CN210720188U - Rapid automatic optical detection system - Google Patents
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- CN210720188U CN210720188U CN201921023542.5U CN201921023542U CN210720188U CN 210720188 U CN210720188 U CN 210720188U CN 201921023542 U CN201921023542 U CN 201921023542U CN 210720188 U CN210720188 U CN 210720188U
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Abstract
The utility model discloses a quick automatic optical detection system, including treater, motion platform, first image acquisition device, second image acquisition device and third image acquisition device, the treater is connected with motion platform, first image acquisition device, second image acquisition device and third image acquisition device respectively, motion platform is used for controlling first image acquisition device and second image acquisition device and removes together. The utility model discloses a first image acquisition device gathers local image to and gather the global image through the third image acquisition device, carry out quick location through local image and global image, and plan the route, avoid traditional fixed detection route, greatly improved optical detection efficiency, but wide application in optical detection technical field.
Description
Technical Field
The utility model relates to an optical detection technical field especially relates to a quick automatic optical detection system.
Background
In the development period of the industrial system entering automation and intellectualization, the requirements of people on surface defect detection and dimension measurement of industrial products are higher and higher, and meanwhile, the requirement on automatic detection is more and more urgent because of the increase of labor cost. Particularly, for high-precision products, such as display panels, FPC cables, chips, etc., during the production and manufacturing process, the requirements for detection speed and precision are required, and meanwhile, the labor cost and the automation cost are also considered, and the demand for online automatic detection equipment is more and more urgent.
The detection method commonly used for high-precision products at present comprises the following steps: (1) ultrasonic detection; the interaction of the ultrasonic wave and the detected object is utilized to carry out microscopic detection, geometric characteristic measurement and detection and characterization of the change of the tissue structure and the mechanical property on the detected object. The method has specific requirements on the material, and is difficult to detect the detected object with a complex shape or an irregular shape. The spatial resolution of ultrasonic detection is on the order of hundreds of microns, since resolution is limited by the hardware of its wavelength. (2) And (5) magnetic powder flaw detection. The method is contact detection, and utilizes the method that magnetic powder is accumulated near the defect to detect the defect on the surface of the ferromagnetic material, the technology can realize the detection with the precision of 0.1 mm, and is effective for the detection of the defect crack on the surface of the steel material or the workpiece, but the technology is only suitable for the ferromagnetic material, and the residual magnetism can generate certain influence on the surface of the object to be detected. (3) And (4) detecting infiltration. The method utilizes the capillary phenomenon to detect the surface defects of the material, also belongs to a detection method during contact, and has certain limitation. (4) Visual detection; the machine vision product is matched with a certain light source system to collect the image information of the detected object and transmit the image information to the image processing software for processing. The visual inspection method has advantages that other inspection methods do not have: (a) the non-contact measurement can be realized, and the possibility of damage to the detected object in the detection process is reduced; (b) the adaptability is strong. The light source system and the image acquisition system which are suitable for different detected objects are selected, so that good detection effect can be realized; (c) the stability is strong. Compared with traditional detection modes such as manual detection and the like, the visual detection has strong stability, and high-strength continuous detection can be realized under the condition of certain hardware conditions.
Although visual inspection has strong performance, there are still some problem challenges for product inspection with high precision requirements; the detection speed is slow, and the current high-precision AOI detection system needs to carry a high-precision image acquisition system, so that the image acquisition speed is slow, and meanwhile, the physical size of a detected object acquired at a single time is small, so that the detection speed of the whole system is slow. Meanwhile, the AOI system uses fixed path scanning imaging, so that the requirement on workpiece positioning is very strict, and the workpiece positioning is a very time-consuming process.
The noun explains:
AOI: automated Optical Inspection, Automated Optical Inspection.
FPC Flexible Printed Circuit.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem, the present invention provides an automatic optical inspection system capable of rapidly performing automatic inspection.
The utility model adopts the technical proposal that:
the utility model provides a quick automatic optical detection system, includes treater, motion platform, first image acquisition device, second image acquisition device and third image acquisition device, the treater is connected with motion platform, first image acquisition device, second image acquisition device and third image acquisition device respectively, the motion platform is used for controlling first image acquisition device and second image acquisition device and moves together.
Furthermore, the motion platform comprises an X-axis moving mechanism, a Y-axis moving mechanism and a Z-axis moving mechanism, and the processor is respectively connected with the X-axis moving mechanism, the Y-axis moving mechanism and the Z-axis moving mechanism.
Further, the first image acquisition device comprises a first lens, a first industrial camera and a first light source, and the first industrial camera is connected with the processor.
Further, the second image acquisition device comprises a second lens, a second industrial camera and a second light source.
Further, the second industrial camera employs a high resolution industrial camera.
The utility model has the advantages that: the utility model provides a quick automatic optical detection system, includes treater, motion platform, first image acquisition device, second image acquisition device and third image acquisition device, the treater is connected with motion platform, first image acquisition device, second image acquisition device and third image acquisition device respectively, the motion platform is used for controlling first image acquisition device and second image acquisition device and moves together. The utility model discloses a first image acquisition device gathers local image to and gather the global image through the third image acquisition device, carry out quick location through local image and global image, and plan the route, avoid traditional fixed detection route, greatly improved optical detection's efficiency.
