CN109444797B - Method and system for verifying electronic transformer transient calibrator - Google Patents
Method and system for verifying electronic transformer transient calibrator Download PDFInfo
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Abstract
The invention discloses a method for verifying an electronic transformer transient calibrator, which comprises the following steps: generating first standard transient waveform data and second standard transient waveform data according to preset standard transient parameters by using simulation software, and converting the first standard transient waveform data and the second standard transient waveform data into a first standard simulation transient waveform and a second standard simulation transient waveform respectively by using a signal generation module; and converting the second standard analog transient waveform to a third standard data transient waveform; the electronic transformer to be tested performs transient calculation to respectively obtain the transient parameters to be tested of each transient waveform; and respectively comparing the measured transient parameters of each transient waveform with the standard transient parameters to determine the transient verification performance of the transient calibrator of the electronic transformer to be tested. The invention provides important technical support for reliable and safe operation of the intelligent substation, perfects the quantity value traceability system of the electronic transformer and the calibrator, and ensures smooth development of verification and calibration work of the electronic transformer calibrator.
Description
Technical Field
The invention relates to the key technical field of intelligent equipment, in particular to a method and a system for verifying an electronic transformer transient calibrator.
Background
The electronic transformer is used as an important primary device of the intelligent transformer substation, provides a foundation for digitization and intellectualization of total station information, and the operation performance of the electronic transformer is related to stable and reliable operation of the intelligent transformer substation. In order to improve the transmission and transformation characteristics and the product operation performance of the electronic transformer in a complex environment, improve the safety and stability of a power system, and put forward higher requirements on the transient characteristics of the electronic transformer, and relevant national standards put forward definite test requirements on the transient characteristics of the electronic transformer.
The electronic transformer calibrator is also widely applied as important equipment for calibration and test of the electronic transformer, and the electronic transformer transient calibrator with the electronic transformer transient characteristic calibration function is also successively released. The technology of the electronic transformer transient characteristic calibrator is still in a primary stage, the product quality and function difference on the market is large, the test of all performance indexes related to transient on the national standard cannot be met, software is mostly upgraded on the basis of the conventional electronic transformer calibrator, and the transient calibration function is compatible. At present, no related detection device and test method are available for evaluating the performance of the transient state calibrator of the electronic transformer, so that the calibration work of the transient state characteristic calibration function of the transient state calibrator of the electronic transformer is not performed. The electronic transformer transient state check meter developed by some manufacturers does not carry out detection service of the transient state characteristics of the electronic transformer through a calibration detection test, and measured transient state characteristic data are not subjected to complete magnitude traceability, so that threats and hidden dangers exist in safe and stable operation of the intelligent transformer substation.
The existing invention patent-an electronic transformer calibrator calibration device and method based on digital source (patent number: ZL201210436816.X) adopts a standard digital source which generates a standard IEC61850 data frame based on a linear mathematical method to realize digital quantity traceability of the electronic transformer calibrator, and standard digital source signals can be output synchronously with a standard analog source after being superposed with a ratio difference and an angle difference; the invention discloses a verification device and a verification method (patent number: ZL201410187562.1) of an electronic transformer harmonic calibrator, which are used for outputting a standard digital source of an IEC61850 data frame based on a mathematical formula method, and are matched with a harmonic generator which can be traced to the national harmonic standard to realize the integral verification of the electronic transformer harmonic calibrator; the invention discloses a tracing device (patent number: 201310106173) for an electronic transformer output calibrator, which realizes digital quantity tracing and integral calibration of the electronic transformer calibrator based on high-precision digital measurement and a differential source superposition technology; the invention relates to a full-automatic transformer calibrator whole inspection device and a whole inspection method (patent number: 201710796325.9) and a utility model patent, in particular to a transformer calibrator system (patent number: ZL201712534653.3) based on an image recognition technology, which carries out automatic detection on measurement data of a to-be-inspected transformer calibrator based on an image recognition method, thereby improving the whole inspection efficiency of the transformer calibrator. The above patents are all to exchanging the whole of the field's electronic transformer check gauge or traditional transformer check gauge and not suitable for the check-up of electronic transformer transient state check gauge.
Therefore, a device for verifying the electronic transformer transient calibrator is needed to verify the transient calibration function of the electronic transformer calibrator.
