CN103364599B - Probe, signal acquiring system and method with attenuation function - Google Patents
Probe, signal acquiring system and method with attenuation function Download PDFInfo
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- CN103364599B CN103364599B CN201210088619.3A CN201210088619A CN103364599B CN 103364599 B CN103364599 B CN 103364599B CN 201210088619 A CN201210088619 A CN 201210088619A CN 103364599 B CN103364599 B CN 103364599B
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Abstract
A kind of probe with attenuation function, signal acquiring system and method, a RC parallel module, the output port that the probe includes a public terminal and is connected in series；There is first wiring point on connecting line between the RC parallel modules and the output port, first electric capacity and a first resistor are in series between first wiring point and public terminal；The second wiring point is additionally provided with the connecting line, a second resistance and a variable resistances by program controlling have been sequentially connected in series between second wiring point and the public terminal；The power pins of the variable resistances by program controlling are connected on power connector end of the output port, and the controlling switch of the variable resistances by program controlling is connected on a control connection terminal of the output port.For the probe of the present invention by setting variable resistances by program controlling to be responded come regulating frequency, frequency response flatness is high, and the measurement data degree of accuracy is high, circuit-under-test is influenceed small.
Description
Technical field
The present invention relates to measurement, technical field of measurement and test, more particularly to a kind of with the popping one's head in of attenuation function, a kind of signal
Acquisition system and a kind of signal acquisition method.
Background technology
In measurement, testing field, probe is a kind of measuring apparatus (such as oscillograph, data acquisition for display electric variable
Card, logic analyser etc.) and the device of signal is gathered, the signal collected from circuit-under-test is input in measuring apparatus by it.
Probe should have flat frequency response as far as possible, i.e., the attenuation ratio in defined frequency range in defined frequency range
Change should be as far as possible small, and frequency response is more flat, and the precision popped one's head in is higher.Probe should also have as far as possible in defined frequency range
High input impedance and as far as possible low input capacitance, high input impedance and low input capacitance are light to the load that circuit-under-test introduces,
Interference to circuit-under-test is small.
The parasitic capacitance of probe cable limits the minimum value of input capacitance, it is not easy to reduces.
It is a kind of existing probe 100 with reference to figure 1, including probe tip resistance Rt, RC parallel circuit for being sequentially connected in series and coaxial
Line 130, the other end of the coaxial line 130 is connected to test equipment 150, between the coaxial line 130 and test equipment 150
A tie point is additionally provided with circuit, is in series with electric capacity Cs and resistance Rs between tie point and the public terminal COM, wherein institute
It is tunable capacitor to state electric capacity Cs.The RC parallel circuits include electric capacity Cc, the resistance Rc being connected in parallel and switch S.
The probe 100 changes attenuation ratio by closing or opening switch S.In order to improve frequency response flatness, probe 100
Adjustment terminal is finely tuned provided with compensation, that is, adjusts electric capacity Cs.First connect good probe 100 and test equipment 150 when adjusting probe compensation, and
Probe 100 is accessed into a correction signal, manual turn compensation fine setting adjustment terminal so that the ripple seen in test equipment 150
Shape does not have overcompensation and under-compensated phenomenon, that is, make it that probe frequency response is optimal.
The probe 100 can realize the attenuation ratio of 1 times or 10 times, i.e., marked in general probe × 1 or × 10.Typically
Ground, electric capacity Cs scope are 21pF~31pF, and the input capacitance of test equipment 150 is 5pF~30pF scopes, test equipment 150
Input resistance be 1M Ω, electric capacity Cc scope is 11pF~21pF, and resistance Rc is 9M Ω.Probe tip resistance Rt and resistance Rs
Resistance typically in the Ω scopes of 0 Ω~500.
When the switch s is closed, attenuation ratio of popping one's head in is 1 times, i.e., is coupled to probe tip resistance Rt direct current from circuit-under-test 104
With low frequency signal without being damply coupled to test equipment 150.Ignore probe tip resistance Rt and resistance Rs, at this moment circuit-under-test
104 in the parallel connection that the probe tip resistance Rt probe input capacitances seen are approximately electric capacity Cs and the input capacitance of test equipment 150,
26pF~61pF scopes, so big input capacitance would generally cause significant impact to circuit-under-test 104.
When switching S disconnections, probe attenuation ratio is 10 times, i.e., is coupled to the straight of probe tip resistance Rt from circuit-under-test 104
Stream and low frequency signal are coupled to test equipment 150 after 10 times of decay.Resistance Rc is very big, it is believed that open circuit, ignores probe
Sharp resistance Rt and resistance Rs, at this moment circuit-under-test 104 is approximately electric capacity Cc in the probe tip resistance Rt probe input capacitances seen
The parallel connection of electric capacity Cs and the input capacitance of test equipment 150 in series connection, the electric capacity is in 11pF~21pF scopes.Attenuation ratio of popping one's head in is 10
Times when input capacitance be less than input capacitance when probe attenuation ratio is 1 times, it is but still very big.
When attenuation ratio of popping one's head in is more than 1, in order that the frequency of the test system of must pop one's head in 100 and the composition of test equipment 150
Respond flat, the element in Fig. 1 needs to meet following relation (negligible resistance Rt and resistance Rs influence)：
CcRc=(Cs+Ci) Ri
Wherein Ci is the input capacitance of test equipment 150, and Ri is the input resistance of test equipment 150.
When the attenuation ratio of probe is much larger than 1,100 input capacitance of popping one's head in is approximately equal to electric capacity Cc size.Ri's is big
It is small to become, in order to further reduce Cc, it is necessary to increase Rc, that is, increase the attenuation ratio of probe 100.
Rc is simply increased, the direct current input impedance of probe 100 can be caused to deviate 10M Ω standard input impedance, do not met
It is required that.
In order to solve the above problems, with reference to figure 2, the US publication file of Patent No. 5172051 discloses another
Kind probe 200, including probe tip resistance Rt, RC parallel circuit 110 (including resistance Rc and electric capacity Cc), lossless coaxial cable 130,
Terminal network 140 (including resistance Rs3, resistance Rs2, resistance Rs1, electric capacity Cs).
