CN209166779U - A kind of fixture of vibration-testing sample - Google Patents

A kind of fixture of vibration-testing sample Download PDF

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Publication number
CN209166779U
CN209166779U CN201822124147.8U CN201822124147U CN209166779U CN 209166779 U CN209166779 U CN 209166779U CN 201822124147 U CN201822124147 U CN 201822124147U CN 209166779 U CN209166779 U CN 209166779U
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China
Prior art keywords
microscope carrier
test
test microscope
vibration
bottom board
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Active
Application number
CN201822124147.8U
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Chinese (zh)
Inventor
顾越
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Huaxin testing (Wuxi) Co.,Ltd.
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National Center for Advanced Packaging Co Ltd
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Priority to CN201822124147.8U priority Critical patent/CN209166779U/en
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Abstract

The utility model discloses a kind of fixtures of vibration-testing sample characterized by comprising clamp bottom board;The multiple test microscope carriers being fixed on the clamp bottom board, each test microscope carrier have identical or different measurement direction.

Description

A kind of fixture of vibration-testing sample
Technical field
The utility model relates to packaging and testing technical fields.Specifically, the utility model relates to a kind of vibration-testing samples The fixture of product.
Background technique
Semiconductor integrated circuit chip or sensor chip are after finalization of the manufacture, it usually needs each class testing is carried out, so as to Whether proofing chip can work normally, and obtain the information such as technology stability and device consistency.
Certain chips need work in vibration environment, for example, the sensor chip of engine.For this kind of chip, need Product reliability and failure verifying are carried out by vibration-testing, so that it is guaranteed that the quality of the product.
Existing chip vibration-testing apparatus carries out unidirectional test to chip to be tested every time.However, chip is practical Working environment it is complicated, all there may be vibrations in each direction.In order to more fully assess the reliability of chip, need along more A direction carries out multiple test to chip to be tested.This causes chip testing efficiency low.
Therefore, this field needs a kind of structures and methods that can be improved sample test efficiency.
Utility model content
Aiming at the problems existing in the prior art, one aspect according to the present utility model provides a kind of vibration-testing sample The fixture of product characterized by comprising
Clamp bottom board;
The multiple test microscope carriers being fixed on the clamp bottom board, each test microscope carrier have identical or different test side To.
In one embodiment of the utility model, the clamp bottom board is plate rectangular parallelepiped structure, the clamp bottom board Front and back area be greater than side area, the back side of the clamp bottom board is contacted with board equipment.
In one embodiment of the utility model, the clamp bottom board has the one or more across back or front Fixation hole.
In one embodiment of the utility model, the multiple test microscope carrier includes the test microscope carrier of first direction, the The test of the test microscope carrier of the test microscope carrier and third direction in two directions, the test microscope carrier, second direction of the first direction carries The test microscope carrier of platform and third direction is plate rectangular parallelepiped structure, the test of the test microscope carrier, second direction of the first direction The area of the front and back of the test microscope carrier of microscope carrier and third direction is greater than the area of side, the test microscope carrier of first direction and The front of the test microscope carrier of second direction is intersected with the front vertical of clamp bottom board respectively, the test microscope carrier of first direction and second The front vertical intersection of the test microscope carrier in direction, the fixed test microscope carrier and second in a first direction of test microscope carrier of third direction The top of the test microscope carrier in direction, the test microscope carrier of first direction, the front of the test microscope carrier of second direction and third direction The front of test microscope carrier is mutually perpendicular to.
In one embodiment of the utility model, the multiple test microscope carrier includes the test microscope carrier of first direction, the One or more mounting holes are respectively provided on the front of the test microscope carrier of the test microscope carrier and third direction in two directions.
In one embodiment of the utility model, sample is fixed on microscope carrier by mounting hole.
In one embodiment of the utility model, the multiple test microscope carrier includes the test microscope carrier of first direction, the The test microscope carrier for testing microscope carrier, fourth direction for testing microscope carrier, third direction in two directions, the test of the first direction carry Platform, the test microscope carrier of second direction, the test microscope carrier of third direction and the test microscope carrier of fourth direction are plate rectangular parallelepiped structures, The face of the front and back of the test microscope carrier of the test microscope carrier of the first direction, the test microscope carrier of second direction and third direction Product is greater than the area of side, the test microscope carrier of first direction, the test microscope carrier of second direction, the test microscope carrier of third direction, the The measurement direction of the test microscope carrier in four directions is different.
