CN210863961U - Microswitch testing device - Google Patents

Microswitch testing device Download PDF

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Publication number
CN210863961U
CN210863961U CN201921277677.4U CN201921277677U CN210863961U CN 210863961 U CN210863961 U CN 210863961U CN 201921277677 U CN201921277677 U CN 201921277677U CN 210863961 U CN210863961 U CN 210863961U
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CN
China
Prior art keywords
microswitch
action
testing device
controller
fixing clamp
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CN201921277677.4U
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Chinese (zh)
Inventor
赵波
廖星庆
凌勇
康扬
罗兴涛
刘爽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gree Electric Appliances Inc of Zhuhai
Gree Wuhan Electric Appliances Co Ltd
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Gree Electric Appliances Inc of Zhuhai
Gree Wuhan Electric Appliances Co Ltd
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Application filed by Gree Electric Appliances Inc of Zhuhai, Gree Wuhan Electric Appliances Co Ltd filed Critical Gree Electric Appliances Inc of Zhuhai
Priority to CN201921277677.4U priority Critical patent/CN210863961U/en
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Publication of CN210863961U publication Critical patent/CN210863961U/en
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Abstract

The application relates to a microswitch testing device, and belongs to the technical field of testing devices. The application includes: the fixing clamp is provided with a first positioning mechanism for positioning and fixing the microswitch; the machine table is provided with a second positioning mechanism for positioning and fixing the fixing clamp, and the fixing clamp is detachably positioned and installed in the second positioning mechanism; the contact mechanism is arranged on the machine table and used for performing reciprocating motion, and the reciprocating motion performs one contact action on an action reed of the microswitch positioned and fixed in the first positioning mechanism every time so as to enable the microswitch to perform one conduction action; and the controller is used for controlling the touch mechanism to repeatedly execute touch action. Through the application, the micro switches with different shapes and structures can be repeatedly subjected to on-off action testing, so that the requirement of repeated on-off action service life reliability testing of the micro switches with different shapes and structures can be met.

Description

Microswitch testing device
Technical Field
This application belongs to testing arrangement technical field, concretely relates to micro-gap switch testing arrangement.
Background
As shown in fig. 1, fig. 1 shows a structural schematic of a micro switch, in which an external force is applied to an action reed 11 of the micro switch 1 to make the action reed 11 act toward a movable contact 12 disposed opposite to the action reed, and a pressure is applied to the movable contact to achieve conduction of the micro switch, and when the external force applied to the action reed is removed, the micro switch returns to a normal state. In practical application, the micro switch can be applied to electrical equipment, taking the application to an air conditioner as an example, the micro switch is used for conversion control of a motion mechanism inside the air conditioner, for example, rotation of an air outlet frame of a cylindrical cabinet machine and connection rod driving of a split machine driving box, once the micro switch fails, the corresponding mechanism cannot effectively convert the state, and accordingly, the air conditioner cannot normally work. Therefore, the reliability of the microswitch operation needs to be effectively ensured.
SUMMERY OF THE UTILITY MODEL
For overcoming the problem that exists among the correlation technique at least to a certain extent, this application provides micro-gap switch testing arrangement, can change different micro-gap switch's mounting fixture, carries out the test of break-make action repeatedly to the micro-gap switch of different shape structures.
In order to achieve the purpose, the following technical scheme is adopted in the application:
the application provides a micro-gap switch testing arrangement includes:
the fixing clamp is provided with a first positioning mechanism for positioning and fixing the microswitch;
the machine table is provided with a second positioning mechanism for positioning and fixing the fixing clamp, and the fixing clamp is detachably positioned and installed in the second positioning mechanism;
the contact mechanism is arranged on the machine table and used for performing reciprocating motion, and the reciprocating motion performs one contact action on an action reed of the microswitch positioned and fixed in the first positioning mechanism every time so as to enable the microswitch to perform one conduction action;
and the controller is used for controlling the touch mechanism to repeatedly execute the touch action.
Further, the second positioning mechanism includes:
the fixing clamp comprises a plurality of stopping parts formed on the machine table, wherein the stopping parts form stopping spaces, and the stopping spaces are used for forming corresponding stopping for the fixing clamp when the fixing clamp is placed in the stopping spaces.