Disclosure of Invention
The invention provides a method and a system for verifying a transient state calibrator of an electronic transformer, which aim to solve the problem of how to verify the transient state calibration function of the transient state calibrator of the electronic transformer.
In order to solve the above problem, according to an aspect of the present invention, there is provided a method for verifying an electronic transformer transient verifier, the method including:
generating first standard transient waveform data and second standard transient waveform data according to preset standard transient parameters by using simulation software, and importing the first standard transient waveform data and the second standard transient waveform data into a signal generation module;
the signal generation module converts the first standard transient waveform data and the second standard transient waveform data into a first standard simulation transient waveform and a second standard simulation transient waveform respectively by using a high-speed D/A conversion function, and outputs the first standard simulation transient waveform and the second standard simulation transient waveform to a standard analog input port and a measured analog input port of the transient calibrator of the electronic transformer to be tested respectively;
the signal generating module outputs the second standard simulation transient waveform to a high-speed A/D sampling module, so that the high-speed A/D sampling module obtains a third standard data transient waveform by using a standard digital source module according to the second standard simulation transient waveform and outputs the third standard data transient waveform to a tested digital input port of the transient calibrator of the electronic transformer to be tested;
the transient state calibrator of the electronic transformer to be tested performs transient state calculation by using the first standard simulated transient state waveform, the second standard simulated transient state waveform and the third standard data transient state waveform so as to respectively obtain the transient state parameters to be tested of each transient state waveform;
and respectively comparing the measured transient parameters of each transient waveform with the standard transient parameters to determine the transient verification performance of the transient calibrator of the electronic transformer to be tested.
Preferably, wherein the transient parameters include: instantaneous error, maximum peak instantaneous error, transient error, and primary time constant.
Preferably, the control platform of the simulation software imports the first standard transient waveform data and the second standard transient waveform data to the signal generation module in an excel file form or a GPIB bus manner.
Preferably, the signal generating module is an index function generator or a device with a D/a conversion function, and signal processing channels of the first standard transient waveform data and the second standard transient waveform data of the signal generating module are kept independent and isolated from each other, so as to reduce mutual interference between two sets of standard transient waveforms.
Preferably, the high-speed a/D sampling module acquires a third standard data transient waveform from the second standard analog transient waveform using a standard digital source module, including:
the high-speed A/D sampling module receives the second standard analog transient waveform, a control signal output by an acquisition control unit in the standard digital source module and a synchronous pulse trigger signal of a synchronous clock unit according to a clock synchronous signal;
and carrying out A/D synchronous trigger sampling on the second standard analog transient waveform according to a preset sampling rate, and transmitting the sampled digital signal which accords with the protocol to a coding unit through an acquisition control unit in a standard digital source module so as to convert the sampled digital signal into a third standard data transient waveform which accords with the protocol.
Preferably, wherein the protocol is an IEC61850 protocol.
According to another aspect of the present invention, there is provided a system for verifying an electronic transformer transient verifier, the system comprising:
the simulation module is used for importing first standard transient waveform data and second standard transient waveform data generated by simulation software according to preset standard transient parameters into the signal generation module;
the signal generation module is used for converting the first standard transient waveform data and the second standard transient waveform data into a first standard simulation transient waveform and a second standard simulation transient waveform respectively by using a high-speed D/A conversion function, and outputting the first standard transient waveform and the second standard simulation transient waveform to a standard analog input port and a measured analog input port of the transient calibrator of the electronic transformer to be tested respectively; for outputting the second standard analog transient waveform to a high speed A/D sampling module;
the high-speed A/D sampling module is used for acquiring a third standard data transient waveform by using a standard digital source module according to the second standard analog transient waveform and outputting the third standard data transient waveform to a tested digital quantity input port of the transient calibrator of the electronic transformer to be tested;
the transient state calibrator of the electronic transformer to be tested is used for performing transient state calculation by utilizing the first standard simulated transient state waveform, the second standard simulated transient state waveform and the third standard data transient state waveform so as to respectively obtain the transient state parameters to be tested of each transient state waveform;
and the transient verification performance determining module is used for comparing the measured transient parameters of each transient waveform with the standard transient parameters respectively so as to determine the transient verification performance of the transient verification instrument of the electronic transformer to be detected.
