CN209327448U - A kind of cell piece contact resistance test device - Google Patents
A kind of cell piece contact resistance test device Download PDFInfo
- Publication number
- CN209327448U CN209327448U CN201822159885.6U CN201822159885U CN209327448U CN 209327448 U CN209327448 U CN 209327448U CN 201822159885 U CN201822159885 U CN 201822159885U CN 209327448 U CN209327448 U CN 209327448U
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- Prior art keywords
- probe
- cell piece
- contact resistance
- test device
- resistance test
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Abstract
The utility model discloses a kind of cell piece contact resistance test devices, belong to solar cell test technical field.The utility model cell piece contact resistance test device includes the testboard that can support mesuring battary piece, cell piece include two edges perpendicular to or be parallel to the battery blade unit cut open in the main grid direction of cell piece, the two opposite sides of testboard are respectively arranged with the first probe, first probe of two sides can be contacted with the main grid of one of battery blade unit respectively, and cell piece contact resistance test device further includes the traveling probe contacted for the secondary grid with cell piece.In the utility model, the first probe is respectively set in the two sides of testboard, the signal of the half of battery blade unit of two of cell piece can be collected, the entire test result of cell piece can be presented, test result is more complete, the more conducively industrial analysis of cell piece, operation is easier, testing efficiency is higher.
Description
Technical field
The utility model relates to solar cell test technical field more particularly to a kind of cell piece contact resistance test dresses
It sets.
Background technique
Cell piece serial resistance is by the resistance of metal electrode, metal electrode and semiconductor contact resistance, emitter region thin-layer electric
The composition such as resistance and base resistance.Series resistance is to influence solar battery fill factor and short circuit current and and then influence photoelectricity turn
One of an important factor for changing efficiency.Metal electrode and semiconductor contact resistance are one of important components of series resistance, quasi-
Really the contact resistance of measurement cell piece can be used to monitor battery plate electrode sintering quality.When contact resistance tester passes through illumination
Pointwise test surface potential calculates the contact resistance of cell piece under short-circuit condition.As shown in Figure 1, contact resistance tester is received
The mode of collection surface potential is: cell piece 20 ' is placed on testboard 10 ', the front main grid 40 ' of cell piece 20 ' and fixed spy
Needle 30 ' contacts, traveling probe 60 ' vertical secondary 50 ' direction of grid from 20 ' side of cell piece point by point, streak secondary grid 50 ' line by line
(what each dotted line with the arrow indicated is the motion track of traveling probe 60 ' in Fig. 1), fixed probe 30 ', secondary grid 50 ' and shifting
Dynamic probe 60 ' is formed into a loop.
Contact resistance tester in the prior art, only the direction parallel with main grid 40 ' in 10 ' side, which is provided with, is used for
The fixation probe 30 ' contacted with main grid 40 ', when the cell piece 20 ' of test is half cell piece, among half cell piece
Grid line is not connected to, and the side grid line far from fixed probe 30 ' and fixed probe 30 ' are contactless, and fixed probe 30 ' can not collect survey
Trial signal causes cell piece one side of something without test result, is unfavorable for industrial analysis.In addition, existing contact resistance tester, when outstanding
Secondary grid 50 ' when traveling probe 60 ' above cell piece streaks 40 ' top of the main grid of top side one, close to 40 ' one side of main grid
It is drawn and breaks by traveling probe 60 ', test signal is difficult to be sent to battery main grid 40 ' and fixed probe 30 ', leads to top side
The site tests result inaccuracy of piece 40 ' an or more main grid is even without result.
Utility model content
The purpose of this utility model is that proposing a kind of cell piece contact resistance test device, it can be used in the survey of cell piece
Examination, provides more complete test result.
