CN207457431U - Double-station semiconductor die testing machine device - Google Patents
Double-station semiconductor die testing machine device Download PDFInfo
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- CN207457431U CN207457431U CN201721251786.XU CN201721251786U CN207457431U CN 207457431 U CN207457431 U CN 207457431U CN 201721251786 U CN201721251786 U CN 201721251786U CN 207457431 U CN207457431 U CN 207457431U
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Abstract
The utility model discloses a kind of double-station semiconductor die testing machine device, and including test machine cabinet and hanging machine case, there are two pci extended housings and two power amplifier cabinets for installation in the test machine cabinet；The hanging machine case includes left side skeleton, right side skeleton, top panel and downside transverse slat；The left side skeleton and the front and rear side of right side skeleton are both provided with installation step and threaded hole.The utility model is in the case where original Cabinet Size is constant, two pci extended housings and two power amplifier cabinets are installed, and in order to realize duplexing bit test, the volume of matrix cabinet inside can also become larger, therefore demountable hanging machine case installation matrix cabinet is set, the front end installation test machine control panel of hanging machine case, duplexing bit test can be realized by being engaged by matrix cabinet with two pci extended housings and two power amplifier cabinets, and single unit system does not change the dimensional structure of former test cabinet, is more prone to assembling and realizes.
Description
Technical field
The utility model belongs to semiconductor detection, and in particular to a kind of double-station semiconductor die testing machine device.
Background technology
As shown in Figure 1, needing dress inside existing semiconductor die testing machine, there are three cabinet, pci extended housings are (i.e.
PXI cabinets), power amplifier cabinet (i.e. 5142 cabinets) and matrix cabinet (i.e. MATRIX cabinets).Usually test machine in test
Only need to test every time chip piece can (either simplex bit test), but due to there is fraction chip testing overlong time, cause whole
A testing process takes that excessive, production capacity is relatively low；In order to improve this segment chip testing efficiency, we determine to existing test machine into
Row improves, and can survey two chips (double-station) simultaneously, can so shorten and test the consumed time, and improve economic effect
Benefit.
Utility model content
The purpose of this utility model be in view of the deficienciess of the prior art, provide one kind can realize duplexing bit test,
And occupy little space, can single double-station switching double-station semiconductor die testing machine body.
Technical solution：Technical solution is used by the utility model solves the problems, such as：A kind of double-station semiconductor chip is surveyed
Test-run a machine device, including test machine cabinet and hanging machine case, there are two pci extended housings and two for installation in the test machine cabinet
A power amplifier cabinet；The hanging machine case includes left side skeleton, right side skeleton, top panel and downside transverse slat；Described
The front and rear side of left side skeleton and right side skeleton is both provided with installation step and threaded hole, and the front side end of the test cabinet and
Rear side end is both provided with matching used installation step and threaded hole, makes test machine machine by the cooperation of installation step and threaded hole
Case and hanging machine case are detachably installed；And matrix cabinet is also equipped in the hanging machine case, the matrix cabinet and two
A pci extended housings and two power amplifier cabinets form the semiconductor die testing machine of double-station.
Preferably, the size of the test machine cabinet is：720mm*563mm*670mm；The hanging machine case
Size is：563mm*670mm 720mm*262mm*670mm；The size of the pci extended housings is：178mm*450mm*
446mm；The size of the power amplifier cabinet is：133mm*450mm*523mm；The size of the matrix cabinet is：
224mm*440mm*593mm。
Preferably, further include dismountable test machine control panel, it is provided on the test machine control panel pair
The installation step and threaded hole answered；The test machine control panel is detachably arranged in the front side end of hanging outdoor unit cabinet；And it is inciting somebody to action
After hanging machine case dismounting, which is detachably arranged in the front side end of test machine cabinet.
Preferably, the test machine cabinet both sides are additionally provided with radiator fan, position is again provided on hanging machine case
Put corresponding radiator fan.
Advantageous effect：The utility model has the advantages that：
(1) the utility model pulls out internal matrix cabinet to come in the case where original Cabinet Size is constant；Installation
Two pci extended housings and two power amplifier cabinets, and in order to realize duplexing bit test, the electronics member of matrix cabinet inside
Number of devices increases, and volume can also become larger, therefore sets demountable hanging machine case installation matrix cabinet, before hanging machine case
End installation test machine control panel, is engaged by matrix cabinet with two pci extended housings and two power amplifier cabinets
It can realize duplexing bit test, and single unit system does not change the dimensional structure of former test cabinet, is more prone to assembling and realizes；
(2) the utility model can also realize the switching of single-station and double-station, and hanging machine case is easily removable, dismounting
Afterwards, test machine control panel may be mounted at the front end of test machine cabinet, and test machine cabinet inside re-replaces into pci striking machines
The structure of case, power amplifier cabinet and original matrix cabinet, available for the test of semiconductor chip single-station, due to only comparing
Few chip testing time is longer, it is necessary to which double-station is tested, other chips still can use the test machine of single-station, so
Just do not have to the test machine for using double-station large volume always, while also reduce the requirement to test machine quantity, save cost.
Description of the drawings
Fig. 1 is existing single-station test device；
Fig. 2 is the structure chart of the utility model；
Fig. 3 is hanging outdoor unit box structure figure in the utility model；
Fig. 4 is the test machine control panel structure chart of front end in the utility model.
Specific embodiment
In the following with reference to the drawings and specific embodiments, the utility model is furtherd elucidate, the present embodiment is with the utility model
Implemented under premised on technical solution, it should be understood that these embodiments are merely to illustrate the utility model rather than limit this reality
With new scope.
