CN210109257U - Test system for laser simulation single particle irradiation damage assessment - Google Patents
Test system for laser simulation single particle irradiation damage assessment Download PDFInfo
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- CN210109257U CN210109257U CN201920603118.1U CN201920603118U CN210109257U CN 210109257 U CN210109257 U CN 210109257U CN 201920603118 U CN201920603118 U CN 201920603118U CN 210109257 U CN210109257 U CN 210109257U
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Abstract
The utility model discloses a test system for laser simulation single particle irradiation damage assessment, which comprises a power supply unit and a test board card, wherein the power supply unit is used for providing power supply for a chip to be tested; the test board card comprises a comparator, a counter, a prompt unit, a single-particle laser test area and a reference test area, wherein the single-particle laser test area and the reference test area are used for respectively testing the chip to be tested loaded with the excitation signal and outputting a first test signal and a second test signal; comparing the data with the counter by the comparator and outputting a comparison result to the counter; the counter is used for receiving and transmitting the comparison result to the prompt unit; and the prompting unit is used for presenting prompting information according to the comparison result. The utility model provides a test system passes through laser simulation single particle irradiation damage test chip that awaits measuring, thereby the rethread adopts two sets of tests to compare more accurately and acquires the test result simultaneously to judge through digital logic and avoid the erroneous judgement and the missing judgement that arouse because of artifical judgement.
Description
Technical Field
The utility model relates to a single particle irradiation technical field especially relates to a test system of laser simulation single particle irradiation damage aassessment.
Background
With the rapid development of scientific technology, especially the development of space technology, aerospace technology and nuclear technology, more and more electronic components and electronic devices are required to be used in a radiation environment. Some components in the electronic equipment are affected by radiation, illumination and other factors in the external environment, so that some electrical parameters are changed, and some electronic components may be damaged in severe cases, so that a circuit fails, and the electronic equipment cannot normally work and operate.
Therefore, there is a need for an irradiation damage evaluation test for devices and components used in the fields of space technology, aerospace technology, and nuclear technology, which can test the change of some electrical parameters in an integrated circuit chip, analyze the irradiation resistance of the integrated circuit according to the result of the change of the electrical parameters, and provide data support for further improving the circuit.
A laser simulation single particle irradiation damage evaluation test is carried out, and mainly a laser in a ground laboratory is used for simulating the irradiation effect evaluation of spatial single particles on an integrated circuit. The difficulty of the test at the present stage is that the test method of the chip of the general integrated circuit is limited to an oscilloscope, a signal source and a power supply, and the function changes of the normal working chip and the comparison chip to be tested can only be observed by the oscilloscope. Since the experimental result can only be observed by human eyes, the frequency of the test chip which can be identified by the human eyes at the highest level is 50HZ, and therefore, the accuracy of the single particle experiment is greatly influenced.
SUMMERY OF THE UTILITY MODEL
In order to solve at least one of the above problems, the utility model provides a test system of laser simulation single particle irradiation damage aassessment, including electrical unit and test board card, wherein
The power supply unit is used for supplying power to a chip to be tested;
the test board card comprises a comparator, a counter, a prompt unit, a single-particle laser test area and a reference test area for respectively testing the chip to be tested, wherein,
the single-particle laser test area is used for testing the chip to be tested loaded with the excitation signal under the irradiation of the single-particle laser, and the chip to be tested outputs a first test signal;
the reference test area is used for testing the chip to be tested loaded with the excitation signal, and the chip to be tested outputs a second test signal;
the comparator is used for comparing the first test signal with the second test signal and outputting a comparison result to the counter;
the counter is used for receiving and transmitting the comparison result to the prompt unit;
and the prompting unit is used for presenting prompting information according to the comparison result.
Furthermore, the test system further comprises a data acquisition card, which is used for respectively acquiring a first test signal of the chip to be tested in the single particle laser test area and a second test signal of the chip to be tested in the reference test area.
Further, the comparator is an exclusive or gate.
Further, the counter includes a plurality of cascaded flip-flops.
Further, the trigger is one of an RS trigger, a T trigger, a D trigger, or a JK trigger.
Further, the power supply unit comprises an overcurrent protection unit and a short-circuit protection unit.
Further, the power supply unit further comprises a display screen for displaying the output voltage of the power supply.
Further, the prompting unit is an LED lamp.
Furthermore, the test system further comprises a transmission line for outputting the first test signal and the second test signal acquired by the data acquisition card to an external processing device.
Furthermore, the chip to be tested is connected to the single particle laser test area and the reference test area through a DIP socket.
