CN208420981U

CN208420981U - A kind of IC functional test seat

Info

Publication number: CN208420981U
Application number: CN201820590998.9U
Authority: CN
Inventors: 杨飞
Original assignee: Shenzhen Kai Li Di Technology Co Ltd
Current assignee: Shenzhen Kai Li Di Technology Co Ltd
Priority date: 2018-04-24
Filing date: 2018-04-24
Publication date: 2019-01-22
Anticipated expiration: 2028-04-24

Abstract

The utility model discloses a kind of IC functional test seats, including pedestal, upper cover, buckle, double ended probes, fixture block, hinge, the upper cover bottom is equipped with hinge, hinge is to be threadedly coupled with upper cover, the hinged base is equipped with pedestal, pedestal is to be threadedly coupled with hinge, the upper tops are equipped with buckle, buckle is to be fixedly connected with upper cover, spring is equipped with inside the double ended probes, spring is to inlay to connect with double ended probes, the spring top is equipped with upper probe, upper probe and spring are to be electrically connected, the spring top is equipped with lower probe, lower probe and spring are to be electrically connected, the susceptor surface is equipped with fixture block, fixture block is to inlay to connect with pedestal, a kind of IC functional test seat, by being equipped with double ended probes in equipment, double ended probes advantageously reduces orifice plate, it can be filled in order to probe groups, replacement, maintenance, impedance compared with It is small, it can be ensured that conducting has preferable communication frequency, while improving the accuracy of test, the utility model infrastructure cost is low, use easy to spread.

Description

A kind of IC functional test seat

Technical field

The utility model relates to electronic product test equipment technical field, specially a kind of IC functional test seat.

Background technique

Integrated circuit, English are Integrated Circuit, are abbreviated as IC；It is exactly a certain number of common electronics members Line between part, such as resistance, capacitor, transistor and these elements, has by what semiconductor technology integrated The circuit of specific function.It is a kind of semiconductor device to grow up one sixties of later period the 1950s.It is through The semiconductor fabrication process such as peroxidating, photoetching, diffusion, extension, evaporation of aluminum are partly led needed for the circuit with certain function constituting The elements such as body, resistance, capacitor and the connecting wire between them are fully integrated on a fritter silicon wafer, and then welding is encapsulated in one Electronic device in a shell.Its package casing has the diversified forms such as round shell-type, flat or dual inline type.Integrated circuit skill Art includes chip fabrication techniques and designing technique, is mainly reflected in process equipment, processing technology, packaging and testing, batch production and In the ability of design innovation.IC functional test seat is tested the electrical property of IC device and electrical connection to check production system Make defect and a kind of undesirable standard test equipment of component.IC functional test seat is mainly used for checking online single IC function Test simulation device function and the test of digital device logic function.The main purpose of IC functional test is to guarantee device severe The function and performance indicator of design specification book defined can be fully achieved under environmental condition.

But existing IC functional test seat is unfavorable for probe assembling, replacement, maintenance, communication frequency is poor, the essence of test Exactness is lower, we devise a kind of a novel IC functional test seat thus, and solving traditional IC functional test seat makes With inconvenient problem.

Utility model content

The purpose of this utility model is to provide a kind of IC functional test seats, to solve existing technological deficiency and cannot reach The technical requirements arrived.

To achieve the above object, the utility model provides the following technical solutions: a kind of IC functional test seat, including pedestal, Upper cover, buckle, double ended probes, spring, upper probe, lower probe, fixture block, hinge, the upper cover bottom be equipped with hinge, hinge with it is upper For lid to be threadedly coupled, the hinged base is equipped with pedestal, and pedestal is to be threadedly coupled with hinge, and the upper tops are equipped with buckle, Buckle is to be fixedly connected with upper cover, and spring is equipped with inside the double ended probes, and spring is to inlay to connect with double ended probes, the bullet Upper probe is equipped at the top of spring, upper probe and spring are to be electrically connected, and the spring top is equipped with lower probe, and lower probe is with spring It is electrically connected, the susceptor surface is equipped with fixture block, and fixture block is to inlay to connect with pedestal.

