CN207488215U - A kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester - Google Patents
A kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester Download PDFInfo
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- CN207488215U CN207488215U CN201721547557.2U CN201721547557U CN207488215U CN 207488215 U CN207488215 U CN 207488215U CN 201721547557 U CN201721547557 U CN 201721547557U CN 207488215 U CN207488215 U CN 207488215U
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Abstract
The utility model is related to material leak-proof system regions, more particularly to a kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester, its key points of the technical solution are that：A kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester, including breaker, alarm and multiple control contacts；Contact is controlled to include the first contact and the second wafer, multiple first contacts are set on sample carrier, and positioned at the opposite side of sample carrier and sample pressure ring；Multiple the second wafers are uniformly distributed in sample pressure ring, the side opposite with first contact；The second wafer and the first contact can contact, and the first contact and the second wafer loose contact can trigger breaker and alarm；The breaker can disconnect the power supply of halogen tester.Its main feature is that can be not close in sample carrier and sample pressure ring cooperation, occur timely responding to during material leakage risk.
Description
Technical field
The utility model is related to material leak-proof system regions, more particularly to a kind of to analyze halogen tester based on X fluorescence spectrum
Material leak-proof system.
Background technology
Fluorine (F), chlorine (Cl), bromine (Br), iodine (I), astatine (At), abbreviation halogen.Organic halogen compound be in itself it is toxic,
Hiding in human body can be carcinogenic, and its biological degradation rate is very low, causes to build up in the ecosystem, and some are volatile
Organohalogen compound has ozone layer great destruction, and environment and human health are caused to seriously affect.Therefore it needs
The halogen of product is tested, it is non-halogen to realize.There are many test method of halogen, in paper《Halogen in electronic scanning piece
The X-ray fluorescence spectrometry of ratio》In provide it is a kind of with X-ray fluorescence spectrum test halogen method.
For the halogen tester analyzed based on X fluorescence spectrum, the existing following patent in China:
License notification number：CN203929682U discloses a kind of special xrf analysis instrument of RoHS, including exciting light
Source device, signal detecting device, signal processing apparatus, computer and sample mobile test platform, built-in high definition pick-up
Head is provided with the detector being connect with signal processing apparatus in signal detecting device, and signal processing apparatus is connect with computer, swashs
Light emitting source apparatus is connected with computer control, and x ray generator is provided in excitation light source device, and detector is located at X ray hair
On the position of the best angle of reflection of raw device excitation ray, filter selection device and collimator are provided with before x ray generator, is visited
Survey device is SDD electricity refrigeration detectors.The utility model can to the RoHS in all kinds of samples instruct in harmful element (Pb, Cd, Hg,
Br, Cr) carry out precisely test and Halogen test.
The sample carrier and sample pressure ring of the patent are replaceable, can not but ensure close between sample carrier and sample pressure ring
Cooperation, can not discover in time if there are gaps, and during the test, sample dust or clast are easily fallen into apparatus measures room,
Light supply apparatus is polluted, influence measurement accuracy or even causes failure.
Utility model content
In view of the deficienciess of the prior art, it is analyzed the purpose of this utility model is to provide one kind based on X fluorescence spectrum
The material leak-proof system of halogen tester, its main feature is that can be not close in sample carrier and sample pressure ring cooperation, there is material leakage wind
It is timely responded to when dangerous.
The above-mentioned technical purpose of the utility model technical scheme is that：One kind is based on X-fluorescence light
The material leak-proof system of spectrum analysis halogen tester, including breaker, alarm and multiple control contacts；Contact is controlled to include first
Contact and the second wafer, multiple first contacts are set on sample carrier, and opposite positioned at sample carrier and sample pressure ring
Side；Multiple the second wafers are uniformly distributed in sample pressure ring, the side opposite with first contact；Described second
Contact and the first contact can contact, and the first contact and the second wafer loose contact can trigger breaker and alarm；It is described
Breaker can disconnect the power supply of halogen tester.
