CN208076623U - T component test systems - Google Patents
T component test systems Download PDFInfo
- Publication number
- CN208076623U CN208076623U CN201820616829.8U CN201820616829U CN208076623U CN 208076623 U CN208076623 U CN 208076623U CN 201820616829 U CN201820616829 U CN 201820616829U CN 208076623 U CN208076623 U CN 208076623U
- Authority
- CN
- China
- Prior art keywords
- measured
- components
- connect
- signal
- host computer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 109
- 238000011017 operating method Methods 0.000 abstract description 4
- 230000010363 phase shift Effects 0.000 description 13
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000036772 blood pressure Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000000087 stabilizing effect Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 238000013142 basic testing Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 238000012956 testing procedure Methods 0.000 description 1
Landscapes
- Monitoring And Testing Of Transmission In General (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model is suitable for product test technical field, provide a kind of T component test systems, include for the host computer of control instruction generator and T module testing instruments, for T components tranmitting data register signal to be measured, latch signal and data-signal command generator and for sending radio-frequency input signals to T components to be measured and testing the T module testing instruments of T assembly properties parameter to be measured；The host computer is connect with described instruction generator and the T module testings instrument respectively, described instruction generator is connect with the low frequency input terminal of the T components to be measured, the T module testings instrument is connect with the output end to be measured of the rf inputs of the T components to be measured and the T components to be measured respectively, and the non-output end to be measured of the T components to be measured is grounded by load respectively.The utility model measuring accuracy is high, reliable and stable, is not necessarily to purely manual test, and high degree of automation, operating procedure is simple, and testing efficiency is high, and production cost is low.
Description
Technical field
The utility model belongs to product test technical field more particularly to a kind of T component test systems.
Background technology
In product test technical field, the test system built is of all kinds, and technical indicator is tested parameter and required also not
It is identical to the greatest extent.In microwave components product test, the selection of basic test equipment is mainly selected according to the frequency range of product, with section
About for the purpose of cost, and test that frequency range is higher, the cost of instrument and equipment is higher, while also need to meet measuring accuracy with it is reliable steady
It is qualitative.In Ka frequency range T module testings, the expense of a set of test equipment is sufficiently expensive, and production cost is high, needs in the prior art
It wants purely manual to be tested, complex for operation step, testing efficiency is low, and cannot be satisfied measuring accuracy and want with reliability and stability
It asks.
Utility model content
In view of this, the utility model embodiment provides a kind of T component test systems, to solve the prior art in T groups
Production cost is high in part test process, needs purely manual test, and operating procedure is complicated, and testing efficiency is low, cannot be satisfied test essence
The problem of degree is required with reliability and stability.
The T component test systems that the utility model embodiment provides, including it is used for control instruction generator and T module testings
The host computer of instrument, the phase shift for making T components to be measured to T components tranmitting data register signal, latch signal and data-signal to be measured
Command generator that state is zero and for sending radio-frequency input signals to T components to be measured and testing T assembly properties parameter to be measured
T module testing instruments；
The host computer is connect with described instruction generator and the T module testings instrument respectively, described instruction generator
It is connect with the low frequency input terminal of the T components to be measured, the T module testings instrument is defeated with the radio frequency of the T components to be measured respectively
Enter end to connect with the output end to be measured of the T components to be measured, the non-output ends to be measured of the T components to be measured respectively by load into
Row ground connection.
Further, the T component test systems further include DC power supply；
The DC power supply is connect with the host computer and described instruction generator respectively, straight described in the PC control
Galvanic electricity source provides voltage for described instruction generator, and the DC power supply is the T components to be measured by described instruction generator
Voltage is provided.
Further, the T component test systems further include the measured signal for adjusting the output end output to be measured
The attenuator of size；
The T module testings instrument is connect by the attenuator with the output end to be measured of the T components to be measured.
Further, the T module testings instrument includes frequency spectrograph and signal generator；
The signal generator is connect with the rf inputs of the T components to be measured and the host computer respectively, the frequency
Spectrometer is connect with the output end to be measured of the T components to be measured and the host computer respectively.
Further, the T module testings instrument includes Network Analyzer；
The Network Analyzer respectively with the host computer, the rf inputs of the T components to be measured and the T groups to be measured
The output end to be measured of part connects.
Further, the host computer is connect by universal serial port bus with described instruction generator.
Further, the host computer is connect by general purpose interface bus with the T module testings instrument.
Further, described instruction generator uses STM32F103 microcontrollers.
Further, the bandwidth of the radio-frequency input signals is no more than 1GHz.
