CN209860912U

CN209860912U - PON parameter multi-machine test system

Info

Publication number: CN209860912U
Application number: CN201920979590.5U
Authority: CN
Inventors: 石瑞; 林聪�; 吴双
Original assignee: Taicang T&W Electronics Co Ltd
Current assignee: Taicang T&W Electronics Co Ltd
Priority date: 2019-06-27
Filing date: 2019-06-27
Publication date: 2019-12-27
Anticipated expiration: 2029-06-27

Abstract

The utility model discloses a PON parameter multimachine test system, including a tester, a PC, light oscillograph, OLT and a plurality of model machines that await measuring, the tester includes master control CPU module, CPLD module, ROSA circuit, beam splitter, first wave splitter, second wave splitter, first electronic variable optical attenuator, second electronic variable optical attenuator, first photoswitch, second photoswitch, LCD display screen; the utility model discloses multimachine test promotes production efficiency and efficiency of software testing, saves the equipment of accompanying in the production process, reduces the production facility input, and the liberation manpower realizes the unmanned on duty test of full automatization, can realize automatic reduction manual operation.

Description

PON parameter multi-machine test system

Technical Field

The utility model relates to an optical fiber communication technical field especially relates to a PON parameter multimachine test system.

Background

In the current production and test of PON products, multiple test stations are usually required, multiple accompanying devices are equipped, such as optical parameters and flow, and different test stations are required to be separated for testing. And taking the streaming test as an example, a plurality of streaming ports and test office equipment are needed to complete the streaming test. In addition, in the test process of an actual product, the optical parameters need to be manually adjusted to perform the test of a prototype under different received light intensities, and the other tests also need to be manually performed.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to the not enough of above-mentioned prior art, provide an efficient PON parameter multimachine test system.

In order to solve the above problems, the utility model adopts the following technical proposal:

a PON parameter multi-machine test system comprises a tester, a PC, an optical oscilloscope, an OLT and a plurality of sample machines to be tested, wherein the tester comprises a master control CPU module, a CPLD module, a ROSA circuit, an optical splitter, a first optical splitter, a second optical splitter, a first electric variable optical attenuator, a second electric variable optical attenuator, a first optical switch, a second optical switch and an LCD display screen; the PC is connected with the master control CPU module through a serial port RS232, the master control CPU module is respectively connected with a CPLD module, a ROSA circuit and a second optical switch, the CPLD module is respectively connected with a first electric variable optical attenuator, a second electric variable optical attenuator, a first optical switch and an LCD display screen, the first optical switch is provided with a plurality of input ends and is respectively connected with a plurality of prototypes to be tested in a one-to-one correspondence manner, the output end of the first optical switch is connected with the input end of a first wave splitter, the first output end of the first wave splitter is connected with the input end of a wave splitter, the first output end of the wave splitter is connected with the ROSA circuit, the second output end of the wave splitter is connected with the optical oscilloscope through a first electric variable optical attenuator, a second wave splitter and a second optical switch, and the second output end of the first wave splitter is connected with the ROSA circuit through a second electric variable optical attenuator, a second wave splitter and a second optical switch, The second optical switch is connected with the OLT.

Further, the tester is communicated with a power supply through a DC power supply interface.

Further, the tester also comprises an LED indicating lamp, the CPLD module is connected with the LED indicating lamp in a control mode, and the LED indicating lamp is used for displaying the states of Pass and Fail of the test prototype.

Further, the first optical switch and the second optical switch are mechanical optical switches.

Adopt the produced beneficial effect of above-mentioned technical scheme to lie in:

the utility model discloses can once accomplish many PON model machines test, the test is accomplished through the timesharing to the concrete multimachine test, namely begins the test from the first port of connecting the model machine that awaits measuring, carries out the test of second port after accomplishing, then accomplishes the test of other ports in proper order; when testing the Pass, the LED indicator light above the port is turned on in green, if the Fail red light is turned on, the Pass or Fail of the tested prototype can be directly judged, and after the test is finished, the tested port can be replaced by another prototype for testing. The test system can complete optical power test, complete optical parameter test (ER, eye diagram allowance, Rising time, falling time and other related parameters) by matching with an optical oscillograph, and complete DDMI (digital diagnostic optical module) reporting test by matching with OLT equipment.

