CN210629498U - SFP optical module test board - Google Patents

SFP optical module test board Download PDF

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Publication number
CN210629498U
CN210629498U CN202020202771.XU CN202020202771U CN210629498U CN 210629498 U CN210629498 U CN 210629498U CN 202020202771 U CN202020202771 U CN 202020202771U CN 210629498 U CN210629498 U CN 210629498U
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China
Prior art keywords
optical module
circuit
sfp optical
test board
module test
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CN202020202771.XU
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Chinese (zh)
Inventor
王之浩
王智
李智勇
何人鑫
叶振煜
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Beijing Jiaotong University
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Beijing Jiaotong University
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Abstract

The utility model provides a SFP optical module surveys test panel for test SFP optical module's high frequency performance, SFP optical module surveys test panel includes power supply circuit, peripheral circuit, IIC bus circuit and radio frequency circuit, peripheral circuit, IIC bus circuit all are connected communication with radio frequency circuit, power supply circuit is used for doing SFP optical module surveys test panel and provides the power, peripheral circuit is used for showing the operating condition that SFP optical module surveyed the test panel, IIC bus circuit is used for being connected communication with the computer, radio frequency circuit be used for with communication is connected to SFP optical module and test equipment. The utility model discloses a SFP optical module test panel has the benefit that can practice thrift the test cost, greatly improve efficiency of software testing.