Existing advantageous effect is the utility model embodiment compared with prior art：T components provided by the utility model
Test system gives T groups to be measured using PC control command generator difference tranmitting data register signal, latch signal and data-signal
Part controls the phase change of T components to be measured using command generator, and measuring accuracy is high, and reliability and stability is good, T components
Test equipment sends radio-frequency input signals to T components to be measured, so that T components to be measured is exported measured signal and gives T module testing instruments, T
Module testing instrument tests the performance parameter of T components according to measured signal, and entire test process is not necessarily to purely manual test, automatically
Change degree is high, and operating procedure is simple, and testing efficiency is high, and production cost is low.
Description of the drawings
It, below will be to embodiment or the prior art in order to illustrate more clearly of the technical scheme in the embodiment of the utility model
Attached drawing needed in description is briefly described, it should be apparent that, the accompanying drawings in the following description is only that this practicality is new
Some embodiments of type for those of ordinary skill in the art without having to pay creative labor, can be with
Obtain other attached drawings according to these attached drawings.
Fig. 1 is a kind of structural schematic diagram for T component test systems that one embodiment of the utility model provides；
Fig. 2 is a kind of structural schematic diagram for T component test systems that another embodiment of the utility model provides；
Fig. 3 is a kind of structural schematic diagram for T component test systems that another embodiment of the utility model provides；
Fig. 4 is a kind of structural schematic diagram for T component test systems that the utility model another embodiment provides.
Specific implementation mode
In order to make technical problem to be solved in the utility model, technical solution and advantageous effect be more clearly understood, with
Lower combination accompanying drawings and embodiments, the present invention will be further described in detail.It should be appreciated that specific reality described herein
It applies example to be only used to explain the utility model, is not used to limit the utility model.
In order to illustrate the technical solution of the utility model, illustrated below by specific embodiment.
Refering to fig. 1, the utility model embodiment provides a kind of T component test systems, including is used for control instruction
The host computer 101 of device 102 and T module testings instrument 103, for 104 tranmitting data register signal of T components to be measured, latch signal and
The command generator 102 of data-signal and radio-frequency input signals and test T components 104 to be measured for being sent to T components 104 to be measured
The T module testings instrument 103 of performance parameter；
The host computer 101 is connect with described instruction generator 102 and the T module testings instrument 103 respectively, the finger
Enable generator 102 and the low frequency input terminal of the T components 104 to be measured connect, the T module testings instrument 103 respectively with it is described
The rf inputs of T components 104 to be measured are connected with the output end to be measured of the T components 104 to be measured, the T components 104 to be measured
Non- output end to be measured is grounded by load respectively.
Specifically, serial port and baud rate are set in host computer 101, that is, determine signal transfer protocol and signal transmission
Speed, host computer 101 send the first control instruction to command generator 102, command generator 102 by universal serial port bus
Tranmitting data register signal, latch signal and data-signal are distinguished by the low frequency input terminal of T components 104 to be measured according to the first control instruction
To T components 104 to be measured, it is zero to make the phase-shift states of T components 104 to be measured, that is to say, that makes the phase shifter in T components 104 to be measured
The phase shift number of degrees be zero, then host computer 101 controls T module testings instrument 103 and sends radio-frequency input signals to T components to be measured
104, radio-frequency input signals is sent to by the rf inputs of T components 104 to be measured and is waited for by specifically T module testings instrument 103
Survey T components 104, T components 104 to be measured export measured signal according to radio-frequency input signals by output end to be measured, and by letter to be measured
Number it is sent to T module testings instrument 103, T module testings instrument 103 tests the performance of T components 104 to be measured according to measured signal
Parameter.To test other output ends of T components 104 to be measured, output end to be tested and T module testings instrument 103 can be needed
Connection, the output end without test pass through carrying ground.Similarly, aforesaid operations step is utilized, you can to T components 104 to be measured
Each output end is tested.
Before testing 104 performance parameter of T components to be measured, host computer 101 can also send the second control instruction to instruction
Generator 102, command generator 102 adjust clock signal, latch signal and data-signal according to the second control instruction, make to be measured
The phase-shift states of T components 104 are the default phase shift number of degrees, that is to say, that it is default phase shift degree to make the phase shifter in T components 104 to be measured
Number, the default phase shift number of degrees here are determined according to the digit of actual demand and phase shifter, such as 180 °, 90 °, 45 °, 22.5 °
Deng then T components 104 to be measured export measured signal to T module testings instrument 103 according to radio-frequency input signals.