Preferably, wherein the transient parameters include: instantaneous error, maximum peak instantaneous error, transient error, and primary time constant.
Preferably, the control platform of the simulation software imports the first standard transient waveform data and the second standard transient waveform data to the signal generation module in an excel file form or a GPIB bus manner.
Preferably, the signal generating module is an index function generator or a device with a D/a conversion function, and signal processing channels of the first standard transient waveform data and the second standard transient waveform data of the signal generating module are kept independent and isolated from each other, so as to reduce mutual interference between two sets of standard transient waveforms.
Preferably, the high-speed a/D sampling module, according to the second standard analog transient waveform, acquires a third standard data transient waveform using a standard digital source module, including:
the high-speed A/D sampling module receives the second standard analog transient waveform, a control signal output by an acquisition control unit in the standard digital source module and a synchronous pulse trigger signal of a synchronous clock unit according to a clock synchronous signal;
and carrying out A/D synchronous trigger sampling on the second standard analog transient waveform according to a preset sampling rate, and transmitting the sampled digital signal which accords with the protocol to a coding unit through an acquisition control unit in a standard digital source module so as to convert the sampled digital signal into a third standard data transient waveform which accords with the protocol.
Preferably, wherein the protocol is an IEC61850 protocol.
The invention provides a method and a system for verifying an electronic transformer transient calibrator, which comprise the following steps: generating first standard transient waveform data and second standard transient waveform data according to preset standard transient parameters by using simulation software, and converting the first standard transient waveform data and the second standard transient waveform data into a first standard simulation transient waveform and a second standard simulation transient waveform respectively by using a signal generation module and outputting the first standard simulation transient waveform and the second standard simulation transient waveform to a standard analog input port and a measured analog input port of the transient calibrator of the electronic transformer to be tested; converting the second standard simulation transient waveform into a third standard data transient waveform, and outputting the third standard data transient waveform to a tested digital quantity input port of the transient calibrator of the electronic transformer to be tested; transient calculation is carried out to respectively obtain the measured transient parameters of each transient waveform; and respectively comparing the measured transient parameters of each transient waveform with the standard transient parameters to determine the transient verification performance of the transient calibrator of the electronic transformer to be tested. The invention solves the problem of magnitude traceability of the transient state checking performance parameters of the electronic transformer calibrator, can calibrate the analog quantity channel and the digital quantity channel of the electronic transformer transient state calibrator, can be used for developing a functional calibration test of the electronic transformer transient state calibrator and developing a verification test of the technical indexes of the electronic transformer transient state calibrator, provides an important technical support for reliable and safe operation of an intelligent substation, perfects the magnitude traceability system of the electronic transformer and the calibrator, and ensures smooth development of the verification and calibration work of the electronic transformer and the calibrator.
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A more complete understanding of exemplary embodiments of the present invention may be had by reference to the following drawings in which:
fig. 1 is a flowchart of a method 100 for verifying an electronic transformer transient verifier according to an embodiment of the present invention;
fig. 2 is a schematic block diagram for verifying an electronic transformer transient verifier according to an embodiment of the present invention; and
fig. 3 is a schematic structural diagram of a system 300 for verifying an electronic transformer transient verifier according to an embodiment of the present invention.
Detailed Description
The exemplary embodiments of the present invention will now be described with reference to the accompanying drawings, however, the present invention may be embodied in many different forms and is not limited to the embodiments described herein, which are provided for complete and complete disclosure of the present invention and to fully convey the scope of the present invention to those skilled in the art. The terminology used in the exemplary embodiments illustrated in the accompanying drawings is not intended to be limiting of the invention. In the drawings, the same units/elements are denoted by the same reference numerals.
Unless otherwise defined, terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Further, it will be understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense.
