CN108469552A - T assembly test methods, apparatus and system - Google Patents
T assembly test methods, apparatus and system Download PDFInfo
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- CN108469552A CN108469552A CN201810385682.0A CN201810385682A CN108469552A CN 108469552 A CN108469552 A CN 108469552A CN 201810385682 A CN201810385682 A CN 201810385682A CN 108469552 A CN108469552 A CN 108469552A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
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Abstract
The present invention is suitable for product test technical field, provides a kind of T assembly test methods, apparatus and system, and the T assembly test methods include：The first control instruction is sent to command generator, described instruction generator distinguishes tranmitting data register signal, latch signal and data-signal to T components to be measured according to first control instruction, and it is zero to make the phase-shift states of the T components to be measured；It controls T module testing instruments and sends radio-frequency input signals to the T components to be measured；After the T components to be measured export measured signal to the T module testings instrument according to the radio-frequency input signals, control T module testings instrument tests the performance parameter of the T components to be measured according to the measured signal.The present invention controls the phase change of T components to be measured using command generator, and measuring accuracy is high, and reliable and stable, and entire test process is not necessarily to purely manual test, and high degree of automation, operating procedure is simple, and testing efficiency is high, and production cost is low.
Description
Technical field
The invention belongs to product test technical field more particularly to a kind of T assembly test methods, apparatus and systems.
Background technology
In product test technical field, the test system built is of all kinds, and technical indicator is tested parameter and required also not
It is identical to the greatest extent.In microwave components product test, the selection of basic test equipment is mainly selected according to the frequency range of product, with section
About for the purpose of cost, and test that frequency range is higher, the cost of instrument and equipment is higher, while also need to meet measuring accuracy with it is reliable steady
It is qualitative.In Ka frequency range T module testings, the expense of a set of test equipment is sufficiently expensive, and production cost is high, needs in the prior art
It wants purely manual to be tested, complex for operation step, testing efficiency is low, and cannot be satisfied measuring accuracy and want with reliability and stability
It asks.
Invention content
In view of this, an embodiment of the present invention provides a kind of T assembly test methods, apparatus and system, to solve existing skill
Art production cost during T module testings is high, needs purely manual test, operating procedure is complicated, and testing efficiency is low, cannot be satisfied
The problem of measuring accuracy is required with reliability and stability.
First aspect of the embodiment of the present invention provides a kind of T assembly test methods, including：
The first control instruction is sent to command generator, described instruction generator is sent out respectively according to first control instruction
Send clock signal, latch signal and data-signal to T components to be measured, it is zero to make the phase-shift states of the T components to be measured；
It controls T module testing instruments and sends radio-frequency input signals to the T components to be measured；
After the T components to be measured export measured signal to the T module testings instrument according to the radio-frequency input signals,
Control T module testings instrument tests the performance parameter of the T components to be measured according to the measured signal.
Further, measured signal is exported according to the radio-frequency input signals in the T components to be measured to survey to the T components
After test instrument, the performance parameter that control T module testings instrument tests the T components to be measured according to the measured signal includes：
It sends the second control instruction and gives described instruction generator, described instruction generator is according to the second control instruction tune
The whole clock signal, the latch signal and the data-signal, it is default phase shift to make the phase-shift states of the T components to be measured
The number of degrees；
Measured signal is exported to institute according to the default phase shift number of degrees and the radio-frequency input signals in the T components to be measured
After stating T module testing instruments, the performance that control T module testings instrument tests the T components to be measured according to the measured signal is joined
Number.
Further, the T assembly test methods further include：
Control DC power supply provides voltage for described instruction generator；
Control described instruction generator carries out lowering and stabilizing blood pressure processing to the voltage and is conveyed to the T components to be measured.
Further, after the first control instruction of the transmission is to command generator, further include：
The feedback signal that described instruction generator is sent is received, the feedback signal has been used to indicate described instruction generator
Received first control instruction.
Further, the T assembly test methods further include：
The performance parameter that the T module testings instrument is tested is obtained, and generates data form and is stored.
Second aspect of the embodiment of the present invention provides a kind of T component test devices, including：
First control instruction sending module, for sending the first control instruction to command generator, described instruction generator
Tranmitting data register signal, latch signal and data-signal are distinguished to T components to be measured according to first control instruction, are made described to be measured
The phase-shift states of T components are zero；
Radio-frequency input signals sending module sends radio-frequency input signals to the T to be measured for controlling T module testing instruments
Component；
Test module, for exporting measured signal to the T groups according to the radio-frequency input signals in the T components to be measured
After part test equipment, control T module testings instrument tests the performance parameter of the T components to be measured according to the measured signal.
