CN207541155U - General-purpose type automatic impedance test device - Google Patents
General-purpose type automatic impedance test device Download PDFInfo
- Publication number
- CN207541155U CN207541155U CN201721472015.3U CN201721472015U CN207541155U CN 207541155 U CN207541155 U CN 207541155U CN 201721472015 U CN201721472015 U CN 201721472015U CN 207541155 U CN207541155 U CN 207541155U
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- Prior art keywords
- hole
- probe
- bolt
- microscope carrier
- diameter
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Abstract
The utility model discloses a kind of general-purpose type automatic impedance test device, it includes pedestal, stent, testing jig, test microscope carrier, cylinder and probe, the stent, which is set on base upper surface and stent, is provided with several impedance instrument, several probe bases are flexibly connected by sliding block with sliding rail respectively, the cylinder is installed on testing jig upper surface and the piston rod of cylinder is fixedly connected with a movable plate, this stud bolt hole is penetrated through with blind hole, the probe is embedded in the stud in the blind hole of probe base lower surface and passed through in an insertion stud bolt hole and is fixedly connected with probe base from bottom to top, the test microscope carrier offers several threaded holes, the diameter of the nut is more than the diameter of the first through hole of T-shaped hole, the diameter of the screw rod is less than the second through-hole diameter, the screw thread of the bolt and the threaded hole of test microscope carrier coincide.The utility model had both been saved bolt and pedestal and test microscope carrier and coincide time of device to hole, and reduced the working strength of operating personnel, saved cost and time by the setting of microscope carrier threaded hole and bolt.
Description
Technical field
The utility model is related to device testing apparatus, and in particular to a kind of general-purpose type automatic impedance test device.
Background technology
With the development of science and technology, electronics detection technology is applied more and more.Fingerprint identification technology is most ripe at present
And cheap biometrics identification technology.The technology of fingerprint recognition is most widely used at present, we are not only in door
It can be seen that the figure of fingerprint identification technology, there is the application of more fingerprint recognitions in the market in taboo, attendance checking system：Such as notebook
Computer, mobile phone, automobile, bank paying all can employing fingerprint identification technology.
In the use fingerprint recognition module of the electronic products such as mobile phone, tablet computer, becket is often used, due to it
Acting as ground connection prevents people's electrostatic of human body when touching fingerprint chip from being damaged to chip, so the DC impedance of itself
It is the smaller the better, still, its DC impedance all is tested using universal meter in current automatic test, use is very inconvenient.
Invention content
The purpose of this utility model is to provide a kind of general-purpose type automatic impedance test device, general-purpose type automatic impedance test
Device had both been saved bolt and pedestal and test microscope carrier and coincide time of device to hole, subtracted by the setting of microscope carrier threaded hole and bolt
The working strength of few operating personnel, has saved cost and time.
In order to achieve the above objectives, the technical solution adopted in the utility model is：A kind of general-purpose type automatic impedance test device,
Including pedestal, stent, testing jig, test microscope carrier, cylinder and probe, the stent is set on base upper surface and stent and sets
There are several impedance instrument, it is described if the test microscope carrier is fixedly installed in base upper surface and below probe by bolt stem
Cylinder and probe are installed on testing jig；
The testing jig front side surface is provided with several sliding rails, and several probe bases are connected by sliding block with sliding rail activity respectively
It connects, the probe is respectively arranged in this several probe base, the cylinder is installed on the piston rod of testing jig upper surface and cylinder
Be fixedly connected with a movable plate, this movable plate is slidably arranged on sliding rail and above the probe base, the movable plate with
It is connected between probe base by a connecting pole；
The probe base lower surface is provided with a blind hole for probe insertion, and probe base side surface is provided with a stud bolt hole,
This stud bolt hole is penetrated through with blind hole, and the probe is embedded in the blind hole of probe base lower surface and passes through an insertion stud bolt hole from bottom to top
Interior stud is fixedly connected with probe base；
The test microscope carrier offers several threaded holes, and the pedestal offers T-shaped hole corresponding with threaded hole, described
Bolt be made of nut and screw rod and screw rod lower external face have screw thread, the T-shaped hole by left and right connection the second through-hole and
First through hole forms, and second through-hole is located at chassis outer side, and the first through hole is located on the inside of pedestal, the diameter of the screw thread
Between the second through-hole and first through hole, the diameter of the nut is more than the diameter of the first through hole of T-shaped hole, the screw rod
Diameter is less than the second through-hole diameter, and the screw thread of the bolt and the threaded hole of test microscope carrier coincide.
Further improved scheme is as follows in above-mentioned technical proposal：
1. in said program, if being fixedly connected between the probe base and sliding block by bolt stem.