Drawings
Fig. 1 is a block diagram of a fast automated optical inspection system according to the present invention;
FIG. 2 is a schematic mechanical diagram of a motion platform according to an embodiment;
FIG. 3 is a schematic diagram of the operation of a first image capture device and a third image capture device in an embodiment;
FIG. 4 is a schematic diagram of a global image captured by the third image capturing device in FIG. 3;
FIG. 5 is a schematic diagram of a partial image captured by the first image capturing device of FIG. 3;
fig. 6 is a schematic diagram of the operation of the first image capturing device and the second image capturing device according to the embodiment.
Detailed Description
As shown in fig. 1 and 2, a rapid automatic optical detection system includes a processor, a motion platform, a first image capturing device, a second image capturing device, and a third image capturing device, wherein the processor is connected to the motion platform, the first image capturing device, the second image capturing device, and the third image capturing device, and the motion platform is configured to control the first image capturing device and the second image capturing device to move together.
When the workpiece 5 to be detected needs to be detected, the workpiece 5 to be detected is placed under the second image acquisition device 2, referring to fig. 2, the first image acquisition device 1 and the second image acquisition device 2 are both installed on the motion platform 4, and move together with the motion of the motion platform 4. The first image acquisition device 1 is used for performing local imaging on the workpiece 5 to be detected, namely only acquiring a local image of the workpiece 5 to be detected, the third image acquisition device 3 is used for performing overall imaging on the workpiece 5 to be detected, namely acquiring a global image of the workpiece 5 to be detected, and the third image acquisition device 3 is in a fixed position. The first image capturing device 1 and the third image capturing device 3 may be implemented by using a common industrial camera, or may be implemented by using a high-resolution industrial camera. The second image acquisition device 2 is used for acquiring image information of the workpiece 5 to be detected, and the image information can be used for optical detection.
Because in the existing optical detection technology, before image acquisition is performed on a workpiece to be detected, the workpiece to be detected needs to be positioned, and then a fixed path is adopted to scan and image the workpiece to be detected, because the path is preset and fixed and cannot be flexibly changed, the whole workpiece to be detected needs to be continuously scanned, and a whole scanned image of the workpiece to be detected is obtained.
Therefore, in this embodiment, a flexible scanning system is proposed, referring to fig. 3, in the system, a third image acquisition device 3 acquires a global image 6, a first image acquisition device 1 acquires a local image 7, and the local image 7 is matched with the global image 6, so that current position information can be quickly acquired, and positioning work is completed; fig. 4 is a global image 6 of the workpiece 5 to be detected, and fig. 5 is a local image 7 of the workpiece 5 to be detected. Since the next coordinate position can be predicted from the current position information, when the second image capturing device 2 has captured the image information of the current position, the next coordinate position can be moved quickly, instead of the conventional method of capturing the image information slowly while moving. The system can flexibly change the detection path according to the design and acquire corresponding image information without scanning and imaging the whole system, so that the aim is fulfilled, the detection efficiency is greatly improved, the production cost is indirectly reduced, and the system can be widely applied to an automatic optical detection scene.
When the system is used for primary detection, visual calibration work is required, the visual calibration work can be planned according to physical size information which can be acquired by a single image, the image acquisition frequency is planned, and the technologies can be realized by adopting the existing technology.
Further as a preferred embodiment, the motion platform includes an X-axis moving mechanism, a Y-axis moving mechanism and a Z-axis moving mechanism, and the processor is connected to the X-axis moving mechanism, the Y-axis moving mechanism and the Z-axis moving mechanism respectively.
As the high-precision AOI measurement precision is required to be in the micrometer level, the resolution of an optical lens is correspondingly in the micrometer level. Therefore, the imaging depth of field of the telecentric lens for high-precision photographing is small due to the limitation of the size of the imaging surface and the processing of the optical lens of the current industrial camera. This results in accurate focusing requirements during the photographing process of the industrial camera. Even minor deviations can lead to imaging blurring and ultimately to failure of the detection algorithm. In the prior art, when a workpiece to be detected is scanned and imaged, the positions of an X axis and a Y axis are mainly changed, and when imaging blurring occurs, a solution cannot be effectively made, so that the detection precision is greatly influenced.
The motion platform is a motion control platform in three directions, and the heights of the second image acquisition device and the workpiece to be detected are adjusted through the Z-axis moving mechanism, so that automatic focusing is realized, and the detection precision is greatly improved.
Referring to fig. 6, further as a preferred embodiment, the first image capture device includes a first lens, a first industrial camera, and a first light source, the first industrial camera being coupled to the processor.
As a further preferred embodiment, with reference to fig. 6, the second image capture device comprises a second lens, a second industrial camera and a second light source.
Further preferably, the second industrial camera is a high-resolution industrial camera.
Referring to fig. 6, the first image pickup device includes a first lens 9, a first industrial camera 10, and a first light source 8, and the second image pickup device includes a second lens 4, a second industrial camera 5, and a second light source 3.
