CN210198679U - Semiconductor laser power test and facula recognition device - Google Patents
Semiconductor laser power test and facula recognition device Download PDFInfo
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- CN210198679U CN210198679U CN201921144661.6U CN201921144661U CN210198679U CN 210198679 U CN210198679 U CN 210198679U CN 201921144661 U CN201921144661 U CN 201921144661U CN 210198679 U CN210198679 U CN 210198679U
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Abstract
The utility model discloses a semiconductor laser power test and facula recognition device, the device includes the base support, the base support top is equipped with first crossbeam, the base support middle part is equipped with the second crossbeam, first crossbeam one end fixed mounting has the integrating sphere, the integrating sphere bottom is equipped with two semi-transparent semi-reflective lens supports, semi-transparent semi-reflective lens both ends respectively with two semi-transparent semi-reflective lens support fixed connection, fixed mounting has the laser instrument socket on the base support, second crossbeam one end fixed mounting has the semi-transparent screen, other end fixed mounting has the CCD camera, the integrating sphere top is equipped with the test probe; the device can realize one-time feeding, and simultaneously complete the power test and the light spot identification test of the laser, thereby greatly improving the test efficiency; in the light spot identification test, the size and the shape of the light spot are quantitatively analyzed and judged through the computer control terminal, the difference of artificial judgment is eliminated, and the consistency of product test is improved.
Description
Technical Field
The utility model relates to a fixed technical field of laser instrument test specifically is a semiconductor laser power test and facula recognition device.
Background
At present, the power test and the light spot identification test of a semiconductor laser are separately tested, and the power test of the semiconductor laser is as follows (as shown in fig. 3): the laser is inserted into a laser socket, the laser is electrified to emit light, light enters the integrating sphere through the light inlet hole, the light entering the integrating sphere is reflected for multiple times by the inner surface and then is irradiated on the test probe, the test probe converts the received light into a current signal and feeds the current signal back to the power tester, the power tester converts the current signal into a digital signal and feeds the digital signal back to the computer control terminal, and the computer control terminal performs quantitative analysis and judgment on the digital signal to finish the test of the laser power; the test for semiconductor laser spot identification was (as shown in fig. 4): the method comprises the following steps of inserting a laser into a laser socket, enabling the laser to be electrified and emit light, projecting light onto a screen, forming light spots on the screen, identifying the size and the shape of the light spots through human eyes, and judging whether the light spots meet requirements or not; the power test and the light spot identification test of the semiconductor laser are divided into two independent steps at present, so that the time consumption is long, and the efficiency is low; in addition, in the test of the semiconductor laser light spot identification, human eyes are adopted to identify light spots, the size and the shape of the light spots cannot be quantitatively judged, and the difference of artificial judgment exists.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a semiconductor laser power test and facula recognition device to solve the problem among the prior art.
In order to achieve the above object, the utility model provides a following technical scheme:
a semiconductor laser power test and facula recognition device comprises a base support, a first beam is arranged at the top of the base support, a second beam is arranged at the middle of the base support, an integrating sphere is fixedly installed at one end of the first beam far away from the base support, the integrating sphere is a hollow sphere with a high-reflectivity inner surface, two window holes are formed in the wall of the sphere, one window hole is used as a light inlet, the other window hole is used as a receiving hole for placing a light receiving device test probe, incident light emitted by a laser device is incident on a semi-transparent semi-reflective lens, half of the incident light penetrates through the semi-transparent semi-reflective lens and enters the integrating sphere through the light inlet, the light entering the integrating sphere is incident on the test probe after being reflected for multiple times by the inner surface, the test probe converts the received light into a current signal and feeds the current signal back to a power tester, the power tester converts, the digital signal is fed back to a computer control terminal, the computer control terminal carries out quantitative analysis and judgment on the digital signal to finish the test of the laser power, the bottom of an integrating sphere is provided with a first semi-transparent semi-reflective lens bracket and a second semi-transparent semi-reflective lens bracket, a semi-transparent semi-reflective lens is arranged below the integrating sphere, the semi-transparent semi-reflective lens can penetrate half light of incident light through a lens, the other half light is reflected through the lens, one end of the semi-transparent semi-reflective lens is fixedly connected with one end of the first semi-transparent semi-reflective lens bracket far away from the integrating sphere, the other end of the semi-transparent semi-reflective lens is fixedly connected with one end of the second semi-transparent semi-reflective lens bracket far away from the integrating sphere, a laser socket is fixedly arranged on a base bracket and is used for inserting a laser, the laser socket is positioned below the integrating sphere, one end of a second beam close to the semi-transparent semi-reflective, the CCD camera is used for shooting light spots formed by light rays reflected to the semi-transparent screen and transmitting the formed pictures to the computer control terminal, the computer control terminal carries out quantitative analysis and judgment on the shape and the size of the light spots through the pictures to finish the quantitative identification of the light spots of the laser, the CCD camera is electrically connected with the computer control terminal and is controlled by the computer control terminal, the top of the integrating sphere is provided with a test probe and a test probe, that is, a sensor is a detecting device which can sense information to be measured and convert the sensed information into an electric signal according to a certain rule to output, the test probe is electrically connected with an external power tester, the external power tester is electrically connected with a computer control terminal, and the external power tester is controlled by the computer control terminal.
