CN208887783U - A kind of semiconductor laser beam quality test device - Google Patents
A kind of semiconductor laser beam quality test device Download PDFInfo
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- CN208887783U CN208887783U CN201821726562.4U CN201821726562U CN208887783U CN 208887783 U CN208887783 U CN 208887783U CN 201821726562 U CN201821726562 U CN 201821726562U CN 208887783 U CN208887783 U CN 208887783U
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 43
- 238000012360 testing method Methods 0.000 title claims abstract description 32
- 239000013307 optical fiber Substances 0.000 claims abstract description 37
- 230000005540 biological transmission Effects 0.000 claims abstract description 8
- 238000012216 screening Methods 0.000 claims abstract description 8
- 230000033001 locomotion Effects 0.000 claims abstract description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 239000000741 silica gel Substances 0.000 claims description 3
- 229910002027 silica gel Inorganic materials 0.000 claims description 3
- 239000011148 porous material Substances 0.000 claims 1
- 238000000034 method Methods 0.000 description 10
- 239000004020 conductor Substances 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 239000000835 fiber Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 3
- 238000010998 test method Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000005253 cladding Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010835 comparative analysis Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007717 exclusion Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
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- Optical Couplings Of Light Guides (AREA)
- Semiconductor Lasers (AREA)
Abstract
A kind of semiconductor laser beam quality test device, it is characterized by: the laser fixture (10) is used to fix the tail optical fiber of semiconductor laser, diaphragm (20) is placed in laser fixture (10) suitable position afterwards, and the clear aperature on diaphragm (20) controls transmission laser；After power receiver (30) is placed in diaphragm (20), the laser power value exported through diaphragm (20) is detected；Sliding rail (40) is used to control the movement of diaphragm (20) horizontal position, and computer control terminal (50) acquires the back-and-forth motion of diaphragm (20), and the performance number detected by power receiver (30) simultaneously carries out analysis comparison, realizes the screening of high light beam quality laser.The utility model is advantageously implemented the screening of the semiconductor laser of high light beam quality, has many advantages, such as that debugging is convenient, testing efficiency is high.The test device is advantageously implemented demand of the client to the semiconductor laser consistency of high light beam quality.
Description
Technical field
The utility model belongs to laser technology field, specifically, being related to the beam quality test of semiconductor laser
Device and its test method.
Background technique
Semiconductor laser has the advantages that electrical efficiency is high, small in size, the service life is long, price is low etc., the army of being widely used to
The fields such as thing, medical treatment, communication.The difference of the semiconductor laser chip both horizontally and vertically both direction angle of divergence makes
Exporting laser is in oval spot profile, is unfavorable for the direct application of semiconductor laser, in practical applications usually in laser core
Realize that the focussed collimated of laser is coupled to optical fiber output using lens system after piece.In industrial application, high power semiconductor swashs
It is the multimode fibres such as 50/125,105/125,200/220 as conduction optical fiber, fibre core that light device, which often selects fibre core/cladding diameter,
The size of numerical aperture has reacted the degree of divergence of the laser after fiber optic conduction.
The evaluation method of beam quality has several evaluation methods such as far-field divergence angle, focused spot size, the M2 factor.And it is remote
The field angle of divergence, focused spot size can change because of the change of optical change, the far-field divergence angle or focal beam spot of same light beam
There are uncertainties, and the M2 factor does not change as the completely new parameter for describing laser beam quality because perfect optics convert,
It is capable of the qualitative character of objective comprehensive description laser beam, but the measurement of M2 factor evaluation method needs complete light distribution letter
Breath compares, and the test of the M2 factor generallys use specific test macro, can only usually swash to mW grades of low-power in test
Light is tested, and limits its practicability to a certain extent, especially for for high-power semiconductor laser not
It is suitble to use M2 factor evaluation beam quality.
Summary of the invention
In view of the above-mentioned problems, the utility model provides a kind of easily and efficiently semiconductor laser beam quality test dress
It sets and adjustment method, the semiconductor laser beam quality for exporting to tail optical fiber is tested, screened.
The utility model solution adopts the technical scheme that: a kind of semiconductor laser beam quality test device includes:
Laser fixture is used to fix the tail optical fiber of semiconductor laser；Diaphragm is placed in after laser fixture at suitable position, clear aperature pair
Transmission laser is controlled；Power receiver is placed in the performance number that the laser exported through diaphragm is detected after diaphragm；Sliding rail, as
The guide rail of diaphragm horizontal position control guarantees moving horizontally in diaphragm moving process；Computer control terminal acquires the mobile front and back of diaphragm
Performance number that power receiver detects simultaneously carries out analysis comparison, realizes the screening of high light beam quality laser.
