CN210896556U - Micro LED Micro display device - Google Patents

Abstract

The utility model belongs to the technical field of display device, concretely relates to Micro LED miniature display device, including pixel and power supply portion, a plurality of pixels are arranged and are formed pixel portion in the display area, power supply portion sets up around the display area, a plurality of pixels are connected through the power cord, power supply portion passes through power cord output mains voltage, every pixel includes first electrode and second motor, be connected with light emitting component between first electrode and the power cord, the second electrode is connected with pixel circuit, be provided with the inspection transistor between first electrode and the second electrode, the inspection transistor is used for examining the defect of inspection pixel after the control signal switch-on. The utility model discloses can reduce the degree of difficulty of examining out the defective pixel information, help reducing the cost of inspection, improve display device's yields to improve the quality of product.

Description

Micro LED Micro display device

Technical Field

The invention belongs to the technical field of display devices, and particularly relates to a Micro LED Micro display device.

Background

As the information-oriented society develops, the demand for display devices increases, and various types of display devices such as liquid crystal display devices, plasma display devices, and organic light emitting display devices are widely used.

Recently, attention has been directed to high resolution display devices using micro light emitting diodes, also referred to as ˝ micro display device ˝.

Disclosure of Invention

One of the objects of the present invention is: aiming at the defects of the prior art, the Micro LED Micro display device is provided, the difficulty of detecting the defective pixel information can be reduced, the detection cost is reduced, the yield of the display device is improved, and the product quality is improved.

In order to achieve the purpose, the invention adopts the following technical scheme:

a Micro LED Micro display device comprises pixels and a power supply part, wherein a plurality of pixels are arranged in a display area to form a pixel part, the power supply part is arranged around the display area, the pixels are connected through a power line, the power supply part outputs power voltage through the power line, each pixel comprises a first electrode and a second motor, a light-emitting element is connected between the first electrode and the power line, the second electrode is connected with a pixel circuit, an inspection transistor is arranged between the first electrode and the second electrode, and the inspection transistor is used for inspecting the defects of the pixels after an inspection control signal is switched on.

As an improvement of the Micro LED Micro display device according to the present invention, the Micro LED Micro display device further includes a driving unit, the driving unit includes a control unit, a scan driving unit, a data driving unit, an inspection driving unit, and an inspection unit, the control unit controls the scan driving unit, the data driving unit, the power supply unit, the inspection driving unit, and the inspection unit, and the scan driving unit, the data driving unit, the inspection driving unit, and the inspection unit are all connected to the pixel unit.

In an improvement of the Micro LED Micro display device according to the present invention, the inspection unit is disposed between the power supply unit and the power line, and the inspection unit inspects a current of the power line when the inspection transistor is turned on.

The invention has the beneficial effects that the invention comprises pixels and a power supply part, wherein a plurality of pixels are arranged in a display area to form a pixel part, the power supply part is arranged around the display area, the pixels are connected through a power line, the power supply part outputs power voltage through the power line, each pixel comprises a first electrode and a second motor, a light-emitting element is connected between the first electrode and the power line, the second electrode is connected with a pixel circuit, and an inspection transistor is arranged between the first electrode and the second electrode and is used for inspecting the defects of the pixels after an inspection control signal is switched on.

Drawings

FIG. 1 is a schematic structural diagram of a display device according to the present invention;

FIG. 2 is a circuit diagram of a pixel according to the present invention;

FIG. 3 is a circuit diagram of the power supply of the present invention;

wherein: 110-a pixel section; 121-a control section; 122-scan drive section; 123-a data driving part; 124-power supply part; 125-inspection drive; 126-inspection section.

Detailed Description

As used in the specification and in the claims, certain terms are used to refer to particular components. As one skilled in the art will appreciate, manufacturers may refer to a component by different names. This specification and claims do not intend to distinguish between components that differ in name but not function. In the following description and in the claims, the terms "include" and "comprise" are used in an open-ended fashion, and thus should be interpreted to mean "include, but not limited to. "substantially" means within an acceptable error range, and a person skilled in the art can solve the technical problem within a certain error range to substantially achieve the technical effect.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", horizontal ", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention.

