CN209858719U - Calibration device of transient calibration instrument of direct current transformer - Google Patents
Calibration device of transient calibration instrument of direct current transformer Download PDFInfo
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Abstract
The utility model discloses a calibrating device of direct current transformer transient state check gauge includes: the system comprises a LabVIEW platform, a signal generating device, a high-speed A/D sampling module and a standard digital source unit; the LabVIEW platform generates standard transient waveform data according to given transient parameters; the signal generating device is used for performing D/A conversion on the signal and converting the received standard transient waveform data into a standard analog transient waveform; the high-speed A/D sampling module is used for carrying out A/D synchronous trigger sampling on the standard analog transient waveform and converting the standard analog transient waveform into a digital signal; the standard data source unit is used for receiving the digital signals and converting the digital signals into digital signals of an FT3 protocol, so that the problem of magnitude traceability of transient verification performance parameters of the direct current transformer calibrator is solved, and the calibration function of the direct current transformer transient calibrator is realized.
Description
Technical Field
The application relates to the field of intelligent equipment calibration, in particular to a calibration device of a transient calibration instrument of a direct current transformer.
Background
The direct current transformer is used as important primary equipment for construction and operation of a direct current power transmission system, accurate and reliable measurement information is provided for control protection and stable operation of the system, and the operation reliability and the measurement accuracy of the direct current transformer are directly related to safe and stable operation of the direct current power transmission system. The direct current transmission system has the requirements of higher sampling speed, wider frequency bandwidth and the like on control protection signals, and particularly in a flexible direct current transmission system and a flexible direct current transmission system, in order to improve the response speed of the flexible direct current system, suppress fault current and improve the safety and stability of a power system, higher requirements are provided for the transient characteristics of the direct current transformer, and clear test requirements are provided for the transient characteristics of the direct current transformer in related national standards.
In recent years, the application of the direct current transformer is more and more extensive, the requirement of field test is more and more obvious, the direct current transformer calibrator is also applied in a large quantity as important equipment for calibration and test of the direct current transformer, the direct current transformer transient calibrator with the direct current transformer transient characteristic calibration function is also successively released, the direct current transformer transient characteristic calibrator technology is still in a primary stage, the product quality and function difference on the market are large, the test of all performance indexes related to transient state on the national standard cannot be met, most of the direct current transformer calibrator is software upgrading on the basis of the conventional direct current transformer calibrator, and the transient state calibration function is compatible. At present, no related detection device and test method are available for evaluating the performance of the transient state calibrator of the direct current transformer, so that the calibration work of the transient state characteristic calibration function of the transient state calibrator of the direct current transformer is not carried out. The transient state check meter of the direct current transformer developed by some manufacturers can carry out detection service of the transient state characteristic of the direct current transformer without a calibration detection test, and measured transient state characteristic data are not subjected to complete magnitude traceability, so that threats and hidden dangers are brought to safe and stable operation of a direct current transmission system.
In the prior art, the method mainly aims at the whole inspection of an electronic transformer calibrator or a traditional transformer calibrator in the alternating current field, but is not suitable for the calibration of a direct current transformer transient calibrator, and the direct current transformer transient calibrator and the alternating current transformer calibrator are greatly different in the aspects of realization principles and magnitude traceability methods.
Disclosure of Invention
The application provides a calibrating device of direct current transformer transient state check gauge solves the problem of tracing to the source of the quantity value of direct current transformer check gauge transient state check performance parameter, has realized direct current transformer transient state check gauge check function.
The application provides verifying attachment of direct current transformer transient state check gauge, its characterized in that includes:
the system comprises a LabVIEW platform, a signal generating device, a high-speed A/D sampling module and a standard digital source unit; the LabVIEW platform generates standard transient waveform data according to given transient parameters and imports the standard transient waveform data into a signal generating device; the signal generating device is used for performing D/A conversion on the signal and converting the received standard transient waveform data into a standard analog transient waveform; the high-speed A/D sampling module is used for receiving the control signal and the synchronous pulse trigger signal output by the standard digital source unit, carrying out A/D synchronous trigger sampling on the standard analog transient waveform, converting the standard analog transient waveform into a digital signal and outputting the digital signal to the standard digital source unit; and the standard data source unit is used for receiving the digital signal and converting the digital signal into a digital signal of an FT3 protocol.
