CN209149288U - Malfunction test card and server - Google Patents
Malfunction test card and server Download PDFInfo
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- CN209149288U CN209149288U CN201822017392.9U CN201822017392U CN209149288U CN 209149288 U CN209149288 U CN 209149288U CN 201822017392 U CN201822017392 U CN 201822017392U CN 209149288 U CN209149288 U CN 209149288U
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- connecting portion
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- test card
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Abstract
The utility model relates to a kind of malfunction test card and server, malfunction test card includes the first connecting portion of ontology and setting on the body；The DEBUG display unit connecting with first connecting portion is provided on ontology, first connecting portion is used to be detachably connected on the cabinet of server, so that the hardware identification code of DEBUG display unit display server.Server provided by the utility model includes cabinet, mainboard and barrier test chart；Mainboard setting is formed with opening in cabinet, on cabinet, the second connector connecting with mainboard is equipped in opening, the second connector includes the third interconnecting piece for being detachably connected with first connecting portion.Malfunction test card and server provided by the utility model can directly observe the hardware identification code on DEBUG display unit outside cabinet, find that failure influences in time, and malfunction elimination is high-efficient, and without dismantling cabinet, easy to operate.
Description
Technical field
This application involves data processing equipment technical fields, such as are related to a kind of malfunction test card and server.
Background technique
Server is widely used in industrial production as common data processing equipment.Once the operation of server
Failure will seriously affect production efficiency, therefore, how to find the failure cause of server in time, be increasingly becoming research
Hot spot.
Currently, server includes cabinet and the mainboard that is arranged in cabinet, error correction (DEBUG) display is provided on mainboard
Component, in start process, DEBUG display unit can be with viewing hardware code, when the failure of a certain hardware leads to server
When can not start, DEBUG display unit can show the hardware identification code of the hardware, arrive faulty hardware to be accurately positioned, just
In the investigation and cleaning of failure.
But when server can not start, need to check cabinet opening the hardware of DEBUG display unit on mainboard
Code, complicated for operation, efficiency is lower.
Utility model content
The embodiment of the present disclosure provides a kind of malfunction test card and server, to solve to check that the operation of DEBUG display unit is multiple
Miscellaneous and lower efficiency problem.
The embodiment of the present disclosure provides a kind of malfunction test card, comprising: ontology and setting on the body first
Interconnecting piece；The DEBUG display unit connecting with the first connecting portion is provided on the ontology, the first connecting portion is used for
It is detachably connected on the cabinet of server, so that the DEBUG display unit shows the hardware identification code of the server.
Malfunction test card as described above, wherein the DEBUG display unit includes multiple LED light arranged in a matrix
Pearl.
Malfunction test card as described above, wherein the DEBUG display unit includes the display surface for showing number
Plate.
Malfunction test card as described above, wherein the scalable setting of first connecting portion is on the body.
Malfunction test card as described above, wherein the malfunction test card further includes for being detachably connected on the machine
Second connecting portion on case, the ontology further include the functional switch connecting with the second connecting portion, and the functional switch is used
Signal switching is carried out in the mainboard to the server.
Malfunction test card as described above, wherein the quantity of the functional switch be it is multiple, multiple functional switches are at matrix
Arrangement is on the body.
Malfunction test card as described above, wherein the functional switch includes jump cap switch and/or slide switch.
Malfunction test card as described above, wherein the functional switch includes that BMC firmware is forced to update switch, and BIOS is extensive
Multiple switch, BIOS default switch and clearing password switch.
Malfunction test card as described above, wherein the scalable setting of second connecting portion is on the body.
Malfunction test card as described above, wherein the first connecting portion and the second connecting portion are integrated in one the
On a connector.
The embodiment of the present disclosure provides a kind of server, including cabinet, mainboard and malfunction test card；The mainboard setting exists
In the cabinet, it is formed with opening on the cabinet, the second connector connecting with the mainboard, institute are installed in the opening
Stating the second connector includes the third interconnecting piece for being detachably connected with the first connecting portion.
Server as described above, wherein the first connecting portion includes connecting line, and the third interconnecting piece includes bullet
Piece, the first connecting portion are inserted into the third interconnecting piece, so that the elastic slice compresses the connecting line.
Server as described above, wherein the cabinet is additionally provided with cover board, and the cover board detachable cover is located at described
Outside two connectors.
