CN211856792U - Automatic collection system for LED service life characteristic parameters - Google Patents

Automatic collection system for LED service life characteristic parameters Download PDF

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Publication number
CN211856792U
CN211856792U CN202020222218.2U CN202020222218U CN211856792U CN 211856792 U CN211856792 U CN 211856792U CN 202020222218 U CN202020222218 U CN 202020222218U CN 211856792 U CN211856792 U CN 211856792U
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China
Prior art keywords
led
mechanical arm
actuating mechanism
disc type
infrared signal
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Expired - Fee Related
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CN202020222218.2U
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Chinese (zh)
Inventor
石颉
申海锋
孔维相
袁晨翔
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Suzhou University of Science and Technology
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Suzhou University of Science and Technology
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Abstract

The utility model discloses an automatic collection system of LED life characteristic parameters, which comprises an LED life test module, and comprises a disc type test rack for placing LEDs to be tested, wherein the test rack is provided with an mechanical arm, the mechanical arm is provided with a detection module, and the mechanical arm is also provided with an actuating mechanism for driving the mechanical arm to move; actuating mechanism includes the rotatory actuating mechanism that drives the arm rotation, radial flexible actuating mechanism that drives the arm and follow disc type test bench radial motion and the flexible actuating mechanism of axial of driving the arm and follow disc type test bench axial motion, this mechanism is through radial flexible actuating mechanism and the flexible actuating mechanism of axial, make this test system can be through reasonable topology extension, realize enlarging the purpose in test sample space, it is more effective to make life-span assessment result, this device uses the illuminometer to realize the measurement of illuminance simultaneously, and illuminance can pass through the functional relation conversion with luminous flux, thereby make the acquireing of luminous flux more simple and convenient accurate.