The embodiment of the utility model can realize that more samples of homologous series are located at multiple directions while carrying out vibration-testing, be not necessarily to One direction three times is carried out to the series of samples to test;It realizes batch samples operation simultaneously, improves operating efficiency;By sample and Fixture is fixedly secured on equipment platform pedestal, substantially reduces the risk of fixture itself shaking, is reduced detection device and is tied to experiment The influence of fruit uncertainty.
Detailed description of the invention
In order to further elucidate the utility model each embodiment the above and other advantages and features, will with reference to attached drawing come The more specific description of each embodiment of the utility model is presented.It is appreciated that these attached drawings only describe the allusion quotation of the utility model Type embodiment, therefore be not to be regarded as being restriction on its scope.In the accompanying drawings, in order to cheer and bright, identical or corresponding portion Part will be indicated with same or similar label.
Fig. 1 shows the stereoscopic schematic diagram of the vibration-testing sample clamp of one embodiment according to the present utility model.
Fig. 2 shows the stereoscopic schematic diagrams of the vibration-testing sample clamp 200 of another embodiment according to the present utility model.
Specific embodiment
In the following description, the utility model is described with reference to each embodiment.However, those skilled in the art Will be recognized can in the case where none or multiple specific details or with other replacements and/or addition method, material or Component implements each embodiment together.In other situations, be not shown or be not described in detail well known structure, material or operation in order to avoid Keep the aspects of each embodiment of the utility model obscure.Similarly, for purposes of explanation, specific quantity, material are elaborated And configuration, in order to provide the comprehensive understanding to the embodiments of the present invention.However, the utility model can be in no specific detail In the case where implement.Further, it should be understood that each embodiment shown in the accompanying drawings is illustrative expression and is not drawn necessarily to scale.
In the present specification, the reference of " one embodiment " or " embodiment " is meaned to combine embodiment description A particular feature, structure, or characteristic is included at least one embodiment of the utility model.Occur in everywhere in this specification The phrase " in one embodiment " be not necessarily all referring to the same embodiment.
In the description of the present application, it is to be understood that term " center ", " longitudinal direction ", " transverse direction ", "upper", "lower", The orientation or positional relationship of the instructions such as "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside" is It is based on the orientation or positional relationship shown in the drawings, is merely for convenience of describing the present invention and simplifying the description, rather than express Or imply that signified device or element must have a particular orientation, be constructed and operated in a specific orientation, therefore cannot understand For limitations of the present invention.In addition, term " first ", " second " are used for description purposes only, and should not be understood as expressing or Imply relative importance.
Aiming at the problem that prior art vibration-testing inefficiency, the utility model provides a kind of vibration-testing specimen holder Tool, which has the sample stage of multiple directions, it can be achieved that more samples of homologous series are vibrated when multiple directions are same as above Test, without carrying out multiple one direction test to the series of samples;The fixture scheme has large scale microscope carrier, it can be achieved that big simultaneously Batch sample operation simultaneously, improves operating efficiency;By increasing clamp base and board equipment contact area, increase fixed spiral shell Sample and fixture can be fixedly secured on equipment platform pedestal by hole, to substantially reduce sample and fixture in operation process In the risk itself shaken, reduce influence of the test process to test result uncertainty.Final achievable high-volume is multi-direction The vibration-testing platform structure for stablizing operation simultaneously, improves work efficiency, ingenious in design, simple for structure, is simple to manufacture, and uses It is convenient, it is at low cost, it is suitable for large-scale promotion application.
Fig. 1 shows the stereoscopic schematic diagram of the vibration-testing sample clamp 100 of one embodiment according to the present utility model.Such as Shown in Fig. 1,100 main body of vibration-testing sample clamp includes the test microscope carrier 110, the test microscope carrier 120 of Y-direction, the side Z of X-direction To test microscope carrier 130 and clamp bottom board 140.Clamp bottom board 140 can be the plate rectangular parallelepiped structure of specific thicknesses, length Thickness is noticeably greater than with width.That is, the area of the front and back of clamp bottom board 140 is noticeably greater than the area of side.Fixture bottom The back side of plate 140 is contacted with board equipment, can improve the steady of fixture by increasing the contact area of clamp bottom board 140 and board It is qualitative.Clamp bottom board 140 has one or more fixation holes 141 across back or front.Pass through one or more fixation holes 141 are fixedly secured vibration-testing sample clamp 100 and sample on equipment platform pedestal.
The test microscope carrier 110 of X-direction and the test microscope carrier 120 of Y-direction are vertically fixed on clamp bottom board 140.X-direction Test microscope carrier 110 and the test microscope carrier 120 of Y-direction can be the plate rectangular parallelepiped structure of specific thicknesses, and length and width is aobvious It writes and is greater than thickness.That is, the area of the front and back of test microscope carrier 110 and 120 is noticeably greater than the area of side.The survey of X-direction The front of examination microscope carrier 110 and the test microscope carrier 120 of Y-direction is intersected with the front vertical of clamp bottom board 140 respectively.The survey of X-direction Try the front vertical intersection of the test microscope carrier 120 of microscope carrier 110 and Y-direction.During the test, microscope carrier 110 and 120 is being tested just Face is for placing sample to be tested.