For this purpose, the utility model uses following technical scheme:
A kind of cell piece contact resistance test device, the testboard including mesuring battary piece can be supported, the cell piece
Including two edges perpendicular to or be parallel to the battery blade unit cut open in the main grid direction of the cell piece, the testboard
Two opposite sides are respectively arranged with the first probe, first probes of two sides can respectively with battery blade unit described in one of them
Main grid contact, the cell piece contact resistance test device further includes the mobile spy contacted for the secondary grid with the cell piece
Needle.
Further, the two opposite sides of the testboard are respectively arranged with the second probe, and the front end of second probe is in
Strip, the front end of second probe of two sides can respectively with a plurality of secondary grid of battery blade unit described in one of them
In one end perpendicular contact of secondary grid.
Further, first probe and second probe are movably arranged on the testboard.
Further, the two opposite sides of the testboard are provided with mounting groove along its length, in the mounting groove
Sliding is provided with multiple brackets, and each first probe and second probe are respectively arranged on the different brackets.
Further, the cell piece contact resistance test device further includes positioning stud, the external groove sidevall of the mounting groove
On the first opening of strip is offered along the length direction of the mounting groove, the bottom end of the bracket is provided with threaded hole, institute
Stating positioning stud can connect across first opening with the threaded hole.
Further, first probe and second probe are rotatably connected with the corresponding bracket.
Further, the upper end of the bracket is provided with U-lag, horizontally disposed in the U-lag to have shaft, institute
The first probe, second probe is stated to be rotatablely connected with the shaft on the corresponding bracket.
Further, the front end face of first probe be can be with the arc of the main grid point contact of the battery blade unit
End face.
Further, the quantity of first probe is multiple.
Further, the quantity of the traveling probe is 1.
The beneficial effects of the utility model are as follows:
In the utility model, the first probe is respectively set in the two sides of testboard, two battery blade units of cell piece
Signal can be collected, and the entire test result of cell piece can be presented, test result is more complete, more conducively the technique of cell piece
Analysis；And the first probe is respectively set in the two sides of testboard, without changing parameter and converting the position of cell piece, it can
The signal of two battery blade units of cell piece is acquired, operation is easier, testing efficiency is higher.In addition, this is practical new
In type, be arranged the second probe and the second probe front end can with a plurality of secondary grid perpendicular contact of battery blade unit upper edge,
When traveling probe slides into above the main grid of top side, breaks even if the secondary grid near the main grid of top side are drawn, can also pass through shifting
It is formed into a loop and is tested between the secondary grid and the second probe slipped over above dynamic probe, top side main grid without traveling probe,
Solve test result inaccuracy even the asking without test result of the above position contact resistance of the main grid of cell piece top side one
Topic.
Detailed description of the invention
Fig. 1 is the top view of contact resistance tester in the prior art；
Fig. 2 is the axonometric drawing for the cell piece contact resistance test device that specific embodiment of the present invention provides；
Fig. 3 is the top view for the cell piece contact resistance test device that specific embodiment of the present invention provides.
Appended drawing reference:
10 ', testboard；20 ', cell piece；30 ', fixed probe；40 ', main grid；50 ', secondary grid；60 ', traveling probe；
10, testboard；20, cell piece；30, the first probe；40, main grid；50, secondary grid；60, the second probe；11, it installs
Slot；12, bracket；13, positioning stud；111, the first opening；121, U-lag；21, battery blade unit；61, before the second probe
End.
Specific embodiment
Further illustrate the technical solution of the utility model below with reference to the accompanying drawings and specific embodiments.
In the description of the present invention, it should be understood that term " on ", "lower", "front", "rear", "left", "right",
The orientation or positional relationship of the instructions such as "vertical", "horizontal", "top", "bottom", "inner", "outside" be orientation based on the figure or
Positional relationship is merely for convenience of describing the present invention and simplifying the description, rather than the device or member of indication or suggestion meaning
Part must have a particular orientation, be constructed and operated in a specific orientation, therefore should not be understood as limiting the present invention.