Further, the test module includes：
Second control instruction sending module gives described instruction generator, described instruction hair for sending the second control instruction
Raw device adjusts the clock signal, the latch signal and the data-signal according to second control instruction, makes described wait for
The phase-shift states for surveying T components are the default phase shift number of degrees；
Performance parameter test module, for defeated according to the default phase shift number of degrees and the radio frequency in the T components to be measured
Enter signal and export measured signal to after the T module testings instrument, control T module testings instrument is tested according to the measured signal
The performance parameter of the T components to be measured.
Further, the T component test devices further include：
First power supply module provides voltage for controlling DC power supply for described instruction generator；
Second power supply module, for controlling described instruction generator to voltage progress lowering and stabilizing blood pressure processing and being conveyed to
The T components to be measured.
The third aspect of the embodiment of the present invention provides a kind of T component test systems, including is used for control instruction generator and T
The host computer of module testing instrument, for the instruction of T components tranmitting data register signal to be measured, latch signal and data-signal occur
Device and for sending radio-frequency input signals to T components to be measured and testing the T module testing instruments of T assembly properties parameter to be measured；
The host computer is connect with described instruction generator and the T module testings instrument respectively, described instruction generator
It is connect with the low frequency input terminal of the T components to be measured, the T module testings instrument is defeated with the radio frequency of the T components to be measured respectively
Enter end to connect with the output end to be measured of the T components to be measured, the non-output ends to be measured of the T components to be measured respectively by load into
Row ground connection.
Existing advantageous effect is the embodiment of the present invention compared with prior art：T assembly test methods provided by the invention,
Apparatus and system gives T to be measured using PC control command generator difference tranmitting data register signal, latch signal and data-signal
Component, it is zero to make the phase-shift states of T components to be measured, and the phase change of T components to be measured, test essence are controlled using command generator
Degree is high, and reliability and stability is good, and T module testing instruments send radio-frequency input signals to T components to be measured, keep T components to be measured defeated
Going out measured signal gives T module testing instruments, T module testings instrument to test the performance parameter of T components, entirely according to measured signal
Test process is not necessarily to purely manual test, and high degree of automation, operating procedure is simple, and testing efficiency is high, and production cost is low.
Description of the drawings
It to describe the technical solutions in the embodiments of the present invention more clearly, below will be to embodiment or description of the prior art
Needed in attached drawing be briefly described, it should be apparent that, the accompanying drawings in the following description be only the present invention some
Embodiment for those of ordinary skill in the art without having to pay creative labor, can also be according to these
Attached drawing obtains other attached drawings.
Fig. 1 is a kind of flow diagram of T assembly test methods provided in an embodiment of the present invention；
Fig. 2 is a kind of structural schematic diagram of T component test devices provided in an embodiment of the present invention；
Fig. 3 is a kind of structural schematic diagram for T component test systems that one embodiment of the invention provides；
Fig. 4 is a kind of structural schematic diagram for T component test systems that another embodiment of the present invention provides；
Fig. 5 is a kind of structural schematic diagram for T component test systems that further embodiment of this invention provides；
Fig. 6 is a kind of structural schematic diagram for T component test systems that yet another embodiment of the invention provides.
Specific implementation mode
In order to make technical problems, technical solutions and advantages to be solved be more clearly understood, tie below
Accompanying drawings and embodiments are closed, the present invention will be described in further detail.It should be appreciated that specific embodiment described herein is only
To explain the present invention, it is not intended to limit the present invention.
In order to illustrate technical scheme of the present invention, illustrated below by specific embodiment.
Refering to fig. 1, first aspect of the embodiment of the present invention provides a kind of T assembly test methods, including：
S101 sends the first control instruction to command generator, and described instruction generator is according to first control instruction
Tranmitting data register signal, latch signal and data-signal give T components to be measured respectively, and it is zero to make the phase-shift states of the T components to be measured.
