CN103063887A - Testing method, tool and device with probe automatically aligned at electrode - Google Patents
Testing method, tool and device with probe automatically aligned at electrode Download PDFInfo
- Publication number
- CN103063887A CN103063887A CN2012105893901A CN201210589390A CN103063887A CN 103063887 A CN103063887 A CN 103063887A CN 2012105893901 A CN2012105893901 A CN 2012105893901A CN 201210589390 A CN201210589390 A CN 201210589390A CN 103063887 A CN103063887 A CN 103063887A
- Authority
- CN
- China
- Prior art keywords
- electrode
- alignment
- probe
- testing
- entrance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 title claims abstract description 54
- 238000012360 testing method Methods 0.000 title claims abstract description 54
- 238000010998 test method Methods 0.000 claims description 9
- 238000002955 isolation Methods 0.000 claims description 4
- 238000003780 insertion Methods 0.000 claims description 3
- 230000037431 insertion Effects 0.000 claims description 3
- 238000009434 installation Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 4
- 238000005516 engineering process Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Images
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The invention relates to a testing method, a tool and a device with a probe automatically aligned at an electrode. The method includes the following steps: providing the tool which comprises a guide board, wherein a plurality of parallel guide grooves are formed in the guide board, a separating board used for separating testing probes is formed between every two adjacent guide grooves, a first inlet which is used for guiding an electrode of a tested object to enter the guide grooves is arranged on the end portion of each guide groove, a second inlet used for guiding the testing probes to enter the guide grooves is arranged on the side portion of each groove, and the guide grooves are formed according to standard positions of the electrode of the tested object; arranging single or multiple testing probe according to needs of a electrical parameter of the electrode of the tested object; inserting the electrode of the tested object directly through the first inlets, wherein the electrode of the tested object is automatically corrected to the standard position in the process of inserting; moving the testing probes, wherein the testing probes enter the guide grooves from the second inlets and are accurately contacted with the electrode of the tested object. The device is composed of a plurality of tools. The testing method, the tool and the device with the probe automatically aligned at the electrode are simple and easy to achieve, high in testing efficiency, strong in generality and low in cost.
Description
Technical field
The present invention relates to a kind of probe auto-alignment electrode test method, instrument and device thereof.
Background technology
When electronic unit (such as integrated circuit) is tested, often can use the test probe of many activities, whole test process all requires to stablize between the probe isolation and probe is accurately aimed at and effectively contacted with the measured body electrode.In order to satisfy these requirements, generally need complicated localization method, efficient and versatility are lower, and testing cost is high.
Summary of the invention
The present invention is directed to the problem that above-mentioned prior art exists and make improvements, namely the technical problem to be solved in the present invention provide a kind of locate simple, testing efficiency is high, highly versatile and low probe auto-alignment electrode alignment method of testing, instrument and the device thereof of testing cost.
In order to solve the problems of the technologies described above, technical scheme one of the present invention is: a kind of probe auto-alignment electrode alignment testing tool, comprise guide plate, offer a plurality of side by side parallel guide channels on the described guide plate, form the dividing plate of isolation test probe between two adjacent guide channels, the end of described guide channel has guiding measured body electrode and enters the first interior entrance of guide channel, described the first entrance is horn opening, and the sidepiece of described guide channel has the guiding test probe and enters the second interior entrance of guide channel.
In order to solve the problems of the technologies described above, technical scheme two of the present invention is: a kind of probe auto-alignment electrode alignment proving installation, comprise a plurality of aforesaid probe auto-alignment electrode alignment testing tools, those probe auto-alignment electrode alignment testing tools are made into one, are combined into one or are connected in series.
In order to solve the problems of the technologies described above, technical scheme three of the present invention is: a kind of probe auto-alignment electrode alignment method of testing, carry out according to the following steps: (1) provides a kind of aforesaid probe auto-alignment electrode alignment testing tool, and wherein guide channel is to offer according to the normal place of measured body electrode; (2) according to the electrical quantity needs of each measured body electrode, arrange single or multiple testing probe; (3) directly insert the measured body electrode from the first entrance, described measured body electrode during insertion by automatic straightening to normal place; (4) mobile test probe, described test probe enters in the guide channel from the second entrance, and does not accurately contact to off normal the measured body electrode fully under the guiding of guide channel.
