CN208224308U - Optical device test bench - Google Patents

Abstract

The utility model provides a kind of optical device test bench, comprising: an electrical isolation ontology, a separating part and multiple conductive terminals；Wherein electrical isolation ontology has the channel of perforation electrical isolation ontology；The channel of electrical isolation ontology is arranged in the separating part, separating part is multiple perforation for penetrating through electrical isolation ontologies to the channel partition for the ontology that will be electrically insulated with multiple partitions, each perforation is equipped with conductive terminal, wherein the top of separating part is the top of bullet and prominent electrical isolation ontology, and the transverse shape on the top of each partition is wide to form a wall knife on the top of the partition under upper point；Wherein conductive terminal includes at least: a plug division of tubulose and a terminal supportor, the interior sidewall surface of the plug division of tubulose has at least three towards the axle center of conductive terminal elastic slice outstanding, and terminal supportor connects with plug division and extend to towards the bottom end of electrical isolation ontology the position of the bottom end of at least prominent electrical isolation ontology.

Description

Optical device test bench

Technical field

The utility model is the test bench about a kind of electronic building brick, especially can successfully carry out the plug of optical device Optical device test bench.

Background technique

Most component for example semiconductor technology manufacture electronic device or optical device, manufacture complete and it is complete It after encapsulation, is usually also tested, to ensure the quality of component.Due to science and technology progress, many components Volume is more and more small, even after completing encapsulation and very small, the component of this very little will increase the survey of component Try difficulty.

In general, each first device has special a test equipment and test bench (test jack), test bench be to The electrical property of line element device and electrical connection are tested to check and manufacture defect and a kind of undesirable standard survey of component Try equipment.It is mainly used for checking the opening of online single component and each circuit network, short-circuit conditions, and must have The features such as easy to operate, quick rapid, failure order member is true.

For the component with terminal or pin after encapsulation, the component for being ready for test is usually used Component is inserted into scheduled test bench using fixture by manual or automaticization equipment operation fixture by special fixture, tradition Test bench according to corresponding tested person component number of terminals design have corresponding jack, be equipped among each jack Conduction connects son and constitutes electric connection with the terminal insertion for component, and the top surface of traditional test bench is planar design, for The jack of the terminal insertion of tested person component is distributed over the top surface of test bench, so in the member for clamping tested person using fixture After device, need accurately by the jack of the terminal alignment test bench of the component of tested person, it could be by first device of tested person The terminal of part is certainly inserted into corresponding conductive terminal in test bench.For test process for the plug of component operation, It is very difficult.

On the other hand, the conductive terminal in traditional test seat is usually a kind of tubular terminal, and the terminal of component is being inserted The process for entering the terminal of test bench and extracting from conductive terminal, will receive the plug behaviour of comparable resistance and unfavorable component Make, while there is biggish contact resistance.

Therefore, the above problem for how improving traditional test seat is always one of the target that component testing industry is made great efforts.

Utility model content

In view of this, the technical problem to be solved by the utility model is to provide a kind of optical device test benches.

In order to solve the above technical problems, a kind of embodiment of the utility model optical device test bench, comprising:

One electrical isolation ontology, electrical isolation ontology have top and bottom end, and electrical isolation ontology has along electrical isolation ontology Axial direction extends and penetrates through the channel of electrical isolation ontology；

The channel of electrical isolation ontology is arranged in one separating part, and separating part has multiple partitions, to the ontology that will be electrically insulated Channel partition is the perforation of multiple perforation electrical isolation ontologies, and the top of separating part is the top of bullet and prominent electrical isolation ontology End, the transverse shape on the top of each partition are wide to form a wall knife on the top of partition under upper point；And

Multiple conductive terminals are respectively and fixedly installed to multiple perforation of electrical isolation ontology, and the conductive terminal includes at least: The plug division of tubulose and terminal supportor, the interior sidewall surface of the plug division of tubulose have at least three to protrude towards the axle center of conductive terminal Elastic slice, terminal supportor connects with plug division and extends to the bottom of at least prominent electrical isolation ontology towards the bottom end of electrical isolation ontology The position at end.

