CN211373534U - Vertical light-emitting chip testing and appearance inspection device - Google Patents
Vertical light-emitting chip testing and appearance inspection device Download PDFInfo
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- CN211373534U CN211373534U CN201921847127.1U CN201921847127U CN211373534U CN 211373534 U CN211373534 U CN 211373534U CN 201921847127 U CN201921847127 U CN 201921847127U CN 211373534 U CN211373534 U CN 211373534U
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- electric push
- push rod
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- vertical light
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Abstract
The utility model discloses a test of perpendicular luminous chip and visual inspection device, including base, backup pad and guide arm, the base upside has through bolted connection the backup pad, the base opposite side is provided with the guide arm, the backup pad upside is provided with electric putter No. one, electric putter one end is provided with the slider No. one. Has the advantages that: the utility model discloses a step motor, sliding ring, pivot, test platform that set up and place the platform for the chip is from placing back on the testboard, and is automatic through the position adjustment, then moves to wait to examine the region, does not need the manual work to operate, simplifies the inspection step, improves inspection efficiency.
Description
Technical Field
The utility model relates to a chip processing field, concretely relates to vertical lighting chip test and visual inspection device.
Background
In the process of processing the chip, the appearance of the chip needs to be correspondingly checked by the device, and the appearance of the chip is ensured to meet the processing requirement.
The current verifying attachment needs the manual work to remove the chip and waits to inspect the region, and inspection step is complicated, and inspection efficiency is low, consequently needs a utility model to solve current problem.
SUMMERY OF THE UTILITY MODEL
Technical problem to be solved
In order to overcome the defects of the prior art, the vertical light-emitting chip testing and appearance inspection device is provided, and the problems that the existing inspection device needs to manually move a chip to an area to be inspected, the inspection steps are complex, and the inspection efficiency is low are solved.
(II) technical scheme
The utility model discloses a following technical scheme realizes: the utility model provides a vertical luminous chip testing and appearance inspection device, which comprises a base, a supporting plate and a guide rod, the upper side of the base is connected with the supporting plate through a bolt, the other side of the base is provided with the guide rod, a first electric push rod is arranged on the upper side of the supporting plate, a slide block is arranged at one end of the first electric push rod, a second electric push rod is arranged at the lower side of the slide block, a sucker nozzle is arranged at the lower end of the second electric push rod, a stepping motor is arranged between the supporting plate and the guide rod, a rotating shaft is arranged on the upper side of the stepping motor, a slip ring is arranged at the upper end of the rotating shaft, a test platform is arranged on the upper side of the slip ring, a placing platform is arranged on the test platform, the placing table is provided with a chip, the upper end of the guide rod is provided with a sliding sleeve, the outer side of the sliding sleeve is provided with a fastening knob, and one end of the sliding sleeve is provided with a CCD detector.
Furthermore, the guide rod with the base passes through threaded connection, the sliding sleeve with guide rod sliding connection, the fastening knob with the sliding sleeve passes through threaded connection.
Through adopting above-mentioned technical scheme, the guide arm does sliding of sliding sleeve provides the guide effect, guarantees the sliding sleeve slides stably in the vertical direction.
Further, the sliding sleeve is connected with the CCD detector through a bolt, the placing table is connected with the testing platform through a bolt, and the testing platform is connected with the sliding ring through a clamping groove.
By adopting the technical scheme, the CCD detector can detect the appearance flatness of the chip, and the chip on the placing table can be moved to different position areas by the rotation of the testing platform.
Furthermore, the slip ring is in key connection with the rotating shaft, and the rotating shaft is in key connection with the stepping motor.
By adopting the technical scheme, the rotating shaft can drive the test platform to rotate through the slip ring.
Furthermore, No. two electric putter with the slider passes through bolted connection, the slider with backup pad sliding connection.
Through adopting above-mentioned technical scheme, electric putter can promote the slider carries out lateral shifting, and then makes No. two electric putter lower extremes the sucking disc mouth is adsorbed the chip carries out lateral shifting, makes the material loading operation can be accomplished to the chip.
Furthermore, the sliding block is connected with the electric push rod through a bolt, and the electric push rod is connected with the supporting plate through a bolt.
Through adopting above-mentioned technical scheme, the backup pad does electric putter provides the stable supporting effect for, makes electric putter can with the slider transversely promotes.
Furthermore, the stepping motor is connected with the base through a bolt, and the sucker nozzle is connected with the second electric push rod through threads.