Above-mentioned clock signal, latch signal and data-signal is transistor-transistor logic (Transistor-
Transistor Logic, TTL) level signal, wherein clock signal and latch signal failing edge is effective, in command generator
After 102 are powered, the latch in command generator 102 do not control signal by when, the latch Enable Pin of latch is in height
Level, the latch signal that command generator 102 exports also are at high level, and latch signal is staggered the failing edge of clock signal,
Failing edge is generated after 11 clock signal periods, latches the data-signal sealed in, the data-signal finally latched makes T groups to be measured
Phase shifter in part 104 generates the corresponding phase shift number of degrees.Transistor-Transistor Logic level is compatible with 0V/+3.3V and 0V/+5V, and command generator
102 carry STM32F103 microcontrollers, and the driver inside command generator 102 can also be utilized with Protection Counter Functions is powered on
Host computer 101 carries out zero-setting operation to command generator 102.
After the performance parameter that T module testings instrument 103 tests T components 104 to be measured, host computer 101 is connect by general
Mouth bus reads the performance parameter that 103 test of T module testings instrument obtains, and automatically generated data table is stored, and may be used also
The performance parameter read is directly sent to other computers, data form is generated on other computers.
T component test systems provided by the invention utilize PC control command generator difference tranmitting data register signal, lock
Signal and data-signal are deposited to T components to be measured, the phase change of T components to be measured, measuring accuracy are controlled using command generator
Height, and reliability and stability is good, and T module testing instruments send radio-frequency input signals to T components to be measured, and T components to be measured is made to export
Measured signal gives T module testing instruments, and T module testings instrument tests the performance parameter of T components according to measured signal, entire to survey
Examination process is not necessarily to purely manual test, and high degree of automation, operating procedure is simple, and testing efficiency is high.
Referring to Fig.2, further, the T component test systems further include DC power supply 105；
The DC power supply 105 is connect with the host computer 101 and described instruction generator 102 respectively, the host computer
The 101 control DC power supplies 105 are that described instruction generator 102 provides voltage, and the DC power supply 105 passes through described instruction
Generator 102 is that the T components 104 to be measured provide voltage.
Specifically, host computer 101 turns on the power switch, and control DC power supply 105 is that command generator 102 provides 20V electricity
Pressure, command generator 102 is a conversion and control box, has the function of power supply management and data setting, can be by 20V DC voltages
Lowering and stabilizing blood pressure processing is carried out, exports+6V/ ± 5V voltages to T components 104 to be measured.
Referring to Fig.2, further, the T component test systems further include being exported for adjusting the output end to be measured
The attenuator 106 of measured signal size；
The T module testings instrument 103 is connected by the output end to be measured of the attenuator 106 and the T components 104 to be measured
It connects.
Specifically, after T components 104 to be measured export measured signal, the big of measured signal is adjusted first with attenuator 106
It is small, it is then forwarded to T module testings instrument 103, is convenient for testing.
Refering to Fig. 3, further, the T module testings instrument includes frequency spectrograph 1031 and signal generator 1032；
The signal generator 1032 connects with the rf inputs of the T components 104 to be measured and the host computer 101 respectively
It connects, the frequency spectrograph 1031 is connect with the output end to be measured of the T components 104 to be measured and the host computer 101 respectively.
Specifically, when T module testings instrument 103 includes frequency spectrograph 1031 and signal generator 1032, signal generator
1032 send the letter to be measured that radio-frequency input signals can be exported to T components 104 to be measured, frequency spectrograph 1031 according to T components 104 to be measured
Number directly measure the output power of output end to be measured.
Refering to Fig. 4, further, the T module testings instrument 103 includes Network Analyzer 1033；
The Network Analyzer 1033 respectively with the host computer 101, the T components 104 to be measured rf inputs and
The output end to be measured of the T components 104 to be measured connects.
Specifically, when T module testings instrument 103 includes Network Analyzer 1033, Network Analyzer 1033 is internally provided with
Signal generator, Network Analyzer 1033 can inherently send radio-frequency input signals to T components 104 to be measured, test T to be measured
Before 104 performance parameter of component, host computer 101 sends the second control instruction to command generator 102, and command generator 102 can
To adjust clock signal, latch signal and data-signal according to the second control instruction, the phase-shift states of T components 104 to be measured are made to be
The default phase shift number of degrees, that is to say, that it is the default phase shift number of degrees, default phase shift degree here to make the phase shifter in T components 104 to be measured
Number is determined according to the digit of actual demand and phase shifter, such as 180 °, 90 °, 45 °, 22.5 °, then T components 104 to be measured
Measured signal is exported to Network Analyzer 1033 according to radio-frequency input signals, and Network Analyzer 1033 can be according to T to be measured
The measured signal that component 104 exports measures positive transmission coefficient S21, reverse transfer coefficient S 12, input reflection coefficient S11, output
The performance parameters such as reflectance factor S22, output gain and input and output standing-wave ratio select the phase of S21 on Network Analyzer 1033
Bit test function, host computer 101 can measure the phase shifting accuracy of 104 opposite zero state of T components to be measured according to positive transmission coefficient S21
With amplitude-phase consistency, zero state here refers to that the phase-shift states of T components 104 to be measured are zero.