Server as described above, wherein described cover board one end is hinged on the cabinet, the other end card of the cover board
It closes on the cabinet.
The malfunction test card and server that the embodiment of the present disclosure provides pass through setting ontology and first connecting portion；Ontology
On be provided with the DEBUG display unit connecting with first connecting portion, first connecting portion is used to be detachably connected on the machine of server
On case, so that the hardware identification code of DEBUG display unit display server can be by malfunction test card when needing malfunction test
It is installed on the cabinet of server, so as to directly observe the hardware identification code on DEBUG display unit outside cabinet, in time
It was found that failure influences, malfunction elimination is high-efficient, and without dismantling cabinet, easy to operate.
Detailed description of the invention
One or more embodiments are illustrated by corresponding attached drawing, these exemplary illustrations and attached drawing
The restriction to embodiment is not constituted, the element with same reference numbers label is shown as similar element in attached drawing, and attached drawing is not
Composition limitation, and wherein:
Fig. 1 is the structural schematic diagram of server in the embodiment of the present disclosure；
Fig. 2 is that the structural schematic diagram after cover board is removed in Fig. 1；
Fig. 3 is the structural schematic diagram of the second connector in Fig. 2；
Fig. 4 is the structural schematic diagram of malfunction test card in the embodiment of the present disclosure.
Description of symbols:
100: malfunction test card；
110: ontology；
120: first connecting portion；
130:DEBUG display unit；
131:LED lamp bead；
140: second connecting portion；
141: connecting line；
150: functional switch；
160: the first connectors；
200: cabinet；
210: the second connectors；
211: third interconnecting piece；
212: the four interconnecting pieces；
212: elastic slice；
220: cover board.
Specific embodiment
The characteristics of in order to more fully hereinafter understand the embodiment of the present disclosure and technology contents, with reference to the accompanying drawing to this public affairs
The realization for opening embodiment is described in detail, appended attached drawing purposes of discussion only for reference, is not used to limit the embodiment of the present disclosure.
In technical description below, for convenience of explanation for the sake of, disclosed embodiment is fully understood with providing by multiple details.
However, one or more embodiments still can be implemented in the case where without these details.It in other cases, is simplification
Attached drawing, well known construction and device can simplify displaying.
Fig. 1 is the structural schematic diagram of server in the embodiment of the present disclosure；Fig. 2 is that the structural representation after cover board is removed in Fig. 1
Figure；Fig. 3 is the structural schematic diagram of the second connector in Fig. 2；Fig. 4 is the structural representation of malfunction test card in the embodiment of the present disclosure
Figure.
Please refer to figs. 1 to 4, and the embodiment of the present disclosure provides a kind of malfunction test card 100, comprising: ontology 110 and sets
Set the first connecting portion 120 on ontology 110；The DEBUG display unit connecting with first connecting portion 120 is provided on ontology 110
Part 130, first connecting portion 120 are used to be detachably connected on the cabinet 200 of server, so that DEBUG display unit 130 is shown
The hardware identification code of server.
Specifically, malfunction test card 100 can be used for carrying out error correction and malfunction elimination to server.Malfunction test card 100
It may include ontology 110 and first connecting portion 120.
Ontology 110 can be plate-like body, shape can there are many, such as round, rectangular etc..The material of ontology 110
Can also there are many, such as plastics, metal etc. be a variety of, is not specifically limited herein.
First connecting portion 120 is arranged on ontology 110, and first connecting portion 120 can be detachably connected with cabinet 200,
Removably can be configured as the case may be, for example, first connecting portion 120 can be connection-peg, it can on cabinet 200
To be provided with the plug socket engaged with connection-peg.Or first connecting portion 120 may include screw, can set on cabinet 200
It is equipped with threaded hole, screw can be screwed on threaded hole, to realize being detachably connected for cabinet 200 and malfunction test card 100.
DEBUG display unit 130 can be set on ontology 110, DEBUG display unit 130 is displayed for servicing
The hardware identification code of device, DEBUG display unit 130 can be connect with first connecting portion 120, such as first connecting portion 120 can be with
The electrical connection of display unit 130 or communication connection, can be with server after first connecting portion 120 is connected on cabinet 200
Mainboard connection, to obtain the hardware identification code of the hardware run in cabinet 200, and transmitted and shown and shown in DEBUG
On component 130.