Specific embodiment of the present utility model provides a kind of cell piece contact resistance test device, such as Fig. 2 and Fig. 3 institute
Show, it can be used to measure the contact resistance of cell piece 20, cell piece 20 include several main grids 40 disposed in parallel and it is several with
The secondary grid 50 that the main grid 40 intersects vertically.When cell piece 20 is half cell piece, usually the middle part of cell piece 20 is along vertical
Two symmetrically arranged battery blade units 21 are divided by cutting modes such as laser in the direction of main grid 40, are in addition also had a small amount of
Cell piece 20 is that the direction that its middle part edge is parallel to main grid 40 is divided into two symmetrically arranged electricity by cutting modes such as laser
Pond blade unit 21, it is possible to understand that the main grid 40 on ground, two battery blade units 21 is disconnected.
With continued reference to Fig. 2 and Fig. 3, which includes testboard 10, the upper table of testboard 10
Face is the metal table top that can support cell piece 20, and the left and right sides of testboard 10 is respectively arranged with the first probe 30, two sides
First probe 30 can be contacted with the main grid 40 of one of battery blade unit 21 of cell piece 20 to be measured respectively, battery
Piece contact resistance test device further includes the traveling probe (not shown) contacted for the secondary grid 50 with cell piece 20.It is mobile
The quantity of probe is preferably 1, i.e. test process, and the cell piece 20 of two sides shares same traveling probe, to simplify overall structure
And operation.The motion track of traveling probe is identical as the motion track of existing traveling probe shown in Fig. 1, i.e., along vertical
It is point-by-point from the side of cell piece in the direction of secondary grid 50, streak secondary grid 50 line by line.In other embodiments, traveling probe
Quantity may be two, i.e. the cell piece 20 of two sides is respectively adopted one of traveling probe and is tested.
In present embodiment, the first probe 30, two electricity of cell piece 20 are respectively set in the two sides of testboard 10
The signal of pond blade unit 21 can be collected, and the entire test result of cell piece 20 can be presented, test result is more complete, more
Conducive to the industrial analysis of cell piece；And the first probe 30 is respectively set in the two sides of testboard 10, without changing parameter and change
Change the position of cell piece 20, it can the signal of two battery blade units 21 of cell piece 20 is acquired, operate it is easier,
Testing efficiency is higher.
As shown in Figures 2 and 3, the two sides of testboard 10 are also respectively provided with the second probe 60, the front end of the second probe 60
61 is in long strip, and the front end 61 of the second probe 60 of two sides can be more with one of 21 upper edge of battery blade unit respectively
One end perpendicular contact of the item pair grid 50 in secondary grid 50.What the length of the front end 61 of the second probe 60 can test according to specific needs
The size of cell piece is arranged, and the front end 61 of the second probe 60 is preferably capable each secondary grid in same battery blade unit 21
50.Present embodiment adds the second probe 60 compared with the existing technology, the front end 61 of the second probe 60 can respectively with its
In a plurality of secondary grid 50 of 21 upper edge of battery blade unit intersect vertically, when traveling probe slides on top side main grid 40
Fang Shi breaks even if the secondary grid 50 near top side main grid 40 are drawn, also can be by traveling probe, 40 top of top side main grid not
It is formed into a loop between the secondary grid 50 and the second probe 60 slipped over through traveling probe, solves the main grid 40 of cell piece top side one
The above position contact resistance test result inaccuracy even without test result the problem of.
In the prior art, the contact length of the first probe 30 and main grid 40 is longer (about 1cm), is easy to scratch main grid 40,
To solve this problem, the front end face that the first probe 30 is enabled in present embodiment is for the main grid 40 with battery blade unit 21
The curved end of point contact, to reduce the contact length of the first probe 30 and main grid 40.
