CN209267546U - Automatically testing and the optoelectronic induction driving circuit trimmed - Google Patents

Automatically testing and the optoelectronic induction driving circuit trimmed Download PDF

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Publication number
CN209267546U
CN209267546U CN201920199681.7U CN201920199681U CN209267546U CN 209267546 U CN209267546 U CN 209267546U CN 201920199681 U CN201920199681 U CN 201920199681U CN 209267546 U CN209267546 U CN 209267546U
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China
Prior art keywords
unit
circuit
trim
trimmed
resistance
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Withdrawn - After Issue
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CN201920199681.7U
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Chinese (zh)
Inventor
林新春
郑凌波
朱敏
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SUZHOU LISHENGMEI SEMICONDUCTOR Co Ltd
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SUZHOU LISHENGMEI SEMICONDUCTOR Co Ltd
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Abstract

The utility model relates to a kind of automatically testings and the optoelectronic induction driving circuit trimmed, circuit includes optoelectronic transceiver circuit, trims circuit, on-line testing circuit, optoelectronic transceiver circuit includes the light emitting unit for accessing the first power supply and the light receiving unit for accessing second source, trim circuit include first connect with light emitting unit trim unit and connect with light receiving unit second trim unit, the transmission of on-line testing circuit trims signal of communication to trim unit to first, the second resistance value for trimming unit trims.It is connect by the way that light emitting unit is trimmed unit with first, light receiving unit is trimmed unit with second to connect, the resistance value of unit is trimmed by trimming first to determine emitted luminescence intensity, and second is trimmed according to emitted luminescence intensity and trims the resistance value of unit to determine the optical responsivity of light receiving unit, so that the voltage output signal of light receiving unit is more accurate, to guarantee that on-line testing circuit is more reliable to the processing result of voltage signal.

