CN210376578U - LED test automatic control system - Google Patents
LED test automatic control system Download PDFInfo
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- CN210376578U CN210376578U CN201920498483.0U CN201920498483U CN210376578U CN 210376578 U CN210376578 U CN 210376578U CN 201920498483 U CN201920498483 U CN 201920498483U CN 210376578 U CN210376578 U CN 210376578U
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Abstract
The utility model discloses an automatic control system for LED test, which carries out the power-on test on a group of LED samples connected in series and outputs the test current; when a failure sample appears in a group of LED samples, the failure sample is automatically short-circuited, and the serial number and the failure time of the failure sample are recorded until the test cut-off condition is reached. The utility model discloses control logic is simple, and experimental guarantee nature is good, and the system is reliable stable, does benefit to very much and uses widely.
Description
Technical Field
The utility model belongs to the technical field of the photoelectric device test, especially, relate to an experimental automatic control system of LED.
Background
A light emitting diode, i.e., a light emitting LED device, is one type of semiconductor diode that can convert electrical energy into light energy. LEDs have the excellent characteristics of high efficiency, pure light color, flexible application, high light quality, etc., and light emitting diodes are used as light sources in many optoelectronic control devices and as signal displays in electronic devices.
However, during the use of the LED, the LED inevitably ages due to the current and the external environment. The aging of the LED mainly includes the aging of the chip and the aging of the package. The aging mechanism of the chip comprises thermomechanical stress strengthening and chip crack expansion caused by heat accumulation, complete separation of a chip bonding layer from a bonding surface caused by poor process and the like. The aging mechanism of the package is mainly that the package material is degraded due to high temperature and humidity, moisture permeates into the package material to cause lead deterioration and PCB copper wire corrosion, and movable conductive ions introduced along with the moisture can reside on the surface of the chip to cause electric leakage. The light emitting efficiency of the aged LED lamp is greatly reduced, the purity of light color is reduced, and even the LED lamp is burnt out.
However, the aging of the LED is not easily observed and judged directly, and is not easily judged by all detection due to the large number of applications. As a modern energy-saving and environment-friendly lamp, once the lamp is aged or burnt out, the circuit loses the indicating function, and great influence is brought to maintenance work. This phenomenon presents a significant safety hazard for certain important circuits.
In the prior art, LED testing techniques include LED voltage measurement, current measurement, and light splitting detection techniques. The main purpose of these tests is that manufacturers perform performance tests and screening on new LED products without concern for the aging status of the LEDs. At present, the LED aging detection has the following problems:
1) the aging test time is long, and the aging parameters of the LED lamp need to be detected in real time.
2) In order to make the test current consistent, the LED test loop is in a series connection mode, when one LED is broken, other LEDs lose power supply, and the test can be continued by waiting for manual recovery. If the interruption time is too long, the accuracy of the life evaluation result is affected.
In view of this, the utility model provides a reliable, efficient LED test automatic control system can successfully solve above-mentioned problem.
SUMMERY OF THE UTILITY MODEL
Utility model purpose: the utility model provides a LED test automatic control system, output current that can automatically regulated power module, operating condition that can each LED of real-time supervision can judge the individuality that failure mode and short circuit became invalid automatically to make other LED samples automatic recovery power supplies, with the problem of solving existence among the prior art.
The utility model has the following contents: an automatic control system for LED tests is used for carrying out a power-on test on a group of LED samples connected in series and outputting test current; when a failure sample appears in a group of LED samples, the failure sample is automatically short-circuited, and the serial number and the failure time of the failure sample are recorded until the test cut-off condition is reached. The scheme can automatically short-circuit the failure sample, and is convenient and reliable in recovery test.
Preferably, the automatic control system conducts a power-on test on a group of LED samples connected in series, and outputs a test current by using a programmable constant current source. The current of the programmable constant current source can be controlled to be constant, so that the accuracy and the continuity of the test are ensured.
