CN209878273U - Laser diode test equipment - Google Patents
Laser diode test equipment Download PDFInfo
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- CN209878273U CN209878273U CN201920641196.0U CN201920641196U CN209878273U CN 209878273 U CN209878273 U CN 209878273U CN 201920641196 U CN201920641196 U CN 201920641196U CN 209878273 U CN209878273 U CN 209878273U
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- laser diode
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- test
- core particles
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Abstract
The utility model provides a laser diode test equipment. The laser diode test equipment comprises a machine frame; a feeding part which is arranged on the frame; the feeding part is used for placing laser diode core particles to be tested; the material conveying part is arranged on the frame; the material conveying part is used for conveying the laser diode core particles to a preset position; a first testing part mounted on the frame; the material conveying part can convey the laser diode core particles from the material loading part to the first testing part, and the first testing part tests the laser diode core particles; a second testing part mounted on the frame; the material transfer part can transfer the laser diode core grains from the first testing part to the second testing part, and the second testing part tests the laser diode core grains; the material receiving part is arranged on the frame; the material conveying part can convey the laser diode core particles on the second testing part to the material receiving part.
Description
Technical Field
The utility model relates to a laser diode test equipment.
Background
The existing laser diode testing equipment adopts the layout of 5 testing stations, wherein the 5 testing stations are a normal-temperature rear-end optical power test, a normal-temperature front-end optical power test, a normal-temperature optical wavelength test, a high-temperature front-end optical power test and a high-temperature optical wavelength test, the equipment occupies a large space due to the layout of the multiple stations, each station needs to adjust the position and the angle of a laser diode core grain, and the testing efficiency is not high.
SUMMERY OF THE UTILITY MODEL
For solving above-mentioned laser diode core grain test equipment occupation space big, problem that efficiency of software testing is low, the utility model provides a little, the high laser diode test equipment scheme of efficiency of software testing of occupation space.
The technical scheme of the utility model is that: the laser diode test apparatus includes a laser diode test apparatus,
a frame;
a feeding part which is arranged on the frame; the feeding part is used for placing laser diode core particles to be tested;
the material conveying part is arranged on the frame; the material conveying part is used for conveying the laser diode core particles to a preset position;
a first testing part mounted on the frame; the material conveying part can convey the laser diode core particles from the material loading part to the first testing part, and the first testing part tests the laser diode core particles;
a second testing part mounted on the frame; the material transfer part can transfer the laser diode core grains from the first testing part to the second testing part, and the second testing part tests the laser diode core grains;
the material receiving part is arranged on the frame; the material conveying part can convey the laser diode core particles on the second testing part to the material receiving part.
Further, the feeding portion, the first testing portion, the second testing portion and the material receiving portion are sequentially arranged along a first straight line.
Further, the first testing part is a normal temperature testing structure; the second test part is a high-temperature test structure.
The material conveying part comprises a first supporting part and a first material taking part, the first supporting part is connected to the rack, and the first material taking part is horizontally connected to the first supporting part through a sliding rail; the first material taking part can be used for taking and placing core particles.
Further, the first test section includes,
the test bearing part is connected with the rack and used for placing the core particles to be tested;
the first probe part is connected with the rack and used for electrically connecting the core particles placed on the test bearing part;
the rear end optical power testing part is connected with the rack and used for testing the luminous optical power of the rear end of the core particle;
the first front-end optical power testing part is connected with the rack and used for testing the front-end luminous optical power of the core particles;
and the optical wavelength testing part is connected with the frame and used for testing the front-end light-emitting wavelength of the core particles.
Furthermore, the test bearing part is provided with an adsorption hole connected with vacuum, and the core particles to be tested are adsorbed on the test bearing part through the adsorption hole in vacuum.
Furthermore, the test bearing part comprises a heating part and a temperature sensing part, the heating part adjusts the temperature to enable the core particles to be tested to be in a preset temperature environment, and the temperature sensing part is used for detecting the temperature of the environment where the core particles to be tested are located.
Furthermore, the first front-end optical power testing part and the optical wavelength testing part are connected to the rack through sliding installation parts.
Furthermore, the first probe part and the rear end optical power testing part are connected to the rack through the motion mounting part.
Further, the motion mounting part is connected to the rack through a vertical slide rail;
the driving motor is fixed on the rack and connected with a cam, and the cam is stopped against the lower end of the motion installation part (57).