As optimization, the base support is of an L shape, the first cross beam is arranged at the top of the L-shaped vertical edge, the second cross beam is arranged in the middle of the L-shaped vertical edge, the first cross beam, the second cross beam and the L-shaped transverse edge are parallel to each other, the first cross beam, the second cross beam and the L-shaped transverse edge are perpendicular to the L-shaped vertical edge, and the first cross beam, the second cross beam and the L-shaped transverse edge are on one vertical straight line.
The CCD camera, the semi-transparent screen and the semi-transparent semi-reflecting lens are arranged on a horizontal straight line, the incident light emitted by the laser strikes the semi-transparent semi-reflecting lens, the other half of the incident light strikes the semi-transparent screen through reflection of the semi-transparent semi-reflecting lens, and light spots are formed on the semi-transparent screen.
As optimization, the first transflective lens bracket is far away from the translucent screen, the second transflective lens bracket is close to the translucent screen, and the length of the first transflective lens bracket is greater than that of the second transflective lens bracket, so that the translucent transflective lens faces the translucent screen.
As optimization, an acute angle formed by the semi-transparent semi-reflective lens and a horizontal straight line is 45 degrees, incident light emitted by the laser strikes the semi-transparent semi-reflective lens, the other half of the incident light is guaranteed to perpendicularly strike the semi-transparent screen after being reflected by the semi-transparent semi-reflective lens, light spots are formed on the semi-transparent screen, and loss of the reflected light is avoided.
Compared with the prior art, the beneficial effects of the utility model are that:
firstly, the semi-transmitting and semi-reflecting lens of the semiconductor laser power testing and light spot recognition device can enable one half of incident light to penetrate through the lens, and the other half of incident light is reflected through the lens; incident light emitted by the laser strikes the semi-transparent semi-reflective lens, half of the incident light penetrates through the semi-transparent semi-reflective lens and enters the integrating sphere through the light inlet, the incident light emitted by the laser is vertically upward, and the light penetrates through the semi-transparent semi-reflective lens and also vertically upward due to the fact that the light is transmitted along a straight line and enters the integrating sphere through the light inlet; incident light emitted by the laser strikes the semi-transparent and semi-reflective lens, and because the acute angle formed by the semi-transparent and semi-reflective lens and a horizontal straight line is 45 degrees, the other half of the incident light can vertically strike the semi-transparent screen after being reflected by the semi-transparent and semi-reflective lens, and light spots are formed on the semi-transparent screen, so that the reflected light is not lost;
secondly, the utility model discloses a semiconductor laser power test and facula recognition device can realize once material loading, accomplishes laser power test and facula recognition test simultaneously, has promoted test efficiency greatly; in the light spot identification test, the size and the shape of the light spot are quantitatively analyzed and judged through the computer control terminal, the difference of artificial judgment is eliminated, and the consistency of product test is improved.
Drawings
Fig. 1 is a schematic structural diagram of a power testing and light spot identifying device for a semiconductor laser according to the present invention;
fig. 2 is a schematic structural diagram of an integrating sphere and a semi-transparent and semi-reflective lens in the semiconductor laser power testing and light spot identification device of the present invention;
FIG. 3 is a schematic structural diagram of a conventional semiconductor laser power testing device;
fig. 4 is a schematic structural diagram of a conventional semiconductor laser spot recognition device.
