CN207541152U - Fingerprint chip automatic impedance test equipment - Google Patents
Fingerprint chip automatic impedance test equipment Download PDFInfo
- Publication number
- CN207541152U CN207541152U CN201721469950.4U CN201721469950U CN207541152U CN 207541152 U CN207541152 U CN 207541152U CN 201721469950 U CN201721469950 U CN 201721469950U CN 207541152 U CN207541152 U CN 207541152U
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Abstract
The utility model discloses a kind of fingerprint chip automatic impedance test equipment, it includes pedestal, stent, testing jig, test microscope carrier, cylinder and probe, the stent, which is set on base upper surface and stent, is provided with several impedance instrument, the cylinder is installed on testing jig upper surface and the piston rod of cylinder is fixedly connected with a movable plate, the probe base lower surface is provided with a blind hole for probe insertion, this stud bolt hole is penetrated through with blind hole, the probe is embedded in the stud in the blind hole of probe base lower surface and passed through in an insertion stud bolt hole and is fixedly connected with probe base from bottom to top, the test microscope carrier offers several threaded holes, the diameter of the nut is more than the diameter of the first through hole of T-shaped hole, the diameter of the screw rod is less than the second through-hole diameter, the screw thread of the bolt and the threaded hole of test microscope carrier coincide.The utility model not only with good accuracy of detection but also protects chip to be measured, situations such as damaging chip to be measured is avoided the occurrence of, so as to ensure the quality and precision of test by the setting of spring on connecting pole.
Description
Technical field
The utility model is related to device testing apparatus, and in particular to a kind of fingerprint chip automatic impedance test equipment.
Background technology
With the development of science and technology, electronics detection technology is applied more and more.Fingerprint identification technology is most ripe at present
And cheap biometrics identification technology.The technology of fingerprint recognition is most widely used at present, we are not only in door
It can be seen that the figure of fingerprint identification technology, there is the application of more fingerprint recognitions in the market in taboo, attendance checking system：Such as notebook
Computer, mobile phone, automobile, bank paying all can employing fingerprint identification technology.
In the use fingerprint recognition module of the electronic products such as mobile phone, tablet computer, becket is often used, due to it
Acting as ground connection prevents people's electrostatic of human body when touching fingerprint chip from being damaged to chip, so the DC impedance of itself
It is the smaller the better, still, its DC impedance all is tested using universal meter in current automatic test, use is very inconvenient.
Invention content
The purpose of this utility model is to provide a kind of fingerprint chip automatic impedance test equipment, and the fingerprint chip is with automatically
Testing impedance equipment not only with good accuracy of detection but also is protected chip to be measured, is avoided by the setting of spring on connecting pole
There is situations such as damaging chip to be measured, so as to ensure the quality and precision of test.
In order to achieve the above objectives, the technical solution adopted in the utility model is：A kind of fingerprint chip is tested with automatic impedance
Equipment, including pedestal, stent, testing jig, test microscope carrier, cylinder and probe, the stent is set to base upper surface and stent
On be provided with several impedance instrument, if the test microscope carrier is fixedly installed in base upper surface and under the probe by bolt stem
Side, the cylinder and probe are installed on testing jig；
The testing jig front side surface is provided with several sliding rails, and several probe bases are connected by sliding block with sliding rail activity respectively
It connects, the probe is respectively arranged in this several probe base, the cylinder is installed on the piston rod of testing jig upper surface and cylinder
Be fixedly connected with a movable plate, this movable plate is slidably arranged on sliding rail and above the probe base, the movable plate with
It is connected between probe base by a connecting pole；
Be provided with several through-holes on the movable plate, the connecting pole upper end passes through the through-hole of movable plate, connecting pole lower end with
Probe base upper surface is fixedly connected, and the connecting pole outer sheath is equipped with a spring, and the probe base lower surface is provided with described in a confession
The blind hole of probe insertion, probe base side surface are provided with a stud bolt hole, this stud bolt hole is penetrated through with blind hole, and the probe is embedding from bottom to top
Enter the stud in the blind hole of probe base lower surface and passed through in an insertion stud bolt hole to be fixedly connected with probe base；
The test microscope carrier offers several threaded holes, and the pedestal offers T-shaped hole corresponding with threaded hole, described
Bolt be made of nut and screw rod and screw rod lower external face have screw thread, the T-shaped hole by left and right connection the second through-hole and
First through hole forms, and second through-hole is located at chassis outer side, and the first through hole is located on the inside of pedestal, the diameter of the screw thread
Between the second through-hole and first through hole, the diameter of the nut is more than the diameter of the first through hole of T-shaped hole, the screw rod
Diameter is less than the second through-hole diameter, and the screw thread of the bolt and the threaded hole of test microscope carrier coincide.
