CN207541153U - Fingerprint chip DC impedance tester - Google Patents
Fingerprint chip DC impedance tester Download PDFInfo
- Publication number
- CN207541153U CN207541153U CN201721470591.4U CN201721470591U CN207541153U CN 207541153 U CN207541153 U CN 207541153U CN 201721470591 U CN201721470591 U CN 201721470591U CN 207541153 U CN207541153 U CN 207541153U
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- CN
- China
- Prior art keywords
- hole
- probe
- several
- pedestal
- microscope carrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
The utility model discloses a kind of fingerprint chip DC impedance tester, it includes pedestal, stent, testing jig, test microscope carrier, cylinder and probe, the stent, which is set on base upper surface and stent, is provided with several impedance instrument, if the test microscope carrier is fixedly installed in base upper surface and below probe by bolt stem, it is connected between the movable plate and probe base by a connecting pole, several through-holes are provided on the movable plate, the connecting pole upper end passes through the through-hole of movable plate, connecting pole lower end is fixedly connected with probe base upper surface, the connecting pole outer sheath is equipped with a spring, the test microscope carrier offers several threaded holes, the diameter of the nut is more than the diameter of the first through hole of T-shaped hole, the diameter of the screw rod is less than the second through-hole diameter, the screw thread of the bolt and the threaded hole of test microscope carrier coincide.The utility model has saved bolt and pedestal and test microscope carrier and has coincide time of device to hole, also avoided the problem that occurring offset direction when bolt rotates by the structure setting of pedestal and bolt.
Description
Technical field
The utility model is related to device testing apparatus, and in particular to a kind of fingerprint chip DC impedance tester.
Background technology
With the development of science and technology, electronics detection technology is applied more and more.Fingerprint identification technology is most ripe at present
And cheap biometrics identification technology.The technology of fingerprint recognition is most widely used at present, we are not only in door
It can be seen that the figure of fingerprint identification technology, there is the application of more fingerprint recognitions in the market in taboo, attendance checking system：Such as notebook
Computer, mobile phone, automobile, bank paying all can employing fingerprint identification technology.
In the use fingerprint recognition module of the electronic products such as mobile phone, tablet computer, becket is often used, due to it
Acting as ground connection prevents people's electrostatic of human body when touching fingerprint chip from being damaged to chip, so the DC impedance of itself
It is the smaller the better, still, its DC impedance all is tested using universal meter in current automatic test, use is very inconvenient.
Invention content
The purpose of this utility model is to provide a kind of fingerprint chip DC impedance tester, which surveys
Structure setting of the instrument by pedestal and bolt is tried, bolt and pedestal has been saved and test microscope carrier is coincide time of device to hole, also avoided
There is the problem of offset direction when rotating in bolt.
In order to achieve the above objectives, the technical solution adopted in the utility model is：A kind of fingerprint chip DC impedance tester,
Including pedestal, stent, testing jig, test microscope carrier, cylinder and probe, the stent is set on base upper surface and stent and sets
There are several impedance instrument, it is described if the test microscope carrier is fixedly installed in base upper surface and below probe by bolt stem
Cylinder and probe are installed on testing jig；
The testing jig front side surface is provided with several sliding rails, and several probe bases are connected by sliding block with sliding rail activity respectively
It connects, the probe is respectively arranged in this several probe base, the cylinder is installed on the piston rod of testing jig upper surface and cylinder
Be fixedly connected with a movable plate, this movable plate is slidably arranged on sliding rail and above the probe base, the movable plate with
It is connected between probe base by a connecting pole, several through-holes is provided on the movable plate, the connecting pole upper end passes through movable plate
Through-hole, connecting pole lower end is fixedly connected with probe base upper surface, and the connecting pole outer sheath is equipped with a spring；
The test microscope carrier offers several threaded holes, and the pedestal offers T-shaped hole corresponding with threaded hole, described
Bolt be made of nut and screw rod and screw rod lower external face have screw thread, the T-shaped hole by left and right connection the second through-hole and
First through hole forms, and second through-hole is located at chassis outer side, and the first through hole is located on the inside of pedestal, the diameter of the screw thread
Between the second through-hole and first through hole, the diameter of the nut is more than the diameter of the first through hole of T-shaped hole, the screw rod
Diameter is less than the second through-hole diameter, and the screw thread of the bolt and the threaded hole of test microscope carrier coincide.
Further improved scheme is as follows in above-mentioned technical proposal：
1. in said program, the number of several through-holes is 2.