Compared with prior art, the present invention has following beneficial effect: this probe auto-alignment electrode alignment testing tool is simple in structure, cost of manufacture is low, the location is quick and highly versatile, be conducive to improve testing efficiency, can be neatly be used for testing the electrical quantity of the measured body electrode of various multi-form and quantity; The guide channel of this probe auto-alignment electrode alignment method of testing by special construction can automatic calibration by the lateral body electrode position to normal place, and isolate accurately aligning and effectively contacting of adjacent test probe, guiding test probe and measured body electrode, locate simple, testing efficiency is high, highly versatile and cost are low, all right a large amount of and multi-direction ground distribution tests probe is to reach different test requests.
The present invention is further detailed explanation below in conjunction with the drawings and specific embodiments.
Description of drawings
Fig. 1 is the organigram of the embodiment of the invention one.
Fig. 2 is the test mode figure one of the embodiment of the invention one.
Fig. 3 is the test mode figure two of the embodiment of the invention one.
Fig. 4 is the organigram of the embodiment of the invention two.
Among the figure: 1-guide plate, 2-guide channel, 3-dividing plate, 4-the first entrance, 5-the second entrance, 6-test probe, 7-measured body electrode, 8-measured body body.
Embodiment
Embodiment one: shown in Fig. 1 ~ 3, a kind of probe auto-alignment electrode alignment testing tool, comprise guide plate 1, offer a plurality of side by side parallel guide channels 2 on the described guide plate 1, form the dividing plate 3 of isolation test probe 6 between two adjacent guide channels 2, the end of described guide channel 2 has the first entrance 4 that guiding measured body electrode 7 enters in the guide channel 2, described the first entrance 4 is horn opening, and the sidepiece of described guide channel 2 has guiding test probe 6 and enters the second entrance 5 in the guide channel 2.In actual use, a plurality of probe auto-alignment electrode alignment testing tools can be used in combination, be made into the one use or be connected in series use etc., to satisfy the electric parameters testing needs of measured body body 8 a large amount of and multidirectional measured body electrodes 7.
Shown in Fig. 2 ~ 3, a kind of probe auto-alignment electrode alignment method of testing, carry out according to the following steps: (1) provides a kind of aforesaid probe auto-alignment electrode alignment testing tool, and wherein guide channel 2 is to offer according to the normal place of measured body electrode 7; (2) according to the electrical quantity needs of each measured body electrode 7, arrange single or multiple testing probe 6; (3) directly insert measured body electrode 7 from the first entrance 4, described measured body electrode 7 during insertion by automatic straightening to normal place; (4) the mobile test probe 6, and described test probe 6 enters in the guide channel 2 from the second entrance 5, and accurately do not contact to off normal measured body electrode 7 fully under the guiding of guide channel 2.
Embodiment two: as shown in Figure 4, insert for the ease of test probe 6 ground, the second entrance 5 among the embodiment one also can be offered the flue opening, its method of testing is the same.
The above only is preferred embodiment of the present invention, and all equalizations of doing according to the present patent application claim change and modify, and all should belong to covering scope of the present invention.
Claims (5)
1. probe auto-alignment electrode alignment testing tool, it is characterized in that: comprise guide plate, offer a plurality of side by side parallel guide channels on the described guide plate, form the dividing plate of isolation test probe between two adjacent guide channels, the end of described guide channel has guiding measured body electrode and enters the first interior entrance of guide channel, described the first entrance is horn opening, and the sidepiece of described guide channel has the guiding test probe and enters the second interior entrance of guide channel.
2. probe auto-alignment electrode alignment testing tool according to claim 1, it is characterized in that: described the second entrance is horn opening.
3. probe auto-alignment electrode alignment proving installation, it is characterized in that: comprise a plurality of probe auto-alignment electrode alignment testing tools as claimed in claim 1, those probe auto-alignment electrode alignment testing tools are made into one, are combined into one or are connected in series.
4. probe auto-alignment electrode alignment method of testing, it is characterized in that, carry out according to the following steps: (1) provides a kind of probe auto-alignment electrode alignment testing tool as claimed in claim 1, and wherein guide channel is to offer according to the normal place of measured body electrode; (2) according to the electrical quantity needs of each measured body electrode, arrange single or multiple testing probe; (3) directly insert the measured body electrode from the first entrance, described measured body electrode during insertion by automatic straightening to normal place; (4) mobile test probe, described test probe enters in the guide channel from the second entrance, and does not accurately contact to off normal the measured body electrode fully under the guiding of guide channel.