Specifically, serial port and baud rate are set in host computer, that is, determine signal transfer protocol and signal transmission speed
Degree, host computer send the first control instruction by universal serial bus (Universal Serial Bus, USB) and occur to instruction
Device, command generator give T components to be measured according to the first control instruction difference tranmitting data register signal, latch signal and data-signal,
Above-mentioned three kinds of signals are sent to the low frequency input terminal of T components to be measured by data line by command generator, make T components to be measured
Phase-shift states be phase shifter is both provided in zero, T components, and here make the phase-shift states of T components to be measured be zero, be to instigate
The phase shift number of degrees of phase shifter in T components to be measured are zero.
Above-mentioned clock signal, latch signal and data-signal be TTL (transistor transistor logic,
TTL) level signal, wherein clock signal and latch signal failing edge are effective, after command generator energization, in command generator
Latch do not control signal by when, the latch Enable Pin of latch is in high level, the latch of command generator output
Signal is also at high level, and latch signal is staggered the failing edge of clock signal, and decline is generated after 11 clock signal periods
The data-signal sealed in is latched on edge, and the data-signal finally latched makes the phase shifter in T components to be measured generate corresponding phase shift degree
Number.Transistor-Transistor Logic level is compatible with 0V/+3.3V and 0V/+5V, and command generator carries STM32F103 microcontrollers, command generator
Internal driver can also carry out zero-setting operation using host computer with Protection Counter Functions is powered on to command generator.
S102, control T module testing instruments send radio-frequency input signals to the T components to be measured.
Specifically, PC control T module testings instrument sends radio-frequency input signals to T components to be measured, T component testers
Above-mentioned radio-frequency input signals is sent to T components to be measured by device by the rf inputs of T components to be measured.
S103 exports measured signal to the T component testers in the T components to be measured according to the radio-frequency input signals
After device, control T module testings instrument tests the performance parameter of the T components to be measured according to the measured signal.
Specifically, T components to be measured export measured signal according to radio-frequency input signals by output end to be measured, and pass through decaying
Measured signal is sent to T module testing instruments by device, the size of measured signal is adjusted using attenuator, at this time T components to be measured
Other output ends are grounded by load, and then T module testings instrument tests T groups to be measured according to the measured signal received
The performance parameter of part.When T module testing instruments include frequency spectrograph and signal generator, signal generator sends radio frequency input letter
Number T components to be measured are given, frequency spectrograph directly measures the output power of output end to be measured according to the measured signal that T components to be measured export.
Similarly, each output end of T components to be measured can be tested using above-mentioned test method.
T assembly test methods provided by the invention utilize PC control command generator difference tranmitting data register signal, lock
Signal and data-signal are deposited to T components to be measured, it is zero to make the phase-shift states of T components to be measured, is waited for using command generator to control
Survey the phase change of T components, measuring accuracy is high, and reliability and stability is good, T module testing instruments send radio-frequency input signals to
T components to be measured make T components to be measured export measured signal and T module testing instruments, T module testings instrument are given to be surveyed according to measured signal
The performance parameter of T components is tried, entire test process is not necessarily to purely manual test, and high degree of automation, operating procedure is simple, test effect
Rate is high.
Further, measured signal is exported according to the radio-frequency input signals in the T components to be measured to survey to the T components
After test instrument, the performance parameter that control T module testings instrument tests the T components to be measured according to the measured signal includes：
It sends the second control instruction and gives described instruction generator, described instruction generator is according to the second control instruction tune
The whole clock signal, the latch signal and the data-signal, it is default phase shift to make the phase-shift states of the T components to be measured
The number of degrees；
Measured signal is exported to institute according to the default phase shift number of degrees and the radio-frequency input signals in the T components to be measured
After stating T module testing instruments, the performance that control T module testings instrument tests the T components to be measured according to the measured signal is joined
Number.
Specifically, before testing T assembly properties parameter to be measured, host computer sends the second control instruction and occurs to instruction
Device, command generator can adjust clock signal, latch signal and data-signal according to the second control instruction, make T components to be measured
Phase-shift states be the default phase shift number of degrees, that is to say, that it is the default phase shift number of degrees to make the phase shifter in T components to be measured, here pre-
If the phase shift number of degrees are determined according to the digit of actual demand and phase shifter, such as 180 °, 90 °, 45 °, 22.5 °, then T to be measured
Component exports measured signal according to radio-frequency input signals and gives T module testing instruments, can also be T components output measured signal to be measured
To attenuator, measured signal is sent to by T module testing instruments by attenuator.When T module testing instruments include network analysis
When instrument, Network Analyzer is internally provided with signal generator, and Network Analyzer can inherently send radio-frequency input signals to T to be measured
Component, and Network Analyzer measures positive transmission coefficient S21, reverse transfer system according to the measured signal that T components to be measured export
The performance parameters such as number S12, input reflection coefficient S11, output reflection coefficient S22, output gain and input and output standing-wave ratio, in net
Select the phase test function of S21, host computer that can measure T components phase to be measured according to positive transmission coefficient S21 on network analyzer
Phase shifting accuracy to zero state and amplitude-phase consistency.