Through the above technical solutions, when sample carrier and sample pressure ring cooperation be not close, when there is material leakage risk, at gap
The first contact and the second wafer loose contact, breaker and alarm can be triggered, timely responded to, send out alarm signal simultaneously
Cut off the power supply of halogen tester.
Preferably, PLC controller is further included, the input terminal of several first contacts is connected by pull-up resistor and power supply
It connects, the second wafer ground connection, the output terminal of first contact is connect with the input terminal of the PLC controller.
Through the above technical solutions, when the first contact and good the second wafer contact, the output terminal of the first contact is to PLC
Controller input low level signal；When the first contact and the second wafer loose contact, the output terminal of the first contact is controlled to PLC
Device input high level signal.
Preferably, further include PLC controller, several first contacts by or door connect with PLC controller.
Through the above technical solutions, when loose contact between wherein arbitrary first contact and the second wafer, you can pass through
Or door sends out high level signal to PLC controller.
Preferably, PLC controller is further included, the input terminal of several first contacts is grounded by pull down resistor, described
The second wafer connects power supply, and the output terminal of first contact is connect with the input terminal of the PLC controller.
Through the above technical solutions, when the first contact and good the second wafer contact, the output terminal of the first contact is to PLC
Controller input high level signal；When the first contact and the second wafer loose contact, the output terminal of the first contact is controlled to PLC
Device input low level signal.
Preferably, several first contacts with door with PLC controller by connecting.
Through the above technical solutions, when loose contact between wherein arbitrary first contact and the second wafer, you can pass through
With door low level signal is sent out to PLC controller.
Preferably, intermediate relay is further included, the coil of intermediate relay and the output terminal of PLC controller connect；Open circuit
It is provided with shunt release in device, the auxiliary contact of shunt opening coil and intermediate relay in shunt release connect.
Through the above technical solutions, that the coil of intermediate relay can be enabled to obtain is electric for PLC controller, intermediate relay it is auxiliary
Help contact closure so that the shunt opening coil of shunt release obtains electric, and shunt release is threaded off automatically, triggers breaker, makes halogen
Tester is stopped.
Preferably, the alarm is connect with the PLC controller.
Through the above technical solutions, PLC controller can trigger alarm, alarm is made to start to work.
Preferably, the alarm is audible-visual annunciator.
Through the above technical solutions, using audible-visual annunciator, sound and light alarm signal can be exported, prompts staff.
Preferably, several first contacts are uniformly distributed on sample carrier.
Through the above technical solutions, it can ensure that there are at gap when sample carrier and sample pressure ring are there are during gap
One contact and the second wafer.
The beneficial effects of the utility model are:It, can be in sample carrier and sample pressure ring by setting material leak-proof system
Cooperation is not close, occurs timely responding to during material leakage risk.
Description of the drawings
Fig. 1 is the electrical connection schematic diagram of halogen tester；
Fig. 2 is the electrical connection diagram of embodiment 1；
Fig. 3 is the electrical connection diagram of embodiment 2；
Fig. 4 is the electrical connection diagram of embodiment 3；
Fig. 5 is the electrical connection diagram of embodiment 4；
Fig. 6 is the structure diagram of sample mobile test platform in background technology；
Fig. 7 is the structure diagram of sample carrier in embodiment 1；
Fig. 8 is the structure diagram of sample pressure ring in embodiment 1.
Reference numeral：1st, sample mobile test platform；2nd, sample test supporting plate；3rd, sample carrier；4th, sample pressure ring；5th,
One contact；6th, the second wafer；7th, breaker；8th, alarm；9th, high voltage power supply；10th, detector power supply；11st, PLC processor；12、
Shunt release；13rd, shunt opening coil；14 or door；15 and door.
Specific embodiment
The utility model is described in further detail below in conjunction with attached drawing.
As shown in fig. 6, sample mobile test platform 1, including sample test supporting plate 2, replaceable sample carrier 3 and sample
Product pressure ring 4.