Specifically, the method comprises the following steps: the device comprises an input module, a power supply module, a current sampling module, a monitoring and isolating module, a control module, a driving module and an execution module;
an input module: the control module is connected with the power supply module and used for inputting a test current preset value and providing the test current preset value for the control module;
a power supply module: the LED testing device is connected with the control module and provides test current for the LED sample; the LED sample has state information after being electrified with test current; the status information comprises serial number information of the LED sample;
a current sampling module: obtaining the test current of the LED sample, feeding the test current back to the control module when the test current changes, and enabling the power supply module to adjust the test current to recover to a current preset value by the control module;
monitoring and isolation module: monitoring the state of each LED sample, and feeding back the failure state information of the corresponding LED sample to the control module when the failure of the LED sample is monitored; the control module is isolated from the electric signals of the LED sample group, so that the control module is protected;
a control module: monitoring and adjusting the test current of the power supply module; receiving failure state information of the LED sample sent by the monitoring and isolating module, sending an electric signal to the driving module, and reading out failure time information of the LED sample;
a driving module: the control module is connected with the control module, receives the electric signal sent by the control module and drives the execution module to act;
an execution module: and the driving module drives the LED sample to be short-circuited. The specific scheme has the characteristics of reliability, continuity, full-automatic test and comprehensive information.
Further, still include the display module: and the control module is connected with the LED chip and is used for displaying the test current provided by the power supply module and the state information of the LED sample. The display module is convenient for displaying the state information in real time, improves the man-machine interaction and facilitates the operation and feedback of testers.
Further, the system also comprises a storage and printing module: and the control module is connected with the control module, receives the electric signal sent by the control module, and stores and prints the serial number information and the failure time information of the failed LED sample. The storage and printing module is very convenient for recording the information of the failed sample, and the efficiency of forming the test file is accelerated.
Furthermore, when the test current drifts, the current sampling module feeds back the test current to the control module, and the control module enables the power supply module to adjust the test current to recover to the current preset value.
Specifically, when the luminous flux of the LED sample is reduced by 50% or more, the LED sample is a failed LED sample. The failure LED sample detects the mode of luminous flux judging failure, and has the characteristics of sensitivity and reliability.
Specifically, when the LED test automatic control system reaches a test cut-off condition, the LED test automatic control system stops working. Stopping work saves test energy consumption.
Further, the test cut-off conditions are: the number of failed LED samples was 2/3 based on the total number of LED samples. The test cutoff condition takes the quantity proportion of the failed samples as the judgment basis to accord with the objective and actual judgment standard.
Further, the state information comprises number information, current information and luminous flux information of the LED sample. The number information, the current information and the luminous flux information are information which can be directly read in the test process, and are convenient to trace and search.
Compared with the prior art, the beneficial effects of the utility model reside in that: the utility model provides an experimental automatic control system of LED, the device is full-automatic, and experimental condition is simple and convenient, and the output result is reliable. The input module and the current sampling module ensure the stability of current, the monitoring and isolating module feeds back failure information of the LED sample in time, and the monitoring and isolating module isolates and protects the control module from electric signals; the driving module and the execution module specifically execute short-circuit failure samples timely and conveniently; the display module and the storage and printing module strengthen the man-machine interaction, so that a tester can obtain the test process and result data in time. The utility model discloses control logic is simple, and experimental guarantee nature is good, and the system is reliable stable, does benefit to very much and uses widely.
Drawings
Fig. 1 is a schematic view of an overall control structure according to a first embodiment of the present invention.
Fig. 2 is a schematic view of the overall structure of the second embodiment of the present invention.
In the figure: 1-an input module, 2-a power supply module, 3-a current sampling module, 4-an LED sample, 40-an LED sample group, 5-a monitoring and isolating module, 6-a control module, 7-a driving module, 8-an execution module, 9-a display module and 10-a storage and printing module;
100-LED test mechanism, 11-test bench, 110-origin positioning hole, 111-infrared signal emitter, 12-mechanical arm, 121-short-circuit mechanism, 122-infrared signal receiver, 81-rotary executing mechanism, 82-telescopic executing mechanism and 130-detection module.
