CN207992321U - Four probe resistance instrument of resistivity under a kind of detectable different temperatures - Google Patents
Four probe resistance instrument of resistivity under a kind of detectable different temperatures Download PDFInfo
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- CN207992321U CN207992321U CN201820408954.XU CN201820408954U CN207992321U CN 207992321 U CN207992321 U CN 207992321U CN 201820408954 U CN201820408954 U CN 201820408954U CN 207992321 U CN207992321 U CN 207992321U
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- temperature
- control box
- probe
- temperature control
- sample
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Abstract
Four probe resistance instrument of resistivity under a kind of detectable different temperatures include mainly connecting rod, sample stage, probe, adjusting knob I, adjusting knob II, feeler arm, temperature control box, conducting wire, temperature display, power supply, pedestal, movable bolt, thermocouple, four probe apertures, temperature inductor, sample；Pass through the combination of temperature control box and thermocouple so that detected sample may be at different temperature carrying out the measurement of resistivity.When solving practical application, the resistivity and actual conditions of semiconductive thin film are there are certain deviation caused by the difference of film temperature, the problem of can not detecting the resistivity under different temperatures so that experimental result can preferably be applied in real life.
Description
Technical field
The utility model is related to measure the experimental facilities of different temperatures lower semiconductor film resiativity, relating generally to one kind can
Detect four probe resistance instrument of resistivity under different temperatures.
Background technology
The operation principle of four probe resistance instrument is to contact semiconductor film film surface with four equidistant metal probes, outside
Two enable probe lead to DC current I, and the voltage drop V between intermediate two probes is measured by potential difference meter, by measured electric current I and
Voltage V can directly be converted into sheet resistance using the appropriate correction factor about sample and probe geometry.Semiconductor
Film is typically employed in photovoltaic technology, electrolysis water, electrochemistry photograph, electronics and microelectronics industry, wherein being mainly used in too
The absorbed layer of positive energy battery, for absorbing sunlight to form electric current in inside.But four traditional probe resistance instrument can only be examined
The resistivity of semiconductive thin film when surveying room temperature, when practical application, since the irradiation of the sunlight of different periods can make film
Temperature is different, and there are certain deviations for the resistivity and actual conditions of the semiconductive thin film measured in this way, can not detect difference
At a temperature of resistivity, to causing limitation in practical application.
Invention content
Four probe resistance instrument of resistivity under a kind of detectable different temperatures, include mainly connecting rod, sample stage, and probe is adjusted
Knob I is saved, adjusting knob II, feeler arm, temperature control box, conducting wire, temperature display, power supply, pedestal, movable bolt, thermocouple, four visit
Pin hole, temperature inductor, sample；It is primarily characterized in that：Connecting rod is fixedly connected with pedestal；Sample stage and pedestal are solid by connecting rod
Fixed connection；Temperature control box is mounted on the center of sample stage by movable bolt, and temperature control box is made of thermal insulation material；It is left inside temperature control box
Right both sides are provided with thermocouple；Thermocouple is connected with power supply by conducting wire；Temperature control box inner upper is equipped with temperature inductor；
Temperature inductor is connected with temperature display by conducting wire；Temperature display is connected with power supply by conducting wire；Sample is placed
In temperature control box；There are four four probe apertures for setting above temperature control box, corresponding with four probe locations of top respectively；Probe is pacified
On feeler arm；Adjusting knob I and adjusting knob II are provided on feeler arm.
When work, temperature control box is opened by movable bolt, sample is placed in temperature control box, required position is adjusted, is covered
Upper temperature control box prepares experiment.Four probe resistance instrument switch is opened, is moved downward to by adjusting the control feeler arm of adjusting knob II
Feeler arm is close to four probe apertures, then adjusting adjusting knob I makes probe enter in temperature control box from four probe apertures, until contact sample is simultaneously
Apply certain pressure to sample.Open power supply, thermocouple start to work, to being heated in temperature control box, temperature inductor with
When monitoring temperature control box in temperature and be shown on temperature display, when the temperature that temperature display is shown reaches the test of needs
When temperature, power supply is closed, starts to carry out resistivity measurement to the semiconductive thin film under specific temperature.Four probe resistance instrument are opened to open
Put capable test into.
Four probe resistance instrument of resistivity under a kind of detectable different temperatures pass through temperature control box and thermoelectricity in the utility model
Even combination so that detected sample may be at different temperature carrying out the measurement of resistivity.Solves practical application
When, there are certain deviations for the resistivity and actual conditions of semiconductive thin film caused by the difference of film temperature, can not detect difference
At a temperature of resistivity the problem of so that experimental result can preferably be applied to real life in.
Description of the drawings：
Fig. 1 is a kind of front view of four probe resistance instrument of resistivity under detectable different temperatures；
Fig. 2 is a kind of partial view of four probe resistance instrument of resistivity under detectable different temperatures.