Probe tip resistance Rt connects with RC parallel circuits 110, on the one hand forms a minimum probe input impedance, the opposing party
Face provides 80% high frequency attenuation together with the characteristic impedance of lossless coaxial cable 130.
Probe tip resistance Rt, RC parallel circuit 110, lossless coaxial cable 130, terminal network 140 collectively constitute one admittedly
The attenuator of certainty ratio.Because the impedance of capacity cell changes with frequency, in different frequency ranges, the impedance of capacity cell is decaying
The component accounted in circuit is different, thus determines that the main element of attenuation ratio is different.In low-frequency range, the impedance of capacity cell is very
Height, it can ignore, the attenuator circuit that resistance Rc and resistance Rs3 are composed in series mainly determines attenuation ratio；In Mid Frequency, electric capacity member
The impedance of part can compare with the impedance of resistance, at this moment compensate network 110 and be made up of cable capacitance, electric capacity Cs, resistance Rs3
Network determines attenuation ratio；In high band, the impedance very little of capacity cell, the impedance of resistance and electric capacity network in parallel is by electric capacity
Determine, the impedance of the network of resistance and electric capacity series connection is determined by resistance, at this moment pop one's head in key resistance Rt, electric capacity Cc, lossless coaxial electrical
Cable 130, resistance Rs1, resistance Rs2, electric capacity Cs together decide on attenuation ratio.
By the length for the lossless coaxial cable 130 for setting optimization, reflection loss and other transmission line effects can be caused
Caused distortion is minimum, so that the frequency response of probe is as far as possible flat.Above-mentioned probe 200, can due to introducing resistance Rs3
To obtain larger attenuation ratio, and then it can make it that input capacitance is smaller, and it is the input resistance of 10M Ω standards to keep input impedance
It is anti-.
Because the attenuation ratio of low-frequency range is determined by resistance, and each resistance of probe 200 is constant, therefore low cut
Than being fixed.And high frequency attenuation is than mainly being determined by each electric capacity, in order that frequency response flatness height, it is necessary to adjust
The high frequency attenuation ratio of probe 200, this can manually adjust electric capacity Cs to carry out, but due to parasitic capacitance, electricity be present
The problems such as holding component error, high frequency attenuation ratio can not accurate adjustment.Therefore, there is such a problem in prior art：In order to
So that probe 200 frequency response flatness it is sufficiently high, change probe 200 high frequency attenuation than scheme uncontrollable mistake be present
Difference, it is difficult to realize.
The content of the invention
In order to solve the above problems, the invention provides a kind of probe with attenuation function, probe frequency response flatness is high.
Probe of the present invention with attenuation function, including public terminal and a RC parallel connection being connected in series
Module, an output port；
There is first wiring point on connecting line between the RC parallel modules and the output port, described first
First electric capacity and a first resistor are in series between wiring point and public terminal；
The second wiring point is additionally provided with the connecting line,
Be sequentially connected in series between second wiring point and the public terminal second resistance and one it is program control can
Become resistance；
The power pins of the variable resistances by program controlling are connected on power connector end of the output port, described
The controlling switch of variable resistances by program controlling is connected on a control connection terminal of the output port.
The probe of the present invention sets variable resistances by program controlling between second resistance and common port, by adjusting Programmable and Variable electricity
Resistance can be achieved to calibrate the low frequency and DC current gain of probe, and then make it that the Flatness of frequency response of probe is high, probe
Precision is high；Program control control can be carried out to variable resistances by program controlling simultaneously, it is high compared to manual regulation, precision.
As one kind for example, in probe of the present invention, second wiring point is located at the RC parallel modules
Between first wiring point.
As another for example, in probe of the present invention, the maximum of the variable resistances by program controlling is less than 1M
Ohm.
As another for example, in probe of the present invention, first wiring point and second wiring point
Between connecting line on be also in series with a 3rd resistor.
As another for example, in probe of the present invention, the variable resistances by program controlling is digital regulation resistance
AD5243。
In order to solve the problems, such as in background technology, present invention also offers a kind of signal acquiring system.
The signal acquiring system includes a probe and a measuring apparatus with attenuation function,
The probe includes：One public terminal and a RC parallel module, the output port being connected in series；Institute
Stating has first wiring point on the connecting line between RC parallel modules and the output port, first wiring point and public
First electric capacity and a first resistor are in series between terminal；
The measuring apparatus includes：One is used for the input port matched with the output port, one with it is described defeated
The control process module of inbound port connection, a power module；
The second wiring point is additionally provided with the connecting line, between second wiring point and the public terminal according to
It is secondary to be in series with a second resistance and a variable resistances by program controlling；
The power pins of the variable resistances by program controlling are connected on power connector end of the output port, described
The controlling switch of variable resistances by program controlling is connected on a control connection terminal of the output port；
A power output terminal and control output end are provided with the input port of the measuring apparatus；
The power output terminal is connected with the power module, and the control output end is sub with the control process module
Connection.
The signal acquiring system of the present invention includes probe and measuring apparatus, is set between the second resistance of probe and common port
Variable resistances by program controlling is put, and probe and measuring apparatus are connected by connection terminal so that measuring apparatus can automatically adjust program control
It variable resistor, can be achieved to calibrate the low frequency and DC current gain of probe by adjusting variable resistances by program controlling, and then cause
The Flatness of frequency response of probe is good, and probe precision is high, and the data that described signal acquiring system collects are more accurate.
As one kind of the invention for example, in signal acquiring system of the present invention, the second wiring point position
Between the RC parallel modules and first wiring point.
As another for example, in signal acquiring system of the present invention, the maximum of the variable resistances by program controlling
Value is less than 1M ohms.
As another for example, in signal acquiring system of the present invention, first wiring point and described
A 3rd resistor is also in series with connecting line between two wiring points.