In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

The present invention will be described in further detail below with reference to the accompanying drawings, but the present invention is not limited thereto.

Example 1

As shown in fig. 1 to 3, a Micro LED Micro display device includes a pixel and a power supply unit 124, wherein a plurality of pixels are arranged in a display region to form a pixel unit 110, the power supply unit 124 is disposed around the display region, the plurality of pixels are connected by a power line, the power supply unit 124 outputs a power voltage through the power line, each pixel includes a first electrode and a second motor, a light emitting element is connected between the first electrode and the power line, a pixel circuit is connected to the second electrode, and an inspection transistor is disposed between the first electrode and the second electrode, and the inspection transistor is used for inspecting defects of the pixel after an inspection control signal is turned on.

Preferably, the micro display device further includes a driving unit, the driving unit includes a control unit 121, a scan driving unit 122, a data driving unit 123, an inspection driving unit 125, and an inspection unit 126, the control unit 121 controls the scan driving unit 122, the data driving unit 123, the power supply unit 124, the inspection driving unit 125, and the inspection unit 126, and the scan driving unit 122, the data driving unit 123, the inspection driving unit 125, and the inspection unit 126 are all connected to the pixel unit 110; the inspection unit 126 is provided between the power supply unit 124 and the power supply line, and the inspection unit 126 inspects the current of the power supply line when the inspection transistor is turned on.

The display device may include: the light emitting device comprises a light emitting element array and a driving circuit substrate. The light emitting element array may be combined with the driving circuit substrate. The display device may be a micro display device.

The light emitting device array may include a plurality of light emitting devices. The light emitting elements may be light emitting diodes, LEDs. The light emitting element may be a micro or nano unit size light emitting diode LED. A plurality of light emitting diodes may be grown on a semiconductor wafer to fabricate at least one light emitting device array. Therefore, the display device can be manufactured by combining the light emitting element array and the driving circuit substrate without transferring the light emitting diodes individually to the driving circuit substrate.

The pixel circuits each corresponding to the light emitting diode on the light emitting element array may be arranged on the driving circuit substrate. The light emitting diodes on the light emitting element array and the pixel circuits on the driving circuit substrate may constitute pixels in an electrically connected manner.

The pixel part 110 may be disposed in the image display region. The pixel part 110 may include: for example, a plurality of pixels PX arranged in various forms such as a matrix shape, a zigzag shape, and the like. The pixel PX emits one color, for example, one color among red, cyan, green, and white. The pixel PX may emit other colors in addition to red, cyan, green, and white.

The pixel PX may include a light emitting element. The light emitting element may be a sub light emitting element. For example, the light emitting elements may be light emitting diodes, LEDs. The light-emitting element may emit light of a single peak wavelength or may emit light of a plurality of peak wavelengths.

The pixel PX may further include a pixel circuit connected to the light emitting element. The pixel circuit may include at least one thin film transistor and at least one capacitor, etc. The pixel circuit may be implemented in a semiconductor stacked structure on a substrate.

The pixel part 110 may include: a scan line SL SLn for applying a scan signal to the pixels PX, a light emission control line EL-ELn for applying a light emission control signal to the pixels PX, and a data line DL-DLm for applying a data signal to the pixels PX. In addition, the pixel section 110 may include inspection control lines CL-CLn that apply inspection control signals to the pixels PX.

The scan lines SL to SLn and the emission control lines EL to ELn are each connected to the pixels PX arranged in the same row, and the data lines DL to DLm are each connected to the pixels PX arranged in the same column.

The driving unit includes a non-display region around the pixel unit 110, and can drive and control the pixel unit 110. The driving part may include: a control unit 121, a scan driving unit 122, a data driving unit 123, a power supply unit 124, an inspection driving unit 125, and an inspection unit 126. The drive unit operates according to a drive mode and an inspection mode.