Detailed Description
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following will briefly describe the embodiments.
Example one
Referring to fig. 1, an automatic control system for LED test performs a power-on test on a group of LED samples connected in series and outputs a test current, preferably a programmable constant current source; when a failure sample appears in a group of LED samples, the failure sample is automatically short-circuited, and the serial number and the failure time of the failure sample are recorded until the test cut-off condition is reached. The scheme can automatically short-circuit the failure sample, and is convenient and reliable in recovery test.
Specifically, the LED test automatic control system comprises: the device comprises an input module 1, a power supply module 2, a current sampling module 3, a display module 4, a monitoring and isolating module 5, a control module 6, a driving module 7 and an execution module 8; the test object comprises a group of LED samples 4 connected in series, and the LED samples are combined into an LED sample group 40;
an input module 1: the device is connected with the control module 6, and is used for inputting a preset test current value and providing the preset test current value for the control module 6;
and (3) the power supply module 2: the LED sample group 40 is connected with the control module 6 and provides test current for the LED sample group; supplying power to all other modules needing power; each LED sample has state information after 4 test currents are conducted; the state information comprises the number information of the LED sample 4, current information and luminous flux information;
a current sampling module: obtaining the test current of the LED sample 4, feeding back to the control module 6 when the test current changes, generally when the test current drifts, wherein the drift is caused by temperature drift or other environmental factors, the current sampling is to connect a high-precision resistor in a loop, and calculating the test current of the LED sample 4 according to ohm's law by reading the terminal voltage of the high-precision resistor; the control module 6 enables the power module 2 to adjust the test current to recover to the current preset value;
monitoring and isolation module 5: monitoring the state of each LED sample 4, and when the failure of the LED sample 4 is monitored, feeding back the failure state information of the corresponding LED sample 4 to the control module 6; and isolates the control module 6 from the electrical signals of the LED sample set 40, thereby protecting the control module 6;
the control module 6: monitoring and adjusting the test current of the power module 2; receiving failure state information of the LED sample 4 sent by the monitoring and isolating module 5, sending an electric signal to the driving module 7, and simultaneously reading out failure time information of the LED sample; the control module 6 is a PLC or a singlechip;
the driving module 7: the control module 6 is connected with the control module, receives the electric signal sent by the control module 6 and drives the execution module 8 to act; the execution module 8: driven by the driving module 8, the failed LED sample 4 is short-circuited.
Further, the LED test automatic control system further includes a display module 9: the LED testing device is connected with the control module 6 and used for displaying the magnitude of the testing current provided by the power supply module 2 and the state information of each LED sample 4; the LED test automatic control system further comprises a storage and printing module 10: and the LED testing device is connected with the control module 6, receives the electric signal sent by the control module 6, and stores and prints the test current, the test time information, the failure time information, the sample number information, the luminous flux parameter information and the like of the test loop of the failed LED sample 4. The display module 9 is convenient for displaying the state information in real time, and the man-machine interaction is improved; the storage and printing module is very convenient for recording the information of the failed sample, and the efficiency of forming the test file is accelerated.
And (3) judging a failed LED sample: when the luminous flux of the LED sample 4 is reduced by 50% or more, it is determined that the LED sample is the failed LED sample 4.
Specifically, when the LED test automatic control system reaches a test cut-off condition, the LED test automatic control system stops working, and the test cut-off condition is: the number of failed LED samples 4 was 2/3 based on the total number of LED samples 4.
Example two
As shown in fig. 2, the second embodiment expands the following modules on the basis of the first embodiment: an LED test mechanism 100, a detection module 130; the LED test mechanism 100 comprises a horizontally placed test bench 11 and a mechanical arm 12 arranged on the test bench 11; the execution module 8 comprises a rotary execution mechanism 81 and a telescopic execution mechanism 82; the LED sample 4 is placed on the test bench 11, the test bench 11 is provided with a short-circuit mechanism 121 on the side of the LED sample 4, and the short-circuit mechanism 121 is suitable for short-circuit of the LED.