As the preferred structure of the utility model optical device test bench, wherein multiple partitions of separating part are from electrical isolation ontology Channel axle center along electrical isolation ontology radial direction extend outwardly radially.

As the preferred structure of the utility model optical device test bench, wherein the lateral wall of electrical isolation ontology has at least two A guide groove, two guide grooves be located at electrical isolation ontology lateral wall be symmetrically electrically insulated ontology axle center position.

In the further preferred embodiments of the utility model optical device test bench, wherein the lateral wall tool of electrical isolation ontology There are four guide groove, the lateral wall that those guide grooves are located at electrical isolation ontology be symmetrically electrically insulated ontology axle center position.

In the further preferred embodiments of the utility model optical device test bench, including a cap, the cap have Loading end and at least two support legs；Loading end is flat structure, and loading end has multiple and electrical isolation ontology conduction The position of terminal is corresponding and penetrates the guide hole of loading end, and the upper surface of loading end has the support portion stretched out upwards, support Portion has multiple supporting clapboards to separate those guide holes；Two support legs are located at the symmetrical of the edge of loading end Position, the support leg are extended downwardly from loading end, and two support legs can be symmetrical with electric exhausted with wantonly two of electrical isolation ontology The guide groove in the axle center of edge ontology mutually fastens.

As the preferred structure of the utility model optical device test bench, wherein multiple support plates of support portion are from loading end Center extends outwardly radially, and appointing has a guide hole between two adjacent supporting clapboards.

As the preferred structure of the utility model optical device test bench, wherein there are four support legs for cap tool.

As the preferred structure of the utility model optical device test bench, wherein there are four perforation and four for electrical isolation ontology tool Conductive terminal.

As the preferred structure of the utility model optical device test bench, wherein there are five perforation and five for electrical isolation ontology tool Conductive terminal.

The beneficial effect of the utility model optical device test bench is, is surveyed using the utility model optical device test bench The terminal of the optical device of examination can be smoothly inserted into the plug division of conductive terminal under the guiding of the wall knife of partition；Conductive terminal Three elastic slices of plug division can reliably clamp the terminal of optical device, and have effects that low contact resistance；Electrical isolation The guide groove of ontology can be convenient the plug of fixture and provide the function of guiding；And the cap can prevent optical device very Long terminal or pin bends in swapping process or the problem of weak foot.

The detailed content of other effects and embodiment in relation to the utility model, cooperation schema are described as follows.

Detailed description of the invention

In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this The some embodiments recorded in application, for those of ordinary skill in the art, without creative efforts, It can also be obtained according to these attached drawings other attached drawings.

Fig. 1 is a kind of structural exploded view of embodiment of the utility model optical device test bench；

Fig. 2 is the construction outside drawing of the embodiment of Fig. 1；

Fig. 3 is the construction outside drawing at another visual angle of the embodiment of Fig. 1；

Fig. 4 is the construction top view of the embodiment of Fig. 1；

Fig. 5 is structure profile diagram of the Fig. 4 in the position A-A；

Fig. 6 is the structural exploded view of another embodiment of the utility model optical device test bench；

Fig. 7 is the construction top view of the embodiment of Fig. 6；

Fig. 8 is a kind of construction front view of embodiment of the conductive terminal of the utility model optical device test bench；

Fig. 9 is the construction top view of the conductive terminal of Fig. 8；

Figure 10 is the structural side view of the conductive terminal of Fig. 8；

Figure 11 is a kind of construction outside drawing of embodiment of the cap of the utility model optical device test bench；

Figure 12 is the construction outside drawing at another visual angle of the cap of Figure 11；

Figure 13 is the construction top view of the cap of Figure 11；

Figure 14 is the use schematic diagram of the cap of the utility model optical device test bench.