Further improved scheme is as follows in above-mentioned technical proposal：
1. in said program, connecting pole lower end side surface is provided with screw thread.
2. in said program, the probe base upper surface is provided with threaded hole corresponding with connecting pole.
3. it in said program, is fixed in the threaded hole of the connecting pole lower end insertion probe base upper surface and with probe base
Connection.
4. in said program, the sliding rail is linear slide rail.
5. in said program, the sliding rail is fixedly connected by several screws with testing jig front side surface.
Due to the utilization of above-mentioned technical proposal, the utility model has following advantages compared with prior art：
1st, the utility model fingerprint chip automatic impedance test equipment, testing jig front side surface are provided with several cunnings
Rail, several probe bases are flexibly connected by sliding block with sliding rail respectively, and the probe is respectively arranged in this several probe base, described
Cylinder is installed on testing jig upper surface and the piston rod of cylinder is fixedly connected with a movable plate, this movable plate is slidably arranged on
It on sliding rail and above probe base, is connected between the movable plate and probe base by a connecting pole, cylinder, sliding rail and activity
The setting of plate, analog manual operation push probe pushing to be contacted with chip to be measured, the impedance of chip to be measured are detected, grasp
Make simple and convenient, a large amount of manpowers of saving, avoid human error, test result is accurate, greatly improves production efficiency.
2nd, the utility model fingerprint chip automatic impedance test equipment is provided with several through-holes, the company on movable plate
The through-hole that column upper end passes through movable plate is connect, connecting pole lower end is fixedly connected with probe base upper surface, is set on the outside of the connecting pole
There is a spring, the setting of spring on connecting pole can provide a cushion effect when cylinder pushes movable plate to push to probe, from
And to keep Elastic Contact between probe and chip to be measured, not only with good accuracy of detection but also chip to be measured is protected, kept away
Exempt from situations such as damaging chip to be measured occur, so as to ensure the quality and precision of test.
3rd, the utility model fingerprint chip automatic impedance test equipment, probe base lower surface are provided with one and supply the probe
Embedded blind hole, probe base side surface are provided with a stud bolt hole, this stud bolt hole is penetrated through with blind hole, and the probe is embedded from bottom to top to be visited
In the blind hole of needle stand lower surface and the stud that passes through in an insertion stud bolt hole is fixedly connected with probe base, from side to probe progress
Fixation is fixed in probe base, ensure that accuracy position to probe, avoid the occurrence of probe generate upper and lower displacement and
The precision of test is influenced, ensures the accuracy and precision of test.
4th, the utility model fingerprint chip automatic impedance test equipment, test microscope carrier offer several threaded holes,
The pedestal offers T-shaped hole corresponding with threaded hole, and the bolt is made of nut and screw rod and screw rod lower external mask
There is screw thread, the T-shaped hole is made of the second through-hole and first through hole of left and right connection, and second through-hole is located at chassis outer side,
The first through hole is located on the inside of pedestal, the diameter of the screw thread between the second through-hole and first through hole, the nut
Diameter is more than the diameter of the first through hole of T-shaped hole, and the diameter of the screw rod is less than the second through-hole diameter, the screw thread of the bolt with
The threaded hole of test microscope carrier coincide, the setting of microscope carrier threaded hole and bolt, had both saved bolt and has coincide with pedestal and test microscope carrier
The time of device to hole also avoids the problem that occurring offset direction when bolt rotates, while easy to operate, reduces the work of operating personnel
Intensity, and prevent when replacing test microscope carrier and the problem of bolt loss occur, save cost and time；Secondly, using can
The mode of dismounting not only can in time be replaced when something goes wrong in test microscope carrier, but also can be replaced according to test product difference corresponding
Test microscope carrier, have good versatility, it is cost-effective.