2. in said program, if being fixedly connected between the probe base and sliding block by bolt stem.
3. in said program, the sliding rail is linear slide rail.
4. in said program, the number of several probe bases is 8.
Due to the utilization of above-mentioned technical proposal, the utility model has following advantages compared with prior art：
1st, the utility model fingerprint chip DC impedance tester, testing jig front side surface are provided with several sliding rails, if
Dry probe base is flexibly connected by sliding block with sliding rail respectively, and the probe, the cylinder are respectively arranged in this several probe base
It is installed on testing jig upper surface and the piston rod of cylinder is fixedly connected with a movable plate, this movable plate is slidably arranged on sliding rail
It is upper and above probe base, it is connected between the movable plate and probe base by a connecting pole, cylinder, sliding rail and movable plate
Setting, analog manual operation push probe pushing to be contacted with chip to be measured, the impedance of chip to be measured are detected, operation letter
Folk prescription just, save a large amount of manpowers, avoid human error, test result is accurate, greatly improves production efficiency.
2nd, the utility model fingerprint chip DC impedance tester is provided with several through-holes, the connecting pole on movable plate
Upper end passes through the through-hole of movable plate, and connecting pole lower end is fixedly connected with probe base upper surface, and the connecting pole outer sheath is equipped with one
Spring, the setting of spring on connecting pole can provide a cushion effect, so as to make when cylinder pushes movable plate to push to probe
Elastic Contact is kept between probe and chip to be measured, not only with good accuracy of detection but also protected chip to be measured, avoided out
Situations such as now damaging chip to be measured, so as to ensure the quality and precision of test.
3rd, the utility model fingerprint chip DC impedance tester, test microscope carrier offers several threaded holes, described
Pedestal offers T-shaped hole corresponding with threaded hole, and the bolt is made of nut and screw rod and screw rod lower external face has spiral shell
Line, the T-shaped hole are made of the second through-hole and first through hole of left and right connection, and second through-hole is located at chassis outer side, described
First through hole is located on the inside of pedestal, and the diameter of the screw thread is between the second through-hole and first through hole, the diameter of the nut
More than the diameter of the first through hole of T-shaped hole, the diameter of the screw rod is less than the second through-hole diameter, the screw thread of the bolt and test
The threaded hole of microscope carrier coincide, the setting of microscope carrier threaded hole and bolt, had both saved bolt and pedestal and test microscope carrier is coincide device to hole
Time, also avoid the problem that occurring offset direction when bolt rotates, while easy to operate, the work for reducing operating personnel is strong
Degree, and prevent when replacing test microscope carrier and the problem of bolt loss occur, save cost and time；Secondly, it uses removable
The mode unloaded not only can in time be replaced when something goes wrong in test microscope carrier, but also can be replaced according to test product difference corresponding
Test microscope carrier has good versatility, cost-effective.
Description of the drawings
Attached drawing 1 is the utility model fingerprint chip DC impedance tester structure diagram；
Attached drawing 2 is the utility model fingerprint chip DC impedance tester partial structural diagram；
Attached drawing 3 is the utility model fingerprint chip DC impedance tester exploded structure diagram.
In the figures above：1st, pedestal；101st, T-shaped hole；102nd, first through hole；103rd, the second through-hole；2nd, stent；3rd, it tests
Frame；4th, test microscope carrier；401st, threaded hole；5th, cylinder；6th, probe；7th, impedance instrument；8th, bolt；801st, nut；802nd, screw rod；803、
Screw thread；14th, sliding rail；15th, probe base；16th, sliding block；17th, movable plate；18th, connecting pole；21st, through-hole；22nd, spring.