Further, a first magnet part is embedded in the fixing clamp, correspondingly, under the condition that the fixing clamp is placed in the stopping space, a second magnet part is embedded in the position, corresponding to the first magnet part, of the machine table, and the first magnet part and the second magnet part can be mutually attracted.
Further, the touch mechanism includes:
a cylinder;
the contact pressure head is arranged at the movable end of the air cylinder; and
and the electromagnetic valve is used for receiving a driving signal of the controller and driving the air cylinder to reciprocate so as to enable the contact pressure head to contact and position the action reed of the microswitch fixed in the first positioning mechanism.
Further, the microswitch testing device further comprises:
and the counter is connected with the controller and is used for recording the times of the touch action repeatedly executed by the touch mechanism under the control of the controller.
Further, the microswitch testing device further comprises:
and the HMI is connected with the controller.
Further, the microswitch testing device further comprises:
and the alarm is connected with the controller.
Further, the alarm includes: an audible alarm, and/or a light alarm.
Further, the controller comprises a PLC controller.
Further, the micro switch is electrically connected to the controller.
This application adopts above technical scheme, possesses following beneficial effect at least:
the application provides a micro-gap switch testing arrangement, mounting fixture detachably location is installed in the second positioning mechanism on the board, in concrete application, to different micro-gap switches, can correspond and change different mounting fixtures, then touch the mechanism through controller control and carry out repeated touch to the micro-gap switch's of fixing in mounting fixture action reed in location, the realization is to the micro-gap switch of different shape structures break-make action test repeatedly, thereby help the micro-gap switch who satisfies different shape structures to break-make action life reliability test's demand repeatedly.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a micro switch provided in an embodiment of the present application;
FIG. 2 is an isometric view of a microswitch testing device provided in one embodiment of the present application;
FIG. 3 is an enlarged view of the point A in FIG. 2;
FIG. 4 is an isometric view of a microswitch testing device provided in another embodiment of the present application;
FIG. 5 is an enlarged view of the point B in FIG. 4;
FIG. 6 is a schematic view of a control portion of a microswitch testing device provided in one embodiment of the present application;
FIG. 7 is a schematic view of a touch down mechanism provided in accordance with an embodiment of the present application;
FIG. 8 is a schematic view of a control portion of a microswitch testing device according to another embodiment of the present application;
in the figure, the position of the upper end of the main shaft,
1-a micro-switch, which is connected with a micro-switch,
11-action reed, 12-moving contact;
2-a micro-switch testing device which comprises a micro-switch testing device,
21-fixing clamp, 22-machine table, 23-touch mechanism, 24-controller, 25-counter, 26-HMI, 27-alarm,
201-first positioning mechanism, 202-second positioning mechanism, 203-first magnet component, 204-second magnet component, 205-air cylinder, 206-pressure contact head, 207-electromagnetic valve.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be described in detail below. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the examples given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1 to 7, in which fig. 1 is a schematic structural diagram of a micro switch according to an embodiment of the present application; FIG. 2 is an isometric view of a microswitch testing device provided in one embodiment of the present application; FIG. 3 is an enlarged view of the point A in FIG. 2; FIG. 4 is an isometric view of a microswitch testing device provided in another embodiment of the present application; FIG. 5 is an enlarged view of the point B in FIG. 4; FIG. 6 is a schematic view of a control portion of a microswitch testing device provided in one embodiment of the present application; fig. 7 is a schematic view of a pressing mechanism according to an embodiment of the present application.
As shown in fig. 1 to 7, the microswitch testing device 2 comprises:
the fixing clamp 21 is provided with a first positioning mechanism 201 for positioning and fixing the microswitch 1 on the fixing clamp 21;
a machine table 22, wherein a second positioning mechanism 202 for positioning and fixing the fixing clamp 21 is formed on the machine table 22, and the fixing clamp 21 is detachably positioned and installed in the second positioning mechanism 202;
the touch mechanism 23 is installed on the machine table 22, the touch mechanism 23 is used for performing reciprocating motion, and each reciprocating motion performs one touch action on the action reed 11 of the microswitch 1 positioned and fixed in the first positioning mechanism 201, so that the microswitch 1 performs one conduction action;
and the controller 24 is used for controlling the touch mechanism 23 to repeatedly execute the touch action.
