CN210834703U - Defect detecting and positioning device for reflector - Google Patents

Defect detecting and positioning device for reflector Download PDF

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Publication number
CN210834703U
CN210834703U CN201920972938.8U CN201920972938U CN210834703U CN 210834703 U CN210834703 U CN 210834703U CN 201920972938 U CN201920972938 U CN 201920972938U CN 210834703 U CN210834703 U CN 210834703U
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positioning
reflector
positioning seat
image acquisition
laser
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CN201920972938.8U
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Chinese (zh)
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慎东
李晓宇
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Huaxing Aerospace Hubei Aerospace Technology Co ltd
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Xi'an Dexunwei Photoelectric Measurement And Control Technology Co ltd
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Abstract

The utility model discloses a speculum fault point detects and positioner, including the objective table, the top of objective table is along vertically being provided with a pair of locating support side by side, is provided with cylindrical positioning seat between the locating support, and the both sides of positioning seat all are connected with the locating support through horizontal connecting axle, and the top cooperation of positioning seat is provided with along its axial rotation's positioning disk, and the clear aperture that link up about the center of positioning disk and positioning seat is seted up jointly, and the top of positioning disk is provided with image acquisition mechanism, and one side of image acquisition mechanism is connected with the laser instrument of aligning clear aperture. The utility model discloses a speculum fault point detects and positioner has realized realizing before speculum assembly process, screens the lens quality and makes clear and definite fault point position and pairs, improves the effect of assembly efficiency and assembly qualification rate.