Further, the host computer 101 is connect by universal serial port bus with described instruction generator 102.
Specifically, host computer 101 sends control instruction, control instruction by universal serial port bus to command generator 102
102 tranmitting data register signal of generator, latch signal and data-signal give T components 104 to be measured, or adjustment to be sent to T groups to be measured
Clock signal, latch signal and the data-signal of part 104.
Further, the host computer 101 is connect by general purpose interface bus with the T module testings instrument 103.
Specifically, host computer 101 obtains the performance that 103 test of T module testings instrument obtains by general purpose interface bus and joins
Number, and generate data form and stored.
Further, described instruction generator 102 uses STM32F103 microcontrollers.
Specifically, command generator 102 uses STM32F103 microcontrollers, interface to use 21 needle low-frequency connectors, have
The function of power supply management and data setting can carry out lowering and stabilizing blood pressure processing to DC voltage, export+6V/ ± 5V to T groups to be measured
Part 104, can also be according to control instruction tranmitting data register signal, latch signal and the data-signal that host computer 101 is sent to T to be measured
Component 104 regulates and controls the phase change of T components 104 to be measured.
Further, the bandwidth of the radio-frequency input signals is no more than 1GHz.
Specifically, during T module testings, the bandwidth of radio-frequency input signals is usually no more than 1GHz, ensures test essence
Degree.
Embodiment described above is only to illustrate the technical solution of the utility model, rather than its limitations；Although with reference to before
Embodiment is stated the utility model is described in detail, it will be understood by those of ordinary skill in the art that：It still can be with
Technical scheme described in the above embodiments is modified or equivalent replacement of some of the technical features；And
These modifications or replacements, the spirit for various embodiments of the utility model technical solution that it does not separate the essence of the corresponding technical solution
And range, it should be included within the scope of protection of this utility model.
Claims (9)
1. a kind of T component test systems, which is characterized in that include for control instruction generator and T module testing instruments
Position machine, for T components tranmitting data register signal to be measured, latch signal and data-signal command generator and for T to be measured
Component sends radio-frequency input signals and tests the T module testing instruments of T assembly properties parameter to be measured；
The host computer is connect with described instruction generator and the T module testings instrument respectively, described instruction generator and institute
State the low frequency input terminal connection of T components to be measured, T module testings instrument rf inputs with the T components to be measured respectively
It is connected with the output end to be measured of the T components to be measured, the non-output end to be measured of the T components to be measured is connect by load respectively
Ground.
2. T component test systems according to claim 1, which is characterized in that further include DC power supply；
The DC power supply is connect with the host computer and described instruction generator respectively, direct current described in the PC control
Source provides voltage for described instruction generator, and the DC power supply is provided by described instruction generator for the T components to be measured
Voltage.
3. T component test systems according to claim 1, which is characterized in that further include for adjusting the output to be measured
Hold the attenuator of the measured signal size of output；
The T module testings instrument is connect by the attenuator with the output end to be measured of the T components to be measured.
4. T component test systems according to claim 1, which is characterized in that the T module testings instrument includes frequency spectrograph
And signal generator；
The signal generator is connect with the rf inputs of the T components to be measured and the host computer respectively, the frequency spectrograph
It is connect respectively with the output end to be measured of the T components to be measured and the host computer.
5. T component test systems according to claim 1, which is characterized in that the T module testings instrument includes network point
Analyzer；
The Network Analyzer respectively with the host computer, the rf inputs of the T components to be measured and the T components to be measured
Output end connection to be measured.
6. T component test systems according to claim 1, which is characterized in that the host computer passes through universal serial port bus
It is connect with described instruction generator.
7. T component test systems according to claim 1, which is characterized in that the host computer passes through general purpose interface bus
It is connect with the T module testings instrument.
8. T component test systems according to claim 1, which is characterized in that described instruction generator uses STM32F103
Microcontroller.
