CN211375012U - Input current's test equipment and server - Google Patents
Input current's test equipment and server Download PDFInfo
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- CN211375012U CN211375012U CN201921484697.9U CN201921484697U CN211375012U CN 211375012 U CN211375012 U CN 211375012U CN 201921484697 U CN201921484697 U CN 201921484697U CN 211375012 U CN211375012 U CN 211375012U
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Abstract
The utility model discloses an input current's test equipment and server, test equipment includes: a shunt resistor and a power supply; the first end of the shunt resistor is connected with the power supply; the second end of the shunt resistor is connected with the input end of the object to be detected; and measuring the measuring voltage at two ends of the shunt resistor by using an ammeter, and obtaining the input current of the object to be measured according to the measuring voltage and the shunt resistor by using ohm's law. The shunt resistor is used for forming a path between the power supply and the object to be detected, the electric meter is used for measuring the potential difference, namely the voltage, at the two ends of the shunt resistor, and the resistance value of the shunt resistor is known, so that the voltage is equal to the resistance multiplied by the current by using the ohm law, and the current passing through the shunt resistor can be obtained, namely the input current of the object to be detected. Since the efficiency of the power supply is closely related to the input current, the efficiency of the power supply will only be more accurate if the input current is measured accurately.
Description
Technical Field
The utility model relates to an electric parameter measures technical field, especially relates to an input current's test equipment and server.
Background
At present, the design of a power supply is very important for a server mainboard. When the power supply is designed, the power supply can be determined whether the power supply is designed correctly or not and the quality is good by measuring the parameters of the power supply, so that the requirements of customers are met, and over-design is avoided.
Among them, power efficiency is the most important part of power design, and higher power efficiency represents smaller power consumption, and smaller power consumption represents more power saving. Parameters required for power supply efficiency include output voltage, output current, input voltage, and input current of the power supply. The input current is difficult to obtain accurately, and therefore, the accuracy of the power efficiency is directly influenced.
Currently, the input Current is measured by disconnecting an input Power supply path of a circuit, additionally providing voltage and Current through a DC source, connecting a DC load to an output terminal of the DC source, and obtaining the input Current through a DC Power supply source (DC Power supply) instrument, or obtaining the input Current through a Current Probe (Current Probe), and obtaining the Power efficiency from the input Current.
However, after the input power supply path is disconnected, an additional multi-core stranded wire must be used to connect the path to be measured by using the current probe. Therefore, the extra multi-core stranded wire is not easy to be welded on the circuit board manually, and extra impedance is caused, so that the measurement is difficult, time and labor are consumed in the conventional mode.
SUMMERY OF THE UTILITY MODEL
In order to solve the above technical problem that exists among the prior art, the utility model provides an input current's test equipment and server can the accurate input current who obtains the power to the accurate efficiency that obtains the power, labour saving and time saving.
The application provides a test equipment of input current, includes: a shunt resistor and a power supply; the first end of the shunt resistor is connected with the power supply;
the second end of the shunt resistor is connected with the input end of the object to be detected;
and two contacts of the ammeter are respectively connected with two ends of the shunt resistor to obtain the measurement voltage at the two ends of the shunt resistor, and the input current of the object to be measured is obtained according to the measurement voltage and the shunt resistor.
Preferably, the number of the shunt resistors is multiple, and the resistance values of the shunt resistors are different; each shunt resistor corresponds to one controllable switching tube; the test apparatus further comprises: a multi-way switch; the multi-way switch comprises a fixed contact and a plurality of movable contacts;
the first end of each shunt resistor is connected with the power supply, the second end of each shunt resistor is connected with the first end of the corresponding controllable switch tube, and the second ends of all the controllable switch tubes are connected with the input end of the object to be detected;
the control end of each controllable switch tube is respectively connected with one movable contact of the multi-way switch; and the static contact of the multi-way switch is connected with a power supply.