The utility model discloses multimachine test promotes production efficiency and efficiency of software testing, saves the equipment of accompanying in the production process, reduces the production facility input, and the liberation manpower realizes the unmanned on duty test of full automatization, can realize automatic reduction manual operation.

Drawings

Fig. 1 is a schematic structural diagram of the present invention;

FIG. 2 is a schematic front view of the test meter of the present invention;

FIG. 3 is a schematic view of the back of the test meter of the present invention;

FIG. 4 is a schematic diagram of a DDMI test environment of the present invention;

fig. 5 is a schematic diagram of the optical environment test of the present invention.

Detailed Description

The following describes embodiments of the present invention in further detail with reference to the accompanying drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.

Fig. 1 to 5 show a specific embodiment of a PON parameter multi-machine test system according to the present invention, which includes a tester, a PC, an optical line wave monitor, an OLT, and a plurality of prototype to be tested, wherein the tester includes a main control CPU module, a CPLD module, a ROSA circuit, a beam splitter, a first wavelength splitter, a second wavelength splitter, a first electric variable optical attenuator, a second electric variable optical attenuator, a first optical switch, a second optical switch, and an LCD display screen; the PC is connected with the master control CPU module through a serial port RS232 and an Ethernet interface, the network port can be used as a debugging port, data is transmitted through the Ethernet port, the master control CPU module is respectively connected with a CPLD module, a ROSA circuit and a second optical switch, the CPLD module is respectively connected with a first electric variable optical attenuator, a second electric variable optical attenuator, a first optical switch and an LCD display screen, the first optical switch is provided with a plurality of input ends and is respectively connected with a plurality of prototypes to be tested in a one-to-one correspondence manner, the output end of the first optical switch is connected with the input end of a first wave splitter, the first output end of the first wave splitter is connected with the input end of the wave splitter, the first output end of the wave splitter is connected with the ROSA circuit, the second output end of the wave splitter is connected with the optical display through the first electric variable optical attenuator, the second wave splitter and the second optical switch, and the second output end of the first wavelength divider is connected with the OLT through a second electric control variable optical attenuator, a second wavelength divider and a second optical switch.

Furthermore, the master control CPU module issues a test command to the CPLD module and performs simple control and data collection of the CPLD module. The command of testing is issued through a testing program on the PC, and then the command is sent to the main control CPU module through the RS232 debugging interface to realize the specific testing operation, and in addition, the main control CPU module can obtain the optical power intensity of the prototype to be tested through the measurement of the ROSA circuit; the main control CPU module also controls the second optical switch to switch the external FC port, and different tests are completed.

Further, the tester is communicated with a power supply through a DC power supply interface. The tester is connected with the OLT through an OLT connecting port, and the tester is connected with the optical oscillograph through an optical oscillograph connecting port.

Further, the ROSA circuit is used to measure the signal strength.

Furthermore, the optical splitter divides the power of the uplink light of the prototype to be tested into a ROSA circuit for optical power test through 1-path and 2-path, and the other path is connected to the FC port for parameter test.

Further, the first electric variable optical attenuator and the second electric variable optical attenuator are used for adjusting the uplink light intensity of the sample machine to be tested and the downlink light intensity of the OLT under the DDMI test, and are respectively adjusted to the receiving sensitivity light intensity and the saturation light intensity of the sample machine to be tested for testing.

Furthermore, the first wavelength divider and the second wavelength divider are used for separately adjusting the intensity of uplink and downlink light when the DDMI reports, so that the phenomenon that the receiving light of the OLT end, namely the uplink light intensity of a sample machine to be tested, is too strong or the receiving of the OLT is abnormal due to overheating is avoided. The upstream light (with the wavelength of 1310nm) of the prototype to be tested can be tested under the ideal light intensity of an OLT end. The wavelength of light that can pass through the port #1 is 1310nm, and the wavelength of light that can pass through the port #2 is 1490 nm.

Further, the first optical switch is a change-over switch connected with an external sample machine to be tested. During testing, the COM ports of the first optical switch are respectively connected to different channels, the testing is completed from the first prototype to be tested to the Nth prototype to be tested in sequence, and the specific channels are switched to be controlled by the CPLD module.

Furthermore, the second optical switch switches channels through the main control CPU module according to the requirements of the test items. And connecting the prototype to be tested to different FC ports to finish the optical parameter test and the DDMI reporting test.