For the cell piece 20 suitable for various halftones, the first probe 30 and the second probe 60 are movably arranged at test
On platform 10.Wherein, the quantity of the first probe 30 is multiple, it is possible to understand that ground is that each first probe 30 is respectively positioned on the second probe
60 the same side.There is a probe due to being required to contact on each main grid 40, and the quantity of usually main grid 40 is within 5, so
The quantity of first probe 30 preferably but is not limited to 5, and the quantity of main grid 40 may be 2-4.It, can be according to electricity when test
The specific structure of pond piece, selection uses several first probes 30 therein, and selects the most final position of the movement of the first probe 30
It sets.
As shown in Fig. 2, the two sides of testboard 10 are provided with the mounting groove 11 of upper end opening, mounting groove along its length
Sliding is provided with multiple brackets 12 in 11, and each first probe 30 and the second probe 60 are respectively arranged on different brackets 12,
By the way that the position of probe can be adjusted along 11 sliding support 12 of mounting groove.In order to by the spy on bracket 12 and bracket 12
Fixed bracket 12 when needle is adjusted to predeterminated position, cell piece contact resistance test device further includes positioning stud 13, mounting groove 11
External groove sidevall on along mounting groove 11 length direction be provided with strip first opening 111, the bottom end of bracket 12 is provided with spiral shell
Pit, positioning stud 13 can pass through the first opening 111 and be threadedly coupled with threaded hole so that the head of positioning stud 13 abuts outside
Cell wall, it is using 13 head of positioning stud and the frictional force at the first 111 edges of opening that bracket 12 and 11 slot lock of mounting groove is tight, it is fixed
The position of bracket 12.Understandably, the head diameter of positioning stud 13 should be greater than the width of the first opening 111.
Each first probe 30 and the second probe 60 are rotatably connected with corresponding bracket 12.Survey is placed in cell piece
Before test stand 10, the first probe 30 and the second probe 60 are rotated up and lift, after cell piece is placed on testboard 10, the
One probe 30 and the second probe 60 are rotated down to contact with cell piece.Optionally, the first probe 30 and the second probe 60 pass through
As under type is rotationally connected on bracket 12: the upper end of bracket 12 is provided with U-lag, in U-lag it is horizontally disposed have turn
Axis, the first probe 30 and the second probe 60 are rotatablely connected with the shaft on corresponding bracket 12.
The course of work of the cell piece contact resistance test device of present embodiment is introduced briefly below:
The first probe 30 of 10 two sides of testboard and the second probe 60 are rotated up and are lifted first, cell piece 20 is placed
In on testboard 10.According to the first probe 30 of 10 two sides of halftone mobile test bench of the two of cell piece 20 battery blade units 21
With the second probe 60, wherein the position of the first probe 30 of two sides respectively with each main grid 40 of two battery blade units 21
Position is corresponding, and the position of the second probe 60 of two sides is corresponding with the uppermost areas of two battery blade units 21 respectively.To
It is lower rotation the first probe 30 and the second probe 60 make two sides the first probe 30 front end face respectively with corresponding main grid 40
Contact, the front end 61 of the second probe 60 of two sides one end perpendicular contact with corresponding a plurality of secondary grid 50 respectively.Along vertical
It is point-by-point from the side of cell piece 20 in the direction of secondary grid 50, streak secondary grid 50 line by line, to obtain two battery blade units
21 test result.Wherein, when traveling probe is at top side main grid 40 (i.e. near the main grid 40 of the second probe 60 in Fig. 2)
When any region of side is mobile, the adjacent main grid 40 set on the upside of the secondary grid 50 and traveling probe on the upside of traveling probe, traveling probe
Between be formed into a loop；When traveling probe is moved to top side 40 top of main grid, traveling probe, the top of top side main grid 40 without
It is formed into a loop between the secondary grid 50 and the second probe 60 that traveling probe slips over.
Technical principle of the utility model has been described above with reference to specific embodiments.These descriptions are intended merely to explain this reality
With novel principle, and it cannot be construed to the limitation to scope of protection of the utility model in any way.Based on the explanation herein,
Those skilled in the art, which does not need to pay for creative labor, can associate with other specific implementation modes of this utility model,
These modes are fallen within the protection scope of the utility model.