The test microscope carrier 130 of Z-direction is fixed on the test microscope carrier 110 of X-direction and the test microscope carrier 120 of Y-direction.Z The test microscope carrier 130 in direction can be the plate rectangular parallelepiped structure of specific thicknesses, and length and width is noticeably greater than thickness.Survey The area for trying the front and back of microscope carrier 130 is noticeably greater than the area of side.The test microscope carrier 130 and clamp bottom board 140 of Z-direction In parallel.Therefore, the front of the test microscope carrier of the test microscope carrier 110 of X-direction, the front of the test microscope carrier 120 of Y-direction and Z-direction It can be mutually perpendicular to.The test microscope carrier 130 of the test microscope carrier 110 of X-direction, the top surface of the test microscope carrier 120 of Y-direction and Z-direction Two adjacent side intersections.During the test, the front of microscope carrier 130 is tested for placing sample to be tested.
It is respectively included on the test microscope carrier 110 of X-direction, the test microscope carrier 120 of Y-direction and the test microscope carrier 130 of Z-direction more A mounting hole 111,121 and 131 for passing through front or the back side.Sample can be fixed on microscope carrier by mounting hole.
It sees on the whole, vibration-testing sample clamp 100 is rectangular box body structure.The survey of clamp bottom board 140 and Z-direction The top and bottom that microscope carrier 130 is rectangular box body are tried, the test microscope carrier 110 of X-direction and the test microscope carrier 120 of Y-direction are length Two adjacent walls of cube cabinet.Other two side wall of rectangular box body lacks, and reserves manual operation space, convenient for surveying The installation and dismounting of test agent.
In the embodiments of the present invention, sample to be tested can be semiconductor integrated circuit chip or sensor core Piece, but the protection scope of the utility model is not limited thereto.In the other embodiments of the utility model, sample to be tested can be with It is all kinds of devices, device and equipment.
It is same to realize that more samples of homologous series are located at tri- directions X, Y, Z by vibration-testing sample clamp 100 shown in FIG. 1 Shi Jinhang vibration-testing is tested without carrying out one direction three times to the series of samples.It realizes batch samples operation simultaneously, improves Operating efficiency.Sample and fixture are fixedly secured on equipment platform pedestal, the risk of fixture itself shaking is substantially reduced, subtracts Few influence of the detection device to experimental result uncertainty.
Fig. 2 shows the stereoscopic schematic diagrams of the vibration-testing sample clamp 200 of another embodiment according to the present utility model. As shown in Fig. 2, 200 main body of vibration-testing sample clamp includes the test microscope carrier of the test microscope carrier 210 of first direction, second direction 220, the test microscope carrier 230 of third direction, fourth direction test microscope carrier 240 and clamp bottom board 250.It is surveyed with vibration shown in FIG. 1 Test agent fixture is similar, the test microscope carrier for testing microscope carrier 210, the test microscope carrier 220 of second direction, third direction of first direction 230, fourth direction test microscope carrier 240 and clamp bottom board 250 can be the plate rectangular parallelepiped structure of specific thicknesses, length and width Degree is noticeably greater than thickness.That is, the area of the front and back of plate rectangular parallelepiped structure is noticeably greater than the area of side.
The back side of clamp bottom board 250 is contacted with board equipment, can pass through the contact area of increase clamp bottom board 250 and board To improve the stability of fixture.Clamp bottom board 250 has one or more fixation hole (not shown) across back or front.It is logical It crosses one or more fixation holes vibration-testing sample clamp 200 and sample are fixedly secured on equipment platform pedestal.
The test microscope carrier of test microscope carrier to the third direction of first direction is vertically fixed on clamp bottom board 250.And the Intersect a side for testing microscope carrier for the test microscope carrier in one direction to third direction.During the test, microscope carrier is tested just Face is for placing sample to be tested.The survey of the test microscope carrier 210, the test microscope carrier 220, third direction of second direction of first direction Trying microscope carrier 230 and fourth direction test microscope carrier 240 has mounting hole, is not shown in the figure.
The test microscope carrier 240 of fourth direction is similar with the test microscope carrier of Z-direction shown in FIG. 1.
The structural representation of both examples above introduction shows the structure of the vibration-testing sample clamp of the utility model. In the other embodiments of the utility model, vibration-testing sample clamp may include that test sample more or less carries Platform.Each test microscope carrier can have identical or different measurement direction.
Although described above is each embodiments of the utility model, however, it is to be understood that they are intended only as example to be in Existing, and without limitation.For those skilled in the relevant art it is readily apparent that various combinations, change can be made to it Type and the spirit and scope changed without departing from the utility model.Therefore, the width and model of the utility model disclosed herein Enclosing should not be limited by above-mentioned disclosed exemplary embodiment, and should be according only to the appended claims and its equivalent replacement To define.