Symbol description

10 electrical isolation 101 tops of ontology

102 bottom end, 11 channel

12 13 fixed feets of perforation

14 guide groove, 20 separating part

201 partition, 21 wall knife

30 conductive terminal, 31 plug division

311 elastic slice, 312 seam

32 terminal supportor, 33 barb

40 cap, 41 loading end

42 support leg, 43 guide hole

44 support portion, 441 supporting clapboard

A optical device B terminal

C fixture

Specific embodiment

Positional relationship described in embodiment below, comprising: on, under, left and right, if being all without specializing On the basis of the direction that component in schema is painted.

It is a kind of structural exploded view, outer of embodiment of the utility model optical device test bench referring initially to FIG. 1 to FIG. 4 See figure and construction top view.A kind of embodiment of the utility model optical device test bench, comprising: 10, one points of ontology of an electrical isolation Every portion 20 and multiple conductive terminals 30.It is with a kind of TO-CAN in the embodiment being painted in the utility model institute accompanying drawings (see Fig. 5) for the optical device of encapsulation, but it is not limited thereto.

Electrical isolation ontology 10 is to manufacture (such as plastics) using electrically insulating material, and electrical isolation ontology 10 has 101 He of top Bottom end 102, electrical isolation ontology 10, which has, extends along the axial direction of electrical isolation ontology 10 and penetrates through electrical isolation ontology 10 Channel 11.

The channel 11 of electrical isolation ontology 10 is arranged in separating part 20, and the preferred embodiment of separating part 20 is and the ontology that is electrically insulated 10 link into an integrated entity and have electrical insulating property, such as are manufactured by plastic ejection moulding technique；Separating part 20 have it is multiple every Perforation 12 of the plate 201 channel 11 for the ontology 10 that is electrically insulated to be divided into multiple perforation electrical isolation ontologies 10, each perforation 12 to install the conductive terminal 30, the number phase of the number of middle punch 12 according to the terminal B of corresponding optical device A Together, the top of separating part 20 is the top 101 of bullet and prominent electrical isolation ontology 10, the top of each partition 201 Transverse shape be it is upper point under it is wide to form a kind of wall knife 21 (see Fig. 5), the terminal B or pin of optical device A can be described The plug division 31 of conductive terminal 30 is smoothly inserted under the guiding of the wall knife 21 of partition 201.

In a kind of embodiment that Fig. 4 is painted, separating part 20 has radial partition 201, and the separating part 20 is from electricity The axle center in the channel 11 of insulating body 10 extends into multiple partitions along the radial direction of electrical isolation ontology 10 outwardly radially 201, there is gap, the perforation 12 of the electrical isolation ontology 10 is in place in office two adjacent between wantonly two adjacent partitions 201 Between partition 201；In the another embodiment that the 6th~7 figure is painted, wherein multiple partitions 201 of separating part 20 will be electrically insulated The channel 11 of ontology 10 is divided into a multiple group perforation 12 for distribution of counting, depending on the distribution mode of the terminal B of optical device A, because This, the distributing position of the partition 201 of the separating part 20 and the perforation 12 is not limited with above-mentioned radial or array.Separately On the one hand, the conductive terminal 30 of the utility model optical device test bench and the number of perforation 12 regard the terminal B of corresponding optical device A Number depending on, such as a kind of embodiment of optical device test bench that Fig. 1 is painted, wherein there are four perforation 12 for electrical isolation ontology 10 tool With four conductive terminals 30；A kind of embodiment of optical device test bench that Fig. 6~Fig. 7 is painted, wherein electrical isolation ontology 10 has five A perforation 12 and five conductive terminals 30.

