CN209373102U - The device that a kind of pair of laser range finder axial location is detected - Google Patents
The device that a kind of pair of laser range finder axial location is detected Download PDFInfo
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- CN209373102U CN209373102U CN201822169469.4U CN201822169469U CN209373102U CN 209373102 U CN209373102 U CN 209373102U CN 201822169469 U CN201822169469 U CN 201822169469U CN 209373102 U CN209373102 U CN 209373102U
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Abstract
The utility model proposes the device that a kind of pair of laser range finder axial location is detected, which is made of beam-expanding system, light attenuation system, light absorption system, CCD and after-treatment system etc., using the higher reflective decaying of antibody Monoclonal threshold value；Most of laser of retroreflection is handled by light absorption system；After reflecting light attenuator, it is incident on an adjustable optical attenuator, different degrees of decaying is carried out to light；It is received through the laser of adjustable optical attenuator by CCD；The hot spot that back-end processor receives CCD carries out data processing, is then accurately positioned centroid position using algorithm, may thereby determine that the position of laser beam axis.The utility model is handled superlaser using novel grating type light absorption system, therefore can greatly reduce the volume of system, so that entire measuring system is more compact, is adapted to more application scenarios.
Description
Technical field
The utility model relates to laser ranging applied technical fields, and in particular to a kind of pair of laser range finder axial location into
The device of row detection.
Background technique
Laser ranging system is component part important in current military electro-optical equipment, the range accuracy of laser range finder with
Laser emission axis, laser pick-off axis and the collimation for observing guidance axis of laser range finder have vital connection, only
Ensure that the collimation of three optical axises just can guarantee the range accuracy of laser range finder, realize its quickly and accurately measure target away from
From.
Currently, the detection of high energy pulse laser range finder optical axis generally uses " laser dotting method ", i.e., professional according to
Adjustment mode is corrected used by laser range finder, every adjustment is primary, and adjustment mirror just passes through " laser dotting method " observation laser spot
Point checks an adjustment effect with whether aiming optical axis cross-graduation center is overlapped, until LASER SPECKLE and graduation center meet
Until it is required that.Due to optical axis correction be involved in the problems, such as it is relatively more, typically in factory or REPSH repair shop by veteran profession
Personnel rule of thumb operate.Along with the continuous improvement of weapon scientific and technological content, weaponry becomes to become increasingly complex, to equipment
More stringent requirements are proposed for maintenance and performance detection, and digital intellectualization detects the development for having become all kinds of new-type weapon and equipment
Trend.And the problems such as intelligence degree is not high is still had to the correction of laser range finder optical axis.
Therefore, how accurately visually positioning high-energy pulse laser range finder optical axis position, just at urgently to be resolved
The problem of.
Utility model content
In view of this, the utility model proposes the device that a kind of pair of laser range finder axial location is detected, it can be right
Superlaser range finder axial location carries out high-precision automatic detection, and detection system is light-weight, compact-sized.
In order to solve the problems existing in the prior art, the technical solution of the utility model is: a kind of high energy pulse laser ranging
Machine system for testing optical axis, it is characterised in that: including pulse laser, expand microscope group, attenuator, absorption means, adjustable light decay
Subtract device, CCD and data processing system；
The pulse laser expands microscope group, attenuator, adjustable optical attenuator and CCD and is successively arranged along optical axis direction,
Absorption means are set to the lower section of attenuator, and data receiving system is set to the rear end CCD and carries out data for receiving CCD hot spot
Processing；
The absorption means include sapphire sheet, TEC and cooling fin；Sapphire sheet, TEC and the cooling fin according to
It is secondary to be adhered to one；
The attenuator is reflective attenuator, and attenuator substrate is 100 crystal orientation GaAs substrates, if substrate surface is arranged
Dried layer reflective film, the high low-index material of reflective film are SiO2/HfO2, the logarithm of growth is 12 pairs；
The absorption means be sub-wave length metal grating, metal grating material be metal Au, screen periods be less than into
The optical wavelength penetrated, the direction of metal grating gratings strips and the polarization direction of laser are identical, the lining of the sapphire sheet
Egative film size is equal with laser beam size.
The pulse laser is launching semiconductor laser.
Compared with prior art, as follows the advantages of the utility model:
1) laser range finder axial location caliberating device designed by the utility model, can be to high pulse energy laser ranging
The axis of machine is demarcated, and overall structure is simple, compact.
2) the utility model is handled reflected light using sub-wave length metal grating, can absorb reflection to greatest extent
Light wave, threshold for resisting laser damage is high, and structure is simple, at low cost.