Further, the T assembly test methods further include：
Control DC power supply provides voltage for described instruction generator；
Control described instruction generator carries out lowering and stabilizing blood pressure processing to the voltage and is conveyed to the T components to be measured.
Specifically, host computer turns on the power switch, and control DC power supply provides 20V voltages, instruction hair for command generator
Raw device is a conversion and control box, has the function of power supply management and data setting, can 20V DC voltages be carried out lowering and stabilizing blood pressure
Processing exports the low frequency input interface of+6V/ ± 5V voltages to T components to be measured, and is required according to the chip in T components to be measured,
- 5V can first be exported to T components to be measured, then export+5V and+6V to T components to be measured.
Further, after the first control instruction of the transmission is to command generator, further include：
The feedback signal that described instruction generator is sent is received, the feedback signal has been used to indicate described instruction generator
Received first control instruction.
Specifically, after host computer sends the first control instruction to command generator, command generator is sent to host computer
Feedback signal, feedback signal are used to indicate command generator and the first control instruction have been received, and show that entire T components are surveyed
Test system connection is good.
Further, the T assembly test methods further include：
The performance parameter that the T module testings instrument is tested is obtained, and generates data form and is stored.
Specifically, after the performance parameter that T module testing instruments test T components to be measured, host computer passes through general-purpose interface
Bus reads the performance parameter that T module testing instruments are tested, and automatically generated data table is stored, can also be directly
The performance parameter read is sent to other computers, data form is generated on other computers.
Referring to Fig.2, second aspect of the embodiment of the present invention provides a kind of T component test devices, including：
First control instruction sending module 201, for sending the first control instruction to command generator, described instruction occurs
Device distinguishes tranmitting data register signal, latch signal and data-signal to T components to be measured according to first control instruction, makes described wait for
The phase-shift states for surveying T components are zero；
Radio-frequency input signals sending module 202 is waited for for controlling T module testing instruments transmission radio-frequency input signals to described
Survey T components；
Test module 203, for exporting measured signal to described according to the radio-frequency input signals in the T components to be measured
After T module testing instruments, control T module testings instrument tests the performance parameter of the T components to be measured according to the measured signal.
Further, the test module 203 includes：
Second control instruction sending module gives described instruction generator, described instruction hair for sending the second control instruction
Raw device adjusts the clock signal, the latch signal and the data-signal according to second control instruction, makes described wait for
The phase-shift states for surveying T components are the default phase shift number of degrees；
Performance parameter test module, for defeated according to the default phase shift number of degrees and the radio frequency in the T components to be measured
Enter signal and export measured signal to after the T module testings instrument, control T module testings instrument is tested according to the measured signal
The performance parameter of the T components to be measured.
Further, the T component test devices further include：
First power supply module provides voltage for controlling DC power supply for described instruction generator；
Second power supply module, for controlling described instruction generator to voltage progress lowering and stabilizing blood pressure processing and being conveyed to
The T components to be measured.
Further, the T component test devices further include：
Feedback signal receiving module, the feedback signal for receiving the transmission of described instruction generator, the feedback signal are used
In instruction received first control instruction of described instruction generator.
Further, the T component test devices further include：
Performance parameter acquisition module, the performance parameter tested for obtaining the T module testings instrument, and generate number
It is stored according to table.
Refering to Fig. 3, the embodiment of the present invention additionally provides a kind of T component test systems, including is used for control instruction generator
The host computer 301 of 302 and T module testings instrument 303 is used for 304 tranmitting data register signal of T components to be measured, latch signal sum number
It is believed that number command generator 302 and radio-frequency input signals and test 304 property of T components to be measured for being sent to T components 304 to be measured
The T module testings instrument 303 of energy parameter；
The host computer 301 is connect with described instruction generator 302 and the T module testings instrument 303 respectively, the finger
Enable generator 302 and the low frequency input terminal of the T components 304 to be measured connect, the T module testings instrument 303 respectively with it is described
The rf inputs of T components 304 to be measured are connected with the output end to be measured of the T components 304 to be measured, the T components 304 to be measured
Non- output end to be measured is grounded by load respectively.