Description of the drawings
Attached drawing 1 is the utility model fingerprint chip automatic impedance test equipment structure diagram；
Attached drawing 2 is the utility model fingerprint chip automatic impedance test equipment partial structural diagram；
Attached drawing 3 is the utility model fingerprint chip automatic impedance test equipment thin portion structure diagram；
Attached drawing 4 is the utility model fingerprint chip automatic impedance test equipment partial structurtes decomposition diagram.
In the figures above：1st, pedestal；101st, T-shaped hole；102nd, first through hole；103rd, the second through-hole；2nd, stent；3rd, it tests
Frame；4th, test microscope carrier；401st, threaded hole；5th, cylinder；6th, probe；7th, impedance instrument；8th, bolt；801st, nut；802nd, screw rod；803、
Screw thread；14th, sliding rail；15th, probe base；16th, sliding block；17th, movable plate；18th, connecting pole；21st, through-hole；22nd, spring；23rd, blind hole；
24th, stud bolt hole；25th, stud.
Specific embodiment
Embodiment 1：A kind of fingerprint chip automatic impedance test equipment is carried including pedestal 1, stent 2, testing jig 3, test
Platform 4, cylinder 5 and probe 6, the stent 2, which is set on 1 upper surface of pedestal and stent 2, is provided with several impedance instrument 7, the survey
If examination microscope carrier 4 is fixedly installed in 1 upper surface of pedestal and positioned at 6 lower section of probe by bolt stem 8, the cylinder 5 and probe 6 are installed
In on testing jig 3；
3 front side surface of testing jig is provided with several sliding rails 14, several probe bases 15 by sliding block 16 respectively with sliding rail
14 flexible connections, are respectively arranged with the probe 6 in this several probe base 15, the cylinder 5 be installed on 3 upper surface of testing jig and
The piston rod of cylinder 5 is fixedly connected with a movable plate 17, this movable plate 17 is slidably arranged on sliding rail 14 and positioned at probe
15 top of seat, is connected between the movable plate 17 and probe base 15 by a connecting pole 18；
Several through-holes 21 are provided on the movable plate 17,18 upper end of connecting pole passes through the through-hole 21 of movable plate 17, even
It connects 18 lower end of column to be fixedly connected with 15 upper surface of probe base, 18 outer sheath of connecting pole is equipped with a spring 22, the probe base
15 lower surfaces are provided with a blind hole 23 for the probe 6 insertion, and 15 side surface of probe base is provided with a stud bolt hole 24, this stud bolt hole 24
It is penetrated through with blind hole 23, the probe 6 is embedded in the blind hole 23 of 15 lower surface of probe base and passes through an insertion stud bolt hole from bottom to top
Stud 25 in 24 is fixedly connected with probe base 15；
The test microscope carrier 4 offers several threaded holes 401, and the pedestal 1 offers and 401 corresponding T of threaded hole
Shape hole 101, the bolt 8 is made of nut 801 and screw rod 802 and 802 lower external face of screw rod has screw thread 803, the T shapes
Hole 101 is made of the second through-hole 103 and first through hole 102 of left and right connection, and second through-hole 103 is located at 1 outside of pedestal, institute
State first through hole 102 and be located at the inside of pedestal 1, the diameter of the screw thread 803 between the second through-hole 103 and first through hole 102,
The diameter of the nut 801 is more than the diameter of the first through hole 102 of T-shaped hole 101, and the diameter of the screw rod 802 is less than second and leads to
103 diameter of hole, the screw thread 803 of the bolt 8 coincide with the threaded hole 401 of test microscope carrier 4.
Above-mentioned 18 lower end side surface of connecting pole is provided with screw thread；It is right with connecting pole 18 that above-mentioned 15 upper surface of probe base is provided with
The threaded hole answered.
