CN211292977U

CN211292977U - Fixing device for chip testing

Info

Publication number: CN211292977U
Application number: CN201921888811.4U
Authority: CN
Inventors: 杨坤宏; 陈绍锋; 何颖东
Original assignee: Shenzhen Sunyilg Intelligent Equipment Co ltd
Current assignee: Shenzhen Sunyilg Intelligent Equipment Co ltd
Priority date: 2019-11-04
Filing date: 2019-11-04
Publication date: 2020-08-18
Anticipated expiration: 2029-11-04

Abstract

The application provides a fixing device for chip testing, which comprises a test board with a mounting surface, a suction nozzle for sucking a chip and a first driving mechanism for driving the test board to do reciprocating linear motion so as to enable the mounting surface of the test board to be close to and far away from the suction nozzle; the mounting surface of the test board is fixedly provided with an elastic sealing ring and a probe for testing a chip, and the mounting surface of the test board is also provided with an air suction hole positioned in the elastic sealing ring. This application can make the chip by firm fixing on the suction nozzle, makes the chip be difficult to take place to drop at the in-process of being tested, and fixed time is shorter moreover, has improved production efficiency.

Description

Fixing device for chip testing

Technical Field

The application belongs to the technical field of chip testing, and more particularly relates to a fixing device for chip testing.

Background

When the integrated circuit chip is automatically tested on the test equipment, a certain fixing device is required to fix the chip, and in the existing scheme, after the chip is clamped and fixed from two sides of the chip, the probe of the test equipment detects the chip. But along with the structure of chip more and more meticulous, the stability of clamping fixedly is difficult to control from both sides to the chip in the test procedure, and the chip takes place to drop easily, and presss from both sides tight product and can lead to the process live time longer, influences equipment efficiency.

SUMMERY OF THE UTILITY MODEL

The application aims to provide a fixing device for chip testing to solve the technical problems that a chip is easy to drop in a testing process and the time of a clamping process is long.

In order to achieve the purpose, the technical scheme adopted by the application is as follows: the fixing device for chip testing comprises a test board with a mounting surface, a suction nozzle for sucking a chip and a first driving mechanism for driving the test board to do reciprocating linear motion so as to enable the mounting surface of the test board to be close to and far away from the suction nozzle; the mounting surface of the test board is fixedly provided with an elastic sealing ring and a probe for testing a chip, and the mounting surface of the test board is also provided with an air suction hole positioned in the elastic sealing ring.

Further, the first driving mechanism comprises a screw rod, a sliding block in threaded connection with the screw rod and a motor for driving the screw rod to rotate, and the test board is fixedly connected with the sliding block.

Further, still include a base, motor fixed mounting be in on the base, the lead screw rotates to be installed on the base, slider slidable mounting be in on the base.

Furthermore, a connecting plate is fixedly mounted on the sliding block, and the test plate is fixedly mounted on the connecting plate.

Furthermore, a groove is formed between the inner wall of the elastic sealing ring and the mounting surface of the test board, and the test end of the probe is positioned in the groove.

Furthermore, the direction of the reciprocating linear motion of the mounting surface of the test board is a first linear direction, and the fixing device further comprises a second driving mechanism for driving the test board to do reciprocating linear motion along a second linear direction perpendicular to the first linear direction.

Furthermore, the fixing device also comprises a third driving mechanism for driving the test board to do reciprocating linear motion along a third linear direction perpendicular to the first linear direction, and the first linear direction, the second linear direction and the third linear direction are vertically arranged in pairs.

The base is connected with the first sliding plate, the axis direction of the first adjusting screw is parallel to the second linear direction, and one end of the first adjusting screw is rotatably embedded into the first sliding plate.

Further, the third driving mechanism comprises a second adjusting screw rod in threaded connection with the first sliding plate and a second sliding plate slidably mounted on the first sliding plate, the base is fixedly connected with the second sliding plate, the axis direction of the second adjusting screw rod is parallel to the third linear direction, and one end of the second adjusting screw rod is rotatably embedded in the second sliding plate.

Furthermore, the sliding plate further comprises a bottom plate and a reinforcing plate, wherein the bottom plate is fixed on the second sliding plate, the base is fixedly connected with the bottom plate, and the reinforcing plate is fixedly connected between the bottom plate and the base.