The type of DEBUG display unit 130 can there are many, for example, DEBUG display unit 130 may include display surface
Plate, display panel can be liquid crystal display panel, can show the number of fault code thereon or display panel may include
LED numerical digit pipe, LED numerical digit pipe can show fault code, and staff can be visually observed that hardware identification code, malfunction elimination
It is more quick.
In addition, DEBUG display unit 130 includes multiple LED lamp beads 131 arranged in a matrix, to use binary representation
Hardware identification code.When LED lamp bead 131 is bright, binary one can be represented, when LED lamp bead 131 is gone out, Binary Zero can be represented, pass through by
The binary code that multiple LED lamp beads 131 form, which is scaled hexadecimal digit, can accurately obtain hardware identification code, which at
This is low.
Preferably, LED lamp bead 131 may include 8, with the arrangement of two column, four row.
When malfunction test, the first connecting portion 120 of malfunction test card 100 can be connected on cabinet 200, then be observed
The hardware identification code that DEBUG display unit 130 on malfunction test card 100 is shown, when DEBUG display unit 130 rest on it is a certain
When stationary digital, it may be considered that hardware representated by the hardware identification code breaks down.It, can be by event after server troubleshooting
The first connecting portion 120 of barrier test chart 100 is disassembled from cabinet 200, avoids the volume for occupying server.
The malfunction test card that the embodiment of the present disclosure provides passes through setting ontology and first connecting portion；It is provided on ontology
The DEBUG display unit connecting with first connecting portion, first connecting portion are used to be detachably connected on the cabinet of server, so that
The hardware identification code of DEBUG display unit display server can the service of being installed to by malfunction test card when needing malfunction test
On the cabinet of device, so as to directly observe the hardware identification code on DEBUG display unit outside cabinet, failure shadow is found in time
It rings, malfunction elimination is high-efficient, and without dismantling cabinet, easy to operate.
In another preferred embodiment, first connecting portion 120 is scalable to be arranged on ontology 110.
Specifically, sliding slot or sliding rail can be set on ontology 110, first connecting portion 120 can pass through sliding slot or sliding rail
It is slided on ontology 110, it, can be sliding by first connecting portion 120 when needing for malfunction test card 100 to be connected on cabinet 200
The position for protruding from ontology 110 is moved, when not using malfunction test card 100, first connecting portion 120 can be slided into ontology
In 110, or on the position Chong Die with ontology 110, it is worn so as to avoid first connecting portion 120 from being exposed to outside ontology 110
Or it destroys.
On the basis of the above embodiments, malfunction test card 100 further includes for being detachably connected on the cabinet 200
Second connecting portion 140, ontology 110 further includes the functional switch 150 connecting with second connecting portion 140, and functional switch 150 is used for
Signal switching is carried out to the mainboard of server.
Specifically, second connecting portion 140 can also be detachably connected on cabinet 200, second connecting portion 140 and cabinet
200 detachable connection method and first connecting portion 120 and the detachable connection method of cabinet 200 are same or similar, specifically may be used
To refer to first connecting portion 120, details are not described herein.
Functional switch 150 is connect with second connecting portion 140, for example, both can be connected by conducting wire or circuit board, when the
When two interconnecting pieces 140 are connected on cabinet 200, functional switch 150 can be connect by cabinet 200 with the mainboard in cabinet 200,
Signal switching is carried out to mainboard to convenient, without opening cabinet 200, is operated more convenient.
In addition, the same side of ontology 110 can be arranged in second connecting portion 140 with first connecting portion 120, thus convenient same
When use DEBUG display unit 130 and functional switch 150.
Preferably, second connecting portion 140 is scalable is arranged on ontology 110.Sliding slot or cunning can be set on ontology 110
Rail, second connecting portion 140 can be slided on ontology 110 by sliding slot or sliding rail, when needing to be connected to malfunction test card 100
When on cabinet 200, second connecting portion 140 can be slided into the position for protruding from ontology 110, when without using malfunction test card
When 100, second connecting portion 140 can be slided into ontology 110, or on the position Chong Die with ontology 110, so as to avoid
Second connecting portion 140 is exposed to outside ontology 110 and is worn or destroys.
It is appreciated that first connecting portion 120 can be slided into protrusion originally when needing using DEBUG display unit 130
Outside body 110, second connecting portion 140 can be located in ontology 110.It, can be by the second connection when needing using functional switch 150
Portion 140 slides into outside protrusion ontology 110, and first connecting portion 120 can be located in ontology 110, to improve first connecting portion 120
With the service life of second connecting portion 140.