In the driving mode, the scan driving unit 122 may sequentially apply scan signals to the scan lines SL to SLn and the data driving unit 123 may apply data signals to the respective pixels PX under the control of the control unit 121. Under the control of the control section 121, the scan driving section 122 may sequentially apply a light emission control signal to the light emission control lines EL to ELn. The pixels PX at this time respond to the scan signals received through the scan lines SL-SLn and emit light with a luminance corresponding to the voltage level or the current level of the data signals received through the data lines DL-DLm.

In the inspection mode, under the control of the control section 121, the scan driving section 122 may sequentially apply scan signals to the scan lines SL to SLn, and the data driving section 123 may apply an inspection signal to each pixel PX. Under the control of the control section 121, the scan driving section 122 may sequentially apply a light emission control signal to the light emission control lines EL to ELn. The inspection driving part 125 may apply an inspection control signal to each pixel PX under the control of the control part 121.

The power supply unit 124 receives an external power supply and/or an internal power supply, converts various voltages to meet operation requirements of various components, and supplies corresponding voltages to the pixel unit 110 according to a power control signal input from the control unit 121.

The power supply section 124 may generate and apply the first power voltage VDD to the pixel section 110. The power supply unit 124 may generate and apply driving voltages to the scan driving unit 122, the data driving unit 123, and the inspection driving unit 125.

The inspection unit 126 measures a current flowing through the power supply line while the first power supply voltage VDD is applied to the pixel unit 110 by the power supply unit 124 in the inspection mode. The inspection portion 126 may be provided with a current measurement circuit for measuring a current. The inspection section 126 measures a current for each row line of the pixel section 110, and compares the measured current value with a standard current value corresponding to an inspection signal. The inspection unit 126 may determine that a defect exists in the pixel circuit of at least one pixel PX in the pixels PX in the relevant row when the difference between the measured current value and the standard current value is equal to or greater than the threshold value.

The controller 121, the scan driver 122, the data driver 123, the power supply 124, and the inspection driver 125 are formed as separate integrated circuit chips or a single integrated circuit chip, and then directly disposed on the substrate on which the pixel portion 110 is formed, or may be attached to a flexible substrate circuit, a TCP substrate, or directly formed on the substrate.

The description will be given by taking the pixel PX of the nth row and the mth column as an example. The pixel PX is one of a plurality of pixels included in the nth row, and is connected to the scan line SLn corresponding to the nth row and the data line DLm corresponding to the mth column.

The pixels PX may be connected to scan lines SLn transmitting scan signals, data lines DLm transmitting data signals crossing the scan lines SLn, and power lines VL transmitting the first power voltage VDD.

The pixel PX may include: a light emitting diode LED and a pixel circuit connected to the light emitting diode LED. The pixel circuit may include: first to third transistors T3 to T, a capacitor C, and a check transistor TT.

The first transistor T1 may include: a gate electrode connected to the first electrode of the capacitor C, a first electrode connected to the light emitting diode LED through the third transistor T3, and a second electrode connected to the second power supply voltage VSS. The second power supply voltage VSS may be a ground voltage GND. The first transistor T1 functions as a driving transistor for supplying current to the light emitting diode LED upon receiving a data signal according to the switching operation of the second transistor T2.

The second transistor T2 may include: a gate electrode connected to the scan line SLn, a first electrode connected to the data line DLm, and a second electrode connected to the gate electrode of the first transistor T1. The second transistor T2 will function as a switching transistor which transmits a data signal received through the data line DLm to the gate electrode of the first transistor T1 after receiving a scan signal through the scan line SLn and being successfully turned on.

