CN209945679U - Picosecond laser spot measuring device convenient to debug - Google Patents
Picosecond laser spot measuring device convenient to debug Download PDFInfo
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- CN209945679U CN209945679U CN201920254542.XU CN201920254542U CN209945679U CN 209945679 U CN209945679 U CN 209945679U CN 201920254542 U CN201920254542 U CN 201920254542U CN 209945679 U CN209945679 U CN 209945679U
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Abstract
The utility model discloses a picosecond laser spot-measuring device convenient for debugging, which comprises a placing table, wherein one side of the placing table is provided with a laser erecting area, and the other side of the laser erecting area is provided with a spot-measuring device debugging area; the laser device erection area is provided with a laser device; the debugging area of the spot measuring device is provided with a longitudinal slide rail and a transverse slide rail; the longitudinal slide rail is connected with the transverse slide rail on the plane of the spot measuring device area; a baffle is arranged at the end opening of the slide rail which is not connected with the slide rail; the longitudinal slide rail and the transverse slide rail are respectively provided with two slide blocks; the sliding block is provided with a prism, a plane reflector, an M-square tester and a light spot analyzer; and the supporting base is provided with round holes with diameters larger than the diameters of the prism, the plane reflector, the M-square tester and the facula analyzer.
Description
Technical Field
The utility model relates to a light spot measuring device specifically is a light spot measuring device of picosecond laser instrument convenient to debugging belongs to laser technical field.
Background
Before the picosecond laser is used or in the maintenance process after the picosecond laser breaks down, parameters such as roundness, M square and the like of the emitted light are generally obtained by using some optical analysis instruments according to different powers or processing purposes, and evaluation and prediction are carried out for the next actual operation so as to judge whether the laser quality meets the working standard.
In the prior art, most picosecond laser products test parameters by using a method of manually assembling devices in the laser detection process, tools such as a prism, a plane reflector, a facula analyzer and the like are arranged on a workbench with a fixed spacing hole, and the devices are arranged on the workbench with the fixed spacing hole.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a picosecond laser device light spot measuring device convenient to debugging just for solving above-mentioned problem.
The utility model discloses a following technical scheme reaches above-mentioned purpose: a picosecond laser spot-measuring device comprises a placing table, wherein a laser erecting area is arranged on one side of the placing table, and a spot-measuring device debugging area is arranged on the other side of the laser erecting area; the laser device erection area is provided with a laser device; the debugging area of the spot measuring device is provided with a longitudinal slide rail and a transverse slide rail; the longitudinal slide rail and the transverse slide rail are connected with each other at an angle of 90 degrees on the plane of the area of the spot measuring device; a baffle is arranged at the end opening of the slide rail which is not connected with the slide rail; the longitudinal slide rail and the transverse slide rail are respectively provided with two slide blocks; the sliding blocks are provided with supporting bases integrated with the sliding blocks; the sliding block is provided with a prism, a plane reflector, an M-square tester and a light spot analyzer; the plane reflective mirror is arranged at a 90-degree included angle formed by the longitudinal slide rail and the transverse slide rail; the laser optical axis of the laser is vertical to the prism, and the reflection optical axis of the plane reflector is vertical to the M-square tester and the light spot analyzer; and the supporting base is provided with round holes with diameters larger than the diameters of the prism, the plane reflector, the M-square tester and the facula analyzer.
Preferably, in order to conveniently replace various devices for measuring various numerical data, the baffle arranged at the non-connection port of the transverse slide rail and the longitudinal slide rail is detachable;
preferably, in order to facilitate the fine adjustment of the position of the device in the process of measuring the light spots, two opposite adjusting screws are arranged on the periphery of the supporting base, and the adjusting screws clamp the device supporting body through round holes of the base;
the utility model has the advantages that: this light spot device is surveyed to picosecond laser instrument reasonable in design, in order to ensure that the refraction light optical axis of device links up each receiver of perpendicular to all the time on the horizontal slide rail slider of indulging, two horizontal slide rails of indulging are the right angle and link up mutually, in order to play fixed effect when need not changing the device, two slide rails do not handing-over the port and are provided with the dismantlement baffle, only pull down the baffle when needing to change the device, just can adorn the slide rail together with the slider with new device, in order to satisfy different light detection's demand, slider on the slide rail can be continuous adjusting distance.
Drawings
FIG. 1 is a side view of a picosecond laser speckle measurement apparatus;
FIG. 2 is a cross-sectional view of a slider and a base integral with the slider;
FIG. 3 is a top view of a slider and a base integral with the slider;
FIG. 4 is a side view of the longitudinal slide and the removable stop;
FIG. 5 is a top view of the transverse slide rail and the removable baffle;
in the figure: 1. put the thing platform, 101, laser instrument erection zone, 102, photometry spot device debugging zone laser instrument, 2, the laser instrument, 3, vertical slide rail, 4, horizontal slide rail, 5, first slider, 6, second slider, 7, third slider, 8, fourth slider, 9, prism, 10, plane reflector, 11, M side tester, 12, facula analysis appearance, 13, first baffle of dismantling, 14, the baffle can be dismantled to the second.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-5, a picosecond laser speckle measurement device convenient for debugging, a picosecond laser speckle measurement device, includes a placing table 1, a laser mounting area 101 is disposed on one side of the placing table 1, a speckle measurement device debugging area 102 is disposed on the other side of the laser mounting area 101, a laser 2 is disposed on the laser mounting area 101, a longitudinal slide rail 3 and a transverse slide rail 4 are disposed in the speckle measurement device debugging area, the longitudinal slide rail 3 and the transverse slide rail 4 form a 90 ° angle to the plane of the speckle measurement device area, a first slide block 5 and a second slide block 6 are disposed on the longitudinal slide rail 3, a fourth slide block 7 and a fifth slide block 8 are disposed on the transverse slide rail 4, a support base integrated with the slide blocks is disposed on each of the first slide block 5, the second slide block 6, the third slide block 7 and the fourth slide block 8, a prism 9 is disposed on the first slide block 5, the second sliding block 6 is provided with a plane reflective mirror 10, the third sliding block 7 is provided with an M-square tester 11, and the fourth sliding block 8 is provided with a light spot analyzer 12.