As another for example, in signal acquiring system of the present invention, the variable resistances by program controlling is numeral
Potentiometer AD5243.
As another for example, in signal acquiring system of the present invention, the measuring apparatus is digital oscillography
Device.
In order to solve the problems, such as in background technology, present invention also offers a kind of signal acquisition method, applied to the present invention
Described signal acquiring system, methods described include an initialization step and a configuration step；
The initialization step：In the control process module of the measuring apparatus it is preset it is corresponding with the probe it is program control can
Become the resistance data of resistance；
The configuration step：After the probe is connected with the measuring apparatus, the control process module is according to the resistance
Value Data configures the variable resistances by program controlling.
Method of the present invention, the resistance data of the variable resistances by program controlling in measuring apparatus in preset probe, once
Probe connects with the measuring apparatus, and before measurement circuit-under-test is started, control process module can be to program control in measuring apparatus
Variable resistor sends resistance data so that variable resistances by program controlling is configured to predetermined value, and whole process is compared to manual regulation, regulation
Finely so that the data precision that collects is high, data are accurate.
Probe, signal acquiring system and method provided by the invention, adjusted by setting variable resistances by program controlling in probe
Saving low frequency and DC current gain so that low frequency and DC current gain are equal with high-frequency gain so that the Flatness of frequency response of probe is high,
Precision of popping one's head in is high, and the data collected are accurate.
Brief description of the drawings
Fig. 1 is the circuit theory diagrams of probe 100 in background technology；
Fig. 2 is the circuit theory diagrams of probe 200 in background technology；
Fig. 3 is the circuit theory diagrams of the probe 300 of the present invention；
Fig. 4 is the Programmable and Variable potentiometer AD5243 of present invention schematic diagram；
Fig. 5 is the circuit theory diagrams of the signal acquiring system 500 of the present invention；
Fig. 6 is the signal acquisition method S600 of present invention flow chart；
Fig. 7 is the signal acquisition method S600 of the present invention another flow chart；
Fig. 8 is the signal acquisition method S600 of the present invention another flow chart.
Embodiment
In order to facilitate the understanding of the purposes, features and advantages of the present invention, it is below in conjunction with the accompanying drawings and specific real
Applying mode, the present invention is further detailed explanation.
With reference to figure 3, the present embodiment provides a kind of probe 300, and the probe 300 includes a public terminal COM, and series connection connects
302, output ports 303 of the RC parallel module connect, the RC parallel modules 302 and the output port 303 it
Between connecting line 306 on be provided with the first wiring point 304 and the second wiring point 305, first wiring point 304 and public terminal
It is in series with an electric capacity C2 and resistance R2 between COM, second wiring point 305 and the public terminal COM's is sequentially connected in series
There are resistance R3 and variable resistances by program controlling R4, the variable resistances by program controlling R4 power pins T1 to be connected to the output port 303
Power connector end 3031, the controlling switch T2 of the variable resistances by program controlling R4 is connected to the control of the output port 303
Connection terminal 3032.
In the present embodiment, the RC parallel modules 302 include the electric capacity C1 and resistance R1 being connected in parallel.The RC is in parallel
The other end connection circuit-under-test 301 of module 302.
Deformed as one kind, a probe tip can also be in series between the RC parallel modules 302 and circuit-under-test 301
Resistance.
As another deformation, the electric capacity C1 in the RC parallel modules 302 can have multiple electric capacity series connection and/or parallel connection
Form, the resistance R1 can also have multiple resistant series and/or composition in parallel, and the present invention can't be had an impact.
In the present embodiment, the connecting line 306, the first wiring point 304 and the second wiring point 305 and the first wiring point
The circuit between circuit, the second wiring point 305 and public terminal COM between 304 and public terminal COM can regard one as jointly
Individual attenuation module 307.Communicated between the RC parallel modules 302 and the attenuation module 307 by coaxial line 308.
Deformed as one kind, can also pass through normal signal between the RC parallel modules 302 and the attenuation module 307
Line communicates.
In the present embodiment, first wiring point 304 is rear, and is directly connected with the output port 303；Described
Two wiring points 305 are directly connected with by the coaxial line 308 with the RC parallel modules 302 preceding, can directly be made
On a pcb board.
Deformed as one kind, first wiring point 304 can also preceding, directly by the coaxial line 308 with it is described
RC parallel modules 302 connect；Second wiring point 305 is directly connected with the output port 303 rear, is produced on one
On individual pcb board.
As another deformation, first wiring point 304 and second boundary point 305 can also be same wiring
Point, it is produced on a pcb board.
As another deformation, when first wiring point 304 in rear, described second wiring point 305 when preceding, described two
A resistance can also be in series with connecting line 306 between individual wiring point, the resistance can compensate resistance R2 to high frequency attenuation
The influence of ratio.
As another deformation, when first wiring point 304 in rear, described second wiring point 305 when preceding, it is described same
A resistance can also be in series between axis 308 and second wiring point 305, the resistance can compensate resistance R2 to high frequency
The influence of attenuation ratio.
In the present embodiment, the output port 303 includes a BNC connector, and BNC connectors are a kind of common companies
Joint, it is widely used in various probes and various measuring apparatus, periphery is one layer of shielding metal leve, and centre is signal transmission
Line, between the two when insulating barrier, and with parameters such as fixed sizes, here is omitted.
Power connector end 3031 and a control connection terminal 3032 are additionally provided with the output port 303,
Between two terminals independently of each other, can be separately positioned on the insulating barrier of BNC connectors.
Deformed as one kind, power connector end 3031 and control connection terminal 3032 can also be by a terminal structures
Into this terminal is arranged on the insulating barrier of BNC connectors.Now the power pins T1 of the variable resistances by program controlling R4 and control are drawn
Pin T2 may be coupled in a bus, is connected to by a bus on the BNC connectors, such as can use 1-WIRE
The mode of communication realizes that here is omitted.
In the present embodiment, the electric capacity C2 and resistance R2 are sequentially connected in series in first wiring point 304 and public terminal
Between COM.