The beneficial effects of the utility model reside in that: the laser diode core grain testing equipment has the advantages of compact layout, small occupied space, reduction of the position adjusting time occupied by multi-station testing and high testing efficiency.
Drawings
FIG. 1 is a schematic structural diagram of a laser diode core grain testing apparatus of the present invention;
fig. 2 is a schematic structural diagram of the first testing portion.
Detailed Description
In order to facilitate the understanding of the technical solutions of the present invention for those skilled in the art, the technical solutions of the present invention will be described in further detail with reference to specific embodiments.
As shown in fig. 1, a laser diode test apparatus 100 includes,
the frame 20 is used for placing other parts and components to enhance the structural stability of the laser diode testing equipment 100;
a feeding unit 30 attached to the frame 20; the feeding part 30 is used for placing laser diode core particles to be tested, so that the core particles to be tested can be conveniently taken in subsequent tests;
a material transfer part 40 mounted on the frame 20; the material transfer part 40 is used for transferring the laser diode core particles to a preset position;
a first test unit 50 attached to the rack 20; the material conveying part 40 can convey the laser diode core particles from the material loading part 30 to the first testing part 50, the first testing part 50 tests the laser diode core particles, and the first testing part 50 is in a normal-temperature testing environment of the laser diode core particles, so that the normal-temperature testing requirement of the laser diode is met;
a second testing unit 60 mounted on the frame 20; the material transfer part 40 can transfer the laser diode core particles from the first testing part 50 to the second testing part 60, and the second testing part 60 tests the laser diode core particles; the second testing part 60 enables the laser diode core particles to be in a high-temperature testing environment, so that the high-temperature testing requirement on the laser diode is met;
a material receiving unit 70 mounted on the frame 20; the material conveying part 40 can convey the laser diode core particles on the second testing part 60 to the material receiving part 70; for placing the laser diode core die tested by the first and second test parts 50 and 60;
by adopting the technical scheme, the normal temperature test and the high temperature test of the laser diode core grain are realized, and the test equipment for replacing the conventional laser diode core grain comprises the following steps: the laser diode core grain testing device has the advantages that five layout stations including the normal-temperature rear-end optical power test station, the normal-temperature front-end optical power test station, the normal-temperature optical wavelength test station, the high-temperature front-end optical power test station and the high-temperature optical wavelength test station are adopted, so that the defects of long testing time and large occupied space of the device are caused, the layout structure only comprising the normal-temperature testing station and the high-temperature testing station is adopted, the structural layout of the laser diode core grain testing device is simple, and relevant components.
As shown in fig. 1, the feeding part 30, the first testing part 50, the second testing part 60 and the receiving part 70 are arranged in sequence along a first straight line; the components are convenient to maintain by adopting linear arrangement; for example, the use of a ring arrangement can reduce the space occupied by the equipment, but is not conducive to equipment assembly, commissioning and maintenance.
As shown in fig. 1, the first test portion 50 is a normal temperature test structure; the second test part 60 is a high temperature test structure; in order to improve the testing efficiency, the normal temperature test and the high temperature test are separated from each other for the laser diode core particle test, if the normal temperature test and the high temperature test are carried out on one station, or the temperature is raised and the high temperature is measured after the normal temperature test, and the normal temperature test of the next laser diode core particle is tested after the high temperature is cooled, so that the heating and cooling time occupies the testing time, and the heating energy is wasted; or a large number of laser diode core particles are tested at normal temperature and then tested at high temperature in batches, and the mode is not beneficial to rapidly and directly judging the state of the laser diode core particles and has low practicability.
As shown in fig. 1, the material conveying portion 40 includes a first supporting portion 41 and a first material taking portion 42, the first supporting portion 41 is connected to the rack 20, the first material taking portion 42 is horizontally connected to the first supporting portion 41 through a slide rail, and a sufficient reserved space is reserved between the first material taking portion 42 and the rack 20 through the first supporting portion 41, so that the first material taking portion 42 is convenient to mount, maintain and move; the first material taking part 42 can be used for taking and placing core particles, and the first material taking part 42 adopts a vacuum adsorption nozzle with a three-dimensional adjusting structure and is used for carrying the laser diode core particles after vacuum adsorption.