Fig. 1 is a flowchart of a method 100 for verifying an electronic transformer transient verifier according to an embodiment of the present invention. As shown in fig. 1, the method for verifying the transient state calibrator of the electronic transformer according to the embodiment of the present invention solves the problem of tracing the magnitude of the transient state calibration performance parameter of the transient state calibrator of the electronic transformer, can calibrate the analog quantity and the digital quantity channels of the transient state calibrator of the electronic transformer, can be used for performing a functional calibration test of the transient state calibrator of the electronic transformer, and also can be used for performing a verification test of technical indexes of the transient state calibrator of the electronic transformer, thereby providing an important technical support for reliable and safe operation of an intelligent substation, perfecting the magnitude tracing system of the electronic transformer and the calibrator, and ensuring smooth performance of verification and calibration of the electronic transformer and the calibrator. The method for verifying the electronic transformer transient calibrator provided by the embodiment of the invention starts from step 101, and in step 101, first standard transient waveform data and second standard transient waveform data generated by simulation software according to preset standard transient parameters are imported into a signal generation module.
Preferably, wherein the transient parameters include: instantaneous error, maximum peak instantaneous error, transient error, and primary time constant.
Preferably, the control platform of the simulation software imports the first standard transient waveform data and the second standard transient waveform data to the signal generation module in an excel file form or a GPIB bus manner.
Fig. 2 is a schematic block diagram for verifying an electronic transformer transient verifier according to an embodiment of the present invention. As shown in fig. 2, in the embodiment of the present invention, the apparatus for verifying the transient calibrator of the electronic transformer mainly comprises a LabVIEW platform, a signal generating device, a high-speed a/D sampling module, and a standard digital source module, wherein the standard digital source module comprises an acquisition control unit, a clock synchronization unit, and a coding unit. During inspection, two sets of transient waveform data, namely standard transient waveform data 1 (first standard transient waveform data) and standard transient waveform data 2 (second standard transient waveform data), are generated in a LabVIEW platform according to a set standard transient parameter through a LabVIEW software program, and then the LabVIEW platform transmits the two sets of transient waveform data to a signal generating device in an excel file form or a GPIB bus mode to perform D/A conversion. The LabVIEW platform is a control unit (a notebook computer, an industrial personal computer or an embedded controller) provided with simulation software LabVIEW, and has the main functions of generating transient waveform data through a digital formula, generating standard simulation transient waveform data 1 and standard simulation transient waveform data 2 according to set standard transient parameters by using the LabVIEW platform, and transmitting the two sets of transient waveforms to a signal generating device for D/A conversion in an excel file form or a GPIB bus mode by using the LabVIEW platform. The standard transient parameters include: instantaneous error, maximum peak instantaneous error, transient error, primary time constant, etc.
Preferably, in step 102, the signal generation module converts the first standard transient waveform data and the second standard transient waveform data into a first standard analog transient waveform and a second standard analog transient waveform respectively by using a high-speed D/a conversion function, and outputs the first standard analog transient waveform and the second standard analog transient waveform to a standard analog input port and a measured analog input port of the transient calibrator of the electronic transformer to be tested respectively.
Preferably, the signal generating module is an index function generator or a device with a D/a conversion function, and signal processing channels of the first standard transient waveform data and the second standard transient waveform data of the signal generating module are kept independent and isolated from each other, so as to reduce mutual interference between two sets of standard transient waveforms.
Preferably, in step 103, the signal generation module outputs the second standard analog transient waveform to the high-speed a/D sampling module, so that the high-speed a/D sampling module obtains a third standard data transient waveform by using the standard digital source module according to the second standard analog transient waveform, and outputs the third standard data transient waveform to the input port of the measured digital quantity of the transient calibrator of the electronic transformer to be tested.
Preferably, the high-speed a/D sampling module acquires a third standard data transient waveform from the second standard analog transient waveform using a standard digital source module, including:
the high-speed A/D sampling module receives the second standard analog transient waveform, a control signal output by an acquisition control unit in the standard digital source module and a synchronous pulse trigger signal of a synchronous clock unit according to a clock synchronous signal;
and carrying out A/D synchronous trigger sampling on the second standard analog transient waveform according to a preset sampling rate, and transmitting the sampled digital signal which accords with the protocol to a coding unit through an acquisition control unit in a standard digital source module so as to convert the sampled digital signal into a third standard data transient waveform which accords with the protocol.
Preferably, wherein the protocol is an IEC61830 protocol.
