CN207650244U - A kind of test probe and test equipment - Google Patents

A kind of test probe and test equipment Download PDF

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Publication number
CN207650244U
CN207650244U CN201820003558.9U CN201820003558U CN207650244U CN 207650244 U CN207650244 U CN 207650244U CN 201820003558 U CN201820003558 U CN 201820003558U CN 207650244 U CN207650244 U CN 207650244U
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CN
China
Prior art keywords
test
probe
insulating element
face
test probe
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Active
Application number
CN201820003558.9U
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Chinese (zh)
Inventor
常小幻
叶帅
兰传艳
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BOE Technology Group Co Ltd
Chengdu BOE Optoelectronics Technology Co Ltd
Original Assignee
BOE Technology Group Co Ltd
Chengdu BOE Optoelectronics Technology Co Ltd
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Priority to CN201820003558.9U priority Critical patent/CN207650244U/en
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Publication of CN207650244U publication Critical patent/CN207650244U/en
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Abstract

The utility model provides a kind of test probe and test equipment, the test probe include:Probe body, the probe body includes the first end and second end being oppositely arranged, the first end end face of the probe body is equipped at least one groove for housing the element under test, at least two conductive parts of mutually insulated are equipped in the groove, at least two conductive part is used for test points different with the element under test and contacts;And at least two leads of the mutually insulated in the probe body are set to, one end of each lead is correspondingly connected with a conductive part, and the other end is drawn from the probe body.Test probe and test equipment provided by the utility model can solve the problem of to be not easy alignment test point when probe test undersized due to element under test in the prior art, convenient for testing small size element under test.

