CN210051512U - Low-temperature test platform - Google Patents
Low-temperature test platform Download PDFInfo
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- CN210051512U CN210051512U CN201920882363.0U CN201920882363U CN210051512U CN 210051512 U CN210051512 U CN 210051512U CN 201920882363 U CN201920882363 U CN 201920882363U CN 210051512 U CN210051512 U CN 210051512U
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Abstract
The utility model relates to a test technical field of optical module among the optical communication, concretely relates to low temperature test device of optical module. Low temperature test platform, its characterized in that: including base, the trench that awaits measuring, the module that awaits measuring, test trench, survey test panel, test module, upper cover, the base bottom is provided with cooling circuit, has the coolant liquid in the cooling circuit, and cooling circuit upper portion is provided with the trench that awaits measuring, places the module that awaits measuring in the trench that awaits measuring, and the both ends on trench upper portion that awaits measuring are provided with the test trench, and test panel is installed on test trench upper portion, places test module in the test trench, the upper cover is installed at low temperature test platform's top. The utility model discloses test platform can test two modules simultaneously to realize the precooling function, thereby improved low temperature efficiency of software testing, simplified equipment, the cost is reduced, and can compatible XFP, SFP etc. packaging form's optical module, small in size, portable, mobility are strong, need not the installation of special messenger, easy operation is applicable to various occasions.
Description
Technical Field
The utility model relates to a test technical field of optical module among the optical communication, concretely relates to low temperature test platform of optical module.
Background
In an optical communication network, an optical module is an optoelectronic device for performing photoelectric and electro-optical conversion, and is a core device in the optical communication network, when the optical module is applied in a low-temperature environment, a higher requirement is provided for the stability of the optical module, the low-temperature performance needs to be tested when the optical module is tested, and how to quickly and conveniently test the optical module is a challenge for a module manufacturer.
The following scheme is mainly adopted for low-temperature test in the current market: one is to adopt a high-low temperature box, when a test module is replaced, the box door needs to be opened and closed every time, which is not beneficial to heat preservation and has lower efficiency; one is to use liquid nitrogen or compressed air to reduce the temperature, and needs to lay pipelines and air valves, so the cost is higher. Therefore, it is an urgent need to develop a low-temperature test system with low cost and high efficiency.
SUMMERY OF THE UTILITY MODEL
The utility model aims at overcoming the technical problem that the equipment cost of testing light module low temperature performance is higher among the prior art, efficiency is lower, providing a low cost, high efficiency, mobilizable low temperature test platform.
The utility model discloses a realize that the technical scheme that above-mentioned purpose adopted is: low temperature test platform, its characterized in that: including base 1, the trench 2 that awaits measuring, the module 3 that awaits measuring, test slot 4, survey test panel 5, test module 6, upper cover 7, 1 bottom of base is provided with cooling circuit 10, has the coolant liquid in the cooling circuit 10, and cooling circuit 10 upper portion is provided with the trench 2 that awaits measuring, places the module 3 that awaits measuring in the trench 2 that awaits measuring, and the both ends on 2 upper portions of trench 2 that await measuring are provided with test slot 4, and test panel 5 is installed on 4 upper portions of test slot, places test module 6 in the test slot 4, upper cover 7 is installed at low temperature test platform's top.
Further, the cooling circuit 10 is designed into a U shape or a multi-turn shape, two ends of the cooling circuit 10 are respectively connected with the cooling liquid inlet 8 and the cooling liquid outlet 9, and the front of the cooling liquid inlet 8 is connected with the thermostatic bath.
Further, the cooling liquid adopts water or alcohol, and when water is adopted, the lower limit temperature is 0 ℃; when alcohol is used, the lower limit temperature is-20 ℃.
The utility model discloses low temperature test platform can realize the rapid cooling to the optical module, can test two modules simultaneously to realize the precooling function, thereby improved low temperature test efficiency, simplified equipment, the cost is reduced, and can compatible XFP, SFP etc. packaging form's optical module, only need to change the module and survey the board and can accomplish the low temperature test, small in size, portable, mobility are strong, need not the installation of special messenger, easy operation is applicable to various occasions.
Drawings
Fig. 1 is a structural diagram of the present invention.
Fig. 2 is a structural diagram of the cooling circuit of the present invention.
In the figure: 1. the test device comprises a base, a slot to be tested, a module to be tested, a test slot, a test board, a test module, an upper cover, a cooling liquid inlet, a cooling liquid outlet and a cooling loop, wherein the slot to be tested is 2, the module to be tested is 3, the test slot is 4, the test board is 5, the test module is 6, the upper cover is 7, the cooling liquid inlet is 8, the cooling liquid outlet.