In the embodiment of the present invention, the signal generation module is a function generator or a device with D/a conversion function, and its main function is to convert two sets of standard transient waveform data derived from the LabVIEW platform into standard analog transient waveforms, i.e. a standard analog transient waveform 1 and a standard analog transient waveform 2, by using a D/a conversion technique, and output the two sets of standard analog transient waveforms from two independent physical signal channels, respectively. The two physical signal channels of the signal generating device are kept independent and isolated from each other so as to reduce mutual interference between the two groups of standard transient waveforms. The standard simulation transient state waveform 1 is output to the standard analog quantity input port of the tested electronic transformer transient state calibrator, the standard simulation transient state waveform 2 is directly output to the tested analog quantity input port of the tested electronic transformer transient state calibrator, the standard simulation transient state waveform 2 is converted into the standard digital transient state waveform (third standard digital transient state waveform) through the high-speed A/D sampling module and the standard digital source module and then is output to the tested digital quantity input port of the tested electronic transformer transient state calibrator, and the standard simulation transient state waveform 1 is used for verifying the transient state calibration function of the electronic transformer transient state calibrator.
The high-speed A/D sampling module adopts a high-speed digitizer of NI company, the model is PXI-5922, and the high-speed A/D sampling module mainly has the functions of receiving a control signal output by an acquisition control unit of a standard digital source module and a synchronous pulse trigger signal of a synchronous clock unit, carrying out A/D synchronous trigger sampling on a standard analog transient waveform, converting the standard analog transient waveform into a digital signal and outputting the digital signal to the standard digital source module. The conversion precision of the high-speed AD sampling module can be ensured through measurement and calibration.
The standard digital source module has the main function of encoding discrete digital signals of the high-speed sampling A/D module into digital signals of an IEC61850 protocol, and consists of an acquisition control unit, a clock synchronization unit and a coding unit. The acquisition control unit is used for receiving the digital signals of the high-speed sampling A/D module and transmitting the digital signals to the coding unit, the coding unit is realized on the basis of an FPGA technology with determined delay, and the FPGA can convert the digital waveforms output by the high-speed AD sampling module into standard digital transient waveforms represented by an IEC61850 protocol at a determined time and send the standard digital transient waveforms to the electronic transformer calibrator to be tested through an optical fiber interface. The clock synchronization unit is used for ensuring synchronization between the high-speed AD sampling module and the standard digital source module, and the standard analog transient waveform 2 is output from the coding unit to the tested tester from the high-speed AD sampling module to the standard digital quantity unit by an IEC61850 protocol.
Preferably, in step 104, the transient state calibrator of the electronic transformer to be tested performs transient state calculation by using the first standard simulated transient state waveform, the second standard simulated transient state waveform, and the third standard data transient state waveform, so as to obtain the measured transient state parameters of each transient state waveform respectively.
Preferably, in step 105, the measured transient parameters of each transient waveform are respectively compared with the standard transient parameters to determine the transient verification performance of the transient verifier of the electronic transformer to be tested.
In the embodiment of the invention, the transient state calibrator of the electronic transformer to be tested acquires 3 groups of transient state waveforms, namely a standard analog transient state waveform 1, a standard analog transient state waveform 2 and a standard digital transient state waveform, wherein the standard digital transient state waveform is a result of digitally sampling the standard analog transient state waveform 2, and other parameters are consistent except for a response time parameter. The three groups of standard transient waveform parameters are preset on a LabVIEW platform, transient calculation is carried out on the electronic transformer transient calibrator to be tested after the electronic transformer transient calibrator to be tested receives the three groups of transient waveforms to obtain the tested transient parameters of the three groups of transient waveforms respectively, and finally the transient calibration functional performance of the electronic transformer transient calibrator is evaluated by comparing the standard transient parameters with the tested transient parameters, so that the functional calibration of the electronic transformer transient calibrator is realized.
Fig. 3 is a schematic structural diagram of a system 300 for verifying an electronic transformer transient verifier according to an embodiment of the present invention. As shown in fig. 3, a system 300 for verifying an electronic transformer transient verifier according to an embodiment of the present invention includes: the system comprises a simulation module 301, a signal generation module 302, a high-speed A/D sampling module 303, a standard digital source module 304, an electronic transformer transient state calibrator 305 to be tested and a transient state calibration performance determination module 306. Preferably, the simulation module 301 is configured to import, to the signal generation module, the first standard transient waveform data and the second standard transient waveform data, which are generated by using simulation software according to the preset standard transient parameters.