The third transistor T3 may include: a gate electrode connected to the emission control line ELn, a first electrode connected to the second electrode of the light emitting diode LED, and a second electrode connected to the first electrode of the first transistor T1. The third transistor T3 may flow the driving current of the first transistor T1 at the light emitting diode LED after receiving the light emission control signal through the light emission control line ELn and being successfully turned on. The light emission control line ELn is connected to the scan driving section 122, and receives a light emission control signal from the scan driving section 122. In another embodiment, the light emitting control line ELn may be connected to the scan driving part 122 and the independent light emitting control driving part, not shown, and then receive the light emitting control signal.

The capacitor C may include: a first electrode connected to the gate electrode of the first transistor T1, and a second electrode connected to the second power supply voltage VSS.

The first electrode of the light emitting diode LED may obtain the first power voltage VDD from the power line VL. A second electrode of the light emitting diode LED may be connected to a first electrode of the third transistor T3. The light emitting diode LED displays an image with luminance corresponding to the data signal. The light emitting diode LED may not emit light in the inspection mode.

The checking of the transistor TT may include: a gate electrode connected to the inspection control line CLn, and first and second electrodes connected to the first and second electrodes of the light emitting diode LED, respectively. The inspection transistor TT is in an on state in the inspection mode and in an off state in the driving mode.

Each pixel PX is electrically connected to a power supply line VL, and an inspection unit 126 is provided between the power supply line VL and the power supply unit 124.

The power line VL crosses the first power line VL and the first power line arranged in a row unit, and may include a second power line VL connected to the first power line VL.

After the scanning signals S to Sn are sequentially applied to the pixel unit 110 through the scanning lines SL to SLn in units of a row, the scanning signals S to Sn are responded in time and the inspection signals are applied to the data lines DL to DLm. Next, light emission control signals E to En are sequentially applied to the pixel section 110 through the light emission control lines EL to ELn. The inspection control signal Test may be applied to the pixel part 110 through the inspection control lines CL to CLn. When the scan signals S to Sn are sequentially applied to the pixel section 110 through the scan lines SL to SLn, the inspection control signal Test may be applied to all the pixels PX of the pixel section 110. The inspection transistor TT is turned on by the inspection control signal Test, and a current flows from the power supply line VL connected to the power supply unit 124 to the ground GND via the inspection transistor TT, the third transistor T3, and the first transistor T1. The current measurement circuit of the inspection section 126 can measure the current Itest flowing through the power supply line VL.

The inspection unit 126 can determine that at least one of the pixels PX in the relevant row has a defect when the difference between the measured current Itest and the standard current is equal to or greater than a threshold value after comparing the current Itest measured in row units with the standard current corresponding to the inspection signal. The pixel defect may be a pixel circuit defect.

The pixel part 110 may be arranged in the image display region. The pixel section 110 may include a plurality of pixels PX arranged in a predetermined form, for example, a matrix shape, a zigzag shape, and the like in various forms. The pixel PX emits one color, for example, one color among red, cyan, green, and white. The pixel PX may emit other colors in addition to red, cyan, green, and white.

The pixel PX may include a light emitting element. The light emitting element may be a sub light emitting element. For example, the light emitting elements may be light emitting diodes, LEDs. The light emitting element may be a micro or nano unit size light emitting diode LED. The light emitting element may emit light of a single peak wavelength or may emit light within a plurality of peak wavelengths.

The pixel PX may further include a pixel circuit connected to the light emitting element. The pixel circuit may include at least one thin film transistor and at least one capacitor, etc. The pixel circuit may be implemented in a semiconductor stacked structure on a substrate.

The pixel part 110 may include: a pulse line plplpln for applying a PWM signal to the pixels PX, and an inspection control line CL-CLn for applying an inspection control signal to the pixels PX. The pulse lines PL to PLn and the inspection control lines CL to CLn are each connected to pixels PX arranged in the same row.

The driving portion is located in a non-display region around the pixel portion 110, and can drive and control the pixel portion 110. The driving part may include: a control unit 121, a PWM driving unit, a current supply unit, a power supply unit 124, an inspection driving unit 125, and an inspection unit 126. The drive unit operates according to a drive mode and an inspection mode.

