CN113295389B - Photoelectric parameter multi-stress online test platform - Google Patents
Photoelectric parameter multi-stress online test platform Download PDFInfo
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- CN113295389B CN113295389B CN202110655378.5A CN202110655378A CN113295389B CN 113295389 B CN113295389 B CN 113295389B CN 202110655378 A CN202110655378 A CN 202110655378A CN 113295389 B CN113295389 B CN 113295389B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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Abstract
The invention discloses a photoelectric parameter multi-stress online test platform, which comprises a vibration table, a multi-stress loading mechanism and an integrating sphere; the vibration table is used for loading vibration stress for the whole test platform; the integrating sphere is used for measuring photoelectric parameters; the multi-stress loading mechanism comprises a circular temperature control table, an integrating sphere connecting part, an aluminum-based circuit board and a rotary light splitter; one end of the circular temperature control table is connected with the power output end of the vibrating table, the other end of the circular temperature control table is attached to the wall and provided with an aluminum-based circuit board, a rotary light splitter is arranged at the position opposite to the aluminum-based circuit board, the rotary light splitter is in power connection with a rotary stepping motor, and the rotary stepping motor drives the rotary light splitter to rotate; the rotary light splitter is provided with a mobile stepping motor and is used for adjusting the distance between the rotary light splitter and the aluminum-based circuit board; the integrating sphere connecting part is sleeved outside the circular temperature control table and connected with a window of the integrating sphere, the aluminum-based circuit board and the rotary light splitter are arranged inside the integrating sphere, and the platform can complete on-line measurement of LED photoelectric parameters of temperature, vibration and current in a fully-coupled loading mode.
Description
Technical Field
The invention belongs to the technical field of testing, and particularly relates to a small multi-stress composite loading online testing system for LED photoelectric parameter measurement.
Background
For a semiconductor Light Emitting Diode (LED) with a theoretical life of 25000 hours, a life test method of a conventional lighting product is adopted, the LED lighting product needs to be tested for not less than 6000 hours, and photometric parameters are recorded every 1000 hours under the conditions of an ambient temperature of 25 ℃ and a rated current (voltage), which obviously causes great loss of manpower, material resources and financial resources of quality inspection mechanisms and manufacturers. In order to shorten the life test time, the aging of the product is accelerated by a stress increasing method under the condition that the failure mechanism is not changed in the accelerated life test, so that the failure information of the product is obtained in a short time, and the life characteristic of the product under the normal stress condition is extrapolated.
The accelerated stress of the accelerated life test can be factors such as temperature, current, vibration and the like, most of the existing accelerated life test platforms adopt a non-online measurement mode, that is, an LED sample is accelerated and aged in a stress accelerating device, after the aging of each accelerated stress level is completed, the sample needs to be taken out of the accelerated aging device, is cooled for 2 hours under normal working conditions, and is put into a photoelectric parameter test device to test the variation of the LED photochromic and electric parameters (the measurement parameters can be luminous flux, color temperature, junction temperature, color drift and the like) after the stress is loaded, after the test of the photochromic and electric parameters is completed, the LED sample returns to the accelerated stress device to enter the next accelerated aging period until a data point generating obvious change is found in the measurement parameters, so that the life of the sample is predicted. In the testing method, from the aspect of simulating the aging of the LED, the aging process of the LED is interrupted at intervals, and principle errors exist; in addition, the acceleration stress device is separated from the photoelectric parameter testing equipment, and complete multi-stress coupling of the tested LED chip is difficult to directly complete on the photoelectric testing equipment.
Disclosure of Invention
In order to solve the defects in the prior art, the invention provides a photoelectric parameter multi-stress online test platform which can complete the online measurement of LED photoelectric parameters of temperature, vibration and current through complete coupling loading.