The first image acquisition device and the second image acquisition device are both arranged on the Z-axis moving mechanism 12. Through a high-precision image acquisition system consisting of the second lens 4, the second industrial camera 5 and the second light source 3, reflected light of the workpiece 1 to be detected passes through the main optical axis 2 of the second lens, image acquisition of the workpiece 1 to be detected with micron-grade precision can be realized, and algorithm processing is carried out through the processor to obtain information such as defects, sizes and the like of the workpiece to be detected. The common image acquisition system comprises a first lens 9, a first industrial camera 10 and a first light source 8, reflected light of a workpiece 1 to be detected passes through a main optical axis 7 of the first lens, an image with certain precision can be acquired, image information is converted into position information through a processor, and the position of image acquisition at the next moment is predicted through an algorithm. The first image acquisition device acquires the current local image as feedback information and is used for adjusting the position of the second image acquisition device, so that closed-loop feedback is realized, the position moving precision is improved, and the detection precision is indirectly improved. And the second image acquisition device is more favorable for focusing and acquiring image information by configuring the light source.
To sum up, the utility model discloses a quick automatic optical detection system has following beneficial effect for prior art:
(1) to industry on-line measuring, the product supplied materials is mostly put at will, even fix a position through certain positioning fixture, positioning accuracy also can not be very high. For high-precision industrial online detection, such as defect detection of circuits in an FPC (flexible printed circuit) cable and glass boundary defect detection, scanning imaging is required according to a certain path in the detection process, so that the overall detection of a target is realized. In addition, the fixed path detection causes that the system usually adopts a method of manually matching a microscope for some special application scenes, and has low efficiency and large error due to manual judgment. The utility model discloses utilize global image and local image to combine together, realize fixing a position fast to predict camera motion path, thereby realize high-speed automatic path planning. And the track is optimized through closed-loop feedback, so that the positioning difficulty of the workpiece is avoided, the detection efficiency and quality are greatly improved, and the requirements of quick detection and high-precision detection are well met.
(2) And because of the limitation of the lens design, the depth of field of the high-precision imaging telecentric lens is very small, and the control of the imaging distance is very critical. The utility model discloses an analysis of current image characteristic realizes quick adjustment to the camera with the distance of the target that awaits measuring, has compensatied the not enough problem of depth of field.
While the preferred embodiments of the present invention have been described, the present invention is not limited to the above embodiments, and those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present invention, and such equivalent modifications or substitutions are intended to be included within the scope of the present invention as defined by the appended claims.
Claims (5)
1. A rapid automatic optical detection system is characterized by comprising a processor, a motion platform, a first image acquisition device, a second image acquisition device and a third image acquisition device, wherein the processor is respectively connected with the motion platform, the first image acquisition device, the second image acquisition device and the third image acquisition device;
the first image acquisition device is installed on the motion platform and used for acquiring local images of the workpiece to be detected, and the third image acquisition device is at a fixed position and used for acquiring global images of the workpiece to be detected.
2. The system according to claim 1, wherein the motion stage comprises an X-axis moving mechanism, a Y-axis moving mechanism and a Z-axis moving mechanism, and the processor is connected to the X-axis moving mechanism, the Y-axis moving mechanism and the Z-axis moving mechanism respectively.
3. The rapid automated optical inspection system of claim 1, wherein the first image capture device comprises a first lens, a first industrial camera, and a first light source, the first industrial camera coupled to the processor.
4. The rapid automated optical inspection system of claim 1, wherein the second image capture device comprises a second lens, a second industrial camera, and a second light source.
5. A rapid automated optical inspection system according to claim 4, wherein the second industrial camera is a high resolution industrial camera.
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| CN201921023542.5U CN210720188U (en) | 2019-07-03 | 2019-07-03 | Rapid automatic optical detection system |
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| CN201921023542.5U CN210720188U (en) | 2019-07-03 | 2019-07-03 | Rapid automatic optical detection system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110501347A (en) * | 2019-07-03 | 2019-11-26 | 深圳市一纳科技有限公司 | A kind of rapid automatized Systems for optical inspection and method |
| CN115308218A (en) * | 2022-10-11 | 2022-11-08 | 中材节能股份有限公司 | Calcium silicate board surface defect on-line measuring system |
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2019
- 2019-07-03 CN CN201921023542.5U patent/CN210720188U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110501347A (en) * | 2019-07-03 | 2019-11-26 | 深圳市一纳科技有限公司 | A kind of rapid automatized Systems for optical inspection and method |
| CN115308218A (en) * | 2022-10-11 | 2022-11-08 | 中材节能股份有限公司 | Calcium silicate board surface defect on-line measuring system |
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Effective date of registration: 20200820 Address after: 518000 520, building 4, Qidi Xiexin, No. 333, Longfei Avenue, huanggekeng community, Longcheng street, Longgang District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Mingrui Instrument Co.,Ltd. Address before: 301-8, floor 3, qidixiexin Science Park, Qingchun Road, Longcheng street, Longgang District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Yina Technology Co.,Ltd. |
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