Preferably, the LabVIEW platform generates standard transient waveform data according to given transient parameters through a LabVIEW software program, and imports the standard transient waveform data into the signal generating device, and includes:
and the LabVIEW platform respectively generates standard transient waveform data 1 and standard transient waveform data 2 according to given transient parameters, and imports the standard transient waveform data 1 and the standard transient waveform data 2 into the signal generating device.
Preferably, the given transient parameters include:
transient step response time, transient step rise or fall time, settling time, and overshoot.
Preferably, the standard transient waveform data includes: amplitude information and time information.
Preferably, the signal generating device is a function generator or a device having a D/a conversion function.
Preferably, the signal generating device is configured to perform D/a conversion on the signal, and convert the received standard transient waveform data into a standard analog transient waveform, and includes:
the signal generating device is used for performing D/A conversion on the received standard transient waveform data 1 and standard transient waveform data 2 to convert the standard transient waveform data into a standard analog transient waveform 1 and a standard analog transient waveform 2;
the standard analog transient waveform 1 and the standard analog transient waveform 2 are output from two separate physical signal channels, respectively.
Preferably, the method further comprises the following steps:
the two physical signal paths of the signal generating means are kept separate and isolated from each other for reducing mutual interference between the standard analog transient waveform 1 and the standard analog transient waveform 2.
Preferably, the method further comprises the following steps:
outputting the standard simulation transient waveform 1 to a standard analog input port of a transient calibrator of the tested direct current transformer;
and outputting the standard analog transient waveform 2 to a measured analog quantity input port of a measured direct current transformer transient calibrator, or outputting the standard analog quantity input port to a measured digital quantity input port of the measured direct current transformer transient calibrator after converting the standard analog quantity waveform into a standard digital transient waveform through a high-speed A/D sampling module and a standard digital source unit.
Preferably, the method further comprises the following steps:
the conversion precision of the high-speed A/D sampling module can be ensured by metering calibration.
Preferably, the standard data source unit consists of an acquisition control unit, a coding unit and a clock synchronization unit; the acquisition control unit is used for receiving the digital signal of the high-speed sampling A/D module and transmitting the digital signal to the coding unit; the encoding unit is realized based on an FPGA technology with determined delay, the FPGA converts a digital waveform output by the high-speed AD sampling module into a standard digital transient waveform represented by an FT3 protocol at a specified time, and the standard digital transient waveform is sent to a tested direct-current transformer calibrator through an optical fiber interface; the clock synchronization unit is used for ensuring the synchronization between the high-speed AD sampling module and the standard digital source unit, the sampling and transmission delay time from the standard analog transient waveform 2 entering the high-speed AD sampling module to the digital quantity output from the coding unit by the FT3 protocol is not more than 1 mu s, and the uncertainty is less than 0.01 mu s.
The calibration device of the transient calibration instrument of the direct current transformer, provided by the application, is used for realizing a standard transient signal source with adjustable transient parameters based on a LabVIEW instrument control technology and a high-resolution D/A technology of a signal generating device; a standard transient digital source with low delay and fast response is realized based on the high-real-time A/D sampling and data coding technology, the problem of magnitude traceability of transient verification performance parameters of the direct current transformer calibrator is solved, and the calibration function of the direct current transformer transient calibrator is realized.
Drawings
Fig. 1 is a schematic block diagram of a calibration apparatus of a transient calibrator for a dc transformer according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a transient waveform according to an embodiment of the present application;
FIG. 3 is a schematic diagram illustrating an operation principle of a DC transformer verification according to an embodiment of the present application;
fig. 4 is a schematic diagram of an operating principle of a transient state calibrator for a dc transformer according to an embodiment of the present application.