Description

Automatically testing and the optoelectronic induction driving circuit trimmed
Technical field
The utility model relates to a kind of automatically testings and the optoelectronic induction driving circuit trimmed.
Background technique
Optoelectronic induction system is widely used in life due to the features such as its is non-contact, response is fast, structure is simple.Light Electric induction system utilizes electrooptical device, and the electric signal of transmitting terminal variation is sent out in the form of light intensity variation luminescent device Out, then in receiving end photoelectric conversion is carried out, converts optical signal into electric signal, recently enters signal processing circuit.Optoelectronic induction The effect of system mainly detects and controls, and for Photoelectric Detection, the electric signal of variation is usually transformed into non electrical quantity, such as uses up Electric induction system makees velocity measuring, shape recognition etc.;It is for photo-electric control, then main to carry out circuit control using optical signal, such as Optoelectronic switch.
When transmitting module in optoelectronic induction system and the electrooptical device in receiving module fail co-ordination, light intensity Variation be difficult accurately to be extracted, the result of signal processing module also becomes unreliable.Especially multicast optoelectronic induction system System, if each phototransistor is different to the sensitivity of light intensity in receiving module, obtained electric signal just will appear larger difference It is different, it is therefore desirable to which that each opto-electronic device operation will be adjusted to while optimum state between photoelectric device in guarantee system Most matched working condition.
Utility model content
Be simple and convenient to operate the purpose of this utility model is to provide a kind of structure and can solve above-mentioned existing issue can The automatic optoelectronic induction driving circuit tested and trimmed.
In order to achieve the above objectives, the utility model provides the following technical solutions: a kind of automatically testing and the photoelectricity trimmed Incude driving circuit, the circuit includes optoelectronic transceiver circuit, with the optoelectronic transceiver circuit connection trims circuit, for connecting It connects the optoelectronic transceiver circuit and trims the on-line testing circuit of circuit, the optoelectronic transceiver circuit includes the first power supply of access Light emitting unit and the light receiving unit for accessing second source, the circuit that trims includes the connect with the light emitting unit One trim unit and connect with the light receiving unit second trim unit, the on-line testing circuit transmission trims communication letter Number to trim unit to described first, the second resistance value for trimming unit trims.
Further, the circuit that trims further includes and the on-line testing circuit connection and trims signal of communication for described Processing described first trims unit, second trims the logic unit of unit for control signal to control.
Further, the circuit that trims further includes connecting with the logic unit and for storing the control signal Storage unit.
Further, the light emitting unit includes luminescent device, and described first, which trims unit, includes the first adjustable driving The first end of resistance, the luminescent device accesses the first power supply, the second end of the luminescent device and the described first adjustable driving The first end of resistance connects, the second end ground connection of the first adjustable driving resistance, the control of the first adjustable driving resistance End is connect with the logic unit.
Further, the light receiving unit includes at least one light shutter device, and described second trims unit including at least The first end of one the second adjustable driving resistance, each light shutter device accesses second source, each light shutter device Second end is connect with the first end of each second adjustable driving resistance, the second end of each second adjustable driving resistance The control terminal of ground connection, each second adjustable driving resistance is connect with the logic unit.
Further, the circuit that trims further includes with the on-line testing circuit connection and for filtering clutter to guarantee The input signal of the on-line testing circuit is the RC filter unit of useful signal.
Further, the RC filter unit includes resistance and capacitor, the first end of the resistance and the optoelectronic transceiver Circuit connection, the second end of the resistance are connect with the first end of the capacitor, the second end ground connection of the capacitor.
The utility model has the beneficial effects that: being connect by the way that light emitting unit is trimmed unit with first, by light-receiving Unit trims unit with second and connect, and trims the resistance value of unit by trimming first to determine emitted luminescence intensity, and according to hair It penetrates luminous intensity and trims second and trim the resistance value of unit to determine the optical responsivity of light receiving unit, so that the electricity of light receiving unit Press output signal more accurate, to guarantee that on-line testing circuit is more reliable to the processing result of voltage signal.
The above description is merely an outline of the technical solution of the present invention, in order to better understand the skill of the utility model Art means, and can be implemented in accordance with the contents of the specification, below on the preferred embodiment of the present invention and the accompanying drawings in detail It describes in detail bright as after.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the automatically testing and the optoelectronic induction driving circuit trimmed of the utility model.
Fig. 2 is the circuit diagram of the automatically testing and the optoelectronic induction driving circuit trimmed of the utility model.
Fig. 3 is the automatically testing and the process of the design method of the optoelectronic induction driving circuit trimmed of the utility model Figure.
Specific embodiment
With reference to the accompanying drawings and examples, specific embodiment of the present utility model is described in further detail.Below Embodiment is not intended to limit the scope of the present invention for illustrating the utility model.
Referring to Figure 1 and Fig. 2, the automatically testing in a preferred embodiment of the utility model and the optoelectronic induction trimmed Driving circuit include optoelectronic transceiver circuit 2, connect with the optoelectronic transceiver circuit 2 trim circuit 3, for connecting the photoelectricity Transmission circuit 2 and the on-line testing circuit 1 for trimming circuit 3, the optoelectronic transceiver circuit 2 include the light emitting of the first power supply of access Unit 21 and the light receiving unit 22 for accessing second source, the circuit 3 that trims includes connecting with the light emitting unit 21 First trim unit 31 and connect with the light receiving unit 22 second trim unit 32, the on-line testing circuit 1 is sent Signal of communication is trimmed to trim unit 31 to described first, the second resistance value for trimming unit 32 trims.
It is described trim circuit 3 further include connect with the on-line testing circuit 1 and by it is described trim signal of communication processing be Control signal described first trims unit 31, second trims the logic unit 33 of unit 32 to control, and the circuit 3 that trims also wraps Include the storage unit 34 connecting with the logic unit 33 and for storing the control signal.In the present embodiment, described to patrol It collects unit 33 and the control signal is being stored in the storage while signal of communication processing is control signal by described trim In unit 34.Really, in other embodiments, the logic unit 33 can also trim signal of communication processing for described as control The control signal is stored in the storage unit 34 after signal.
