CN211182148U

CN211182148U - In-situ electron microscope material damage micro-mechanism analysis device

Info

Publication number: CN211182148U
Application number: CN202020089050.2U
Authority: CN
Inventors: 杨小祥; 王玲玲; 吴玉莲; 李颜; 王传真; 李润发
Original assignee: Nantong Li Si Yi Electronics Technology Co ltd
Current assignee: Nantong Li Si Yi Electronics Technology Co ltd
Priority date: 2020-01-16
Filing date: 2020-01-16
Publication date: 2020-08-04
Anticipated expiration: 2030-01-16

Abstract

The utility model relates to a material damage analysis technical field just discloses normal position electron microscope material damage microtechnology analytical equipment, which comprises a fixed base, the top fixed mounting of fixing base has the analysis storehouse, the top fixed mounting in analysis storehouse has the analysis microscope that runs through the analysis storehouse top, the right side fixed mounting in analysis storehouse has a sealed section of thick bamboo, the inside fixed mounting in analysis storehouse has the division board, the top fixed mounting of division board has quantity to be four stoppers, openly and the back two the inside movable mounting of stopper has the movable rod, two the right side fixed mounting of movable rod has the shrouding that is located sealed section of thick bamboo inside. This normal position electron microscope material damages microtechnology analytical equipment, simple structure is reasonable, avoids user's hand power operation, conveniently opens and closes, and it is more convenient to use, and can place reagent and material and accomodate, avoids rubbing the material production among the experimentation and bumps, improves the analysis result accuracy.

Description

In-situ electron microscope material damage micro-mechanism analysis device

Technical Field

The utility model relates to a material damage analysis technical field specifically is an in situ electron microscope material damage micro mechanism analytical equipment.

Background

An electron microscope, referred to as an electron microscope, has become an indispensable important tool in modern science and technology through development for over fifty years, and is composed of a lens cone, a vacuum device and a power supply cabinet, and the application of the electron microscope technology is established on the basis of an optical microscope, the resolution of the optical microscope is 0.2 μm, the resolution of a transmission electron microscope is 0.2nm, that is, the transmission electron microscope is amplified 1000 times on the basis of the optical microscope, and when the novel material is subjected to analysis and detection such as surface wear resistance, the electron microscope is usually used for observation, and the degree of surface damage.

Traditional normal position electron microscope analytical equipment needs the manual work to open the back when using, pulls out the material board, puts in need detect material, and the use convenience is lower, and does not have the storage capacity, and the user can place the analysis material at the desktop usually, causes unexpected wearing and tearing easily, influences the analysis result, so has proposed a normal position electron microscope material damage micro mechanism analytical equipment and has solved the problem that the aforesaid was proposed.

SUMMERY OF THE UTILITY MODEL

Technical problem to be solved

The utility model provides a not enough to prior art, the utility model provides an normal position electron microscope material damages micro mechanism analytical equipment possesses advantages such as convenient to use, has solved traditional normal position electron microscope analytical equipment when using, needs the manual work to open the back, pulls out the material board, puts good to needing the detected material, and the use convenience is lower, and does not possess the storage capacity, and the user can place the analyzed material at the desktop usually, causes unexpected wearing and tearing easily, influences the problem of analysis result.

(II) technical scheme

In order to realize the purpose of convenient use, the utility model provides a following technical scheme: the in-situ electron microscope material damage microscopic mechanism analysis device comprises a fixed seat, wherein an analysis bin is fixedly mounted at the top of the fixed seat, an analysis microscope penetrating the top of the analysis bin is fixedly mounted at the top of the analysis bin, a sealing barrel is fixedly mounted at the right side of the analysis bin, a separation plate is fixedly mounted inside the analysis bin, four limit blocks are fixedly mounted at the top of the separation plate, movable rods are movably mounted inside the limit blocks at the front side and the back side, seal plates located inside the sealing barrel are fixedly mounted at the right sides of the two movable rods, two racks are fixedly mounted at the left side of the seal plates, a speed reduction motor located at the back side of the movable rod at the back side is fixedly mounted at the top of the separation plate, two gears which are respectively meshed with the bottoms of the two racks are fixedly mounted at the output ends of, two the top fixed mounting of rack carries the thing board, the top movable mounting who carries the thing board has quantity to be two location clamp, two the left side fixed mounting of movable rod has with two rack left side fixed connection's connecting plate, the inner wall fixed mounting in analysis storehouse have the top that is located two racks and with the displacement sensor of the top fixed connection of connecting plate, the equal fixed mounting in the inner wall left and right sides in analysis storehouse has the slide rail that is located the division board below, two the relative one side movable mounting of slide rail has the positive material case of running through analysis storehouse.

Preferably, the front of the material box is fixedly provided with a handle, and the left side and the right side of the material box are fixedly provided with wheel plates respectively extending to the inner parts of the two sliding rails.

Preferably, the top of the fixing seat is provided with a fixing hole positioned outside the analysis bin, and the objective end at the bottom of the analysis microscope is positioned right above the object carrying plate.

