CN110736953A - digital oscilloscope checking device - Google Patents
digital oscilloscope checking device Download PDFInfo
- Publication number
- CN110736953A CN110736953A CN201911320363.2A CN201911320363A CN110736953A CN 110736953 A CN110736953 A CN 110736953A CN 201911320363 A CN201911320363 A CN 201911320363A CN 110736953 A CN110736953 A CN 110736953A
- Authority
- CN
- China
- Prior art keywords
- probe
- frequency
- signal
- calibration
- low
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The application discloses digital oscilloscope check devices, including probe, switch matrix and check device controller, switch matrix is used for receiving the check signal that check device sent and sending to the probe, and the probe is used for sending the check signal that receives to the oscilloscope that is being tested, and the check device controller is used for when the oscilloscope that is being tested is checked, control switch matrix connection probe and check device to send the check signal that check device sent to the oscilloscope that is being tested through the probe.
Description
Technical Field
The invention belongs to the technical field of digital oscilloscopes, and particularly relates to an digital oscilloscope checking device.
Background
With the development of the modern test and measurement field, in order to cope with the increasing complexity of electronic product design, monitoring equipment is required to develop towards high bandwidth, high sampling rate and high storage depth, and a digital oscilloscope is used as universal electronic measurement instruments using , which are used for measuring the amplitude, maximum value, minimum value, period, pulse width, duty ratio and the like of various electric signals, and has various advantages of accurate measurement, simple and convenient maintenance, flexible use, high reliability, good stability and the like, and is generally applied to a plurality of industries by .
Disclosure of Invention
The invention discloses an digital oscilloscope calibration device, which solves the technical problem that human intervention is needed when a digital oscilloscope is calibrated and checked in the prior art.
According to an th aspect, embodiments provide a digital oscilloscope verifier including a probe, a switch matrix, and a verifier controller;
the switch matrix is connected with the probe and used for receiving a calibration signal sent by calibration equipment and sending the calibration signal to the probe;
the probe is used for being connected to the signal input end of the tested oscillograph and sending the received verification signal to the tested oscillograph; and/or, the verification device is also used for monitoring the input signal of the signal input end of the tested oscillograph and sending feedback data obtained according to the monitoring result to the verification device controller;
the calibration device controller is connected with the switch matrix and is used for controlling the switch matrix to be connected with the probe and the calibration equipment when the tested oscillograph is calibrated so as to send the calibration signal sent by the calibration equipment to the tested oscillograph through the probe; and/or, the verification device is further configured to obtain verification signal adjustment information according to the obtained feedback data, so that the verification device adjusts the verification signal.
A step , in which the switch matrix includes a high frequency switch matrix and a low frequency switch matrix;
the checking device controller is also used for controlling the high-frequency switch matrix to be started when the checking equipment sends out a high-frequency checking signal, and controlling the low-frequency switch matrix to be started when the checking equipment sends out a low-frequency checking signal;
when the high-frequency switch matrix is started, the high-frequency switch matrix is used for receiving a high-frequency check signal sent by check equipment and sending the high-frequency check signal to the probe;
and when the low-frequency switch matrix is started, the low-frequency switch matrix is used for receiving a low-frequency check signal sent by the check equipment and sending the low-frequency check signal to the probe.
, the probe comprises a switch circuit and a probe controller;
the switch circuit comprises a low-frequency signal input end and a probe output end; the low-frequency signal input end is connected with the low-frequency switch matrix and used for receiving a low-frequency check signal; the probe controller is connected with the switch circuit, and when the probe receives a low-frequency verification signal, the switch circuit is controlled to connect the low-frequency signal input end with the probe output end so as to send the low-frequency verification signal received by the low-frequency signal input end to the tested oscilloscope.
And , the probe further comprises a low-pass filter, which is connected between the low-frequency signal input end and the probe output end through the switch circuit, and is used for sending the low-frequency verification signal received by the low-frequency signal input end to the probe output end after low-pass filtering, so as to improve the signal-to-noise ratio of the low-frequency verification signal.
And , the switch circuit further comprises a high-frequency signal input end connected with the high-frequency switch matrix, and the probe controller is further used for controlling the switch circuit to connect the high-frequency signal input end with the probe output end when the probe receives the high-frequency verification signal so as to send the high-frequency verification signal received by the high-frequency signal input end to the tested oscilloscope.
