CN209946214U - Positioning device for silicon block resistivity test - Google Patents
Positioning device for silicon block resistivity test Download PDFInfo
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- CN209946214U CN209946214U CN201920411711.6U CN201920411711U CN209946214U CN 209946214 U CN209946214 U CN 209946214U CN 201920411711 U CN201920411711 U CN 201920411711U CN 209946214 U CN209946214 U CN 209946214U
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Abstract
The utility model discloses a positioner for silicon briquette resistivity test, including the locating plate that width and silicon briquette width that awaits measuring equal, be provided with the through-hole on the locating plate, the through-hole is including the test hole of removing the head and removing the tail test hole, and the center of the test hole of removing the head equals the height that the silicon briquette head that awaits measuring was waited to get rid of with the distance on locating plate top, and the center of removing the tail test hole equals the height that the silicon briquette afterbody that awaits measuring was waited to get rid of with the distance of locating plate bottom. The above-mentioned technical scheme that this application discloses sets up the locating plate that a width equals with the silicon briquette width that awaits measuring, when carrying out the resistivity test to the silicon briquette, can directly fix a position the resistivity test point of the silicon briquette that awaits measuring through the test hole of removing the head and the test hole of removing the tail on the locating plate, need not to recycle the height that the ruler location silicon briquette removed the head and removed the tail promptly, consequently, can improve efficiency of software testing. In addition, because the selected test point is fixed, the influence of human factors can be avoided, and the reliability and the repeatability of test data can be improved.
Description
Technical Field
The utility model relates to a silicon briquette tests technical field, and more specifically says, relates to a positioner for silicon briquette resistivity test.
Background
In the manufacturing process of the solar cell, the silicon ingot obtained by ingot casting needs to be cooled for a period of time (stress in the silicon ingot is removed) at normal temperature before being drawn into a square, and after the square is cut, the silicon ingot obtained by the square is required to be subjected to quality inspection, wherein the resistivity test of the silicon ingot is an indispensable link in the quality inspection of the silicon ingot. Because the resistivity of the head and the tail of the silicon block is larger and the minority carrier lifetime is shorter, the height of removing the head and the height of removing the tail need to be positioned when the resistivity of the silicon block is tested, and then the resistivity is tested.
In the existing silicon block resistivity test, an operator needs to position the height of removing the head and the tail of the silicon block by using a ruler, then lines are drawn at corresponding positions (the same height), and test points are randomly selected at the line drawing positions for testing. However, in the above-mentioned testing process, since the positions of removing the head and the tail are measured by means of a ruler every time, the operation is time-consuming and the testing efficiency is low. In addition, because different operators may have certain differences in the selected test points during testing, different data acquisition standards may be caused, and thus, reliability and repeatability of data may be relatively poor.
In summary, how to improve the efficiency of the resistivity test of the silicon block and improve the reliability and repeatability of the test data is a technical problem to be solved by those skilled in the art.
SUMMERY OF THE UTILITY MODEL
In view of this, the present invention provides a positioning device for testing resistivity of silicon blocks, so as to improve the efficiency of resistivity testing of silicon blocks and improve the reliability and repeatability of testing data.
In order to achieve the above object, the present invention provides the following technical solutions:
the utility model provides a positioner for silicon briquette resistivity test, includes the locating plate that width and silicon briquette width that awaits measuring equal, be provided with the through-hole on the locating plate, the through-hole is including removing head test hole and removing the tail test hole, wherein:
the distance between the center of the head-removing test hole and the top end of the positioning plate is equal to the height to be removed from the head of the silicon briquette to be detected, and the distance between the center of the tail-removing test hole and the bottom end of the positioning plate is equal to the height to be removed from the tail of the silicon briquette to be detected.
Preferably, the height of the positioning plate is equal to the height of the silicon block to be measured.
Preferably, the positioning plate is provided with a plurality of the head removing test holes and a plurality of the tail removing test holes respectively.
Preferably, the head-removing test holes and the tail-removing test holes are uniformly distributed on the positioning plate.
Preferably, the positioning plate is respectively provided with 3 de-heading test holes and 3 de-tailing test holes.
Preferably, the through hole is a square hole or a circular hole.
Preferably, the aperture of the through hole is 6 mm.
Preferably, the positioning plate is a plastic positioning plate.