Preferably, a sealing ring is bonded to the outer portion of the sealing plate, and the outer portion of the sealing plate is matched with the inner wall of the sealing cylinder.

Preferably, the movable rod is connected with the limiting block in a sliding mode, the displacement sensor is a pull rope type displacement sensor, and the pull rope end of the displacement sensor is fixedly connected with the top of the connecting plate.

Preferably, the positioning clamp is hinged to the loading plate, the positioning clamp is an elastic metal clamping piece, and the bottom of the left end of the positioning clamp is bonded with a resistance-increasing rubber sheet.

(III) advantageous effects

Compared with the prior art, the utility model provides an in situ electron microscope material damages micro mechanism analytical equipment possesses following beneficial effect:

the in-situ electron microscope material damage micro mechanism analysis device can pull an animal material box to move the animal material box out of an analysis bin through a slide rail when in use, put a material to be detected and a reagent required by analysis into the material box, drive a gear to rotate by a speed reducing motor, so that a rack moves rightwards, move a sealing plate rightwards under the matching of a movable rod and a limiting block, move a carrying plate out of the analysis bin, detect a displacement distance by a displacement sensor, ensure that the displacement distance is equal to a preset value, a user can fix the material to be detected on the top of the carrying plate through two positioning clamps, drive the carrying plate to return to the bottom of an analysis microscope by the speed reducing motor at the moment, and analyze and detect the material surface damage, has simple and reasonable structure, avoids the hand-pulling operation of the user, is convenient to open and close, is more convenient to use, and can place and, the material is prevented from being rubbed and bumped in the experimental process, and the accuracy of the analysis result is improved.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is an enlarged schematic view of the structure at the position A of the present invention;

fig. 3 is a front view of the present invention.

In the figure: the device comprises a fixed seat 1, an analysis bin 2, an analysis microscope 3, a sealing barrel 4, a separation plate 5, a limiting block 6, a movable rod 7, a sealing plate 8, a rack 9, a speed reduction motor 10, a gear 11, a loading plate 12, a positioning clamp 13, a connecting plate 14, a displacement sensor 15, a sliding rail 16 and a material box 17.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-3, the in-situ electron microscope material damage micro mechanism analysis device comprises a fixed seat 1, an analysis bin 2 is fixedly installed at the top of the fixed seat 1, an analysis microscope 3 penetrating through the top of the analysis bin 2 is fixedly installed at the top of the analysis bin 2, a sealing cylinder 4 is fixedly installed at the right side of the analysis bin 2, a partition plate 5 is fixedly installed inside the analysis bin 2, four limit blocks 6 are fixedly installed at the top of the partition plate 5, movable rods 7 are movably installed inside the two limit blocks 6 at the front and the back, a seal plate 8 located inside the sealing cylinder 4 is fixedly installed at the right side of the two movable rods 7, a seal ring is bonded outside the seal plate 8, the outside of the seal plate 8 is matched with the inner wall of the sealing cylinder 4, two racks 9 are fixedly installed at the left side of the seal plate 8, a speed reduction motor 10 located at the back of the movable, the output end of the speed reducing motor 10 is fixedly provided with two gears 11 which are respectively meshed with the bottoms of the two racks 9, the tops of the two racks 9 are fixedly provided with a carrying plate 12, the top of the fixed seat 1 is provided with a fixed hole positioned outside the analysis bin 2, the objective end at the bottom of the analysis microscope 3 is positioned right above the carrying plate 12, the top of the carrying plate 12 is movably provided with two positioning clamps 13, the positioning clamps 13 are hinged with the carrying plate 12, the positioning clamps 13 are elastic metal clamping pieces, the bottom of the left end of each positioning clamp 13 is bonded with a resistance increasing rubber sheet, the left sides of the two movable rods 7 are fixedly provided with connecting plates 14 fixedly connected with the left sides of the two racks 9, the inner wall of the analysis bin 2 is fixedly provided with displacement sensors 15 which are positioned at the tops of the two racks 9 and fixedly connected with the tops of the connecting plates 14, the movable rods 7 are slidably connected with the limiting blocks 6, and the displacement sensors, the pull rope end of the displacement sensor 15 is fixedly connected with the top of the connecting plate 14, the left side and the right side of the inner wall of the analysis bin 2 are both fixedly provided with slide rails 16 positioned below the partition plate 5, one opposite side of the two slide rails 16 is movably provided with a material box 17 penetrating through the front surface of the analysis bin 2, the front surface of the material box 17 is fixedly provided with a handle, the left side and the right side of the material box 17 are both fixedly provided with wheel plates respectively extending into the two slide rails 16, when in use, the animal material box 17 can be pulled to move out of the analysis bin 2 through the slide rails 16, a material to be detected, a reagent required by analysis and the like are placed in the material box 17, the gear 11 is driven by the speed reducing motor 10 to rotate, so that the rack 9 moves rightwards, under the cooperation of the movable rod 7 and the limiting block 6, the sealing plate 8 moves rightwards, the carrying plate 12 moves out, the user can fix the material of waiting to detect at the top of carrying thing board 12 through two fixation clamps 13, and gear motor 10 drives the bottom that carries thing board 12 and get back to analytical microscope 3 this moment, carries out material surface damage analysis and detection operation, and this device simple structure is reasonable, avoids user's hand power operation, conveniently opens and closes, and it is more convenient to use, and can place reagent and material and accomodate, avoids rubbing the material production in the experimentation and bumps, improves the analysis result accuracy.