By adopting the technical scheme, the stepping motor can drive the test platform to rotate at a precise specific angle, so that the chip can be tested and subjected to appearance inspection.
(III) advantageous effects
Compared with the prior art, the utility model, following beneficial effect has:
for solving current verifying attachment and need artifically remove the chip to wait to examine the region, the inspection step is complicated, the problem that inspection efficiency is low, the utility model discloses a step motor, sliding ring, pivot, test platform that set up with place the platform for the chip is from placing the back on the testboard, and automatic through position adjustment, then remove to wait to examine the region, does not need the manual work to operate, simplifies the inspection step, improves inspection efficiency.
Drawings
Fig. 1 is a front view of a vertical light emitting chip testing and appearance inspection apparatus according to the present invention;
fig. 2 is a top view of a vertical light emitting chip testing and appearance inspection apparatus according to the present invention;
fig. 3 is a top view of a testing platform in the device for testing a vertical light emitting chip and inspecting appearance of the vertical light emitting chip of the present invention.
The reference numerals are explained below:
1. a base; 2. a support plate; 3. a first electric push rod; 4. a slider; 5. a second electric push rod; 6. a suction cup mouth; 7. a stepping motor; 8. a rotating shaft; 9. a slip ring; 10. a test platform; 11. a guide bar; 12. a placing table; 13. a chip; 14. a sliding sleeve; 15. fastening a knob; 16. a CCD detector.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1-3, the vertical luminescence chip testing and appearance inspection device of the present embodiment comprises a base 1, a supporting plate 2 and a guide rod 11, wherein the supporting plate 2 is connected to the upper side of the base 1 through a bolt, the guide rod 11 is arranged on the other side of the base 1, a first electric push rod 3 is arranged on the upper side of the supporting plate 2, a slide block 4 is arranged at one end of the first electric push rod 3, a second electric push rod 5 is arranged on the lower side of the slide block 4, a suction cup mouth 6 is arranged at the lower end of the second electric push rod 5, a sliding sleeve 14 is arranged at the upper end of the guide rod 11, a fastening knob 15 is arranged on the outer side of the sliding sleeve 14, a CCD detector 16 is arranged at one end of the sliding sleeve 14, the guide rod 11 is connected to the base 1 through a thread, the sliding sleeve 14 is connected, test platform 10 passes through the draw-in groove with sliding ring 9 and is connected, sliding ring 9 and 8 key-type connections in pivot, pivot 8 and step motor 7 key-type connections, No. two electric putter 5 passes through bolted connection with slider 4, slider 4 and 2 sliding connection in backup pad, slider 4 passes through bolted connection with an electric putter 3, No. one electric putter 3 passes through bolted connection with backup pad 2, step motor 7 passes through bolted connection with base 1, sucking disc mouth 6 passes through threaded connection with No. two electric putter 5.
As shown in fig. 1-3, in this embodiment, a stepping motor 7 is disposed between the supporting plate 2 and the guide rod 11, a rotating shaft 8 is disposed on the upper side of the stepping motor 7, a sliding ring 9 is disposed on the upper end of the rotating shaft 8, a testing platform 10 is disposed on the upper side of the sliding ring 9, a placing platform 12 is disposed on the testing platform 10, a chip 13 is disposed on the placing platform 12, and the chip 13 passes through the stepping motor 7, the sliding ring 9, the rotating shaft 8, the testing platform 10 and the placing platform 12, so that the chip 13 automatically passes through position adjustment after being placed on the testing platform 10, and then moves to an area to be inspected, without manual operation, thereby simplifying inspection steps and improving inspection.
The specific implementation process of this embodiment is as follows: when the testing platform is used, the control device adjusts the first electric push rod 3, so that the first electric push rod 3 drives the sliding block 4 to transversely move, the sucking disc mouth 6 moves to be right above the chip 13, then the second electric push rod 5 pushes the sucking disc mouth 6 to downwards move, the sucking disc mouth 6 is in contact with the chip 13 and adsorbs the chip 13, then the second electric push rod 5 upwards contracts, so that the chip 13 is adsorbed, meanwhile, the first electric push rod 3 pushes the sliding block 4 to move towards the placing platform 12, so that when the chip 13 moves to be above the placing platform 12, the second electric push rod 5 downwards extends, so that the chip 13 is placed on the placing platform 12 at the 1# position on the testing platform 10, then the stepping motor 7 drives the testing platform 10 to clockwise rotate ninety degrees through the rotating shaft 8 and the sliding ring 9, so that the placing platform 12 moves to the 2# position, and then the position of the chip 13 is adjusted, after the adjustment, test platform 10 continues clockwise rotation ninety degrees, make place platform 12 and remove 3# position department, at this moment, CCD detector 16 can inspect chip 13 outward appearance roughness, after the inspection finishes, test platform 10 continues clockwise rotation ninety degrees to 4# position department, then expand chip 13, through step motor 7 that sets up, sliding ring 9, pivot 8, test platform 10 and place platform 12, make chip 13 from placing on test platform 10 after, automatically through position adjustment, then move to the region of examining, do not need the manual work to operate, simplify the inspection step, improve inspection efficiency.