Description

Defect detecting and positioning device for reflector
Technical Field
The utility model belongs to the technical field of laser top optical components and parts surface defect check out test set, concretely relates to speculum defect detects and positioner.
Background
The surface defects of the optical element mainly refer to pockmarks, scratches, split bubbles, broken points, broken edges and the like, the quality of a film coating area at the later stage can be influenced if the defects cannot be effectively checked in the process of fine machining of a front-stage reflector, the surface quality of the film coating area can be damaged in the transportation and turnover processes of the lens, and the defects can interfere with laser transmission inside a laser gyroscope, so that the lock area of the gyroscope and the total loss in a cavity are increased in a same ratio. Therefore, from the viewpoint of the production specificity of the laser gyro, the detection and the positioning of the defects of the reflecting mirror are important factors influencing the assembly precision of the laser gyro. The traditional inspection method is low in inspection efficiency due to the limitation of parameters such as a microscope and a light source and the influence of subjective error factors when manual marking is carried out by holding a reflector by hands, and the defects are marked by mistake and are missed due to visual fatigue caused by long-term work.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a speculum fault detects and positioner has improved the assembly efficiency and the assembly qualification rate of laser top.
The utility model adopts the technical proposal that: the utility model provides a speculum fault detects and positioner, including the objective table, the top of objective table is provided with a pair of locating support along vertically juxtaposing, be provided with cylindrical positioning seat between the locating support, the both sides of positioning seat all are connected with the locating support through the horizontal connecting axle, the top cooperation of positioning seat is provided with along its axial rotation's positioning disk, the clear aperture that link up about the center of positioning disk and positioning seat is seted up jointly, the top of positioning disk is provided with image acquisition mechanism, one side of image acquisition mechanism is connected with the laser instrument of aligning the clear aperture.
The utility model is also characterized in that,
the connecting shaft and the positioning bracket are in threaded connection.
The top border of positioning seat is provided with annular constant head tank, and the bottom of positioning disk is provided with the ring groove who cup joints with the constant head tank.
The edge of the positioning disk is provided with a poking opening.
The image acquisition mechanism is an Olympus SZ61 desktop optical microscope, and is provided with a four-million-pixel CCD imaging component and upper computer image acquisition software in a standard mode.
The laser is a small semiconductor laser with power not more than 10mW, and the laser and the axis of the light through hole form an angle of 45 degrees.
The utility model has the advantages that: the utility model relates to a speculum fault point detects and positioner, through the positioning disk location, under the unchangeable condition of benchmark axle center, can carry out 360 detection to speculum coating film surface along the horizontal plane, through the addition of microscope standard match imaging CCD simultaneously, realized the visual location of speculum fault point, reduce the error that former hand drawing location brought; in addition, the optical path propagation path in the cavity can be simulated by adjusting the angle of the laser, the matching process of the reflector before cavity assembly is increased, the later-stage assembly efficiency is improved, the interference of defects existing when the optical path in the cavity is changed on the optical path is reduced, and the working stability of the resonant cavity is improved.
Drawings
FIG. 1 is a schematic structural view of a device for detecting and positioning defects of a reflector of the present invention;
FIG. 2 is a schematic structural view of an objective table in the device for detecting and positioning defects of a reflector of the present invention;
FIG. 3 is a cross-sectional view of an objective table of the device for detecting and positioning defects of a reflector of the present invention;
FIG. 4 is a display area image of the image capturing mechanism of the device for detecting and positioning defects of reflectors.
In the figure, the device comprises an object stage 1, a positioning support 2, a positioning seat 3, a connecting shaft 4, a positioning disc 5, a light through hole 6, an image acquisition mechanism 7, a laser 8, a positioning groove 9, a clamping groove 10 and a poking opening 11.
Detailed Description
The present invention will be described in detail with reference to the accompanying drawings and specific embodiments.
The utility model provides a reflector defect detecting and positioning device, as shown in figures 1 to 3, which comprises an object stage 1, a pair of positioning brackets 2 are longitudinally arranged above the object stage 1 in parallel, a cylindrical positioning seat 3 is arranged between the positioning brackets 2, both sides of the positioning seat 3 are connected with the positioning brackets 2 through horizontal connecting shafts 4, the connecting shafts 4 and the positioning brackets 2 are in threaded connection, so that the positioning seat 3 can be adjusted to adapt to other types of reflectors such as spherical mirrors along the axial rotation angle of the connecting shafts 4, a positioning disc 5 rotating along the axial direction is arranged at the top of the positioning seat 3 in a matching way, the edge of the positioning disc 5 is provided with a poking opening 11, the positioning disc 5 and the center of the positioning seat 3 are provided with a light through hole 6 which is communicated up and down, an image acquisition mechanism 7 is arranged above the positioning disc 5, the image acquisition mechanism 7 is an Olympus SZ61 desk-top optical, the standard is matched with a four-million-pixel CCD imaging component and upper computer image acquisition software, one side of the image acquisition mechanism 7 is connected with a laser 8 aligned with the light through hole 6, the laser 8 is a small semiconductor laser with the power not exceeding 10mW, and an angle of 45 degrees is formed between the laser 8 and the axis of the light through hole 6.