5. probe auto-alignment electrode alignment method of testing according to claim 4, it is characterized in that: described the second entrance is horn opening.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012105893901A CN103063887A (en) | 2012-12-31 | 2012-12-31 | Testing method, tool and device with probe automatically aligned at electrode |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012105893901A CN103063887A (en) | 2012-12-31 | 2012-12-31 | Testing method, tool and device with probe automatically aligned at electrode |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103063887A true CN103063887A (en) | 2013-04-24 |
Family
ID=48106596
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012105893901A Pending CN103063887A (en) | 2012-12-31 | 2012-12-31 | Testing method, tool and device with probe automatically aligned at electrode |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103063887A (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105334446A (en) * | 2015-09-23 | 2016-02-17 | 南京协辰电子科技有限公司 | Method for aligning workpiece to tool in electrical testing |
| CN106918727A (en) * | 2017-01-26 | 2017-07-04 | 苏州佳世达电通有限公司 | A kind of automatic plug line test device |
| CN107430150A (en) * | 2015-03-13 | 2017-12-01 | 泰克诺探头公司 | Test head with vertical probe especially for high-frequency applications |
| CN108235214A (en) * | 2017-12-28 | 2018-06-29 | 上海传英信息技术有限公司 | A kind of cavity for test horn and the acoustic test equipment with the cavity |
| CN109782103A (en) * | 2019-03-11 | 2019-05-21 | 潘元志 | The alignment methods and system of probe and pin of electronic device |
| CN111665428A (en) * | 2019-03-08 | 2020-09-15 | 致茂电子(苏州)有限公司 | Electronic component testing method and testing probe |
| CN112083049A (en) * | 2020-10-20 | 2020-12-15 | 爱奥乐医疗器械(深圳)有限公司 | Electrochemical test paper capable of correcting detection position and detection device |
| CN115390002A (en) * | 2022-08-11 | 2022-11-25 | 国网河北省电力有限公司营销服务中心 | Calibrating device and method compatible with calibration of multiple electric energy meters |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1079340A (en) * | 1992-05-13 | 1993-12-08 | 富士康国际股份有限公司 | Integrated circuit socket and contact thereof |
| JPH0921828A (en) * | 1995-07-06 | 1997-01-21 | Nippon Denshi Zairyo Kk | Vertically actuated probe card |
| CN2549589Y (en) * | 2002-04-23 | 2003-05-07 | 寰邦科技股份有限公司 | A support plate and seat cover assembly |
| US20060022686A1 (en) * | 2004-07-28 | 2006-02-02 | Mjc Probe Incorporation | Integrated circuit probe card |
| TW200823463A (en) * | 2006-11-22 | 2008-06-01 | Taiwan Semiconductor Mfg | Ultra-fine pitch probe card structure |
| US20090261850A1 (en) * | 2008-04-21 | 2009-10-22 | Willtechnology Co., Ltd. | Probe card |
| CN102053173A (en) * | 2009-11-04 | 2011-05-11 | 日本麦可罗尼克斯股份有限公司 | Probe guiding member, probe plate and test method of semiconductor device using the guiding member |
| CN203117236U (en) * | 2012-12-31 | 2013-08-07 | 福建合顺微电子有限公司 | Electrical parameter automatic alignment testing tool and device applying same |
-
2012
- 2012-12-31 CN CN2012105893901A patent/CN103063887A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1079340A (en) * | 1992-05-13 | 1993-12-08 | 富士康国际股份有限公司 | Integrated circuit socket and contact thereof |
| JPH0921828A (en) * | 1995-07-06 | 1997-01-21 | Nippon Denshi Zairyo Kk | Vertically actuated probe card |
| CN2549589Y (en) * | 2002-04-23 | 2003-05-07 | 寰邦科技股份有限公司 | A support plate and seat cover assembly |
| US20060022686A1 (en) * | 2004-07-28 | 2006-02-02 | Mjc Probe Incorporation | Integrated circuit probe card |
| TW200823463A (en) * | 2006-11-22 | 2008-06-01 | Taiwan Semiconductor Mfg | Ultra-fine pitch probe card structure |
| US20090261850A1 (en) * | 2008-04-21 | 2009-10-22 | Willtechnology Co., Ltd. | Probe card |
| CN102053173A (en) * | 2009-11-04 | 2011-05-11 | 日本麦可罗尼克斯股份有限公司 | Probe guiding member, probe plate and test method of semiconductor device using the guiding member |
