CN208125613U - A kind of apparatus for measuring reflectance - Google Patents
A kind of apparatus for measuring reflectance Download PDFInfo
- Publication number
- CN208125613U CN208125613U CN201820646514.8U CN201820646514U CN208125613U CN 208125613 U CN208125613 U CN 208125613U CN 201820646514 U CN201820646514 U CN 201820646514U CN 208125613 U CN208125613 U CN 208125613U
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- China
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- light
- test sample
- measuring reflectance
- collimating mirror
- spectrometer
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Abstract
The utility model discloses a kind of apparatus for measuring reflectance comprising：Light source；Beam splitter；Photocell；Acquire microscope base；Collimating mirror；Hood；Calibration assemblies；And spectrometer.Beam splitter transmitted light is irradiated in test sample surface after sequentially passing through the acquisition microscope base, collimating mirror and hood, and it is entered in the spectrometer after being collected by the collimated mirror of light that the test sample surface reflects, the light reflected by the test sample surface is analyzed by the spectrometer, obtains the reflectivity of the test sample.The apparatus for measuring reflectance of the utility model is integrated design, can be improved the precision (including indicating accuracy and repeatable accuracy) and stability of measuring reflectance, avoids the generation of indicating value drift conditions.
Description
Technical field
The utility model relates to spectral detection field, in particular to a kind of apparatus for measuring reflectance.
Background technique
Usual apparatus for measuring reflectance uses light source for LED light source, and band relative narrower only can satisfy visible light
Wavelength measurement, there are limitations for application range；Usual apparatus for measuring reflectance is furnished with acquisition probe, and by its relative determination object
It is disposed vertically, but when test angle changes, will change to same measure object reflected light light intensity collected, shadow
Ring the accuracy and repeatable accuracy of measurement reflectivity；Further, existing apparatus for measuring reflectance need to be edited with being ready for use on
On-gauge plate, with the use year in year out and test surrounding environment change of instrument, so that each wavelength for the light source that determining instrument uses is strong
Degree changes, then edits instrument by on-gauge plate, will be unable to the reflectivity for accurately obtaining measure object.
Utility model content
In view of the foregoing drawbacks, the utility model provides a kind of lens reflecting rate measurement device based on diffusing reflection formula,
It can be improved the precision and stability of measuring reflectance.
The technical solution that the utility model is proposed with regard to above-mentioned technical problem is as follows：
Provide a kind of apparatus for measuring reflectance comprising：
Light source is used to generate light；
Beam splitter is used to be split the light, generates transmitted light and reflected light；
Photocell is used to acquire the reflected light；
Acquire microscope base comprising pedestal and the mounting portion connecting with the pedestal；
Collimating mirror is mounted in the mounting portion, and is coaxially disposed with the mounting portion；
Hood offers the aperture passed through for the mounting portion, and the aperture and the collimating mirror are coaxially disposed；
Calibration assemblies connect the hood；
And spectrometer；
The transmitted light is irradiated in test sample surface after sequentially passing through the acquisition microscope base, collimating mirror and hood,
And the light reflected by the test sample surface enters in the spectrometer after collimating mirror collection, by described
Spectrometer analyzes the light reflected by the test sample surface, with obtaining the test sample reflectivity.
Preferably, the light source includes the xenon source that wavelength is 200-1100nm.
Preferably, the pedestal of the acquisition microscope base is equipped with screw thread.
Preferably, the calibration assemblies include：The calibration circle being detachably connected with the hood and setting are described
Calibration mirror in calibration circle.
Preferably, half-reflection and half-transmission plate is equipped between the beam splitter and collimating mirror；The transmitted light passes through described half anti-half
Test sample surface is irradiated in after saturating plate and collimating mirror, and the light reflected by the test sample surface is anti-by described half
It is entered in the spectrometer after semi-transparent plate reflection.
Preferably, the spectrometer includes spectrophotometric unit and photodetector unit.
The apparatus for measuring reflectance of the utility model is integrated design, can be improved the precision of measuring reflectance
(including indicating accuracy and repeatable accuracy) and stability, avoid the generation of indicating value drift conditions.