2. in said program, if the number of the bolt stem is 4.
3. in said program, the reach is the 1/6 ~ 1/5 of spiro rod length.
4. in said program, the sliding rail is linear slide rail.
5. in said program, the number of several impedance instrument is 4.
Due to the utilization of above-mentioned technical proposal, the utility model has following advantages compared with prior art：
1st, the utility model general-purpose type automatic impedance test device, probe base lower surface are provided with one and are embedded in for the probe
Blind hole, probe base side surface is provided with a stud bolt hole, this stud bolt hole is penetrated through with blind hole, and the probe is embedded in probe base from bottom to top
In the blind hole of lower surface and the stud that passes through in an insertion stud bolt hole is fixedly connected with probe base, and probe is fixed from side
It is fixed in probe base, ensure that the accuracy positioned to probe, avoid the occurrence of probe and generate upper and lower displacement and influence
The precision of test ensures the accuracy and precision of test.
2nd, the utility model general-purpose type automatic impedance test device, testing jig front side surface are provided with several sliding rails, if
Dry probe base is flexibly connected by sliding block with sliding rail respectively, and the probe, the cylinder are respectively arranged in this several probe base
It is installed on testing jig upper surface and the piston rod of cylinder is fixedly connected with a movable plate, this movable plate is slidably arranged on sliding rail
It is upper and above probe base, it is connected between the movable plate and probe base by a connecting pole, cylinder, sliding rail and movable plate
Setting, analog manual operation push probe pushing to be contacted with chip to be measured, the impedance of chip to be measured are detected, operation letter
Folk prescription just, save a large amount of manpowers, avoid human error, test result is accurate, greatly improves production efficiency.
3rd, the utility model general-purpose type automatic impedance test device, test microscope carrier offers several threaded holes, described
Pedestal offers T-shaped hole corresponding with threaded hole, and the bolt is made of nut and screw rod and screw rod lower external face has spiral shell
Line, the T-shaped hole are made of the second through-hole and first through hole of left and right connection, and second through-hole is located at chassis outer side, described
First through hole is located on the inside of pedestal, and the diameter of the screw thread is between the second through-hole and first through hole, the diameter of the nut
More than the diameter of the first through hole of T-shaped hole, the diameter of the screw rod is less than the second through-hole diameter, the screw thread of the bolt and test
The threaded hole of microscope carrier coincide, the setting of microscope carrier threaded hole and bolt, had both saved bolt and pedestal and test microscope carrier is coincide device to hole
Time, also avoid the problem that occurring offset direction when bolt rotates, while easy to operate, the work for reducing operating personnel is strong
Degree, and prevent when replacing test microscope carrier and the problem of bolt loss occur, save cost and time；Secondly, it uses removable
The mode unloaded not only can in time be replaced when something goes wrong in test microscope carrier, but also can be replaced according to test product difference corresponding
Test microscope carrier has good versatility, cost-effective.
Description of the drawings
Attached drawing 1 is the utility model general-purpose type automatic impedance test device structure diagram；
Attached drawing 2 is the utility model general-purpose type automatic impedance test device partial structural diagram；
Attached drawing 3 is the utility model general-purpose type automatic impedance test device exploded structure diagram.
In the figures above：1st, pedestal；101st, T-shaped hole；102nd, first through hole；103rd, the second through-hole；2nd, stent；3rd, it tests
Frame；4th, test microscope carrier；401st, threaded hole；5th, cylinder；6th, probe；7th, impedance instrument；8th, bolt；801st, nut；802nd, screw rod；803、
Screw thread；14th, sliding rail；15th, probe base；16th, sliding block；17th, movable plate；18th, connecting pole；23rd, blind hole；24th, stud bolt hole；25th, stud.