The light emitting unit 21 includes luminescent device, and described first, which trims unit 31, includes the first adjustable driving resistance, The first end of the luminescent device accesses the first power supply VCC1, the second end of the luminescent device and the described first adjustable driving electricity The first end of resistance connects, the second end ground connection of the first adjustable driving resistance, the control terminal of the first adjustable driving resistance It is connect with the logic unit 33.In the present embodiment, the luminescent device is light emitting diode, really, in other embodiments In, the luminescent device can also be other, it is not limited here.The i.e. described light emitting unit 21 include light emitting diode D1 and with The first of the light emitting diode D1 connection is adjustable driving resistance R1.According to different applications, first adjustable resistance Also it can access the first power supply VCC1, i.e., the first end of described first adjustable resistance is connect with the first power supply VCC1, and described first can The second end of resistance is adjusted to connect with the luminescent device.
The light receiving unit 22 includes at least one light shutter device, described second trim unit 32 include at least one the Two adjustable driving resistance, the first end of each light shutter device access second source VCC2, and the of each light shutter device Two ends are connect with the first end of each second adjustable driving resistance, the second termination of each second adjustable driving resistance The control terminal on ground, each second adjustable driving resistance is connect with the logic unit 33.In the present embodiment, described light-operated The number of device is 3, then, the number of the second adjustable driving resistance is also 3.Meanwhile the light shutter device is light Electric transistor, really, in other embodiments, the light shutter device and the second adjustable driving resistance can also be other, herein not It limits.According to above-mentioned, the light shutter device T1 in the present embodiment is connect with the described second adjustable driving resistance R2;The light Control device T2 is connect with the described second adjustable driving resistance R3;The light shutter device T3 and with the described second adjustable driving resistance R4 Connection.In other embodiments, if light shutter device and the second adjustable driving resistance are other numbers, successively cis-position is numbered, This is not illustrated.According to different applications, second adjustable resistance also can access second source VCC2, i.e., described The first end of second adjustable resistance is connect with second source VCC2, the second end of first adjustable resistance and the light shutter device Connection.
It is described trim circuit 3 further include connect with the on-line testing circuit 1 and guarantee for filtering clutter it is described The input signal that line tests circuit 1 is the RC filter unit 35 of useful signal.In the present embodiment, the RC filter circuit output Voltage signal, the on-line testing circuit 1 is used to receive the voltage signal of the output of RC filter unit 35, and is believed according to the voltage Number the logic unit 33 is sent and to trim signal of communication accordingly.
The RC filter unit 35 is connect with the light receiving unit 22 comprising resistance and capacitor, the of the resistance One end is connect with the optoelectronic transceiver circuit 2, and the second end of the resistance is connect with the first end of the capacitor, the capacitor Second end ground connection.With it is above-mentioned corresponding, in the present embodiment, there are three the RC filter unit 35 settings.First RC filtering is single Member 35 includes resistance R5 and capacitor C1, second RC filter unit 35 include resistance R6 and capacitor C2, third RC filter unit 35 include resistance R7 and capacitor C3, and successively cis-position is numbered, and is not illustrated herein.
The embodiments of the present invention are connect by the way that light emitting unit 21 is trimmed unit 31 with first, by light receiving unit 22, which trim unit 32 with second, connect, and trims the resistance value of unit 31 by trimming first to determine emitted luminescence intensity, and according to Emitted luminescence intensity trims second and trims the resistance value of unit 32 to determine the optical responsivity of light receiving unit 22, so that light-receiving list The voltage output signal of member 22 is more accurate, to guarantee that on-line testing circuit 1 is more reliable to the processing result of voltage signal.
Incorporated by reference to Fig. 3, the utility model additionally provides a kind of automatically testing and the optoelectronic induction driving circuit that trims Design method, using automatically testing as described above and the optoelectronic induction driving circuit trimmed, the method includes walking as follows It is rapid:
Step 301, it trims first connect with light emitting unit 21 and trims the resistance value of unit 31 to determine transmitting light intensity Degree;
Step 302, according to the emitted luminescence intensity, unit 32 is trimmed to second connect with the light receiving unit 22 Resistance value is trimmed to determine optical responsivity.
Before formally trimming, the on-line testing circuit trims signal to trimming circuit and send in advance, described pre- to trim signal It can make all light shutter devices while to meet optical responsivity consistent;Then signal pair and the luminescent device pre- are trimmed according to this The first adjustable resistance, each in the light shutter device second it is adjustable driving resistance resistance value trimmed.
When formally trimming:
The on-line testing circuit 1 to it is described trim circuit 3 transmission trim signal of communication;
It is described trim circuit 3 receive it is described trim signal of communication and by the signal processing that trims for control signal;
The control signal function trims unit 31 in described first and second trims unit 32 and trim to described first Unit 31 and second trim unit 32 resistance value trimmed.Wherein, if described second trim it is second adjustable in unit 32 The number for driving resistance is two or more, trims the electricity with the second adjustable driving resistance in each light shutter device Resistance value is so that the optical responsivity of each light shutter device is consistent.It is worth noting that, needing adjustable to each second simultaneously The resistance value of driving resistance is trimmed, and is not trimmed successively.
More specifically, the on-line testing circuit 1 to it is described trim circuit 3 transmission trim signal of communication specifically:
The circuit 3 that trims is to the on-line testing circuit 1 transmission voltage signal;
The on-line testing circuit 1 receives the voltage signal and is to trim signal of communication by voltage signal processing.
In summary: being connect by the way that light emitting unit 21 is trimmed unit 31 with first, by light receiving unit 22 and second The connection of unit 32 is trimmed, trims the resistance value of unit 31 by trimming first to determine emitted luminescence intensity, and according to transmitting light intensity Degree trims second and trims the resistance value of unit 32 to determine the optical responsivity of light receiving unit 22, so that the electricity of light receiving unit 22 Press output signal more accurate, to guarantee that on-line testing circuit 1 is more reliable to the processing result of voltage signal.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited In contradiction, all should be considered as described in this specification.
Above-described embodiments merely represent several embodiments of the utility model, the description thereof is more specific and detailed, But it cannot be understood as the limitations to utility model patent range.It should be pointed out that for the common skill of this field For art personnel, without departing from the concept of the premise utility, various modifications and improvements can be made, these are belonged to The protection scope of the utility model.Therefore, the scope of protection shall be subject to the appended claims for the utility model patent.