And , the probe further comprises a detector which is respectively connected with the probe controller and the probe output end and is used for monitoring the input signal of the signal input end of the tested oscillograph and sending the monitoring result to the probe controller, and the probe controller acquires the feedback data according to the monitoring result and sends the feedback data to the checking device controller.
And , the probe further comprises a matcher which is respectively connected with the probe controller and the probe output end, and the matcher is connected to the probe output end through the probe controller by the verifying device controller when the tested oscilloscope does not have an internal matcher, so as to provide impedance matching for the high-frequency verifying signal input into the tested oscilloscope.
, the probe also includes a memory connected to the probe controller for storing the probe number information and/or the probe parameter information.
And , the digital oscilloscope checking device comprises at least probes, and each probe is respectively connected with the switch matrix and is used for being respectively connected with a plurality of input ends of the tested oscillograph or is used for being respectively connected with a plurality of tested oscillographs.
, the device further comprises a master controller, which is used to connect with the calibration device controller, the calibration equipment and the tested oscillograph, respectively, the calibration device controller sends the calibration signal adjustment information obtained according to the feedback data to the master controller, the master controller is used to obtain the compensation value of the calibration signal according to the calibration signal adjustment information and send the calibration equipment, the calibration device adjusts the output calibration signal according to the compensation value, and/or the master controller is used to obtain the calibration item of the tested oscillograph and connects the tested oscillograph and the calibration equipment needed for calibrating the calibration item through the switch matrix and the probe according to the calibration item of the tested oscillograph.
And , the master controller is further configured to respond to a verification request of the tested oscillograph, and control the switch matrix to send a verification signal sent by the verification device required by the verification item to the tested oscillograph through the probe according to the verification item of the tested oscillograph.
The digital oscilloscope check devices according to the embodiment comprise a probe, a switch matrix and a check device controller, wherein the switch matrix is used for receiving a check signal sent by a check device and sending the check signal to the probe, the probe is used for sending the received check signal to a tested oscilloscope, the check device controller is used for controlling the switch matrix to be connected with the probe and the check device when the tested oscilloscope is checked so as to send the check signal sent by the check device to the tested oscilloscope through the probe.
Drawings
FIG. 1 is a schematic diagram of digital oscilloscopes connected to a calibration device;
FIG. 2 is a schematic diagram of digital oscilloscope connected to a calibration device;
FIG. 3 is a schematic structural diagram of a checking device of a digital oscilloscope in embodiments;
FIG. 4 is a schematic structural diagram of exemplary switch matrices;
FIG. 5 is a schematic structural diagram of a probe in embodiments;
fig. 6 is a schematic structural diagram of embodiments of the digital oscilloscope verification apparatus.
Detailed Description
In the following detailed description, the invention is described in conjunction with the accompanying drawings in , where like elements in different embodiments have been given like element numbers associated with them, in which case many details will be described to better understand the present application, however, those skilled in the art will readily appreciate that some of the features may be omitted or replaced with other elements, materials, methods, and in some cases, operations associated with the present application are not shown or described in the specification, which is necessary to avoid overwhelming the core of the present application and to avoid unnecessary detailed description of the associated operations, which will be fully apparent to those skilled in the art based on the description in the specification and general knowledge in the art.
Additionally, the various orders in the specification and drawings are for clarity only to describe certain embodiments and are not meant to be a required order unless otherwise specified where a certain order must be followed.
The ordinal numbers used herein to describe the components, such as "," "second," etc., are used solely to distinguish between the items described and do not have any sequential or technical meaning.
At present, mature commercial oscilloscopes calibration instruments are available on the market, although the calibration instruments have excellent performance and high automation degree, the calibration instruments are expensive, high in use and maintenance cost and poor in flexibility, and new calibration requirements brought by new functional characteristics of a digital oscilloscope are difficult to timely respond to, please refer to fig. 1, which is a schematic connection diagram of digital oscilloscopes and calibration equipment, according to calibration items of a tested oscillograph, corresponding calibration equipment is sequentially connected through signal lines, in practical application, different calibration equipment is required to be connected for calibrating different items of the tested oscillograph, for example, calibration equipment such as a signal source, a multimeter or an impedance analyzer is required to be connected, the connection between the tested oscillograph and the calibration equipment needs to be frequently and manually replaced, different calibration equipment may need different signal lines, for example, a precise direct current source, a high-frequency coupling noise in a transmission process needs to be added at an input port of the oscilloscope, while a high-bandwidth radio frequency coaxial line is required for the signal source, refer to fig. 2, which is a schematic connection diagram of digital oscillographs and a low-frequency coupling noise in a transmission process of a low-frequency signal generated in a transmission line in order to compensate loss of a signal, a signal source, and a corresponding calibration equipment is added to compensate a three.