Specific embodiment
Embodiment 1：A kind of general-purpose type automatic impedance test device, including pedestal 1, stent 2, testing jig 3, test microscope carrier 4,
Cylinder 5 and probe 6, the stent 2, which is set on 1 upper surface of pedestal and stent 2, is provided with several impedance instrument 7, and the test carries
If platform 4 is fixedly installed in 1 upper surface of pedestal and positioned at 6 lower section of probe by bolt stem 8, the cylinder 5 and probe 6 are installed on survey
It tries on frame 3；
3 front side surface of testing jig is provided with several sliding rails 14, several probe bases 15 by sliding block 16 respectively with sliding rail
14 flexible connections, are respectively arranged with the probe 6 in this several probe base 15, the cylinder 5 be installed on 3 upper surface of testing jig and
The piston rod of cylinder 5 is fixedly connected with a movable plate 17, this movable plate 17 is slidably arranged on sliding rail 14 and positioned at probe
15 top of seat, is connected between the movable plate 17 and probe base 15 by a connecting pole 18；
15 lower surface of probe base is provided with a blind hole 23 for the probe 6 insertion, and 15 side surface of probe base is provided with one
Stud bolt hole 24, this stud bolt hole 24 are penetrated through with blind hole 23, and the probe 6 is embedded in the blind hole 23 of 15 lower surface of probe base from bottom to top
And the stud 25 passed through in an insertion stud bolt hole 24 is fixedly connected with probe base 15；
The test microscope carrier 4 offers several threaded holes 401, and the pedestal 1 offers and 401 corresponding T of threaded hole
Shape hole 101, the bolt 8 is made of nut 801 and screw rod 802 and 802 lower external face of screw rod has screw thread 803, the T shapes
Hole 101 is made of the second through-hole 103 and first through hole 102 of left and right connection, and second through-hole 103 is located at 1 outside of pedestal, institute
State first through hole 102 and be located at the inside of pedestal 1, the diameter of the screw thread 803 between the second through-hole 103 and first through hole 102,
The diameter of the nut 801 is more than the diameter of the first through hole 102 of T-shaped hole 101, and the diameter of the screw rod 802 is less than second and leads to
103 diameter of hole, the screw thread 803 of the bolt 8 coincide with the threaded hole 401 of test microscope carrier 4.
If it is fixedly connected between above-mentioned probe base 15 and sliding block 16 by bolt stem；If the number of above-mentioned bolt stem is 4.
Embodiment 2：A kind of general-purpose type automatic impedance test device, including pedestal 1, stent 2, testing jig 3, test microscope carrier 4,
Cylinder 5 and probe 6, the stent 2, which is set on 1 upper surface of pedestal and stent 2, is provided with several impedance instrument 7, and the test carries
If platform 4 is fixedly installed in 1 upper surface of pedestal and positioned at 6 lower section of probe by bolt stem 8, the cylinder 5 and probe 6 are installed on survey
It tries on frame 3；
3 front side surface of testing jig is provided with several sliding rails 14, several probe bases 15 by sliding block 16 respectively with sliding rail
14 flexible connections, are respectively arranged with the probe 6 in this several probe base 15, the cylinder 5 be installed on 3 upper surface of testing jig and
The piston rod of cylinder 5 is fixedly connected with a movable plate 17, this movable plate 17 is slidably arranged on sliding rail 14 and positioned at probe
15 top of seat, is connected between the movable plate 17 and probe base 15 by a connecting pole 18；
15 lower surface of probe base is provided with a blind hole 23 for the probe 6 insertion, and 15 side surface of probe base is provided with one
Stud bolt hole 24, this stud bolt hole 24 are penetrated through with blind hole 23, and the probe 6 is embedded in the blind hole 23 of 15 lower surface of probe base from bottom to top
And the stud 25 passed through in an insertion stud bolt hole 24 is fixedly connected with probe base 15；
The test microscope carrier 4 offers several threaded holes 401, and the pedestal 1 offers and 401 corresponding T of threaded hole
Shape hole 101, the bolt 8 is made of nut 801 and screw rod 802 and 802 lower external face of screw rod has screw thread 803, the T shapes
Hole 101 is made of the second through-hole 103 and first through hole 102 of left and right connection, and second through-hole 103 is located at 1 outside of pedestal, institute
State first through hole 102 and be located at the inside of pedestal 1, the diameter of the screw thread 803 between the second through-hole 103 and first through hole 102,
The diameter of the nut 801 is more than the diameter of the first through hole 102 of T-shaped hole 101, and the diameter of the screw rod 802 is less than second and leads to
103 diameter of hole, the screw thread 803 of the bolt 8 coincide with the threaded hole 401 of test microscope carrier 4.
Above-mentioned 803 length of screw thread is the 1/5 of 802 length of screw rod；Above-mentioned sliding rail 14 is linear slide rail；Above-mentioned several impedance instrument
7 number is 4.
During using above-mentioned general-purpose type automatic impedance test device, probe is fixed from side and is fixed in probe
In seat, the accuracy positioned to probe ensure that, avoid the occurrence of the precision that probe generates upper and lower displacement and influences test, ensure
The accuracy and precision of test；Secondly, the setting of cylinder, sliding rail and movable plate, analog manual operation push probe to push with treating
Chip contact is surveyed, the impedance of chip to be measured is detected, simple to operate, a large amount of manpowers of saving avoid human error, survey
Test result is accurate, greatly improves production efficiency；Again, the setting of microscope carrier threaded hole and bolt, both saved bolt and pedestal and
Test microscope carrier is coincide time of device to hole, also avoids the problem that occurring offset direction when bolt rotates, while easy to operate, reduces behaviour
Make the working strength of personnel, and prevent when replacing test microscope carrier and the problem of bolt loss occur, save cost and time；This
Outside, dismountable mode is used, not only can in time be replaced when something goes wrong in test microscope carrier, but also can be according to test product not
With corresponding test microscope carrier is replaced, there is good versatility, it is cost-effective.