Description

Automatic collection system for LED service life characteristic parameters
Technical Field
The utility model relates to a LED life-span detection area, in particular to LED life-span characteristic parameter automatic acquisition system.
Background
In the prior art, an LED can convert electric energy into light energy, and has the characteristics of high efficiency, pure light color, flexible application, high light quality and the like, so that the LED is used as a light source in many photoelectric control devices and is used as a signal display in electronic devices.
However, during the use of the LED, the LED inevitably ages due to the current and the external environment. The aging of the LED mainly includes the aging of the chip and the aging of the package. The aging mechanism of the chip comprises thermomechanical stress strengthening and chip crack expansion caused by heat accumulation, complete separation of a chip bonding layer from a bonding surface caused by poor process and the like. The aging mechanism of packaging is mainly that high temperature and humidity lead to the deterioration of packaging materials, water vapor permeates into the packaging materials to cause lead deterioration and PCB copper wire corrosion, and movable conductive ions introduced by the water vapor can reside on the surface of a chip to cause electric leakage. The light emitting efficiency of the aged LED lamp is greatly reduced, the purity of light color is reduced, and even the LED lamp is burnt out.
However, the aging of the LED is not easily observed and judged directly, and is not easily judged by all detection due to the large number of applications. As a modern energy-saving and environment-friendly lamp, once the lamp is aged or burnt out, the circuit loses the indicating function, and great influence is brought to maintenance work. This phenomenon presents a significant safety hazard for certain important circuits.
Although development is carried out, an LED detection system has been developed, but the feature quantity acquisition module has the following problems:
1. when the characteristic parameter luminous flux of the LED is collected at present, a service life evaluation method based on statistics requires that the number of test samples is large enough, but the collection of large-scale test samples cannot be realized by the current collection system;
2. when LED luminous flux is collected, the characteristic quantity is inaccurate due to the influence of the brightness of adjacent LEDs;
3. the direct collection of the luminous flux presents great difficulties in an automated implementation.
SUMMERY OF THE UTILITY MODEL
The utility model provides a technical problem provide a LED life characteristic parameter automatic acquisition system to solve present test sample quantity not much, thereby assess the problem that the result precision influences life-span.
The utility model provides a technical scheme that its technical problem adopted is: an automatic collection system for LED life characteristic parameters comprises an LED life test module and a disc type test bench for placing an LED to be tested, wherein a mechanical arm is arranged on the test bench, a illuminometer is arranged on the mechanical arm, an actuating mechanism for driving the mechanical arm to move is further arranged on the mechanical arm, and light blocking modules with adjustable heights are arranged around the illuminometer;
the executing mechanism comprises a rotary executing mechanism for driving the mechanical arm to rotate, a radial telescopic executing mechanism for driving the mechanical arm to move along the radial direction of the disc type test bench and an axial telescopic executing mechanism for driving the mechanical arm to move along the axial direction of the disc type test bench;
the device also comprises a control module and a data storage and display module, wherein the control module is respectively connected with the actuating mechanism, the illuminometer and the data storage and display module.
Further, the method comprises the following steps: the test bench is characterized in that an original point positioning hole used for giving reset signals to the actuating mechanism is formed in the disc type test bench, an infrared signal transmitter is arranged at the original point positioning hole, an infrared signal receiver matched with the infrared signal transmitter is arranged on the mechanical arm, and the infrared signal transmitter and the infrared signal receiver are both connected with the control module.
Further, the method comprises the following steps: the light blocking module is a baffle plate with adjustable height and arranged around the mechanical arm.
Further, the method comprises the following steps: the LED circuit testing device further comprises a data storage and display module which is used for recording loop testing current, time information and detection data of all the LED samples and displaying the data according to instructions, and the data storage and display module is connected with the control module.
Further, the method comprises the following steps: still including setting up the short circuit mechanism that is used for carrying out the short circuit at disc type test rack to inefficacy LED.
Further, the method comprises the following steps: the rotary actuating mechanism is a servo motor which is coaxial with the disc type test bench.
The utility model has the advantages that:
1. the illuminance meter is used for measuring the illuminance, and the illuminance can be converted with the luminous flux through a functional relation, so that the luminous flux can be acquired more simply, conveniently and accurately;
2. the light blocking module is adopted to realize the isolation of the tested LED from other LEDs, so that the measurement result of the LED is not interfered by other LEDs;
3. through the radial telescopic actuating mechanism and the axial telescopic actuating mechanism, the test system can achieve the purpose of expanding the space of a test sample through reasonable topological expansion, and the service life evaluation result is more effective.
Drawings
Fig. 1 is a schematic structural diagram of the acquisition system.
Fig. 2 is a schematic diagram of the module electrical connection of the acquisition system.
Reference numerals:
11-a test bench, 110-an original point positioning hole, 111-an infrared signal emitter, 12-a mechanical arm, 121-an infrared signal receiver, 122-a rotary actuator, 123-a radial telescopic actuator, 124-an axial telescopic actuator, 125-a light blocking module, 126-an illuminometer and 130-an LED sample.
Detailed Description
The present invention will be further described with reference to the accompanying drawings and the following detailed description.
