CN211206699U - Semiconductor chip electrical characteristic detection device - Google Patents
Semiconductor chip electrical characteristic detection device Download PDFInfo
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- CN211206699U CN211206699U CN201922106285.8U CN201922106285U CN211206699U CN 211206699 U CN211206699 U CN 211206699U CN 201922106285 U CN201922106285 U CN 201922106285U CN 211206699 U CN211206699 U CN 211206699U
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Abstract
The utility model discloses a semiconductor chip electrical property detection device, including fixing base, support, slide, motor fixing base, slip motor, slide bar, slip table, chip standing groove, detection mechanism and controller, the support is located on the fixing base, the slide is located on the support, the motor fixing base is located on the support lateral wall, the slip motor is located on the motor fixing base, the slide bar can slide and locate on the motor fixing base, the slide bar is located on the slip motor output, the slide bar top is located to slip table one end, the slip table other end can slide and locate in the slide, the slip table top is located to the chip standing groove, detection mechanism locates the support top and locates chip standing groove top, the controller is located on the detection mechanism. The utility model belongs to the technical field of electronic chip apparatus for producing, specifically indicate a semiconductor chip electrical characteristic detection device that detection efficiency is high, real-time switch check point, diversified detection.
Description
Technical Field
The utility model belongs to the technical field of electronic chip apparatus for producing, specifically indicate a semiconductor chip electrical characteristic detection device.
Background
In general, a semiconductor chip used in manufacturing an electronic product is subjected to a test process for determining whether the semiconductor chip is acceptable, and the electrical characteristics and reliability of the semiconductor chip can be ensured by the test process as described above. The conventional inspection is performed manually, the chip is inserted into the detection jack, is butted with the test platform, and is electrified for testing, but the manual operation efficiency is low, and errors are easy to occur. At present, some enterprises carry out automatic production and operate by means of manipulators, but the intelligent manipulator is high in equipment cost and difficult to maintain.
SUMMERY OF THE UTILITY MODEL
In order to solve the problem, the utility model provides a semiconductor chip electrical characteristic detection device that detection efficiency is high, switch over check point, diversified detection in real time.
In order to realize the above functions, the utility model discloses the technical scheme who takes as follows: a semiconductor chip electrical characteristic detection device comprises a fixed seat, a support, a slide way, a motor fixed seat, a sliding motor, a slide rod, a slide table, a chip placing groove, a detection mechanism and a controller, wherein the support is arranged on the fixed seat, the slide way is arranged on the support, the motor fixed seat is arranged on the side wall of the support, the sliding motor is arranged on the motor fixed seat, the slide rod is arranged on the motor fixed seat in a sliding way, the slide rod is arranged on the output end of the sliding motor, one end of the slide table is arranged at the top of the slide rod, the other end of the slide table is arranged in the slide way in a sliding way, the chip placing groove is arranged at the top of the slide way, the detection mechanism is arranged at the top of the support and is arranged above the chip placing groove, the controller is arranged on the detection mechanism, the detection mechanism comprises a telescopic motor, a telescopic, the utility model discloses a chip detection device, including telescopic motor, stop device, detection motor, display screen, slide motor, slide bar, chip standing groove, telescopic link, stop device, detection motor, detection head and display screen, on telescopic motor output is located to the telescopic link, stop device locates on the support, the detection motor is located the telescopic link bottom, it locates the detection motor bottom to detect the head symmetry, on the detection motor was located to the display screen, the slide motor drove the slide bar motion, and the slide bar drives the slip table and slides in the slide, and the slip table drives the chip.
Further, stop device includes slide rail and stopper, the slide rail is located on the support, the stopper slidable locates on the slide rail, and the stopper can slide along the slide rail, prescribes a limit to the height that detects the motor decline, prevents to detect the head damage chip.
Further, the controller is electrically connected with the sliding motor, the telescopic motor and the detection motor.
Furthermore, the display screen is electrically connected with the controller, and the display screen can display the detection result in real time.
Further, detect on motor one end locates the stopper, detect the motor other end and locate the telescopic link bottom, the slide rail is injectd the height that detects the motor decline.
The utility model adopts the above structure to gain beneficial effect as follows: the utility model provides a pair of semiconductor chip electrical property detection device detection efficiency is high, the slip motor drives the slide bar motion, the slide bar drives the slip table and slides in the slide, the slip table drives the chip standing groove motion, the chip standing groove drives the chip motion, flexible motor drives the telescopic link motion simultaneously, the telescopic link drives the detection motor motion, the detection motor drives the first motion of detection, detect the electrical property information feedback of motor with this check point after the detection finishes to the controller, controller control slip motor, flexible motor, do the preparation for next detection, the slide rail is injectd to the height that detects the motor and descend simultaneously, prevent to detect first damage chip.
Drawings
FIG. 1 is a schematic diagram of an overall structure of a semiconductor chip electrical characteristic inspection apparatus according to the present invention;
fig. 2 is a left side view of the device for detecting electrical characteristics of a semiconductor chip according to the present invention.
The detection device comprises a fixing base 1, a fixing base 2, a support 3, a slide rail 4, a motor fixing base 5, a sliding motor 6, a slide rod 7, a sliding table 8, a chip placing groove 9, a detection mechanism 10, a controller 11, a telescopic motor 12, a telescopic rod 13, a limiting device 14, a detection motor 15, a detection head 16, a display screen 17, a slide rail 18 and a limiting block.
Detailed Description
The technical solution of the present invention will be described in further detail with reference to the following embodiments, and the technical features or the connection relations of the present invention, which are not described in detail, are the prior art adopted.