In the driving mode, the PWM driving unit may sequentially apply the PWM signal to the pulse lines PL to PLn and the current supply unit may apply the current Iref to each pixel PX under the control of the control unit 121. The pixels PX emit light at a luminance according to the PWM signal received by the PWM driving part.

In the inspection mode, the PWM driving section sequentially applies a PWM signal of a predetermined bit to the pulse lines PL to PLn under the control of the control section 121, and the current supply section can apply a current Iref to each pixel PX. The inspection driving part 125 may apply an inspection control signal to each pixel PX under the control of the control part 121.

The current supply part may include a plurality of current sources that supply current to each column of the pixel part 110.

The power supply section 124 may generate and apply the first power voltage VDD to the pixel section 110. The power supply unit 124 may generate and apply a driving voltage to the PWM driving unit and the inspection driving unit 125.

The inspection unit 126 measures a current flowing through the power supply line while the power supply unit 124 applies the first power supply voltage VDD to the pixel unit 110 in the inspection mode. The inspection unit 126 is configured with a current measurement circuit for measuring a current. The inspection section 126 measures a current for each row line of the pixel section 110, and compares the measured current value with a standard current value corresponding to an inspection signal. The inspection section 126 may determine that the pixel circuit of at least one pixel PX in the relevant row of pixels PX has a defect, if the difference between the measured current value and the standard current value is greater than or equal to a critical value.

The control unit 121, the PWM driving unit, the current supply unit, the power supply unit 124, and the inspection driving unit 125 are each configured as an independent integrated circuit chip or a single integrated circuit chip, and then directly mounted on the upper surface of the substrate on which the pixel unit 110 is formed, or may be attached to the upper surface of a flexible substrate circuit, attached to the substrate by a TCP method, or directly formed in the substrate.

Example 2

As shown in fig. 1 to 3, a method for inspecting a Micro LED Micro display device includes:

sending a check signal to the pixel circuit and then turning on the check transistor;

detecting the current of a power line through a checking transistor to obtain a measuring current;

and comparing the measured current with the standard current to judge whether the pixel has defects.

Preferably, the standard current corresponds to the check signal.

Variations and modifications to the above-described embodiments may also occur to those skilled in the art, which fall within the scope of the invention as disclosed and taught herein. Therefore, the present invention is not limited to the above-mentioned embodiments, and any obvious improvement, replacement or modification made by those skilled in the art based on the present invention is within the protection scope of the present invention. Furthermore, although specific terms are employed herein, they are used in a generic and descriptive sense only and not for purposes of limitation.

Claims (3)

1. A Micro LED Micro display device is characterized in that: includes a pixel and a power supply unit

(124) A plurality of pixels arranged in the display region to form a pixel part (110), and a power supply part (124)

A plurality of pixels arranged around the display region and connected via power lines to supply power

A unit (124) for outputting a power supply voltage via the power supply lines, each of the pixels including a first electrode and a second electrode

A light emitting element connected between the first electrode and the power line, and an image connected to the second electrode

A pixel circuit having a check transistor disposed between the first and second electrodes, the check transistor

The tube is used for inspecting the pixel for defects after being switched on by the inspection control signal.

2. A Micro LED microdisplay device according to claim 1 in which: the micro-scale

The display device further includes a driving unit including a control unit (121), a scanning driving unit (122),

A data driving unit (123), an inspection driving unit (125), and an inspection unit (126), wherein the control unit (121) controls the inspection unit

The scan driving unit (122), the data driving unit (123), the power supply unit (124), and the inspection unit

A drive unit (125) and the inspection unit (126), the scan drive unit (122) and the data drive unit

(123) The inspection driving unit (125) and the inspection unit (126) are connected to the pixel unit (110).

3. A Micro LED microdisplay device according to claim 2 in which: the detection is carried out

An inspection unit (126) is provided between the power supply unit (124) and the power line, the inspection unit (126) being provided between the power supply unit (124) and the power line

When the inspection transistor is turned on, the current of the power supply line is inspected.

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