| CN203117236U (en) * | 2012-12-31 | 2013-08-07 | 福建合顺微电子有限公司 | Electrical parameter automatic alignment testing tool and device applying same |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107430150A (en) * | 2015-03-13 | 2017-12-01 | 泰克诺探头公司 | Test head with vertical probe especially for high-frequency applications |
| CN105334446A (en) * | 2015-09-23 | 2016-02-17 | 南京协辰电子科技有限公司 | Method for aligning workpiece to tool in electrical testing |
| CN105334446B (en) * | 2015-09-23 | 2018-07-20 | 南京泊纳莱电子科技有限公司 | A kind of electrical measurement alignment method between workpiece and jig and system |
| CN106918727A (en) * | 2017-01-26 | 2017-07-04 | 苏州佳世达电通有限公司 | A kind of automatic plug line test device |
| CN106918727B (en) * | 2017-01-26 | 2021-02-19 | 苏州佳世达电通有限公司 | Automatic plug wire testing device |
| CN108235214A (en) * | 2017-12-28 | 2018-06-29 | 上海传英信息技术有限公司 | A kind of cavity for test horn and the acoustic test equipment with the cavity |
| CN108235214B (en) * | 2017-12-28 | 2021-04-30 | 上海传英信息技术有限公司 | Cavity for testing horn and acoustic testing equipment with cavity |
| CN111665428A (en) * | 2019-03-08 | 2020-09-15 | 致茂电子(苏州)有限公司 | Electronic component testing method and testing probe |
| CN109782103A (en) * | 2019-03-11 | 2019-05-21 | 潘元志 | The alignment methods and system of probe and pin of electronic device |
| CN109782103B (en) * | 2019-03-11 | 2021-07-30 | 镇江宏祥自动化科技有限公司 | Alignment method and system for probe and electronic device pin |
| CN112083049A (en) * | 2020-10-20 | 2020-12-15 | 爱奥乐医疗器械(深圳)有限公司 | Electrochemical test paper capable of correcting detection position and detection device |
| CN115390002A (en) * | 2022-08-11 | 2022-11-25 | 国网河北省电力有限公司营销服务中心 | Calibrating device and method compatible with calibration of multiple electric energy meters |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103063887A (en) | Testing method, tool and device with probe automatically aligned at electrode | |
| CN102707188B (en) | Audio connector testing device | |
| CN203673038U (en) | Aging testboard for residual-current circuit breaker | |
| CN102121979A (en) | Insertion device for detecting electric energy meter and detection system of electric energy meter | |
| CN102735990A (en) | Device for measuring currents in electricity supply networks | |
| CN102749565A (en) | Horizontal transformer dielectric-strength testing jig for | |
| CN105424987A (en) | Electrical-connector electrical performance detection fixture and electrical-connector electrical performance test system | |
| CN107677981A (en) | It is a kind of to patch line apparatus for electric energy meter detection | |
| CN202471641U (en) | Water quality detection system and probe thereof | |
| CN203117236U (en) | Electrical parameter automatic alignment testing tool and device applying same | |
| CN201583561U (en) | Measuring clamp of side surface pin LED | |
| CN201540311U (en) | A jig for measuring internal resistance of a battery | |
| CN209182490U (en) | A kind of electric instrument measuring device | |
| CN101676736B (en) | Test wiring platform containing multiple groups of wiring plates | |
| CN102262186A (en) | Antenna testing jig | |
| CN201892687U (en) | Universal test clamp of mobile phone battery | |
| KR102083882B1 (en) | Impregnation inspection device for secondary battery | |
| CN203365488U (en) | Probe type connector detection apparatus | |
| CN204760358U (en) | A adapter for IPM and IGBT test | |
| CN102914670B (en) | Insulation resistance test clamp | |
| CN202305343U (en) | Tensile test device for lead wires of electrical components | |
| CN222125405U (en) | Battery cell testing equipment and system | |
| CN203719677U (en) | An instrument clamping apparatus used for a test board | |
| CN206832948U (en) | A kind of FT test fixture part | |
| CN205280863U (en) | A automatic testing keysets for cable |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20130424 |