In the figure: the device comprises a base support 1, a first beam 2, a second beam 3, an integrating sphere 4, a first semi-transparent semi-reflective lens support 5, a second semi-transparent semi-reflective lens support 6, a semi-transparent semi-reflective lens 7, a laser socket 8, a semi-transparent screen 9, a CCD camera 10 and a test probe 11.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
As shown in fig. 1 and fig. 2, a power testing and light spot identifying device for a semiconductor laser comprises a base support 1, a first beam 2 is arranged on the top of the base support 1, a second beam 3 is arranged in the middle of the base support 1, an integrating sphere 4 is fixedly arranged at one end of the first beam 2 far away from the base support 1, the integrating sphere 4 is a hollow sphere with a high-reflectivity inner surface, two window holes are arranged on the sphere wall, one window hole is used as a light inlet, the other window hole is used as a receiving hole for placing a light receiving device testing probe 11, incident light emitted by a laser is irradiated on a semi-transparent semi-reflective lens 7, half of the incident light penetrates through the semi-transparent semi-reflective lens 7 and enters the integrating sphere 4 through the light inlet, the light entering the integrating sphere 4 is irradiated on the testing probe 11 after being reflected for multiple times by the inner surface of the integrating sphere, the testing probe 11 converts the received light into a current signal, the power tester converts the current signal into a digital signal, and feeds the digital signal back to the computer control terminal, the computer control terminal carries out quantitative analysis and judgment on the digital signal to finish the test of the laser power, the bottom of the integrating sphere 4 is provided with a first semi-transparent semi-reflective lens bracket 5 and a second semi-transparent semi-reflective lens bracket 6, a semi-transparent semi-reflective lens 7 is arranged below the integrating sphere 4, the semi-transparent semi-reflective lens 7 can lead half of incident light to penetrate through a lens, the other half of the incident light is reflected through the lens, one end of the semi-transparent semi-reflective lens 7 is fixedly connected with one end of the first semi-transparent semi-reflective lens bracket 5 far away from the integrating sphere 4, the other end is fixedly connected with one end of the second semi-transparent semi-reflective lens bracket 6 far away from the integrating sphere 4, a laser socket 8 is fixedly arranged on the base bracket 1, the laser socket 8 is used for inserting, a semi-transparent screen 9 is fixedly arranged at one end of the second beam 3 close to the semi-transparent and semi-reflective lens 7, a CCD camera 10 is fixedly arranged at one end of the second beam 3 far from the semi-transparent and semi-reflective lens 7, the CCD camera 10 is used for shooting light spots formed by light rays reflected to the semi-transparent screen 9 and transmitting the formed pictures to a computer control terminal, the computer control terminal carries out quantitative analysis and judgment on the shape and the size of the light spots through the pictures to finish the quantitative identification of the laser light spots, the CCD camera 10 is electrically connected with the computer control terminal, the CCD camera 10 is controlled by the computer control terminal, a test probe 11 is arranged at the top of the integrating sphere 4, the test probe 11 is a sensor, and the sensor is a detection device which can sense the measured information and convert the sensed information into electric signals according to a certain rule to output the electric signals so as to meet the requirements of transmission, processing, storage, Recording and controlling, the test probe 11 is electrically connected with an external power tester, the external power tester is electrically connected with a computer control terminal, and the external power tester is controlled by the computer control terminal.
The laser socket 8, integrating sphere 4 and half-transmitting and half-reflecting lens 7 are on a vertical straight line, the laser inserts laser socket 8, the incident light that the laser sent strikes on half-transmitting and half-reflecting lens 7, half of the incident light passes through half-transmitting and half-reflecting lens 7 and enters into integrating sphere 4 through the light inlet hole, the incident light that the laser sent is vertical upwards, because light is along the rectilinear propagation, so the light that passes through half-transmitting and half-reflecting lens 7 is vertical upwards too, enter into integrating sphere 4 through the light inlet hole, CCD camera 10, half-transmitting screen 9 and half-transmitting and half-reflecting lens 7 are on a horizontal straight line, the incident light that the laser sent strikes on half-transmitting and half-reflecting lens 7, another half of the incident light strikes on half-transmitting screen 9 through the reflection of half-transmitting and half-reflecting lens 7, and form facula on half-transmitting screen 9.
The first semi-transparent and semi-reflective lens support 5 is far away from the semi-transparent screen 9, the second semi-transparent and semi-reflective lens support 6 is close to the semi-transparent screen 9, the length of the first semi-transparent and semi-reflective lens support 5 is larger than that of the second semi-transparent and semi-reflective lens support 6, and the semi-transparent and semi-reflective lens 7 faces the semi-transparent screen 9.
An acute angle formed by the semi-transparent semi-reflective lens 7 and a horizontal straight line is 45 degrees, incident light emitted by the laser strikes the semi-transparent semi-reflective lens 7, the other half of the incident light is guaranteed to perpendicularly strike the semi-transparent screen 9 after being reflected by the semi-transparent semi-reflective lens 7, and light spots are formed on the semi-transparent screen 9, so that the reflected light is not lost.