Description

A kind of test probe and test equipment
Technical field
The utility model is related to technical field of measurement and test more particularly to a kind of test probes and test equipment.
Background technology
In the prior art, generally use tests probe to test electric elements.In test small size capacitance electricity When the voltage and current of resistance element, since component size is too small, existing test probe is not easy to prick in the test point of element, behaviour It makes comparisons difficulty;And it due to the surface exposure for testing probe, is easy to encounter other element and cause short circuit, to influence to test As a result.
Utility model content
The purpose of this utility model is to provide a kind of test probe and test equipment, can solve in the prior art due to The problem of element under test is undersized, and when probe test is not easy alignment test point, convenient for being surveyed to small size element under test Examination.
Technical solution provided by the utility model is as follows:
A kind of test probe, for testing element under test;The test probe includes:
Probe body, the probe body include opposite first end and second end, the first end end of the probe body Face is equipped at least one groove for housing the element under test, and being equipped at least two of mutually insulated in the groove leads Electric portion, at least two conductive part are used for test points different with the element under test and contact;
And it is set at least two leads of the mutually insulated in the probe body, one end of each lead It is correspondingly connected with a conductive part, the other end is drawn from the probe body.
Further, each conductive part is at least partially disposed at the slot bottom of the groove, is at least partially disposed at described recessed On the side wall of slot.
Further, the test probe further includes an insulation crust covered at outside the probe body.
Further, the probe body includes at least:Insulating element;And it is arranged opposite the two of the insulating element Two sheet metals of side;
Wherein, the first end of described two sheet metals exceed the insulating element first end except, with it is described absolutely The first end end face of edge part cooperatively forms the groove, and the first end of described two sheet metals is beyond except the insulating element Part be respectively formed two conductive parts.
Further, have to the second concave end of the sheet metal on the first end end face of the sheet metal and be formed by platform Stage structure, and the step structure is located at the sheet metal in the side opposite with another sheet metal, the step structure Include the First terrace towards another sheet metal and the second step face parallel with the first end end face of the sheet metal, The First terrace and the second step face form the conductive part.
Further, the first end end face of the First terrace and the insulating element.
Further, the lead is set to inside the insulating element, and is drawn from the insulating element.
Further, the second end of the insulating element at least partly exceeds the second end of described two sheet metals, described Lead is stretched out from the second end of the insulating element.
Further, the lead is also associated with for being set with test equipment from one end that the probe body is drawn The plug structure that standby ontology is attached.
A kind of test equipment, including apparatus body and test probe as described above, wherein the lead of the test probe It is electrically connected with the apparatus body.
It is had the beneficial effect that caused by the utility model:
Test probe and test equipment provided by the utility model, by the way that a probe body is arranged, by the probe body One end end face on groove is set, when testing element under test, groove is directed at element under test, covers on element under test On, at least two conductive parts on groove inner wall i.e. can test points contact connectios different from element under test, and by drawing Line is electrically connected with external test facility, and to realize the test to element under test, probe is tested with using in the prior art Bundle is compared in the test point of element under test, and groove alignment element under test is easier to operate to, and is solved test probe and is not easy The problem of being directed at the test point of element under test.
Description of the drawings
Fig. 1 shows the structural schematic diagrams of the test probe provided in the utility model embodiment;
Fig. 2 indicates structural representation of the test probe provided in the utility model embodiment when testing element under test Figure.
Specific implementation mode
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model It clearly and completely describes, it is clear that described embodiment is the utility model a part of the embodiment, rather than whole implementation Example.Based on the embodiments of the present invention, those of ordinary skill in the art are obtained without creative efforts The every other embodiment obtained, shall fall within the protection scope of the present invention.
For the problem of test probe is not easy to be directed at the test point of element under test in the prior art, the utility model provides A kind of test probe and test equipment, can solve the above problems, convenient for testing element under test.
As depicted in figs. 1 and 2, the test probe that the utility model embodiment is provided, for being surveyed to element under test Examination;The test probe includes:
Probe body 100, the probe body 100 include the first end and second end being oppositely arranged, the probe body 100 first end end face is equipped at least one groove 110 for housing the element under test 10, is set in the groove 110 There are at least two conductive parts 120 of mutually insulated, at least two conductive part 120 is for the difference with the element under test 10 Point 11 is tested to contact;
And it is set at least two leads 200 of the mutually insulated in the probe body 100, each lead 200 one end is correspondingly connected with a conductive part 120, and the other end is drawn from the probe body 100.
Test probe and test equipment provided by the utility model are led the probe by the way that a probe body 100 is arranged Groove 110 is set on one end end face of body 100, when testing element under test 10, by the groove in probe body 100 110 alignment element under tests 10, and cover on element under test 10, at least two conductive parts 120 on 110 inner wall of groove i.e. can with wait for The different test points 11 surveyed on element 10 connect, and are electrically connected with external test facility by lead 200, to Realize the test to element under test 10, compared with being pricked in the test point of element under test using test probe in the prior art, The alignment element under test 10 of groove 110 is easier to operate to, test probe is solved and is not easy to be directed at the test point of element under test Problem.
It should be noted that the test probe provided in said program can be applied to the electrical measurement of various element under tests 10 Examination, can be according to the size of element under test 10 and model etc., the conduction on 110 inner wall of size and groove to design groove 110 The distributing position in portion 120.Especially, the element under test 10 that can be directed to small size is tested, for example, can be used for testing 0201 patch capacitor resistance, 0402 patch capacitor resistance, 0603 patch capacitor resistance or larger size patch capacitor resistance etc. Element.