In practical application, the micro-gap switch 1 has different shape structures, in order to adapt to the testing of the service life of the on-off action of the micro-gap switch 1 with different shape structures, the scheme of the embodiment provides that the fixing clamp 21 is detachably positioned and installed in the second positioning mechanism 202 on the machine table 22, different testing clamps correspondingly position and fix the micro-gap switch 1 with different shape structures, and the requirements of the testing of the service life of the on-off action of different micro-gap switches 1 are met by replacing the fixing clamps 21 of different micro-gap switches 1. Taking the microswitch 1 shown in fig. 1 as an example, the first positioning mechanism 201 in the fixing jig 21 shown in fig. 2 to 5 is matched with the microswitch 1, the microswitch 1 is positioned and fixed in the first positioning mechanism 201, the first positioning mechanism 201 forms a constraint limit on the microswitch 1, and even when an external force is applied to the action reed 11 of the microswitch 1, the microswitch 1 is kept in an initial positioning and fixing state under the constraint limit of the first positioning mechanism 201. In a specific application, the micro switch 1 and the first positioning mechanism 201 disposed thereon may be in a clearance fit relationship, and the fit relationship can form a better constraint limiting effect on the micro switch 1. As for the first positioning mechanism 201, the structure may be a positioning groove structure matched with the micro switch 1 as specifically shown in fig. 3 and 5, and when the micro switch 1 is placed in the positioning groove structure, the action reed 11 of the micro switch 1 faces the touch mechanism 23 outward, so that the touch mechanism 23 can touch and press the action reed 11. In a specific application, the first positioning mechanism 201 may also have a cavity structure, the cavity structure forms an opening on the surface of the fixing fixture 21 for taking and placing the micro switch 1, the cavity structure matches with the shape of the micro switch 1, and when the micro switch 1 is placed, the action reed 11 of the micro switch 1 faces the touch mechanism 23 outwards, so that the touch mechanism 23 can touch and press the action reed 11.
In a specific application, the controller 24 may be a PLC controller, for example, a PLC controller having a human-computer interaction function in the related art, and the PLC controller has a setting key and a display screen, so that a user can perform related settings for controlling the touch mechanism 23, for example, two ten thousand driving signals are sent to the touch mechanism 23 through the PLC controller setting, and the touch mechanism 23 is controlled to perform two ten thousand touch actions on the action reed 11 of the micro switch 1. In practical applications, the positional relationship between the contact mechanism 23 and the fixing jig 21 needs to be set in advance, and the contact mechanism 23 can perform the contact operation on the actuation reed 11 of the micro switch 1 to turn on the micro switch 1. After completing two ten thousand touch actions, a user can take down the microswitch 1 and connect the microswitch 1 in a prepared test circuit, and confirm whether the test circuit is conducted or not through manually touching the action reed 11 of the microswitch 1, for example, a test circuit is formed by a power supply and an indicator lamp and is connected to the microswitch 1 to form a series circuit with the power supply and the indicator lamp, and confirm whether the indicator lamp is lighted or not through manually touching the action reed 11 of the microswitch 1, if the indicator lamp is lighted, the on-off action life test of the microswitch 1 is qualified, otherwise, the on-off action life test of the microswitch 1 is unqualified.
Through the scheme of the above-mentioned related embodiment, as shown in fig. 4, the fixing clamp 21 is detachably positioned and installed in the second positioning mechanism 202 on the machine table 22, in specific application, for different micro switches 1, different fixing clamps 21 can be correspondingly replaced, then the touch mechanism 23 is controlled by the controller 24 to repeatedly touch and press the action reed 11 of the micro switch 1 fixed in the fixing clamp 21, so as to realize repeated on-off action test on the micro switches 1 with different shapes, thereby being beneficial to meeting the requirement of repeated on-off action life reliability test on the micro switches 1 with different shapes, further being beneficial to improving the incoming material quality control of the micro switches 1, being beneficial to front end switching of target application products (such as air conditioners), and reducing the after-sale failure rate of the target application products.
As shown in fig. 2 and 4, in one embodiment, the second positioning mechanism 202 includes:
the plurality of stopping portions are formed on the machine table 22, and form a stopping space, and the stopping space is used for forming corresponding stopping for the fixing clamp 21 when the fixing clamp 21 is placed in the stopping space.