Certainly, first connecting portion 120 and second connecting portion 140 can integrate on first connector 160, and first connects
Ontology 110 can be fixed or be slidably arranged in by connecing device 160, and when malfunction test card 100 to be connected on cabinet 200, first connects
Connecing device 160 can integrally connect with cabinet 200, easy to operate.
Further, the quantity of functional switch 150 is multiple, and multiple functional switches 150 are arranged in a matrix in ontology 100
On, so as to carry out multi-mode operation to mainboard.
Preferably, functional switch 150 include BMC firmware force update switch, BIOS restore switch, BIOS default switch and
Clearing password switch, so as to control outside cabinet 200 mainboard inside cabinet 200, to realize that BMC firmware is strong
System updates, BIOS restores, BIOS defaults and the common operations such as password understands, without opening cabinet 200, operation is more convenient, mentions
The efficiency of high troubleshooting.
Further, the type of functional switch 150 can there are many, such as functional switch 150 may include jump cap switch
And/or slide switch.I.e. functional switch 150 can be switched all for jump cap, or all be opened for slide switch or partial function
It closes 150 to switch for jump cap, another part functional switch 150 is slide switch, can be specifically configured according to the actual situation.
The embodiment of the present disclosure also provides a kind of server, including cabinet 200, mainboard and malfunction test card 100；Failure tune
Examination card 100 includes: ontology 110 and the first connecting portion being arranged on ontology 110 120；It is provided on ontology 110 and connects with first
The DEBUG display unit 130 that socket part 120 connects, first connecting portion 120 are used to be detachably connected on the cabinet 200 of server,
So that the hardware identification code of 130 display server of DEBUG display unit.Mainboard is arranged in cabinet 200, is formed on cabinet 200
It is open, the second connector 210 connecting with the mainboard is installed in opening, the second connector 210 includes for connecting with first
The third interconnecting piece 211 that socket part 120 is detachably connected.
Specifically, cabinet 200 can be body structure common in the art, and mainboard can be set in cabinet 200,
Chip there are many can be set on mainboard.Opening is formed on cabinet 200, the second connector 210 can engage or be fixed on out
At mouthful, the second connector 210 may include third interconnecting piece 211, and third interconnecting piece 211 can pass through conducting wire or circuit board and master
Plate connection, so as to control mainboard, or from mainboard go out obtain information.
It is appreciated that the second connector 210 may include multiple portions, and third interconnecting piece 211 is thereon only with first
The part that interconnecting piece 120 connects, in addition to this, the second connector 210 further include the clamping portion with opening connection, or fix the
The fixed part etc. of three interconnecting pieces 211.For example, the second connector 210 can be plate structure, edge could be formed with and be open
The clamping portion of engaging, third interconnecting piece 211 can be the connection-peg that the second connector 210 is arranged in or connecting terminal etc. and specifically tie
Structure, first connecting portion 120 can cooperate realization to be detachably connected with third interconnecting piece 211.
Malfunction test card 100 is detachably connected with cabinet 200, can pass through first connecting portion 120 and third interconnecting piece
211 are detachably connected to realize, such as first connecting portion 120 may include contact pin, and third interconnecting piece 211 may include and institute
DEBUG display unit may be implemented after first connecting portion 120 and the connection of third interconnecting piece 211 in the slot for stating contact pin engaging
130 with the connection of mainboard, to obtain hardware identification code.
Preferably, first connecting portion 120 includes connecting line 141, and third interconnecting piece 211 includes elastic slice 212, first connecting portion
120 are inserted into third interconnecting piece 211, so that elastic slice 212 compresses connecting line 141, ensure that first connecting portion 120 and third
The connection reliability of interconnecting piece 211.
In addition, the second connector 210 can also include the 4th interconnecting piece 212, the 4th interconnecting piece 212 can also connect with mainboard
It connects, the 4th interconnecting piece 212 can be detachably connected with second connecting portion 140, to realize the company of functional switch 150 Yu mainboard
It connects, specifically connection type can refer to the connection of DEBUG display unit 130 and mainboard.
When malfunction test, the first connecting portion 120 of malfunction test card 100 can be connected on cabinet 200, then be observed
The hardware identification code that DEBUG display unit 130 on malfunction test card 100 is shown, when DEBUG display unit 130 rest on it is a certain
When stationary digital, it may be considered that hardware representated by the hardware identification code breaks down.It, can be by event after server troubleshooting
The first connecting portion 120 of barrier test chart 100 is disassembled from cabinet 200, avoids the volume for occupying server.