9. T component test systems according to claim 1, which is characterized in that the bandwidth of the radio-frequency input signals does not surpass
Cross 1GHz.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820616829.8U CN208076623U (en) | 2018-04-26 | 2018-04-26 | T component test systems |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820616829.8U CN208076623U (en) | 2018-04-26 | 2018-04-26 | T component test systems |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208076623U true CN208076623U (en) | 2018-11-09 |
Family
ID=64045037
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820616829.8U Active CN208076623U (en) | 2018-04-26 | 2018-04-26 | T component test systems |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208076623U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108469552A (en) * | 2018-04-26 | 2018-08-31 | 深圳市华讯方舟微电子科技有限公司 | T assembly test methods, apparatus and system |
-
2018
- 2018-04-26 CN CN201820616829.8U patent/CN208076623U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108469552A (en) * | 2018-04-26 | 2018-08-31 | 深圳市华讯方舟微电子科技有限公司 | T assembly test methods, apparatus and system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN112165415A (en) | 1553B bus control equipment, control system and control method | |
| CN109709474B (en) | Radio frequency mixed signal integrated circuit test system and test method | |
| CN102565676B (en) | Automation measuring apparatus for crystal oscillator parameters | |
| CN208076623U (en) | T component test systems | |
| CN205105224U (en) | Micropower wireless communication module testing arrangement | |
| CN206400004U (en) | The single-phase 3 line intelligent electric meter of high current | |
| CN106301608A (en) | A kind of ultrashort wave Transmit-Receive Unit Universal debugging fitting device | |
| CN103383443B (en) | Modularization three-phase instrument calibration device used for intelligent electric network | |
| CN100362352C (en) | Palm sized universal oscillograph with USB bus power supply | |
| CN102175980B (en) | Control device of high-temperature superconducting magnetometer measurement capable of automatically locking work point | |
| CN108469552A (en) | T assembly test methods, apparatus and system | |
| CN108562795A (en) | A kind of solar cell impedance measurement system | |
| CN212258965U (en) | Automatic test system of radio frequency module | |
| CN105954623A (en) | Modulation and testing system for universal frequency source type plugging element and testing method thereof | |
| CN103633967B (en) | A kind of digital arbitrary waveform generator | |
| CN213581157U (en) | Novel antenna measuring device | |
| CN106972839A (en) | A kind of system for adjusting crystal oscillator frequency | |
| CN215181967U (en) | Test fixture and test system for power consumption test of PCIE (peripheral component interface express) interface product | |
| CN107707276A (en) | A kind of consumption detection device based on broadband power line carrier communication unit | |
| CN204405814U (en) | A kind of electronic load tester with power meter function | |
| CN112098740A (en) | Intelligent comprehensive test instrument | |
| CN203661040U (en) | Wideband signal generator based on phase-locked loop chip ADF4350 | |
| Lijun et al. | A Novel Matching Method of Electronic Calibration Kit and Various Brands Vector Network Analyzer | |
| CN208424401U (en) | The test device of the performance of the communication interface of electronic equipment | |
| CN218006231U (en) | High-frequency signal source device for EMC radiation field |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| PP01 | Preservation of patent right | ||
| PP01 | Preservation of patent right |
Effective date of registration: 20210630 Granted publication date: 20181109 |
|
| PD01 | Discharge of preservation of patent | ||
| PD01 | Discharge of preservation of patent |
Date of cancellation: 20230421 Granted publication date: 20181109 |
|
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20230718 Address after: 518000 107, building 37, chentian Industrial Zone, chentian community, Xixiang street, Bao'an District, Shenzhen, Guangdong Province Patentee after: Shenzhen Huaxun ark Intelligent Information Technology Co.,Ltd. Address before: 518102 East, 2nd floor, building 37, chentian Industrial Zone, Baotian 1st Road, Xixiang street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN HUAXUN FANGZHOU MICROELECTRONIC SCIENCE & TECHNOLOGY Co.,Ltd. Patentee before: CHINA COMMUNICATION TECHNOLOGY Co.,Ltd. |
|
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20231208 Address after: Building 7-6, Industrial Control Cloud Creation Port, No. 58 Hongtu Avenue, Honggutan District, Nanchang City, Jiangxi Province, 330000 Patentee after: Jiangxi Huaxun Fangzhou Intelligent Technology Co.,Ltd. Address before: 518000 107, building 37, chentian Industrial Zone, chentian community, Xixiang street, Bao'an District, Shenzhen, Guangdong Province Patentee before: Shenzhen Huaxun ark Intelligent Information Technology Co.,Ltd. |