In a specific application of the above embodiment, as shown in fig. 2 and 4, a plurality of stopping portions are disposed on the machine table 22, a stopping space is formed by the plurality of stopping portions, and when the fixing clamp 21 is placed in the stopping space, the plurality of stopping portions form corresponding stopping for the fixing clamp 21, for example, the corresponding stopping may be to keep the fixing clamp 21 in an initial positioning and fixing state, or for example, as shown in fig. 2 and 4, stopping portions are formed on two sides of the fixing clamp 21 on the machine table 22 to stop two sides of the fixing clamp 21. In a specific application, the fixing clip 21 and the stopping space for placing the fixing clip may be in a clearance fit relationship, and the fit relationship can provide a better constraint and limit effect for the fixing clip 21.
Further, a first magnet part 203 is embedded on the fixing clamp 21, and correspondingly, under the condition that the fixing clamp 21 is placed in the stopping space, a second magnet part 204 is embedded on the machine table 22 at a position corresponding to the first magnet part 203, wherein the first magnet part 203 and the second magnet part 204 can be attracted to each other.
Through the above embodiment, the fixing clamp 21 may be attracted to the machine table 22, and the fixing clamp 21 may also be positioned and fixed, for example, two first magnet components 203 are disposed on the fixing clamp 21 shown in fig. 4, and correspondingly, two second magnet components 204 are also disposed on the machine table 22. In a specific application, for the arrangement of the plurality of stopping portions, the stopping portion may not be arranged on one side of the fixing clamp 21, and in particular, refer to the case shown in fig. 4. Fix on board 22 through mounting fixture 21 magnetism, compensate this certain side that does not set up the backstop portion, can not backstop the not enough of restraint, simultaneously, utilize this certain side that does not set up the backstop portion, can be convenient for take out mounting fixture 21 from the backstop space.
As shown in fig. 7, in one embodiment, the pressing mechanism 23 includes:
a cylinder 205;
a contact head 206 disposed at a movable end of the cylinder 205; and
and the electromagnetic valve 207 is used for receiving a driving signal of the controller 24 and driving the air cylinder 205 to perform reciprocating operation so that the contact head 206 contacts and positions the action reed 11 of the microswitch 1 fixed in the first positioning mechanism 201.
In specific application, the cylinder 205 is driven by compressed air to realize reciprocating operation, the electromagnetic valve 207 can be connected to a compressed air interface of a plant, the electromagnetic valve 207 of the controller 24 drives the cylinder 205 to reciprocate through a driving signal sent by the controller 24, so as to drive the contact pressure head 206 arranged at the movable end of the cylinder 205 to correspondingly reciprocate, and the contact pressure head 206 contacts the action reed 11 of the microswitch 1 positioned and fixed in the first positioning mechanism 201 through reciprocating motion.
In practical application, the touch mechanism 23 can also adopt a screw motor to realize reciprocating motion.
As shown in fig. 8, in one embodiment, the microswitch testing device 2 further comprises:
and a counter 25 connected to the controller 24, wherein the counter 25 is used for recording the number of times that the controller 24 controls the touch mechanism 23 to repeatedly perform the touch action.
In specific application, when the controller 24 sends a driving signal to the touch mechanism 23 every time, a counting signal can be sent to the counter 25, so that the counter 25 counts and displays the counting, and a user can see the counting displayed on the counter 25 and know where the on-off action life test of the microswitch 1 is carried out in real time, for example, the user sets to carry out the on-off action life test for 2 ten thousand times, and then the user leaves the meeting, and after the user returns, the user can know that the on-off action life test of the microswitch 1 has been carried out by one fourth by checking the displayed counting on the counter 25, for example, the display 5000 is carried out, so that the user can know that the on-off action life test of the microswitch 1.
As shown in fig. 8, in one embodiment, the microswitch testing device 2 further comprises:
and an HMI26 coupled to the controller 24.
HMI26 is an abbreviation for Human Machine Interface, in Chinese: human-machine interface, also called human-machine interface. In a specific application, human-computer interaction operation can be performed through the HMI26, for example, a user can start test operation, pause test operation and the like through a virtual key on an HMI26 interface, and for example, the user can set a target number of on-off action life tests of the microswitch 1 on the HMI 26.
As shown in fig. 8, in one embodiment, the microswitch testing device 2 further comprises:
and an alarm 27 connected with the controller 24.
Further, the alarm 27 includes: an audible alarm, and/or a light alarm.
The alarm 27 can indicate the current operating state, for example, when the test is completed, an alarm can be given, for example, when a fault occurs, an alarm can be given, and so on.
