CN208466554U - A kind of image scan test device of wafer sorting machine - Google Patents
A kind of image scan test device of wafer sorting machine Download PDFInfo
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- CN208466554U CN208466554U CN201820327698.1U CN201820327698U CN208466554U CN 208466554 U CN208466554 U CN 208466554U CN 201820327698 U CN201820327698 U CN 201820327698U CN 208466554 U CN208466554 U CN 208466554U
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- image
- sorting machine
- information
- scan
- equipment case
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Abstract
The utility model discloses a kind of image scan test devices of wafer sorting machine, it is made of image documentation equipment case, the image documentation equipment case is fixed on sorting machine by fixed steel disc, one side of the image documentation equipment case is equipped with scan box, and another side of image documentation equipment case is equipped with equipment connector；The scan box is integrated with image documentation equipment case, and infrared ray projection hole and image scan mouth are equipped with outside the scan box, is equipped with scanner and the infrared ray projector inside the scan box；Control mainboard, image processor, information parser, power transmission plate and reservoir are equipped with inside the image documentation equipment case, the mode that image scan is retrieved, solves the case where time length, efficiency bottom of information input formula retrieval, pass through scanning device, multiple intelligent control devices and multiple transmission devices, the information sharing between scanning information and computer is realized, the time is reduced and also enhances the intelligence of wafer sorting machine while improving efficiency.
Description
Technical field
The utility model relates to wafer sorting machine image scanner technical field, specially a kind of wafer sorting machine
Image scan test device.
Background technique
Wafer is after first purifying by silicon process, melt, distill, silicon crystal stick is made, then is ground by silicon crystal stick
Mill, polishing and slice become wafer master slice, due to wafer sorting machine, need to carry out type to wafer before operation to distinguish
It not and distinguishes, by computer by the information input of wafer, retrieve by computer the cooked mode of corresponding wafer
And the operational mode of wafer sorting machine.
The problem of conventional information input type retrieval mode, causes the time longer, low efficiency, so that wafer sorting machine
Lack certain intelligent.To solve the above-mentioned problems, therefore, we have proposed a kind of tests of the image scan of wafer sorting machine
Device.
Utility model content
The purpose of this utility model is to provide a kind of image scan test devices of wafer sorting machine, solve background
The problem of proposed in technology.
To achieve the above object, the utility model provides the following technical solutions: a kind of image scan of wafer sorting machine
Test device is made of image documentation equipment case, and the image documentation equipment case is fixed on sorting machine by fixed steel disc, and the image is set
One side of standby case is equipped with scan box, and another side of image documentation equipment case is equipped with equipment connector；The scan box with
Image documentation equipment case is integrated, and infrared ray projection hole and image scan mouth, the scan box are equipped with outside the scan box
Inside is equipped with scanner and the infrared ray projector；Control mainboard, image processor, information solution are equipped with inside the image documentation equipment case
Parser, power transmission plate and reservoir, the control mainboard by integrated line respectively with scanner, the infrared ray projector, image
Processor is connected with power transmission plate, and described image processor is connect by integrated line with information parser, the information parsing
Device is connect by integrated line with reservoir.
Integrated transmission chip is equipped with as a kind of preferred embodiment of the utility model, inside the equipment connector,
The integrated transmission chip is connected with reservoir and the connectivity port connecting on equipment device respectively by integrated line.
As a kind of preferred embodiment of the utility model, the connectivity port on the equipment connector is connected by information
Wiring is connect with computer.
As a kind of preferred embodiment of the utility model, the control mainboard is equipped with image analysis module, number
Demodulation module and micro-circuit board.
As a kind of preferred embodiment of the utility model, by power supply inside the integrated line of the control mainboard connection
Line, transmission line of information and information receive line and constitute.
Compared with prior art, the beneficial effects of the utility model are as follows:
In such a way that image scan is retrieved, the time of effective solution information input formula retrieval is long, low efficiency
The case where, while by scanning device, multiple intelligent control devices and multiple transmission devices, realize scanning information and computer
Between information sharing, reduce the time and improve efficiency while also enhance the intelligence of wafer sorting machine.