The technical scheme adopted by the invention is as follows:
the photoelectric parameter multi-stress online test platform comprises a vibration table, a multi-stress loading mechanism and an integrating sphere; the vibration table is used for loading vibration stress for the whole test platform; the integrating sphere is used for measuring photoelectric parameters; the multi-stress loading mechanism comprises a circular temperature control table, an integrating sphere connecting part, an aluminum-based circuit board and a rotary light splitter; one end of the circular temperature control table is connected with the power output end of the vibrating table, the other end of the circular temperature control table is attached to the wall and provided with an aluminum-based circuit board, a rotary light splitter is arranged at the position opposite to the aluminum-based circuit board, the rotary light splitter is in power connection with a rotary stepping motor, and the rotary stepping motor drives the rotary light splitter to rotate; the rotary light splitter is provided with a mobile stepping motor and is used for adjusting the distance between the rotary light splitter and the aluminum-based circuit board; the integrating sphere connecting part is sleeved outside the round temperature control table and connected with a window of the integrating sphere, and the aluminum-based circuit board and the rotary light splitter are arranged inside the integrating sphere.
Furthermore, n LED chips are uniformly arranged on the aluminum-based circuit board along the circumferential direction.
Furthermore, n-1 blind holes and 1 through hole are arranged on the side face, opposite to the aluminum-based circuit board, of the rotary light splitter in an array mode along the circumferential direction, and the blind holes and the through holes are arranged opposite to the LED chip to be detected on the aluminum-based circuit board.
Furthermore, a thermal resistance wire is arranged in the circular temperature control platform, the thermal resistance wire is connected with a temperature controller through a lead, and certain heat is loaded to the circular temperature control platform through the temperature controller and is used for simulating the loading of temperature stress on the LED chip.
Furthermore, the LED chip is connected with a current controller through a wire, and the current controller controls the current of the LED chip and is used for simulating the loading of current stress on the LED chip.
Furthermore, the rotary optical splitter is disc-shaped, a connecting hole is formed in the center of the rotary optical splitter, the rotary optical splitter is connected with the power transmission of the rotary stepping motor through the connecting hole, and then the power transmission between the rotary stepping motor and the rotary optical splitter is achieved.
Furthermore, a first motor mounting hole is axially formed in the center of the circular temperature control table, and a rotary stepping motor is mounted in the first motor mounting hole.
Further, radially having seted up reserved passageway on circular control by temperature change platform, the second motor mounting hole has been seted up along the axial on the integrating sphere adapting unit, install mobile stepper motor in the second motor mounting hole, mobile stepper motor's output shaft sets up to the screw rod shape, and the cover is equipped with the nut on mobile stepper motor's output shaft, be connected through the rigidity pole between this nut and the rotatory stepper motor, the top of this rigidity pole penetrate first motor mounting hole and with rotatory stepper motor external connection from reserved passageway.
The invention has the beneficial effects that:
1. the test platform can realize the respective single stress loading of temperature, vibration and current, and the simultaneous complete coupling loading of double stress and triple stress, and realize the stress coupling completely consistent with the real working environment of the tested electronic device.
2. According to the test platform, the stress loading equipment and the photoelectric test equipment of the LED chip are integrated, direct photoelectric test that the stress loading of the LED chip is not stopped can be carried out, the test result is more in line with the actual working condition of the LED chip, and the result is more accurate.
Drawings
FIG. 1 is a schematic view of a multi-stress on-line testing platform for photoelectric parameters according to the present invention;
FIG. 2 is a schematic structural view of the multi-stress loading mechanism of the present invention;
FIG. 3 is a schematic diagram of a rotating beam splitter according to the present invention;
in the figure, 1, a rotary stepping motor controller, 2, a mobile stepping motor controller, 3, a temperature controller, 4, a current controller, 5, an integrating sphere, 6, an integrating sphere support, 7, a vibration table support, 8, a vibration table, 9, a temperature control table, 10, an aluminum-based circuit board, 11, a rotary light splitter, 12, an LED chip, 13, a mobile stepping motor, 14, a rotary stepping motor, 15 and an integrating sphere connecting part.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The photoelectric parameter multi-stress online test platform shown in fig. 1 comprises a vibration table 8, a multi-stress loading mechanism and an integrating sphere 5; the bottom of the vibration table 8 is fixedly arranged on the base through a vibration table bracket 7, and the bottom of the integrating sphere 5 is fixedly arranged on the base through an integrating sphere bracket 6; the power output end of the vibration table 8 is connected with the integrating sphere 5 through a multi-stress loading mechanism.