Description

SFP optical module test board
Technical Field
The utility model belongs to the technical field of communication device test equipment, concretely relates to SFP optical module surveys test panel.
Background
In recent years, with the progress of technology and the promotion of policy, an optical access network enters a rapidly developing orbit, and an SFP optical module plays a key role as a core device in an ethernet physical layer. The device performance test has a great effect on the device, and the device can be guided to be better applied only by representing various characteristics of the device more accurately.
The high-frequency performance test of the photoelectronic device comprises two aspects, namely a small signal frequency response characteristic test and a large signal dynamic characteristic test, wherein the small signal frequency response describes the transmission characteristic and the reflection characteristic of the device under different frequencies, and the small signal frequency response reflects the linear responsivity of the device; the large signal test is the transfer characteristic of the device at different rates, which reflects the non-linear characteristic of the device.
At present, the SFP optical module testing technology needs to be carried out by matching a standard SFP optical module with a switch, and computer testing software is used for checking the information of the SFP optical module. It can be seen that the testing method is complicated and inefficient, and especially when the high frequency characteristics of the test instruments such as a vector network analyzer and an error code tester are tested in a laboratory, the testing requirements cannot be met.
Therefore, further improvement on the existing SFP optical module testing technology is to be made.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a SFP optical module surveys test panel, it can practice thrift the test cost, greatly improves efficiency of software testing.
The utility model provides a SFP optical module test board for test the high frequency performance of SFP optical module, SFP optical module test board includes power supply circuit, peripheral circuit, IIC bus circuit and radio frequency circuit all connect communication;
the power supply circuit is used for providing power supply for the SFP optical module test board;
the peripheral circuit is used for displaying the working state of the SFP optical module test board;
the IIC bus circuit is used for being connected and communicated with a computer, and SFP optical module information can be checked through test software in the computer;
the radio frequency circuit is used for connecting and communicating the SFP optical module with test equipment.
Preferably, the power supply circuit adopts an LDO (low dropout regulator) circuit designed by an AMS1117 series voltage regulation chip.
Preferably, the printed circuit board material of the SFP optical module test board is FR4 material.
Preferably, the peripheral circuit comprises an LED indicator light for indicating the operating state of the SFP light module test board.
Preferably, the IIC bus circuit includes an IIC bus interface.
Preferably, the radio frequency circuit comprises a transmitting end radio frequency circuit and a receiving end radio frequency circuit.
Preferably, the transmitting end radio frequency circuit includes a transmitting end SMA interface, and the receiving end radio frequency circuit includes a receiving end SMA interface.
Preferably, the differential lines in the radio frequency circuit are designed in a packet mode.
Preferably, the differential line in the radio frequency circuit is over-designed by adopting a circular arc segment.
Preferably, the test equipment comprises a pulse code generator and an oscilloscope.
The utility model discloses a SFP optical module surveys test panel has following beneficial technological effect for prior art:
1. the utility model discloses a SFP optical module surveys test panel circuit design is simple, low cost, and the SFP optical module only needs to insert on the SFP optical module surveys test panel to survey test panel to the SFP optical module and supply power, just can let the normal work of SFP optical module.
2. The utility model discloses a radio frequency circuit among SFP optical module test panel adopts the SMA interface, longe-lived, the superior performance, and the reliability is high, extensively is arranged in microwave equipment and digital communication equipment to can realize utilizing test equipment such as oscilloscope and pulse code shape generator, convenient and fast ground carries out the capability test to the SFP optical module.
Drawings
In order to illustrate the embodiments of the present invention or the technical solutions in the prior art more clearly, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only used for explaining the concept of the present invention.
FIG. 1 is a schematic structural diagram of an SFP optical module test board of the present invention;
FIG. 2 is a schematic diagram of a first application of the SFP optical module test board of the present invention;
fig. 3 is a schematic diagram of the application of the SFP optical module testing board of the present invention.
Summary of reference numerals:
1. power supply circuit 2 and peripheral circuit
3. IIC bus circuit 4 and radio frequency circuit
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in detail with reference to the accompanying drawings. It should be understood that the description is intended to be illustrative only and is not intended to limit the scope of the present invention. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present invention.
The utility model discloses a purpose of embodiment aims at overcoming not enough and the defect that prior art exists, the utility model provides a SFP optical module surveys test panel for test SFP optical module's high frequency performance, as shown in fig. 1, the utility model discloses a SFP optical module surveys test panel includes power supply circuit 1, peripheral circuit 2, IIC bus circuit 3 and radio frequency circuit 4, and peripheral circuit 2, IIC bus circuit 3 all are connected communication with radio frequency circuit 4, and power supply circuit 1 is used for surveying test panel for SFP optical module and provides the power. The peripheral circuit 2 is used for displaying the working state of the SFP optical module test board, the IIC bus circuit 3 is used for being connected and communicated with a computer, the SFP optical module information can be checked through the computer, and the radio frequency circuit 4 is used for connecting and communicating the SFP optical module with test equipment.
It is required to explain, the utility model discloses well SFP optical module is surveyed and is provided with SFP optical module socket on the board, when SFP optical module carries out the high frequency performance test, only need insert the SFP optical module the utility model discloses in the SFP optical module socket on the SFP optical module is surveyed and is surveyed the board, can carry out SFP optical module signal detection.
In the utility model discloses a further embodiment, power supply circuit 1 in the SFP optical module test panel adopts the LDO (low dropout regulator) circuit of AMS1117 series steady voltage chip design, and the design is trun into the required 3.3V voltage of work for the direct current 5V of input like this to produced power noise is little, and this chip has the function of current-limiting and overheated automatic turn-off protection, and the voltage precision is higher moreover, and circuit design is simple, and is small.
The utility model discloses a further embodiment concerns the signal integrality in the design of the radio frequency circuit 4 that SFP optical module tested in the board, adopts the design of optimization in the layout part, can obtain higher frequency response like this to and great bandwidth. The utility model discloses select for use the FR4 panel that the cost is lower to survey PCB (printed circuit board) panel of board as SFP optical module.
Further, the utility model discloses a radio frequency circuit 4 includes transmitting terminal radio frequency circuit and receiving terminal radio frequency circuit to transmitting terminal radio frequency circuit includes the transmitting terminal SMA interface, and receiving terminal radio frequency circuit includes the receiving terminal SMA interface. When the high-frequency performance of the SFP optical module is tested, a transmitting end SMA interface in a transmitting end radio frequency circuit of the SFP optical module test board is connected with a transmitting end of the SFP optical module, and a receiving end SMA interface in a receiving end radio frequency circuit of the SFP optical module test board is connected with a receiving end of the SFP optical module.
The transmitting end radio frequency circuit and the receiving end radio frequency circuit in the radio frequency circuit 4 both adopt a differential line design, but two groups of differential lines of the transmitting end radio frequency circuit and the receiving end radio frequency circuit need to ensure that each group of differential line pairs have the same impedance and the lengths of the wiring are also identical. In addition, the existing 135-degree straight corner processing method is abandoned at the routing corner, and the 45-degree arc section is used for over-designed substitution, so that the method is more advantageous to the signal integrity under the condition of high-frequency signals.
Meanwhile, in order to control the impedance and reduce the crosstalk, a packet ground process is adopted for all the differential signal lines of the radio frequency circuit 4.
The utility model discloses a further embodiment, peripheral circuit 2 among the SFP optical module test panel includes the LED pilot lamp, and the LED pilot lamp is used for instructing the operating condition that the SFP optical module tested the panel. Under normal operating conditions, the LED lamp is on (green). Of course, the peripheral circuit 2 may also include a matching circuit related to the operation status indicator lamp, and is not limited to the LED indicator lamp.
In the utility model discloses a further embodiment, IIC bus circuit 3 includes IIC bus interface, connects communication with the SFP optical module test panel and computer through IIC bus interface.
In a further embodiment of the present invention, the test equipment comprises a pulse code generator and an oscilloscope. Alternatively, the test device may select other test devices according to other signals to be detected by the SFP optical module, such as a vector network analyzer, an error code detector, and the like, and is not limited to the pulse pattern generator and the oscilloscope, which are exemplified below.
Fig. 2 is the utility model discloses a SFP optical module surveys test panel's application schematic diagram one, as shown in fig. 2, insert the SFP optical module and survey in the SFP optical module socket that the test panel was surveyed to the SFP optical module, use dupont line or ordinary electric wire to insert the SFP optical module and survey test panel power socket, for power supply circuit 1 circular telegram, survey test panel through power supply circuit 1 for the SFP optical module and provide dc power supply, the SFP optical module surveys the test panel and goes up the electricity for the SFP optical module this moment. When the LED indicator lamp in the peripheral circuit 2 is on, the power-on is completed, and at the moment, the SFP optical module test board is in a working state.
When the SFP optical module is subjected to photoelectric signal testing, the LC optical fiber jumper is used for connecting the optical module and the oscilloscope, the coaxial cable is used for connecting the SFP optical module testing board and the pulse code generator, the pulse code generator sends a testing electric signal to a transmitting end SMA interface of the SFP optical module testing board through the coaxial cable at the moment, the testing electric signal is transmitted to a transmitting end of the SFP optical module testing board through a transmitting end radio frequency circuit, the transmitting end SMA interface enables the SFP optical module to generate a corresponding optical signal, the corresponding optical signal is transmitted to the oscilloscope through the LC optical fiber jumper, and the testing of the testing signal is.
FIG. 3 is a schematic diagram of the application of the SFP optical module test board of the present invention, as shown in FIG. 3, when testing the optical signal of the SFP optical module, connect the transmitting end and the receiving end of the optical module with the LC optical fiber jumper, connect the testing device with the transmitting end SMA interface and the receiving end SMA interface of the SFP optical module test board with the coaxial cable, at this time, the pulse code generator sends the testing electrical signal to the transmitting end SMA interface of the SFP optical module test board through the coaxial cable, transmit to the transmitting end of the SFP optical module through the transmitting end RF circuit, so that the SFP optical module generates the corresponding optical signal, the optical signal then returns to the receiving end of the optical module from the transmitting end of the optical module through the LC optical fiber jumper, generate the corresponding electrical signal through the receiving end of the optical module, and then the electrical signal is connected to the receiving end SMA, and then the test signal is transmitted to an oscilloscope through a coaxial cable to complete the detection of the test signal.
In fig. 3, the transmitting end SMA interface in the rf circuit of the SFP optical module test board is connected to the pulse code generator through a coaxial cable, and the receiving end SMA interface in the rf circuit 4 of the SFP optical module test board is connected to the oscilloscope through a coaxial cable.
Finally, it should be noted that the above embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention.