In preferred embodiment provided by the utility model, as depicted in figs. 1 and 2, each conductive part 120 is at least Part is located at the slot bottom of the groove 110, is at least partially disposed on the side wall of the groove 110.
Using the above scheme, each 120 at least part of the conductive part is arranged the slot bottom in groove 110, at least one Set up the side wall set in groove 110 separately, in this way, can be more convenient for contacting with the conductive structure on element under test 10, that is, with member to be measured Test point contact on part 10.Of course, it should be understood that the conductive part 120 can also be only arranged at the groove 110 Slot bottom or be provided only on the side wall of the groove 110.
In addition, in preferred embodiment provided by the utility model, as depicted in figs. 1 and 2, the test probe is also wrapped Include an insulation crust 300 covered at outside the probe body 100.
Using the above scheme, by the way that an insulation crust 300 will be provide with outside probe body 100, it can make the probe body 100 cause short circuit when will not be contacted with other elements.As depicted in figs. 1 and 2, the lead 200 draws the insulation crust 300 Outside, to be attached with external test facility.
In addition, in preferred embodiment provided by the utility model, as depicted in figs. 1 and 2, the probe body 100 It includes at least:Insulating element 101;And two sheet metals 102 in the opposite sides of the insulating element 101 are set;
Wherein, the first end of described two sheet metals 102 exceed the insulating element 101 first end except, with The first end end face of the insulating element 101 cooperatively forms the groove 110, and the first end of described two sheet metals 102 exceeds Part except the insulating element 101 is respectively formed two conductive parts 120.
Using the above scheme, the probe body 100 is formed using two sheet metals 102 and an insulating element 101, is led to Two sheet metals 102 are arranged in the opposite sides crossed in insulating element 101, using two sheet metals 102 as two conductive parts 120, different from element under test 10 test point (e.g., with the positive and negative anodes of element under test 10) is connect, this simple in structure, It is easy to assembly.
It should be noted that in practical applications, for special element under test 10 in the probe body 100, when its survey Pilot position has at least three, that is to say, that when needing at least three conductive parts 120, the quantity of the sheet metal 102 can be It is identical as test point bit quantity, and it is distributed in the peripheral side of insulating element 101, setting is spaced between adjacent metal piece 102, so that Adjacent metal piece 102 is obtained to insulate.
It should also be noted that, in practical applications, the conductive part 120 can also be to be realized using other structures , for example, it may be the probe body 100 includes an insulating body, formed on the first end end face of the insulating body recessed Slot 110, the metal piece 102 on 110 inner wall of groove, to form the conductive part 120.
In addition, in preferred embodiment provided by the utility model, as depicted in figs. 1 and 2, the sheet metal 102 Have to the second concave end of the sheet metal 102 on first end end face and be formed by step structure, and the step structure is located at For the sheet metal 102 in the side opposite with another sheet metal 102, the step structure includes towards another metal The First terrace of piece 102 and the second step face parallel with the first end end face of the sheet metal 102, the First terrace The conductive part 120 is formed with the second step face.
Using the above scheme, using step structure is formed on the first end end face of the sheet metal 102, to make described lead 120 part of electric portion is located at the slot bottom of the groove 110, and another part is located on the side wall of the groove 110, simple in structure, It is easy to make.
In addition, in preferred embodiment provided by the utility model, as depicted in figs. 1 and 2, the First terrace with The first end end face of the insulating element 101.Using the above scheme, as depicted in figs. 1 and 2, the First terrace with The first end end face of the insulating element 101 can be conducive to through the first end end face of the insulating element 101 into one Step ensures the insulation effect between two conductive parts 120.
In addition, in preferred embodiment provided by the utility model, as depicted in figs. 1 and 2, the lead 200 is arranged It is drawn inside the insulating element 101, and from the insulating element 101.
Using the above scheme, the lead 200 is set up directly in insulating element 101, and in the insulating element 101 with lead Electric portion 120 is correspondingly connected with, and from the insulating element 101 draw, the insulating element 101 play to the lead 200 insulation, The effect of protection.Of course, it should be understood that the installation position for the lead 200 and the connection structure with conductive part 120 It is not limited thereto.
In addition, in preferred embodiment provided by the utility model, as depicted in figs. 1 and 2, the insulating element 101 Second end at least partly exceed the second ends of described two sheet metals 102, the lead 200 is from the insulating element 101 Second end is stretched out.
Using the above scheme, as depicted in figs. 1 and 2, the second end of the insulating element 101 at least partly exceeds described two The second end of a sheet metal 102, and stretched out from the insulation crust 300, as depicted in figs. 1 and 2, the insulation crust 300 On can be in the positive and negative electrode of 200 position mark lead 200 of corresponding lead, the lead 200 is arranged in insulating element 101, absolutely Edge part 101 plays the role of that lead 200 is insulated and protected.In practical applications, the setting of the insulating element 101 Mode is without being limited thereto.
In addition, in preferred embodiment provided by the utility model, as depicted in figs. 1 and 2, the lead 200 from One end that the probe body 100 is drawn is also associated with the plug structure being attached for the apparatus body with test equipment 400.Using the above scheme, convenient for being electrically connected with test equipment, which can be the plug structure 400 Conducting wire or crocodile head clip, it is convenient to be connected with test equipments such as multimeter or oscillographs.
A kind of test equipment, including apparatus body and the utility model embodiment are additionally provided in the utility model embodiment The test probe provided, wherein the lead 200 of the test probe is electrically connected with the apparatus body.The apparatus body can be with It is multimeter or oscillograph etc..
Above description is only a specific implementation of the present invention, but the scope of protection of the utility model is not limited to In this, any one skilled in the art within the technical scope disclosed by the utility model, can readily occur in variation Or replace, it should be covered within the scope of the utility model.Therefore, the scope of protection of the utility model should be wanted with right Subject to the protection domain asked.