Detailed description of the invention
Fig. 1 is High Power Laser Pulses laser range finder optical axis testing principle block diagram；
Fig. 2 is High Power Laser Pulses laser range finder optical axis detection principle diagram；
101- high energy pulse laser, 102- expand microscope group, 103- attenuator, 104- absorption means, 105- sapphire
Piece, 106- TEC, 107- cooling fin, 108- adjustable optical attenuator, 109- CCD, 110- data processing system.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without creative efforts
Every other embodiment obtained, fall within the protection scope of the utility model.
The design fundamentals of the utility model: high energy pulse laser is carried out at effective decaying and retroreflection first
Then reason acquires laser facula by CCD in the preceding somewhere of Laser emission window, and then in host computer in real time to the laser of acquisition
Hot spot carries out data processing, determines being accurately directed to for laser beam axis using algorithm.
The testing principle of the utility model: laser output high energy pulse light after beam-expanding system, to laser into
Row collimation；To prevent damage CCD photosensitive element, the light beam after collimation has to pass through attenuator decaying, due to pulsed laser energy
Too high, the utility model uses the higher reflective decaying of antibody Monoclonal threshold value；Most of laser of retroreflection is by light absorption system
System is handled；It after reflecting light attenuator, is incident on an adjustable optical attenuator, different degrees of decline is carried out to light
Subtract；It is received through the laser of adjustable optical attenuator by CCD；The hot spot that back-end processor receives CCD carries out data processing,
Then it is accurately positioned centroid position using algorithm, may thereby determine that the position of laser beam axis.
The device (referring to Fig. 1 and Fig. 2) detected the present embodiment provides a kind of pair of laser range finder axial location, including
Pulse laser 101 expands microscope group 102, attenuator 103, absorption means 104, adjustable optical attenuator 108, CCD109 sum number
According to processing system 110；
Above-mentioned pulse laser 101 expands the successively edge microscope group 102, attenuator 103, adjustable optical attenuator 108 and CCD109
Optical axis direction setting, absorption means 104 are set to the lower section of attenuator 103, after data receiving system 110 is set to CCD109
End carries out data processing for receiving CCD109 hot spot；
Above-mentioned attenuator 103 is reflective attenuator, and attenuator substrate is 100 crystal orientation GaAs substrates, substrate surface setting
Several layers reflective film, the high low-index material of reflective film are SiO2/HfO2, the logarithm of growth is 12 pairs.
The function of above-mentioned each module:
Laser 101 is diode-end-pumped mode, and pumping source semiconductor laser is emitting semiconductor laser
Device.
Attenuator 103 due to the threshold value that the pulse energy of high energy pulse laser is more than most of neutral density attenuator,
Therefore the utility model is decayed using light intensity of the reflective attenuator to laser.
104 purpose of absorption means is the laser absorption as much as possible that will be reflected, and extra light is prevented to be reflected into light spy
It surveys on device, in order to avoid influence the precision of ranging.
The thermal coefficient of sapphire 105 is very excellent, and the smooth surface of sapphire is suitble to make light absorption structure.
TEC106 is the volume for reducing test equipment, convenient to be bonded with sapphire interface, and the utility model is big using size
The small semiconductor chilling plate to match with beam sizes, as temperature control equipment, refrigerating capacity is suitable with light energy absorption amount.
Cooling fin 107 is bonded with the hot end of semiconductor chilling plate, and the heat that the laser of retroreflection converts is dissipated.
Adjustable optical attenuator 108 can continuously adjust the laser energy for entering CCD by adjustable optical attenuator.
Data processing system 110, data processing system is by algorithm, by the centroid position of the collected laser facula of CCD
It marks, so that it is determined that the specific axis direction of laser range finder.
Above-mentioned absorption means 104 be sub-wave length metal grating, metal grating material be metal Au, screen periods be less than into
The optical wavelength penetrated, sub-wave length metal grating have very unique effect, when incident light wave polarization direction is parallel to grating gold
When category, incident light can be absorbed by metal grating.Metal grating 104 is grown in high thermal conductivity coefficient by e-book evaporation technology
Sapphire Substrate on piece, then pass through lithography corrosion process make sub-wave length metal grating 104.104 gratings strips of metal grating
Direction it is identical with the polarization direction of laser to guarantee that laser is fully absorbed by sub-wave length metal grating 104, sapphire lining
Egative film is bonded in TEC(semiconductor cooler) on 106, TEC(semiconductor cooler) 106 sizes and 105 substrate slice of sapphire sheet
Sizableness.The semiconductor cooler 106 is bonded together with cooling fin 107.