Embodiment 2：A kind of fingerprint chip automatic impedance test equipment is carried including pedestal 1, stent 2, testing jig 3, test
Platform 4, cylinder 5 and probe 6, the stent 2, which is set on 1 upper surface of pedestal and stent 2, is provided with several impedance instrument 7, the survey
If examination microscope carrier 4 is fixedly installed in 1 upper surface of pedestal and positioned at 6 lower section of probe by bolt stem 8, the cylinder 5 and probe 6 are installed
In on testing jig 3；
3 front side surface of testing jig is provided with several sliding rails 14, several probe bases 15 by sliding block 16 respectively with sliding rail
14 flexible connections, are respectively arranged with the probe 6 in this several probe base 15, the cylinder 5 be installed on 3 upper surface of testing jig and
The piston rod of cylinder 5 is fixedly connected with a movable plate 17, this movable plate 17 is slidably arranged on sliding rail 14 and positioned at probe
15 top of seat, is connected between the movable plate 17 and probe base 15 by a connecting pole 18；
Several through-holes 21 are provided on the movable plate 17,18 upper end of connecting pole passes through the through-hole 21 of movable plate 17, even
It connects 18 lower end of column to be fixedly connected with 15 upper surface of probe base, 18 outer sheath of connecting pole is equipped with a spring 22, the probe base
15 lower surfaces are provided with a blind hole 23 for the probe 6 insertion, and 15 side surface of probe base is provided with a stud bolt hole 24, this stud bolt hole 24
It is penetrated through with blind hole 23, the probe 6 is embedded in the blind hole 23 of 15 lower surface of probe base and passes through an insertion stud bolt hole from bottom to top
Stud 25 in 24 is fixedly connected with probe base 15；
The test microscope carrier 4 offers several threaded holes 401, and the pedestal 1 offers and 401 corresponding T of threaded hole
Shape hole 101, the bolt 8 is made of nut 801 and screw rod 802 and 802 lower external face of screw rod has screw thread 803, the T shapes
Hole 101 is made of the second through-hole 103 and first through hole 102 of left and right connection, and second through-hole 103 is located at 1 outside of pedestal, institute
State first through hole 102 and be located at the inside of pedestal 1, the diameter of the screw thread 803 between the second through-hole 103 and first through hole 102,
The diameter of the nut 801 is more than the diameter of the first through hole 102 of T-shaped hole 101, and the diameter of the screw rod 802 is less than second and leads to
103 diameter of hole, the screw thread 803 of the bolt 8 coincide with the threaded hole 401 of test microscope carrier 4.
It is fixedly connected in the threaded hole of above-mentioned 18 lower end of connecting pole insertion probe base, 15 upper surface and with probe base 15；It is above-mentioned
Sliding rail 14 is linear slide rail；Above-mentioned sliding rail 14 is fixedly connected by several screws with 3 front side surface of testing jig.
During using above-mentioned fingerprint chip automatic impedance test equipment, people is simulated in the setting of cylinder, sliding rail and movable plate
Work act, push probe pushing is contacted with chip to be measured, the impedance of chip to be measured is detected, it is simple in structure it is easy to operate,
A large amount of manpowers are saved, avoid human error, test result is accurate, greatly improves production efficiency；Secondly, spring on connecting pole
Setting can provide a buffering, so that between probe and chip to be measured when cylinder pushes movable plate to push to probe
Elastic Contact is kept, not only with good accuracy of detection but also has protected chip to be measured, avoids the occurrence of situations such as damaging chip to be measured,
Ensure the quality and precision of test；Again, probe is fixed from side and be fixed in probe base, ensure that visiting
Needle positioning accuracy, avoid the occurrence of probe generate above and below displacement and influence test precision, ensure test accuracy and
Precision；Again, it had both saved bolt and pedestal and test microscope carrier is coincide time of device to hole, and bolt had also been avoided to occur when rotating inclined
The problem of from direction, at the same it is easy to operate, the working strength of operating personnel is reduced, and prevent when replacing test microscope carrier and spiral shell occur
The problem of bolt is lost, has saved cost and time；In addition, it uses dismountable mode, can both be asked in test microscope carrier
It is replaced in time during topic, and can corresponding test microscope carrier be replaced according to test product difference, there is good versatility, save into
This.
Above-described embodiment is only the technical concepts and features for illustrating the utility model, and its object is to allow be familiar with technique
Personage can understand the content of the utility model and implement according to this, can not the scope of protection of the utility model be limited with this.
It is all according to the spirit of the present invention substantially equivalent change or modification for being made, should all cover the scope of protection of the utility model it
It is interior.