As shown in fig. 1 and 2, the first test part 50 includes,
a test bearing part 51 connected to the frame 20 for placing the laser diode core particles to be tested;
a first probe part 52 connected to the frame 20 for electrically connecting the laser diode core particles placed on the test carrying part 51;
a rear-end optical power testing part 53 connected to the frame 20 for testing the luminous optical power of the rear end of the laser diode core particle;
a first front-end optical power testing section 54 connected to the chassis 20 for testing the front-end light-emitting optical power of the core particles;
an optical wavelength measuring unit 55 connected to the chassis 20 for measuring the front-end emission wavelength of the core particles;
the first probe part 52, the rear-end optical power testing part 53, the first front-end optical power testing part 54 and the optical wavelength testing part 55 which are required by the laser diode core particle test are concentrated around the test bearing part 51, so that the laser diode core particles placed in the test bearing part 51 can realize the rear-end optical power test, the front-end optical power test and the optical wavelength test in a normal temperature environment, and the structure is concentrated and occupies a small space.
As shown in fig. 1 and 2, the test carrier 51 is provided with a suction hole for vacuum connection, and the core particles to be tested are vacuum-sucked to the test carrier 51 through the suction hole; the laser diode core particles to be tested are placed on the test bearing part 51 in a vacuum adsorption mode, so that the laser diode core particles are convenient and reliable to take and place, and the laser diode core particles cannot be damaged.
As shown in fig. 1 and 2, the test carrier 51 includes a heating portion and a temperature sensing portion, the heating portion adjusts the temperature to make the core particles to be tested in a preset temperature environment, and the temperature sensing portion is used for detecting the temperature of the environment where the core particles to be tested are located; the test bearing part 51 can adjust the environmental temperature according to the test requirement, for example, although the normal temperature test is required, if the environmental temperature is too low, the temperature rise adjustment of the test bearing part 51 is required; the structure can also be used for the second test section 60, since the high temperature test of the laser diode core does not require the back end optical power test, the high temperature test does not require the back end optical power test section 53; the structure is reliable, the use is convenient, and various temperature requirements of the laser diode core particle test can be met.
As shown in fig. 1 and 2, the first front end optical power test section 54 and the optical wavelength test section 55 are both connected to the chassis 20 through a slide mounting section 56; adopt conventional integrating sphere structure occupation space big, because first front end optical power test portion 54 and optical wavelength test portion 55 do not necessarily need to test simultaneously, the event adopts first front end optical power test portion 54 and optical wavelength test portion 55 to separately use and can satisfy the operation requirement, first front end optical power test portion 54 and optical wavelength test portion 55 are all installed through slidable mounting portion 56, thereby the safe distance between first front end optical power test portion 54 and optical wavelength test portion 55 has been guaranteed, just can realize the control to first front end optical power test portion 54 and optical wavelength test portion 55 position through control slidable mounting portion 56, moreover, the steam generator is simple in structure, high durability and convenient use are reliable.
As shown in fig. 1 and fig. 2, the first probe portion 52 and the rear end optical power testing portion 53 are both connected to the frame 20 through the motion mounting portion 57, and since the rear end optical power testing portion 53 needs to ensure that the first probe portion 52 is electrically connected to the laser diode core when operating, the first probe portion 52 and the rear end optical power testing portion 53 are relatively fixed and corresponding in position, and when the first probe portion 52 is required to be electrically connected to the laser diode core, the rear end optical power testing portion 53 is in a position capable of collecting optical power of the laser diode core, so that the relative position between the rear end optical power testing portion 53 and the first probe portion 52 needs to be adjusted before the laser diode testing apparatus 100 is used.
As shown in fig. 1 and 2, the motion mounting portion 57 is connected to the rack 20 through a vertical slide rail, and the motion mounting portion 57 can move in a vertical direction, so that the first probe portion 52 and the rear end optical power testing portion 53 can move in the vertical direction under the driving of the motion mounting portion 57;
the driving motor is fixed on the rack 20, the driving motor is connected with a cam, the cam is stopped against the lower end of the motion mounting part 57, the motion control of the motion mounting part 57 along the vertical direction is realized through the driving motor and the cam, and the cam has periodicity and is convenient to control; the vertical movement of the movable mounting part 57 is mainly to ensure that the first probe part 52 and the rear optical power test part 53 have a safe distance from the first test part 50 in the vertical direction.
The above is the preferred embodiment of the present invention, and is not used to limit the protection scope of the present invention. It should be recognized that non-inventive variations and modifications to the disclosed embodiments, as understood by those skilled in the art, are intended to be included within the scope of the present invention as claimed and claimed.