The beneficial effects of this application lie in, through the surface at survey test panel set up the elastic sealing circle and make its lower surface and the suction nozzle of laminating suction nozzle form an airtight space, breathe in through the suction hole that is located the elastic sealing circle, make the pressure in the airtight space reduce, the chip is by firm absorption on the suction nozzle this moment. Clamping is fixed to comparing the chip with traditional both sides from the chip, and this application is more stable to the fixed of chip, makes the chip be difficult to take place to drop at the in-process that is being tested, and the fixed process is also more swift simultaneously, has improved production efficiency.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.

FIG. 1 is a schematic structural diagram of an embodiment of the present application;

FIG. 2 is a schematic view of a partial structure of a test board according to an embodiment of the present disclosure.

Wherein, each mark in the figure is:

1. a test board; 2. a mounting surface; 3. an elastic sealing ring; 4. a probe; 5. a suction hole; 6. a screw rod; 7. A slider; 8. a motor; 9. a base; 10. a chute; 11. a coupling; 12. a connecting plate; 13. a fixing plate; 14. a first adjusting screw; 15. a first slide plate; 16. a second adjusting screw; 17. a second slide plate; 18. a base plate; 19. a reinforcing plate.

Detailed Description

In order to make the technical problems, technical solutions and advantageous effects to be solved by the present application clearer, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly or indirectly connected to the other element. The terms "upper", "lower", "left", "right", and the like, indicate orientations or positional relationships based on those shown in the drawings, are merely for convenience of description, and do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed in a specific orientation, and operate, and thus are not to be construed as limiting the patent, and the specific meanings of the above terms will be understood by those skilled in the art according to specific situations. The terms "first", "second" and "first" are used merely for descriptive purposes and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features. The meaning of "plurality" is two or more unless specifically limited otherwise.

As shown in fig. 1 and 2, a fixing device for chip testing includes a testing board 1 having a mounting surface 2, a suction nozzle (not shown) for sucking a chip, and a first driving mechanism for driving the mounting surface 2 of the testing board 1 to reciprocate in a linear direction toward and away from the suction nozzle. An elastic sealing ring 3 and a probe 4 for testing a chip are fixedly arranged on the mounting surface 2 of the test board 1, an air suction hole 5 is further formed in the mounting surface 2 of the test board 1, and the air suction hole 5 is located in the elastic sealing ring 3.

When the test device works, the suction nozzle on the manipulator or the turntable adsorbs the lower surface of the chip to bring the chip to a test station, and the lower surface of the suction nozzle is positioned right above the sealing elastic sealing ring. The first driving mechanism drives the test board 1 to move upwards to be continuously close to the suction nozzle, the elastic sealing ring 3 on the mounting surface 2 of the test board 1 is in contact with the lower surface of the suction nozzle, at the moment, the first driving mechanism stops working, the mounting surface 2 of the test board 1, the inner ring of the elastic sealing ring 3, the suction nozzle and the lower surface of the chip are enclosed to form a closed space, then the suction hole 5 starts to suck air through a vacuumizing device connected with the suction hole, the air in the closed space is sucked out, then the first driving mechanism continues working, the test board 1 is driven to continue to move upwards, when the elastic sealing ring 3 is extruded, the test end of the probe 4 is in contact with the lower surface of the chip, and the chip is tested through a detection device.

This application simple structure sets up elastic seal circle 3 and makes its laminating form an airtight space at the lower surface of suction nozzle through the surface at survey test panel 1, breathes in through the suction hole 5 that is located elastic seal circle 3, makes the pressure reduction in the airtight space, and the chip is adsorbed in the suction nozzle top more firmly this moment. Clamping is fixed comparing from the both sides of chip with traditional, and this application is more stable to the fixed of chip, makes the chip be difficult to the emergence of being tested in-process and drops, and the absorbent mode of suction nozzle is also more swift to the chip than pressing from both sides tightly in addition, has improved production efficiency.

Further, a first driving mechanism comprises a screw rod 6, a sliding block 7 and a motor 8, the sliding block 7 is in threaded connection with the screw rod 6, an output end of the motor 8 is connected with the screw rod 6 and used for driving the screw rod 6 to rotate, and the test board 1 is fixedly connected with the sliding block 7. When the motor 8 works, the screw rod 6 and the slide block 7 are in threaded transmission, the slide block 7 can be driven to slide up and down, the mounting surface 2 of the test board 1 can make reciprocating linear motion towards the direction close to and far away from the suction nozzle, and the test board is simple in structure and sensitive in action.