Claims (6)
1. a kind of fingerprint chip automatic impedance test equipment, it is characterised in that：Including pedestal（1）, stent（2）, testing jig
（3）, test microscope carrier（4）, cylinder（5）And probe（6）, the stent（2）It is set to pedestal（1）Upper surface and stent（2）On set
It is equipped with several impedance instrument（7）, the test microscope carrier（4）If pass through bolt stem（8）It is fixedly installed in pedestal（1）Upper surface and it is located at
Probe（6）Lower section, the cylinder（5）And probe（6）It is installed on testing jig（3）On；
The testing jig（3）Front side surface is provided with several sliding rails（14）, several probe bases（15）Pass through sliding block（16）Respectively with
Sliding rail（14）Flexible connection, this several probe base（15）Inside it is respectively arranged with the probe（6）, the cylinder（5）It is installed on survey
Try frame（3）Upper surface and cylinder（5）Piston rod and a movable plate（17）It is fixedly connected, this movable plate（17）Slidable setting
In sliding rail（14）Above and positioned at probe base（15）Top, the movable plate（17）With probe base（15）Between pass through a connecting pole
（18）Connection；
The movable plate（17）On be provided with several through-holes（21）, the connecting pole（18）Upper end passes through movable plate（17）Through-hole
（21）, connecting pole（18）Lower end and probe base（15）Upper surface is fixedly connected, the connecting pole（18）Outer sheath is equipped with a spring
（22）, the probe base（15）Lower surface is provided with one and supplies the probe（6）Embedded blind hole（23）, probe base（15）It opens side surface
There is a stud bolt hole（24）, this stud bolt hole（24）With blind hole（23）Perforation, the probe（6）It is embedded in probe base from bottom to top（15）Under
The blind hole on surface（23）It is interior and pass through an insertion stud bolt hole（24）Interior stud（25）With probe base（15）It is fixedly connected；
The test microscope carrier（4）Offer several threaded holes（401）, the pedestal（1）It offers and threaded hole（401）It is corresponding
T-shaped hole（101）, the bolt（8）By nut（801）And screw rod（802）Composition and screw rod（802）Lower external face has spiral shell
Line（803）, the T-shaped hole（101）By the second through-hole of left and right connection（103）And first through hole（102）Composition, described second is logical
Hole（103）Positioned at pedestal（1）Outside, the first through hole（102）Positioned at pedestal（1）Inside, the screw thread（803）Diameter position
In the second through-hole（103）And first through hole（102）Between, the nut（801）Diameter be more than T-shaped hole（101）It is first logical
Hole（102）Diameter, the screw rod（802）Diameter be less than the second through-hole（103）Diameter, the bolt（8）Screw thread（803）
With test microscope carrier（4）Threaded hole（401）It coincide.
2. fingerprint chip automatic impedance test equipment according to claim 1, it is characterised in that：The connecting pole（18）
Lower end side surface is provided with screw thread.
3. fingerprint chip automatic impedance test equipment according to claim 1, it is characterised in that：The probe base（15）
Upper surface is provided with and connecting pole（18）Corresponding threaded hole.
4. according to claim 1 ~ 3 any one of them fingerprint chip automatic impedance test equipment, it is characterised in that：The company
Connect column（18）Lower end is embedded in probe base（15）In the threaded hole of upper surface and and probe base（15）It is fixedly connected.
5. fingerprint chip automatic impedance test equipment according to claim 1, it is characterised in that：The sliding rail（14）For
Linear slide rail.
6. fingerprint chip automatic impedance test equipment according to claim 1, it is characterised in that：The sliding rail（14）It is logical
Cross several screws and testing jig（3）Front side surface is fixedly connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721469950.4U CN207541152U (en) | 2017-11-07 | 2017-11-07 | Fingerprint chip automatic impedance test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721469950.4U CN207541152U (en) | 2017-11-07 | 2017-11-07 | Fingerprint chip automatic impedance test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207541152U true CN207541152U (en) | 2018-06-26 |
Family
ID=62612540
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721469950.4U Expired - Fee Related CN207541152U (en) | 2017-11-07 | 2017-11-07 | Fingerprint chip automatic impedance test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207541152U (en) |
-
2017
- 2017-11-07 CN CN201721469950.4U patent/CN207541152U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180626 Termination date: 20191107 |