The present invention will be described in further detail with reference to the accompanying drawings.
Referring to fig. 1-2, the present invention relates to a semiconductor chip electrical characteristic detecting device, which comprises a fixing base 1, a support 2, a slide rail 3, a motor fixing base 4, a sliding motor 5, a sliding rod 6, a sliding table 7, a chip placement groove 8, a detecting mechanism 9 and a controller 10, wherein the support 2 is arranged on the fixing base 1, the slide rail 3 is arranged on the support 2, the motor fixing base 4 is arranged on the side wall of the support 2, the sliding motor 5 is arranged on the motor fixing base 4, the sliding rod 6 is slidably arranged on the motor fixing base 4, the sliding rod 6 is arranged on the output end of the sliding motor 5, one end of the sliding table 7 is arranged on the top of the sliding rod 6, the other end of the sliding table 7 is slidably arranged in the slide rail 3, the chip placement groove 8 is arranged on the top of the sliding table 7, the detecting mechanism 9 is arranged on the top of the support 2 and above, detection mechanism 9 includes flexible motor 11, telescopic link 12, stop device 13, detects motor 14, detects head 15 and display screen 16, 2 tops of support are located to flexible motor 11, telescopic link 12 is located on the flexible motor 11 output, stop device 13 is located on support 2, detect motor 14 and locate telescopic link 12 bottoms, it locates detection motor 14 bottoms to detect head 15 pair, display screen 16 is located on detecting motor 14.
The controller 10 is electrically connected with the slide motor 5, the telescopic motor 11 and the detection motor 14.
The display screen 16 is electrically connected to the controller 10.
One end of the detection motor 14 is arranged on the limiting block 18, and the other end of the detection motor 14 is arranged at the bottom of the telescopic rod 12.
When the device is used, an operator puts a chip into the chip placing groove 8, the power supply is switched on, the telescopic motor 11 drives the telescopic rod 12 to move, the telescopic rod 12 drives the detection motor 14 to move, the detection motor 14 drives the detection head 15 to move, after the detection head moves to a proper position, the detection motor 14 starts to detect, the display screen 16 displays a detection result in real time, the slide rail 17 limits the descending height of the detection motor 14 to prevent the detection head 15 from damaging the chip, meanwhile, the slide motor 5 drives the slide rod 6 to move, the slide rod 6 drives the slide table 7 to slide in the slide way 3, the slide table 7 drives the chip placing groove 8 to move, the chip placing groove 8 drives the chip to move, the detection motor 14 feeds back the electrical characteristic information of the detection point to the controller 10 after the detection is finished, the controller 10 controls the slide motor 5 to move again to drive the chip to move to, and multi-azimuth detection is realized.
The present invention and the embodiments thereof have been described above, but the description is not limited thereto, and the embodiment shown in the drawings is only one of the embodiments of the present invention, and the actual structure is not limited thereto. In summary, those skilled in the art should understand that they should not be limited to the embodiments described above, and that they can design the similar structure and embodiments without departing from the spirit of the invention.
Claims (5)
1. An apparatus for detecting electrical characteristics of a semiconductor chip, comprising: comprises a fixed seat, a support, a slideway, a motor fixed seat, a sliding motor, a sliding rod, a sliding table, a chip placing groove, a detection mechanism and a controller, wherein the support is arranged on the fixed seat, the slideway is arranged on the support, the motor fixed seat is arranged on the side wall of the support, the sliding motor is arranged on the motor fixed seat, the sliding rod is arranged on the motor fixed seat in a sliding way, the sliding rod is arranged on the output end of the sliding motor, one end of the sliding table is arranged at the top of the sliding rod, the other end of the sliding table is arranged in the slideway in a sliding way, the chip placing groove is arranged at the top of the sliding table, the detection mechanism is arranged at the top of the support and above the chip placing groove, the controller is arranged on the detection mechanism, the detection mechanism comprises a telescopic motor, a telescopic rod, a limiting device, a detection motor, a detection, the limiting device is arranged on the support, the detection motor is arranged at the bottom of the telescopic rod, the detection heads are symmetrically arranged at the bottom of the detection motor, and the display screen is arranged on the detection motor.
2. The apparatus for detecting the electrical characteristics of a semiconductor chip according to claim 1, wherein: the limiting device comprises a sliding rail and a limiting block, the sliding rail is arranged on the support, and the limiting block is arranged on the sliding rail in a sliding mode.
3. The apparatus for detecting the electrical characteristics of a semiconductor chip according to claim 1, wherein: the controller is electrically connected with the sliding motor, the telescopic motor and the detection motor.
4. The apparatus for detecting the electrical characteristics of a semiconductor chip according to claim 1, wherein: the display screen is electrically connected with the controller.
5. The apparatus for detecting the electrical characteristics of a semiconductor chip according to claim 1, wherein: the detection motor is characterized in that one end of the detection motor is arranged on the limiting block, and the other end of the detection motor is arranged at the bottom of the telescopic rod.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922106285.8U CN211206699U (en) | 2019-11-29 | 2019-11-29 | Semiconductor chip electrical characteristic detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922106285.8U CN211206699U (en) | 2019-11-29 | 2019-11-29 | Semiconductor chip electrical characteristic detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211206699U true CN211206699U (en) | 2020-08-07 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922106285.8U Active CN211206699U (en) | 2019-11-29 | 2019-11-29 | Semiconductor chip electrical characteristic detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211206699U (en) |
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2019
- 2019-11-29 CN CN201922106285.8U patent/CN211206699U/en active Active
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