Further, the fixing device further comprises a base 9, the motor 8 is fixedly installed on the base 9, the screw rod 6 is rotatably installed on the base 9, and the sliding block 7 is slidably installed on the base 9. In the application, the motor 8 is fixedly arranged on the lower surface of the base 9, a sliding groove 10 is arranged on the side surface of the base 9, the screw rod 6 is rotatably arranged in the sliding groove 10 of the base 9, and the output end of the motor 8 penetrates through the base 9 and then is connected with one end of the screw rod 6 through a coupling 11; the sliding block 7 is connected with the screw rod 6 in a threaded manner and is in sliding fit with the sliding groove 10 of the base 9.

Further, a connecting plate 12 is fixedly mounted on the slider 7, and the test board 1 is fixedly mounted on the connecting plate 12. Survey test panel 1 through connecting plate 12 and slider 7 fixed connection, when making slider 7 slide from top to bottom in vertical direction, connecting plate 12 is vertical arranging, and then makes and survey test panel 1 and be the level and arrange, surveys test panel 1's installation face 2 and can slide from top to bottom, is close to and keeps away from the suction nozzle.

Furthermore, the inner ring of the elastic sealing ring 3 and the mounting surface 2 of the test board 1 are combined to form a groove, and the test end of the probe 4 is positioned in the groove. When the lower surface contact of elastic sealing ring 3 and suction nozzle, the recess that the inner circle of elastic sealing ring 3 and the installation face 2 combination that survey test panel 1 formed encloses with the lower surface of suction nozzle and chip and closes and form airtight space, the test end of probe 4 is located this airtight space simultaneously, when elastic sealing ring 3 adsorbs the lower surface of suction nozzle, the integrated circuit structure of chip lower surface is located elastic sealing ring 3, the test end of probe 4 can be surveyed the chip, can also guarantee that the focus of chip also is located elastic sealing ring 3 within, make the suction nozzle more stable to the absorption of chip. On the contrary, if the integrated circuit structure on the lower surface of the chip is located outside the elastic sealing ring 3 when the suction nozzle sucks the lower surface of the chip, the probe 4 is inevitably installed outside the elastic sealing ring 3, so that the suction nozzle can only suck a part of the edge of the chip, and stable suction cannot be formed.

Furthermore, the direction of the reciprocating linear motion of the mounting surface 2 of the test board 1 is a first linear direction, and the fixing device further comprises a second driving mechanism for driving the test board 1 to do reciprocating linear motion along a second linear direction perpendicular to the first linear direction. In this application, first rectilinear direction is upper and lower direction promptly, and the second rectilinear direction is the fore-and-aft direction in the horizontal plane, before work, can drive through second actuating mechanism earlier and survey test panel 1 seesaw in the horizontal plane to the position of survey test panel 1 is surveyed in the adjustment of fore-and-aft direction, makes the elastic sealing ring 3 on the installation face 2 of survey test panel 1 can cooperate the suction nozzle to adsorb the chip of different specifications and sizes.

Furthermore, the fixing device further comprises a third driving mechanism for driving the test board 1 to make reciprocating linear motion along a third linear direction perpendicular to the first linear direction, and the first linear direction, the second linear direction and the third linear direction are vertically arranged in pairs. In this application, the third linear direction is the left-right direction in the horizontal plane, and before the operation, can drive the test board 1 through the third actuating mechanism and move about in the horizontal plane to the position of the test board 1 is adjusted in the left-right direction, makes the elastic sealing ring 3 on the installation face 2 of the test board 1 can adsorb the chip of different specification sizes. The position of the test board 1 is adjusted in the front-back direction and the left-right direction through the second driving mechanism and the third driving mechanism respectively, the position of a test point of a chip can be accurately adjusted, debugging of test equipment is facilitated, and the test board is suitable for testing chips of various types.

Further, the fixing device further comprises a fixing plate 13, the second driving mechanism comprises a first adjusting screw 14 in threaded connection with the fixing plate 13 and a first sliding plate 15 slidably mounted on the fixing plate 13, the base 9 is connected with the first sliding plate 15, the axial direction of the first adjusting screw 14 is parallel to the second linear direction, and one end of the first adjusting screw 14 is rotatably embedded in the first sliding plate 15. When the first adjusting screw 14 is rotated, because the outer circumferential surface of the first adjusting screw 14 is in threaded connection with the fixing plate 13, the end part of the first adjusting screw 14 is rotatably embedded into the first sliding plate 15, and the first sliding plate 15 slides on the fixing plate 13 along the second linear direction through the threaded transmission between the first adjusting screw 14 and the fixing plate 13, so that the forward and backward sliding of the test plate 1 is realized.