Deformed as one kind, the position being connected in series of the electric capacity C2 and resistance R2 can be exchanged, i.e., described electric capacity C2
And resistance R2 is sequentially connected in series between the public terminal COM and first wiring point 304, shadow can't be produced to the present invention
Ring.
In the present embodiment, the resistance R3 and variable resistances by program controlling R4 are sequentially connected in series in the He of the second wiring point 305
Between the public terminal COM.Such way be because：On the one hand the rated supply voltage of the variable resistances by program controlling R4 compared with
Small, typically between 1.8V-5.5V, after resistance R3 partial pressures first, the voltage added at variable resistances by program controlling R4 both ends is smaller, easily
In meet demand；On the other hand, variable resistances by program controlling R4 has the much larger parasitic capacitance of the big parasitic capacitances of ratio resistance R3, such as
Fruit is directly connected with the connecting line 306, variable resistances by program controlling R4 parasitic capacitance having a great influence to probe 300, and sets
Between the resistance R3 and public terminal COM, then influence of the parasitic capacitance to probe 300 is small.
In the present embodiment, the maximum of the variable resistances by program controlling R4 is less than 1M ohms, and this is by existing oscillograph
Together decided on etc. measuring apparatus and probe 300, by taking oscillograph as an example, the input impedance of general oscillograph is 1M ohms, probe
Input impedance is 10M ohms, in order to reach 40: 1 or higher attenuation ratio, it is necessary to which variable resistances by program controlling R4 resistance is less than 1M
Ohm.
Deformed as one kind, the maximum of the variable resistances by program controlling R4 can also be more than or equal to 1M ohms, this needs
The variable resistances by program controlling R4 has big adjustable range and small stepping, such as the resistance that maximum is 2M ohms, and its is adjustable
Scope is 0-2M ohms, shares 1000 parts of steppings, each 2 ohm of stepping, also disclosure satisfy that most of demands of probe 300.
As another deformation, the variable resistances by program controlling R4 can also have multiple variable resistances by program controlling to collectively form, he
Between or series connection or in parallel or connection in series-parallel combine, variable resistances by program controlling R4 can be collectively formed, quantity meeting but more
Bring more parasitic capacitances.Therefore, if probe 300 can endure the parasitic capacitance that this mode is brought, it is multiple it is program control can
Change resistance collectively forms also possible；Or parasitic capacitance can also be corrected by setting compensation circuit, mended by setting
Circuit is repaid to correct parasitic capacitance be prior art, is repeated no more.
In the present embodiment, the variable resistances by program controlling R4 uses the AD5243 numeral current potentials of Analog device companies
Device.With reference to reference to figure 4, AD5243 shares 4 pins, and wherein pin VDD is power pins, is directly connected to output port 303
Power connector end 3031；Pin GND is grounding pin, is directly connected to public terminal COM；Pin SDA and SCL are that control is drawn
Pin, it is directly connected to the control binding post 3032 of output port 303.
There are inside AD5243 two groups of resistance, two groups of resistance or with one of them, or series connection, or parallel connection, it is possible to achieve
Maximum resistance has four gears：2.5K ohms, 10K ohms, 50K ohms, 100K ohms, can be as needed from different
Gear.AD5243 has 256 steppings, and its rated supply voltage is 2.7V-5.5V, disclosure satisfy that the demand of probe 300.
AD5243 is communicated using serial communication mode, its internal register RDAC with the resistance for controlling resistance, user
Can be by output port 303 come read/write register RDAC, so as to change AD5243 resistance.Pin SDA is used for transmitting number
According to pin SCL is used for transmitting clock, and after writing new data to RDAC registers, AD5243 resistance will accordingly change, hereafter
It is maintained in the resistance, until writing new data to RDAC；Once AD5243 is powered off, then AD5243 may remain in the resistance
On, it can also return on a representative value set in advance.
The low frequency and DC current gain of probe 300 are calibrated by changing AD5243 resistance, more preferable frequency is obtained with this
Flatness is responded, and degree of regulation is high.
Another embodiment of the present invention provides a kind of signal acquiring system 500, with reference to reference to figure 5, the signal acquisition system
System 500 includes probe 300 and measuring apparatus 400.
The probe 300 includes a public terminal COM, 302, output ends of a RC parallel module being connected in series
Mouthfuls 303, the first wiring point is provided with the connecting line 306 between the RC parallel modules 302 and the output port 303
304 and second wiring point 305, it is in series with an electric capacity C2 and resistance between first wiring point 304 and public terminal COM
R2, second wiring point 305 and the public terminal COM's has been sequentially connected in series resistance R3 and variable resistances by program controlling R4, described
Variable resistances by program controlling R4 power pins T1 is connected to power connector end 3031 of the output port 303, it is described it is program control can
The controlling switch T2 for becoming resistance R4 is connected to the control connection terminal 3032 of the output port 303.
The measuring apparatus 400 includes an input port 401,403, power modules of a control process module
404,4011, control output end 4012 of a power output terminal, power supply output are provided with the input port 401
Terminal 4011 is connected to power module 404, and control output end 4012 is connected to control process module 403.
The input port 401 of the measuring apparatus 400 can be coupled with the output port 303 of the probe 300, after mating
It can be used for measuring circuit-under-test 301, pop one's head in and obtain measurement signal from circuit-under-test 301, and pass through output port 303 and input
Port 401 is transferred to measuring apparatus 400.
After the measuring apparatus 400 is coupled by the output port 303 of input port 401 and probe 300, measuring apparatus
400 power module 404 can be powered by power output terminal 4011 to the variable resistances by program controlling R4 of probe 300, at control
Reason module 403 can also send data to change journey by control output end 4012 to the variable resistances by program controlling R4 of probe 300
Control variable resistor R4 resistance.
Measuring apparatus 400 also includes the front-end circuit 402 being connected with input port 401, and probe 300 will obtain measurement letter
Number front-end circuit 402 is transferred to by input port 401, measurement signal is transferred to by front-end circuit 402 by output end 405 again
A/D modular converters etc., are further processed.