Specifically, serial port and baud rate are set in host computer 301, that is, determine signal transfer protocol and signal transmission
Speed, host computer 301 send the first control instruction to command generator 302, command generator 302 by universal serial port bus
Tranmitting data register signal, latch signal and data-signal are distinguished by the low frequency input terminal of T components 304 to be measured according to the first control instruction
To T components 304 to be measured, it is zero to make the phase-shift states of T components 304 to be measured, that is to say, that makes the phase shifter in T components 304 to be measured
The phase shift number of degrees be zero, then host computer 301 controls T module testings instrument 303 and sends radio-frequency input signals to T components to be measured
304, radio-frequency input signals is sent to by the rf inputs of T components 304 to be measured and is waited for by specifically T module testings instrument 303
Survey T components 304, T components 304 to be measured export measured signal according to radio-frequency input signals by output end to be measured, and by letter to be measured
Number it is sent to T module testings instrument 303, T module testings instrument 303 tests the performance of T components 304 to be measured according to measured signal
Parameter.To test other output ends of T components 304 to be measured, output end to be tested and T module testings instrument 303 can be needed
Connection, the output end without test pass through carrying ground.Similarly, aforesaid operations step is utilized, you can to T components 304 to be measured
Each output end is tested.
Before testing 304 performance parameter of T components to be measured, host computer 301 can also send the second control instruction to instruction
Generator 302, command generator 302 adjust clock signal, latch signal and data-signal according to the second control instruction, make to be measured
The phase-shift states of T components 304 are the default phase shift number of degrees, that is to say, that it is default phase shift degree to make the phase shifter in T components 304 to be measured
Number, the default phase shift number of degrees here are determined according to the digit of actual demand and phase shifter, such as 180 °, 90 °, 45 °, 22.5 °
Deng then T components 304 to be measured export measured signal to T module testings instrument 303 according to radio-frequency input signals.
Above-mentioned clock signal, latch signal and data-signal be TTL (transistor transistor logic,
TTL) level signal, wherein clock signal and latch signal failing edge are effective, and after the energization of command generator 302, instruction occurs
Latch in device 302 do not control signal by when, the latch Enable Pin of latch is in high level, command generator 302
The latch signal of output is also at high level, and latch signal is staggered the failing edge of clock signal, in 11 clock signal periods
After generate failing edge, latch the data-signal sealed in, the data-signal finally latched makes the phase shifter in T components 304 to be measured produce
The raw corresponding phase shift number of degrees.Transistor-Transistor Logic level is compatible with 0V/+3.3V and 0V/+5V, and the carrying of command generator 302 STM32F103 is micro-
Controller, the driver inside command generator 302 can also utilize host computer 301 to send out instruction with Protection Counter Functions is powered on
Raw device 302 carries out zero-setting operation.
After the performance parameter that T module testings instrument 303 tests T components 304 to be measured, host computer 301 is connect by general
Mouth bus reads the performance parameter that 303 test of T module testings instrument obtains, and automatically generated data table is stored, and may be used also
The performance parameter read is directly sent to other computers, data form is generated on other computers.
T component test systems provided by the invention utilize PC control command generator difference tranmitting data register signal, lock
Signal and data-signal are deposited to T components to be measured, the phase change of T components to be measured, measuring accuracy are controlled using command generator
Height, and reliability and stability is good, and T module testing instruments send radio-frequency input signals to T components to be measured, and T components to be measured is made to export
Measured signal gives T module testing instruments, and T module testings instrument tests the performance parameter of T components according to measured signal, entire to survey
Examination process is not necessarily to purely manual test, and high degree of automation, operating procedure is simple, and testing efficiency is high.
Refering to Fig. 4, further, the T component test systems further include DC power supply 305；
The DC power supply 305 is connect with the host computer 301 and described instruction generator 302 respectively, the host computer
The 301 control DC power supplies 305 are that described instruction generator 302 provides voltage, and the DC power supply 305 passes through described instruction
Generator 302 is that the T components 304 to be measured provide voltage.