The server that the embodiment of the present disclosure provides passes through setting ontology and first connecting portion；It is provided on ontology and the
The DEBUG display unit of one interconnecting piece connection, first connecting portion are used to be detachably connected on the cabinet of server, so that
The hardware identification code of DEBUG display unit display server can the service of being installed to by malfunction test card when needing malfunction test
On the cabinet of device, so as to directly observe the hardware identification code on DEBUG display unit outside cabinet, failure shadow is found in time
It rings, malfunction elimination is high-efficient, and without dismantling cabinet, easy to operate.
On the basis of the above embodiments, cabinet 200 is additionally provided with cover board 220, and 220 detachable cover of cover board is located at the second company
It connects outside device 210, so that avoiding entering in cabinet 200 without using dust when malfunction test card 100 etc. from the second connector 210 influences
Server operation, improves the service life of server.
Further, 220 one end of cover board is hinged on cabinet 200, and the other end of cover board 220 is fastened on cabinet 200, when
When needing using the second connector 210, it is only necessary to partially open engaging, then rotating plate 220 can expose the second connection
Device 210 avoids the loss of cover board 220.
When in the application, although term " first ", " second " etc. may be used in this application to describe respectively
Element, but these elements should not be limited by these terms.These terms are only used to by an element and another element region
It does not open.For example, in the case where not changing the meaning of description, first element can be called second element, and same, second
Element can be called first element, as long as " second yuan that " first element " occurred is unanimously renamed and occurred
Part " unanimously renames.First element and second element are all elements, but can not be identical element.
Word used herein is only used for description embodiment and is not used in limitation claim.Such as embodiment with
And used in the description of claim, unless context clearly illustrates, otherwise "one" (a) of singular, "one"
(an) and " described " (the) is intended to include equally plural form.Similarly, term "and/or" as used in this specification
Refer to comprising one or more associated any and all possible combinations listed.In addition, when being used for the application
When middle, term " includes " (comprise) and its modification " comprising " (comprises) and/or refer to including (comprising) etc. old
The presence of feature, entirety, step, operation, element and/or the component stated, but be not excluded for one or more other features,
Entirety, step, operation, element, component and/or these grouping presence or addition.
Various aspects, embodiment, realization or feature in described embodiment can be used alone or in any combination
Mode use.Various aspects in described embodiment being implemented in combination with by software, hardware or software and hardware.Described reality
Applying example can also be embodied by the computer-readable medium for being stored with computer-readable code, which includes can be by
The instruction that at least one computing device executes.The computer-readable medium can be filled with any data-storable data storage
Set associated, which can be read by computer system.Computer-readable medium for citing may include read-only memory,
Random access memory, CD-ROM, HDD, DVD, tape and optical data storage devices etc..The computer-readable medium may be used also
To be distributed in the computer system by net connection, such computer-readable code distributed storage and can be executed.
Above-mentioned technical description can refer to attached drawing, these attached drawings form a part of the application, and by description attached
The embodiment according to described embodiment is shown in figure.Although the description of these embodiments is enough in detail so that this field
Technical staff can be realized these embodiments, but these embodiments are non-limiting；Other implementations thus can be used
Example, and variation can also be made in the case where not departing from the range of described embodiment.For example, described in flow chart
Operation order be non-limiting, therefore in flow charts illustrate and according to flow chart description two or more behaviour
The sequence of work can be changed according to several embodiments.As another example, in several embodiments, it explains in flow charts
It releases and is optional or deletable according to one or more operations that flow chart describes.In addition, certain steps or
Function can be added in the disclosed embodiments or more than two sequence of steps are replaced.All these variations are considered
Included in the disclosed embodiments and claim.
In addition, using term to provide the thorough understanding of described embodiment in above-mentioned technical description.However, and being not required to
Will excessively detailed details to realize described embodiment.Therefore, the foregoing description of embodiment be in order to illustrate and describe and
It presents.The embodiment and example disclosed according to these embodiments presented in foregoing description is provided separately, with
Addition context simultaneously helps to understand described embodiment.Description above, which is not used in, accomplishes exhaustive or by described reality
Apply the precise forms that example is restricted to the disclosure.According to the above instruction, it is several modification, selection be applicable in and variation be feasible.?