The utility model has the advantages as follows:
the utility model discloses to present problem, formulate a test system that laser simulation single particle irradiation damage was evaluateed, damage the test chip that awaits measuring through laser simulation single particle irradiation, the rethread adopts two sets of tests to compare simultaneously and acquires the test result to the realization is to the single particle irradiation damage test of the chip that awaits measuring, has effectively compensatied the problem among the prior art, can improve the accuracy of test result, and judge through digital logic and avoid erroneous judgement and the omission that arouses because of artifical judgement.
Drawings
The following describes embodiments of the present invention in further detail with reference to the accompanying drawings.
Fig. 1 shows a block diagram of a test system according to an embodiment of the present invention;
fig. 2 shows a schematic structural diagram of a counter according to an embodiment of the present invention;
fig. 3 shows a block diagram of a test system according to another embodiment of the present invention.
Detailed Description
In order to explain the present invention more clearly, the present invention will be further described with reference to the preferred embodiments and the accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and is not to be taken as limiting the scope of the invention.
As shown in fig. 1, an embodiment of the present invention provides a test system for evaluating irradiation damage of laser simulation single particle, which includes a power unit and a test board, wherein the power unit is used for providing power to a chip to be tested; the test board card comprises a comparator, a counter, a prompt unit, a single-particle laser test area and a reference test area, wherein the single-particle laser test area is used for testing the chip to be tested loaded with the excitation signal under the irradiation of single-particle laser, and the chip to be tested outputs a first test signal; the reference test area is used for testing the chip to be tested loaded with the excitation signal, and the chip to be tested outputs a second test signal; the comparator is used for comparing the first test signal with the second test signal and outputting a comparison result to the counter; the counter is used for receiving and transmitting the comparison result to the prompt unit; and the prompting unit is used for presenting prompting information according to the comparison result.
In a specific example, in consideration of the problem that misjudgment and misjudgment exist when a board card to be tested is tested by laser simulation single-particle irradiation and a oscilloscope is observed by naked eyes of a tester, the test board card comprises a single-particle laser test area and a reference test area, namely the test board card is provided with two identical positions for triggering a chip to be tested, and the chip to be tested is connected into the single-particle laser test area and the reference test area through a DIP socket. The method is characterized in that one of the chips is tested under the irradiation of single-particle laser irradiation, the other chip is tested under a normal environment, the same excitation is loaded on the two same chips to be tested respectively, the two chips to be tested start to work, the chip to be tested under the irradiation of the single-particle laser irradiation outputs a first test signal, the chip to be tested under the normal environment outputs a second test signal, and the second test signal is used as a reference signal of the first test signal to be compared, so that the problems that whether the electrical parameters of the chip to be tested are changed, a circuit is failed, electronic components in the chip are damaged, and the chip cannot work normally under the irradiation of the single-particle laser irradiation are judged.
Be provided with the comparator on the test board card for comparing first test signal and second test signal, in this embodiment, the comparator is exclusive-or gate, and the output is 0 when first test signal and second test signal are the same, and the not simultaneous output is 1. Considering that the highest recognition frequency of naked eyes of a tester is 50Hz, and the frequencies of the first test signal and the second test signal output by the chip to be tested are far higher than the recognizable frequency of the naked eyes, the test board card is provided with a counter for receiving the test result output by the comparator, caching, processing and counting, and the accuracy of the first test signal is represented through digital logic. In this embodiment, as shown in fig. 2, the counter includes a plurality of cascaded flip-flops, and the counting is performed by the cascaded flip-flops. Further, the trigger is one of an RS trigger, a T trigger, a D trigger, or a JK trigger, and a person skilled in the art should set an appropriate trigger according to an actual application scenario to perform counting to meet an application requirement, which is not described herein again.
And finally, the counter transmits the output result to the prompting unit so as to display the test result of the first test signal. In this embodiment, the prompting unit is an LED lamp, and the LED lamp is turned on when the first test signal is different from the second test signal, otherwise, the off state of the LED lamp is maintained, that is, when the LED lamp flickers, it is indicated that the chip to be tested has a problem, and whether the first test signal has a problem can be visually represented by the prompting unit, so that the tester can use the naked eye for detection, thereby realizing the digital logic judgment to avoid misjudgment and missed judgment caused by manual judgment.
The test system for evaluating the irradiation damage of the laser simulation single particle provided by the embodiment effectively improves the test accuracy by simultaneously adopting two sets of tests for comparison, and simultaneously avoids misjudgment and missed judgment caused by manual judgment through digital logic judgment.