Claims (7)

1. a kind of automatically testing and the optoelectronic induction driving circuit trimmed, which is characterized in that the circuit includes optoelectronic transceiver Circuit, with the optoelectronic transceiver circuit connection trim circuit, for connect the optoelectronic transceiver circuit and trim circuit Line tests circuit, and the optoelectronic transceiver circuit includes the light emitting unit for accessing the first power supply and the light-receiving for accessing second source Unit, the circuit that trims includes that first connect with the light emitting unit trims unit and connect with the light receiving unit Second trim unit, the on-line testing circuit transmission trims signal of communication to trim unit to described first, second trim The resistance value of unit is trimmed.
2. automatically testing as described in claim 1 and the optoelectronic induction driving circuit trimmed, which is characterized in that described to trim Circuit further includes that trim signal of communication processing described to control for control signal with the on-line testing circuit connection and by described First trims unit, second trims the logic unit of unit.
3. automatically testing as claimed in claim 2 and the optoelectronic induction driving circuit trimmed, which is characterized in that described to trim Circuit further includes connecting with the logic unit and for storing the storage unit for controlling signal.
4. automatically testing as claimed in claim 2 and the optoelectronic induction driving circuit trimmed, which is characterized in that the light hair Penetrating unit includes luminescent device, and described first, which trims unit, includes the first adjustable driving resistance, the first end of the luminescent device The first power supply is accessed, the second end of the luminescent device is connect with the first end of the described first adjustable driving resistance, and described first The control terminal of the second end ground connection of adjustable driving resistance, the first adjustable driving resistance is connect with the logic unit.
5. automatically testing as claimed in claim 2 and the optoelectronic induction driving circuit trimmed, which is characterized in that the light connects Receiving unit includes at least one light shutter device, and described second to trim unit include at least one second adjustable driving resistance, each The first end of the light shutter device accesses second source, and the second end of each light shutter device and each described second can transfer drive The first end connection of dynamic resistance, the second end ground connection of each second adjustable driving resistance, each second adjustable driving The control terminal of resistance is connect with the logic unit.
6. automatically testing as described in claim 1 and the optoelectronic induction driving circuit trimmed, which is characterized in that described to trim Circuit further includes believing with the on-line testing circuit connection and for filtering clutter with the input for guaranteeing the on-line testing circuit Number be useful signal RC filter unit.
7. automatically testing as claimed in claim 6 and the optoelectronic induction driving circuit trimmed, which is characterized in that the RC filter Wave unit includes resistance and capacitor, the first end of the resistance and the optoelectronic transceiver circuit connection, the second end of the resistance It is connect with the first end of the capacitor, the second end ground connection of the capacitor.
CN201920199681.7U 2019-02-14 2019-02-14 Automatically testing and the optoelectronic induction driving circuit trimmed Withdrawn - After Issue CN209267546U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920199681.7U CN209267546U (en) 2019-02-14 2019-02-14 Automatically testing and the optoelectronic induction driving circuit trimmed

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920199681.7U CN209267546U (en) 2019-02-14 2019-02-14 Automatically testing and the optoelectronic induction driving circuit trimmed

Publications (1)

Publication Number Publication Date
CN209267546U true CN209267546U (en) 2019-08-16

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201920199681.7U Withdrawn - After Issue CN209267546U (en) 2019-02-14 2019-02-14 Automatically testing and the optoelectronic induction driving circuit trimmed

Country Status (1)

Country Link
CN (1) CN209267546U (en)

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Granted publication date: 20190816

Effective date of abandoning: 20230926