Specific embodiment
Embodiment 1：A kind of fingerprint chip DC impedance tester, including pedestal 1, stent 2, testing jig 3, test microscope carrier 4,
Cylinder 5 and probe 6, the stent 2, which is set on 1 upper surface of pedestal and stent 2, is provided with several impedance instrument 7, and the test carries
If platform 4 is fixedly installed in 1 upper surface of pedestal and positioned at 6 lower section of probe by bolt stem 8, the cylinder 5 and probe 6 are installed on survey
It tries on frame 3；
3 front side surface of testing jig is provided with several sliding rails 14, several probe bases 15 by sliding block 16 respectively with sliding rail
14 flexible connections, are respectively arranged with the probe 6 in this several probe base 15, the cylinder 5 be installed on 3 upper surface of testing jig and
The piston rod of cylinder 5 is fixedly connected with a movable plate 17, this movable plate 17 is slidably arranged on sliding rail 14 and positioned at probe
15 top of seat, is connected by a connecting pole 18 between the movable plate 17 and probe base 15, is provided on the movable plate 17 several
Through-hole 21,18 upper end of connecting pole pass through the through-hole 21 of movable plate 17, and 18 lower end of connecting pole is fixed with 15 upper surface of probe base
Connection, 18 outer sheath of connecting pole are equipped with a spring 22；
The test microscope carrier 4 offers several threaded holes 401, and the pedestal 1 offers and 401 corresponding T of threaded hole
Shape hole 101, the bolt 8 is made of nut 801 and screw rod 802 and 802 lower external face of screw rod has screw thread 803, the T shapes
Hole 101 is made of the second through-hole 103 and first through hole 102 of left and right connection, and second through-hole 103 is located at 1 outside of pedestal, institute
State first through hole 102 and be located at the inside of pedestal 1, the diameter of the screw thread 803 between the second through-hole 103 and first through hole 102,
The diameter of the nut 801 is more than the diameter of the first through hole 102 of T-shaped hole 101, and the diameter of the screw rod 802 is less than second and leads to
103 diameter of hole, the screw thread 803 of the bolt 8 coincide with the threaded hole 401 of test microscope carrier 4.
The number of above-mentioned several through-holes 21 is 2；Connect if being fixed between above-mentioned probe base 15 and sliding block 16 by bolt stem
It connects.
Embodiment 2：A kind of fingerprint chip DC impedance tester, including pedestal 1, stent 2, testing jig 3, test microscope carrier 4,
Cylinder 5 and probe 6, the stent 2, which is set on 1 upper surface of pedestal and stent 2, is provided with several impedance instrument 7, and the test carries
If platform 4 is fixedly installed in 1 upper surface of pedestal and positioned at 6 lower section of probe by bolt stem 8, the cylinder 5 and probe 6 are installed on survey
It tries on frame 3；
3 front side surface of testing jig is provided with several sliding rails 14, several probe bases 15 by sliding block 16 respectively with sliding rail
14 flexible connections, are respectively arranged with the probe 6 in this several probe base 15, the cylinder 5 be installed on 3 upper surface of testing jig and
The piston rod of cylinder 5 is fixedly connected with a movable plate 17, this movable plate 17 is slidably arranged on sliding rail 14 and positioned at probe
15 top of seat, is connected by a connecting pole 18 between the movable plate 17 and probe base 15, is provided on the movable plate 17 several
Through-hole 21,18 upper end of connecting pole pass through the through-hole 21 of movable plate 17, and 18 lower end of connecting pole is fixed with 15 upper surface of probe base
Connection, 18 outer sheath of connecting pole are equipped with a spring 22；
The test microscope carrier 4 offers several threaded holes 401, and the pedestal 1 offers and 401 corresponding T of threaded hole
Shape hole 101, the bolt 8 is made of nut 801 and screw rod 802 and 802 lower external face of screw rod has screw thread 803, the T shapes
Hole 101 is made of the second through-hole 103 and first through hole 102 of left and right connection, and second through-hole 103 is located at 1 outside of pedestal, institute
State first through hole 102 and be located at the inside of pedestal 1, the diameter of the screw thread 803 between the second through-hole 103 and first through hole 102,
The diameter of the nut 801 is more than the diameter of the first through hole 102 of T-shaped hole 101, and the diameter of the screw rod 802 is less than second and leads to
103 diameter of hole, the screw thread 803 of the bolt 8 coincide with the threaded hole 401 of test microscope carrier 4.
Above-mentioned sliding rail 14 is linear slide rail；The number of above-mentioned several probe bases 15 is 8.
During using above-mentioned fingerprint chip DC impedance tester, artificial behaviour is simulated in the setting of cylinder, sliding rail and movable plate
Make, probe pushing is pushed to be contacted with chip to be measured, the impedance of chip to be measured is detected, simple to operate, saving is largely
Manpower avoids human error, and test result is accurate, greatly improves production efficiency；Secondly, the setting of spring on connecting pole can
To provide a cushion effect to probe when cylinder pushes movable plate to push, so that keeping bullet between probe and chip to be measured
Property contact, not only with good accuracy of detection but also protected chip to be measured, and avoided the occurrence of situations such as damaging chip to be measured, so as to protect
Demonstrate,prove the quality and precision of test；Again, it had both saved bolt and pedestal and test microscope carrier is coincide time of device to hole, and also avoided spiral shell
There is the problem of offset direction, while easy to operate when rotating in bolt, and reduces the working strength of operating personnel, and replacement is prevented to survey
It tries the problem of bolt loss occur during microscope carrier, has saved cost and time；Again, dismountable mode is used, it both can be
Test microscope carrier is replaced in time when something goes wrong, and can replace corresponding test microscope carrier according to test product difference, is had good
Versatility, it is cost-effective.