In the present embodiment, measuring apparatus 400 is digital oscilloscope.
Deformed as one kind, the measuring apparatus 400 can also be data collecting card, logic analyser etc..
In the present embodiment, for convenience of description, front-end circuit 402 in measuring apparatus 400 is carried out at ideal model
Reason, the front-end circuit 402 after processing include Programmable and Variable amplifier a K, a resistance R5 and an electric capacity C3.
In the present embodiment, the RC parallel modules 302 include the electric capacity C1 and resistance R1 being connected in parallel.The RC is in parallel
The other end connection circuit-under-test 301 of module 302.
Deformed as one kind, a probe tip can also be in series between the RC parallel modules 302 and circuit-under-test 301
Resistance.
As another deformation, the electric capacity C1 in the RC parallel modules 302 can have multiple electric capacity series connection and/or parallel connection
Form, the resistance R1 can also have multiple resistant series and/or composition in parallel, and the present invention can't be had an impact.
In the present embodiment, the connecting line 306, the first wiring point 304 and the second wiring point 305 and the first wiring point
The circuit between circuit, the second wiring point 305 and public terminal COM between 304 and public terminal COM can regard one as jointly
Individual attenuation module 307.Communicated between the RC parallel modules 302 and the attenuation module 307 by coaxial line 308.
Deformed as one kind, can also pass through normal signal between the RC parallel modules 302 and the attenuation module 307
Line communicates.
In the present embodiment, first wiring point 304 is rear, and is directly connected with the output port 303；Described
Two wiring points 305 are directly connected with by the coaxial line 308 with the RC parallel modules 302 preceding, can directly be made
On a pcb board.
Deformed as one kind, first wiring point 304 can also preceding, directly by the coaxial line 308 with it is described
RC parallel modules 302 connect；Second wiring point 305 is directly connected with the output port 303 rear, is produced on one
On individual pcb board.
As another deformation, first wiring point 304 and second boundary point 305 can also be same wiring
Point, it is produced on a pcb board.
As another deformation, when first wiring point 304 in rear, described second wiring point 305 when preceding, described two
A resistance can also be in series with connecting line 306 between individual wiring point, the resistance can compensate resistance R2 to high frequency attenuation
The influence of ratio.
As another deformation, when first wiring point 304 in rear, described second wiring point 305 when preceding, it is described same
A resistance can also be in series between axis 308 and second wiring point 305, the resistance can compensate resistance R2 to high frequency
The influence of attenuation ratio.
In the present embodiment, the output port 303 includes a BNC connector, is realized using BNC males；It is and described
Input port 401 also includes a BNC connector, is realized using BNC females.BNC connectors are a kind of common connectors, extensively
The general various probes and various measuring apparatus, periphery of being applied to are one layer of shielding metal leves, and centre is signal transmssion line, both it
Between when insulating barrier, and can be mutually coupled with parameter, male and females such as fixed sizes, here is omitted.
Power connector end 3031 and a control connection terminal 3032 are additionally provided with the output port 303,
Between two terminals independently of each other, can be separately positioned on the insulating barrier of BNC connectors.Set on the input port 401
There are a power output terminal 4011 and control output end 4012, be separately positioned between two terminals independently of each other
On the insulating barrier of BNC connectors.And when the output port 303 and input port 401 are coupled, the power output terminal
4011 electrically connect with power connector end 3031, control output end 4012 and the electricity of control connection terminal 3032
Connection.
Deformed as one kind, power connector end 3031 and control connection terminal 3032 can also be by a terminal structures
Into this terminal is arranged on the insulating barrier of BNC connectors.The power output terminal 4011 and control output end 4012
It can also be made up of a terminal, this terminal is arranged on the insulating barrier of BNC connectors.The now variable resistances by program controlling R4
Power pins T1 and controlling switch T2 may be coupled in a bus, is connected to by a bus on the BNC connectors,
The power module 404 and the control process module 403 are connected on the BNC connectors by a bus, such as can
Realized in a manner of being communicated using 1-WIRE.And when the output port 303 and input port 401 are coupled, the power supply
Lead-out terminal 4011 electrically connects with power connector end 3031, can be the variable resistances by program controlling R4 power supplies in probe 300,
Control output end 4012 electrically connects with the control connection terminal 3032, can be in communication with each other.
In the present embodiment, the electric capacity C2 and resistance R2 are sequentially connected in series in first wiring point 304 and public terminal
Between COM.
Deformed as one kind, the position being connected in series of the electric capacity C2 and resistance R2 can be exchanged, i.e., described electric capacity C2
And resistance R2 is sequentially connected in series between the public terminal COM and first wiring point 304, shadow can't be produced to the present invention
Ring.
In the present embodiment, the resistance R3 and variable resistances by program controlling R4 are sequentially connected in series in the He of the second wiring point 305
Between the public terminal COM.Such way be because：On the one hand the rated supply voltage of the variable resistances by program controlling R4 compared with
Small, typically between 1.8V-5.5V, after resistance R3 partial pressures first, the voltage added at variable resistances by program controlling R4 both ends is smaller, easily
In meet demand；On the other hand, variable resistances by program controlling R4 has the much larger parasitic capacitance of ratio resistance R3 parasitic capacitances, if directly
Connect and be connected with the connecting line 306, the parasitic capacitance has a great influence to probe 300, and is arranged on the resistance R3 and public
Between terminal COM, then influence of the parasitic capacitance to probe 300 is small.
In the present embodiment, the maximum of the variable resistances by program controlling R4 is less than 1M ohms, and this is by existing oscillograph
Together decided on etc. measuring apparatus and probe 300, by taking oscillograph as an example, the input impedance of general oscillograph is 1M ohms, probe
Input impedance is 10M ohms, in order to reach 40: 1 or higher attenuation ratio, it is necessary to which variable resistances by program controlling R4 resistance is less than 1M
Ohm.