Preferably, the method further comprises the following steps: a pull-up resistor;
the static contact is connected with the power supply through the pull-up resistor.
Preferably, the controllable switch tube is an NMOS tube.
Preferably, the shunt resistance includes four of: a first shunt resistor, a second shunt resistor, a third shunt resistor and a fourth shunt resistor; the NMOS tube comprises the following four parts: the NMOS transistor comprises a first NMOS transistor, a second NMOS transistor, a third NMOS transistor and a fourth NMOS transistor;
the second end of the first shunt resistor is connected with the drain electrode of the first NMOS tube, and the source electrode of the first NMOS tube is connected with the input end of the object to be detected;
the second end of the second shunt resistor is connected with the drain electrode of the second NMOS tube, and the source electrode of the second NMOS tube is connected with the input end of the object to be measured;
the second end of the third shunt resistor is connected with the drain electrode of the third NMOS tube, and the source electrode of the third NMOS tube is connected with the input end of the object to be measured;
the second end of the fourth shunt resistor is connected with the drain electrode of the fourth NMOS tube, and the source electrode of the fourth NMOS tube is connected with the input end of the object to be measured.
Preferably, the resistance value of the first shunt resistor is 10 milliohms, the resistance value of the second shunt resistor is 5 milliohms, the resistance value of the third shunt resistor is 2 milliohms, and the resistance value of the fourth shunt resistor is 1 milliohm.
Preferably, the object to be tested is a power supply on a server mainboard.
The present application further provides a server, comprising: the main board and the test equipment;
the test equipment is used for measuring the input current of the power supply on the mainboard.
Compared with the prior art, the utility model discloses at least, following advantage has:
the test apparatus includes: a shunt resistor and a power supply; the first end of the shunt resistor is connected with the power supply; the second end of the shunt resistor is connected with the input end of the object to be detected; and measuring the measuring voltage at two ends of the shunt resistor by using an ammeter, and obtaining the input current of the object to be measured according to the measuring voltage and the shunt resistor by using ohm's law.
The shunt resistor is used for forming a path between the power supply and the object to be detected, the electric meter is used for measuring the potential difference, namely the voltage, at the two ends of the shunt resistor, and the resistance value of the shunt resistor is known, so that the voltage is equal to the resistance multiplied by the current by using the ohm law, and the current passing through the shunt resistor can be obtained, namely the input current of the object to be detected. Since the efficiency of the power supply is closely related to the input current, the efficiency of the power supply will only be more accurate if the input current is measured accurately.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a schematic diagram of measuring input current;
FIG. 2 is a schematic diagram of a test apparatus for inputting current provided herein;
FIG. 3 is a schematic diagram of another input current test apparatus provided herein;
fig. 4 is a schematic diagram of a shunt resistance module provided by the present invention.
Detailed Description
In order to make the technical solution of the present invention better understood, the technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1, a schematic diagram of measuring an input current is shown.
The adjustable power supply 100 of FIG. 1 provides input current to a DUT200 that is a power module on a server motherboard, but not a primary power supply, as an intermediate power module. Therefore, the input current of the intermediate power module needs to be measured, since the efficiency of the power module is directly related to the input current. Whereas the input current is not easily available in practice. The efficiency of a power supply module depends on the input power, which depends on the input voltage and the input current, and the output power, which depends on the output voltage and the output current, wherein the input current has the greatest influence on the power supply efficiency. In the embodiments of the present application, how to accurately obtain the input current of the power module is described. The object to be measured in the present application refers to a power source to be measured.
The present application is to disconnect a path of an input power supply and implement a current path by using a shunt resistor, and specifically, refer to fig. 2, which is a schematic diagram of a test apparatus for an input current provided by the present application.
The test equipment for the input current provided by the embodiment comprises: a shunt resistor 300 and a power supply 100;
a first end of the shunt resistor 300 is connected to the power supply 100;
the second end of the shunt resistor 300 is connected with the input end of the object to be tested 200;
the measurement voltage at both ends of the shunt resistor 300 is measured by using the ammeter 400, and the input current of the object 200 to be measured is obtained according to the measurement voltage and the shunt resistor by using ohm's law.