In the embodiment of the application, digital oscilloscope check devices are disclosed, which comprise a probe, a switch matrix and a check device controller, wherein the switch matrix is used for receiving a check signal sent by a check device and sending the check signal to the probe, the probe is used for sending the received check signal to a tested oscilloscope, the check device controller is used for controlling the switch matrix to be connected with the probe and the check device when the tested oscilloscope is checked so as to send the check signal sent by the check device to the tested oscilloscope through the probe, and the check device controller is used for connecting the tested oscilloscope and the check device according to the check requirement of the tested oscilloscope, so that the check environment can be independently established for use, and can also be matched with a commercial oscilloscope calibrator to be used as a supplement device so as to quickly meet the check requirement increased due to the new functions of the oscilloscope, further simplify the operation steps of digital oscilloscope check, and save the oscilloscope check time and labor.
Example
Please refer to fig. 3, which is a schematic structural diagram of embodiments of a digital oscilloscope calibration apparatus, wherein a digital oscilloscope calibration apparatus 1 includes a probe 10, a switch matrix 20 and a calibration apparatus controller 30, the switch matrix 20 is connected to the probe 10 and configured to receive a calibration signal sent by a calibration device 2 and send the calibration signal to the probe 10, the probe 10 is configured to send the received calibration signal to a tested oscilloscope 3, in embodiments, the probe 10 is connected to the calibration apparatus controller 30 and further configured to monitor an input signal at an input end of the tested oscilloscope 3 and send feedback data obtained by monitoring the input signal to the calibration apparatus controller 30, and the calibration apparatus controller 30 sends calibration signal adjustment information to the calibration device 2 according to the feedback data so as to adjust the output calibration signal of the calibration device 2.
Referring to fig. 4, which is a schematic diagram of a switch matrix in embodiments, the switch matrix 20 includes a high frequency switch matrix 21 and a low frequency switch matrix 22, the calibration device controller 30 is used for controlling to turn on the high frequency switch matrix 21 when the calibration device 1 sends out a high frequency calibration signal, and controls to turn on the low frequency switch matrix 22 when the calibration device 1 sends out a low frequency calibration signal, the high frequency switch matrix 21 is used for receiving a high frequency calibration signal sent by the calibration device 1 and sending to the probe 10 when turned on, the low frequency switch matrix 22 is used for receiving a low frequency calibration signal sent by the calibration device 1 and sending to the probe 10 when turned on, in embodiments, the digital oscilloscope calibration device 30 includes at least probes 10, each probe 10 is connected to the switch matrix 20 respectively, for being connected to a plurality of inputs of the probes 3 to be tested, or connected to a plurality of the probes 3 to be tested, referring to fig. 5, which is a schematic diagram of a probe configuration of probes in embodiments, the probe 30 includes a switch circuit and a probe 34, a probe circuit and a probe circuit, a probe, a calibration circuit, a.
Referring to fig. 6, which is a schematic structural diagram of a digital oscilloscope calibration apparatus in embodiments, in embodiments, the digital oscilloscope calibration apparatus further includes a master controller 40, which is connected to the calibration apparatus controller 30, the calibration device 2 and the tested oscilloscope 3 respectively, to obtain calibration items of the tested oscilloscope 3, and according to the calibration items of the tested oscilloscope 3, the tested oscilloscope 3 and an output end of the calibration device 2 required for calibrating the calibration items are connected through the switch matrix 20 and the probe 10, in embodiment, the probe 10 is further connected to the calibration apparatus controller 30, for monitoring a calibration signal input to the tested oscilloscope 3 when the tested oscilloscope 3 is calibrated, and sending feedback data obtained according to the monitoring data to the calibration apparatus controller 30, the calibration apparatus controller 30 sends calibration signal adjustment information obtained according to the feedback data to the master controller 40, the master controller 40 is used for obtaining a compensation value of a calibration signal according to the calibration signal and sending the calibration signal to the calibration device 2, the calibration device 2 adjusts an output signal according to the compensation value of the probe 2, and sends a calibration signal adjustment information to the calibration device 2 for performing calibration, that the calibration signal adjustment process of the calibration signal, that the calibration device 2 is transmitted to the calibration device 30, that the calibration device 30 is transmitted through the calibration device 34, and the calibration device 30 is connected to the calibration device 30, and the calibration device 30, the calibration device 30 includes the calibration device 34, the calibration device 30 includes the calibration device 34, the calibration device 30 includes the calibration device 34, the calibration device 30, the calibration device 34, the calibration device 30 includes the calibration device 34, the calibration device 30 includes the calibration device 30, the calibration device 2, the calibration device 30 includes the calibration device 30, the calibration device 2, the calibration.