Above-described embodiment is only the technical concepts and features for illustrating the utility model, and its object is to allow be familiar with technique
Personage can understand the content of the utility model and implement according to this, can not the scope of protection of the utility model be limited with this.
It is all according to the spirit of the present invention substantially equivalent change or modification for being made, should all cover the scope of protection of the utility model it
It is interior.
Claims (5)
1. a kind of fingerprint chip DC impedance tester, it is characterised in that：Including pedestal（1）, stent（2）, testing jig（3）, survey
Try microscope carrier（4）, cylinder（5）And probe（6）, the stent（2）It is set to pedestal（1）Upper surface and stent（2）It is provided on if
Dry impedance instrument（7）, the test microscope carrier（4）If pass through bolt stem（8）It is fixedly installed in pedestal（1）Upper surface and positioned at probe
（6）Lower section, the cylinder（5）And probe（6）It is installed on testing jig（3）On；
The testing jig（3）Front side surface is provided with several sliding rails（14）, several probe bases（15）Pass through sliding block（16）Respectively with
Sliding rail（14）Flexible connection, this several probe base（15）Inside it is respectively arranged with the probe（6）, the cylinder（5）It is installed on survey
Try frame（3）Upper surface and cylinder（5）Piston rod and a movable plate（17）It is fixedly connected, this movable plate（17）Slidable setting
In sliding rail（14）Above and positioned at probe base（15）Top, the movable plate（17）With probe base（15）Between pass through a connecting pole
（18）Connection, the movable plate（17）On be provided with several through-holes（21）, the connecting pole（18）Upper end passes through movable plate（17）'s
Through-hole（21）, connecting pole（18）Lower end and probe base（15）Upper surface is fixedly connected, the connecting pole（18）Outer sheath is equipped with one
Spring（22）；
The test microscope carrier（4）Offer several threaded holes（401）, the pedestal（1）It offers and threaded hole（401）It is corresponding
T-shaped hole（101）, the bolt（8）By nut（801）And screw rod（802）Composition and screw rod（802）Lower external face has spiral shell
Line（803）, the T-shaped hole（101）By the second through-hole of left and right connection（103）And first through hole（102）Composition, described second is logical
Hole（103）Positioned at pedestal（1）Outside, the first through hole（102）Positioned at pedestal（1）Inside, the screw thread（803）Diameter position
In the second through-hole（103）And first through hole（102）Between, the nut（801）Diameter be more than T-shaped hole（101）It is first logical
Hole（102）Diameter, the screw rod（802）Diameter be less than the second through-hole（103）Diameter, the bolt（8）Screw thread（803）
With test microscope carrier（4）Threaded hole（401）It coincide.
2. fingerprint chip DC impedance tester according to claim 1, it is characterised in that：Several through-holes（21）'s
Number is 2.
3. fingerprint chip DC impedance tester according to claim 1, it is characterised in that：The probe base（15）With cunning
Block（16）It is fixedly connected between if by bolt stem.
4. fingerprint chip DC impedance tester according to claim 1, it is characterised in that：The sliding rail（14）It is linear
Sliding rail.
5. fingerprint chip DC impedance tester according to claim 1, it is characterised in that：Several probe bases（15）
Number be 8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721470591.4U CN207541153U (en) | 2017-11-07 | 2017-11-07 | Fingerprint chip DC impedance tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721470591.4U CN207541153U (en) | 2017-11-07 | 2017-11-07 | Fingerprint chip DC impedance tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207541153U true CN207541153U (en) | 2018-06-26 |
Family
ID=62612607
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721470591.4U Expired - Fee Related CN207541153U (en) | 2017-11-07 | 2017-11-07 | Fingerprint chip DC impedance tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207541153U (en) |
-
2017
- 2017-11-07 CN CN201721470591.4U patent/CN207541153U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180626 Termination date: 20191107 |