Preferably, wherein the transient parameters include: instantaneous error, maximum peak instantaneous error, transient error, and primary time constant.
Preferably, the control platform of the simulation software imports the first standard transient waveform data and the second standard transient waveform data to the signal generation module in an excel file form or a GPIB bus manner.
Preferably, the signal generating module 302 is configured to convert the first standard transient waveform data and the second standard transient waveform data into a first standard analog transient waveform and a second standard analog transient waveform respectively by using a high-speed D/a conversion function, and output the first standard transient waveform and the second standard analog transient waveform to a standard analog input port and a measured analog input port of the transient calibrator of the electronic transformer to be tested respectively; for outputting the second standard analog transient waveform to a high speed A/D sampling module.
Preferably, the signal generating module is an index function generator or a device with a D/a conversion function, and signal processing channels of the first standard transient waveform data and the second standard transient waveform data of the signal generating module are kept independent and isolated from each other, so as to reduce mutual interference between two sets of standard transient waveforms.
Preferably, the high-speed a/D sampling module 303 is configured to obtain a third standard data transient waveform by using the standard digital source module 304 according to the second standard analog transient waveform, and output the third standard data transient waveform to a measured digital input port of the transient calibrator for the electronic transformer to be tested.
Preferably, the high-speed a/D sampling module, according to the second standard analog transient waveform, acquires a third standard data transient waveform using a standard digital source module, including: the high-speed A/D sampling module receives the second standard analog transient waveform, a control signal output by an acquisition control unit in the standard digital source module and a synchronous pulse trigger signal of a synchronous clock unit according to a clock synchronous signal; and carrying out A/D synchronous trigger sampling on the second standard analog transient waveform according to a preset sampling rate, and transmitting the sampled digital signal which accords with the protocol to a coding unit through an acquisition control unit in a standard digital source module so as to convert the sampled digital signal into a third standard data transient waveform which accords with the protocol.
Preferably, wherein the protocol is an IEC61850 protocol.
Preferably, the transient calibrator 305 of the electronic transformer to be tested is configured to perform transient calculation by using the first standard simulated transient waveform, the second standard simulated transient waveform, and the third standard data transient waveform, so as to obtain the measured transient parameter of each transient waveform respectively.
Preferably, the transient verification performance determining module 306 is configured to compare the measured transient parameter of each transient waveform with the standard transient parameter, so as to determine the transient verification performance of the transient verifier of the electronic transformer to be tested.
The system 300 for verifying the electronic transformer transient state verifier in the embodiment of the present invention corresponds to the method 100 for verifying the electronic transformer transient state verifier in another embodiment of the present invention, and is not described herein again.
The invention has been described with reference to a few embodiments. However, other embodiments of the invention than the one disclosed above are equally possible within the scope of the invention, as would be apparent to a person skilled in the art from the appended patent claims.
Generally, all terms used in the claims are to be interpreted according to their ordinary meaning in the technical field, unless explicitly defined otherwise herein. All references to "a/an/the [ device, component, etc ]" are to be interpreted openly as referring to at least one instance of said device, component, etc., unless explicitly stated otherwise. The steps of any method disclosed herein do not have to be performed in the exact order disclosed, unless explicitly stated.
Claims (10)
1. A method for verifying an electronic transformer transient verifier, the method comprising:
generating first standard transient waveform data and second standard transient waveform data according to preset standard transient parameters by using simulation software, and importing the first standard transient waveform data and the second standard transient waveform data into a signal generation module;
the signal generation module converts the first standard transient waveform data and the second standard transient waveform data into a first standard simulation transient waveform and a second standard simulation transient waveform respectively by using a high-speed D/A conversion function, and outputs the first standard simulation transient waveform and the second standard simulation transient waveform to a standard analog input port and a measured analog input port of the transient calibrator of the electronic transformer to be tested respectively;
the signal generating module outputs the second standard simulation transient waveform to a high-speed A/D sampling module, so that the high-speed A/D sampling module obtains a third standard data transient waveform by using a standard digital source module according to the second standard simulation transient waveform and outputs the third standard data transient waveform to a tested digital input port of the transient calibrator of the electronic transformer to be tested;
the transient state calibrator of the electronic transformer to be tested performs transient state calculation by using the first standard simulated transient state waveform, the second standard simulated transient state waveform and the third standard data transient state waveform so as to respectively obtain the transient state parameters to be tested of each transient state waveform;
respectively comparing the measured transient parameters of each transient waveform with the standard transient parameters to determine the transient verification performance of the transient calibrator of the electronic transformer to be tested;
the transient parameters include: instantaneous error, maximum peak instantaneous error, transient error, and primary time constant.
