CN210442406U - Lower double-needle elastic module - Google Patents
Lower double-needle elastic module Download PDFInfo
- Publication number
- CN210442406U CN210442406U CN201920973032.8U CN201920973032U CN210442406U CN 210442406 U CN210442406 U CN 210442406U CN 201920973032 U CN201920973032 U CN 201920973032U CN 210442406 U CN210442406 U CN 210442406U
- Authority
- CN
- China
- Prior art keywords
- needle
- fixed block
- probe
- keysets
- needle piece
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model aims at providing a simple structure, low in manufacturing cost, test effect are good, the precision is high and can effectively reduce the lower duplex elastic module of misdetection rate. The utility model discloses a keysets, fixed block, needle piece, connector and a plurality of probe, the connector is located on the bottom of needle piece, needle piece adaptation is installed on the fixed block, the fixed block is adorned admittedly the bottom of keysets, a plurality of the one end of probe all with the connector is connected, a plurality of the other end of probe runs through in proper order the needle piece with the fixed block and with the keysets is connected. The utility model discloses be applied to circuit board test equipment's technical field.
Description
Technical Field
The utility model relates to a circuit board test equipment's technical field, in particular to lower duplex elastic module.
Background
In a general circuit board testing fixture, the specification of a lower pin point of a B2B connector is 0.12mm by 0.35mm, so that a usable probe is very small, and a contact surface of the lower pin is an arc surface and is easy to slide, so that a lower pin module commonly used by people has poor contact caused by sliding of the pin; in addition, a general DUT (tested product, consumer electronic product mainboard) has soldering flux, and a lower probe module tested for many times is easy to be dirty to cause poor contact; the two reasons can cause the misdetection rate of the circuit board test to increase.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve the technical problem that overcome prior art not enough, provide a simple structure, low in manufacturing cost, test effect is good, the precision is high and can effectively reduce the lower duplex elastic module of misdetection rate.
The utility model adopts the technical proposal that: the utility model discloses a keysets, fixed block, needle piece, connector and a plurality of probe, the connector is located on the bottom of needle piece, needle piece adaptation is installed on the fixed block, the fixed block is adorned admittedly the bottom of keysets, a plurality of the one end of probe all with the connector is connected, a plurality of the other end of probe runs through in proper order the needle piece with the fixed block and with the keysets is connected.
Furthermore, a plurality of the probes are uniformly arranged in a double-row parallel mode.
Further, a preferred scheme is that the needle block includes needle block upper portion and needle block lower part, be equipped with on the fixed block with needle block upper portion looks adaptation's mounting groove, needle block upper portion is located on the mounting groove, needle block lower part stretch out in the lower surface of fixed block.
Further, the upper part of the needle block and the lower part of the needle block are integrally formed, and the appearance of the needle block is T-shaped.
Furthermore, the connector is provided with a plurality of needle points corresponding to the probes one to one, the adapter plate is provided with a plurality of needle holes corresponding to the probes one to one, one ends of the probes are installed on the needle points in one to one correspondence, and the other ends of the probes are installed on the needle holes in one to one correspondence.
Furthermore, a plurality of springs are arranged between the fixed block and the adapter plate, first mounting holes corresponding to the springs one to one are formed in the fixed block, second mounting holes corresponding to the springs one to one are formed in the adapter plate, one ends of the springs are mounted on the first mounting holes, and the other ends of the springs are mounted on the second mounting holes.
Further, the adapter plate is a flexible circuit board.
The utility model has the advantages that:
through a plurality of the setting of probe makes on the connector the needle point contacts with the product, is surveyed the data of product via the probe transmission, and finally passes through the keysets transmits the outer antithetical couplet computer to accomplish the test of product, its simple structure, test effect are good, a plurality of the probe is the mode of double block and column type evenly arranging, increased the test point on the product with the probe connection the contact probability of needle point has reduced the condition with the contact failure of product, thereby reaches the purpose that reduces the misdetection rate.
In addition, in the process that the needle point is in contact with the product, the spring is arranged, so that the contact process is elastic contact, the needle point has certain self-adjusting capacity, and the product is prevented from being damaged due to rigid contact with the product.
Drawings
Fig. 1 is a schematic structural diagram of the present invention;
fig. 2 is an exploded schematic view of the present invention;
fig. 3 is a schematic structural view of the connector and the probe.
Detailed Description
As shown in fig. 1-3, in this embodiment, the utility model discloses an adapter plate 1, fixed block 2, needle piece 3, connector 4 and a plurality of probe 5, connector 4 is located on the bottom of needle piece 3, needle piece 3 adaptation is installed on fixed block 2, fixed block 2 is adorned admittedly adapter plate 1's bottom, a plurality of probe 5's one end all with connector 4 is connected, a plurality of probe 5's the other end runs through in proper order needle piece 3 with fixed block 2 and with adapter plate 1 is connected, adapter plate 1 is the flexible circuit board, a plurality of probe 5 is double column and is evenly arranged, in this design, fixed block 2 through a plurality of pin 12 with adapter plate 1 fixes a position and fixed connection.