Wherein, can set up annular constant head tank 9 through the top border of positioning seat 3, the bottom of positioning disk 5 sets up the ring groove 10 that cup joints with constant head tank 9, realizes that positioning disk 5 is rotatory along the axis of positioning seat 3.
When in use, the method specifically comprises the following steps:
a) wiping the positioning disc 5 with absolute ethyl alcohol obtained by tertiary distillation to ensure that the device is clean and free of foreign matters and oil stains, opening the laser 8, adjusting a preposed light spot rotary adjusting button, reducing or amplifying the light spot to enable the light spot to just penetrate through a light through hole 6 in the positioning disc 5, wherein the size of the light through hole 6 is close to that of a film coating area on a reflector, and the laser adopts a red light source for ensuring the actual working state of a subsequent finished resonant cavity and the image acquisition effect;
b) opening an Olympus SZ61 desk type optical microscope, a CCD imaging component and computer upper computer acquisition software of the image acquisition mechanism 7 to ensure that the magnification of the desk type microscope meets the requirements of different lens inspection processes;
c) placing the upward coated surface of the reflector to be detected on a positioning disc 5, and placing the marked points on the reflector in the 12 o' clock direction;
d) observing the image acquisition software of the upper computer, wherein the coating area without defects and scratches is dark black and red defects under the observation angle of the microscope due to the total reflection of light and the scratches cannot realize total reflection under the irradiation of strong laser due to the influence of coating characteristics, the refraction and diffraction caused by the defects and scratches are acquired by the microscope and are displayed on a display of the image acquisition software of the upper computer in a red highlight mode, as shown in fig. 4, the display area in the upper computer software can be divided into 5 quadrants, the 5 quadrants are fixed on a fixed area of the coating of the non-reflecting mirror and are a relative reference layer, the relative quadrant position on the reflecting mirror is constantly changed in the process of rotating the reflecting mirror, and the quadrant layer is kept unchanged. At the moment, the positioning disc 5 rotates along the positioning seat 3 through the poking opening 11 until the observation is carried out for 360 degrees, the detection result is recorded, because the E quadrant is the main working surface of the reflector, the light path inside the finished resonant cavity external component is reflected and propagated in the quadrant when the finished resonant cavity external component is not in operation, the E quadrant is ensured to have no defect in the rotating process, the light path inside the finished resonant cavity external component is deviated to the other four quadrants, because the actual deviation amount is smaller, the defect condition of the E quadrant is mainly observed in the rotating process, the highlight of the boundary between A, B, C, D and E is also as little as possible at the same time when the highlight point in the E quadrant is as few as possible, because the laser 8 is fixed in the positive 9 o 'clock direction of the objective lens, corresponding marks are made in the 9 o' clock direction of the reflector according to the incident axis of the laser 8 at the moment, which is the best assembly position, and meanwhile, the image of the position of the defect point is stored, the image is rotated by 90 degrees clockwise by using the rotation function of the upper computer, and the directions of the mark and the image can completely correspond to the requirements of the assembly process for subsequent process operators to use.
The qualified reflectors after being inspected can be rapidly screened and paired by operators in subsequent processes and assembled according to the axial direction due to the incident axial marks and the images acquired by the upper computer, so that the efficiency is improved compared with the original method.
In this way, the reflector defect detecting and positioning device of the utility model is positioned by the positioning disc 5, under the condition that the reference axis is not changed, 360-degree detection can be carried out on the coating surface of the reflector along the horizontal plane, and meanwhile, the addition of the imaging CCD (charge coupled device) is marked and matched by the microscope, so that the visual positioning of the reflector defects is realized, and the error caused by the original hand-drawing positioning is reduced; in addition, the optical path propagation path in the cavity can be simulated by adjusting the angle of the laser 8, the matching process of the reflector before cavity assembly is increased, the later-stage assembly efficiency is improved, the interference of defects existing in the cavity when the optical path changes to the optical path is reduced, and the working stability of the resonant cavity is improved. Therefore, the effect of screening the quality of the lens to determine the positions of the defective spots and pairing the defective spots before the assembly process of the reflector is realized, and the assembly efficiency and the assembly qualification rate are improved.