Claims (10)
1. A laser diode testing apparatus, characterized by: the laser diode test apparatus (100) includes,
a frame (20);
a feeding part (30) mounted on the frame (20); the feeding part (30) is used for placing laser diode core particles to be tested;
a material transfer part (40) mounted on the frame (20); the material transfer part (40) is used for transferring the laser diode core particles to a preset position;
a first test unit (50) mounted on the chassis (20); the material conveying part (40) can convey the laser diode core particles from the material loading part (30) to the first testing part (50), and the first testing part (50) tests the laser diode core particles;
a second test unit (60) mounted on the chassis (20); the material transfer part (40) can transfer the laser diode core grains from the first testing part (50) to the second testing part (60), and the second testing part (60) tests the laser diode core grains;
a material receiving part (70) mounted on the frame (20); the material conveying part (40) can convey the laser diode core particles on the second testing part (60) to the material receiving part (70).
2. The laser diode test apparatus of claim 1, wherein:
the feeding part (30), the first testing part (50), the second testing part (60) and the material receiving part (70) are sequentially arranged along a first straight line.
3. The laser diode test apparatus of claim 1, wherein:
the first testing part (50) is a normal temperature testing structure; the second test part (60) is a high temperature test structure.
4. The laser diode test apparatus of claim 2 or 3, wherein:
the material conveying part (40) comprises a first supporting part (41) and a first material taking part (42), the first supporting part (41) is connected to the rack (20), and the first material taking part (42) is horizontally connected to the first supporting part (41) through a sliding rail; the first material taking part (42) can be used for taking and placing core particles.
5. The laser diode test apparatus of claim 2 or 3, wherein:
the first test portion (50) comprises,
a test carrying part (51) connected to the frame (20) for placing the core particles to be tested;
a first probe part (52) connected to the frame (20) for electrically connecting the core particles placed on the test carrier part (51);
a rear end optical power test part (53) connected to the frame (20) and used for testing the luminous optical power of the rear end of the core particle;
a first front-end optical power test unit (54) connected to the chassis (20) and used for testing the front-end luminous optical power of the core particles;
and an optical wavelength measuring unit (55) connected to the chassis (20) and used for measuring the front-end emission wavelength of the core particles.
6. The laser diode test apparatus of claim 5, wherein:
the test bearing part (51) is provided with an adsorption hole connected with vacuum, and core particles to be tested are adsorbed on the test bearing part (51) through the adsorption hole in vacuum.
7. The laser diode test apparatus of claim 6, wherein:
the test bearing part (51) comprises a heating part and a temperature sensing part, wherein the heating part adjusts the temperature to enable the core particles to be tested to be in a preset temperature environment, and the temperature sensing part is used for detecting the temperature of the environment where the core particles to be tested are located.
8. The laser diode test apparatus of claim 5, wherein:
the first front end optical power testing part (54) and the optical wavelength testing part (55) are connected to the rack (20) through a sliding installation part (56).
9. The laser diode test apparatus of claim 5, wherein:
the first probe part (52) and the rear end optical power testing part (53) are connected to the rack (20) through the motion mounting part (57).
10. The laser diode test apparatus of claim 9, wherein: the motion mounting part (57) is connected to the rack (20) through a vertical slide rail;
the driving motor is fixed on the rack (20), the driving motor is connected with a cam, and the cam is stopped against the lower end of the motion installation part (57).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920641196.0U CN209878273U (en) | 2019-05-07 | 2019-05-07 | Laser diode test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920641196.0U CN209878273U (en) | 2019-05-07 | 2019-05-07 | Laser diode test equipment |
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| Publication Number | Publication Date |
|---|---|
| CN209878273U true CN209878273U (en) | 2019-12-31 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920641196.0U Active CN209878273U (en) | 2019-05-07 | 2019-05-07 | Laser diode test equipment |
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| CN (1) | CN209878273U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220209493A1 (en) * | 2020-12-31 | 2022-06-30 | Chroma Ate Inc. | Laser diode testing system and laser diode testing method |
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2019
- 2019-05-07 CN CN201920641196.0U patent/CN209878273U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220209493A1 (en) * | 2020-12-31 | 2022-06-30 | Chroma Ate Inc. | Laser diode testing system and laser diode testing method |
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Address after: 518172 Longgang District, Shenzhen City, Guangdong Province Patentee after: Silicon electric semiconductor equipment (Shenzhen) Co., Ltd Address before: 518172 Longgang District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN SIDEA SEMICONDUCTOR EQUIPMENT Co.,Ltd. |