Detailed description of the invention
Fig. 1 is the index path in the utility model embodiment one.
Fig. 2 is the quick-fried of the black box comprising acquisition microscope base, collimating mirror and hood in the utility model embodiment one
Fried view.
Specific embodiment
For a clearer understanding of the technical features, objectives and effects of the utility model, now control attached drawing is detailed
Illustrate specific embodiment of the present utility model.
Embodiment one：
As shown in Figs. 1-2, the apparatus for measuring reflectance in the utility model includes：Light source 100 is used to generate light；
Preferably, the light source 100 includes the xenon source that wavelength is 200-1100nm, relative to Conventional LED light sources, service life
It is longer, energy stability is more preferable, the reflectivity precision obtained by weighted average calculation is higher, stability is more preferable；
Beam splitter 200 is used to be split the light, generates transmitted light and reflected light；In the present embodiment, thoroughly
Light is penetrated as measurement light, reflected light is as reference light；
Photocell 300 is used to acquire the reflected light；
Acquire microscope base 1 comprising pedestal 11 and the mounting portion 12 being connect with the pedestal 11, and the mounting portion 12
Shape is matched with the shape of following collimating mirrors 2；
Collimating mirror 2, single side frosted diffuse for uniform illuminance and collection, improve measuring reflectance essence
Degree, repeatability and stability；The collimating mirror 2 is mounted in the mounting portion 12, and is coaxially disposed with the mounting portion 12；
Hood 3 is closed structure, offers the aperture 31 passed through for the mounting portion 12, and the aperture 31 with
The collimating mirror 2 is coaxially disposed；Extraneous light interference can be isolated by the hood 3；
Calibration assemblies connect the hood 3, be used for when instrument reflectance test there are when deviations in accuracy to instrument
Device is edited；And spectrometer 400, the spectrometer 400 include spectrophotometric unit and photodetector unit；
The transmitted light is irradiated in test sample (such as after sequentially passing through the acquisition microscope base 1, collimating mirror 2 and hood 3
Solar heat reflection paint) surface, and entered in the spectrometer 400 by the light that the test sample surface reflects, lead to
It crosses the spectrometer 400 to analyze the light reflected by the test sample surface, obtains the anti-of the test sample
Penetrate rate.
In the present embodiment, integrating sphere can be replaced by the system that acquisition microscope base 1, collimating mirror 2 and hood 3 form, made
Emergent light scatters uniform irradiation in measure object surface, and can be to due to measure object rough surface, uneven generation
Diffuse and be collected, so as not to due to the deviation of the shake of acquisition probe or incident angle to the measurement stability of complete machine and
Accuracy has an impact.
Further, the pedestal 11 of the acquisition microscope base 1 is equipped with screw thread, thus can be by screw thread by the acquisition microscope base 1
It is fixed on Instrument shell to Whole-dismountable.
The calibration assemblies include：The calibration circle 4 and setting being detachably connected with the hood 3 are enclosed in the calibration
Calibration mirror (not shown) in 4, specifically, calibration circle 4 is threadedly coupled with the hood 3, and the calibration mirror is preferred
For the standard plated film aluminium mirror of known reflectivity.
In addition, being equipped with half-reflection and half-transmission plate 500 between the beam splitter 200 and collimating mirror 2；The transmitted light passes through described half
Test sample surface, and the light quilt reflected by the test sample surface are irradiated in after anti-semi-transparent plate 500 and collimating mirror 2
The half-reflection and half-transmission plate 500 enters in the spectrometer 400 after reflecting.
The design in conclusion apparatus for measuring reflectance of the utility model is integrated can be improved reflectivity survey
Fixed precision (including indicating accuracy and repeatable accuracy) and stability, avoid the generation of indicating value drift conditions.
The above is only the preferred embodiment of the present invention, is not intended to limit the utility model, all practical at this
Within novel spirit and principle, any modification, equivalent replacement, improvement and so on should be included in the guarantor of the utility model
Within the scope of shield.