The detection method for the device that a kind of pair of laser range finder axial location is detected are as follows: pulse laser 101 exports
High energy pulse laser pass sequentially through beam expanding lens 102, reflective attenuator 103 is divided into two after reflective attenuator 103
Shu Guang, wherein the light transmitted is light beam to be measured, light beam to be measured is incident on adjustable optical attenuator 108, adjustable by continuously adjusting
The laser beam of the attenuation multiple of optical attenuator 108, differential declines multiple is finally received by CCD109, and data processing system 110 is right
The laser facula of CCD acquisition is analyzed and is handled, and the position of accurate facula mass center is obtained；Another beam is anti-through attenuator 103
The light being emitted back towards is incident on absorption means 104, and absorption means 104 will generate heat after absorbing light, and the heat of generation passes through
Heat transfer passes to TEC106, and TEC106 transfers heat to the cooling fin 107 of the other side to handle waste heat.
The main task of data processing system 110 is that the laser facula of CCD acquisition is analyzed and handled, it is therefore an objective to
To the position of accurate facula mass center.When CCD receives representation of laser facula, sensor can not be kept away in exploring laser light hot spot
That exempts from brings noise signal, and the utility model places a transmissibility of adjustable attenuation piece in the front end CCD, and transmissibility of adjustable attenuation piece can be adjusted continuously
Section enters the laser energy of CCD, during adjusting attenuator, obtains continuous hot spot by acquiring different laser faculas
Then image does calculus of differences by the image to consecutive frame, obtain difference image, and the noise as brought by sensor can lead to
Calculus of differences is crossed to eliminate.
Claims (2)
1. the device that a kind of pair of laser range finder axial location is detected, it is characterised in that: including pulse laser (101),
Expand microscope group (102), attenuator (103), absorption means (104), adjustable optical attenuator (108), CCD(109) and data at
Reason system (110)；
The pulse laser (101) expands microscope group (102), attenuator (103), adjustable optical attenuator (108) and CCD
(109) successively it is arranged along optical axis direction, absorption means (104) are set to the lower section of attenuator (103), data receiving system
(110) it is set to CCD(109) rear end is for receiving CCD(109) hot spot carries out data processing；
The absorption means (104) include sapphire sheet (105), TEC(106) and cooling fin (107)；The sapphire
Piece (105), TEC(106) and cooling fin (107) be successively adhered to one；
The attenuator (103) is reflective attenuator, and attenuator substrate is 100 crystal orientation GaAs substrates, substrate surface setting
Several layers reflective film, the high low-index material of reflective film are SiO2/HfO2, the logarithm of growth is 12 pairs；
The absorption means (104) be sub-wave length metal grating, metal grating material be metal Au, screen periods be less than into
The optical wavelength penetrated, the direction of metal grating gratings strips and the polarization direction of laser are identical, the sapphire sheet (105)
Substrate slice size it is equal with laser beam size.
2. the device that a kind of pair of laser range finder axial location according to claim 1 is detected, it is characterised in that: institute
The pulse laser (101) stated is launching semiconductor laser.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822169469.4U CN209373102U (en) | 2018-12-24 | 2018-12-24 | The device that a kind of pair of laser range finder axial location is detected |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822169469.4U CN209373102U (en) | 2018-12-24 | 2018-12-24 | The device that a kind of pair of laser range finder axial location is detected |
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| Publication Number | Publication Date |
|---|---|
| CN209373102U true CN209373102U (en) | 2019-09-10 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201822169469.4U Active CN209373102U (en) | 2018-12-24 | 2018-12-24 | The device that a kind of pair of laser range finder axial location is detected |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109407076A (en) * | 2018-12-24 | 2019-03-01 | 西安工业大学 | High energy pulse laser range finder system for testing optical axis and its detection method |
| CN111843229A (en) * | 2020-06-29 | 2020-10-30 | 江苏亚威艾欧斯激光科技有限公司 | Substrate cutting device |
-
2018
- 2018-12-24 CN CN201822169469.4U patent/CN209373102U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109407076A (en) * | 2018-12-24 | 2019-03-01 | 西安工业大学 | High energy pulse laser range finder system for testing optical axis and its detection method |
| CN109407076B (en) * | 2018-12-24 | 2023-12-22 | 西安工业大学 | Optical axis detection system and detection method for high-energy pulse laser range finder |
| CN111843229A (en) * | 2020-06-29 | 2020-10-30 | 江苏亚威艾欧斯激光科技有限公司 | Substrate cutting device |
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