CN208140880U

CN208140880U - Biometric sensor apparatus for testing chip under a kind of screen

Info

Publication number: CN208140880U
Application number: CN201820639176.5U
Authority: CN
Inventors: 张术利
Original assignee: Shanghai Li Yang Chuang Chip Testing Co Ltd
Current assignee: Shanghai Li Yang Chuang Chip Testing Co Ltd
Priority date: 2018-04-28
Filing date: 2018-04-28
Publication date: 2018-11-23
Anticipated expiration: 2028-04-28

Abstract

The utility model provides biometric sensor apparatus for testing chip under a kind of screen, including sequentially connected test machine, probe card and FPGA board, the test machine is electrically connected with FPGA board, it is additionally provided with the light cylinder connecting with probe card, the light cylinder is for irradiating the chip under test put on the probe card, after in light cylinder irradiation light to chip under test, chip under test simulates the identification data for shielding lower biometric sensor, after FPGA board carries out operation to identification data, operation result is sent to test machine to be tested, without being simulated with dedicated instrument to lower biometric sensor chip is shielded, it reduces costs.

Description

Biometric sensor apparatus for testing chip under a kind of screen

Technical field

The utility model relates to apparatus for testing chip, in particular to biometric sensor chip testing fills under a kind of screen It sets.

Background technique

Biometric sensor chip is just preferred by everyone since emerging, and application range is also very wide, mainly It applies in terms of the electronic products such as smart phone, computer.With the update of electronic product, common bio-identification has met The not demand of people, therefore shield lower biometric sensor chip and come into being.

When to biometric sensor chip is tested under screen, under chip under test need to be made in running order, then The chip under test is tested again.Current common practice is that chip under test is made to be in work shape using dedicated test equipment Under state, then directly the chip under test under in running order is tested, but dedicated test equipment cost is high, it is difficult With volume production.

Utility model content

The purpose of the utility model is to provide biometric sensor apparatus for testing chip under a kind of screen of low cost.

In order to achieve the above object, the utility model provides biometric sensor apparatus for testing chip under a kind of screen, packet Sequentially connected test machine, probe card and FPGA board are included, the test machine is electrically connected with FPGA board, is additionally provided with and probe card The light cylinder of connection, the light cylinder is for irradiating the chip under test put on the probe card.

Preferably, the test machine is electrically connected with FPGA board by USB.

Preferably, the probe card is equipped with the location hole for connecting light cylinder, and the light cylinder is equipped with for being inserted into location hole Positioning inserting column.

Preferably, the FPGA board is equipped with multiple chip test circuits, and each chip test circuit corresponding one tested Chip.

Preferably, the test machine is equipped with the display device for showing test result.

The utility model has the advantages that：After in light cylinder irradiation light to chip under test, chip under test is simulated Operation result is sent to survey after FPGA board carries out operation to identification data by the identification data for shielding lower biometric sensor Test-run a machine is tested, and without being simulated with dedicated instrument to lower biometric sensor chip is shielded, is reduced costs.

Detailed description of the invention

Fig. 1 is the structural block diagram shielding lower biometric sensor chip apparatus and connecting with chip under test；

Fig. 2 is the structural schematic diagram of probe card；

Fig. 3 is the structural schematic diagram of light cylinder.

Appended drawing reference：1-PCB plate；2- probe base；3- location hole；4- light cylinder；41- positions inserting column.

Specific embodiment

As shown in Figure 1, test machine, probe card and FPGA board are sequentially connected, FPGA board is separately electrically connected survey by USB Test-run a machine, test machine are equipped with display device (not shown).

Probe card is used as the medium of chip under test electrical connection test machine and FPGA board, and chip under test is put on the probe card Chip under test electrical connection test machine and FPGA board can be enabled.

As shown in Fig. 2, probe card includes pcb board 1 and probe base 2, probe base 2 is for placing chip under test, in PCB For connecting the location hole 3 of light cylinder 4 there are two being set on plate 1.As shown in figure 3, setting on light cylinder 4, there are two position inserting column 41, positioning After inserting column 41 is inserted into location hole 3, light cylinder 4 is directed at the chip under test being placed on probe base 2, and the light that light cylinder 4 issues is radiated at On chip under test.Chip under test is to shield lower biometric sensor chip, can be simulated after being irradiated by light in work shape Identification data under state.

In test, light cylinder 4 is irradiated to light on the chip under test for being placed on probe card, and chip under test is simulated in work Make the identification data under state.Test machine sends test command to FPGA board through probe card, and FPGA board receives test life After order, test command is decoded to obtain decoding data, then be sent to decoding data through probe card and put on the probe card Chip under test.After chip under test receives the test command decoding data from FPGA board, identification data through probe card It reaches in FPGA board, FPGA board carries out operation according to the identification data, then operation result is reached test machine by USB In.After test machine receives the operation result from FPGA board, operation result is compared with preset theoretical value, according to Comparison result judges whether the performance of chip under test is good, then using judging result as test result, by test machine Display device is shown.

FPGA board is equipped with multiple chip test circuits, therefore can test simultaneously multiple chip under test, for example, if core The quantity of built-in testing circuit is ten, then settable ten probe cards, this ten probe cards connect the same FPGA board, each Probe card connects a chip test circuit, and ten probe cards connect a test machine jointly, to realize to being placed on probe card On ten chip under test simultaneously tested, testing efficiency can be improved in this way.

Claims

1. biometric sensor apparatus for testing chip under a kind of screen, it is characterized in that：Including sequentially connected test machine, probe card With FPGA board, the test machine is electrically connected with FPGA board, is additionally provided with dress light cylinder on the probe card, and the light cylinder is to being placed on Chip under test in probe card is irradiated.

2. biometric sensor apparatus for testing chip under screen according to claim 1, it is characterized in that：The test machine with FPGA board is electrically connected by USB.

3. biometric sensor apparatus for testing chip under screen according to claim 1, it is characterized in that：The probe card is set There is the location hole for connecting light cylinder, the light cylinder is equipped with the positioning inserting column for being inserted into location hole.

4. biometric sensor apparatus for testing chip under screen according to claim 1, it is characterized in that：The FPGA board Equipped with multiple chip test circuits, the corresponding chip under test of each chip test circuit.

5. biometric sensor apparatus for testing chip under screen according to claim 1, it is characterized in that：The test machine is set There is the display device for showing test result.