Detailed Description
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. This application is capable of implementation in many different ways than those herein set forth and of similar import by those skilled in the art without departing from the spirit of this application and is therefore not limited to the specific implementations disclosed below.
Referring to fig. 1, fig. 1 is a schematic block diagram of a calibration apparatus of a transient calibration apparatus of a dc transformer according to an embodiment of the present application, and the apparatus according to the embodiment of the present application is described in detail below with reference to fig. 1.
The application provides a pair of verifying attachment of direct current transformer transient state check gauge, its characterized in that includes:
the system comprises a LabVIEW platform, a signal generating device, a high-speed A/D sampling module and a standard digital source unit; the LabVIEW platform generates standard transient waveform data according to given transient parameters and imports the standard transient waveform data into a signal generating device; the signal generating device is used for performing D/A conversion on the signal and converting the received standard transient waveform data into a standard analog transient waveform; the high-speed A/D sampling module is used for receiving the control signal and the synchronous pulse trigger signal output by the standard digital source unit, carrying out A/D synchronous trigger sampling on the standard analog transient waveform, converting the standard analog transient waveform into a digital signal and outputting the digital signal to the standard digital source unit; and the standard data source unit is used for receiving the digital signal and converting the digital signal into a digital signal of an FT3 protocol.
The dc transformer calibrator is an instrument for calibrating performance of a dc transformer, and generally, the dc transformer calibrator is an instrument or device for calibrating steady-state errors of the dc transformer, and the dc transformer transient calibrator is an instrument or device for calibrating transient performance of the dc transformer.
The application provides a calibrating device of direct current transformer transient state check gauge, the primary function is the calibration that realizes the transient state check function and the direct current transformer transient state check gauge performance of direct current transformer check gauge. The working principle of the transient state calibrator for calibrating the direct current transformer is as follows: generating two groups of transient waveform data, namely standard transient waveform data 1 and standard transient waveform data 2, according to given transient parameters (called standard transient parameters, such as transient step response time, transient step rise time/fall time, stability approaching time, overshoot parameters and the like) through a LabVIEW software program in a LabVIEW platform, importing the two groups of transient waveform data into a signal generating device, referring to a transient waveform schematic diagram in figure 2, converting digital transient waveform data into the standard analog transient waveform 1 and the standard analog transient waveform 2 through high-speed D/A conversion after the signal generating device receives the two groups of transient waveform data, respectively outputting the standard analog waveform 1 and the standard analog transient waveform 2 to a standard analog input port and a measured analog input port of a transient calibrator of a tested direct current transformer, and outputting the standard analog transient waveform 2 to a high-speed A/D sampling module, the high-speed A/D sampling module receives the transient waveform according to the clock synchronization signal and synchronously samples the transient waveform according to a given sampling rate, then the sampled data is transmitted to the coding unit through the acquisition control unit in the standard digital source and converted into the standard digital transient waveform of the FT3 protocol, and the standard digital transient waveform is output to the input port of the measured digital quantity of the transient calibrator of the measured direct current transformer. In summary, the dc transformer transient calibrator may output three sets of transient waveforms to the dc transformer transient calibrator to be tested, which are a standard analog transient waveform 1, a standard analog transient waveform 2, and a standard digital transient waveform, where the standard digital transient waveform is a result of digitally sampling the standard analog transient waveform 2, and other parameters are consistent except for a response time parameter. The three groups of standard transient waveform parameters are preset on a LabVIEW platform, transient parameters (called measured transient parameters) of the three groups of transient waveforms are obtained by performing transient calculation after the measured direct current transformer transient calibrator receives the three groups of transient waveforms, and the transient calibration functional performance of the direct current transformer transient calibrator can be evaluated by comparing the standard transient parameters with the measured transient parameters, so that the functional calibration of the direct current transformer transient calibrator is realized.