Claims (10)
1. a kind of cell piece contact resistance test device, the testboard (10) including that can support mesuring battary piece (20) is described
Cell piece (20) include two edges perpendicular to or be parallel to the cell piece list cut open in the main grid direction of the cell piece (20)
First (21), which is characterized in that the two opposite sides of the testboard (10) are respectively arranged with the first probe (30), and described the of two sides
One probe (30) can be contacted with the main grid (40) of battery blade unit (21) described in one of them respectively, the cell piece contact electricity
Hindering test device further includes the traveling probe contacted for the secondary grid (50) with the cell piece (20).
2. cell piece contact resistance test device according to claim 1, which is characterized in that the two of the testboard (10)
Opposite side is respectively arranged with the second probe (60), and the front end (61) of second probe (60) is in long strip, and described the of two sides
The front end (61) of two probes (60) can exist with a plurality of secondary grid (50) of battery blade unit (21) described in one of them respectively
One end perpendicular contact of secondary grid (50).
3. cell piece contact resistance test device according to claim 2, which is characterized in that first probe (30) and
Second probe (60) is movably arranged on the testboard (10).
4. cell piece contact resistance test device according to claim 3, which is characterized in that the two of the testboard (10)
Opposite side is provided with mounting groove (11) along its length, and sliding is provided with multiple brackets (12) in the mounting groove (11),
Each first probe (30) and second probe (60) are respectively arranged on the different brackets (12).
5. cell piece contact resistance test device according to claim 4, which is characterized in that the cell piece contact resistance
Test device further includes positioning stud (13), along the length direction of the mounting groove (11) on the external groove sidevall of the mounting groove (11)
The first opening (111) of strip is offered, the bottom end of the bracket (12) is provided with threaded hole, positioning stud (13) energy
It is enough to be connect across first opening (111) with the threaded hole.
6. cell piece contact resistance test device according to claim 4, which is characterized in that first probe (30) and
Second probe (60) is rotatably connected with the corresponding bracket (12).
7. cell piece contact resistance test device according to claim 6, which is characterized in that the upper end of the bracket (12)
It is provided with U-lag, it is horizontally disposed in the U-lag to have shaft, first probe (30), second probe (60)
It is rotatablely connected with the shaft on the corresponding bracket (12).
8. cell piece contact resistance test device according to any one of claims 1 to 7, which is characterized in that described first
The front end face of probe (30) is can be with the curved end of main grid (40) point contact of the battery blade unit (21).
9. cell piece contact resistance test device according to any one of claims 1 to 7, which is characterized in that described first
The quantity of probe (30) is multiple.
10. cell piece contact resistance test device according to any one of claims 1 to 7, which is characterized in that the movement
The quantity of probe is 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822159885.6U CN209327448U (en) | 2018-12-21 | 2018-12-21 | A kind of cell piece contact resistance test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822159885.6U CN209327448U (en) | 2018-12-21 | 2018-12-21 | A kind of cell piece contact resistance test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209327448U true CN209327448U (en) | 2019-08-30 |
Family
ID=67727965
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201822159885.6U Expired - Fee Related CN209327448U (en) | 2018-12-21 | 2018-12-21 | A kind of cell piece contact resistance test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209327448U (en) |
-
2018
- 2018-12-21 CN CN201822159885.6U patent/CN209327448U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: No. 199, deer mountain road, Suzhou high tech Zone, Jiangsu Province Patentee after: Atlas sunshine Power Group Co.,Ltd. Address before: No. 199, deer mountain road, Suzhou high tech Zone, Jiangsu Province Patentee before: CSI SOLAR POWER GROUP Co.,Ltd. |
|
| CP01 | Change in the name or title of a patent holder | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190830 Termination date: 20211221 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |