CN209117740U - A kind of probe test fixture - Google Patents

A kind of probe test fixture Download PDF

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Publication number
CN209117740U
CN209117740U CN201821036279.9U CN201821036279U CN209117740U CN 209117740 U CN209117740 U CN 209117740U CN 201821036279 U CN201821036279 U CN 201821036279U CN 209117740 U CN209117740 U CN 209117740U
Authority
CN
China
Prior art keywords
probe
sliding block
test fixture
fixed block
meanwhile
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201821036279.9U
Other languages
Chinese (zh)
Inventor
文燕
朱良伟
朱伟
唐烨斌
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Boqin Electric Co Ltd
Original Assignee
Suzhou Boqin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Boqin Electric Co Ltd filed Critical Suzhou Boqin Electric Co Ltd
Priority to CN201821036279.9U priority Critical patent/CN209117740U/en
Application granted granted Critical
Publication of CN209117740U publication Critical patent/CN209117740U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model discloses a kind of probe test fixtures, it is characterized by comprising probe fixed blocks, and the sliding block that can be slided on the probe fixed block, wherein, the sliding block includes two pieces, respectively left slider and right sliding block, meanwhile, screw hole is offered on the sliding block, it can be used for installation locking nut, meanwhile probe aperture is additionally provided on the probe fixed block, probe is installed in the probe aperture.The test fixture very flexibly adjustment can close the contact position of probe and connecting terminal according to the spacing of different terminals, probe carries spring and can be in close contact probe and connecting terminal, poor contact or phenomenon of arc discharge will not be generated, eliminate the trouble of handling p-wire every time, it is easy to operate, so that testing efficiency is improved 3 times or more.

Description

A kind of probe test fixture
Technical field
The utility model belongs to technical field of transformer manufacturing, and in particular to a kind of probe test fixture.
Background technique
The test of transformer industry is mostly manual operation at present, and the degree of automation is very low, and testing efficiency is lower, base when test This is all p-wire to be then inserted into transformer terminal, then tighten by manually unscrewing the terminal screwdriver of each winding, Test is completed also to disassemble p-wire, expends a large amount of manpower and material resources.
Utility model content
The utility model proposes a kind of probe test fixture aiming at the problem that background technique is proposed, which can root According to different terminals spacing can very flexibly adjustment close probe and connecting terminal contact position, it is easy to operate, make to test Efficiency improves 3 times or more.
The technical solution of the utility model is: a kind of probe test fixture, including probe fixed block, and can be in described The sliding block slided on probe fixed block, wherein the sliding block includes two pieces, respectively left slider and right sliding block, meanwhile, the cunning Screw hole is offered on block, can be used for installation locking nut, meanwhile, it is additionally provided with probe aperture on the probe fixed block, it is described Probe is installed in probe aperture.
Further, the probe aperture at least includes 8.
Further, locking nut is provided on the left slider.
Further, locking nut is provided on the left slider and right sliding block.
Further, through slot is offered on the probe fixed block, meanwhile, it is provided with screw hole on the sliding block, is passed through The sliding block is fixed on probe fixed block by screw.
This fixture specific working mode are as follows: according to the spacing sliding slider of different connecting terminals to be adjusted to suitable position It sets, connects test cable, insert probes into corresponding transformer connecting terminal, tighten locking nut, complete test clip The connection of tool starts to test.Adjusting slider can be adjusted according to the number of terminal interpolation position.
The beneficial effects of the utility model are embodied in: the test fixture can very flexibly according to the spacing of different terminals Adjustment close the contact position of probe and connecting terminal, probe carries spring and can be in close contact probe and connecting terminal, will not Poor contact or phenomenon of arc discharge are generated, the trouble of handling p-wire every time is eliminated, it is easy to operate, so that testing efficiency is improved 3 times More than.
Detailed description of the invention
The utility model is further described with reference to the accompanying drawings and embodiments:
Fig. 1 is the structural schematic diagram of the fixture;
Wherein: 1, left slider, 2, right sliding block, 3, probe fixed block, 4, locking nut, 5, probe.
Specific embodiment
Embodiment: being a kind of probe test fixture provided by the utility model, including probe fixed block as shown in connection with fig. 1 3, and the sliding block that can be slided on the probe fixed block 3, respectively left slider 1 and right sliding block 2, wherein the sliding block Including two pieces, meanwhile, screw hole is offered on the sliding block, can be used for installation locking nut 4, meanwhile, on the probe fixed block It is additionally provided with probe aperture, probe 5 is installed in the probe aperture.
In the present embodiment, the probe aperture at least includes 8.
In the present embodiment, locking nut is provided on the left slider.
In the present embodiment, locking nut is provided on the left slider and right sliding block.
In the present embodiment, through slot is offered on the probe fixed block, meanwhile, it is provided with screw hole on the sliding block, The sliding block is fixed on probe fixed block by screw.
Certainly the above embodiments are only for explaining the technical ideas and features of the present invention, and its object is to allow be familiar with this The people of technology can understand the content of the utility model and implement accordingly, and the protection model of the utility model can not be limited with this It encloses.Any modifications made in accordance with the spirit of the main technical solutions of the utility model should all cover the guarantor in the utility model Within the scope of shield.

Claims (5)

1. a kind of probe test fixture, it is characterised in that: including probe fixed block, and can be in sliding on the probe fixed block Dynamic sliding block, wherein the sliding block includes two pieces, respectively left slider and right sliding block, meanwhile, spiral shell is offered on the sliding block Hole can be used for installation locking nut, meanwhile, it is additionally provided with probe aperture on the probe fixed block, is equipped in the probe aperture Probe.
2. a kind of probe test fixture according to claim 1, which is characterized in that the probe aperture at least includes 8.
3. a kind of probe test fixture according to claim 1, which is characterized in that be provided with locking screw on the left slider It is female.
4. a kind of probe test fixture according to claim 1, which is characterized in that be all provided on the left slider and right sliding block It is equipped with locking nut.
5. a kind of probe test fixture according to claim 1, which is characterized in that offered on the probe fixed block logical Slot, meanwhile, it is provided with screw hole on the sliding block, the sliding block is fixed on probe fixed block by screw.
CN201821036279.9U 2018-07-02 2018-07-02 A kind of probe test fixture Expired - Fee Related CN209117740U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201821036279.9U CN209117740U (en) 2018-07-02 2018-07-02 A kind of probe test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201821036279.9U CN209117740U (en) 2018-07-02 2018-07-02 A kind of probe test fixture

Publications (1)

Publication Number Publication Date
CN209117740U true CN209117740U (en) 2019-07-16

Family

ID=67195934

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201821036279.9U Expired - Fee Related CN209117740U (en) 2018-07-02 2018-07-02 A kind of probe test fixture

Country Status (1)

Country Link
CN (1) CN209117740U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111504765A (en) * 2020-05-08 2020-08-07 强一半导体(苏州)有限公司 MEMS palladium alloy probe testing device and key structure and method thereof
CN113376511A (en) * 2021-06-22 2021-09-10 江苏富联通讯技术有限公司 Detection device for 5G communication module processing and detection method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111504765A (en) * 2020-05-08 2020-08-07 强一半导体(苏州)有限公司 MEMS palladium alloy probe testing device and key structure and method thereof
CN113376511A (en) * 2021-06-22 2021-09-10 江苏富联通讯技术有限公司 Detection device for 5G communication module processing and detection method thereof

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GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20190716