Specifically, host computer 301 turns on the power switch, and control DC power supply 305 is that command generator 302 provides 20V electricity
Pressure, command generator 302 is a conversion and control box, has the function of power supply management and data setting, can be by 20V DC voltages
Lowering and stabilizing blood pressure processing is carried out, exports+6V/ ± 5V voltages to T components 304 to be measured.
Refering to Fig. 4, further, the T component test systems further include being exported for adjusting the output end to be measured
The attenuator 306 of measured signal size；
The T module testings instrument 303 is connected by the output end to be measured of the attenuator 306 and the T components 304 to be measured
It connects.
Specifically, after T components 304 to be measured export measured signal, the big of measured signal is adjusted first with attenuator 306
It is small, it is then forwarded to T module testings instrument 303, is convenient for testing.
Refering to Fig. 5, further, the T module testings instrument includes frequency spectrograph 3031 and signal generator 3032；
The signal generator 3032 connects with the rf inputs of the T components 304 to be measured and the host computer 301 respectively
It connects, the frequency spectrograph 3031 is connect with the output end to be measured of the T components 304 to be measured and the host computer 301 respectively.
Specifically, when T module testings instrument 303 includes frequency spectrograph 3031 and signal generator 3032, signal generator
3032 send the letter to be measured that radio-frequency input signals can be exported to T components 304 to be measured, frequency spectrograph 3031 according to T components 304 to be measured
Number directly measure the output power of output end to be measured.
Refering to Fig. 6, further, the T module testings instrument 303 includes Network Analyzer 3033；
The Network Analyzer 3033 respectively with the host computer 301, the T components 304 to be measured rf inputs and
The output end to be measured of the T components 304 to be measured connects.
Specifically, when T module testings instrument 303 includes Network Analyzer 3033, Network Analyzer 3033 is internally provided with
Signal generator, Network Analyzer 3033 can inherently send radio-frequency input signals to T components 304 to be measured, test T to be measured
Before 304 performance parameter of component, host computer 301 sends the second control instruction to command generator 302, and command generator 302 can
To adjust clock signal, latch signal and data-signal according to the second control instruction, the phase-shift states of T components 304 to be measured are made to be
The default phase shift number of degrees, that is to say, that it is the default phase shift number of degrees, default phase shift degree here to make the phase shifter in T components 304 to be measured
Number is determined according to the digit of actual demand and phase shifter, such as 180 °, 90 °, 45 °, 22.5 °, then T components 304 to be measured
Measured signal is exported to Network Analyzer 3033 according to radio-frequency input signals, and Network Analyzer 3033 can be according to T to be measured
The measured signal that component 304 exports measures positive transmission coefficient S21, reverse transfer coefficient S 12, input reflection coefficient S11, output
The performance parameters such as reflectance factor S22, output gain and input and output standing-wave ratio select the phase of S21 on Network Analyzer 1033
Bit test function, host computer 301 can measure the phase shifting accuracy of 304 opposite zero state of T components to be measured according to positive transmission coefficient S21
With amplitude-phase consistency, zero state here refers to that the phase-shift states of T components 304 to be measured are zero.
Further, the host computer 301 is connect by universal serial port bus with described instruction generator 302.
Specifically, host computer 301 sends control instruction, control instruction by universal serial port bus to command generator 302
302 tranmitting data register signal of generator, latch signal and data-signal give T components 304 to be measured, or adjustment to be sent to T groups to be measured
Clock signal, latch signal and the data-signal of part 304.
Further, the host computer 301 is connect by general purpose interface bus with the T module testings instrument 303.
Specifically, host computer 301 obtains the performance that 303 test of T module testings instrument obtains by general purpose interface bus and joins
Number, and generate data form and stored.
Further, described instruction generator 302 uses STM32F103 microcontrollers.
Specifically, command generator 302 uses STM32F103 microcontrollers, interface to use 21 needle low-frequency connectors, have
The function of power supply management and data setting can carry out lowering and stabilizing blood pressure processing to DC voltage, export+6V/ ± 5V to T groups to be measured
Part 304, can also be according to control instruction tranmitting data register signal, latch signal and the data-signal that host computer 301 is sent to T to be measured
Component 304 regulates and controls the phase change of T components 304 to be measured.
Further, the bandwidth of the radio-frequency input signals is no more than 1GHz.
Specifically, during T module testings, the bandwidth of radio-frequency input signals is usually no more than 1GHz, ensures test essence
Degree.