The direct current transformer transient state calibrator verification device has the functions of verifying the analog quantity and the digital quantity transient state of the direct current transformer transient state calibrator. When the standard signal and the measured signal are checked by the direct current transformer transient state calibrator with analog quantity input, the direct current transformer transient state calibrator outputs a standard simulation transient state waveform 1 and a standard simulation transient state waveform 2 to a standard analog quantity input port and a measured analog quantity input port of the measured direct current transformer transient state calibrator respectively; when the standard signal is checked to be analog input and the measured signal is the direct current transformer transient state calibrator with digital input, the direct current transformer transient state calibrator outputs the standard analog transient state waveform 1 and the standard digital transient state waveform to the standard analog input port and the measured digital input port of the direct current transformer transient state calibrator.
The LabVIEW platform generally refers to a control unit (which can be a notebook, an industrial personal computer or an embedded controller) provided with LabVIEW software, and the LabVIEW platform mainly has the function of generating transient step waveform data through a digital formula, wherein the transient waveform data comprises amplitude information and time information. The main idea of generating the transient step waveform data by the LabVIEW platform is as follows: firstly, generating an ideal step waveform digital sequence from 0 to 1 with the set-up time, the settling time and the overshoot all being 0, then designing a transfer function according to the specified set-up time and the parameter requirement of the overshoot, converting the parameters of the transfer function into two groups of coefficient sequences of a forward coefficient and a reverse coefficient by a bilinear transformation method, and carrying out convolution operation on the two groups of coefficients and the ideal step waveform digital sequence to obtain a group of output digital sequences, wherein the sequence is a digital sequence with the specified set-up time and the overshoot characteristic, and the settling time can be obtained by outputting the digital sequences. Based on the principle, a LabVIEW platform is used for generating standard simulated transient waveform data 1 and standard simulated transient waveform data 2 according to given transient parameters (transient step response time, transient step rise time/fall time, stability tending time, overshoot and the like), and then the LabVIEW platform transmits the two sets of transient waveforms to a signal generating device in an excel file form or a GPIB bus mode for D/A conversion.
The signal generating device is a function generator or a device with a D/A conversion function, and has the main function of converting two groups of standard transient waveform data derived from a LabVIEW platform into standard analog transient waveforms, namely a standard analog transient waveform 1 and a standard analog transient waveform 2, by a D/A conversion technology, and respectively outputting the two groups of standard analog transient waveforms from two independent physical signal channels. The two physical signal channels of the signal generating device are kept independent and isolated from each other so as to reduce mutual interference between the two groups of standard transient waveforms. The standard simulation transient waveform 1 is output to a standard analog input port of a transient calibrator of the tested direct current transformer, and the standard simulation transient waveform 2 is directly output to the tested analog input port of the transient calibrator of the tested direct current transformer or is converted into a standard digital transient waveform through a high-speed A/D sampling module and a standard digital source unit and then is output to the tested digital input port of the transient calibrator of the tested direct current transformer for verifying the transient calibration function of the transient calibrator of the direct current transformer.
The high-speed A/D sampling module can adopt a high-speed digitizer of NI company, and the model is PXI-5922. The analog-digital conversion device has the main functions of A/D synchronous trigger sampling of standard analog transient waveforms, conversion of the standard analog transient waveforms into digital signals and output of the digital signals to a standard digital source unit, and the conversion precision of the A/D sampling module can be guaranteed through measurement and calibration.
The standard data source unit consists of an acquisition control unit, a coding unit and a clock synchronization unit; the acquisition control unit is used for receiving the digital signal of the high-speed sampling A/D module and transmitting the digital signal to the coding unit; the encoding unit is realized based on an FPGA technology with determined delay, the FPGA converts a digital waveform output by the high-speed AD sampling module into a standard digital transient waveform represented by an FT3 protocol at a specified time, and the standard digital transient waveform is sent to a tested direct-current transformer calibrator through an optical fiber interface; the clock synchronization unit is used for ensuring the synchronization between the high-speed AD sampling module and the standard digital source unit, the sampling and transmission delay time from the standard analog transient waveform 2 entering the high-speed AD sampling module to the digital quantity output from the coding unit by the FT3 protocol is not more than 1 mu s, and the uncertainty is less than 0.01 mu s.