Detailed description of the invention
Fig. 1 is a kind of image scan test device overall appearance structural representation of wafer sorting machine of the utility model
Figure；
Fig. 2 is that a kind of image scan test device scan box internal structure of wafer sorting machine of the utility model is illustrated
Figure；
Fig. 3 is a kind of image scan test device image documentation equipment case internal structure of wafer sorting machine of the utility model
Schematic diagram；
Fig. 4 is a kind of image scan test device workflow schematic diagram of wafer sorting machine of the utility model.
In figure: 1- image documentation equipment case, 2- scan box, 3- equipment connector, 4- infrared ray projection hole, 5- image scan mouth,
6- scanner, the 7- infrared ray projector, 8- control mainboard, 9- image processor, 10- information parser, 11- power transmission plate,
12- reservoir.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work
Every other embodiment obtained, fall within the protection scope of the utility model.
Fig. 1-4 is please referred to, the utility model provides a kind of technical solution: a kind of image scan test of wafer sorting machine
Device is made of image documentation equipment case 1, and the image documentation equipment case 1 is fixed on sorting machine by fixed steel disc, the image documentation equipment
One side of case 1 is equipped with scan box 2, and another side of the image documentation equipment case 1 is equipped with equipment connector 3；The scan box 2
It is integrated with image documentation equipment case 1, infrared ray projection hole 4 and image scan mouth 5 is equipped with outside the scan box 2, it is described
Scanner 6 and the infrared ray projector 7 are equipped with inside scan box 2；Control mainboard 8 is equipped with inside the image documentation equipment case 1, at image
Manage device 9, information parser 10, power transmission plate 11 and reservoir 12, the control mainboard 8 by integrated line respectively with scanner
6, the infrared ray projector 7, image processor 9 and power transmission plate 11 connect, and described image processor 9 passes through integrated line and information
Resolver 10 connects, and the information parser 10 is connect by integrated line with reservoir 12.
Referring to Fig. 3, a kind of preferred embodiment as the utility model, collection is equipped with inside the equipment connector 3
At transmission chip, the integrated transmission chip by integrated line respectively with reservoir 12 and the connectivity port connecting on equipment device 3
Connection.By integrated transmission chip, the connection of reservoir and connectivity port is realized, is provided for image documentation equipment with connection is calculated
The guarantee of information sharing.
Connecting pin referring to Fig. 3, a kind of preferred embodiment as the utility model, on the equipment connector 3
Mouth is connect by information connecting line with computer.By the connection of equipment connector and computer, image scan information is realized
It is shared.
Referring to Fig. 3, a kind of preferred embodiment as the utility model, the control mainboard 8 is equipped with image solution
Analyse module, digital demodulating block and micro-circuit board.By image analysis module, scan-image information can be carried out receiving and
Transmission can be converted to the received information pattern of other equipment by digital demodulating block to image information, and micro-circuit board is convenient
To the power transmission of each equipment.
Referring to Fig. 3, a kind of preferred embodiment as the utility model, the integrated line that the control mainboard 8 connects
Inside receives line by power supply line, transmission line of information and information and constitutes.The use of integrated line, avoids multiple independent wire bodies and causes line
Road connection is complicated, causes certain inconvenience to detection and maintenance.
A kind of image scan test device of wafer sorting machine described in the utility model, is retrieved when to wafer
When, first by wafer close to scan box 2, by the induction of the infrared ray projector 7, induction information is transmitted to control mainboard 8
It is interior, scanner 6 will be opened by control mainboard 8, scanner 6 feeds back to the image information of wafer in control mainboard 8 again,
By control mainboard 8, image information is transmitted in image processor 9, then image processor 9 will treated image information
It is transmitted in information parser 10, by the conversion of the mode of information, is transmitted in reservoir 12 and is stored, when equipment connects
When device 3 is connect with computer, the information in reservoir 12 can be transmitted in computer by information connecting line to be retrieved.