Above-described embodiment is only the technical concepts and features for illustrating the utility model, and its object is to allow be familiar with technique
Personage can understand the content of the utility model and implement according to this, can not the scope of protection of the utility model be limited with this.
It is all according to the spirit of the present invention substantially equivalent change or modification for being made, should all cover the scope of protection of the utility model it
It is interior.
Claims (6)
1. a kind of general-purpose type automatic impedance test device, it is characterised in that：Including pedestal（1）, stent（2）, testing jig（3）, survey
Try microscope carrier（4）, cylinder（5）And probe（6）, the stent（2）It is set to pedestal（1）Upper surface and stent（2）It is provided on if
Dry impedance instrument（7）, the test microscope carrier（4）If pass through bolt stem（8）It is fixedly installed in pedestal（1）Upper surface and positioned at probe
（6）Lower section, the cylinder（5）And probe（6）It is installed on testing jig（3）On；
The testing jig（3）Front side surface is provided with several sliding rails（14）, several probe bases（15）Pass through sliding block（16）Respectively with
Sliding rail（14）Flexible connection, this several probe base（15）Inside it is respectively arranged with the probe（6）, the cylinder（5）It is installed on survey
Try frame（3）Upper surface and cylinder（5）Piston rod and a movable plate（17）It is fixedly connected, this movable plate（17）Slidable setting
In sliding rail（14）Above and positioned at probe base（15）Top, the movable plate（17）With probe base（15）Between pass through a connecting pole
（18）Connection；
The probe base（15）Lower surface is provided with one and supplies the probe（6）Embedded blind hole（23）, probe base（15）It opens side surface
There is a stud bolt hole（24）, this stud bolt hole（24）With blind hole（23）Perforation, the probe（6）It is embedded in probe base from bottom to top（15）Under
The blind hole on surface（23）It is interior and pass through an insertion stud bolt hole（24）Interior stud（25）With probe base（15）It is fixedly connected；
The test microscope carrier（4）Offer several threaded holes（401）, the pedestal（1）It offers and threaded hole（401）It is corresponding
T-shaped hole（101）, the bolt（8）By nut（801）And screw rod（802）Composition and screw rod（802）Lower external face has spiral shell
Line（803）, the T-shaped hole（101）By the second through-hole of left and right connection（103）And first through hole（102）Composition, described second is logical
Hole（103）Positioned at pedestal（1）Outside, the first through hole（102）Positioned at pedestal（1）Inside, the screw thread（803）Diameter position
In the second through-hole（103）And first through hole（102）Between, the nut（801）Diameter be more than T-shaped hole（101）It is first logical
Hole（102）Diameter, the screw rod（802）Diameter be less than the second through-hole（103）Diameter, the bolt（8）Screw thread（803）
With test microscope carrier（4）Threaded hole（401）It coincide.
2. general-purpose type automatic impedance test device according to claim 1, it is characterised in that：The probe base（15）With cunning
Block（16）It is fixedly connected between if by bolt stem.
3. general-purpose type automatic impedance test device according to claim 1 or 2, it is characterised in that：If the bolt stem
Number is 4.
4. general-purpose type automatic impedance test device according to claim 1, it is characterised in that：The screw thread（803）Length
For screw rod（802）The 1/6 ~ 1/5 of length.
5. general-purpose type automatic impedance test device according to claim 1, it is characterised in that：The sliding rail（14）It is linear
Sliding rail.
6. general-purpose type automatic impedance test device according to claim 1, it is characterised in that：Several impedance instrument（7）
Number be 4.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721472015.3U CN207541155U (en) | 2017-11-07 | 2017-11-07 | General-purpose type automatic impedance test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721472015.3U CN207541155U (en) | 2017-11-07 | 2017-11-07 | General-purpose type automatic impedance test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207541155U true CN207541155U (en) | 2018-06-26 |
Family
ID=62612538
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721472015.3U Expired - Fee Related CN207541155U (en) | 2017-11-07 | 2017-11-07 | General-purpose type automatic impedance test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207541155U (en) |
-
2017
- 2017-11-07 CN CN201721472015.3U patent/CN207541155U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180626 Termination date: 20191107 |