Claims (10)

1. The test board for the SFP optical module is used for testing the high-frequency performance of the SFP optical module and comprises a power supply circuit, a peripheral circuit, an IIC bus circuit and a radio frequency circuit, wherein the peripheral circuit, the IIC bus circuit and the radio frequency circuit are connected and communicated;
the power supply circuit is used for providing power supply for the SFP optical module test board;
the peripheral circuit is used for displaying the working state of the SFP optical module test board;
the IIC bus circuit is used for being connected with a computer for communication;
the radio frequency circuit is used for connecting and communicating the SFP optical module with test equipment.
2. The SFP optical module test board as claimed in claim 1, wherein the power circuit is an LDO circuit designed by AMS1117 series voltage regulator chip.
3. The SFP optical module test board as claimed in claim 1, wherein the PCB material of the SFP optical module test board is FR4 board.
4. The SFP optical module test board as claimed in claim 1, wherein said peripheral circuit comprises LED indicator lights for indicating the operating status of said SFP optical module test board.
5. The SFP optical module test board as claimed in claim 1, wherein the IIC bus circuit comprises an IIC bus interface.
6. The SFP optical module test board as claimed in claim 1, wherein the RF circuit comprises a transmitting end RF circuit and a receiving end RF circuit.
7. The SFP optical module test board as claimed in claim 6, wherein the transmitting end RF circuit comprises a transmitting end SMA interface, and the receiving end RF circuit comprises a receiving end SMA interface.
8. The SFP optical module test board as claimed in claim 1, wherein the differential lines in the RF circuit are designed in a packet-based manner.
9. The SFP optical module test board as claimed in claim 1, wherein the differential lines in the RF circuit are over-designed with arc segments.
10. The SFP optical module test board as claimed in claim 1, wherein the test equipment comprises a pulse pattern generator and an oscilloscope.
CN202020202771.XU 2020-02-24 2020-02-24 SFP optical module test board Active CN210629498U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202020202771.XU CN210629498U (en) 2020-02-24 2020-02-24 SFP optical module test board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202020202771.XU CN210629498U (en) 2020-02-24 2020-02-24 SFP optical module test board

Publications (1)

Publication Number Publication Date
CN210629498U true CN210629498U (en) 2020-05-26

Family

ID=70749657

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202020202771.XU Active CN210629498U (en) 2020-02-24 2020-02-24 SFP optical module test board

Country Status (1)

Country Link
CN (1) CN210629498U (en)

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