Embodiment 1：It is a kind of based on X fluorescence spectrum analysis halogen tester material leak-proof system, if as shown in Fig. 2, including
Dry first contact 5, with 5 corresponding the second wafer 6 of the first contact, breaker 7 and alarm 8.Breaker 7 is surveyed for cutting off halogen
The power supply of instrument is tried, alarm 8 is used to send out alarm signal.First contact 5 and the second wafer 6 are used to trigger breaker 7 and alarm
Device 8, when the loose contact of the first contact 5 and the second wafer 6, breaker 7 and alarm 8 are triggered.Alarm 8 is acousto-optic
Alarm.
As shown in fig. 7, several first contacts 5 are uniformly arranged on sample carrier 3, positioned at sample carrier 3 and sample pressure ring 4
Opposite side.
As shown in figure 8, several the second wafers 6 are uniformly arranged in sample pressure ring 4, positioned at sample pressure ring 4 and sample carrier 3
Opposite side.The second wafer 6 is oppositely arranged with the first contact 5.
When sample pressure ring 4 and sample carrier 3 are fitted close, the first contact 5 and the second wafer 6 contact well, Neng Gouliang
Good conduction.It is not close when coordinating between sample pressure ring 4 and sample carrier 3, when there is gap, the first contact 5 at gap and the
Two contacts, 6 loose contact, can not be conductive.
As shown in Figure 1, breaker 7 is connect with high voltage power supply 9 and detector power supply 10, it being capable of cutoff high power supply 9 and spy
Device power supply 10 is surveyed, halogen tester is made to be stopped.
As shown in Fig. 2, PLC processor and intermediate relay are further included in system.Shunt release is provided in breaker 7
12, shunt release 12 is interior to be equipped with shunt opening coil 13.The input terminal of first contact 5 is by pull-up resistor R1 connection power supply VCC, and
The output terminal of one contact 5 is connect with the input terminal of PLC controller 11.The second wafer 6 is grounded.The coil KA-1 of intermediate relay with
The output terminal connection of PLC controller 11.The auxiliary contact KA-2 of intermediate relay is connect with shunt opening coil 13, auxiliary contact KA-2
It is electric that closure can obtain shunt opening coil 13.Alarm 8 connects the output terminal of PLC controller 11.
When the first contact 5 and the second wafer 6 contact good, the output terminal of the first contact 5 inputs low to PLC controller 11
Level signal.When the first contact 5 and 6 loose contact of the second wafer, the output terminal of the first contact 5 is inputted to PLC controller 11
High level signal.PLC controller 11 triggers alarm 8 at this time, and alarm 8 is made to start to work, and exports sound and light alarm signal.Together
When, it is electric that PLC controller 11 enables the coil KA-1 of intermediate relay obtain, and the auxiliary contact KA-2 of intermediate relay is closed so that point
Encourage buckle releaser 12 shunt opening coil 13 it is electric, shunt release 12 automatically thread off, trigger breaker 7, make halogen tester stop
Work.
The occupation mode of the present embodiment is as follows：It is assembled on sample carrier 3 in sample pressure ring 4, after starting halogen tester.
If there are gap between sample pressure ring 4 and sample carrier 3, the loose contact of the first contact 5 and the second wafer 6 at gap is led to
It crosses the triggering alarm 8 of PLC controller 11 and sends out alarm, and passing through breaker 7 makes halogen tester be stopped.
Embodiment 2：It is a kind of based on X fluorescence spectrum analysis halogen tester material leak-proof system, it is different from embodiment 1 it
Be in, as shown in figure 3, the output terminal of several first contacts 5 by or door 14 connect with PLC controller 11.When wherein arbitrary
Between first contact 5 and the second wafer 6 during loose contact, you can by or door 14 send out high level signal to PLC controller 11.