The above-described embodiments are merely illustrative of the preferred embodiments of the present invention and are not intended to limit the spirit and scope of the present invention. Without departing from the design concept of the present invention, various modifications and improvements made by the technical solution of the present invention by those skilled in the art should fall into the protection scope of the present invention, and the technical contents claimed by the present invention have been fully recorded in the claims.
Claims (7)
1. The utility model provides a vertical luminous chip test and visual inspection device which characterized in that: comprises a base (1), a support plate (2) and a guide rod (11), wherein the support plate (2) is connected to the upper side of the base (1) through a bolt, the guide rod (11) is arranged on the other side of the base (1), a first electric push rod (3) is arranged on the upper side of the support plate (2), a slide block (4) is arranged at one end of the first electric push rod (3), a second electric push rod (5) is arranged on the lower side of the slide block (4), a suction cup nozzle (6) is arranged at the lower end of the second electric push rod (5), a stepping motor (7) is arranged between the support plate (2) and the guide rod (11), a rotating shaft (8) is arranged on the upper side of the stepping motor (7), a sliding ring (9) is arranged at the upper end of the rotating shaft (8), a testing platform (10) is arranged on the, the chip placing device is characterized in that a chip (13) is arranged on the placing table (12), a sliding sleeve (14) is arranged at the upper end of the guide rod (11), a fastening knob (15) is arranged on the outer side of the sliding sleeve (14), and a CCD detector (16) is arranged at one end of the sliding sleeve (14).
2. A vertical light emitting chip testing and visual inspection apparatus according to claim 1, wherein: the guide rod (11) is connected with the base (1) through threads, the sliding sleeve (14) is connected with the guide rod (11) in a sliding mode, and the fastening knob (15) is connected with the sliding sleeve (14) through threads.
3. A vertical light emitting chip testing and visual inspection apparatus according to claim 2, wherein: the sliding sleeve (14) is connected with the CCD detector (16) through bolts, the placing table (12) is connected with the testing platform (10) through bolts, and the testing platform (10) is connected with the sliding ring (9) through a clamping groove.
4. A vertical light emitting chip testing and visual inspection apparatus according to claim 3, wherein: the slip ring (9) is connected with the rotating shaft (8) in a key mode, and the rotating shaft (8) is connected with the stepping motor (7) in a key mode.
5. The vertical light emitting chip testing and visual inspection apparatus according to claim 4, wherein: the second electric push rod (5) is connected with the sliding block (4) through a bolt, and the sliding block (4) is connected with the supporting plate (2) in a sliding mode.
6. The vertical light emitting chip testing and visual inspection apparatus according to claim 5, wherein: the sliding block (4) is connected with the electric push rod (3) through a bolt, and the electric push rod (3) is connected with the supporting plate (2) through a bolt.
7. A vertical light emitting chip testing and visual inspection apparatus according to claim 6, wherein: the stepping motor (7) is connected with the base (1) through a bolt, and the sucker nozzle (6) is connected with the second electric push rod (5) through a thread.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921847127.1U CN211373534U (en) | 2019-10-30 | 2019-10-30 | Vertical light-emitting chip testing and appearance inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921847127.1U CN211373534U (en) | 2019-10-30 | 2019-10-30 | Vertical light-emitting chip testing and appearance inspection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211373534U true CN211373534U (en) | 2020-08-28 |
Family
ID=72152905
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921847127.1U Active CN211373534U (en) | 2019-10-30 | 2019-10-30 | Vertical light-emitting chip testing and appearance inspection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211373534U (en) |
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2019
- 2019-10-30 CN CN201921847127.1U patent/CN211373534U/en active Active
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