Further, the third driving mechanism comprises a second adjusting screw 16 in threaded connection with the first sliding plate 15 and a second sliding plate 17 slidably mounted on the first sliding plate 15, the base 9 is fixedly connected with the second sliding plate 17, the axial direction of the second adjusting screw 16 is parallel to the third linear direction, and one end of the second adjusting screw 16 is rotatably embedded in the second sliding plate 17. When the second adjusting screw 16 is rotated, because the outer peripheral surface of the second adjusting screw 16 is in threaded connection with the first sliding plate 15, the end part of the second adjusting screw 16 is rotatably embedded into the second sliding plate 17, and the second sliding plate 17 slides on the first sliding plate 15 along the third linear direction through the threaded transmission between the second adjusting screw 16 and the first sliding plate 15, so that the left-right sliding of the test board 1 is realized.

Further, the fixing device further comprises a bottom plate 18 and a reinforcing plate 19, the bottom plate 18 is fixed on the second sliding plate 17, the base 9 is fixedly connected with the bottom plate 18, the reinforcing plate 19 is fixedly connected between the bottom plate 18 and the base 9, the base 9 is fixedly connected with the second sliding plate 17 through the reinforcing plate 19 and the bottom plate 18, and the second driving mechanism and the third driving mechanism can also drive the base 9 to slide back and forth and slide left and right.

The above description is only exemplary of the present application and should not be taken as limiting the present application, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present application should be included in the protection scope of the present application.

Claims

1. The fixing device for chip testing is characterized by comprising a test board with a mounting surface, a suction nozzle for sucking a chip and a first driving mechanism for driving the test board to do reciprocating linear motion so as to enable the mounting surface of the test board to be close to and far away from the suction nozzle; the mounting surface of the test board is fixedly provided with an elastic sealing ring and a probe for testing a chip, and the mounting surface of the test board is also provided with an air suction hole positioned in the elastic sealing ring.

2. The fixing device for chip testing as claimed in claim 1, wherein the first driving mechanism comprises a screw rod, a slide block screwed to the screw rod, and a motor for driving the screw rod to rotate, and the testing board is fixedly connected to the slide block.

3. The fixture for chip testing as defined in claim 2, further comprising a base, said motor being fixedly mounted on said base, said lead screw being rotatably mounted on said base, said slider being slidably mounted on said base.

4. The fixing device for chip testing as claimed in claim 2, wherein a connecting plate is fixedly mounted on the slider, and the testing plate is fixedly mounted on the connecting plate.

5. The fixture for chip testing as claimed in claim 1, wherein the inner wall of said elastic sealing ring and the mounting surface of said testing board form a groove, and the testing end of said probe is located in said groove.

6. The fixture for chip testing as claimed in claim 3, wherein the direction of the reciprocating linear motion of the mounting surface of the test board is a first linear direction, the fixture further comprising a second driving mechanism for driving the test board to reciprocate linearly along a second linear direction perpendicular to the first linear direction.

7. The fixture for chip testing as claimed in claim 6, wherein said fixture further comprises a third driving mechanism for driving said testing board to perform a reciprocating linear motion along a third linear direction perpendicular to said first linear direction, said second linear direction and said third linear direction being perpendicular to each other.

8. The fixing device for chip testing as claimed in claim 7, further comprising a fixing plate, wherein the second driving mechanism comprises a first adjusting screw threaded on the fixing plate and a first sliding plate slidably mounted on the fixing plate, the base is connected to the first sliding plate, an axial direction of the first adjusting screw is parallel to the second linear direction, and one end of the first adjusting screw is rotatably embedded in the first sliding plate.

9. The fixing device for chip testing according to claim 8, wherein the third driving mechanism includes a second adjusting screw threaded on the first sliding plate and a second sliding plate slidably mounted on the first sliding plate, the base is fixedly connected with the second sliding plate, an axial direction of the second adjusting screw is parallel to the third linear direction, and one end of the second adjusting screw is rotatably embedded in the second sliding plate.

10. The fixture for chip testing as claimed in claim 9, further comprising a bottom plate and a reinforcing plate, wherein the bottom plate is fixed on the second sliding plate, the base is fixedly connected with the bottom plate, and the reinforcing plate is fixedly connected between the bottom plate and the base.