The connector 4 is provided with a plurality of needle points 9 corresponding to the probes 5 one to one, the adapter plate 1 is provided with a plurality of needle holes 10 corresponding to the probes 5 one to one, one ends of the probes 5 are installed on the needle points 9 in one to one correspondence, and the other ends of the probes 5 are installed on the needle holes 10 in one to one correspondence.
The fixed block 2 with be equipped with a plurality of spring 11 between the keysets 1, be equipped with on the fixed block 2 with a plurality of the first mounting hole of spring 11 one-to-one, be equipped with on the keysets 1 with a plurality of the second mounting hole of spring 11 one-to-one, install the one end of spring 11 on the first mounting hole, install the other end of spring 11 on the second mounting hole.
Claims (7)
1. A lower double-needle elastic module is characterized in that: it includes keysets (1), fixed block (2), needle piece (3), connector (4) and a plurality of probe (5), connector (4) are located on the bottom of needle piece (3), needle piece (3) adaptation is installed on fixed block (2), fixed block (2) are adorned admittedly the bottom of keysets (1), a plurality of the one end of probe (5) all with connector (4) are connected, a plurality of the other end of probe (5) runs through in proper order needle piece (3) with fixed block (2) and with keysets (1) are connected.
2. The lower double pin spring module of claim 1, wherein: the probes (5) are uniformly arranged in a double-row parallel manner.
3. The lower double pin spring module of claim 1, wherein: needle piece (3) are including needle piece upper portion (6) and needle piece lower part (7), be equipped with on fixed block (2) with mounting groove (8) of needle piece upper portion (6) looks adaptation, needle piece upper portion (6) are located on mounting groove (8), needle piece lower part (7) stretch out in the lower surface of fixed block (2).
4. The lower double pin spring module of claim 3, wherein: the upper needle block part (6) and the lower needle block part (7) are integrally formed, and the appearance of the needle block (3) is T-shaped.
5. The lower double pin spring module of claim 1, wherein: be equipped with on connector (4) with a plurality of probe (5) one-to-one's needle point (9), be equipped with on keysets (1) with a plurality of probe (5) one-to-one's pinhole (10), a plurality of the one end one-to-one of probe (5) is installed on needle point (9), the other end one-to-one of probe (5) is installed on pinhole (10).
6. The lower double pin spring module of claim 1, wherein: fixed block (2) with be equipped with a plurality of spring (11) between keysets (1), be equipped with on fixed block (2) with a plurality of the first mounting hole of spring (11) one-to-one, be equipped with on keysets (1) with a plurality of the second mounting hole of spring (11) one-to-one, the one end of spring (11) is installed on the first mounting hole, the other end of spring (11) is installed on the second mounting hole.
7. The lower double pin spring module of claim 1, wherein: the adapter plate (1) is a flexible circuit board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920973032.8U CN210442406U (en) | 2019-06-26 | 2019-06-26 | Lower double-needle elastic module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920973032.8U CN210442406U (en) | 2019-06-26 | 2019-06-26 | Lower double-needle elastic module |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210442406U true CN210442406U (en) | 2020-05-01 |
Family
ID=70404081
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920973032.8U Active CN210442406U (en) | 2019-06-26 | 2019-06-26 | Lower double-needle elastic module |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210442406U (en) |
-
2019
- 2019-06-26 CN CN201920973032.8U patent/CN210442406U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN201145789Y (en) | Tester for LCD display module | |
| CN203117232U (en) | Novel integrated circuit (IC) simple testing seat | |
| KR102151695B1 (en) | Contact-type terminal connection device for testing | |
| CN205091435U (en) | PCB testing arrangement | |
| TW201430350A (en) | Testing device | |
| CN206945903U (en) | Integrated chip test bench and integrated chip test module | |
| CN102478590A (en) | Direct probe-testing type probe testing device | |
| US7815442B2 (en) | Burn-in socket with improved contacts | |
| CN210442406U (en) | Lower double-needle elastic module | |
| KR102615603B1 (en) | probe module | |
| CN203397348U (en) | Novel memory-chip testing jig | |
| CN207923955U (en) | Chip testing crimp head and its probe mechanism | |
| CN208782077U (en) | A kind of chip test base | |
| CN205067627U (en) | Probe testing apparatus | |
| CN108562766A (en) | Chip testing crimp head and its probe mechanism | |
| JP2010043868A (en) | Electric inspection jig and electric inspection apparatus | |
| CN204989258U (en) | PCB test faller subassembly | |
| CN210376457U (en) | Socket device for testing S-shaped elastic thread needle made of alloy material | |
| CN111077684A (en) | Liquid crystal display module electrical measurement connecting mechanism and jig | |
| CN107728039B (en) | Loss test probe | |
| CN208140882U (en) | A kind of jig | |
| CN207717928U (en) | Arrangement for testing integrated circuit | |
| CN207705497U (en) | A kind of interface end test suite and interface end test device | |
| CN208721711U (en) | A kind of FPC test bench | |
| CN221595173U (en) | Aging testing mechanism for flexible circuit board |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |