CN208506171U - Fingerprint module test fixture - Google Patents
Fingerprint module test fixture Download PDFInfo
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- CN208506171U CN208506171U CN201821116503.5U CN201821116503U CN208506171U CN 208506171 U CN208506171 U CN 208506171U CN 201821116503 U CN201821116503 U CN 201821116503U CN 208506171 U CN208506171 U CN 208506171U
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- electric conductor
- pin
- test fixture
- mould group
- fingerprint
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Abstract
A kind of fingerprint module test fixture, for test fingerprint mould group, the fingerprint mould group includes back side stiffening plate and internal circuit board, the fingerprint module test fixture includes jig plummer and testing host, electric conductor on the jig plummer, the testing host is electrically connected at the electric conductor, the testing host is also used to be electrically connected at the internal circuit board of the fingerprint mould group, and the electric conductor corresponds to the back side stiffening plate and sets to be electrically connected or disconnect with the back side stiffening plate.Fingerprint module test fixture provided by the utility model increases the electric conductor for being electrically connected and being electrically connected with fingerprint mould group back side stiffening plate with testing host, realizes effective interception that the bad fingerprint mould group of this type is shorted to back side stiffening plate and internal circuit board.
Description
Technical field
The utility model relates to testing for electrical equipment fields, and in particular to a kind of fingerprint module test fixture.
Background technique
Fingerprint mould group usually requires to carry out functional test before factory, it is however generally that, existing fingerprint module test fixture
Including the internal jig bottom plate for being equipped with testing host, jig bottom plate is equipped with Test bench, and Test bench is equipped with multiple one end
Fingerprint mould group is placed in when being tested on Test bench, tests the another of probe by the test probe being electrically connected with testing host
To be electrically connected with the internal circuit board of fingerprint mould group on the corresponding top to the corresponding test point of fingerprint mould group in end, testing host passes through more
A test probe is communicated with fingerprint mould group, to realize the functional test to fingerprint mould group.
In the production procedure of fingerprint mould group correlation plate, fitting CVL is carried out in the software circuit board to fingerprint mould group and (is covered
Epiphragma) when, there is probability that can cause scuffing breaking point to cause reinforcement plate and built-in system ground short circuit on circuit boards, for
Stiffening plate circuit hanging fingerprint mould group in the back side scratches breaking point if existing on flexible circuit board, when fingerprint mould group is depressed
When, stiffening plate can be shorted with the signal wire scratched at breaking point, this is one of undesirable type of fingerprint mould group, will cause terminal and refers to
Line is bad, it is therefore necessary to effectively intercept such bad products, and existing fingerprint module test fixture can not effectively intercept it is such
Bad fingerprint mould group.
Utility model content
The purpose of this utility model seeks to solve the deficiencies in the prior art, provides a kind of fingerprint module test fixture, with
Realize effective interception that the bad fingerprint mould group of this type is shorted to back side stiffening plate and internal circuit board.
In order to achieve the above objectives, the technical solution of the utility model is achieved in that
A kind of fingerprint module test fixture described in the utility model is used for test fingerprint mould group, the fingerprint mould group packet
Back side stiffening plate and internal circuit board are included, the fingerprint module test fixture includes jig plummer and carries set on the jig
Testing host, electric conductor on platform, the testing host are electrically connected at the electric conductor, and the testing host is also used to electrical property
Be connected to the internal circuit board of the fingerprint mould group, the electric conductor correspond to the back side stiffening plate and set with the back
Face stiffening plate is electrically connected or disconnects.
Fingerprint module test fixture provided by the utility model is increased and is electrically connected with testing host and can be with fingerprint mould group
The electric conductor of back side stiffening plate electrical connection, realizes and is shorted the bad fingerprint mould of this type to back side stiffening plate and internal circuit board
Effective interception of group.
In one embodiment, the fingerprint mould group further includes circuit board, the circuit board and the internal circuit board
It is electrically connected, the electric conductor includes the first electric conductor, and first electric conductor includes connecting pin and contact jaw, the test master
Plate is equipped with the first pin and second pin, and the circuit board is equipped with third pin and the third pin and is used for and described the
Two pins are electrically connected, and the connecting pin of first electric conductor is electrically connected with first pin of the testing host,
The contact jaw is used to be electrically connected with the back side stiffening plate.
In one embodiment, the electric conductor further includes the second electric conductor, and second electric conductor includes connecting pin
And contact jaw, the testing host is equipped with the 4th pin, and is formed with electricity between the 4th pin and first pin
Potential difference, the fingerprint module test fixture further include detection indicator, the detection indicator be connected to the 4th pin and
Between the connecting pin of second electric conductor, the contact jaw of second electric conductor with the back side stiffening plate for electrically connecting
Connect, first electric conductor, first pin, the 4th pin, the detection indicator and second electric conductor according to
Secondary electrical connection is to detect whether first electric conductor and/or second electric conductor are broken.
In one embodiment, the detection indicator is detection indicator light.
It in one embodiment, further include multiple 5th pins on the circuit board, the testing host further includes more
A 6th pin, the multiple 5th pin on the circuit board can be led by other in the fingerprint module test fixture
Electric body is electrically connected with the multiple 6th pin on the testing host respectively.
In one embodiment, the jig plummer includes pedestal and Test bench, and the electric conductor is fixedly connected
In the pedestal and the Test bench is passed through, the relatively described pedestal of the Test bench can be set to the pedestal up or down
On, so that the electric conductor exposes or does not expose the upper surface of the Test bench.
In one embodiment, the fingerprint module test fixture further includes pinboard, and the pinboard is set to described
One end of jig plummer is electrically connected with the testing host inside the jig plummer, and the pinboard is equipped with and is used for
The interface being electrically connected with processor is the testing host to be connected to the processor.
In one embodiment, the fingerprint module test fixture further includes jig cover board, is set on the jig cover board
There is limit indent, the jig cover board is connected to the side of the jig plummer turnablely, to be completely exposed the fingerprint
Mould group or part and the EDGE CONTACT of the fingerprint mould group with fixation and press the fingerprint mould group.
In one embodiment, the electric conductor is POGOPIN type probe.
In one embodiment, the electric conductor is copper sheet metal or the aluminum metal without anodized
Piece.
The further advantage of the utility model will be described in detail in conjunction with attached drawing in the following detailed description section.
Detailed description of the invention
The attached drawing for constituting a part of the utility model is used to provide a further understanding of the present invention, this is practical new
The illustrative embodiments and their description of type are not constituteed improper limits to the present invention for explaining the utility model.
In the accompanying drawings:
Fig. 1 is one embodiment use state cross section structure schematic diagram of the utility model fingerprint module test fixture；
Fig. 2 is that normal fingerprints mould group and test fixture are electrically connected under fingerprint module test fixture use state shown in Fig. 1
Relation schematic diagram；
Fig. 3 is that bad fingerprint mould group and test fixture are electrically connected under fingerprint module test fixture use state shown in Fig. 1
Relation schematic diagram；
Fig. 4 is fingerprint module test fixture shown in Fig. 1 and tested fingerprint mould group normal communication timing schematic diagram；
Fig. 5 is fingerprint module test fixture shown in Fig. 1 and tested fingerprint mould group anomalous communication timing schematic diagram.
Description of symbols: 10 jig plummers 11, bottom plate 13, testing host 15, pinboard 131, the first pin
133, second pin 135, the 4th pin 139, the 6th pin 21, Test bench 31, the first electric conductor 33, second are conductive
Body 41, detection indicator 50, fingerprint mould group 51, circuit board 513, third pin 519, the 5th pin 53, back side reinforcement
Plate 54, internal circuit board 55, fingerprint recognition chip 56, becket 57, cover board 61, processor
Specific embodiment
For the technical solution of the utility model is explained further, the utility model is explained in detail with reference to the accompanying drawing
It states, identical reference label indicates identical component in the accompanying drawings.
Fig. 1 is one embodiment use state cross section structure schematic diagram of the utility model fingerprint module test fixture, such as Fig. 1 institute
Show, tested fingerprint mould group 50 includes successively folding back side stiffening plate 53, internal circuit board 54, the fingerprint recognition chip set from the bottom to top
55, cover board 57 and it is located on the becket 56 in outside, in its natural state, the back side stiffening plate 53 of fingerprint mould group 50 and internal
Hanging between wiring board 54, only edge mutually bonds.
In the present embodiment, fingerprint module test fixture includes jig plummer 10 and the survey on jig plummer 10
Mainboard 13, electric conductor are tried, testing host 13 is electrically connected at electric conductor, and testing host 13 is also used to be electrically connected at fingerprint mould group
Internal circuit board 54, electric conductor correspond to back side stiffening plate 53 and set to back side stiffening plate 53 be electrically connected or disconnect.Tool
Body, for electric conductor for fingerprint mould group 50 to be electrically connected with testing host 13, the electric conductor in the present embodiment is POGOPIN type
Probe, in other examples, electric conductor can also be other kinds of probe.
In the present embodiment, as shown in Figure 1, jig plummer 10 includes pedestal 11 and Test bench 21, electric conductor is fixed to be connected
It being connected to pedestal 11 and passes through Test bench 21, Test bench 21 can be set on pedestal 11 up or down with respect to pedestal 11, so that
Electric conductor exposes or does not expose the upper surface of Test bench 21.Specifically, elastic component is equipped between pedestal 11 and Test bench 21
(not shown), elastic component can make Test bench 21 automatically return to original position after Test bench 21 is depressed, to make fingerprint mould
Electric conductor of the group test fixture in non-test state thereon is housed in Test bench 21, and electric conductor is protected to make its not rapid wear
It is bad.
In conjunction with referring to figs. 1 to Fig. 3, wherein Fig. 2 and fingerprint mould group 50 shown in Fig. 3 are illustrated only in the presence of electric connection
Structure, in the present embodiment, electric conductor include the first electric conductor 31 and the second electric conductor 33, and testing host 13 is equipped with first and draws
Foot 131, second pin 133, the 4th pin 135 and multiple 6th pins 139；Fingerprint mould group 50 includes circuit board 51, inner wire
Road plate 54 and fingerprint recognition chip 55, circuit board 51 and internal circuit board 54 are electrically connected, internal circuit board 54 and fingerprint recognition
Chip 55 is electrically connected.Be equipped with altogether in the present embodiment, on circuit board 51 12 pins as test point with testing host 13
It is electrically connected, including third pin 513 and other 11 the 5th pins 519, in other embodiments, drawing on circuit board 51
Foot number is not limited only to 12.Specifically, the third pin 513 on circuit board 51 and the second pin on testing host 13
Multiple 6th pins 139 on 133 multiple 5th pins 519 and testing host 13 corresponding, on circuit board 51 correspond, point
It is not electrically connected by other electric conductors, to make that SPI communication can be carried out between testing host 13 and internal circuit board 54.Fig. 4
Shown in be fingerprint module test fixture and tested fingerprint mould group normal communication timing schematic diagram, second on testing host 13 draws
The S_GND in potential corresponding diagram 4 at foot 133, S_GND are testing hosts 13 and internal circuit board 54 carries out the interior of SPI communication
The normal timing in portion, when on internal circuit board 54 there is no is shorted with back side stiffening plate 53 breaking point when, internal circuit board 54 and
Without being electrically connected (as shown in Figure 2) between back side stiffening plate 53, by SPI timing control shown in Fig. 4 after the energization of fingerprint mould group 50
System, S-GND transmission timing signal to fingerprint mould group 50, fingerprint mould group 50 and 13 normal communication of testing host.
In the present embodiment, the first electric conductor 31 and the second electric conductor 33 include connecting pin and contact jaw, such as Fig. 3 institute
Show, the connecting pin of the first electric conductor 31 is electrically connected with the first pin 131 of testing host 13, in 131 corresponding diagram 5 of the first pin
Constant potential at E_GND, E_GND, can be low potential, be also possible to high potential, and E_GND be not belonging to testing host 13 with
Timing inside SPI when internal circuit board 54 communicates, the contact jaw of the first electric conductor 31 are used to electrically connect with back side stiffening plate 53
It connects.When test, the contact jaw of the first electric conductor 31 is contacted with back side stiffening plate 53, when tested fingerprint mould group 50 is bad fingerprint mould
Group, when back side stiffening plate 53 and internal circuit board 54 thereon is shorted, the first pin 131 is mended by the first electric conductor 31, the back side
Strong plate 53, internal circuit board 54, circuit board 51 and the electric conductor being connected between third pin 513 and second pin 133, and with
The second pin 133 of testing host 13 is connected to, and then E_GND and S_GND is shorted, since E_GND is not normal inside SPI
Timing, therefore directly result in SPI clock signal mistake and then cause fingerprint mould group 50 that cannot communicate with testing host 13.Therefore, may be used
Back side stiffening plate 53 and internal wiring are intercepted by observing the communication abnormality between tested fingerprint mould group 50 and testing host 13
The bad fingerprint mould group that plate 54 is shorted.
Fingerprint module test fixture further includes detecting indicator 41, and in the present embodiment, detection indicator 41 is that a detection refers to
Show lamp, be connected between the 4th pin 135 and the connecting pin of the second electric conductor 33, the contact jaw of the second electric conductor 33 is used for and back
Face stiffening plate 53 is electrically connected, and is formed with potential difference between the 4th pin 135 and the first pin 131, and in the present embodiment, the 4th draws
Voltage at foot 135 is 3.3v, and the first electric conductor 31, the first pin 131, the 4th pin 135, detection indicator 41 and second are led
Electric body 33 is sequentially connected electrically to form a detection circuit to detect whether the first electric conductor 31 and/or the second electric conductor 33 are broken.Tool
Body, pressing fingerprint mould group 50 is when being tested, the contact jaw of the first electric conductor 31 and the second electric conductor 33 respectively with fingerprint mould
The back side stiffening plate 53 of group 50 contacts, and the first electric conductor 31, the second electric conductor 33 and back side stiffening plate 53 combine at this time, acts as
The switch of one closure will test circuit conducting, due between the first pin 131 and second pin 133 there are potential difference,
In the case where the first electric conductor 31 and intact the second electric conductor 33, detection circuit forms a closed circuit, detects indicator light
It is lit, i.e., under 33 fine status of the first electric conductor 31 and the second electric conductor, one fingerprint mould group 50 of every detection detects indicator light
41 just can be lit it is primary, whether being lighted by observation detection indicator light 41, so that it may intuitively judge the first electric conductor 31 or
Whether the second electric conductor 33 is broken.Based on principle same as the first electric conductor, the second electric conductor can also be used for intercepting back side benefit
The bad fingerprint mould group that strong plate and internal circuit board are shorted；Second electric conductor, detection indicator and the cooperation of the first electric conductor are referring to
A detection circuit is constituted in line module test fixture, is realized the real-time monitoring of easily damaged electric conductor this kind of to probe, is made
Tester can have found in time and replace impaired probe, avoid because of the impaired risk for causing defective products to flow out of probe.
In the present embodiment, as shown in figure 3, fingerprint module test fixture further includes pinboard 15, pinboard 15 is set to and controls
Have plummer 10 one end, be electrically connected with the testing host 13 jig plummer 10 inside, pinboard 15 equipped with for processing
The interface that device 61 is electrically connected is testing host 13 to be connect with processor 61.Pinboard 15 passes through above-mentioned interface and processor 61
It is electrically connected, and then testing host 13 and processor 61 is connected, the internal wiring of testing host 13 and fingerprint mould group 50
The communication process of plate 54 can be shown by the software window on the display that is connected with processor 61, and then tester's root
The test information shown according to software window judge fingerprint mould group it is bad whether.
In the present embodiment, fingerprint module test fixture further includes jig cover board, and jig cover board is equipped with limit indent, controls
The side that tool cover board is connected to jig plummer 10 turnablely passes through when fingerprint mould group 50 is placed on jig plummer 10
Overturning jig cover board can be completely exposed fingerprint mould group 50, when jig cover board is overturn towards 10 upper surface of jig plummer, limit pressure
The edge of slot is contacted with the part edge of fingerprint mould group 50 with fixed and pressing fingerprint mould group 50.
In another embodiment, the first electric conductor 31 and the second electric conductor 33 can also be for copper sheet metals or without anode
The aluminum sheet metal of oxidation processes.
Fingerprint module test fixture provided by the utility model, effectively prevents back side stiffening plate and internal circuit board is shorted
The detection of the bad fingerprint mould group of this type is missed, and realizes easily damaged electric conductor this kind of to probe by increasing detection circuit
Real-time monitoring, avoid the risk for causing defective products to flow out because probe is impaired, while substantially reducing the point before online operation
The time is examined, the complete interception for being shorted the bad fingerprint mould group of this type to back side stiffening plate and internal circuit board is realized, can grasp
The property made is strong, it is easy to accomplish.
Above description is only a specific implementation of the present invention, it is noted that any to be familiar with those skilled in the art
For member in the technical scope disclosed by the utility model, any changes or substitutions that can be easily thought of, should all cover in the utility model
Protection scope within.
Claims (10)
1. a kind of fingerprint module test fixture is used for test fingerprint mould group (50), the fingerprint mould group (50) includes back side reinforcement
Plate (53) and internal circuit board (54), which is characterized in that the fingerprint module test fixture includes jig plummer (10) and sets
In testing host (13), electric conductor on the jig plummer (10), the testing host (13) is electrically connected at described lead
Electric body, the testing host (13) is also used to be electrically connected at the internal circuit board (54) of the fingerprint mould group, described to lead
Electric body corresponds to the back side stiffening plate (53) and sets to be electrically connected or disconnect with the back side stiffening plate (53).
2. fingerprint module test fixture as described in claim 1, which is characterized in that the fingerprint mould group (50) further includes circuit
Plate (51), the circuit board (51) and the internal circuit board (54) are electrically connected, and the electric conductor includes the first electric conductor
(31), first electric conductor (31) includes connecting pin and contact jaw, and the testing host (13) is equipped with the first pin (131)
With second pin (133), the circuit board (51) is equipped with third pin (513) and the third pin (513) is used for and institute
State second pin (133) electric connection, the connecting pin of first electric conductor (31) and the institute of the testing host (13)
The first pin (131) electrical connection is stated, the contact jaw is used to be electrically connected with the back side stiffening plate (53).
3. fingerprint module test fixture as claimed in claim 2, which is characterized in that the electric conductor further includes the second electric conductor
(33), second electric conductor (33) includes connecting pin and contact jaw, and the testing host (13) is equipped with the 4th pin
(135), potential difference, the fingerprint mould group test and between the 4th pin (135) and first pin (131) are formed with
Jig further includes detection indicator (41), and the detection indicator (41) is connected to the 4th pin (135) and described second
Between the connecting pin of electric conductor (33), the contact jaw of second electric conductor (33) is used for the back side stiffening plate (53) electrically
Connection, first electric conductor (31), first pin (131), the 4th pin (135), the detection indicator
(41) and second electric conductor (33) is sequentially connected electrically to detect first electric conductor (31) and/or second electric conductor
(33) whether it is broken.
4. fingerprint module test fixture as claimed in claim 3, which is characterized in that the detection indicator (41) is that detection refers to
Show lamp.
5. fingerprint module test fixture as claimed in claim 2, which is characterized in that further include multiple on the circuit board (51)
5th pin (519), the testing host (13) further include multiple 6th pins (139), described on the circuit board (51)
Multiple 5th pins (519) can by other electric conductors in the fingerprint module test fixture respectively with the testing host
(13) the multiple 6th pin (139) on is electrically connected.
6. fingerprint module test fixture as described in claim 1, which is characterized in that the jig plummer (10) includes pedestal
(11) it is fixedly connected on the pedestal (11) with Test bench (21), the electric conductor and passes through the Test bench (21), institute
Stating the relatively described pedestal (11) of Test bench (21) can be set on the pedestal (11) up or down, so that the electric conductor reveals
Expose the upper surface of the Test bench (21) out or not.
7. fingerprint module test fixture as described in claim 1, which is characterized in that the fingerprint module test fixture further includes
Pinboard (15), the pinboard (15) are set to one end of the jig plummer (10), interior with the jig plummer (10)
The testing host (13) in portion is electrically connected, and the pinboard (15) is equipped with the interface for being electrically connected with processor (61) to incite somebody to action
The testing host (13) connect with the processor (61).
8. fingerprint module test fixture as described in claim 1, which is characterized in that the fingerprint module test fixture further includes
Jig cover board, the jig cover board are equipped with limit indent, and the jig cover board is connected to the jig plummer turnablely
(10) side, to be completely exposed the fingerprint mould group (50) or partially with the EDGE CONTACT of the fingerprint mould group (50) with fixation
With the pressing fingerprint mould group (50).
9. fingerprint module test fixture as described in claim 1, which is characterized in that the electric conductor is POGOPIN type probe.
10. fingerprint module test fixture as described in claim 1, which is characterized in that the electric conductor be copper sheet metal or
Aluminum sheet metal without anodized.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821116503.5U CN208506171U (en) | 2018-07-13 | 2018-07-13 | Fingerprint module test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821116503.5U CN208506171U (en) | 2018-07-13 | 2018-07-13 | Fingerprint module test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208506171U true CN208506171U (en) | 2019-02-15 |
Family
ID=65284623
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821116503.5U Active CN208506171U (en) | 2018-07-13 | 2018-07-13 | Fingerprint module test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208506171U (en) |
-
2018
- 2018-07-13 CN CN201821116503.5U patent/CN208506171U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20201209 Address after: 3 / F, factory building No.1, No.3, Taihong Road, high tech Zone, Kunshan City, Suzhou City, Jiangsu Province Patentee after: Kunshanqiu titanium biometric technology Co., Ltd Address before: No.3, Taihong Road, Kunshan high tech Industrial Development Zone, Suzhou, Jiangsu Province, 215300 Patentee before: KUNSHAN Q TECHNOLOGY Co.,Ltd. |