Deformed as one kind, the maximum of the variable resistances by program controlling R4 can also be more than or equal to 1M ohms, this needs
The variable resistances by program controlling R4 has big adjustable range and small stepping, such as the resistance that maximum is 2M ohms, and its is adjustable
Scope is 0-2M ohms, shares 1000 parts of steppings, each 2 ohm of stepping, also disclosure satisfy that most of demands of probe 300, but
It is that variable resistances by program controlling of the prior art is typically up to less than so high parameter request.
As another deformation, the variable resistances by program controlling R4 can also have multiple variable resistances by program controlling to collectively form, he
Between or series connection or in parallel or connection in series-parallel combine, variable resistances by program controlling R4 can be collectively formed, quantity meeting but more
Bring more parasitic capacitances.Therefore, if probe 300 can endure the parasitic capacitance that this mode is brought, it is multiple it is program control can
Change resistance collectively forms also possible；Or parasitic capacitance can also be corrected by setting compensation circuit, mended by setting
Circuit is repaid to correct parasitic capacitance be prior art, is repeated no more.
In the present embodiment, the variable resistances by program controlling R4 uses the AD5243 numeral current potentials of Analog device companies
Device.With reference to reference to figure 4, AD5243 shares 4 pins, and wherein pin VDD is power pins, is directly connected to output port 303
Power connector end 3031；Pin GND is grounding pin, is directly connected to public terminal COM；Pin SDA and SCL are that control is drawn
Pin, it is directly connected to the control binding post 3032 of output port 303.
There are inside AD5243 two groups of resistance, two groups of resistance or with one of them, or series connection, or parallel connection, it is possible to achieve
Maximum resistance has four gears：2.5K ohms, 10K ohms, 50K ohms, 100K ohms, can be as needed from different
Gear.AD5243 has 256 steppings, and its rated supply voltage is 2.7V-5.5V, disclosure satisfy that the demand of probe 300.
AD5243 is communicated using serial communication mode, its internal register RDAC with the resistance for controlling resistance, user
Can be by output port 303 come read/write register RDAC, so as to change AD5243 resistance.Pin SDA is used for transmitting number
According to pin SCL is used for transmitting clock, and after writing new data to RDAC registers, AD5243 resistance will accordingly change, hereafter
It is maintained in the resistance, until writing new data to RDAC；Once AD5243 is powered off, AD5243 may remain in the resistance
On, it can also return on a representative value set in advance.
The low frequency and DC current gain of probe 300 are calibrated by changing AD5243 resistance, more preferable frequency is obtained with this
Flatness is responded, and degree of regulation is high.
, can also be micro- by monolithic as one kind for example, the control process module 403 can be made up of dsp chip
Processor is formed, can also be made up of fpga chip, etc..
The circuit theory of the present embodiment is introduced below.
The selection of coaxial line 308 damages coaxial line, damages the transmission line effect unobvious of coaxial line in itself, is not in serious
Reflex, therefore the frequency response of Mid Frequency and high band is closely similar, so merging into high band to illustrate.Due to electricity
Hold the impedance of element as frequency changes, in different frequency ranges, the component that the impedance of capacity cell accounts in attenuator circuit is different,
Thus determine that the main element of attenuation ratio is different.
It is very high in low-frequency range, the impedance of capacity cell, it is believed that open circuit, what resistance R1, R3, R4 and R5 were composed in series declines
Powered down road mainly determines low-frequency gain.
Low-frequency gain is：[(R3+R4)||R5]/{[(R3+R4)||R5]+R1}
In high band, the impedance of capacity cell is much smaller than the impedance of resistance, it is believed that resistive-open, electric capacity C1, C2,
The attenuation network of C3, cable distributed capacitance Cc composition determines high-frequency gain.
High-frequency gain is：(C3||C2||Cc)/[(C3||C2||Cc)+C1].
Because electric capacity is constant, therefore high-frequency gain is constant.In order that high-frequency gain and low-frequency gain it is equal, it is necessary to adjust
Variable resistances by program controlling R4 so that low-frequency gain is equal to high-frequency gain.
High-frequency gain and low-frequency gain are equal, i.e., Flatness of frequency response is optimal, input of the system in measuring apparatus 400
There is the time constant of matching at mouth 401.
Therefore it may only be necessary to low frequency and DC current gain are calibrated, you can so that the Flatness of frequency response of system is good, visit
The signal that first 300 measurement obtains is accurate.
Therefore, when the signal of circuit-under-test 301 is low frequency, resistance R3 and R4 series connection are then in parallel with resistance R5, then with electricity
R1 series connection is hindered, forms whole system circuit.
Resistance R5 values are 1M ohms in general measure equipment, and the all-in resistance of whole system circuit is 10M ohms, decay
Than being set to 40: 1, the voltage of circuit-under-test is 300V, and variable resistances by program controlling R4 rated supply voltage is 2.5V.
Resistance R3 and variable resistances by program controlling R4 series resistance are referred to as R34, and the resistance after resistance R34 is in parallel with resistance R5 claims
For Rs, according to attenuation ratio formula：
The value that resistance Rs can be obtained is 0.25M ohms, and R1 value is 9.75M ohms.
The value that resistance R34 can further be calculated is 333K ohms, i.e. resistance R3 and variable resistances by program controlling R4 series connection resistances
It is worth for 333K ohms.
Because attenuation ratio is 40: 1, the voltage of circuit-under-test is 300V, can obtain the current potential at the second wiring point 305 and be
7.5V, along with variable resistances by program controlling R4 rated supply voltage is 2.5V, i.e. between resistance R3 and variable resistances by program controlling R4
Current potential is up to 2.5V, can obtain variable resistances by program controlling R4 maximum can not be more than resistance R3 half, therefore it is program control can
111K ohms, otherwise variable resistances by program controlling R4 operation irregularities or damage can not be more than by becoming resistance R4 maximum.
It can further draw, resistance R3 value 283K ohms, variable resistances by program controlling R4 takes 100K ohm gears, i.e., can
Meet attenuation ratio, variable resistances by program controlling R4 voltage requirements etc. requirement, larger adjustable range can be obtained again, also cause probe and
The frequency response compensation range of whole system is larger, meets the requirements.