For example, the object 200 may be a power module in a server, during normal operation, the output voltage of the previous stage power supply of the power module is 12V, that is, the input voltage of the object 200 is 12V, and when the input current of the object 200 is measured, the power supply 100 is used to provide 12V voltage for the object 200 to measure the input current of the object 200.
In this embodiment, the accuracy of measuring the input current is optimized by the shunt resistor 300. The shunt resistor 300 may be selected according to the accuracy of the input current measurement required, for example, 10 milliohms, 5 milliohms, 2 milliohms, or 1 milliohm may be selected. Wherein the input current accuracy measured for a 10 milliohm correspondence is 10 times the input current accuracy for a 1 milliohm correspondence.
The above is only a specific description, and a person skilled in the art may actually need to set a specific resistance value of the shunt resistor, and the embodiment is not limited in detail.
The electric meter may use a multimeter (Multmeter), among others.
The test equipment for the input current provided by this embodiment uses the shunt resistor to form a path between the power supply and the object to be tested, and measures the potential difference, i.e. the voltage, between two ends of the shunt resistor through the ammeter. Since the efficiency of the power supply is closely related to the input current, the efficiency of the power supply will only be more accurate if the input current is measured accurately.
The following describes that a test device can include shunt resistors with various measurement accuracies, and can be switched according to the measurement accuracy requirement, so as to obtain an input current corresponding to the accuracy requirement.
Referring to fig. 3, a schematic diagram of another input current testing apparatus provided herein is shown.
Referring to fig. 4, a schematic diagram of a shunt resistance module including various measurement accuracies is provided.
The following describes the test equipment provided in this embodiment with reference to fig. 3 and fig. 4, where the shunt resistor module includes four shunt resistors with different resistances as an example, it can be understood that if more types of measurement accuracy need to be obtained, a greater number of shunt resistors with different resistances may be set, and the principle is the same, and is not described herein again.
The shunt resistors are multiple, and the resistance values of the shunt resistors are different; each shunt resistor corresponds to one controllable switching tube; the test apparatus further comprises: a multi-way switch; the multi-way switch comprises a fixed contact and a plurality of movable contacts;
the first end of each shunt resistor is connected with the power supply, the second end of each shunt resistor is connected with the first end of the corresponding controllable switch tube, and the second ends of all the controllable switch tubes are connected with the input end of the object to be detected;
the control end of each controllable switch tube is respectively connected with one movable contact of the multi-way switch; and the static contact of the multi-way switch is connected with a power supply.
In addition, the test equipment provided in this embodiment may further include: a pull-up resistor;
the static contact is connected with the power supply through the pull-up resistor.
The controllable switch tube in the embodiment of the application can be an NMOS tube, and can also be other switch tubes which can realize the same principle.
The following description will take four shunt resistors and the controllable switch transistor is an NMOS transistor as an example.
The shunt resistor comprises the following four parts: a first shunt resistor R1, a second shunt resistor R2, a third shunt resistor R3 and a fourth shunt resistor R4; the NMOS tube comprises the following four parts: a first NMOS transistor N1, a second NMOS transistor N2, a third NMOS transistor and a fourth NMOS transistor N4;
the second end of the first shunt resistor R1 is connected with the drain of the first NN3MOS tube N1, and the source of the first NMOS tube N1 is connected with the input end of the object to be tested;
the second end of the second shunt resistor R2 is connected with the drain of the second NMOS tube N2, and the source of the second NMOS tube N2 is connected with the input end of the object to be tested;
a second end of the third shunt resistor R3 is connected to the drain of the third NMOS transistor N3, and a source of the third NMOS transistor N3 is connected to the input end of the object to be tested;
the second end of the fourth shunt resistor R4 is connected to the drain of the fourth NMOS transistor N4, and the source of the fourth NMOS transistor N4 is connected to the input end of the object to be tested.