An LED lifetime characteristic parameter automatic acquisition system as shown in fig. 1 and fig. 2 includes an LED lifetime test module, which has been clearly elucidated in the previous patent "an LED test automatic control system" and "an LED aging state automatic detection and lifetime evaluation system and method thereof", and is not improved in the present application, and thus is not repeated herein, and includes a disc-type test bench 11 for placing an LED to be tested, wherein the test bench 11 is provided with a mechanical arm 12, the mechanical arm 12 is provided with an illuminometer 126, the mechanical arm 12 is further provided with an actuating mechanism for driving the mechanical arm 12 to move, and the illuminometer 126 is provided with a height-adjustable light-blocking module 125 at the periphery;
the actuating mechanisms comprise a rotary actuating mechanism 122 for driving the mechanical arm 12 to rotate, a radial telescopic actuating mechanism 123 for driving the mechanical arm 12 to move along the radial direction of the disc type test bench 11, and an axial telescopic actuating mechanism 124 for driving the mechanical arm 12 to move along the axial direction of the disc type test bench 11;
the device also comprises a control module and a data storage and display module, wherein the control module is respectively connected with the actuating mechanism, the illuminometer 126 and the data storage and display module;
the light blocking module 125 is a baffle plate with adjustable height arranged around the mechanical arm 12, and can also be designed into a baffle cover, etc., the baffle plate and the baffle cover can be designed into a fixed type or a telescopic type, and the telescopic light blocking module 125 is controlled by a control module;
during specific work, the LED sample 130 groups are connected in series and are arranged at corresponding positions of the disc type test bench 11 according to a concentric, equal-radius and uniform angle, the control module controls the rotary actuator 122 to rotate at a preset speed or angle, the preset value is preset in the control module, and when the rotary actuator 122 rotates to a position above the LED sample 130, the control module controls the rotary actuator 122 to stop rotating; simultaneously, the axial telescopic actuator 124 is driven to push the detection device to a preset position, and the illuminometer detects the illuminance of the corresponding LED sample 130; during detection, the light blocking module 125 can isolate the detected LED from other LEDs, so that the measurement result of the LED is not interfered by other LEDs, after the rotary actuator 122 rotates for one circle, the control module controls the radial telescopic actuator 123 to drive the mechanical arm 12 to drive the detection device to move to the positions of the LED samples 130 with different radii, and continues to detect until all the LED samples 130 are measured, that is, a measurement period is finished, wherein the rotary actuator 122 comprises a rotary motor coaxial with the test bench 11, and the rotary motor drives the mechanical arm 12 to rotate; the radial telescopic actuator 123 and the axial telescopic actuator 124 are high-precision motor-driven lead screws or linear motor-driven linear slide rails, preferably high-precision motor-driven lead screw mechanisms; the rotating motor and the telescopic motor are servo motors; by changing the radius, the structure can realize the simultaneous test of multiple groups of concentric, equal-number and equal-angle LED samples, thereby enlarging the space of a test sample, realizing the purpose of enlarging the space of the test sample by reasonable topological expansion of the test system and enabling the service life evaluation result to be more effective;
the illuminance after the detection is based on the conversion between the illuminance and the luminous flux, and the unit of the illuminance is lux, that is, the illuminance in which the luminous flux of 1 lux-1 lumen is uniformly distributed on an area of 1 square meter, so that the luminous flux can be rapidly acquired by using the illuminometer 126, and the luminous flux can be acquired more simply, conveniently and accurately.
On the basis, as shown in fig. 1, an origin positioning hole 110 for giving a reset signal to an actuator is arranged on the disc-type test bench 11, an infrared signal transmitter 111 is arranged at the origin positioning hole 110, an infrared signal receiver 121 used in cooperation with the infrared signal transmitter 111 is arranged on the mechanical arm 12, both the infrared signal transmitter 111 and the infrared signal receiver 121 are connected with a control module, and during specific work, when the mechanical arm 12 rotates to the position above the origin positioning hole 110 each time, the infrared signal receiver 121 receives the infrared signal and transmits the infrared signal to the control module, and the control module transmits a reset driving signal to reset the rotary actuator 122 so as to eliminate an accumulated error; similarly, for each expansion and contraction of the axial expansion and contraction actuator 124, the control module sends a reset driving signal to reset the expansion and contraction actuator to eliminate accumulated errors, which is equivalent to 1 expansion and contraction, testing one LED sample 130, withdrawing and resetting, rotating for 1 expansion and contraction again at a certain angle, and repeating the steps; and when the test platform rotates for a circle, the rotary executing mechanism 122 resets once, and the test accuracy can be ensured to the maximum extent by the arrangement.
On the basis, the LED testing device further comprises a data storage and display module which is used for recording the loop testing current, the time information and the detection data of all the LED samples 130 and displaying the data according to the instructions, the data storage and display module is connected with the control module and is used for receiving the instructions of the control module, automatically recording the loop testing current, the time information and the detection data of all the LED samples 130 and displaying the data according to the instructions, and therefore man-machine interaction is improved and the efficiency of forming the testing files is improved.
On the basis, still including setting up the short circuit mechanism that is used for carrying out the short circuit to inefficacy LED at disc type test rack 11, after LED detected inefficacy, control module control short circuit mechanism carries out the short circuit to inefficacy LED, short circuit mechanism simple structure, only need with the LED both ends that lose efficacy with the wire short circuit that switches on can, can be execution unit such as relay.
The above-mentioned embodiments, further detailed description of the objects, technical solutions and advantages of the present invention, it should be understood that the above-mentioned embodiments are only specific embodiments of the present invention, and are not intended to limit the present invention, and any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims (6)