The embodiment of the application discloses digital oscilloscope calibration devices, which comprise a probe, a switch matrix and a calibration device controller, wherein the switch matrix is used for receiving a calibration signal sent by a calibration device and sending the calibration signal to the probe, the probe is used for sending the received calibration signal to a tested oscilloscope, the calibration device controller is used for controlling the switch matrix to be connected with the probe and the calibration device when the tested oscilloscope is calibrated, so that the calibration signal sent by the calibration device is sent to the tested oscilloscope through the probe.
When all or part of the functions of the above embodiments are implemented by a computer program, the program may be stored in computer readable storage medium, which may include a read only memory, a random access memory, a magnetic disk, an optical disk, a hard disk, etc. and the functions may be implemented by a computer.
The present invention has been described in terms of specific examples, which are provided to aid understanding of the invention and are not intended to be limiting. For a person skilled in the art to which the invention pertains, several simple deductions, modifications or substitutions may be made according to the idea of the invention.
Claims (10)
- The checking device of the digital oscilloscope is characterized by comprising a probe, a switch matrix and a checking device controller;the switch matrix is connected with the probe and used for receiving a calibration signal sent by calibration equipment and sending the calibration signal to the probe;the probe is used for being connected to the signal input end of the tested oscillograph and sending the received verification signal to the tested oscillograph; and/or, the verification device is also used for monitoring the input signal of the signal input end of the tested oscillograph and sending feedback data obtained according to the monitoring result to the verification device controller;the calibration device controller is connected with the switch matrix and is used for controlling the switch matrix to be connected with the probe and the calibration equipment when the tested oscillograph is calibrated so as to send the calibration signal sent by the calibration equipment to the tested oscillograph through the probe; and/or, the verification device is further configured to obtain verification signal adjustment information according to the obtained feedback data, so that the verification device adjusts the verification signal.
- 2. The digital oscilloscope calibration apparatus according to claim 1, wherein said switch matrix comprises a high frequency switch matrix and a low frequency switch matrix;the checking device controller is also used for controlling the high-frequency switch matrix to be started when the checking equipment sends out a high-frequency checking signal, and controlling the low-frequency switch matrix to be started when the checking equipment sends out a low-frequency checking signal;when the high-frequency switch matrix is started, the high-frequency switch matrix is used for receiving a high-frequency check signal sent by check equipment and sending the high-frequency check signal to the probe;and when the low-frequency switch matrix is started, the low-frequency switch matrix is used for receiving a low-frequency check signal sent by the check equipment and sending the low-frequency check signal to the probe.
- 3. The digital oscilloscope calibration apparatus according to claim 2, wherein said probe comprises a switching circuit and a probe controller;the switch circuit comprises a low-frequency signal input end and a probe output end; the low-frequency signal input end is connected with the low-frequency switch matrix and used for receiving a low-frequency check signal; the probe controller is connected with the switch circuit, and when the probe receives a low-frequency verification signal, the switch circuit is controlled to connect the low-frequency signal input end with the probe output end so as to send the low-frequency verification signal received by the low-frequency signal input end to the tested oscilloscope.
- 4. The digital oscilloscope calibration apparatus according to claim 3, wherein said probe further comprises a low pass filter connected between said low frequency signal input terminal and said probe output terminal through said switching circuit, for low pass filtering the low frequency calibration signal received at the low frequency signal input terminal and sending it to said probe output terminal, so as to improve the signal-to-noise ratio of the low frequency calibration signal.
- 5. The digital oscilloscope calibration apparatus according to claim 3, wherein said switching circuit further comprises a high frequency signal input connected to said high frequency switch matrix; and the probe controller is also used for controlling the switch circuit to connect the high-frequency signal input end with the probe output end when the probe receives the high-frequency verification signal so as to send the high-frequency verification signal received by the high-frequency signal input end to the tested oscilloscope.
- 6. The digital oscilloscope calibration apparatus according to claim 5, wherein said probe further comprises a detector, connected to said probe controller and said probe output terminal respectively, for monitoring an input signal at a signal input terminal of said detector under test and sending a monitoring result to said probe controller; and the probe controller acquires the feedback data according to the monitoring result and sends the feedback data to the checking device controller.