2. The method according to claim 1, wherein the control platform of the simulation software imports the first standard transient waveform data and the second standard transient waveform data into the signal generation module in an excel file form or a GPIB bus manner.
3. The method of claim 1, wherein the signal generation module is an exponential function generator or a device with D/a conversion function, and signal processing channels of the first standard transient waveform data and the second standard transient waveform data of the signal generation module are kept independent and isolated from each other to reduce mutual interference between two sets of standard transient waveforms.
4. The method of claim 1, wherein the high-speed a/D sampling module acquires a third standard data transient waveform from the second standard analog transient waveform using a standard digital source module, comprising:
the high-speed A/D sampling module receives the second standard analog transient waveform, a control signal output by an acquisition control unit in the standard digital source module and a synchronous pulse trigger signal of a synchronous clock unit according to a clock synchronous signal;
and carrying out A/D synchronous trigger sampling on the second standard analog transient waveform according to a preset sampling rate, and transmitting the sampled digital signal which accords with the protocol to a coding unit through an acquisition control unit in a standard digital source module so as to convert the sampled digital signal into a third standard data transient waveform which accords with the protocol.
5. The method according to claim 4, wherein the protocol is an IEC61850 protocol.
6. A system for verifying an electronic transformer transient verifier, the system comprising:
the simulation module is used for importing first standard transient waveform data and second standard transient waveform data generated by simulation software according to preset standard transient parameters into the signal generation module;
the signal generation module is used for converting the first standard transient waveform data and the second standard transient waveform data into a first standard simulation transient waveform and a second standard simulation transient waveform respectively by using a high-speed D/A conversion function, and outputting the first standard transient waveform and the second standard simulation transient waveform to a standard analog input port and a measured analog input port of the transient calibrator of the electronic transformer to be tested respectively; for outputting the second standard analog transient waveform to a high speed A/D sampling module;
the high-speed A/D sampling module is used for acquiring a third standard data transient waveform by using a standard digital source module according to the second standard analog transient waveform and outputting the third standard data transient waveform to a tested digital quantity input port of the transient calibrator of the electronic transformer to be tested;
the transient state calibrator of the electronic transformer to be tested is used for performing transient state calculation by utilizing the first standard simulated transient state waveform, the second standard simulated transient state waveform and the third standard data transient state waveform so as to respectively obtain the transient state parameters to be tested of each transient state waveform;
the transient verification performance determining module is used for comparing the measured transient parameters of each transient waveform with the standard transient parameters to determine the transient verification performance of the transient verification instrument of the electronic transformer to be tested; the transient parameters include: instantaneous error, maximum peak instantaneous error, transient error, and primary time constant.
7. The system according to claim 6, wherein the control platform of the simulation software imports the first and second standard transient waveform data to the signal generation module in an excel file format or in a GPIB bus format.
8. The system of claim 6, wherein the signal generation module is an exponential function generator or a device with D/A conversion function, and signal processing channels of the first standard transient waveform data and the second standard transient waveform data of the signal generation module are kept independent and isolated from each other to reduce mutual interference between two sets of standard transient waveforms.
9. The system of claim 6, wherein the high-speed A/D sampling module, based on the second standard analog transient waveform, acquires a third standard data transient waveform using a standard digital source module, comprising:
the high-speed A/D sampling module receives the second standard analog transient waveform, a control signal output by an acquisition control unit in the standard digital source module and a synchronous pulse trigger signal of a synchronous clock unit according to a clock synchronous signal;
and carrying out A/D synchronous trigger sampling on the second standard analog transient waveform according to a preset sampling rate, and transmitting the sampled digital signal which accords with the protocol to a coding unit through an acquisition control unit in a standard digital source module so as to convert the sampled digital signal into a third standard data transient waveform which accords with the protocol.
10. The system of claim 9, wherein the protocol is an IEC61850 protocol.
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