In some cases, processing step well known is not described in avoid described embodiment is unnecessarily influenced.
Claims (14)
1. a kind of malfunction test card characterized by comprising the first connecting portion of ontology and setting on the body；
The DEBUG display unit connecting with the first connecting portion is provided on the ontology, the first connecting portion is used for can
Dismantling connection is on the cabinet of server, so that the DEBUG display unit shows the hardware identification code of the server.
2. malfunction test card according to claim 1, which is characterized in that the DEBUG display unit includes multiple into square
The LED lamp bead of battle array arrangement.
3. malfunction test card according to claim 1, which is characterized in that the DEBUG display unit includes for showing
The display panel of number.
4. malfunction test card according to claim 1, which is characterized in that the first connecting portion is scalable to be arranged described
On ontology.
5. malfunction test card according to claim 1, which is characterized in that the malfunction test card further includes for detachable
The second connecting portion being connected on the cabinet, the ontology further include the functional switch connecting with the second connecting portion, institute
It states functional switch and carries out signal switching for the mainboard to the server.
6. malfunction test card according to claim 5, which is characterized in that the quantity of the functional switch be it is multiple, it is multiple
Functional switch is arranged in a matrix on the body.
7. malfunction test card according to claim 6, which is characterized in that the functional switch include jump cap switch and/or
Slide switch.
8. malfunction test card according to claim 6, which is characterized in that the functional switch includes that BMC firmware is forced more
New switch, BIOS restore switch, BIOS default switch and clearing password switch.
9. malfunction test card according to claim 5, which is characterized in that the second connecting portion is scalable to be arranged described
On ontology.
10. malfunction test card according to claim 5, which is characterized in that the first connecting portion and second connection
Portion is integrated on first connector.
11. a kind of server, which is characterized in that including cabinet, mainboard and the described in any item failure tune of claim 1-10
Examination card；The mainboard is arranged in the cabinet, and opening is formed on the cabinet, is equipped in the opening and the mainboard
Second connector of connection, second connector includes that the third for being detachably connected with the first connecting portion is connect
Portion.
12. server according to claim 11, which is characterized in that the first connecting portion includes connecting line, and described
Three interconnecting pieces include elastic slice, and the first connecting portion is inserted into the third interconnecting piece, so that described in elastic slice compression
Connecting line.
13. server according to claim 11, which is characterized in that the cabinet is additionally provided with cover board, and the cover board can
Disassembly lid is located at outside second connector.
14. server according to claim 13, which is characterized in that described cover board one end is hinged on the cabinet, institute
The other end for stating cover board is fastened on the cabinet.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822017392.9U CN209149288U (en) | 2018-11-28 | 2018-11-28 | Malfunction test card and server |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822017392.9U CN209149288U (en) | 2018-11-28 | 2018-11-28 | Malfunction test card and server |
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| Publication Number | Publication Date |
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| CN209149288U true CN209149288U (en) | 2019-07-23 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113806152A (en) * | 2021-09-14 | 2021-12-17 | 合肥联宝信息技术有限公司 | Fault diagnosis card and equipment |
-
2018
- 2018-11-28 CN CN201822017392.9U patent/CN209149288U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113806152A (en) * | 2021-09-14 | 2021-12-17 | 合肥联宝信息技术有限公司 | Fault diagnosis card and equipment |
| CN113806152B (en) * | 2021-09-14 | 2024-04-19 | 合肥联宝信息技术有限公司 | Fault diagnosis card and equipment |
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Effective date of registration: 20210811 Address after: 100192 Building No. 25, No. 1 Hospital, Baosheng South Road, Haidian District, Beijing, No. 301 Patentee after: SUANFENG TECHNOLOGY (BEIJING) Co.,Ltd. Address before: 100192 2nd Floor, Building 25, No. 1 Hospital, Baosheng South Road, Haidian District, Beijing Patentee before: BITMAIN TECHNOLOGIES Inc. |
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Effective date of registration: 20220223 Address after: Room 501-1, unit 4, floor 5, building 2, yard 9, FengHao East Road, Haidian District, Beijing 100089 Patentee after: Beijing suneng Technology Co.,Ltd. Address before: 100192 Building No. 25, No. 1 Hospital, Baosheng South Road, Haidian District, Beijing, No. 301 Patentee before: SUANFENG TECHNOLOGY (BEIJING) CO.,LTD. |