- 7. The digital oscilloscope calibration apparatus according to claim 6, wherein said probe further comprises a matcher connected to said probe controller and said probe output terminal, respectively, for connecting said matcher to said probe output terminal through said probe controller when said oscilloscope under test has no internal matcher, so as to provide impedance matching for the high frequency calibration signal input to said oscilloscope under test.
- 8. The digital oscilloscope calibration apparatus according to claim 7, wherein said probe further comprises a memory connected to said probe controller for storing information on the number of said probe and/or information on the parameters of the probe.
- 9. The digital oscilloscope verification apparatus according to claim 3, wherein said digital oscilloscope verification apparatus comprises at least of said probes, each probe being connected to said switch matrix, for connection to a respective plurality of inputs of said oscilloscope under test, or for connection to a respective plurality of said oscilloscope under test.
- 10. The digital oscilloscope calibration apparatus according to claim 3, further comprising a master controller for connecting to said calibration apparatus controller, said calibration device and said oscilloscope under test, respectively; the checking device controller sends the checking signal adjusting information obtained according to the feedback data to the master controller, the master controller is used for obtaining a compensation value of a checking signal according to the checking signal adjusting information and sending the compensation value to the checking equipment, and the checking device adjusts the output checking signal according to the compensation value; and/or the master controller is used for acquiring the check items of the tested oscillograph and connecting the tested oscillograph and the check equipment required for checking the check items through the switch matrix and the probe according to the check items of the tested oscillograph.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201911320363.2A CN110736953A (en) | 2019-12-20 | 2019-12-20 | digital oscilloscope checking device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201911320363.2A CN110736953A (en) | 2019-12-20 | 2019-12-20 | digital oscilloscope checking device |
Publications (1)
Publication Number | Publication Date |
---|---|
CN110736953A true CN110736953A (en) | 2020-01-31 |
Family
ID=69274577
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201911320363.2A Pending CN110736953A (en) | 2019-12-20 | 2019-12-20 | digital oscilloscope checking device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN110736953A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113126014A (en) * | 2021-04-14 | 2021-07-16 | 中国工程物理研究院计量测试中心 | Calibration system for realizing array parallelism of digital oscilloscope |
CN113625032A (en) * | 2021-07-01 | 2021-11-09 | 普源精电科技股份有限公司 | Probe measurement system and method |
CN117310292A (en) * | 2023-11-28 | 2023-12-29 | 深圳市鼎阳科技股份有限公司 | System, method and medium for measuring input impedance of high-frequency power supply probe |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009111476A (en) * | 2007-10-26 | 2009-05-21 | Honda Motor Co Ltd | Signal distributor |
CN103424689A (en) * | 2012-05-24 | 2013-12-04 | 沈阳华岩电力技术有限公司 | Phase selection switch verifying device and phase selection switch verifying method |
CN104459595A (en) * | 2014-12-22 | 2015-03-25 | 上海斐讯数据通信技术有限公司 | Oscilloscope checking system and method |
CN204465479U (en) * | 2015-03-26 | 2015-07-08 | 深圳市鼎阳科技有限公司 | A kind of digital filter with gain compensation function |
CN106371005A (en) * | 2016-08-17 | 2017-02-01 | 中国电子科技集团公司第四十研究所 | Switch matrix based microwave component switch response time measuring device and method |
CN107656159A (en) * | 2017-10-09 | 2018-02-02 | 常州工学院 | Novel automatic pyroelectric effect test system and method |
CN207570576U (en) * | 2017-12-14 | 2018-07-03 | 广州山锋测控技术有限公司 | Measurement and calibration adaptive device and system |
CN108254608A (en) * | 2016-12-29 | 2018-07-06 | 北京普源精电科技有限公司 | The method for self-calibrating of digital oscilloscope and digital oscilloscope |
CN110412371A (en) * | 2019-07-20 | 2019-11-05 | 中国船舶重工集团公司第七二四研究所 | Multi-coaxial cable assembly shield effectiveness detection method based on probe method |
-
2019
- 2019-12-20 CN CN201911320363.2A patent/CN110736953A/en active Pending
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009111476A (en) * | 2007-10-26 | 2009-05-21 | Honda Motor Co Ltd | Signal distributor |