The general dc transformer calibrator operates according to the principle shown in fig. 3, and receives a standard signal U and an output U ' of a dc transformer to be tested, which is U + Δ U (U ' may be an analog or digital output, and both U and U ' are stable dc signals), and then calculates an error between the output and the input.
Suppose that the measured transformation ratio of the measured direct current transformer is 1: 1 (namely, theoretically, the output and the input are the same), but because the measured direct current transformer is inaccurate in measurement and has errors, the output and the input of the direct current transformer are not equal under normal conditions, a small measurement error (namely, delta U) exists, and the direct current transformer calibrator has the function of measuring the measurement error of the measured direct current transformer.
After the direct current transformer calibrator receives the standard signal U and the output U' of the direct current transformer to be measured, which is U + delta U, the measurement error of the direct current transformer to be measured is calculated by using the following formula:
ε＝(U′-U)/U＝ΔU/U
because the direct current transformer calibrator needs to collect a standard signal and an output signal of the measured direct current transformer to calculate a measurement error of the measured direct current transformer, the accuracy level of the direct current transformer calibrator needs to be very high, and the situation that the measurement error of the direct current transformer calibrator is inaccurate can also occur under a common situation, the error of the direct current transformer calibrator needs to be measured. The direct current transformer calibrator has the function of calibrating errors of the direct current transformer calibrator. Therefore, referring to the working principle of the dc transformer calibrator in fig. 3, the dc transformer calibrator needs to provide three sets of very accurate and stable dc signals, which are a set of standard dc signal and two sets of dc signal to be measured (each set of analog quantity and digital quantity).
The working principle of the transient calibrator for the direct current transformer is shown in fig. 4, and the difference from fig. 3 is that input and output signals of the tested direct current transformer are transient step waveforms, and because the tested direct current transformer has a measurement error, the input and output signals are not identical, so that transient parameters of the input and output transient step waveforms are different, and the transient performance of the direct current transformer can be evaluated by calculating and comparing the input and output transient step waveform parameters of the tested direct current transformer.
Therefore, the device for verifying the dc transformer transient calibrator (i.e., the dc transformer transient calibrator verifying device of this patent, shown in fig. 1) needs to output three sets of transient waveform signals, namely, the standard analog transient waveform 1, the standard analog transient waveform 2 and the standard digital transient waveform in fig. 4 or fig. 1, respectively. The standard transient parameters of the three groups of transient waveform signals can be preset, then the signals are output to a transient calibrator of the tested direct current transformer to be calculated to obtain the transient parameters, and whether the transient calibration function of the transient calibrator of the tested direct current transformer is normal or not can be evaluated by comparing the standard transient parameters with the transient parameters.
The calibration device of the transient calibration instrument of the direct current transformer, provided by the application, is used for realizing a standard transient signal source with adjustable transient parameters based on a LabVIEW instrument control technology and a high-resolution D/A technology of a signal generating device; a standard transient digital source with low delay and fast response is realized based on the high-real-time A/D sampling and data coding technology, the problem of magnitude traceability of transient verification performance parameters of the direct current transformer calibrator is solved, and the calibration function of the direct current transformer transient calibrator is realized.
The above embodiments are only used to illustrate the technical solution of the present invention and not to limit the same, although the present invention has been described in detail with reference to the above embodiments, those skilled in the art can still modify or equally replace the specific embodiments of the present invention, and these modifications or equivalents do not depart from the spirit and scope of the present invention, which is all within the protection scope of the claims of the present invention pending on this application.