The utility model provides a positioner for silicon briquette resistivity test, including the locating plate that width and silicon briquette width that awaits measuring equal, be provided with the through-hole on the locating plate, the through-hole is including removing head test hole and removing the tail test hole, wherein: the distance between the center of the head-removing test hole and the top end of the positioning plate is equal to the height to be removed from the head of the silicon block to be detected, and the distance between the center of the tail-removing test hole and the bottom end of the positioning plate is equal to the height to be removed from the tail of the silicon block to be detected.
The above-mentioned technical scheme that this application discloses sets up the locating plate that a width equals with the silicon briquette width that awaits measuring, when carrying out the resistivity test to the silicon briquette, can directly fix a position the resistivity test point of the silicon briquette that awaits measuring through the test hole of removing the head that sets up on the locating plate and the test hole of removing the tail, need not to recycle the height that the silicon briquette removed the head and removed the tail promptly, consequently, can improve efficiency of software testing. In addition, because the selected test points are fixed, namely have uniform data acquisition standards, the influence of human factors can be avoided, and the reliability and the repeatability of the test data can be improved.
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In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a positioning device for testing resistivity of a silicon block according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1, it shows a structural schematic diagram of a positioning device for silicon briquette resistivity test that the embodiment of the utility model provides, can include the width and the locating plate 1 that awaits measuring the silicon briquette width equals that be provided with through-hole 2 on the locating plate 1, through-hole 2 can be including removing head test hole 21 and removing the tail test hole 22, wherein:
the distance between the center of the head removing test hole 21 and the top end of the positioning plate 1 is equal to the height to be removed of the head of the silicon block to be detected, and the distance between the center of the tail removing test hole 22 and the bottom end of the positioning plate 1 is equal to the height to be removed of the tail of the silicon block to be detected.
A positioner for silicon briquette resistivity test can include locating plate 1, and the width of this locating plate 1 equals with the width of the silicon briquette that awaits measuring that the ingot casting evolution obtained, is provided with through-hole 2 on this locating plate 1 moreover, and it specifically includes test hole 21 and the test hole 22 of tailgating of removing. The positions of the de-heading test hole 21 and the de-tailing test hole 22 on the positioning plate 1 are respectively set according to the height to be removed of the head of the silicon block to be detected and the height to be removed of the tail of the silicon block to be detected, specifically, the distance between the de-heading test hole 21 and the top end of the positioning plate 1 is equal to the height to be removed of the head of the silicon block to be detected, and the distance between the de-tailing test hole 22 and the bottom end of the positioning plate 1 is equal to the height to be removed of the tail of the silicon block to be detected.
When tail resistivity of a silicon block to be tested is tested, the positioning plate 1 can be attached to the surface of the silicon block to be tested, the bottom end of the positioning plate 1 is aligned with the tail of a silicon wafer to be tested, and then a probe of a resistivity tester can be inserted into the tail-removing test hole 22 and pressed on the surface of the silicon block to be tested so as to test the resistivity of the tail-removing position of the silicon block to be tested; when head resistivity test is carried out on the silicon briquette to be tested, the positioning plate 1 can be attached to the surface of the silicon briquette to be tested, the top end of the positioning plate 1 is aligned with the head of the silicon briquette to be tested, and then, similar to tail resistivity test, a probe of a resistivity tester can be inserted into the head removing test hole 21 and pressed on the surface of the silicon briquette to be tested, so that resistivity test is carried out on the head removing position of the silicon briquette to be tested.
As can be seen from the above, setting the width of the positioning plate 1 to be equal to the width of the silicon block to be measured can enable the positioning plate 1 to be completely attached to the silicon block to be measured in the width direction, so that each measurement can be performed on the resistivity test points (i.e., the positions on the silicon block to be measured corresponding to the tail-removing test hole 22 and the head-removing test hole 21 when the positioning plate 1 is attached to the silicon block to be measured and aligned with the tail and the head of the silicon block to be measured, respectively) which are the same as the silicon block to be measured, i.e., data collection has a uniform data collection standard, so as to avoid the randomness of data collection; the de-heading test hole 21 and the de-tailing test hole 22 not only can facilitate the probe of the resistivity tester to be pressed on the silicon block to be tested so as to carry out resistivity test, but also can be quickly positioned on the resistivity test point during measurement, thereby simplifying the resistivity test flow.
That is, when the resistivity of the silicon block to be tested is tested by the positioning device, an operator does not need to measure the height of removing the head and the height of removing the tail by using a ruler every time, so that the resistivity testing efficiency can be improved. In addition, because the position corresponding to the through hole 2 is directly used as the resistivity test point during testing, namely the data acquisition position is standardized, the problems of low reliability and poor repeatability of test data caused by randomly selecting the test point by an operator can be effectively solved.