The laser fixture has the baltimore groove to match with tested semiconductor laser tail optical fiber coat diameter.
The laser fixture groove is provided with one layer of layer of silica gel, and coat is damaged when preventing optical fiber from accommodating.
The diaphragm has a certain size a clear aperature, and clear aperature is set as constant aperture or variable aperture
Two kinds of forms；By changing stop position in constant aperture form, the test of beam quality is completed；In variable aperture form, Gu
Determine the position of diaphragm, changes the diameter of diaphragm clear aperature, complete the test of beam quality.
The selection of the clear aperture diameter, according to the numerical aperture of optical fiber and diaphragm away from semiconductor laser tail optical fiber end
The distance in face is calculated, formula are as follows:
In formula: NA is the numerical aperture of optical fiber；N is the refractive index in air, is approximately 1；α is that laser is exported in tail optical fiber
The angle of divergence afterwards；D is distance of the diaphragm away from optical fiber light output end；D is spot diameter when laser is transferred to distance d, and as diaphragm is logical
The diameter of light aperture.
The power receiver is placed in after diaphragm and with diaphragm while mobile, the mobile front and back laser power value of detection diaphragm.
The sliding rail is carved with the centimeter scale ruler of standard, carries out quantitative control to the moving distance of diaphragm.
The computer control terminal has the function of power collecting, and the performance number of the mobile front and back of diaphragm is carried out Record Comparison.
The utility model: according to the different principle of spot diameter at a certain distance of the fiber end face of different numerical apertures, if
The clear aperature of photometric door screen limits transmission laser, swashs in situation more lesser than optical fiber numerical aperture itself for measuring
Optical power value, power concentration degree situation is tested in noise spectra of semiconductor lasers light beam.It is advantageously implemented the half of high light beam quality
The screening of conductor laser, the test method have many advantages, such as that debugging is convenient, and testing efficiency is high.The test device is advantageously implemented
Demand of the client to the semiconductor laser consistency of high light beam quality.
Detailed description of the invention
Fig. 1 is the utility model semiconductor laser beam quality test device schematic diagram.
Fig. 2 is the laser fixture schematic diagram of the utility model.
Fig. 3 is the utility model diaphragm clear aperature Computing Principle and formula schematic diagram.
In figure: 10 laser fixtures, 11 laser clamp bottom boards, 12 laser fixture cover boards, 13 grooves, 20 diaphragms, 30 power connect
Receive device, 40 sliding rails, 50 computer control terminals, 60 optical fiber.
Specific embodiment
Presently filed embodiment is described in detail below in conjunction with accompanying drawings and embodiments, how the application is applied whereby
Technological means solves technical problem and reaches the realization process of technical effect to fully understand and implement.
Fig. 1 is the utility model semiconductor laser beam quality test device, includes: laser fixture 10 is for fixed half
The output optical fibre of conductor laser；After diaphragm 20 is placed in laser fixture 10, the clear aperature of diaphragm 20 transmits situation to laser
It is controlled；Power receiver 30 tests the laser power transmitted through diaphragm 20 after being placed in diaphragm 20；Sliding rail 40 is to entire optical path
System level direction is corrected；Computer control terminal 50 receives the performance number that detects of power receiver 30, and compares point
Analysis.
As shown in Fig. 2, being the laser fixture schematic diagram of the utility model.Laser fixture 10 by laser clamp bottom board 11, swash
Light fixture cover board 12 is constituted, and is machined with and semiconductor laser tail optical fiber diameter on laser clamp bottom board 11 and laser fixture cover board 12
Matched groove 13,13 surface of groove coat one layer of layer of silica gel, prevent laser fixture 10 from causing to damage to optical fiber in clamping process
Wound.
The clear aperature of diaphragm 20 controls transmission laser, and clear aperature is set as two kinds of forms, constant aperture, can
Variable orifice diameter, two kinds of forms respectively correspond two kinds of test methods of the invention.Constant aperture diaphragm, mobile 20 position of diaphragm are realized high
The test screen of beam quality semiconductor laser；Aperture-variable diaphragm, 20 position of fixed aperture, replacement clear aperature size are real
The test screen of existing high light beam quality semiconductor laser.