Specifically, the test bench 11 is disc-shaped and is provided with an origin positioning hole 110; the LED sample groups 30 are connected in series and are arranged at corresponding positions of the disc of the test bench 11 according to the concentric, equal-radius and uniform angle; the actuating mechanism 8 comprises a rotary actuating mechanism 81, a telescopic actuating mechanism 82 and a short-circuit mechanism 121, the rotary actuating mechanism 81 and the telescopic actuating mechanism 82 are respectively arranged on the mechanical arm 12, and the rotary actuating mechanism 81 drives the mechanical arm 12 to rotate; the detection module 130 is mounted on the mechanical arm 12, and the mechanical arm 12 does not make telescopic motion so as to detect at a detectable position (close to the LED sample); the control module 6 controls the driving module 7 to drive the short-circuit mechanism 121 to carry out short-circuit on the failed LED sample, the short-circuit mechanism 121 is simple in structure, only the two ends of the failed LED sample 4 need to be short-circuited through conducted wires, and the short-circuit mechanism can be an execution unit such as a relay.
The origin locating hole 110 is provided with an infrared signal transmitter 111, the mechanical arm 12 is provided with an infrared signal receiver 122 at a corresponding position, each time the mechanical arm 12 rotates to the position above the origin locating hole 110, the infrared signal receiver 122 receives an infrared signal and transmits the infrared signal to the control module 6, the control module 6 enables the driving module 7 to send a reset driving signal, and the rotary executing mechanism 81 resets once to eliminate accumulated errors; similarly, for each expansion and contraction of the telescopic actuator 82, the control module 6 enables the driving module 7 to send a reset driving signal to reset the telescopic actuator 82 so as to eliminate accumulated errors, which is equivalent to 1 expansion and contraction for each time, testing one LED sample 4, withdrawing and resetting, rotating for a certain angle and then expanding and contracting for 1 time, and repeating the steps; when the rotating actuator 81 rotates for a circle, the rotating actuator is reset once;
the detection module 130 comprises a luminous flux tester for measuring the luminous flux of the LED sample 4, and compared with the electric performance test, the parameter test of the luminous flux has less interference, more definite stability and directivity, and the control module can more easily judge the failed sample; when the detection module 130 detects that the luminous flux of a certain LED sample 4 is smaller than the preset value, it is determined that the LED sample is a failed LED sample, and the control module 6 immediately drives the short-circuit mechanism 121 to short-circuit the failed LED sample 4, so as to ensure that other LED samples 4 continue to be tested normally.
In addition, the control module 6 sends an electric signal to the driving module 7, the driving module 7 drives the actuating mechanism 8, specifically, the rotating actuating mechanism 81 is driven to rotate according to a preset speed or angle, the preset value is preset in the control module 6, and when the rotating actuating mechanism is rotated to a position above the LED sample 4, the control module 6 controls the driving module 7 to drive the rotating actuating mechanism 81 to stop rotating; the control module 6 controls the driving module 7 to drive the telescopic actuator 82 to push the detection module 130 to a preset position near the LED sample 4, wherein the preset position is a position convenient for operating the LED sample 4, such as above the LED, and detects the characteristic parameter of the corresponding LED sample 4, and records and prints the characteristic parameter by the storage and printing module 10; when the detection module 130 detects that the luminous flux of the LED sample 4 is reduced by more than 50%, the LED sample is judged to be invalid, and the control module 6 controls the driving module 7 to drive the short-circuit mechanism 121 to carry out short-circuit on the invalid LED sample 4; when the number of failed LED samples 4 is the total number of LED samples 4, the test cut-off condition is reached. Wherein the rotary actuator 81 includes a rotary motor coaxial with the test stage 11, the rotary motor driving the robot arm 12 to perform a rotary operation; the telescopic executing mechanism 82 comprises a telescopic motor 82 or a linear motor, the telescopic motor drives a screw rod mechanism, or the linear motor drives a linear slide rail, preferably a mechanism that the telescopic motor drives a screw rod; the rotating motor and the telescopic motor are servo motors.