It is apparent to those skilled in the art that for convenience of description and succinctly, only with above-mentioned each work(
Can unit, module division progress for example, in practical application, can be as needed and by above-mentioned function distribution by different
Functional unit, module are completed, i.e., the internal structure of described device are divided into different functional units or module, more than completion
The all or part of function of description.Each functional unit, module in embodiment can be integrated in a processing unit, also may be used
It, can also be above-mentioned integrated during two or more units are integrated in one unit to be that each unit physically exists alone
The form that hardware had both may be used in unit is realized, can also be realized in the form of SFU software functional unit.In addition, each function list
Member, the specific name of module are also only to facilitate mutually distinguish, the protection domain being not intended to limit this application.Above system
The specific work process of middle unit, module, can refer to corresponding processes in the foregoing method embodiment, and details are not described herein.
Those of ordinary skill in the art may realize that lists described in conjunction with the examples disclosed in the embodiments of the present disclosure
Member and algorithm steps can be realized with the combination of electronic hardware or computer software and electronic hardware.These functions are actually
It is implemented in hardware or software, depends on the specific application and design constraint of technical solution.Professional technician
Each specific application can be used different methods to achieve the described function, but this realization is it is not considered that exceed
The scope of the present invention.
In embodiment provided by the present invention, it should be understood that disclosed device and method can pass through others
Mode is realized.For example, system embodiment described above is only schematical, for example, the division of the module or unit,
Only a kind of division of logic function, formula that in actual implementation, there may be another division manner, such as multiple units or component can be with
In conjunction with or be desirably integrated into another system, or some features can be ignored or not executed.Another point, it is shown or discussed
Mutual coupling or direct-coupling or communication connection can be by some interfaces, the INDIRECT COUPLING of device or unit or
Communication connection can be electrical, machinery or other forms.
The unit illustrated as separating component may or may not be physically separated, aobvious as unit
The component shown may or may not be physical unit, you can be located at a place, or may be distributed over multiple
In network element.Some or all of unit therein can be selected according to the actual needs to realize the mesh of this embodiment scheme
's.
In addition, each functional unit in each embodiment of the present invention can be integrated in a processing unit, it can also
It is that each unit physically exists alone, it can also be during two or more units be integrated in one unit.Above-mentioned integrated list
The form that hardware had both may be used in member is realized, can also be realized in the form of SFU software functional unit.
If the integrated module/unit be realized in the form of SFU software functional unit and as independent product sale or
In use, can be stored in a computer read/write memory medium.Based on this understanding, the present invention realizes above-mentioned implementation
All or part of flow in example method, can also instruct relevant hardware to complete, the meter by computer program
Calculation machine program can be stored in a computer readable storage medium, the computer program when being executed by processor, it can be achieved that on
The step of stating each embodiment of the method.Wherein, the computer program includes computer program code, the computer program generation
Code can be source code form, object identification code form, executable file or certain intermediate forms etc..The computer-readable medium
May include：Any entity or device, recording medium, USB flash disk, mobile hard disk, magnetic of the computer program code can be carried
Dish, CD, computer storage, read-only memory (Read-Only Memory, ROM), random access memory (Random
Access Memory, RAM), electric carrier signal, telecommunication signal and software distribution medium etc..It should be noted that the meter
The content that calculation machine readable medium includes can carry out increase and decrease appropriate according to legislation in jurisdiction and the requirement of patent practice,
Such as in certain jurisdictions, according to legislation and patent practice, computer-readable medium is including being not electric carrier signal and electricity
Believe signal.
Embodiment described above is merely illustrative of the technical solution of the present invention, rather than its limitations；Although with reference to aforementioned reality
Applying example, invention is explained in detail, it will be understood by those of ordinary skill in the art that：It still can be to aforementioned each
Technical solution recorded in embodiment is modified or equivalent replacement of some of the technical features；And these are changed
Or replace, the spirit and scope for various embodiments of the present invention technical solution that it does not separate the essence of the corresponding technical solution should all
It is included within protection scope of the present invention.
Claims (10)
1. a kind of T assembly test methods, which is characterized in that including：
The first control instruction is sent to command generator, when described instruction generator is sent respectively according to first control instruction
Clock signal, latch signal and data-signal give T components to be measured, and it is zero to make the phase-shift states of the T components to be measured；
It controls T module testing instruments and sends radio-frequency input signals to the T components to be measured；
After the T components to be measured export measured signal to the T module testings instrument according to the radio-frequency input signals, control
T module testings instrument tests the performance parameter of the T components to be measured according to the measured signal.