Embodiment 3：It is a kind of based on X fluorescence spectrum analysis halogen tester material leak-proof system, it is different from embodiment 1 it
It is in as shown in figure 4, the input terminal of the first contact 5 is grounded by pull down resistor R2, output terminal and the PLC of the first contact 5 are controlled
The input terminal connection of device 11 processed.The second wafer 6 is connect with power supply VCC.When the first contact 5 and the second wafer 6 contact good, the
The output terminal of one contact 5 is to 11 input high level signal of PLC controller.When the first contact 5 and 6 loose contact of the second wafer,
The output terminal of first contact 5 is to 11 input low level signal of PLC controller.
Embodiment 4：It is a kind of based on X fluorescence spectrum analysis halogen tester material leak-proof system, it is different from embodiment 2 it
It is in as shown in figure 5, the output terminal of several first contacts 5 with door 15 with PLC controller 11 by connecting.When wherein arbitrary
Between first contact 5 and the second wafer 6 during loose contact, you can by sending out low level signal to PLC controller 11 with door 15.
The above is only the exemplary embodiment of the utility model, the protection model rather than limited the present invention
It encloses, the scope of protection of the utility model is determined by appended claim.
Claims (9)
1. a kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester, it is characterised in that：Including breaker（7）, report
Alert device（8）With multiple control contacts；Contact is controlled to include the first contact（5）And the second wafer（6）, multiple first contacts
（5）It is set to sample carrier（3）On, and positioned at sample carrier（3）And sample pressure ring（4）Opposite side；Multiple described second
Contact（6）It is uniformly distributed in sample pressure ring（4）On, with first contact（5）Opposite side；The second wafer（6）With
First contact（5）It can contact, the first contact（5）And the second wafer（6）Loose contact can trigger breaker（7）And alarm
（8）；The breaker（7）The power supply of halogen tester can be disconnected.
2. a kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester according to claim 1, feature exist
In：Further include PLC controller（11）, several first contacts（5）Input terminal pass through pull-up resistor（R1）With power supply（VCC）
Connection, the second wafer（6）Ground connection, first contact（5）Output terminal and the PLC controller（11）Input terminal connect
It connects.
3. a kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester according to claim 2, feature exist
In：Several first contacts（5）By or door（14）With PLC controller（11）Connection.
4. a kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester according to claim 1, feature exist
In：Further include PLC controller（11）, several first contacts（5）Input terminal pass through pull down resistor（R2）Ground connection, described the
Two contacts（6）Connect power supply（VCC）, first contact（5）Output terminal and the PLC controller（11）Input terminal connect
It connects.
5. a kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester according to claim 4, feature exist
In：Several first contacts（5）By with door（15）With PLC controller（11）Connection.
6. a kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester according to claim 2 or 4, special
Sign is：Further include intermediate relay, the coil of intermediate relay（KA-1）With PLC controller（11）Output terminal connection；It is disconnected
Road device（7）In be provided with shunt release（12）, shunt release（12）In shunt opening coil（13）It is auxiliary with intermediate relay
Help contact（KA-2）Connection.
7. a kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester according to claim 2 or 4, special
Sign is：The alarm（8）With the PLC controller（11）Connection.
8. a kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester according to claim 1, feature exist
In：The alarm（8）For audible-visual annunciator.
9. a kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester according to claim 1, feature exist
In：Several first contacts（5）It is uniformly distributed in sample carrier（3）On.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721547557.2U CN207488215U (en) | 2017-11-18 | 2017-11-18 | A kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721547557.2U CN207488215U (en) | 2017-11-18 | 2017-11-18 | A kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207488215U true CN207488215U (en) | 2018-06-12 |
Family
ID=62474098
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721547557.2U Active CN207488215U (en) | 2017-11-18 | 2017-11-18 | A kind of material leak-proof system based on X fluorescence spectrum analysis halogen tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207488215U (en) |
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2017
- 2017-11-18 CN CN201721547557.2U patent/CN207488215U/en active Active
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