In order to realize four different measurement accuracies of the input current, the resistance value of the first shunt resistor R1 is 10 milliohms, the resistance value of the second shunt resistor R2 is 5 milliohms, the resistance value of the third shunt resistor R3 is 2 milliohms, and the resistance value of the fourth shunt resistor R4 is 1 milliohm.
The working principle is described below with reference to fig. 3 and 4.
For example, when the stationary contact of the multiway switch S1 connects the first movable contact, N1 is on and N2-N4 are all off. At this time, R1 is connected between the power supply 100 and the object 200, the voltage across R1 is obtained by the ammeter 400, and the input current of the object 200 can be obtained by the measured voltage and R1. Similarly, when the fixed contact of the multi-way switch S1 is connected to the fourth moving contact, the N4 is turned on, correspondingly, the R4 is connected between the power supply 100 and the object 200, the voltage across the R4 is obtained by the ammeter 400, and the input current of the object 200 can be obtained by using the measured voltage and the R4.
Since R1 and R4 have different resistances, the resistance of R1 is 10 times the resistance of R4, and therefore the accuracy of measuring the input current when N1 is on is 10 times the accuracy of measuring the input current when N4 is on.
For the switching of the multiway switch S1, the movable contact may be switched manually, or may be switched automatically through external control, which is not limited in this embodiment of the application.
The test equipment provided by the embodiment of the application can be switched as required by setting the shunt resistors with a plurality of different resistances, so that the input currents with different precision requirements can be obtained. When the accuracy of the input current is high, accurate power efficiency can be obtained, so that a more accurate power can be set for the server.
Based on the test equipment for the input current provided by the above embodiments, the embodiments of the present application further provide a test method for the input current, which is described in detail below.
The method for testing the input current provided by the embodiment is applied to test equipment, and the test equipment comprises: a shunt resistor and an ammeter; the resistance values of the shunt resistors are different; the first end of the shunt resistor is connected with a power supply; the second end of the shunt resistor is connected with the input end of the object to be detected; the method comprises the following steps:
measuring the measurement voltage at two ends of the shunt resistor by using an ammeter;
and acquiring the input current of the object to be measured according to the measuring voltage and the shunt resistor by using ohm's law.
In the method provided by this embodiment, a shunt resistor is used to form a path between a power supply and an object to be measured, and an electric meter is used to measure a potential difference, i.e., a voltage, across the shunt resistor. Since the efficiency of the power supply is closely related to the input current, the efficiency of the power supply will only be more accurate if the input current is measured accurately.
Based on the test equipment and the test method for the input current provided by the above embodiments, the embodiments of the present application further provide a server, which is described in detail below.
The server provided by the embodiment of the application comprises: the main board and the test equipment;
the test equipment is used for measuring the input current of the power supply on the mainboard.
As the operating speed of the server is required to be higher and higher, the required power supply is also larger and larger, the larger the power supply is, the more important the conversion efficiency of the power supply is, and the power supply with high efficiency must be selected. The power supply is designed by first accurately measuring the accurate power supply efficiency value. The efficiency of the power supply is often about 1% because the measurement error is only about, and it takes a lot of time to reconfirm whether the measurement is correct. The utility model provides a scheme of accurate measurement input current can both save time and save labour.
It should be understood that in the present application, "at least one" means one or more, "a plurality" means two or more. "and/or" for describing an association relationship of associated objects, indicating that there may be three relationships, e.g., "a and/or B" may indicate: only A, only B and both A and B are present, wherein A and B may be singular or plural. The character "/" generally indicates that the former and latter associated objects are in an "or" relationship. "at least one of the following" or similar expressions refer to any combination of these items, including any combination of single item(s) or plural items. For example, at least one (one) of a, b, or c, may represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", wherein a, b, c may be single or plural.