Claims (6)
1. a kind of apparatus for measuring reflectance, which is characterized in that including：
Light source is used to generate light；
Beam splitter is used to be split the light, generates transmitted light and reflected light；
Photocell is used to acquire the reflected light；
Acquire microscope base comprising pedestal and the mounting portion connecting with the pedestal；
Collimating mirror is mounted in the mounting portion, and is coaxially disposed with the mounting portion；
Hood offers the aperture passed through for the mounting portion, and the aperture and the collimating mirror are coaxially disposed；
Calibration assemblies connect the hood；
And spectrometer；
The transmitted light is irradiated in test sample surface after sequentially passing through the acquisition microscope base, collimating mirror and hood, and logical
The light for crossing the test sample surface reflection enters in the spectrometer after collimating mirror collection, passes through the spectrum
Instrument analyzes the light reflected by the test sample surface, with obtaining the test sample reflectivity.
2. apparatus for measuring reflectance as described in claim 1, which is characterized in that the light source includes that wavelength is 200-1100nm
Xenon source.
3. apparatus for measuring reflectance as described in claim 1, which is characterized in that the pedestal of the acquisition microscope base is equipped with screw thread.
4. apparatus for measuring reflectance as described in claim 1, which is characterized in that the calibration assemblies include：With the shading
The calibration mirror for covering the calibration circle being detachably connected and being arranged in the calibration circle.
5. apparatus for measuring reflectance as described in claim 1, which is characterized in that be equipped with half between the beam splitter and collimating mirror
Anti- semi-transparent plate；The transmitted light is irradiated in test sample surface after passing through the half-reflection and half-transmission plate and collimating mirror, and passes through institute
The light for stating test sample surface reflection is entered in the spectrometer after half-reflection and half-transmission plate reflection.
6. apparatus for measuring reflectance as described in claim 1, which is characterized in that the spectrometer includes spectrophotometric unit and light
Electro-detection unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820646514.8U CN208125613U (en) | 2018-05-02 | 2018-05-02 | A kind of apparatus for measuring reflectance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820646514.8U CN208125613U (en) | 2018-05-02 | 2018-05-02 | A kind of apparatus for measuring reflectance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208125613U true CN208125613U (en) | 2018-11-20 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820646514.8U Expired - Fee Related CN208125613U (en) | 2018-05-02 | 2018-05-02 | A kind of apparatus for measuring reflectance |
Country Status (1)
| Country | Link |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110763657A (en) * | 2019-11-20 | 2020-02-07 | 江苏赛诺格兰医疗科技有限公司 | Photoelectric digital conversion system for reflective material reflectivity test system |
| CN111103247A (en) * | 2019-12-12 | 2020-05-05 | 中山大学新华学院 | Ultraviolet-visible spectrophotometer |
| RU2726310C1 (en) * | 2019-12-19 | 2020-07-13 | Общество с ограниченной ответственностью "Корпорация Уралтехнострой" | Collimating device for spectrometer |
-
2018
- 2018-05-02 CN CN201820646514.8U patent/CN208125613U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110763657A (en) * | 2019-11-20 | 2020-02-07 | 江苏赛诺格兰医疗科技有限公司 | Photoelectric digital conversion system for reflective material reflectivity test system |
| CN111103247A (en) * | 2019-12-12 | 2020-05-05 | 中山大学新华学院 | Ultraviolet-visible spectrophotometer |
| RU2726310C1 (en) * | 2019-12-19 | 2020-07-13 | Общество с ограниченной ответственностью "Корпорация Уралтехнострой" | Collimating device for spectrometer |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20190125 Address after: 102208 9th floor 901-03, No. 3 Courtyard, 106 Kexing West Road, Huilongguan Town, Changping District, Beijing Patentee after: Beijing Warner Smart Spectrum Technology Co., Ltd. Address before: Room 405, Longguan Real Estate Building, Huilongguan West Street, Changping District, Beijing Patentee before: Beijing Hua Ke Jingyi science and Technology Co., Ltd. |
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| TR01 | Transfer of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20181120 Termination date: 20200502 |
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| CF01 | Termination of patent right due to non-payment of annual fee |