Detailed Description
The present invention will be described in detail with reference to the accompanying drawings and examples, but the present invention is not limited to the specific examples.
Example 1
The low-temperature test platform shown in fig. 1-2 comprises a base 1, a slot 2 to be tested, a module 3 to be tested, a test slot 4, a test board 5, a test module 6 and an upper cover 7, wherein a cooling loop 10 is arranged at the bottom of the base 1, the cooling loop 10 is designed into a U shape, two ends of the cooling loop 10 are respectively connected with a cooling liquid inlet 8 and a cooling liquid outlet 9, a constant temperature tank is connected in front of the cooling liquid inlet 8, the constant temperature tank and the cooling loop 10 form a cooling circulation system, the constant temperature tank provides circulating cooling liquid for the cooling loop 10, the cooling liquid enters from the cooling liquid inlet 8 and flows out from the cooling liquid outlet 9 after passing through the cooling loop 10, so that a low-temperature test environment is provided for the platform, when the cooling liquid adopts water, the lower limit temperature can reach 0 ℃, and when the cooling liquid adopts alcohol, the lower limit temperature. Upper cover 7 is installed at low temperature test platform's top to guarantee the constant temperature test environment of platform, cooling circuit 10 upper portion is provided with the trench 2 that awaits measuring, can place module 3 that awaits measuring wherein precooling improves efficiency of software testing, and the both ends on trench 2 upper portion that awaits measuring are provided with test trench 4, and test panel 5 is installed on 4 upper portions of test trench, places test module 6 in the test trench 4, carries out module low temperature test to survey panel 5 and the power supply of test module 6. The modules of the two test slots can be tested simultaneously, the use efficiency is improved, the platform can be compatible with the currently popular optical module packaging forms such as XFP and SFP, low-temperature test can be completed only by replacing the module test board, the platform is small in size and strong in mobility, installation by a specially-assigned person is not needed, and the operation is simple.
Example 2
This example uses a cryogenic test platform that is substantially the same as example 1, except that the cooling circuit is designed to be multi-turn.
The above description is further detailed in connection with the preferred embodiments of the present invention, and it is not intended that the specific embodiments of the present invention be limited to these descriptions. To the utility model belongs to the technical field of the ordinary technical personnel, do not deviate from the utility model discloses a under the prerequisite of the design, can also make simple deduction and replacement, all should regard as the utility model discloses a protection scope.
Claims (3)
1. Low temperature test platform, its characterized in that: including base (1), trench (2) that await measuring, module (3) that awaits measuring, test trench (4), survey test panel (5), test module (6), upper cover (7), base (1) bottom is provided with cooling circuit (10), has the coolant liquid in cooling circuit (10), and cooling circuit (10) upper portion is provided with trench (2) that awaits measuring, places module (3) that awaits measuring in trench (2) that awaits measuring, and the both ends on trench (2) upper portion that awaits measuring are provided with test trench (4), and survey test panel (5) are installed on test trench (4) upper portion, places test module (6) in test trench (4), upper cover (7) are installed at low temperature test platform's top.
2. The cryogenic test platform of claim 1, wherein: the cooling loop (10) is designed into a U shape or a multi-bending shape, two ends of the cooling loop (10) are respectively connected with a cooling liquid inlet (8) and a cooling liquid outlet (9), and a thermostatic bath is connected in front of the cooling liquid inlet (8).
3. The cryogenic test platform of claim 1, wherein: the cooling liquid adopts water or alcohol, and when the water is adopted, the lower limit temperature is 0 ℃; when alcohol is used, the lower limit temperature is-20 ℃.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920882363.0U CN210051512U (en) | 2019-06-13 | 2019-06-13 | Low-temperature test platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920882363.0U CN210051512U (en) | 2019-06-13 | 2019-06-13 | Low-temperature test platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210051512U true CN210051512U (en) | 2020-02-11 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN201920882363.0U Active CN210051512U (en) | 2019-06-13 | 2019-06-13 | Low-temperature test platform |
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| CN (1) | CN210051512U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112629824A (en) * | 2020-12-15 | 2021-04-09 | 成都新易盛通信技术股份有限公司 | Optical module high temperature test frock |
-
2019
- 2019-06-13 CN CN201920882363.0U patent/CN210051512U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112629824A (en) * | 2020-12-15 | 2021-04-09 | 成都新易盛通信技术股份有限公司 | Optical module high temperature test frock |
| CN112629824B (en) * | 2020-12-15 | 2023-06-30 | 成都新易盛通信技术股份有限公司 | Optical module high temperature test fixture |
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