Fig. 8~Figure 10 is that a kind of construction of embodiment of the conductive terminal 30 of the utility model optical device test bench is faced Figure, top view and side view.Conductive terminal 30 is separately fixed at the perforation 12 of electrical isolation ontology 10, and the conductive terminal 30 is at least Include: the plug division 31 of tubulose and terminal supportor 32, preferably, conductive terminal 30 can also be fastened on perforation 12 with barb 33 To fixed conductive terminals 30, the interior sidewall surface of the plug division 31 of tubulose has at least three towards conductive terminal 30 inner sidewall Axle center elastic slice 311 outstanding, these three elastic slices 311 are distributed in the position of the interior sidewall surface circumference in equal parts of the plug division 31 of tubulose, The terminal B of optical device A can be contacted after being inserted into plug division 31 with elastic slice 311, have the advantages that low contact resistance, terminal supportor 32 and the connection of plug division 31 and the bottom end that at least prominent electrical isolation ontology 10 is extended to towards the bottom end 102 of electrical isolation ontology 10 102 position, the part that the end of terminal supportor 32 is exposed are to the circuit electric connection with test equipment, such as by terminal supportor 32 end is welded on the circuit board of test equipment；Preferably, also having in the bottom end 102 of electrical isolation ontology 10 multiple outstanding The corresponding hole of the circuit board can be inserted in fixed feet 13, fixed feet 13, is fixed on to the ontology 10 that will be electrically insulated described The fixation position of circuit board.

Conductive terminal 30 is manufactured using conductive material, it is preferred to use metal manufacture, for example (,) it is curved by punching press and metal plate part Bent technique manufacture, one of embodiment plug division 31 are that tubulose is made by bending machining using copper sheet, and plug division 31 has There is axially extending seam 312 (see Fig. 9) to form a kind of seamed tubular structure, this plug division 31 can be in light Deformable elastic force is provided after terminal B (Pin) or pin the insertion plug division 31 of device A, and then reliably clamps optical device A Terminal B.

In the further embodiment of the utility model optical device test bench, wherein the lateral wall of electrical isolation ontology 10 has extremely Few two guide grooves 14, the lateral wall that two guide grooves 14 are located at electrical isolation ontology 10 are symmetrically electrically insulated the axle center of ontology 10 Position；A kind of preferred embodiment that Fig. 1 is painted, there are four guide groove 14, guide groove 14 is the lateral wall tool of electrical isolation ontology 10 A kind of groove structure for the lateral wall being recessed into electrical isolation ontology 10, as shown in figure 5, the fixture C of clamping optical device A is by light device Part A insertion or extract optical device survey formula seat swapping process in, by the guide groove 14 can be convenient fixture C plug and The function of guide jig C is provided.

It include a cap 40 in the further preferred embodiments of the utility model optical device test bench；Please referring to Figure 11 is The construction outside drawing and construction top view of a kind of embodiment of the cap of the utility model optical device test bench.

Wherein cap 40 has loading end 41 and at least two support legs 42, the utility model optical device test bench compared with Good embodiment, there are four support legs 42 for the tool of cap 40；Loading end 41 is flat structure, and loading end 41 has multiple and electricity exhausted The position of the conductive terminal 30 of edge ontology 10 is corresponding and penetrates the guide hole 43 of loading end 41, and the upper surface of loading end 41 has The support portion 44 stretched out upwards, support portion 44 have multiple supporting clapboards 441 to separate those guide holes 43, appoint two-phase Guide hole 43 described in there is one between adjacent supporting clapboard 441；Multiple support legs 42 are located at the edge of loading end 41 Symmetric position, support leg 42 extends downwardly from loading end 41, and support leg 42 can be symmetrical with electrical isolation the multiple of ontology 10 The guide groove 14 in the axle center of electrical isolation ontology 10 mutually fastens.

It is constructed in a kind of embodiment for the support portion 44 that Figure 11 is painted, is the optical device test bench to be painted with Fig. 1 With use, so multiple supporting clapboards 441 of support portion 44 towards external radiation are extended from the center of loading end 41, still, branch The distribution shape of multiple supporting clapboards 441 of support part 44 is not limited thereto.