As a kind of preferred embodiment of the utility model, the base bottom is equipped with pcb board, and pcb board is with pedestal It is detachably connected.

As a kind of preferred embodiment of the utility model, the upper lid surface is equipped with briquetting, and briquetting and upper cover are solid Fixed connection, briquetting shape are cuboid.

As a kind of preferred embodiment of the utility model, the chassis interior is equipped with IC posting, IC posting with Pedestal is to inlay connection.

As a kind of preferred embodiment of the utility model, double ended probes is equipped with inside the IC posting, double end is visited Needle is to inlay to connect with IC posting.

Compared with prior art, the beneficial effects of the utility model are as follows:

Compared with a kind of traditional IC functional test seat, a kind of IC functional test seat after improvement is equipped with double end in equipment Probe, double ended probes advantageously reduce orifice plate, can fill in order to probe groups, replacement, maintenance, and impedance is smaller, it can be ensured that conducting has Preferable communication frequency, while also improving the accuracy of test.

Detailed description of the invention

Fig. 1 is a kind of IC functional test holder structure schematic diagram of the utility model；

Fig. 2 is a kind of IC functional test seat schematic diagram of base structure of the utility model.

Fig. 3 is a kind of IC functional test seat double ended probes structural schematic diagram of the utility model；

In figure: pedestal -1, upper cover -2, pcb board -3, buckle -4, briquetting -5, IC posting -6, double ended probes -7, spring - 71, upper probe -72, lower probe -73, fixture block -8, hinge -9.

Specific embodiment

The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work Every other embodiment obtained, fall within the protection scope of the utility model.

Please refer to Fig. 1-3, the utility model provides a kind of technical solution: a kind of IC functional test seat, including pedestal 1, on Lid 2, buckle 4, double ended probes 7, spring 71, upper probe 72, lower probe 73, fixture block 8, hinge 9,2 bottom of upper cover is equipped with hinge Chain 9, hinge 9 are to be threadedly coupled with upper cover 2, and 9 bottom of hinge is equipped with pedestal 1, and pedestal 1 is to be threadedly coupled with hinge 9, described Buckle 4 is equipped at the top of upper cover 2, buckle 4 is to be fixedly connected with upper cover 2, and spring 71, spring 71 are equipped with inside the double ended probes 7 It is to inlay to connect with double ended probes 7, upper probe 72 is equipped at the top of the spring 71, upper probe 72 is to be electrically connected with spring 71, Lower probe 73 is equipped at the top of the spring 71, lower probe 73 is to be electrically connected with spring 71, and 1 surface of pedestal is equipped with fixture block 8, Fixture block 8 is to inlay to connect with pedestal 1.

1 bottom of pedestal is equipped with pcb board 3, and pcb board 3 is to be detachably connected with pedestal 1, and pcb board 3 is printed circuit board, It is made of electron printing, avoids the mistake of artificial wiring, and can realize that electronic component is inserted or mounted automatically, is automatic Scolding tin, automatic detection.

2 surface of upper cover is equipped with briquetting 5, and briquetting 5 is to be fixedly connected with upper cover 2, and 5 shape of briquetting is cuboid, briquetting 5 It is capable of fixing IC to be tested and IC to be tested is enable well to contact with two-sided thimble.

IC posting 6 is equipped with inside the pedestal 1, IC posting 6 is to inlay to connect with pedestal 1, and IC posting 6 is used to put Set IC to be tested.

Double ended probes 7 is equipped with inside the IC posting 6, double ended probes 7 is to inlay to connect with IC posting 6, and double end is visited Needle advantageously reduces orifice plate, can fill in order to probe groups, replacement, maintenance, and impedance is smaller, it can be ensured that conducting has preferable communication Frequency, while also improving the accuracy of test.