Fig. 3 is 20 clear aperture diameter Computing Principle of diaphragm and formula in the utility model, according to the numerical aperture of optical fiber
And diaphragm 20 is calculated away from the distance of semiconductor laser tail optical fiber end face, formula are as follows:
In formula: NA is the numerical aperture of optical fiber；N is the refractive index in air, is approximately 1；α is that laser is exported in tail optical fiber
The angle of divergence afterwards；D is distance of the diaphragm away from optical fiber light output end；D is spot diameter when laser is transferred to distance d, and as diaphragm is logical
The diameter of light aperture.
It should be noted that data involved in calculating of the invention are only that the present invention is easy to understand use, and non-present invention
Final data value, clear aperature calculate all data be within the scope of the invention.
Power of the laser of 30 noise spectra of semiconductor lasers of power receiver output through the mobile front and back of diaphragm 20 or replacement front and back
Value is detected, and is acquired by computer control terminal 50, comparative analysis, realizes the screening of high light beam quality.
The adjustment method of semiconductor laser beam quality test device has following two method in the utility model, debugging
Steps are as follows:
Method 1:
Semiconductor laser tail optical fiber is fixed in the groove 13 of laser fixture 10 by step 1.
After step 2,20 position of diaphragm are placed in laser fixture 10, power receiver 30 detects semiconductor laser power at this time
Value, and record is acquired in computer control terminal 50.
After step 3, diaphragm 20 are moved to suitable distance, power receiver 30 detects semiconductor laser after the movement of diaphragm 20
Performance number, and record is acquired in computer control terminal 50.
The performance number that step 4, computer control terminal 50 record step 2 and step 3 compares, and completes high light beam quality half
The screening of conductor laser.
Method 2:
Semiconductor laser tail optical fiber is fixed in the groove 13 of laser fixture 10 by step 1.
Step 2,20 position of diaphragm are placed in fixed position after laser fixture 10, choose the clear aperature of certain diameter, function
Rate receiver 30 detects semiconductor laser performance number at this time, and is acquired record in computer control terminal 50.
Step 3,20 position of fixed aperture are constant, replace clear aperature, and the detection diaphragm 20 of power receiver 30 is replaced later half
Conductor laser performance number, and record is acquired in computer control terminal 50.
The performance number that step 4, computer control terminal 50 record step 2 and step 3 compares, and completes high light beam quality half
The screening of conductor laser.
Embodiment 1:
Take semiconductor laser that numerical aperture is 0.22 optical fiber to the transmission laser situation of 0.15NA in its light beam into
Row test:
Fixed clear aperature, chooses 20 clear aperture diameter 2cm of diaphragm, when numerical aperture 0.22, be computed diaphragm 20 away from
Optical fiber luminescent identity distance is from for 4.4cm；When numerical aperture 0.15, diaphragm 20 is away from optical fiber luminescent identity distance from for 6.6cm.Test process
Middle 20 position of mobile diaphragm is moved to 6.6cm from initial 4.4cm, and carries out detection analysis comparison respectively to transimission power.
Embodiment 2:
Take semiconductor laser that numerical aperture is 0.22 optical fiber to the transmission laser situation of 0.15NA in its light beam into
Row test:
20 position of diaphragm is fixed on away from the 5cm of optical fiber luminescent end face, the light beam of numerical aperture 0.22 by variable clear aperature
Its clear aperture diameter is 2.25cm, the light beam of numerical aperture 0.15 its light hole at 20 position of diaphragm at 20 position of diaphragm
Diameter diameter is 1.52cm.20 position of fixed aperture in test is replaced diaphragm 20, is changed to from initial clear aperature 2.25cm
1.52cm, and detection analysis comparison is carried out to replacement front and back transmission power value.
Above description shows and describes several preferred embodiments of the present application, but as previously described, it should be understood that the application
Be not limited to forms disclosed herein, should not be regarded as an exclusion of other examples, and can be used for various other combinations,
Modification and environment, and the above teachings or related fields of technology or knowledge can be passed through in application contemplated scope described herein
It is modified.And changes and modifications made by those skilled in the art do not depart from spirit and scope, then it all should be in this Shen
It please be in the protection scope of appended claims.
