CN210038054U - Mainboard testing device - Google Patents
Mainboard testing device Download PDFInfo
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- CN210038054U CN210038054U CN201920397839.1U CN201920397839U CN210038054U CN 210038054 U CN210038054 U CN 210038054U CN 201920397839 U CN201920397839 U CN 201920397839U CN 210038054 U CN210038054 U CN 210038054U
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- mainboard
- detection
- test probe
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Abstract
The utility model relates to a mainboard testing arrangement, it mainly includes the bottom plate, bottom plate top be provided with spacing landing leg, bottom plate top be provided with compression spring, compression spring top be provided with the mainboard fixed plate, mainboard fixed plate middle part have a mainboard stopper through the bolt fastening, mainboard stopper top correspondence be provided with a plurality of test probe, test probe be fixed in test probe board, test probe board set up in the lifter plate bottom, lifter plate top be provided with the detection display, test probe board pass through line connection detection display, the lifter plate pass through extension spring and connect spacing landing leg, the utility model discloses effectively solved artifical test intensity of labour big, the inefficiency, detection quality hangs down the scheduling problem, general the utility model discloses have the reduction artifical intensity of labour, the utility model discloses a, The detection efficiency is improved, the detection quality is improved, and the applicability is strong.
Description
Technical Field
The utility model belongs to the testing arrangement field, in particular to mainboard testing arrangement.
Background
In the middle of the electronic product, the mainboard is extremely important subassembly, go out the back at the production mainboard, need carry out a series of tests to it, with confirm whether the mainboard reaches qualified standard, the mainboard test mode that uses at present is artifical test mostly, it places the mainboard on testing platform to need the production line staff, manually aim at the metal contact on the mainboard with metal probe, in order to accomplish the test, rely on the manual work to accomplish the test, artifical intensity of labour is big, and production quantity along with the mainboard is constantly increasing, the mode efficiency of artifical test mainboard is extremely low, and make mistakes easily, can't guarantee detection quality, cause very big puzzlement to mainboard production.
Disclosure of Invention
In order to overcome the defects of the prior art, the mainboard testing device which is simple in operation and reasonable in structure is provided, and the problems of high labor intensity, low efficiency, low detection quality and the like of manual testing can be effectively solved.
The purpose of the utility model is realized like this: the utility model provides a mainboard testing arrangement, it mainly includes the bottom plate, bottom plate top be provided with spacing landing leg, bottom plate top be provided with compression spring, compression spring top be provided with the mainboard fixed plate, mainboard fixed plate middle part have a mainboard stopper through the bolt fastening, mainboard stopper top correspondence be provided with a plurality of test probe, test probe be fixed in the test probe board, the test probe board set up in the lifter plate bottom, lifter plate top be provided with the detection display, the test probe board pass through line connection and detect the display, the lifter plate pass through extension spring and connect spacing landing leg.
The extension spring is arranged inside the limiting supporting leg.
The number of the limiting supporting legs and the number of the extension springs are 4.
The size of the main board fixing plate and the size of the lifting plate are the same.
The mainboard limiting block, the detection probe board, the lifting board and the circuit are detachably connected.
The utility model has the advantages that: when the utility model is used, a mainboard to be detected is placed on a mainboard limiting block, a lifting plate is pressed downwards, the lifting plate moves downwards to drive a detection probe plate, the detection probe plate drives a detection probe to move downwards, the detection probe corresponds to the metal contact position of the mainboard, the detection probe is pressed until the detection probe is contacted with the metal contact of the detected mainboard, the detection probe transmits detected data to a detection display through a circuit, the detection can be completed, after the detection is completed, a stretching spring drives the lifting plate to ascend, the lifting plate returns to the original position, in the detection process, as the detection probe needs to be contacted with the metal contact on the detected mainboard, in order to prevent the mainboard from being damaged by external force pressing, a compression spring is arranged at the bottom of a mainboard fixing plate, the buffering of the external force pressing can be effectively buffered, the mainboard is effectively protected from being damaged, and the compression spring exerts an upward acting force on, make the contact of test probe and the metal contact on the mainboard that is detected inseparabler to it is more accurate to make the test data, extension spring sets up inside spacing landing leg, reduces outside occupation space, makes its structure compacter, and the mainboard stopper, the test probe board, with the lifter plate, the circuit is for dismantling and be connected, the mainboard stopper and the supporting test probe board of removable other specifications for detect the mainboard of other models, reinforcing suitability and versatility, the utility model discloses effectively solved artifical test intensity of labour big, inefficiency, detection quality low grade problem to can realize changing the model at the in-process that uses, be used for detecting multiple model mainboard, have stronger suitability, general the utility model has the advantages of reduce artifical intensity of labour, improve detection efficiency, promote detection quality, the suitability is strong.