When IC functional test seat a kind of using the utility model, determining what a kind of IC functional test seat can operate normally Under state, pedestal 1 and upper cover 2 can be separated by buckle 4 and fixture block 8, for the IC posting 6 on 1 surface of pedestal for placing IC, IC is fixed Position frame 6 matches with briquetting 5, and the upper probe 72 for the double ended probes 7 being equipped in IC posting 6 is used for IC in electrical contact, lower probe 73 are used for pcb board 3 in electrical contact, and IC is put into IC posting 6, make IC to be tested and upper probe 72 are good to contact and again unlikely Excessive in pressure, lower probe 73 is contacted with pcb board 3, and pcb board 3 is connected to the stitch of test bench simultaneously, and stitch is plugged in test IC to be tested can be detected in equipment.

The pedestal 1 of the utility model, upper cover 2, pcb board 3, buckle 4, briquetting 5, IC posting 6, double ended probes 7, spring 71, upper probe 72, lower probe 73, fixture block 8, hinge 9, component are universal standard part or portion as known to those skilled in the art Part, structure and principle are all that this technology personnel can be learnt by technical manual or be known by routine experiment method, this reality Solve the problems, such as it is that existing IC functional test seat is unfavorable for probe assembling, replacement, maintenance with novel, communication frequency is poor, surveys The accuracy of examination is lower, and the utility model can be realized by being combined with each other for above-mentioned component, by the way that double end is arranged in equipment Probe advantageously reduces orifice plate, can fill in order to probe groups, replacement, maintenance, and impedance is smaller, it can be ensured that conducting has preferable logical News frequency rate, while also improving the accuracy of test.

The basic principles and main features of the present invention and the advantages of the present invention have been shown and described above, for For those skilled in the art, it is clear that the present invention is not limited to the details of the above exemplary embodiments, and without departing substantially from this In the case where the spirit or essential attributes of utility model, the utility model can be realized in other specific forms.Therefore, no matter From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the utility model is by institute Attached claim rather than above description limit, it is intended that will fall within the meaning and scope of the equivalent elements of the claims All changes are embraced therein.It should not treat any reference in the claims as limiting related right It is required that.

In addition, it should be understood that although this specification is described in terms of embodiments, but not each embodiment is only wrapped Containing an independent technical solution, this description of the specification is merely for the sake of clarity, and those skilled in the art should It considers the specification as a whole, the technical solutions in the various embodiments may also be suitably combined, forms those skilled in the art The other embodiments being understood that.

Claims

1. a kind of IC functional test seat, including pedestal (1), upper cover (2), buckle (4), double ended probes (7), spring (71), upper spy Needle (72), lower probe (73), fixture block (8), hinge (9), it is characterised in that: upper cover (2) bottom is equipped with hinge (9), hinge It (9) is to be threadedly coupled with upper cover (2), hinge (9) bottom is equipped with pedestal (1), and pedestal (1) is to be threadedly coupled with hinge (9), Buckle (4) is equipped at the top of the upper cover (2), buckle (4) is to be fixedly connected with upper cover (2), is equipped with inside the double ended probes (7) Spring (71), spring (71) are to inlay to connect with double ended probes (7), are equipped with upper probe (72) at the top of the spring (71), upper spy Needle (72) and spring (71) are to be electrically connected, and lower probe (73), lower probe (73) and spring are equipped at the top of the spring (71) (71) to be electrically connected, pedestal (1) surface is equipped with fixture block (8), and fixture block (8) is to inlay to connect with pedestal (1).

2. a kind of IC functional test seat according to claim 1, it is characterised in that: pedestal (1) bottom is equipped with pcb board (3), pcb board (3) is to be detachably connected with pedestal (1).

3. a kind of IC functional test seat according to claim 1, it is characterised in that: upper cover (2) surface is equipped with briquetting (5), briquetting (5) is to be fixedly connected with upper cover (2), and briquetting (5) shape is cuboid.

4. a kind of IC functional test seat according to claim 1, it is characterised in that: the pedestal (1) is internal fixed equipped with IC Position frame (6), IC posting (6) are to inlay to connect with pedestal (1).

5. a kind of IC functional test seat according to claim 4, it is characterised in that: be equipped with inside the IC posting (6) Double ended probes (7), double ended probes (7) are to inlay to connect with IC posting (6).