Claims (4)

1. a kind of fixture of vibration-testing sample characterized by comprising
Clamp bottom board;
The multiple test microscope carriers being fixed on the clamp bottom board, each test microscope carrier have identical or different measurement direction,
The clamp bottom board is plate rectangular parallelepiped structure, and the area of the front and back of the clamp bottom board is greater than the face of side Product, the back side of the clamp bottom board contacts with board equipment, the multiple to test test microscope carrier that microscope carrier includes first direction, the The test of the test microscope carrier of the test microscope carrier and third direction in two directions, the test microscope carrier, second direction of the first direction carries The test microscope carrier of platform and third direction is plate rectangular parallelepiped structure, the test of the test microscope carrier, second direction of the first direction The area of the front and back of the test microscope carrier of microscope carrier and third direction is greater than the area of side, the test microscope carrier of first direction and The front of the test microscope carrier of second direction is intersected with the front vertical of clamp bottom board respectively, the test microscope carrier of first direction and second The front vertical intersection of the test microscope carrier in direction, the fixed test microscope carrier and second in a first direction of test microscope carrier of third direction The top of the test microscope carrier in direction, the test microscope carrier of first direction, the front of the test microscope carrier of second direction and third direction The front of test microscope carrier is mutually perpendicular to.
2. the fixture of vibration-testing sample as described in claim 1, which is characterized in that the clamp bottom board has across the back side Or positive one or more fixation holes.
3. the fixture of vibration-testing sample as described in claim 1, which is characterized in that the multiple test microscope carrier includes first One or more is respectively provided on the front of the test microscope carrier of the test microscope carrier in direction, the test microscope carrier of second direction and third direction A mounting hole.
4. the fixture of vibration-testing sample as claimed in claim 3, which is characterized in that sample is fixed on microscope carrier by mounting hole On.
CN201822124147.8U 2018-12-18 2018-12-18 A kind of fixture of vibration-testing sample Active CN209166779U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201822124147.8U CN209166779U (en) 2018-12-18 2018-12-18 A kind of fixture of vibration-testing sample

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201822124147.8U CN209166779U (en) 2018-12-18 2018-12-18 A kind of fixture of vibration-testing sample

Publications (1)

Publication Number Publication Date
CN209166779U true CN209166779U (en) 2019-07-26

Family

ID=67344029

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201822124147.8U Active CN209166779U (en) 2018-12-18 2018-12-18 A kind of fixture of vibration-testing sample

Country Status (1)

Country Link
CN (1) CN209166779U (en)

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GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20201218

Address after: 214235 3rd floor, building D1, International Innovation Park, 200 Linghu Avenue, Xinwu District, Wuxi City, Jiangsu Province

Patentee after: Huaxin testing (Wuxi) Co.,Ltd.

Address before: 214028 building D1, China Sensor Network International Innovation Park, No. 200, Linghu Avenue, New District, Wuxi City, Jiangsu Province

Patentee before: National Center for Advanced Packaging Co.,Ltd.