Drawings
Fig. 1 is a front view of the main board testing device of the present invention.
Fig. 2 is a top view of the motherboard fixing plate of the motherboard testing apparatus of the present invention.
In the figure: 1. bottom plate 2, spacing landing leg 3, compression spring 4, mainboard fixed plate 5, bolt 6, mainboard stopper 7, test probe 8, test probe board 9, lifter plate 10, detection display 11, circuit 12, extension spring.
Detailed Description
The present invention will be further described with reference to the accompanying drawings.
Example 1
As shown in fig. 1 and 2, a mainboard testing device, it mainly includes bottom plate 1, 1 top of bottom plate be provided with spacing landing leg 2, 1 top of bottom plate be provided with compression spring 3, 3 tops of compression spring be provided with mainboard fixed plate 4, 4 middle parts of mainboard fixed plate be fixed with mainboard stopper 6 through bolt 5, 6 tops of mainboard stopper correspond and be provided with a plurality of detection probe 7, detection probe 7 be fixed in detection probe board 8, detection probe board 8 set up in lifter plate 9 bottom, lifter plate 9 top be provided with detection display 10, detection probe board 8 connect detection display 10 through circuit 11, lifter plate 9 connect spacing landing leg 2 through extension spring 12.
The utility model discloses when using: when the utility model is used, a mainboard to be detected is placed on a mainboard limiting block, a lifting plate is pressed downwards, the lifting plate moves downwards to drive a detection probe plate, the detection probe plate drives a detection probe to move downwards, the detection probe corresponds to the metal contact position of the mainboard, the detection probe is pressed until the detection probe is contacted with the metal contact of the detected mainboard, the detection probe transmits detected data to a detection display through a circuit, the detection can be completed, after the detection is completed, a stretching spring drives the lifting plate to ascend, the lifting plate returns to the original position, in the detection process, as the detection probe needs to be contacted with the metal contact on the detected mainboard, in order to prevent the mainboard from being damaged by external force pressing, a compression spring is arranged at the bottom of a mainboard fixing plate, the buffering of the external force pressing can be effectively buffered, the mainboard is effectively protected from being damaged, and the compression spring exerts an upward acting force on, make the test probe more inseparable with being detected the metal contact on the mainboard to it is more accurate to make the detection data, the utility model discloses effectively solved artifical test intensity of labour big, inefficiency, detection quality low grade problem, general the utility model has the advantages of reduce artifical intensity of labour, improve detection efficiency, promote detection quality.
Example 2
As shown in fig. 1 and 2, a mainboard testing device mainly comprises a bottom plate 1, a limiting supporting leg 2 is arranged above the bottom plate 1, a compression spring 3 is arranged above the bottom plate 1, a mainboard fixing plate 4 is arranged above the compression spring 3, a mainboard limiting block 6 is fixed in the middle of the mainboard fixing plate 4 through a bolt 5, a plurality of detection probes 7 are correspondingly arranged above the mainboard limiting block 6, the detection probes 7 are fixed on a detection probe plate 8, the detection probe plate 8 is arranged at the bottom of a lifting plate 9, a detection display 10 is arranged above the lifting plate 9, the detection probe plate 8 is connected with the detection display 10 through a circuit 11, the lifting plate 9 is connected with the limiting supporting leg 2 through a tension spring 12, the tension spring 12 is arranged inside the limiting supporting leg 2, spacing landing leg 2 and extension spring 12 quantity be 4, mainboard fixed plate 4 and lifter plate 9 size be same specification, mainboard stopper 6, detection probe card 8, lifter plate 9, circuit 11 be for dismantling the connection.