The structure of the multi-stress loading mechanism is shown in fig. 2, and comprises a circular temperature control table 9, an integrating sphere connecting part 15, an aluminum-based circuit board 10 and a rotary beam splitter 11. One end of the circular temperature control table 9 is connected with the power output end of the vibrating table 8 (or a clamp of the vibrating table 8 can be connected with the left end of the circular temperature control table 9), and the vibrating table 8 is used for loading vibration stress on the LED chip 12. The other end of the circular temperature control table 9 is provided with an aluminum-based circuit board 10 in an adherent manner, the aluminum-based circuit board 10 is used for fixing LED chips 12 to be detected, the n LED chips 12 are fixedly installed on the aluminum-based circuit board 10 along the circumferential direction in an array manner during detection, and a through hole is formed in the center of the aluminum-based circuit board 10. A first motor mounting hole is axially formed in the center of the circular temperature control table 9, a rotary stepping motor 14 is mounted in the first motor mounting hole, and a power output shaft of the rotary stepping motor 14 penetrates through a through hole in the center of the aluminum-based circuit board 10 to be connected with a rotary optical splitter 11; the rotary stepping motor 14 controls the rotation of the circular rotary beam splitter 11. In addition, a reserved channel is arranged on the circular temperature control table 9 along the radial direction. The round temperature control table 9 is internally provided with a thermal resistance wire, the thermal resistance wire is connected with the temperature controller 3 through a lead, and the temperature controller 3 loads certain heat to the round temperature control table 9 for simulating the loading of temperature stress on the LED chip 12. The LED chip 12 is connected with the current controller 4 through a wire, the current controller 4 controls the current of the LED chip 12, and the current stress can be loaded on the LED chip 12. The rotary stepping motor 14 is in signal connection with the rotary stepping motor controller 1, and the rotary stepping motor controller 1 controls the start and stop of the rotary stepping motor 14. In the present embodiment, the LED chip 12 may be directly fixed on the aluminum-based circuit board 10 by an adhesive, or may be directly fixed on the aluminum-based circuit board 10 by a fastener such as a screw.
As shown in fig. 3, the structure of the rotary beam splitter 11 is that the rotary beam splitter 11 is disc-shaped, and a connection hole is formed in the center of the rotary beam splitter 11, through which connection between the rotary beam splitter 11 and the power transmission of the rotary stepping motor 14 is achieved, thereby achieving power transmission between the rotary stepping motor 14 and the rotary beam splitter 11. N-1 blind holes and 1 through hole are arranged on the side face, opposite to the aluminum-based circuit board 10, of the rotary light splitter 11 in an array mode along the circumferential direction, and the number of the blind holes is the same as that of the LED chips 12 to be detected on the aluminum-based circuit board 10, so that the blind holes and the LED chips 12 can correspond to each other one by one in the detection process; in the present embodiment, a total of 6 holes are formed, one through hole and the rest are blind holes.
The integrating sphere connecting part 15 is a ring-shaped part, the integrating sphere connecting part 15 is sleeved outside the circular temperature control table 9 by using a through hole at the center of the integrating sphere connecting part 15, a second motor mounting hole is formed on the integrating sphere connecting part 15 along the axial direction, a movable stepping motor 13 is arranged in the second motor mounting hole, the output shaft of the movable stepping motor 13 is arranged in a screw rod shape, a nut is sleeved on the output shaft of the movable stepping motor 13, the nut is connected with the rotary stepping motor 14 through a rigid rod, the top of the rigid rod penetrates into the first motor mounting hole from the reserved channel and is connected with the outside of the rotary stepping motor 14, the position of the rotary stepping motor 14 is driven to move left and right by the operation of the movable stepping motor 13, and the rotating stepper motor 14 drives the distance between the rotating beam splitter 11 and the aluminum-based circuit board 10 (and the LED chip 12 on the aluminum-based circuit board 10) to change. Integrating sphere connecting part 15 passes through connecting piece fixed connection with the window border of integrating sphere 5, and aluminium base circuit board 10, rotatory spectrometer 11 all place inside integrating sphere 5. The moving stepping motor 13 is in signal connection with the moving stepping motor controller 2, and the moving stepping motor controller controls the work start and stop of the moving stepping motor 13.