Claims (5)
1. a kind of semiconductor laser beam quality test device, by laser fixture (10), diaphragm (20), power receiver (30)
It is formed with sliding rail (40), computer control terminal (50) and optical fiber (60), it is characterised in that: the laser fixture (10) is for fixing
The tail optical fiber of semiconductor laser, diaphragm (20) are placed in laser fixture (10) suitable position afterwards, the clear aperature pair on diaphragm (20)
Transmission laser is controlled；After power receiver (30) is placed in diaphragm (20), the laser power value exported through diaphragm (20) is detected；
Sliding rail (40) is used to control the movement of diaphragm (20) horizontal position, and computer control terminal (50) acquires the back-and-forth motion of diaphragm (20),
The performance number that is detected by power receiver (30) simultaneously carries out analysis comparison, realizes the screening of high light beam quality laser.
2. a kind of semiconductor laser beam quality test device as described in claim 1, it is characterised in that: the laser
Fixture (10) has the groove (13) to match with tested semiconductor laser tail optical fiber coat diameter.
3. a kind of semiconductor laser beam quality test device as claimed in claim 2, it is characterised in that: the laser
One layer of layer of silica gel is provided on fixture groove (13).
4. a kind of semiconductor laser beam quality test device as described in claim 1, it is characterised in that: the diaphragm
(20) with a certain size a clear aperature, clear aperature is set as two kinds of forms of constant aperture or variable aperture；It is fixed
By changing diaphragm (20) position in pore size versions, the test of beam quality is completed；In variable aperture form, the position of fixed aperture
It sets, changes the diameter of diaphragm (20) clear aperature, complete the test of beam quality.
5. a kind of semiconductor laser beam quality test device as claimed in claim 4, it is characterised in that: the light passing
The selection of aperture diameter is counted according to the numerical aperture of optical fiber and diaphragm (20) away from the distance of semiconductor laser tail optical fiber end face
It calculates, formula are as follows:
In formula: NA is the numerical aperture of optical fiber；N is the refractive index in air, is approximately 1；α is that laser is sent out after tail optical fiber output
Dissipate angle；D is distance of the diaphragm away from optical fiber light output end；D is spot diameter, as diaphragm light hole when laser is transferred to distance d
The diameter of diameter.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821165542 | 2018-07-23 | ||
| CN2018211655424 | 2018-07-23 |
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| Publication Number | Publication Date |
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| CN208887783U true CN208887783U (en) | 2019-05-21 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201821726562.4U Active CN208887783U (en) | 2018-07-23 | 2018-10-24 | A kind of semiconductor laser beam quality test device |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109186757A (en) * | 2018-07-23 | 2019-01-11 | 江苏天元激光科技有限公司 | A kind of semiconductor laser beam quality test device and its test method |
| CN111121960A (en) * | 2019-12-30 | 2020-05-08 | 西安电子科技大学 | Sampling measurement system for high-energy-intensity continuous laser beam quality factor |
| CN114354135A (en) * | 2021-12-22 | 2022-04-15 | 广东粤港澳大湾区硬科技创新研究院 | Laser light spot measuring device and measuring method thereof |
-
2018
- 2018-10-24 CN CN201821726562.4U patent/CN208887783U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109186757A (en) * | 2018-07-23 | 2019-01-11 | 江苏天元激光科技有限公司 | A kind of semiconductor laser beam quality test device and its test method |
| CN111121960A (en) * | 2019-12-30 | 2020-05-08 | 西安电子科技大学 | Sampling measurement system for high-energy-intensity continuous laser beam quality factor |
| CN111121960B (en) * | 2019-12-30 | 2021-08-31 | 西安电子科技大学 | Sampling measurement system for high-energy-intensity continuous laser beam quality factor |
| CN114354135A (en) * | 2021-12-22 | 2022-04-15 | 广东粤港澳大湾区硬科技创新研究院 | Laser light spot measuring device and measuring method thereof |
| CN114354135B (en) * | 2021-12-22 | 2024-05-17 | 广东粤港澳大湾区硬科技创新研究院 | Laser spot measuring device and measuring method thereof |
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Address after: Entrepreneurship Service Center, High-tech Zone, No. 99, Zhulin Road, Danyang City, Zhenjiang City, Jiangsu Province 212300 Patentee after: Jiangsu Skyera Laser Technology Co.,Ltd. Address before: 212300 No.8, high tech industrial concentration zone, Danyang City, Zhenjiang City, Jiangsu Province Patentee before: JIANGSU SKYERALASER TECHNOLOGY CO.,LTD. |