CN209327410U - A kind of conducting probe - Google Patents
A kind of conducting probe Download PDFInfo
- Publication number
- CN209327410U CN209327410U CN201821476490.2U CN201821476490U CN209327410U CN 209327410 U CN209327410 U CN 209327410U CN 201821476490 U CN201821476490 U CN 201821476490U CN 209327410 U CN209327410 U CN 209327410U
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- CN
- China
- Prior art keywords
- bending part
- conducting probe
- support portion
- insulation material
- probe
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Abstract
The utility model discloses a kind of conducting probes.The conducting probe, including support portion and bending part, one end of the support portion and bending part electrical connection, angle is β, β ∈ (90 ° 180 °) between the support portion and bending part；The bending part is enclosed with high-temperature insulation material, and the bending part includes electrical contacts；By using the electric discharge exposed position of high-temperature insulation material package conducting probe, conducting probe electric discharge is reduced；To reduce conducting probe electric discharge influence caused by use；Structure is simple, convenient for production, using reliable.
Description
Technical field
The utility model relates to a kind of conducting probes.
Background technique
For the LED grain of formal dress and upside-down mounting, since the pole N and the pole P are in the same side；In order to test the electrical parameter of LED grain
And optical parameter, it needs to import test electricity to the pole N of LED grain and the pole P simultaneously.
The testing scheme being widely used at present is: LED grain being passed through to test probe respectively and imports test electricity.However, with
LED grain it is smaller and smaller, discharge because distance is too close between the pole N probe and the pole P probe and causes probe quickening ablation and influence
The optical parameter and electrical parameter of LED test.
Utility model content
To improve the pole N probe and the pole P probe because of the too close electric discharge of distance, probe service life, while extension and conducting probe are influenced
Electric discharge influences the problem of using；The utility model proposes a kind of conducting probe and its manufacturing method and application method, reduce conduction
The method of probe electric discharge.
The technical solution of the utility model are as follows: a kind of conducting probe, including support portion and bending part, the one of the support portion
End and bending part electrical connection, angle is β, β ∈ (90 °, 180 °) between the support portion and bending part；
The bending part is enclosed with high-temperature insulation material, and the bending part includes electrical contacts.
Conducting probe electric discharge is reduced by using high-temperature insulation material, reduces conducting probe use because of the bring shadow that discharges
It rings；Technical solution is simple, improves the using effect of conducting probe；Moreover, the finish that can reduce conducting probe bending part is wanted
It asks, reduces the manufacturing cost of conducting probe.
Further, the support portion is provided with rotation prevention portion far from one end of bending part, and the rotation prevention portion and bending part exist
In same plane；The rotation prevention portion causes bending part position moving influence conducting probe to use for placing support portion rotation.
Further, the high-temperature insulation material is transformer insulated paint；Transformer insulated paint is existing material, at
This is cheap, easy to use.
Further, the one end of the bending part far from support portion is electrical contacts；Keep conducting probe structure simple, and
Electrical contacts occupied space for being electrically connected with equipment to be tested is minimum.
The utility model has the beneficial effects that: exposed by using the electric discharge of high-temperature insulation material package conducting probe
Conducting probe electric discharge is reduced at position；To reduce conducting probe electric discharge influence caused by use；Structure is simple, convenient for production,
Using reliable.
Detailed description of the invention
Fig. 1 is the utility model conducting probe structural schematic diagram.
Specific embodiment
For convenient for those skilled in the art understand that the technical solution of the utility model, below by the technical side of the utility model
Case is described in further detail in conjunction with specific embodiments.
As shown in Figure 1, a kind of conducting probe 100, including support portion 20 and bending part 30, the bending part 30 are to be connected to
Support portion 20 and the position that the pilot's electric probe 100 that shows a film uses can be generated, support portion 20 is for the installation with conducting probe 100
Seat connection；One end of the support portion 20 and bending part 30 are electrically connected, and the electric signal that the test of bending part 30 obtains passes through support portion
20 are transmitted to signal acquisition or processing module, and angle is β, β ∈ (90 °, 180 °) between the support portion 20 and bending part 30,
Guarantee that support portion 20 and bending part 30 form obtuse angle, to meet when using multiple conducting probes 100, adjacent conductive probe
100 are gradually reduced from support portion 20 to 30 distance of bending part, put so as to reduce the short distance between adjacent conductive probe 100
Electricity guarantees that test signal stabilization is reliable；The bending part 30 is enclosed with high-temperature insulation material, and high temperature does not limit specific herein
Temperature, just to illustrate the high-temperature insulation material used will not because the temperature caused by conduction of bending part 30 rise due to
It destroys, high temperature resistant is just to illustrating that the high-temperature insulation material can satisfy the temperature requirement of specific use occasion；To
Reduce the site that conducting probe 100 closely discharges, simultaneously as existing visit without the conductive of package high-temperature insulation material
Needle 100 may require that bending part 30 guarantees certain finish, using resistance to height to reduce closely electric discharge and/or point discharge
The technical solution of warm insulating materials can reduce the smoothness requirements of 100 bending part 30 of conducting probe, to reduce conducting probe
100 manufacture requirement, moreover, bending part 30 can fit in order to enhance high-temperature insulation material in the adhesive ability of bending part 30