In order to explain the optoelectronic parameter multi-stress online test platform in the present application more clearly, the following further explains the working process of the optoelectronic parameter multi-stress online test platform in combination:
certain heat is loaded to the circular temperature control table 9 through the temperature controller 3, and then the heat is transferred to the LED chip 12 on the aluminum-based circuit board 10 to simulate the loading of temperature stress on the LED chip 12.
Vibration is transmitted to the circular temperature control table 9 by using the vibration table 8, and then vibration stress is loaded on the LED chip 12 on the circular temperature control table 9.
The current controller 4 controls the current of the LED chip 12, and can load the current stress on the LED chip 12.
Therefore, the test platform can realize the respective single stress loading of temperature, vibration and current, and the simultaneous complete coupling loading of double stress and triple stress, and realize the stress coupling which is completely consistent with the real working environment of the tested electronic device.
The round temperature control table 9 is connected with the window of the integrating sphere 5, so that the stress loading equipment and the photoelectric testing equipment can be integrated, and as shown in the attached figures 1 and 2, when the movable stepping motor 13 drives the rotary optical splitter 11 to move rightwards through the rotation of a screw and a nut, the rotary optical splitter 11 is far away from the surface of the LED chip 12, and meanwhile, the LED chip 12 continues to be subjected to stress loading; when the stress loading is suspended, the rotating optical splitter 11 moves leftwards and is buckled on the surface of the LED chip 12, only the LED chip 12 selected by the only through hole of the rotating optical splitter 11 is scattered into the integrating sphere 5, the photoelectric parameter is measured, and the light of the rest n-1 LED chips 12 is shielded by the blind hole of the rotating optical splitter 11. The rotation of the rotary stepping motor 14 is controlled by the rotary stepping motor controller 1, and the movement of the moving stepping motor 13 is controlled by the moving stepping motor controller 2.
The above embodiments are only used for illustrating the design idea and features of the present invention, and the purpose of the present invention is to enable those skilled in the art to understand the content of the present invention and implement the present invention accordingly, and the protection scope of the present invention is not limited to the above embodiments. Therefore, all equivalent changes and modifications made in accordance with the principles and concepts disclosed herein are intended to be included within the scope of the present invention.
Claims (8)
1. The photoelectric parameter multi-stress online test platform is characterized by comprising a vibration table (8), a multi-stress loading mechanism and an integrating sphere (5); the vibration table (8) is used for loading vibration stress for the whole test platform; the integrating sphere (5) is used for measuring photoelectric parameters; the multi-stress loading mechanism comprises a circular temperature control table (9), an integrating sphere connecting part (15), an aluminum-based circuit board (10) and a rotary light splitter (11); one end of a circular temperature control table (9) is connected with the power output end of a vibrating table (8), the other end of the circular temperature control table (9) is attached to the wall and provided with an aluminum-based circuit board (10), a rotary light splitter (11) is arranged at the position opposite to the aluminum-based circuit board 10, the rotary light splitter (11) is in power connection with a rotary stepping motor (14), and the rotary stepping motor (14) drives the rotary light splitter (11) to rotate; the rotary optical splitter (11) is provided with a mobile stepping motor (13) for adjusting the distance between the rotary optical splitter (11) and the aluminum-based circuit board (10); integrating sphere connecting part (15) suit is outside circular temperature control platform (9) and is connected with the window of integrating sphere (5), and aluminium base circuit board (10), rotatory spectrometer (11) are all arranged in integrating sphere (5).
2. The multi-stress on-line test platform for photoelectric parameters according to claim 1, characterized in that n LED chips (12) are uniformly mounted on the aluminum-based circuit board (10) along the circumferential direction.
3. The photoelectric parameter multi-stress online test platform according to claim 2, wherein n-1 blind holes and 1 through hole are arranged in a circumferential direction in an array on the side surface of the rotary beam splitter (11) opposite to the aluminum-based circuit board (10), and the holes are arranged opposite to the LED chip (12) to be detected on the aluminum-based circuit board (10).