Further, the LCD display screen is used for displaying Pass and Fail conditions of the corresponding sample machine to be tested and displaying the optical power intensity of the sample machine to be tested of the corresponding port.

Furthermore, the tester also comprises an LED indicator light, the CPLD module is in control connection with the LED indicator light, the LED indicator light is used for displaying the states of Pass and Fail of the test prototype, each port corresponds to a red-green double-color LED light, green represents Pass, red represents Fail, and the CPLD module is used for controlling the LED indicator light.

The working principle is as follows:

after N prototypes to be tested are connected to the tester, the PC is connected to a debugging interface of the tester through RS232 so as to control the tester, and after the test is started, the main control CPU module issues a command to the CPLD module to start the test.

And (3) carrying out optical parameter test:

the master control CPU module switches the second optical switch to be connected with the COM of the second optical switch to be connected with the COM of the second optical switch, the CPLD module adjusts the attenuation of the first electrically-controlled variable optical attenuator to be 0, and meanwhile, the CPLD module; when a certain channel is switched, the corresponding channel is connected with a COM port, a signal enters the optical splitter from #1 through a first wave splitter, wherein the signal at a port #1 of the first wave splitter enters a ROSA circuit to measure the optical power, a port #2 passes through a first electric control adjustable optical attenuator to a second wave splitter and then reaches an FC port #2 of a second optical switch through the COM port, the signal is tested through an optical oscillograph, a test result is fed back to a PC through an oscilloscope, the PC feeds back the test result to a tester through an RS232 interface, if the result is Pass, the LED indicator lamp at the corresponding port is turned on green, and if the result is Fail, the LED indicator lamp is turned on red.

Carrying out DDMI reporting test:

and switching the second optical switch to be connected with the COM of the second optical switch by the main control CPU module, adjusting the attenuation of the first electrically-controlled variable optical attenuator to 15-20 dB by the CPLD module, and testing the specific attenuation under the condition that the specific attenuation needs to be adjusted to an ideal attenuation according to the current environment. And the CPLD module respectively adjusts the attenuation of the second electrically-controlled variable optical attenuator to the receiving sensitivity and the saturated optical power of a prototype to be tested, and then DDMI reporting tests are respectively carried out twice. And the PC machine reads data through the Ethernet port of the prototype to be tested, and then feeds the data back to the tester to judge whether Pass or Fail.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the embodiments of the present invention.

Claims

1. A PON parameter multi-machine test system is characterized by comprising a tester, a PC, an optical oscilloscope, an OLT and a plurality of prototypes to be tested, wherein the tester comprises a master control CPU module, a CPLD module, a ROSA circuit, an optical splitter, a first optical splitter, a second optical splitter, a first electric variable optical attenuator, a second electric variable optical attenuator, a first optical switch, a second optical switch and an LCD display screen; the PC is connected with the master control CPU module through a serial port RS232, the master control CPU module is respectively connected with a CPLD module, a ROSA circuit and a second optical switch, the CPLD module is respectively connected with a first electric variable optical attenuator, a second electric variable optical attenuator, a first optical switch and an LCD display screen, the first optical switch is provided with a plurality of input ends and is respectively connected with a plurality of prototypes to be tested in a one-to-one correspondence manner, the output end of the first optical switch is connected with the input end of a first wave splitter, the first output end of the first wave splitter is connected with the input end of a wave splitter, the first output end of the wave splitter is connected with the ROSA circuit, the second output end of the wave splitter is connected with the optical oscilloscope through a first electric variable optical attenuator, a second wave splitter and a second optical switch, and the second output end of the first wave splitter is connected with the ROSA circuit through a second electric variable optical attenuator, a second wave splitter and a second optical switch, The second optical switch is connected with the OLT.

2. A PON parameter multi-machine test system as claimed in claim 1, wherein the tester communicates with the power supply via a DC power interface.

3. A PON parameter multi-machine test system as claimed in claim 1, wherein the tester further comprises an LED indicator, the CPLD module is connected to the LED indicator, and the LED indicator is used to display the status of Pass and Fail of the test prototype.

4. A PON parameter multi-machine test system as claimed in claim 1, wherein the first and second optical switches are mechanical optical switches.