Claims (6)

1. The utility model provides a speculum fault detects and positioner, a serial communication port, including objective table (1), the top of objective table (1) is along vertically being provided with a pair of locating support (2) side by side, be provided with cylindrical positioning seat (3) between locating support (2), the both sides of positioning seat (3) all are connected with locating support (2) through horizontal connecting axle (4), the top cooperation of positioning seat (3) is provided with along its axial rotation's positioning disk (5), clear aperture (6) that link up from top to bottom are seted up jointly in positioning disk (5) and the center of positioning seat (3), the top of positioning disk (5) is provided with image acquisition mechanism (7), one side of image acquisition mechanism (7) is connected with laser instrument (8) of aiming at clear aperture (6).
2. A reflector defect detecting and locating device as claimed in claim 1, characterized in that said connecting shaft (4) and locating bracket (2) are both screw-threaded.
3. A reflector defect detecting and positioning device as defined in claim 1, characterized in that the top edge of said positioning seat (3) is provided with a circular positioning groove (9), and the bottom of said positioning plate (5) is provided with a circular clamping groove (10) sleeved with said positioning groove (9).
4. A reflector defect detecting and positioning device as in claim 1 or 3, characterized in that the edge of the positioning plate (5) is provided with a poke opening (11).
5. A reflector defect detecting and locating device as claimed in claim 1, characterized in that said image acquisition mechanism (7) is an olympus SZ61 desktop optical microscope, standard with four megapixel CCD imaging components and upper computer image acquisition software.
6. A mirror defect detecting and locating device according to claim 1, characterized in that said laser (8) is a small semiconductor laser with a power not exceeding 10mW, the laser (8) being at an angle of 45 ° to the axis of the through-light hole (6).
CN201920972938.8U 2019-06-26 2019-06-26 Defect detecting and positioning device for reflector Active CN210834703U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920972938.8U CN210834703U (en) 2019-06-26 2019-06-26 Defect detecting and positioning device for reflector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920972938.8U CN210834703U (en) 2019-06-26 2019-06-26 Defect detecting and positioning device for reflector

Publications (1)

Publication Number Publication Date
CN210834703U true CN210834703U (en) 2020-06-23

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114113123A (en) * 2021-12-29 2022-03-01 泸州成像通科技有限公司 Detection device for mobile phone camera module

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114113123A (en) * 2021-12-29 2022-03-01 泸州成像通科技有限公司 Detection device for mobile phone camera module
CN114113123B (en) * 2021-12-29 2023-12-08 泸州成像通科技有限公司 Detection device for mobile phone camera module

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Effective date of registration: 20200821

Address after: Room 301, building 1, coffee Angel building, No.9, Gaoxin 2nd Road, hi tech Zone, Xi'an City, Shaanxi Province

Patentee after: Huaxing Aerospace (Xi'an) measurement and Control Technology Co., Ltd

Address before: 710077 G43F Xi'an Industrial Park, Xi'an, Shaanxi.

Patentee before: XI'AN DEXUNWEI PHOTOELECTRIC MEASUREMENT AND CONTROL TECHNOLOGY Co.,Ltd.

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Effective date of registration: 20210208

Address after: 442000 No. 127, Huichuan village committee, Yuanyang Township People's government, Maojian District, Shiyan City, Hubei Province

Patentee after: Huaxing Aerospace (Hubei) measurement and Control Technology Co.,Ltd.

Address before: Room 301, building 1, coffee Angel building, garage, No.9, Gaoxin 2nd Road, high tech Zone, Xi'an City, Shaanxi Province, 710077

Patentee before: Huaxing Aerospace (Xi'an) measurement and Control Technology Co., Ltd

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Effective date of registration: 20220104

Address after: 710100 a-93, No. 10301, floor 3, block F, airport international business center, airport new town, Xixian New District, Xi'an City, Shaanxi Province

Patentee after: Huaxing Aerospace (Shaanxi) Technology Development Co.,Ltd.

Address before: 442000 No. 127, Huichuan village committee, Yuanyang Township People's government, Maojian District, Shiyan City, Hubei Province

Patentee before: Huaxing Aerospace (Hubei) measurement and Control Technology Co.,Ltd.

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Effective date of registration: 20220622

Address after: 442012 No. 127, Huichuan village committee, Yuanyang Township People's government, Maojian District, Shiyan City, Hubei Province

Patentee after: Huaxing Aerospace (Hubei) Aerospace Technology Co.,Ltd.

Address before: 710100 a-93, No. 10301, floor 3, block F, airport international business center, airport new town, Xixian New District, Xi'an City, Shaanxi Province

Patentee before: Huaxing Aerospace (Shaanxi) Technology Development Co.,Ltd.

TR01 Transfer of patent right