1. The utility model provides a LED life characteristic parameter automatic acquisition system, includes LED life test module, its characterized in that: the LED testing device comprises a disc type testing rack (11) used for placing an LED to be tested, wherein a mechanical arm (12) is arranged on the testing rack (11), a illuminometer (126) is arranged on the mechanical arm (12), an executing mechanism for driving the mechanical arm (12) to move is further arranged on the mechanical arm (12), and light blocking modules (125) with adjustable heights are arranged around the illuminometer (126);
the executing mechanism comprises a rotary executing mechanism (122) for driving the mechanical arm (12) to rotate, a radial telescopic executing mechanism (123) for driving the mechanical arm (12) to move along the radial direction of the disc type test rack (11), and an axial telescopic executing mechanism (124) for driving the mechanical arm (12) to move along the axial direction of the disc type test rack (11);
the device also comprises a control module and a data storage and display module, wherein the control module is respectively connected with the actuating mechanism, the illuminometer (126) and the data storage and display module.
2. The automatic LED lifetime characteristic parameter acquisition system according to claim 1, wherein: the test bench is characterized in that an origin positioning hole (110) used for giving reset signals to the actuating mechanism is formed in the disc type test bench (11), an infrared signal transmitter (111) is arranged at the origin positioning hole (110), an infrared signal receiver (121) matched with the infrared signal transmitter (111) for use is arranged on the mechanical arm (12), and the infrared signal transmitter (111) and the infrared signal receiver (121) are both connected with the control module.
3. The automatic LED lifetime characteristic parameter acquisition system according to claim 1, wherein: the light blocking module (125) is a baffle plate with adjustable height and arranged around the mechanical arm (12).
4. An automatic collection system for LED lifetime characteristic parameters according to claim 1 or 2, wherein: the LED circuit testing device further comprises a data storage and display module which is used for recording loop testing current, time information and detection data of all the LED samples (130) and displaying the data according to instructions, and the data storage and display module is connected with the control module.
5. An automatic collection system for LED lifetime characteristic parameters according to claim 1 or 2, wherein: the LED short-circuit testing device further comprises a short-circuit mechanism which is arranged on the disc type testing rack (11) and used for short-circuit of the failure LED.
6. The automatic LED lifetime characteristic parameter acquisition system according to claim 1, wherein: the rotary executing mechanism (122) is a servo motor which is coaxial with the disc type test bench (11).
CN202020222218.2U 2020-02-28 2020-02-28 Automatic collection system for LED service life characteristic parameters Expired - Fee Related CN211856792U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202020222218.2U CN211856792U (en) 2020-02-28 2020-02-28 Automatic collection system for LED service life characteristic parameters

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202020222218.2U CN211856792U (en) 2020-02-28 2020-02-28 Automatic collection system for LED service life characteristic parameters

Publications (1)

Publication Number Publication Date
CN211856792U true CN211856792U (en) 2020-11-03

Family

ID=73236873

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202020222218.2U Expired - Fee Related CN211856792U (en) 2020-02-28 2020-02-28 Automatic collection system for LED service life characteristic parameters

Country Status (1)

Country Link
CN (1) CN211856792U (en)

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Granted publication date: 20201103