Claims (10)

1. a kind of test probe, for testing element under test;It is characterized in that, the test probe includes:
Probe body, the probe body include the first end and second end being oppositely arranged, the first end end of the probe body Face is equipped at least one groove for housing the element under test, and the groove inner wall is equipped at least two of mutually insulated Conductive part, at least two conductive part are used for test points different with the element under test and contact;
And at least two leads of the mutually insulated in the probe body are set to, one end of each lead corresponds to A conductive part is connected, the other end is drawn from the probe body.
2. test probe according to claim 1, which is characterized in that each conductive part is at least partially disposed at described recessed The slot bottom of slot is at least partially disposed on the side wall of the groove.
3. test probe according to claim 1, which is characterized in that the test probe further includes one covering at the spy Insulation crust outside head main body.
4. test probe according to claim 1, which is characterized in that the probe body includes at least:Insulating element; And two sheet metals in the opposite sides of the insulating element are set;
Wherein, the first end of described two sheet metals exceed the insulating element first end except, with the insulation division The first end end face of part cooperatively forms the groove, and the first end of described two sheet metals is beyond the portion except the insulating element It is respectively formed two conductive parts.
5. test probe according to claim 4, which is characterized in that have to this on the first end end face of the sheet metal Second concave end of sheet metal is formed by step structure, and the step structure be located at the sheet metal with another gold Belong to the opposite side of piece, the step structure include First terrace towards another sheet metal and with the sheet metal The parallel second step face in first end end face, the First terrace and the second step face form the conductive part.
6. test probe according to claim 5, which is characterized in that the of the First terrace and the insulating element One end end face.
7. test probe according to claim 4, which is characterized in that the lead is set to inside the insulating element, And it is drawn from the insulating element.
8. test probe according to claim 7, which is characterized in that the second end of the insulating element at least partly exceeds The second end of described two sheet metals, the lead are stretched out from the second end of the insulating element.
9. test probe according to claim 1, which is characterized in that one drawn from the probe body of the lead End is also associated with the plug structure being attached for the apparatus body with test equipment.
10. a kind of test equipment, which is characterized in that visited including apparatus body and test as described in any one of claim 1 to 9 Head, wherein the lead of the test probe is electrically connected with the apparatus body.
CN201820003558.9U 2018-01-02 2018-01-02 A kind of test probe and test equipment Active CN207650244U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201820003558.9U CN207650244U (en) 2018-01-02 2018-01-02 A kind of test probe and test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201820003558.9U CN207650244U (en) 2018-01-02 2018-01-02 A kind of test probe and test equipment

Publications (1)

Publication Number Publication Date
CN207650244U true CN207650244U (en) 2018-07-24

Family

ID=62877378

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201820003558.9U Active CN207650244U (en) 2018-01-02 2018-01-02 A kind of test probe and test equipment

Country Status (1)

Country Link
CN (1) CN207650244U (en)

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