In one embodiment, the microswitch 1 is electrically connected to the controller 24.
In a specific application, taking the PLC controller 24 as an example, the PLC controller 24 has a signal terminal interface, and connects the micro switch 1 with the signal terminal interface of the PLC controller 24, when the micro switch 1 is closed and turned on, the signal terminal interface receives a turn-on signal, and the receipt of the turn-on signal indicates that there is no problem in the current test of the micro switch 1, and the controller 24 can form a history record of normal test in the HMI26 every time it receives the turn-on signal.
Through the related embodiment, in practical application, after a user sets the test times, the micro-switch testing device 2 operates according to the set test times, and after the test times are reached, the micro-switch testing device 2 stops operating. For example, the user sets in the controller 24 to send a driving signal to the touch mechanism 23 twice ten thousand times, controls the touch mechanism 23 to perform touch actions twice ten thousand times on the action reed 11 of the micro switch 1, and stops the micro switch testing device 2 after completing the touch actions twice ten thousand times. After the two-thousand repeated on-off action test is completed, the micro switch testing device 2 is supposed to operate two-thousand touch and press actions under the condition that the micro switch 1 is qualified. And for the situation that the microswitch 1 is unqualified after the two thousand repeated on-off action tests are finished, the microswitch testing device 2 runs two thousand contact actions to form waste, so that the testing efficiency is reduced.
In order to improve the testing efficiency, the following related embodiment schemes are further provided in the application.
In one embodiment, the controller 24 is further configured to:
acquiring target test times set by a user, and interval duration and duration of transmission of a driving signal;
sending the driving signal to the touch mechanism 23 according to the interval duration and the duration to control the touch mechanism 23 to execute the touch action;
determining whether the microswitch 1 forms a conducting signal during the execution of the touch action;
and carrying out corresponding processing according to the determined result.
Through the above embodiment scheme, in specific application, taking the PLC controller 24 as an example, the PLC controller 24 has a signal terminal interface, and connects the microswitch 1 with the signal terminal interface of the PLC controller 24, when the microswitch 1 is closed and switched on, the signal terminal interface receives a switching-on signal, and the reception of the switching-on signal indicates that there is no problem in the current test of the microswitch 1, that is, the current test is qualified.
By determining whether the microswitch 1 forms a conduction signal during the execution of the current touch action, it can be said whether the current test of the microswitch 1 is qualified, if it is determined that the microswitch 1 forms a conduction signal, it is said that the current test of the microswitch 1 is qualified, and if it is determined that the microswitch 1 does not form a conduction signal, it is said that the current test of the microswitch 1 is unqualified. Whether the micro switch 1 that determines forms the result that switches on the signal carries out corresponding processing, can realize in the action is pressed to a certain time, what determine is that micro switch 1 does not form and switches on the signal, carries out the pertinence and handles, makes the test action of pressing to touch and can not form extravagantly, and then helps promoting efficiency of software testing.
Further, the performing corresponding processing according to the determined result includes:
if the micro switch 1 is determined to form a conducting signal, judging whether the frequency of sending the driving signal reaches the target test frequency;
if the target test times are not reached, returning to the step of sending the driving signal to the touch mechanism 23 according to the interval duration and the duration;
and if the target test times are reached, confirming that the microswitch 1 is qualified in test, and prompting that the microswitch 1 is qualified in test.
Specifically, for example, the user sets the number of target tests to be twenty thousand, and in the process of executing the touch operation, if it is determined that the microswitch 1 forms the on signal, it is triggered and determined whether the number of times of sending the driving signal reaches twenty thousand, for example, the touch operation is executed for the first time, and if it is determined that the microswitch 1 forms the on signal, it is triggered and determined that the number of times of sending the driving signal is one time, and does not reach twenty thousand times yet. Under the condition, the second touch action is continued, then if the microswitch 1 is determined to form a conducting signal again, the number of times of sending the driving signal is triggered and judged to be two times and not reach two thousand times, and then the third touch action is continued, so if the microswitch 1 is determined to form a conducting signal every touch action, the touch action is continued until reaching two thousand times, and if the microswitch 1 is determined to form a conducting signal when the touch action is executed for the second ten thousand times, the number of times of sending the driving signal is triggered and judged to be two thousand times and reaches two thousand times, the microswitch 1 is determined to be qualified in test, and the prompt indicating that the test is qualified is given, for example, the prompt indicating that the test is qualified can be given through screen display, audible and visual alarm and the like.