For the optical device A with very long terminal B, cap 40 first can be fastened on electrical isolation originally by support leg 42 The guide groove 14 of body 10 is separating after the terminal B of optical device A can respectively initially pass through multiple guide holes 43 of loading end 41 It is smoothly inserted into the plug division 31 of conductive terminal 30 under the guiding of the wall knife 21 of the partition 201 in portion 20, then passes through cap 40 Optical device A (see Figure 14) is supported with the supporting clapboard 441 of support portion 44, can prevent the very long terminal B of optical device A from inserting It bends during pulling out or the problem of weak foot.

Embodiment described above and/or embodiment are only the preferable realities to illustrate to realize the utility model technology Example and/or embodiment are applied, not the embodiment of the utility model technology is made any form of restriction, any this field Technical staff, in the range for not departing from technological means disclosed in the content of the present invention, when can make a little change or modification For other equivalent embodiments, but still it should be regarded as technology identical with the utility model in essence or embodiment.

Claims (9)

1. a kind of optical device test bench characterized by comprising

One electrical isolation ontology, the electrical isolation ontology have top and bottom end, which has along the electrical isolation ontology Axial direction extend and penetrate through the channel of the electrical isolation ontology；

One separating part, the separating part are arranged in the channel of the electrical isolation ontology, which has multiple partitions, to should The channel partition of ontology of being electrically insulated is multiple perforation for penetrating through the electrical isolation ontologies, the top of the separating part be bullet and The top of the prominent electrical isolation ontology, the transverse shape on the top of each partition are wide in the partition under upper point Top forms a wall knife；And

Multiple conductive terminals, those conductive terminals are respectively and fixedly installed to those perforation of the electrical isolation ontology, the conductive terminal Include at least: a plug division of tubulose and a terminal supportor, the interior sidewall surface of the plug division of tubulose have at least three directions should The axle center of conductive terminal elastic slice outstanding, the terminal supportor connect with the plug division and extend towards the bottom end of the electrical isolation ontology To the position for the bottom end at least protruding the electrical isolation ontology.

2. optical device test bench as described in claim 1, which is characterized in that those partitions of the separating part are from the electrical isolation sheet The axle center in the channel of body extends outwardly radially along the radial direction of the electrical isolation ontology, wantonly two adjacent partitions Between there is gap, with the perforation between wantonly two adjacent partitions.

3. optical device test bench as described in claim 1, which is characterized in that the lateral wall of the electrical isolation ontology has at least two A guide groove, two guide grooves are located at the position in the axle center of the symmetrical electrical isolation ontology of lateral wall of the electrical isolation ontology.

4. optical device test bench as described in claim 1, which is characterized in that there are four lead the lateral wall tool of the electrical isolation ontology Slot, those guide grooves are located at the position in the axle center of the symmetrical electrical isolation ontology of lateral wall of the electrical isolation ontology.

5. optical device test bench as claimed in claim 4, which is characterized in that including a cap, which has a loading end At least two support legs；The loading end is flat structure, which there is multiple and the electrical isolation ontology this to lead The position of electric terminal is corresponding and penetrates the guide hole of the loading end, and the upper surface of the loading end has the support stretched out upwards Portion, the support portion have multiple supporting clapboards to separate those guide holes；Two support legs are located at the carrying The symmetric position at the edge in face, the support leg are extended downwardly from the loading end, those support legs can be with the electrical isolation ontology The guide groove in wantonly two axle center for being symmetrical with the electrical isolation ontology mutually fastens.

6. optical device test bench as claimed in claim 5, which is characterized in that there are four the support legs for cap tool.

7. optical device test bench as claimed in claim 5, which is characterized in that those support plates of the support portion are from the loading end Center extend outwardly radially, appoint two adjacent supporting clapboards between have the guide hole.

8. optical device test bench as described in claim 1, which is characterized in that there are four perforation and four to lead for electrical isolation ontology tool Electric terminal.

9. optical device test bench as described in claim 1, which is characterized in that there are five perforation and five to lead for electrical isolation ontology tool Electric terminal.