The utility model discloses when using: when the utility model is used, a mainboard to be detected is placed on a mainboard limiting block, a lifting plate is pressed downwards, the lifting plate moves downwards to drive a detection probe plate, the detection probe plate drives a detection probe to move downwards, the detection probe corresponds to the metal contact position of the mainboard, the detection probe is pressed until the detection probe is contacted with the metal contact of the detected mainboard, the detection probe transmits detected data to a detection display through a circuit, the detection can be completed, after the detection is completed, a stretching spring drives the lifting plate to ascend, the lifting plate returns to the original position, in the detection process, as the detection probe needs to be contacted with the metal contact on the detected mainboard, in order to prevent the mainboard from being damaged by external force pressing, a compression spring is arranged at the bottom of a mainboard fixing plate, the buffering of the external force pressing can be effectively buffered, the mainboard is effectively protected from being damaged, and the compression spring exerts an upward acting force on, make the contact of test probe and the metal contact on the mainboard that is detected inseparabler to it is more accurate to make the test data, extension spring sets up inside spacing landing leg, reduces outside occupation space, makes its structure compacter, and the mainboard stopper, the test probe board, with the lifter plate, the circuit is for dismantling and be connected, the mainboard stopper and the supporting test probe board of removable other specifications for detect the mainboard of other models, reinforcing suitability and versatility, the utility model discloses effectively solved artifical test intensity of labour big, inefficiency, detection quality low grade problem to can realize changing the model at the in-process that uses, be used for detecting multiple model mainboard, have stronger suitability, general the utility model has the advantages of reduce artifical intensity of labour, improve detection efficiency, promote detection quality, the suitability is strong.
Claims (5)
1. The utility model provides a mainboard testing arrangement, it mainly includes the bottom plate, its characterized in that: the bottom plate top be provided with spacing landing leg, bottom plate top be provided with compression spring, compression spring top be provided with the mainboard fixed plate, mainboard fixed plate middle part have a mainboard stopper through the bolt fastening, mainboard stopper top correspond and be provided with a plurality of test probe, test probe be fixed in the test probe board, the test probe board set up in the lifter plate bottom, lifter plate top be provided with the detection display, the test probe board pass through line connection and detect the display, the lifter plate pass through extension spring and connect spacing landing leg.
2. A motherboard testing apparatus as claimed in claim 1, wherein: the extension spring is arranged inside the limiting supporting leg.
3. A motherboard testing apparatus as claimed in claim 1, wherein: the number of the limiting supporting legs and the number of the extension springs are 4.
4. A motherboard testing apparatus as claimed in claim 1, wherein: the size of the main board fixing plate and the size of the lifting plate are the same.
5. A motherboard testing apparatus as claimed in claim 1, wherein: the mainboard limiting block, the detection probe board, the lifting board and the circuit are detachably connected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201920397839.1U CN210038054U (en) | 2019-03-27 | 2019-03-27 | Mainboard testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201920397839.1U CN210038054U (en) | 2019-03-27 | 2019-03-27 | Mainboard testing device |
Publications (1)
Publication Number | Publication Date |
---|---|
CN210038054U true CN210038054U (en) | 2020-02-07 |
Family
ID=69356649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201920397839.1U Expired - Fee Related CN210038054U (en) | 2019-03-27 | 2019-03-27 | Mainboard testing device |
Country Status (1)
Country | Link |
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CN (1) | CN210038054U (en) |
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2019
- 2019-03-27 CN CN201920397839.1U patent/CN210038054U/en not_active Expired - Fee Related
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Legal Events
Date | Code | Title | Description |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200207 Termination date: 20210327 |
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CF01 | Termination of patent right due to non-payment of annual fee |