Claims (10)
1. The utility model provides a verifying attachment of direct current transformer transient state check gauge which characterized in that includes:
the system comprises a LabVIEW platform for generating standard transient waveform data, a signal generating device, a high-speed A/D sampling module and a standard digital source unit; the LabVIEW platform for generating the standard transient waveform data generates the standard transient waveform data according to the given transient parameters and guides the standard transient waveform data into the signal generating device; the signal generating device is used for performing D/A conversion on the signal and converting the received standard transient waveform data into a standard analog transient waveform; the high-speed A/D sampling module is used for receiving the control signal and the synchronous pulse trigger signal output by the standard digital source unit, carrying out A/D synchronous trigger sampling on the standard analog transient waveform, converting the standard analog transient waveform into a digital signal and outputting the digital signal to the standard digital source unit; the standard digital source unit is used for receiving the digital signal and converting the digital signal into a digital signal of FT3 protocol.
2. The apparatus of claim 1, wherein the LabVIEW platform generates standard transient waveform data according to given transient parameters by a LabVIEW software program and directs the standard transient waveform data to the signal generating device, comprising:
and the LabVIEW platform respectively generates standard transient waveform data 1 and standard transient waveform data 2 according to given transient parameters, and imports the standard transient waveform data 1 and the standard transient waveform data 2 into the signal generating device.
3. The apparatus of claim 1 or 2, the given transient parameter, comprising:
transient step response time, transient step rise or fall time, settling time, and overshoot.
4. The apparatus of claim 1, wherein the standard transient waveform data comprises: amplitude information and time information.
5. The apparatus of claim 1, wherein the signal generating means is a function generator or a device with D/a conversion function.
6. The apparatus of claim 1, wherein the signal generating means for D/a converting the signal to convert the received standard transient waveform data into a standard analog transient waveform comprises:
the signal generating device is used for performing D/A conversion on the received standard transient waveform data 1 and standard transient waveform data 2 to convert the standard transient waveform data into a standard analog transient waveform 1 and a standard analog transient waveform 2;
the standard analog transient waveform 1 and the standard analog transient waveform 2 are output from two separate physical signal channels, respectively.
7. The apparatus of claim 6, further comprising:
the two physical signal paths of the signal generating means are kept separate and isolated from each other for reducing mutual interference between the standard analog transient waveform 1 and the standard analog transient waveform 2.
8. The apparatus of claim 7, further comprising:
outputting the standard simulation transient waveform 1 to a standard analog input port of a transient calibrator of the tested direct current transformer;
and outputting the standard analog transient waveform 2 to a measured analog quantity input port of a measured direct current transformer transient calibrator, or outputting the standard analog quantity input port to a measured digital quantity input port of the measured direct current transformer transient calibrator after converting the standard analog quantity waveform into a standard digital transient waveform through a high-speed A/D sampling module and a standard digital source unit.
9. The apparatus of claim 1, further comprising:
the conversion precision of the high-speed A/D sampling module can be ensured by metering calibration.
10. The apparatus of claim 1, wherein the standard digital source unit is composed of an acquisition control unit, an encoding unit and a clock synchronization unit; the acquisition control unit is used for receiving the digital signal of the high-speed sampling A/D module and transmitting the digital signal to the coding unit; the encoding unit is realized based on an FPGA technology with determined delay, the FPGA converts a digital waveform output by the high-speed AD sampling module into a standard digital transient waveform represented by an FT3 protocol at a specified time, and the standard digital transient waveform is sent to a tested direct-current transformer calibrator through an optical fiber interface; the clock synchronization unit is used for ensuring the synchronization between the high-speed AD sampling module and the standard digital source unit, the sampling and transmission delay time from the standard analog transient waveform 2 entering the high-speed AD sampling module to the digital quantity output from the coding unit by the FT3 protocol is not more than 1 mu s, and the uncertainty is less than 0.01 mu s.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113447874A (en) * | 2021-09-01 | 2021-09-28 | 南京宏泰半导体科技有限公司 | Calibration device and method for semiconductor test system |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113447874A (en) * | 2021-09-01 | 2021-09-28 | 南京宏泰半导体科技有限公司 | Calibration device and method for semiconductor test system |
| CN113447874B (en) * | 2021-09-01 | 2021-11-12 | 南京宏泰半导体科技有限公司 | Calibration device and method for semiconductor test system |
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