1 is connecting rod in figure, and 2 be sample stage, and 3 be probe, and 4 be adjusting knob I, and 5 be adjusting knob II, and 6 be feeler arm, 7
It is temperature control box, 8 be conducting wire, and 9 be temperature display, and 10 be power supply, and 11 be pedestal, and 12 be movable bolt, and 13 be thermocouple, and 14 be four
Probe aperture, 15 be temperature inductor, and 16 be sample.
Specific implementation mode：
Four probe resistance instrument of resistivity under a kind of detectable different temperatures, include mainly connecting rod, sample stage, and probe is adjusted
Knob I is saved, adjusting knob II, feeler arm, temperature control box, conducting wire, temperature display, power supply, pedestal, movable bolt, thermocouple, four visit
Pin hole, temperature inductor, sample；It is primarily characterized in that：Connecting rod is fixedly connected with pedestal；Sample stage and pedestal are solid by connecting rod
Fixed connection；Temperature control box is mounted on the center of sample stage by movable bolt, and temperature control box is made of thermal insulation material；It is left inside temperature control box
Right both sides are provided with thermocouple；Thermocouple is connected with power supply by conducting wire；Temperature control box inner upper is equipped with temperature inductor；
Temperature inductor is connected with temperature display by conducting wire；Temperature display is connected with power supply by conducting wire；Sample is placed
In temperature control box；There are four four probe apertures for setting above temperature control box, corresponding with four probe locations of top respectively；Probe is pacified
On feeler arm；Adjusting knob I and adjusting knob II are provided on feeler arm.
When work, temperature control box is opened by movable bolt, sample is placed in temperature control box, required position is adjusted, is covered
Upper temperature control box prepares experiment.Four probe resistance instrument switch is opened, is moved downward to by adjusting the control feeler arm of adjusting knob II
Feeler arm is close to four probe apertures, then adjusting adjusting knob I makes probe enter in temperature control box from four probe apertures, until contact sample is simultaneously
Apply certain pressure to sample.Open power supply, thermocouple start to work, to being heated in temperature control box, temperature inductor with
When monitoring temperature control box in temperature and be shown on temperature display, when the temperature that temperature display is shown reaches the test of needs
When temperature, power supply is closed, starts to carry out resistivity measurement to the semiconductive thin film under specific temperature.Four probe resistance instrument are opened to open
Put capable test into.
Claims (1)
1. four probe resistance instrument of resistivity under a kind of detectable different temperatures include mainly connecting rod, sample stage, probe, adjusting
Knob I, adjusting knob II, feeler arm, temperature control box, conducting wire, temperature display, power supply, pedestal, movable bolt, thermocouple, four probes
Hole, temperature inductor, sample；It is primarily characterized in that：Connecting rod is fixedly connected with pedestal；Sample stage and pedestal are fixed by connecting rod
Connection；Temperature control box is mounted on the center of sample stage by movable bolt, and temperature control box is made of thermal insulation material；Left and right inside temperature control box
Both sides are provided with thermocouple；Thermocouple is connected with power supply by conducting wire；Temperature control box inner upper is equipped with temperature inductor；Temperature
Degree inductor is connected with temperature display by conducting wire；Temperature display is connected with power supply by conducting wire；Sample is placed on
In temperature control box；There are four four probe apertures for setting above temperature control box, corresponding with four probe locations of top respectively；Probe is installed
On feeler arm；Adjusting knob I and adjusting knob II are provided on feeler arm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820408954.XU CN207992321U (en) | 2018-03-26 | 2018-03-26 | Four probe resistance instrument of resistivity under a kind of detectable different temperatures |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820408954.XU CN207992321U (en) | 2018-03-26 | 2018-03-26 | Four probe resistance instrument of resistivity under a kind of detectable different temperatures |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207992321U true CN207992321U (en) | 2018-10-19 |
Family
ID=63829133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820408954.XU Expired - Fee Related CN207992321U (en) | 2018-03-26 | 2018-03-26 | Four probe resistance instrument of resistivity under a kind of detectable different temperatures |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207992321U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110672926A (en) * | 2019-10-24 | 2020-01-10 | 河北工业大学 | Electrical material conductivity measuring device and measuring system suitable for different working conditions |
-
2018
- 2018-03-26 CN CN201820408954.XU patent/CN207992321U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110672926A (en) * | 2019-10-24 | 2020-01-10 | 河北工业大学 | Electrical material conductivity measuring device and measuring system suitable for different working conditions |
| CN110672926B (en) * | 2019-10-24 | 2021-08-10 | 河北工业大学 | Electrical material conductivity measuring device and measuring system suitable for different working conditions |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20181019 Termination date: 20190326 |
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| CF01 | Termination of patent right due to non-payment of annual fee |