The image documentation equipment case 1 of the utility model, scan box 2, equipment connector 3, infrared ray project hole 4, image scan mouth
5, scanner 6, the infrared ray projector 7, control mainboard 8, image processor 9, information parser 10, power transmission plate 11, storage
Device 12, component are universal standard part or component as known to those skilled in the art, and structure and principle are all this technology personnel
It can be learnt by technical manual or be known by routine experiment method, the utility model solves the problems, such as it is conventional information input
The problem of formula retrieval mode causes the time longer, low efficiency.The utility model has in such a way that image scan is retrieved
Effect solves the case where long time that information input formula is retrieved, low efficiency, while being set by scanning device, multiple intelligent controls
Standby and multiple transmission devices, realize the information sharing between scanning information and computer, reduces the time and improves efficiency
The intelligence of wafer sorting machine is also enhanced simultaneously.
Finally, it should be noted that the above descriptions are merely preferred embodiments of the present invention, it is not limited to this
Utility model, although the utility model is described in detail with reference to the foregoing embodiments, for those skilled in the art
For, it is still possible to modify the technical solutions described in the foregoing embodiments, or to part of technical characteristic
It is equivalently replaced.Within the spirit and principle of the utility model, any modification, equivalent replacement, improvement and so on,
It should be included within the scope of protection of this utility model.
Claims (5)
1. a kind of image scan test device of wafer sorting machine, is made of, it is characterised in that: described image documentation equipment case (1)
Image documentation equipment case (1) is fixed on sorting machine by fixed steel disc, and a side of the image documentation equipment case (1) is equipped with scan box
(2), another side of the image documentation equipment case (1) is equipped with equipment connector (3)；
The scan box (2) is integrated with image documentation equipment case (1), and infrared ray is equipped with outside the scan box (2) and is projected
Hole (4) and image scan mouth (5), the scan box (2) is internal to be equipped with scanner (6) and the infrared ray projector (7)；
Control mainboard (8), image processor (9), information parser (10), electric power biography are equipped with inside the image documentation equipment case (1)
Input board (11) and reservoir (12), the control mainboard (8) by integrated line respectively with scanner (6), the infrared ray projector
(7), image processor (9) and power transmission plate (11) connection, described image processor (9) pass through integrated line and information parser
(10) it connects, the information parser (10) is connect by integrated line with reservoir (12).
2. a kind of image scan test device of wafer sorting machine according to claim 1, it is characterised in that: it is described
Be equipped with integrated transmission chip inside equipment connector (3), the integrated transmission chip by integrated line respectively with reservoir (12)
It is connected with the connectivity port on equipment connector (3).
3. a kind of image scan test device of wafer sorting machine according to claim 1, it is characterised in that: described to set
Connectivity port on standby connector (3) is connect by information connecting line with computer.
4. a kind of image scan test device of wafer sorting machine according to claim 1, it is characterised in that: it is described
Control mainboard (8) is equipped with image analysis module, digital demodulating block and micro-circuit board.
5. a kind of image scan test device of wafer sorting machine according to claim 1, it is characterised in that: the control
Line is received by power supply line, transmission line of information and information inside the integrated line of mainboard (8) connection processed to constitute.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820327698.1U CN208466554U (en) | 2018-03-11 | 2018-03-11 | A kind of image scan test device of wafer sorting machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820327698.1U CN208466554U (en) | 2018-03-11 | 2018-03-11 | A kind of image scan test device of wafer sorting machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208466554U true CN208466554U (en) | 2019-02-05 |
Family
ID=65205972
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820327698.1U Expired - Fee Related CN208466554U (en) | 2018-03-11 | 2018-03-11 | A kind of image scan test device of wafer sorting machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208466554U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114700285A (en) * | 2022-03-31 | 2022-07-05 | 深圳市联得自动化装备股份有限公司 | Chip sorting device, equipment and method |
-
2018
- 2018-03-11 CN CN201820327698.1U patent/CN208466554U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114700285A (en) * | 2022-03-31 | 2022-07-05 | 深圳市联得自动化装备股份有限公司 | Chip sorting device, equipment and method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190205 |