The above-mentioned technical scheme that this application discloses sets up the locating plate that a width equals with the silicon briquette width that awaits measuring, when carrying out the resistivity test to the silicon briquette, can directly fix a position the resistivity test point of the silicon briquette that awaits measuring through the test hole of removing the head that sets up on the locating plate and the test hole of removing the tail, need not to recycle the height that the silicon briquette removed the head and removed the tail promptly, consequently, can improve efficiency of software testing. In addition, because the selected test points are the same, namely, have uniform data acquisition standards, the influence of human factors can be avoided, and the reliability and the repeatability of the test data can be improved.
The embodiment of the utility model provides a pair of a positioner for silicon briquette resistivity test, locating plate 1 highly can equal the height of the silicon briquette that awaits measuring.
The height of locating plate 1 specifically can equal with the height of the silicon briquette that awaits measuring to when awaiting measuring silicon briquette resistivity test, can let the bottom of locating plate 1 align with the afterbody of the silicon briquette that awaits measuring, and let the top of locating plate 1 align with the head of the silicon briquette that awaits measuring simultaneously, just need not to remove the position of locating plate 1 when resistivity test like this, thereby can further improve resistivity test's efficiency.
Of course, the height of the positioning plate 1 may not be equal to the height of the silicon block to be tested, at this time, when the tail resistivity test is performed, only the bottom end of the positioning plate 1 may be aligned with the tail of the silicon block to be tested, and when the head resistivity test is performed, only the top end of the positioning plate 1 may be aligned with the head of the silicon block to be tested.
The embodiment of the utility model provides a pair of a positioner for silicon briquette resistivity test can be provided with a plurality of test holes 21 and a plurality of test holes 22 that remove the tail of removing respectively on locating plate 1.
A plurality of de-heading test holes 21 and a plurality of de-tailing test holes 22 can be respectively arranged on the positioning plate 1, namely, a plurality of de-heading test holes 21 can be arranged on the positioning plate 1 at the same horizontal position with the top end distance as the height to be removed of the head of the silicon briquette to be tested, and a plurality of de-tailing test holes 22 are arranged on the positioning plate 1 at the same horizontal position with the bottom end distance as the height to be removed of the tail of the silicon briquette to be tested, so as to obtain a plurality of head resistivity test points and a plurality of tail resistivity test points.
Accordingly, when the head resistivity test is performed by the resistivity tester, the resistivity of the head resistivity test point corresponding to each of the decapsulation test holes 21 may be separately tested, and then the average value of the resistivities may be calculated to obtain the head resistivity. Similarly, the resistivity of the tail resistivity test point corresponding to each of the tail-out test holes 22 may be tested separately, and the average value of the resistivities may be calculated to obtain the tail resistivity.
The resistivity at a plurality of positions is tested by arranging a plurality of head-removing test holes 21 and a plurality of tail-removing test holes 22, and the reliability of test data can be improved by finally obtaining the average resistivity.
It should be noted that the number of the de-heading test holes 21 and the number of the de-heading test holes 22 may be equal or unequal, and they may be specifically set according to the type of the silicon block to be tested and the conditions of the head and the tail of the silicon block to be tested, that is, the number of the de-heading test holes 21 and the number of the de-heading test holes 22 may be set individually.
The embodiment of the utility model provides a pair of a positioner for silicon briquette resistivity test, test hole 21, the test hole 22 evenly distributed that removes the tail of removing are on locating plate 1.
When the positioning plate 1 comprises a plurality of head removing test holes 21 and a plurality of tail removing test holes 22, the arranged head removing test holes 21 and tail removing test holes 22 can be uniformly distributed on corresponding positions so as to uniformly collect the resistivity of the head removing position and the tail removing position of the silicon block to be tested, thereby improving the reliability and the repeatability of test data.
The embodiment of the utility model provides a pair of a positioner for silicon briquette resistivity test can be provided with 3 test hole 21 and 3 test hole 22 that remove the tail of removing respectively on locating plate 1.
Based on the consideration of the width of the silicon block to be tested and the resistivity test efficiency, 3 head removing test holes 21 and 3 tail removing test holes 22 can be respectively arranged on the positioning plate 1, namely, the corresponding positions of the positioning plate 1 can be respectively positioned according to quartering opening so as to respectively arrange 3 head removing test points and 3 tail removing test points, thereby improving the resistivity test efficiency while improving the reliability of test data.
The embodiment of the utility model provides a pair of a positioner for silicon briquette resistivity test, through-hole 2 can be quad slit or circular port.