When the device is used, a laser is inserted into a laser socket 8, a computer control terminal controls a power tester to emit test current, the laser is electrified to emit light, incident light emitted by the laser strikes the semi-transparent and semi-reflective lens 7, wherein half of the incident light penetrates through the semi-transparent and semi-reflective lens 7 and enters the integrating sphere 4 through a light inlet, the light entering the integrating sphere 4 strikes a test probe 11 after being reflected for multiple times by the inner surface of the integrating sphere, the test probe 11 converts the received light into a current signal and feeds the current signal back to the power tester, the power tester converts the current signal into a digital signal and feeds the digital signal back to the computer control terminal, and the computer control terminal performs quantitative analysis and judgment on the digital signal to finish the test of the power of the laser; meanwhile, the other half of the incident light is reflected by the semi-transparent and semi-reflective lens 7 to strike the semi-transparent screen 9, and light spots are formed on the semi-transparent screen 9, at the moment, the computer control terminal controls the CCD camera 10 to shoot the light spots formed by the light reflected to the semi-transparent screen 9, and transmits formed pictures to the computer control terminal, the computer control terminal quantitatively analyzes and judges the shape and the size of the light spots through the pictures, so that the quantitative recognition of the light spots of the laser is completed, meanwhile, the test of the quantitative recognition of the light spots and the test of the power of the laser are completed, and the test efficiency is greatly improved.
It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (5)
1. The utility model provides a semiconductor laser power test and facula recognition device which characterized in that: the device comprises a base support (1), wherein a first beam (2) is arranged at the top of the base support (1), a second beam (3) is arranged in the middle of the base support (1), an integrating sphere (4) is fixedly arranged at one end, far away from the base support (1), of the first beam (2), a first semi-transparent semi-reflective lens support (5) and a second semi-transparent semi-reflective lens support (6) are arranged at the bottom of the integrating sphere (4), a semi-transparent semi-reflective lens (7) is arranged below the integrating sphere (4), one end of the semi-transparent semi-reflective lens (7) is fixedly connected with one end, far away from the integrating sphere (4), of the first semi-transparent semi-reflective lens support (5), the other end of the semi-transparent semi-reflective lens support (6) is fixedly connected with one end, far away from the integrating sphere (4), a laser socket (8) is fixedly arranged on the base support (1), and the laser socket (8) is positioned below the integrating sphere, second crossbeam (3) are close to the one end fixed mounting of semi-transparent semi-reflective lens (7) and have semi-transparent screen (9), the one end fixed mounting that semi-transparent semi-reflective lens (7) were kept away from in second crossbeam (3) has CCD camera (10), CCD camera (10) are connected with computer control terminal electricity, CCD camera (10) are controlled by computer control terminal, integrating sphere (4) top is equipped with test probe (11), test probe (11) are connected with external power tester electricity, external power tester is connected with computer control terminal electricity, external power tester is controlled by computer control terminal.
2. The device for power testing and spot identification of a semiconductor laser as claimed in claim 1 wherein: the base support (1) is L-shaped, the first cross beam (2) is arranged at the top of the L-shaped vertical edge, the second cross beam (3) is arranged in the middle of the L-shaped vertical edge, and the first cross beam (2), the second cross beam (3) and the L-shaped transverse edge are parallel to each other.
3. A semiconductor laser power test and spot identification device as claimed in claim 2 wherein: the laser socket (8), the integrating sphere (4) and the semi-transparent and semi-reflective lens (7) are arranged on a vertical straight line, and the CCD camera (10), the semi-transparent screen (9) and the semi-transparent and semi-reflective lens (7) are arranged on a horizontal straight line.
4. A semiconductor laser power test and spot identification device as claimed in any one of claims 1 to 3 wherein: the semi-transparent screen (9) is kept away from to first semi-transparent semi-reflective lens support (5), semi-transparent screen (9) is close to second semi-transparent semi-reflective lens support (6), the length of first semi-transparent semi-reflective lens support (5) is greater than the length of second semi-transparent semi-reflective lens support (6).
5. The device for power testing and spot identification of a semiconductor laser as claimed in claim 4 wherein: the acute angle formed by the semi-transparent semi-reflective lens (7) and a horizontal straight line is 45 degrees.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921144661.6U CN210198679U (en) | 2019-07-19 | 2019-07-19 | Semiconductor laser power test and facula recognition device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201921144661.6U CN210198679U (en) | 2019-07-19 | 2019-07-19 | Semiconductor laser power test and facula recognition device |
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| CN210198679U true CN210198679U (en) | 2020-03-27 |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113959681A (en) * | 2021-09-24 | 2022-01-21 | 山东大学 | Semiconductor laser optical fiber coupling output light spot detection device and method for end face pumping |
| CN114769141A (en) * | 2022-03-31 | 2022-07-22 | 潍坊华光光电子有限公司 | Semiconductor laser tube core power and light spot detection system |
-
2019
- 2019-07-19 CN CN201921144661.6U patent/CN210198679U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113959681A (en) * | 2021-09-24 | 2022-01-21 | 山东大学 | Semiconductor laser optical fiber coupling output light spot detection device and method for end face pumping |
| CN114769141A (en) * | 2022-03-31 | 2022-07-22 | 潍坊华光光电子有限公司 | Semiconductor laser tube core power and light spot detection system |
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