Further, the performing corresponding processing according to the determined result includes:
and if the microswitch 1 is determined not to form a conducting signal, determining that the microswitch 1 is unqualified in test, stopping executing the step of sending the driving signal to the touch mechanism 23 according to the interval duration and the duration, and prompting that the test is unqualified.
For example, when the touch-press action is performed for the first ten thousand times, if it is determined that the microswitch 1 does not form a conducting signal, it indicates that the microswitch 1 is damaged after being touched and pressed for ten thousand times, and it can be determined that the tested microswitch 1 is unqualified, and under this condition, the execution of the touch-press action on the microswitch 1 is stopped, that is, the microswitch testing device 2 does not need to perform the remaining ten thousand touch-press actions, so that the touch-press testing action is not wasted, and the testing efficiency is further improved. And the prompt indicating that the test is unqualified can be performed in the modes of screen display, audible and visual alarm and the like.
It is understood that the same or similar parts in the above embodiments may be mutually referred to, and the same or similar parts in other embodiments may be referred to for the content which is not described in detail in some embodiments.
It should be noted that, in the description of the present application, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. In addition, in the description of the present application, the meaning of "plurality" means at least two unless otherwise specified.
Any process or method descriptions in flow charts or otherwise described herein may be understood as: represents modules, segments or portions of code which include one or more executable instructions for implementing specific logical functions or steps of a process, and the scope of the preferred embodiments of the present application includes other implementations in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the embodiments of the present application.
It should be understood that portions of the present application may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present application may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc.
In the description herein, reference to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Although embodiments of the present application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present application, and that variations, modifications, substitutions and alterations may be made to the above embodiments by those of ordinary skill in the art within the scope of the present application.

Claims (10)

1. A microswitch testing device comprising:
the fixing clamp is provided with a first positioning mechanism for positioning and fixing the microswitch;
the machine table is provided with a second positioning mechanism for positioning and fixing the fixing clamp, and the fixing clamp is detachably positioned and installed in the second positioning mechanism;
the contact mechanism is arranged on the machine table and used for performing reciprocating motion, and the reciprocating motion performs one contact action on an action reed of the microswitch positioned and fixed in the first positioning mechanism every time so as to enable the microswitch to perform one conduction action;
and the controller is used for controlling the touch mechanism to repeatedly execute the touch action.
2. The microswitch testing device of claim 1, wherein the second positioning mechanism comprises:
the fixing clamp comprises a plurality of stopping parts formed on the machine table, wherein the stopping parts form stopping spaces, and the stopping spaces are used for forming corresponding stopping for the fixing clamp when the fixing clamp is placed in the stopping spaces.
3. The microswitch testing device of claim 2,
the fixing clamp is embedded with a first magnet component, correspondingly, under the condition that the fixing clamp is placed in the stopping space, a second magnet component is embedded in the position, corresponding to the first magnet component, of the machine table, and the first magnet component and the second magnet component can be mutually attracted.
4. The microswitch testing device of claim 1, wherein the touch down mechanism comprises:
a cylinder;
the contact pressure head is arranged at the movable end of the air cylinder; and
and the electromagnetic valve is used for receiving a driving signal of the controller and driving the air cylinder to reciprocate so as to enable the contact pressure head to contact and position the action reed of the microswitch fixed in the first positioning mechanism.
5. The microswitch testing device of claim 1, further comprising:
and the counter is connected with the controller and is used for recording the times of the touch action repeatedly executed by the touch mechanism under the control of the controller.
6. The microswitch testing device of claim 1, further comprising:
and the HMI is connected with the controller.
7. The microswitch testing device of claim 1, further comprising:
and the alarm is connected with the controller.
8. The microswitch testing device of claim 7, wherein the alarm comprises: an audible alarm, and/or a light alarm.
9. The microswitch testing device of claim 1,
the controller comprises a PLC controller.
10. Microswitch testing device according to any one of claims 1 to 9,
the micro switch is electrically connected with the controller.
CN201921277677.4U 2019-08-07 2019-08-07 Microswitch testing device Active CN210863961U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110501635A (en) * 2019-08-07 2019-11-26 格力电器(武汉)有限公司 Micro-switch testing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110501635A (en) * 2019-08-07 2019-11-26 格力电器(武汉)有限公司 Micro-switch testing device

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