Through-hole 2 that sets up on locating plate 1 specifically can be quad slit or circular port, and the test hole 21 of removing the head promptly, remove tail test hole 22 and specifically can be quad slit or circular port to insert smoothly of resistivity tester probe, thereby reduce the influence to the resistivity test.
Of course, the through-hole 2 may be formed in an oval shape, a triangular shape, or the like as long as the probe of the resistivity tester can be smoothly inserted.
The embodiment of the utility model provides a pair of a positioner for silicon briquette resistivity test, the aperture of through-hole 2 can be 6 mm.
The aperture of the through hole 2 can be 6mm, that is, it is specifically a square hole with a side length of 6mm, or a circular hole with a diameter of 6mm, so as to facilitate the smooth insertion of the probe of the resistivity tester.
In addition, the through hole 2 with the size of 6mm can also avoid the test error caused by different contact positions of the probe and the silicon block to be tested in each test due to the oversize through hole 2, so that the reliability and the repeatability of test data can be improved.
The embodiment of the utility model provides a pair of a positioner for silicon briquette resistivity test, locating plate 1 can be the plastics locating plate.
The positioning plate 1 can be a plastic positioning plate, so that the through hole 2 is formed in the positioning plate, damage to a silicon block to be tested when the positioning plate is attached to the silicon block to be tested is reduced, damage to an operator when resistivity testing is carried out can be avoided as much as possible, and the positioning plate is light in weight, so that the positioning plate 1 is convenient to move.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Furthermore, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include elements inherent in the list. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element. In addition, the embodiment of the present invention provides a part of the above technical solution consistent with the realization principle of the corresponding technical solution in the prior art, which is not described in detail, so as to avoid redundant description.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (8)
1. The utility model provides a positioner for silicon briquette resistivity test, its characterized in that, includes the locating plate that width and silicon briquette width that awaits measuring equal, be provided with the through-hole on the locating plate, the through-hole is including removing head test hole and removing the tail test hole, wherein:
the distance between the center of the head-removing test hole and the top end of the positioning plate is equal to the height to be removed from the head of the silicon briquette to be detected, and the distance between the center of the tail-removing test hole and the bottom end of the positioning plate is equal to the height to be removed from the tail of the silicon briquette to be detected.
2. The positioning device for resistivity testing of silicon blocks as claimed in claim 1, wherein the height of the positioning plate is equal to the height of the silicon block to be tested.
3. The positioning device for resistivity testing of silicon blocks as claimed in claim 1, wherein the positioning plate is provided with a plurality of de-heading test holes and a plurality of de-tailing test holes respectively.
4. The positioning device for resistivity testing of silicon blocks as claimed in claim 3, wherein the de-heading test holes and the de-heading test holes are uniformly distributed on the positioning plate.
5. The positioning device for resistivity testing of silicon blocks as claimed in claim 4, wherein the positioning plate is provided with 3 de-heading test holes and 3 de-tailing test holes respectively.
6. The positioning device for resistivity test of silicon blocks as claimed in any one of claims 1 to 5, wherein the through holes are square holes or circular holes.
7. The positioning device for resistivity test of silicon blocks as claimed in claim 6, wherein the aperture of the through hole is 6 mm.
8. The positioning device for resistivity testing of silicon blocks as claimed in claim 6, wherein the positioning plate is a plastic positioning plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920411711.6U CN209946214U (en) | 2019-03-28 | 2019-03-28 | Positioning device for silicon block resistivity test |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920411711.6U CN209946214U (en) | 2019-03-28 | 2019-03-28 | Positioning device for silicon block resistivity test |
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| CN209946214U true CN209946214U (en) | 2020-01-14 |
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| CN201920411711.6U Active CN209946214U (en) | 2019-03-28 | 2019-03-28 | Positioning device for silicon block resistivity test |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111337543A (en) * | 2020-04-13 | 2020-06-26 | 宜昌南玻硅材料有限公司 | Sampling device and sampling test method for resistivity test of polycrystalline silicon ingot |
-
2019
- 2019-03-28 CN CN201920411711.6U patent/CN209946214U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111337543A (en) * | 2020-04-13 | 2020-06-26 | 宜昌南玻硅材料有限公司 | Sampling device and sampling test method for resistivity test of polycrystalline silicon ingot |
| CN111337543B (en) * | 2020-04-13 | 2022-06-17 | 宜昌南玻硅材料有限公司 | Sampling device and sampling test method for resistivity test of polycrystalline silicon ingot |
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