40: 1 attenuation ratio can be realized by the above-mentioned probe being calculated, therefore electric capacity C1 can be caused as far as possible
Small, the influence to circuit-under-test 301 is small.
Another embodiment of the present invention gives a kind of signal acquisition method for above-mentioned signal acquiring system 500
S600, measuring apparatus is by taking digital oscilloscope as an example, with reference to reference to figure 6, including initialization step S601 and configuration step S602.
Initialization step S601：It is preset corresponding with the probe 300 in the control process module 403 of the oscillograph 400
Variable resistances by program controlling R4 resistance data；
Configuration step S602：After the probe 300 is connected with the oscillograph 400, the foundation of control process module 403
The resistance data configure the variable resistances by program controlling R4.
In the present embodiment, can be achieved in that with reference to reference to figure 7, the initialization step S601：
It is first begin to step S701：Probe 300 and oscillograph 400 are connected, if oscillograph 400 has multiple passages
(such as dual channel oscilloscope has 2 passages, and 4 oscilloscope channels have 4 passages), it can connect one by one therein each logical
Road, can also be only to one of channel presetting, and turns on the power, into normal measurement mode.
Subsequently into step S702：The probe tip of probe 300 connects a frequency reference source, for example with oscillograph 400
The low-frequency square-wave signal carried, low-frequency square-wave signal caused by external signal generator can also be used, square wave can also be used
Square-wave signal caused by circuit, the square-wave signal are the square-wave signals for not overshooting He rushing in advance.
Subsequently into step S703：Whether completely the control process module 403 of oscillograph 400 judges the square-wave signal collected
Sufficient preset error requirement, such as set overcompensation or undercompensation to be less than the 1% of square wave amplitude and required for satisfaction.If it is satisfied, note
Now variable resistances by program controlling R4 resistance value is recorded to control process module 403, into step S705；If be unsatisfactory for, enter
Step S704.
Step S704：If the square-wave signal that oscillograph 400 collects is overcompensation, control process module 403 increases
Variable resistances by program controlling R4 resistance, the square-wave signal that now oscillograph 400 is shown can change therewith, until oscillograph 400 gathers
To square-wave signal meet preset error requirement, record now variable resistances by program controlling R4 resistance value is to control process module 403；
If the square-wave signal that oscillograph 400 collects is undercompensation, control process module 403 reduces variable resistances by program controlling R4 resistance
Value, the square-wave signal that now oscillograph 400 is shown can change therewith, until the square-wave signal that oscillograph 400 collects meets in advance
Put error requirements, record now variable resistances by program controlling R4 resistance value is to control process module 403.
Step S705：Repeat the above steps, probe 300 corresponding to next passage is carried out preset.
Step S706：Initialization step terminates.
The above-mentioned steps of the present embodiment can voluntarily be completed as needed by the user of oscillograph 400 and probe 300；Also may be used
To be previously-completed above-mentioned steps, by variable resistances by program controlling R4 resistance data initialization in control process module 403, user can not
Change.
It should be noted that due to combining the pre- of the different variable resistor R4 of needs between different probes and different probes
Parameter is put, therefore in above-mentioned steps, it is necessary to recording channel number and probe simultaneously during record variable resistances by program controlling R4 resistance
Number, recorded correspondingly, this is prior art, and does not influence the present invention, is repeated no more.
In the present embodiment, with reference to can be such with reference to figure 8, the configuration step S602：
It is first begin to step S801：Probe 300 and oscillograph 400 are connected, multiple probes and passage can be connected simultaneously,
A passage can also be only connected, is turned on the power, into normal measurement mode.
Subsequently into step S802：The identification probe number of oscillograph 400 and channel number.
Subsequently into step S803：Control process module 403 reads preset program control according to the probe number and channel number
Variable resistor R4 resistance data, and variable resistances by program controlling R4 is sent to, into step S804；If search less than preset number
According to then oscillograph 400 is prompted not calibrated, into step S805.
Step S804：Variable resistances by program controlling R4 changes resistance value to corresponding gear according to the data received.
Step S805：Configuration terminates.
It should be noted that in step S803, if searched less than preset data, oscillograph 400 prompt it is not calibrated, can be with
It is display display reminding or alarm or the combination of the two etc., has no effect on the present invention.
Explanation is needed further exist for, the configuration step S602 can be after the start of oscillograph 400, before normal measurement
It is automatic to carry out, can normal measurement data after the completion of configuration；It can also be that config option is set, choose whether to configure by user,
If user's option and installment, configuration step S602 is entered according to user's selection instruction.
Explanation is needed further exist for, the variable resistances by program controlling R4 there can be a representative value, in Programmable and Variable electricity
After resistance R4 does not receive configuration data or the power-off of probe 300, variable resistances by program controlling R4 keeps the representative value.The representative value can be with
Set or be set by the user in advance when variable resistances by program controlling R4 dispatches from the factory, the present invention can't be influenceed.
Being deformed as one kind, the variable resistances by program controlling can not also keep a representative value after the power-off of probe 300, and
Resistance before remaining powered off, this is to be set to together decide on by variable resistances by program controlling R4 characteristics in itself and user, can't shadow
Ring the present invention.
After the completion of step S805, user's can measures application using oscillograph 400 and probe 300.
Continuing with reference to figure 5, probe 300 is connected to circuit-under-test 301 by probe tip, the letter in circuit-under-test 301
Number RC parallel modules 302 are coupled to, attenuation module is sent to by coaxial line 308 after the partial pressure of RC parallel modules 302
307, arrived most preferably because the resistance of the variable resistances by program controlling R4 in attenuation module 307 is adjusted, therefore signal is attenuated module
The BNC connectors of probe 300 are delivered to after 307 decay, then the coupling of the BNC connectors by oscillograph 400, signal are just sent to
Inside oscillograph 400, handled by amplification of front-end circuit 402 in oscillograph 400 etc., make signal be changed into meeting A/D conversions
The signal of device requirement, A/D converter is further transferred to by output end 405, and A/D converter samples to the signal, is turned
Data signal is changed to, digital processing unit is given and carries out follow-up processing, complete whole signal acquisition process.