The above embodiments are only intended to illustrate the preferred embodiments of the present invention, and it should be noted that, for those skilled in the art, various modifications or equivalent substitutions can be made without departing from the principle of the present invention, and the scope of the present invention is to be considered as the protection scope of the present invention, which is still covered by the claims of the present invention.
Claims (10)
1. An automatic control system for LED tests is used for carrying out a power-on test on a group of LED samples connected in series and outputting test current; when a failure sample appears in a group of LED samples, the failure sample is automatically short-circuited, and the serial number and the failure time of the failure sample are recorded until a test cut-off condition is reached; when the luminous flux of a certain LED sample is smaller than a preset value, the LED sample is judged to be a failure sample.
2. The automatic control system for LED test as claimed in claim 1, wherein the automatic control system performs power-on test on a group of LED samples connected in series and outputs test current by using a programmable constant current source.
3. An LED test automatic control system according to claim 1 or 2, characterized by comprising: the device comprises an input module, a power supply module, a current sampling module, a monitoring and isolating module, a control module, a driving module and an execution module;
an input module: the control module is connected with the power supply module and used for inputting a test current preset value and providing the test current preset value for the control module;
a power supply module: the LED testing device is connected with the control module and provides test current for the LED sample; the LED sample has state information after being electrified with test current; the status information comprises serial number information of the LED sample;
a current sampling module: obtaining the test current of the LED sample, feeding the test current back to the control module when the test current changes, and enabling the power supply module to adjust the test current to recover to a current preset value by the control module;
monitoring and isolation module: monitoring the state of each LED sample, and feeding back the failure state information of the corresponding LED sample to the control module when the failure of the LED sample is monitored; the control module is isolated from the electric signal of the LED sample, so that the control module is protected;
a control module: monitoring and adjusting the test current of the power supply module; receiving failure state information of the LED sample sent by the monitoring and isolating module, sending an electric signal to the driving module, and reading out failure time information of the LED sample;
a driving module: the control module is connected with the control module, receives the electric signal sent by the control module and drives the execution module to act;
an execution module: and the driving module drives the LED sample to be short-circuited.
4. The automatic control system for the LED test according to claim 3, further comprising a display module: and the control module is connected with the LED chip and is used for displaying the test current provided by the power supply module and the state information of the LED sample.
5. The automatic control system for LED tests as claimed in claim 3, further comprising a storage and printing module: and the control module is connected with the control module, receives the electric signal sent by the control module, and stores and prints the serial number information and the failure time information of the failed LED sample.
6. The automatic control system for the LED test according to claim 3, wherein the current sampling module feeds back to the control module when the test current drifts, and the control module enables the power module to adjust the test current to restore to the preset current value.
7. The automatic control system for LED tests as claimed in claim 1, wherein when the luminous flux of the LED sample is reduced by more than 50%, the LED sample is a failed LED sample.
8. The LED test automatic control system according to claim 1, wherein when the LED test automatic control system reaches a test cut-off condition, the LED test automatic control system stops working.
9. The automatic control system for the LED test according to claim 8, wherein the test cut-off condition is as follows: the number of failed LED samples was 2/3 based on the total number of LED samples.
10. The automatic control system for LED tests as claimed in claim 6, wherein the status information comprises number information, current information and luminous flux information of LED samples.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920498483.0U CN210376578U (en) | 2019-04-14 | 2019-04-14 | LED test automatic control system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201920498483.0U CN210376578U (en) | 2019-04-14 | 2019-04-14 | LED test automatic control system |
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| CN210376578U true CN210376578U (en) | 2020-04-21 |
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| CN201920498483.0U Expired - Fee Related CN210376578U (en) | 2019-04-14 | 2019-04-14 | LED test automatic control system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109946581A (en) * | 2019-04-14 | 2019-06-28 | 苏州科技大学 | A kind of LED test automatic control system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109946581A (en) * | 2019-04-14 | 2019-06-28 | 苏州科技大学 | A kind of LED test automatic control system |
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