CN103424689A (en) * | 2012-05-24 | 2013-12-04 | 沈阳华岩电力技术有限公司 | Phase selection switch verifying device and phase selection switch verifying method |
CN104459595A (en) * | 2014-12-22 | 2015-03-25 | 上海斐讯数据通信技术有限公司 | Oscilloscope checking system and method |
CN204465479U (en) * | 2015-03-26 | 2015-07-08 | 深圳市鼎阳科技有限公司 | A kind of digital filter with gain compensation function |
CN106371005A (en) * | 2016-08-17 | 2017-02-01 | 中国电子科技集团公司第四十研究所 | Switch matrix based microwave component switch response time measuring device and method |
CN108254608A (en) * | 2016-12-29 | 2018-07-06 | 北京普源精电科技有限公司 | The method for self-calibrating of digital oscilloscope and digital oscilloscope |
CN107656159A (en) * | 2017-10-09 | 2018-02-02 | 常州工学院 | Novel automatic pyroelectric effect test system and method |
CN207570576U (en) * | 2017-12-14 | 2018-07-03 | 广州山锋测控技术有限公司 | Measurement and calibration adaptive device and system |
CN110412371A (en) * | 2019-07-20 | 2019-11-05 | 中国船舶重工集团公司第七二四研究所 | Multi-coaxial cable assembly shield effectiveness detection method based on probe method |
Non-Patent Citations (1)
Title |
---|
白向飞: "示波器校准仪控制平台和信号切换系统的硬件设计", 《中国优秀硕士学位论文全文数据库 工程科技II辑》 * |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113126014A (en) * | 2021-04-14 | 2021-07-16 | 中国工程物理研究院计量测试中心 | Calibration system for realizing array parallelism of digital oscilloscope |
CN113126014B (en) * | 2021-04-14 | 2024-04-02 | 中国工程物理研究院计量测试中心 | Calibration system for realizing array parallelism of digital oscilloscope |
CN113625032A (en) * | 2021-07-01 | 2021-11-09 | 普源精电科技股份有限公司 | Probe measurement system and method |
CN117310292A (en) * | 2023-11-28 | 2023-12-29 | 深圳市鼎阳科技股份有限公司 | System, method and medium for measuring input impedance of high-frequency power supply probe |
CN117310292B (en) * | 2023-11-28 | 2024-01-30 | 深圳市鼎阳科技股份有限公司 | System, method and medium for measuring input impedance of high-frequency power supply probe |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN110736953A (en) | digital oscilloscope checking device | |
US7405575B2 (en) | Signal analysis system and calibration method for measuring the impedance of a device under test | |
CN102095905B (en) | There is the signal acquiring system of probe cable termination in signal processing equipment | |
US7460983B2 (en) | Signal analysis system and calibration method | |
CN102081107B (en) | Reduce the signal acquiring system of the probe load of equipment under test | |
US7599618B2 (en) | Method and apparatus for self-testing of test equipment | |
US7408363B2 (en) | Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load | |
US20200300923A1 (en) | Automatic test system of wireless charging system | |
US11408916B2 (en) | Modular probe for automated test applications | |
CN102749604A (en) | Automatic calibrator, calibration system and calibration method of testing equipment | |
US20070041511A1 (en) | Apparatus and method for processing a signal under test for measuring the impedance of a device under test | |
US12061232B2 (en) | Margin test data tagging and predictive expected margins | |
US11226371B2 (en) | System and method of production testing of impedance of radio frequency circuit incorporated on printed circuit board | |
CN110609183A (en) | IVI technology-based identification module and automatic test system of complete machine | |
US6064312A (en) | Method and apparatus for automatic verification of measurement probe functionality and compensation | |
US5336988A (en) | Scalar S-parameter test set for NMR instrumentation measurements | |
JP5855838B2 (en) | Multi-channel test switching system and method | |
US11971450B2 (en) | Electronic tester and testing method | |
JP7565443B2 (en) | System and method for compensating for power loss due to radio frequency (RF) signal probe mismatch in conducted signal testing - Patents.com | |
US20220390513A1 (en) | Multi-input remote heads for sequential testing | |
CN114499706B (en) | Electronic calibration system, automatic port identification method and storage medium | |
US8989243B1 (en) | Power line device with directional coupler | |
CN112230069A (en) | Integrated circuit electromagnetic interference diagnostic system and method | |
EP1826583A2 (en) | Signal analysis system and calibration method | |
US11782073B2 (en) | Probe extension system, measurement system and probe extension method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
RJ01 | Rejection of invention patent application after publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20200131 |