When reduction finish；The bending part 30 includes electrical contacts 32, and the electrical contacts 32 with component to be tested for being electrically connected
It connects, the one end of the bending part 30 far from support portion 20 is electrical contacts 32；In use, only need to wrap up electrical contacts 32
High-temperature insulation material removal, to guarantee only exposed with the position of component to be tested electrical contact, reduction connectorless portion
The possibility that position is closely discharged；The electric discharge is not only the electric discharge between adjacent conductive probe 100, can also reduce conductive spy
The possibility that needle 100 and the conductive component of close contact discharge；The support portion 20 is provided with far from one end of bending part 30
Rotation prevention portion 40, the rotation prevention portion 40 and bending part 30 are in the same plane；The rotation prevention portion 40 is for additional conductive probe 100
Installation prevents conducting probe 100 from causing 30 change in location of bending part along the axis rotation of support portion 20 in use, influences institute
State the use of conducting probe 100；Certainly, the rotation prevention portion 40 may also be limited to other angles relative to support portion 20, also can
Enough prevent the rotation of support portion 20 from causing 30 change in location of bending part；It, will in order to reduce the processing request of 100 mounting base of conducting probe
Rotation prevention portion 40 be arranged to it is coplanar with bending part 30 can reduce manufacture difficulty, and reduce by 100 occupied space of conducting probe；It is described resistance to
High temperature insulating material is transformer insulated paint, and the material that transformer uses is exactly to prevent inside transformer from generating electricity to insulate
Vortex causes failure, and transformer itself is since conduction can cause temperature to rise, therefore the high-temperature insulation material energy that transformer uses
It is enough in the use occasion of the utility model, can not need to research and develop new high-temperature insulation material in this way based on the prior art,
Reduce cost.
As shown in Figure 1, a kind of application method of conducting probe, it is characterised in that:
S1: the one end of the bending part 30 far from support portion 20 is electrical contacts 32, and conducting probe 100 is connect electricity using preceding
The high temperature insulating material of contact portion 32 removes；
S2: the electrical contacts 32 and electrode to be tested for eliminating high temperature insulating material are in electrical contact；To guarantee only have electricity
Contact portion 32 is exposed in order to meet electrical connection demand, unavoidably discharges, except the bending part 30 of electrical contacts 32 is other
There is high-temperature insulation material barrier electric discharge at position, reduces the electric discharge of conducting probe 100, reduces because of the electric discharge pair of conducting probe 100
It is influenced caused by test；The sand paper of electrical contacts 32 is abraded into high-temperature insulation material, grinding using sand paper can be quick and precisely
Remove the high-temperature insulation material of electrical contacts 32.
As shown in Figure 1, in one conducting probe manufacturing method, by bending part 30 immerse liquid high-temperature insulation material；It will
Bending part is dried/is dried, and wraps up bending part 30 by high-temperature insulation material；Production method is simple, the high-temperature insulation material
Material uniformly can accurately be attached to bending part 30；Moreover, the producer can choose whether according to needs of production by support portion
20 all or part of immersion high-temperature insulation materials, thus the whole ability for improving conducting probe 100 and placing electric discharge.
As shown in Figure 1, a kind of method for reducing conducting probe electric discharge, wraps up high temperature resistant for the electric discharge of conducting probe 100 position
Insulating materials removes the high-temperature insulation material of conducting probe electrical contacts 32 when use；Guarantee conducting probe 100 only with
The position of electrode connection to be tested is exposed, and other positions are wrapped up by high-temperature insulation material；It is naked to reduce conducting probe 100
Reveal position close contact and influence test of discharging.
It is the preferred embodiment of the utility model above, is not used in the restriction protection scope of the utility model.It should approve,
Those skilled in the art made non-creative deformation and change after understanding technical solutions of the utility model, should also belong to
The protection of the utility model and scope of disclosure.
Claims (4)
1. a kind of conducting probe, including support portion and bending part, one end of the support portion and bending part electrical connection, feature exist
In: angle is β, β ∈ (90 °, 180 °) between the support portion and bending part；
The bending part is enclosed with high-temperature insulation material, and the bending part includes electrical contacts.
2. conducting probe according to claim 1, it is characterised in that: the support portion is provided with far from one end of bending part
Rotation prevention portion, the rotation prevention portion and bending part are in the same plane.
3. conducting probe according to claim 1, it is characterised in that: the high-temperature insulation material is transformer insulated
Paint.
4. conducting probe according to claim 1, it is characterised in that: the bending part connects far from one end of support portion for electricity
Contact portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821476490.2U CN209327410U (en) | 2018-09-11 | 2018-09-11 | A kind of conducting probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821476490.2U CN209327410U (en) | 2018-09-11 | 2018-09-11 | A kind of conducting probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209327410U true CN209327410U (en) | 2019-08-30 |
Family
ID=67706764
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821476490.2U Active CN209327410U (en) | 2018-09-11 | 2018-09-11 | A kind of conducting probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209327410U (en) |
-
2018
- 2018-09-11 CN CN201821476490.2U patent/CN209327410U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 518172 Longgang District, Shenzhen City, Guangdong Province Patentee after: Silicon electric semiconductor equipment (Shenzhen) Co., Ltd Address before: 518172 Longgang District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN SIDEA SEMICONDUCTOR EQUIPMENT Co.,Ltd. |
|
| CP01 | Change in the name or title of a patent holder |