In order to further test the specific condition of the chip to be tested, in a preferred embodiment, as shown in fig. 3, the test system further includes a data acquisition card, configured to acquire a first test signal of the chip to be tested in the single particle laser test area and a second test signal of the chip to be tested in the reference test area, respectively. Namely, the data acquisition card is used for respectively acquiring the test data of the chips to be tested in different test environments. Furthermore, the test system further comprises a transmission line for outputting the first test signal and the second test signal acquired by the data acquisition card to an external processing device. The test data collected by the data acquisition card is transmitted to an external processing device, such as a computer, a processor and the like, and is processed, compared and displayed on a display screen of the computer through the external processing device so as to be recorded and observed conveniently. In this embodiment, the transmission line is a network cable, and is one of a twisted pair, a coaxial cable, or an optical cable. Those skilled in the art should understand that, according to the actual application scenario, a proper transmission line is selected to transmit the test data of the chip to be tested, so as to meet the actual requirement as a design criterion, which is not described herein again.
In consideration of the fact that the power supply condition of the power supply unit to the chip to be tested also affects the test condition of the chip to be tested, in a preferred embodiment, the power supply unit includes an overcurrent protection unit and a short-circuit protection unit. In this embodiment, the power supply unit is a four-way power supply and is configured to provide a power supply voltage for a chip to be tested, the power supply unit implements overcurrent protection on the chip to be tested through the overcurrent protection unit, and implements short-circuit protection on the chip to be tested through the short-circuit protection unit. Meanwhile, the power supply unit has two working modes of voltage stabilization and current stabilization, can be automatically switched according to the change of the load, and can automatically enter a current stabilization working state when the external load is too heavy or the output is short-circuited. Furthermore, in order to facilitate observation of a tester, the power supply unit further comprises a display screen for displaying the output voltage of the power supply. Namely, the output voltage of the power supply unit is directly displayed through the display screen, so that the display screen is visual and accurate.
The utility model discloses to present problem, formulate a test system that laser simulation single particle irradiation damage was evaluateed, damage the test chip that awaits measuring through laser simulation single particle irradiation, the rethread adopts two sets of tests to compare simultaneously and acquires the test result, thereby realize the single particle irradiation damage test to the chip that awaits measuring, and the testing personnel of being convenient for are surveyed, effectively compensatied the problem among the prior art, can improve the accuracy of test result, and judge through digital logic and avoid erroneous judgement and the omission that arouses because of artifical judgement.
Obviously, the above embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it is obvious for those skilled in the art to make other variations or changes based on the above descriptions, and all the embodiments cannot be exhausted here, and all the obvious variations or changes that belong to the technical solutions of the present invention are still in the protection scope of the present invention.
Claims (10)
1. A test system for laser simulation single particle irradiation damage assessment is characterized by comprising a power supply unit and a test board card, wherein the test board card is used for testing the irradiation damage of a laser simulation single particle
The power supply unit is used for supplying power to a chip to be tested;
the test board card comprises a comparator, a counter, a prompt unit, a single-particle laser test area and a reference test area for respectively testing the chip to be tested, wherein,
the single-particle laser test area is used for testing the chip to be tested loaded with the excitation signal under the irradiation of the single-particle laser, and the chip to be tested outputs a first test signal;
the reference test area is used for testing the chip to be tested loaded with the excitation signal, and the chip to be tested outputs a second test signal;
the comparator is used for comparing the first test signal with the second test signal and outputting a comparison result to the counter;
the counter is used for receiving and transmitting the comparison result to the prompt unit;
and the prompting unit is used for presenting prompting information according to the comparison result.
2. The test system of claim 1, further comprising a data acquisition card for respectively acquiring a first test signal of the chip under test in the single particle laser test area and a second test signal of the chip under test in the reference test area.
3. The test system of claim 1, wherein the comparator is an exclusive or gate.
4. The test system of claim 1, wherein the counter comprises a plurality of cascaded flip-flops.
5. The test system of claim 4, wherein the flip-flop is one of an RS flip-flop, a T flip-flop, a D flip-flop, or a JK flip-flop.
6. The test system of claim 1, wherein the power supply unit comprises an over-current protection unit and a short-circuit protection unit.
7. The test system of claim 1, wherein the power supply unit further comprises a display screen for displaying the output voltage of the power supply.
8. The test system of claim 1, wherein the prompting unit is an LED light.
9. The test system according to claim 2, further comprising a transmission line for outputting the first test signal and the second test signal collected by the data acquisition card to an external processing device.
10. The test system according to any one of claims 1 to 9, wherein the chip to be tested is connected to the single particle laser test area and the reference test area through a DIP socket.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201920603118.1U CN210109257U (en) | 2019-04-28 | 2019-04-28 | Test system for laser simulation single particle irradiation damage assessment |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201920603118.1U CN210109257U (en) | 2019-04-28 | 2019-04-28 | Test system for laser simulation single particle irradiation damage assessment |
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| CN210109257U true CN210109257U (en) | 2020-02-21 |
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| CN201920603118.1U Active CN210109257U (en) | 2019-04-28 | 2019-04-28 | Test system for laser simulation single particle irradiation damage assessment |
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