2. T assembly test methods according to claim 1, which is characterized in that in the T components to be measured according to the radio frequency
Input signal exports measured signal to after the T module testings instrument, and control T module testings instrument is surveyed according to the measured signal
The performance parameter for trying the T components to be measured includes：
Sending the second control instruction gives described instruction generator, described instruction generator to adjust institute according to second control instruction
Clock signal, the latch signal and the data-signal are stated, it is default phase shift degree to make the phase-shift states of the T components to be measured
Number；
Measured signal is exported to the T according to the default phase shift number of degrees and the radio-frequency input signals in the T components to be measured
After module testing instrument, control T module testings instrument tests the performance parameter of the T components to be measured according to the measured signal.
3. T assembly test methods according to claim 1, which is characterized in that further include：
Control DC power supply provides voltage for described instruction generator；
Control described instruction generator carries out lowering and stabilizing blood pressure processing to the voltage and is conveyed to the T components to be measured.
4. T assembly test methods according to claim 1, which is characterized in that in the first control instruction of the transmission to finger
After enabling generator, further include：
The feedback signal that described instruction generator is sent is received, the feedback signal is used to indicate described instruction generator and has connect
Receive first control instruction.
5. T assembly test methods according to claim 1, which is characterized in that further include：
The performance parameter that the T module testings instrument is tested is obtained, data form is generated and is stored.
6. a kind of T component test devices, which is characterized in that including：
First control instruction sending module, for sending the first control instruction to command generator, described instruction generator according to
The first control instruction difference tranmitting data register signal, latch signal and data-signal give T components to be measured, make the T groups to be measured
The phase-shift states of part are zero；
Radio-frequency input signals sending module sends radio-frequency input signals to the T groups to be measured for controlling T module testing instruments
Part；
Test module is surveyed for exporting measured signal according to the radio-frequency input signals in the T components to be measured to the T components
After test instrument, control T module testings instrument tests the performance parameter of the T components to be measured according to the measured signal.
7. T component test devices according to claim 6, which is characterized in that the test module includes：
Second control instruction sending module gives described instruction generator, described instruction generator for sending the second control instruction
The clock signal, the latch signal and the data-signal are adjusted according to second control instruction, makes the T groups to be measured
The phase-shift states of part are the default phase shift number of degrees；
Performance parameter test module, for being believed according to the default phase shift number of degrees and radio frequency input in the T components to be measured
Measured signal number is exported to after the T module testings instrument, control T module testings instrument is according to described in measured signal test
The performance parameter of T components to be measured.
8. T component test devices according to claim 6, which is characterized in that further include：
First power supply module provides voltage for controlling DC power supply for described instruction generator；
Second power supply module, for controlling described instruction generator to voltage progress lowering and stabilizing blood pressure processing and being conveyed to described
T components to be measured.
9. a kind of T component test systems, which is characterized in that include for control instruction generator and T module testing instruments
Position machine, for T components tranmitting data register signal to be measured, latch signal and data-signal command generator and for T to be measured
Component sends radio-frequency input signals and tests the T module testing instruments of T assembly properties parameter to be measured；
The host computer is connect with described instruction generator and the T module testings instrument respectively, described instruction generator and institute
State the low frequency input terminal connection of T components to be measured, T module testings instrument rf inputs with the T components to be measured respectively
It is connected with the output end to be measured of the T components to be measured, the non-output end to be measured of the T components to be measured is connect by load respectively
Ground.
10. a kind of computer readable storage medium, the computer-readable recording medium storage has computer program, feature to exist
In realizing the T assembly test methods as described in claim 1 to 5 any one when the computer program is executed by processor
Step.
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| CN201810385682.0A CN108469552A (en) | 2018-04-26 | 2018-04-26 | T assembly test methods, apparatus and system |
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|---|---|---|---|
| CN201810385682.0A CN108469552A (en) | 2018-04-26 | 2018-04-26 | T assembly test methods, apparatus and system |
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| CN201810385682.0A Pending CN108469552A (en) | 2018-04-26 | 2018-04-26 | T assembly test methods, apparatus and system |
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Cited By (1)
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| CN112748300A (en) * | 2020-12-24 | 2021-05-04 | 西安航空电子科技有限公司 | Test method, test device and test system for microwave equipment |
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