In conclusion, when the in-situ electron microscope material damage micro mechanism analysis device is used, the animal material box 17 can be pulled to move out of the analysis bin 2 through the slide rail 16, the material to be detected and reagents required by analysis and the like are placed in the material box 17, the gear 11 is driven by the speed reduction motor 10 to rotate, so that the rack 9 moves rightwards, the sealing plate 8 moves rightwards under the matching of the movable rod 7 and the limiting block 6, the carrying plate 12 moves out of the analysis bin 2, the displacement sensor 15 detects the displacement distance, the displacement distance is equal to the preset value, a user can fix the material to be detected on the top of the carrying plate 12 through the two positioning clamps 13, the carrying plate 12 is driven by the speed reduction motor 10 to return to the bottom of the analysis microscope 3 to analyze and detect the material surface damage, the device is simple and reasonable in structure, avoids manual operation of a user, and is convenient to open and close, use more convenient, and can place reagent and material and accomodate, avoid producing to wipe the material in the experimentation and bump, improve the analysis result accuracy, solved traditional normal position electron microscope analytical equipment when using, need the manual work to open the back, pull out the material board, put the material that needs to detect, it is lower to use the convenience, and does not possess the storage capacity, the user can place the analysis material at the desktop usually, cause unexpected wearing and tearing easily, influence the problem of analysis result.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. In situ electron microscope material damages micro mechanism analytical equipment, including fixing base (1), its characterized in that: the analysis device is characterized in that an analysis bin (2) is fixedly mounted at the top of the fixing seat (1), an analysis microscope (3) penetrating through the top of the analysis bin (2) is fixedly mounted at the top of the analysis bin (2), a sealing barrel (4) is fixedly mounted at the right side of the analysis bin (2), a separation plate (5) is fixedly mounted inside the analysis bin (2), limit blocks (6) with four quantity are fixedly mounted at the top of the separation plate (5), movable rods (7) are movably mounted inside the limit blocks (6) in the front and at the back of the front, a sealing plate (8) positioned inside the sealing barrel (4) is fixedly mounted at the right side of the movable rods (7) for two times, racks (9) with two quantities are fixedly mounted at the left side of the sealing plate (8), and a speed reduction motor (10) positioned at the back of the movable rods, the output end of the speed reducing motor (10) is fixedly provided with two gears (11) which are respectively meshed with the bottoms of the two racks (9), the tops of the two racks (9) are fixedly provided with an object carrying plate (12), the top of the object carrying plate (12) is movably provided with two positioning clamps (13), the left sides of the two movable rods (7) are fixedly provided with connecting plates (14) fixedly connected with the left sides of the two racks (9), the inner wall of the analysis bin (2) is fixedly provided with a displacement sensor (15) which is positioned at the top of the two racks (9) and is fixedly connected with the top of the connecting plate (14), the equal fixed mounting in inner wall left and right sides in analysis storehouse (2) has slide rail (16) that are located division board (5) below, two the relative one side movable mounting of slide rail (16) has material case (17) that run through analysis storehouse (2) openly.

2. The in situ electron microscopy material damage micro-mechanistic analysis device of claim 1, wherein: the front of the material box (17) is fixedly provided with a handle, and the left side and the right side of the material box (17) are fixedly provided with wheel plates respectively extending to the inner parts of the two slide rails (16).

3. The in situ electron microscopy material damage micro-mechanistic analysis device of claim 1, wherein: the top of the fixed seat (1) is provided with a fixed hole positioned outside the analysis bin (2), and the objective end at the bottom of the analysis microscope (3) is positioned right above the object carrying plate (12).

4. The in situ electron microscopy material damage micro-mechanistic analysis device of claim 1, wherein: the outside bonding of shrouding (8) has the sealing washer, the outside and the sealed section of thick bamboo (4) inner wall looks adaptation of shrouding (8).

5. The in situ electron microscopy material damage micro-mechanistic analysis device of claim 1, wherein: the movable rod (7) is connected with the limiting block (6) in a sliding mode, the displacement sensor (15) is a pull rope type displacement sensor, and the pull rope end of the displacement sensor (15) is fixedly connected with the top of the connecting plate (14).

6. The in situ electron microscopy material damage micro-mechanistic analysis device of claim 1, wherein: the positioning clamp (13) is hinged to the loading plate (12), the positioning clamp (13) is an elastic metal clamping piece, and a resistance-increasing rubber sheet is bonded to the bottom of the left end of the positioning clamp (13).