From the foregoing it can be seen that embodiments of the invention are solved present in background technology, probe can not be fine
Regulation, frequency response can not automatically adjust, frequency response easily by such environmental effects the problem of, there is provided one kind using it is program control can
Become that resistance realizes pop one's head in, a kind of signal pickup assembly realized using variable resistances by program controlling, and a kind of adopted corresponding to signal
The signal acquisition method of acquisition means, the probe can automatic, program control regulation variable resistances by program controlling, without adjust electric capacity,
The regulation to probe and signal acquiring system frequency response can be achieved, Flatness of frequency response is good, and probe precision is high, and then makes
Data precision height, the degree of accuracy height that signal acquiring system collects are obtained, and due to increasing probe attenuation ratio, reduces probe
Input capacitance so that probe and influence of the whole signal acquiring system to circuit-under-test also further reduce, and measurement effect is good.
Above-described is only the specific embodiment of the present invention, should be understood that the explanation of above example is simply used
In help understand the present invention method and its core concept, the protection domain being not intended to limit the present invention, it is all the present invention
Any modification for being made within thought and principle, equivalent substitution etc., should be included in the scope of the protection.
Claims (12)
1. a kind of probe with attenuation function, including a public terminal and be connected in series a RC parallel module, one
Output port；
There are first wiring point, first wiring on connecting line between the RC parallel modules and the output port
First electric capacity and a first resistor are in series between point and public terminal；
It is characterized in that：
The second wiring point is additionally provided with the connecting line,
A second resistance and a Programmable and Variable electricity have been sequentially connected in series between second wiring point and the public terminal
Resistance；
The power pins of the variable resistances by program controlling are connected on power connector end of the output port, described program control
The controlling switch of variable resistor is connected on a control connection terminal of the output port.
2. the probe according to claim 1 with attenuation function, it is characterised in that：
Second wiring point is between the RC parallel modules and first wiring point.
3. the probe according to claim 2 with attenuation function, it is characterised in that：
The maximum of the variable resistances by program controlling is less than 1M ohms.
4. the probe according to claim 3 with attenuation function, it is characterised in that：
A 3rd resistor is also in series with connecting line between first wiring point and second wiring point.
5. the probe according to claim 4 with attenuation function, it is characterised in that：
The variable resistances by program controlling is digital regulation resistance AD5243.
6. a kind of signal acquiring system, including a probe and a measuring apparatus with attenuation function,
The probe includes：One public terminal and a RC parallel module, the output port being connected in series；In the RC
There are first wiring point, first wiring point and public terminal on connecting line between parallel module and the output port
Between be in series with first electric capacity and a first resistor；
The measuring apparatus includes：One is used for the input port matched with the output port, one and the input
The control process module of mouth connection, a power module；
It is characterized in that：
The second wiring point is additionally provided with the connecting line, is gone here and there successively between second wiring point and the public terminal
It is associated with a second resistance and a variable resistances by program controlling；
The power pins of the variable resistances by program controlling are connected on power connector end of the output port, described program control
The controlling switch of variable resistor is connected on a control connection terminal of the output port；
A power output terminal and control output end are provided with the input port of the measuring apparatus；
The power output terminal is connected with the power module, and the control output end is sub to be connected with the control process module
Connect.
7. signal acquiring system according to claim 6, it is characterised in that：
Second wiring point is between the RC parallel modules and first wiring point.
8. signal acquiring system according to claim 7, it is characterised in that：
The maximum of the variable resistances by program controlling is less than 1M ohms.
9. signal acquiring system according to claim 8, it is characterised in that：
A 3rd resistor is also in series with connecting line between first wiring point and second wiring point.
10. signal acquiring system according to claim 9, it is characterised in that：
The variable resistances by program controlling is digital regulation resistance AD5243.
11. signal acquiring system according to claim 6, it is characterised in that：
The measuring apparatus is digital oscilloscope.
A kind of 12. signal acquisition method, applied to any one signal acquiring system of claim 6-11, it is characterised in that：Bag
An initialization step and a configuration step are included,
The initialization step：The preset Programmable and Variable electricity corresponding with the probe in the control process module of the measuring apparatus
The resistance data of resistance；
The configuration step：After the probe is connected with the measuring apparatus, the control process module is according to the resistance number
According to configuring the variable resistances by program controlling.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113203472A (en) * | 2021-05-13 | 2021-08-03 | 深圳市鼎阳科技股份有限公司 | Microphone probe sensitivity compensation method and system for oscilloscope |
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| CN104267228B (en) * | 2014-09-30 | 2017-02-01 | 中国电子科技集团公司第四十一研究所 | Circuit allowing trigger sensitivity of digital oscilloscope to be continuously adjustable |
| CN106908641B (en) * | 2015-12-23 | 2020-06-12 | 普源精电科技股份有限公司 | Signal measurement device and method |
| CN106932627A (en) * | 2015-12-29 | 2017-07-07 | 苏州普源精电科技有限公司 | A kind of probe circuit |
| CN107782942B (en) * | 2016-08-31 | 2021-03-02 | 北京普源精电科技有限公司 | Oscilloscope measuring circuit, active front end thereof, testing system and measuring method |
| US11079407B2 (en) * | 2017-07-10 | 2021-08-03 | Tektronix, Inc. | Probe attenuator for reduced input capacitance |
| CN108169531B (en) * | 2017-12-28 | 2023-09-26 | 广东机电职业技术学院 | Novel attenuation network circuit |
| TWI750683B (en) * | 2020-06-02 | 2021-12-21 | 緯穎科技服務股份有限公司 | Signal testing device and signal testing method |
| US11638345B2 (en) * | 2021-04-05 | 2023-04-25 | Fluke Corporation | Feed forward compensation of parasitic capacitance in a device frontend |
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