The above description is only for the preferred embodiment of the present invention, and is not intended to limit the present invention in any way. Although the present invention has been described with reference to the preferred embodiments, it is not intended to limit the present invention. The invention is not limited to the embodiments described herein, but is capable of other embodiments according to the invention, and may be used in various other applications, including, but not limited to, industrial. Therefore, any simple modification, equivalent change and modification made to the above embodiments by the technical entity of the present invention all still fall within the protection scope of the technical solution of the present invention, where the technical entity does not depart from the content of the technical solution of the present invention.
Claims (8)
1. An input current testing apparatus, comprising: a shunt resistor and a power supply; the first end of the shunt resistor is connected with the power supply;
the second end of the shunt resistor is connected with the input end of the object to be detected;
and two contacts of the ammeter are respectively connected with two ends of the shunt resistor to obtain the measurement voltage at the two ends of the shunt resistor, and the input current of the object to be measured is obtained according to the measurement voltage and the shunt resistor.
2. The test equipment as claimed in claim 1, wherein the shunt resistor is provided in plurality, and the resistance values of the shunt resistors are different from each other; each shunt resistor corresponds to one controllable switching tube; the test apparatus further comprises: a multi-way switch; the multi-way switch comprises a fixed contact and a plurality of movable contacts;
the first end of each shunt resistor is connected with the power supply, the second end of each shunt resistor is connected with the first end of the corresponding controllable switch tube, and the second ends of all the controllable switch tubes are connected with the input end of the object to be detected;
the control end of each controllable switch tube is respectively connected with one movable contact of the multi-way switch; and the static contact of the multi-way switch is connected with a power supply.
3. The test apparatus of claim 2, further comprising: a pull-up resistor;
the static contact is connected with the power supply through the pull-up resistor.
4. The test apparatus as claimed in claim 2 or 3, wherein the controllable switch transistor is an NMOS transistor.
5. The test apparatus of claim 4, wherein the shunt resistance comprises four of: a first shunt resistor, a second shunt resistor, a third shunt resistor and a fourth shunt resistor; the NMOS tube comprises the following four parts: the NMOS transistor comprises a first NMOS transistor, a second NMOS transistor, a third NMOS transistor and a fourth NMOS transistor;
the second end of the first shunt resistor is connected with the drain electrode of the first NMOS tube, and the source electrode of the first NMOS tube is connected with the input end of the object to be detected;
the second end of the second shunt resistor is connected with the drain electrode of the second NMOS tube, and the source electrode of the second NMOS tube is connected with the input end of the object to be measured;
the second end of the third shunt resistor is connected with the drain electrode of the third NMOS tube, and the source electrode of the third NMOS tube is connected with the input end of the object to be measured;
the second end of the fourth shunt resistor is connected with the drain electrode of the fourth NMOS tube, and the source electrode of the fourth NMOS tube is connected with the input end of the object to be measured.
6. The test apparatus according to claim 5, wherein the first shunt resistor has a resistance value of 10 milliohms, the second shunt resistor has a resistance value of 5 milliohms, the third shunt resistor has a resistance value of 2 milliohms, and the fourth shunt resistor has a resistance value of 1 milliohm.
7. The test equipment according to claim 2 or 3, wherein the object under test is a power supply on a server motherboard.
8. A server, comprising: a motherboard and the test apparatus of any of claims 1-7;
the test equipment is used for measuring the input current of the power supply on the mainboard.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921484697.9U CN211375012U (en) | 2019-09-06 | 2019-09-06 | Input current's test equipment and server |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921484697.9U CN211375012U (en) | 2019-09-06 | 2019-09-06 | Input current's test equipment and server |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211375012U true CN211375012U (en) | 2020-08-28 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921484697.9U Active CN211375012U (en) | 2019-09-06 | 2019-09-06 | Input current's test equipment and server |
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| CN (1) | CN211375012U (en) |
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2019
- 2019-09-06 CN CN201921484697.9U patent/CN211375012U/en active Active
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