4. The photoelectric parameter multi-stress online test platform according to claim 1, 2 or 3, wherein a thermal resistance wire is arranged in the circular temperature control platform (9), the thermal resistance wire is connected with the temperature controller (3) through a lead, and a certain amount of heat is loaded to the circular temperature control platform (9) through the temperature controller (3) for simulating the loading of the temperature stress on the LED chip (12).
5. The online multi-stress test platform for photoelectric parameters according to claim 4, wherein the LED chip 12 is connected to the current controller (4) through a wire, and the current controller (4) controls the current magnitude of the LED chip (12) for simulating the loading of the LED chip (12) with current stress.
6. The online multi-stress testing platform for photoelectric parameters according to claim 4, wherein the rotating beam splitter (11) is disc-shaped, and a connection hole is formed at the center of the rotating beam splitter (11), through which the connection between the rotating beam splitter (11) and the power transmission of the rotating stepping motor (14) is realized, so as to realize the power transmission between the rotating stepping motor (14) and the rotating beam splitter (11).
7. The photoelectric parameter multi-stress online test platform according to claim 6, wherein a first motor mounting hole is axially formed in the center of the circular temperature control table (9), and a rotary stepping motor (14) is mounted in the first motor mounting hole.
8. The photoelectric parameter multi-stress online test platform according to claim 7, wherein a reserved channel is radially arranged on the circular temperature control platform (9), a second motor mounting hole is axially arranged on the integrating sphere connecting component (15), a moving stepping motor (13) is mounted in the second motor mounting hole, an output shaft of the moving stepping motor (13) is in a screw rod shape, a nut is sleeved on the output shaft of the moving stepping motor (13), the nut is connected with the rotating stepping motor (14) through a rigid rod, and the top of the rigid rod penetrates through the first motor mounting hole from the reserved channel and is externally connected with the rotating stepping motor (14).
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110655378.5A CN113295389B (en) | 2021-06-11 | 2021-06-11 | Photoelectric parameter multi-stress online test platform |
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| CN202110655378.5A CN113295389B (en) | 2021-06-11 | 2021-06-11 | Photoelectric parameter multi-stress online test platform |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104569778A (en) * | 2014-12-20 | 2015-04-29 | 佛山市多谱光电科技有限公司 | LED integrated ageing and life rapid detection device |
| CN105444995A (en) * | 2015-11-17 | 2016-03-30 | 中国科学院长春光学精密机械与物理研究所 | LED-lamp accelerated-life on-line detection equipment |
| CN208171441U (en) * | 2018-05-04 | 2018-11-30 | 陕西中科启航科技有限公司 | For observing the high spectrum radiometer of spoke brightness |
| CN109669116A (en) * | 2019-02-26 | 2019-04-23 | 河海大学常州校区 | A kind of multiple physical field LED ageing tester and method |
| CN110045257A (en) * | 2019-03-05 | 2019-07-23 | 江苏大学 | One kind is based on gray system theory LED chip heat vibration accelerated aging prediction technique |
-
2021
- 2021-06-11 CN CN202110655378.5A patent/CN113295389B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104569778A (en) * | 2014-12-20 | 2015-04-29 | 佛山市多谱光电科技有限公司 | LED integrated ageing and life rapid detection device |
| CN105444995A (en) * | 2015-11-17 | 2016-03-30 | 中国科学院长春光学精密机械与物理研究所 | LED-lamp accelerated-life on-line detection equipment |
| CN208171441U (en) * | 2018-05-04 | 2018-11-30 | 陕西中科启航科技有限公司 | For observing the high spectrum radiometer of spoke brightness |
| CN109669116A (en) * | 2019-02-26 | 2019-04-23 | 河海大学常州校区 | A kind of multiple physical field LED ageing tester and method |
| CN110045257A (en) * | 2019-03-05 | 2019-07-23 | 江苏大学 | One kind is based on gray system theory LED chip heat vibration accelerated aging prediction technique |
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