The plane reflective mirror 10 is arranged at an included angle formed by the longitudinal slide rail 3 and the transverse slide rail 4, so that the position of other devices can be adjusted by the plane reflective mirror 10; the reflection optical axis of the plane reflector 10 is perpendicular to the M-square tester 11 and the light spot analyzer 12 to accurately measure the M-square and the light spot values; the unconnected ports of the transverse slide rail 3 and the longitudinal slide rail 4 are provided with a first detachable baffle 13 and a second detachable baffle 14; the laser optical axis of the laser 2 is perpendicular to the prism 9, and the basic laser measurement condition is met; the supporting base integrated with the sliding block is provided with round holes with diameters larger than the diameters of the supporting bodies of the prism 9, the plane reflector 10, the M-square tester 11 and the facula analyzer 12, the supporting base integrated with the sliding block is provided with two opposite adjusting screws, the prism 9, the plane reflector 10, the M-square tester 11 and the facula analyzer 12 are clamped and fixed in the round holes of the supporting base integrated with the sliding block, and the positions of the supporting bodies can be finely adjusted to different degrees through the two pairs of adjusting screws according to different requirements so as to achieve better measuring effects.
The working principle is as follows: when the picosecond laser spot-measuring device is used, the prism 9 is firstly pushed to the front of the laser emission port, so that laser can be vertically emitted onto the prism 9, and the plane reflector 10 is rotated to a proper angle so that the refracted optical axis can vertically pass through the M-side detector 11 (if the M-side detector is not required to be detached, the same principle is applied when other values are measured) and the spot detector 12.
It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (8)
1. The utility model provides a picosecond laser instrument photometry spot device convenient to debugging, includes puts thing platform (1), put thing platform (1) one side and be equipped with laser instrument and erect district (101), laser instrument erects district (101) opposite side and is equipped with photometry spot device debugging district (102), be equipped with laser instrument (2) on laser instrument erects district (101), it is equipped with longitudinal slide rail (3), transverse slide rail (4) to survey facula device debugging district, its characterized in that: vertical slide rail (3) with transverse slide rail (4) are 90 jiaos and link up in photometry spot device district plane, be equipped with first slider (5), second slider (6) on vertical slide rail (3), be equipped with third slider (7), fourth slider (8) on transverse slide rail (4), be equipped with prism (9) on first slider (5), be equipped with plane reflector (10) on second slider (6), be equipped with M side tester (11) on third slider (7), be equipped with facula analysis appearance (12) on fourth slider (8).
2. The picosecond laser speckle measurement device convenient to debug of claim 1, wherein: the plane reflective mirror (10) is arranged at an included angle formed by the longitudinal slide rail (3) and the transverse slide rail (4).
3. The picosecond laser speckle measuring device convenient to debug according to claim 2, wherein: and the reflection optical axis of the plane reflector (10) is vertical to the M-square tester (11) and the light spot analyzer (12).
4. The picosecond laser speckle measurement device convenient to debug of claim 1, wherein: the unconnected ports of the longitudinal slide rail (3) and the transverse slide rail (4) are provided with a first detachable baffle (13) and a second detachable baffle (14).
5. The picosecond laser speckle measurement device convenient to debug of claim 1, wherein: the laser optical axis of the laser (2) is perpendicular to the prism (9).
6. The picosecond laser speckle measurement device convenient to debug of claim 1, wherein: and the first sliding block (5), the second sliding block (6), the third sliding block (7) and the fourth sliding block (8) are respectively provided with a supporting base integrated with the sliding blocks.
7. The picosecond laser speckle measurement device convenient to debug of claim 6, wherein: and the supporting base is provided with round holes with diameters larger than the diameters of the supporting bodies of the prism (9), the plane reflector (10), the M-square tester (11) and the facula analyzer (12).
8. The picosecond laser speckle measurement device convenient to debug of claim 7, wherein: two opposite adjusting screws are arranged on the sliding block supporting base, and the supporting bodies of the prism (9), the plane reflector (10), the M-square tester (11) and the light spot analyzer (12) are clamped and fixed in the circular hole of the supporting base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920254542.XU CN209945679U (en) | 2019-02-28 | 2019-02-28 | Picosecond laser spot measuring device convenient to debug |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920254542.XU CN209945679U (en) | 2019-02-28 | 2019-02-28 | Picosecond laser spot measuring device convenient to debug |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209945679U true CN209945679U (en) | 2020-01-14 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920254542.XU Active CN209945679U (en) | 2019-02-28 | 2019-02-28 | Picosecond laser spot measuring device convenient to debug |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209945679U (en) |
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2019
- 2019-02-28 CN CN201920254542.XU patent/CN209945679U/en active Active
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