As shown in Figure 2, Figure 3 and Figure 4, a kind of double-station semiconductor die testing machine device, including test machine cabinet 1 and outside
On-hook case 2, there are two pci extended housings 3 and two power amplifier cabinets 4 for the interior installation of the test machine cabinet 1；Described
Hanging machine case 2 includes left side skeleton 21, right side skeleton 22, top panel 23 and downside transverse slat 24；The left side skeleton 21 and the right side
The front and rear side of side skeleton 22 is both provided with installation step 26 and threaded hole 27, and the front side end and rear side of the test cabinet 1
End is both provided with matching used installation step and threaded hole, makes test machine machine by the cooperation of installation step 26 and threaded hole 27
Case 1 and hanging machine case 2 are detachably installed；And matrix cabinet 5 is also equipped in the hanging machine case 2, the matrix cabinet 5
The semiconductor die testing machine of double-station is formed with two pci extended housings 3 and two power amplifier cabinets.
In the utility model, the size constancy of test machine cabinet 1, pci extended housings 3 and power amplifier cabinet 4, and square
Battle array cabinet 5 becomes larger, and the size of the test machine cabinet 1 is：720mm*563mm*670mm；The size of the hanging machine case 2
For：720mm*262mm*670mm；The size of the pci extended housings 3 is：178mm*450mm*446mm；The power
The size of amplifier cabinet 4 is：133mm*450mm*523mm；The size of the matrix cabinet 5 is：224mm*440mm*
593mm。
Dismountable test machine control panel 6 is further included, corresponding installation is provided on the test machine control panel 6
Step 26 and threaded hole 27；The test machine control panel 6 is detachably arranged in the front side end of hanging outdoor unit cabinet 1；And by outside
After on-hook case 2 is dismantled, which is detachably arranged in the front side end of test machine cabinet 1.
1 both sides of test machine cabinet are additionally provided with radiator fan 7, and it is opposite to be again provided with position on hanging machine case 2
The radiator fan 7 answered.
The utility model pulls out internal matrix cabinet to come in the case where original Cabinet Size is constant；Installation two
A pci extended housings and two power amplifier cabinets, and in order to realize duplexing bit test, the electronics member device of matrix cabinet inside
Number of packages amount increases, and volume can also become larger, therefore sets demountable hanging machine case installation matrix cabinet, the front end of hanging machine case
Test machine control panel is installed, is engaged just with two pci extended housings and two power amplifier cabinets by matrix cabinet
It can realize duplexing bit test, and single unit system does not change the dimensional structure of former test cabinet, is more prone to assembling and realizes.
The utility model can also realize the switching of single-station and double-station, and hanging machine case is easily removable, after dismounting, survey
Test-run a machine control panel may be mounted at the front end of test machine cabinet, and test machine cabinet inside re-replaces into pci extended housings, work(
The structure of rate amplifier cabinet and original matrix cabinet, it is fewer due to only having available for the test of semiconductor chip single-station
The chip testing time is longer, it is necessary to which double-station is tested, other chips still can use the test machine of single-station, thus not
With always using the test machine of double-station large volume, while also reduce the requirement to test machine quantity, cost is saved.
The above is only the preferred embodiment of the utility model, it is noted that for the common skill of the art
For art personnel, on the premise of the utility model principle is not departed from, several improvements and modifications can also be made, these improve and
Retouching also should be regarded as the scope of protection of the utility model.
Claims (4)
1. a kind of double-station semiconductor die testing machine device, it is characterised in that：Including test machine cabinet (1) and hanging machine case
(2), there are two pci extended housings (3) and two power amplifier cabinets (4) for installation in the test machine cabinet (1)；It is described
Hanging machine case (2) include left side skeleton (21), right side skeleton (22), top panel (23) and downside transverse slat (24)；The left side
The front and rear side of side skeleton (21) and right side skeleton (22) is both provided with installation step (26) and threaded hole (27), and the test
The front side end and rear side end of cabinet (1) are both provided with matching used installation step and threaded hole, by installation step (26) and
The cooperation of threaded hole (27) makes test machine cabinet (1) and hanging machine case (2) detachably install；And in the hanging machine case (2)
It is also equipped with matrix cabinet (5), the matrix cabinet (5) and two pci extended housings (3) and two power amplifier cabinets
Form the semiconductor die testing machine of double-station.
2. a kind of double-station semiconductor die testing machine device according to claim 1, it is characterised in that：
The size of the test machine cabinet (1) is：720mm*563mm*670mm；
The size of the hanging machine case (2) is：720mm*262mm*670mm；
The size of the pci extended housings (3) is：178mm*450mm*446mm；
The size of the power amplifier cabinet (4) is：133mm*450mm*523mm；
The size of the matrix cabinet is：224mm*440mm*593mm.
3. a kind of double-station semiconductor die testing machine device according to claim 1, it is characterised in that：It further includes removable
The test machine control panel (6) unloaded is provided with corresponding installation step (26) and screw thread on the test machine control panel (6)
Hole (27)；The test machine control panel (6) is detachably arranged in the front side end of hanging outdoor unit cabinet (1)；And by hanging machine case
(2) after dismantling, which is detachably arranged in the front side end of test machine cabinet (1).
4. a kind of double-station semiconductor die testing machine device according to claim 1, it is characterised in that：The test
Machine cabinet (1) both sides are additionally provided with radiator fan (7), and the corresponding radiator fan in position is again provided on hanging machine case (2)
(7)。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721251786.XU CN207457431U (en) | 2017-09-27 | 2017-09-27 | Double-station semiconductor die testing machine device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721251786.XU CN207457431U (en) | 2017-09-27 | 2017-09-27 | Double-station semiconductor die testing machine device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207457431U true CN207457431U (en) | 2018-06-05 |
Family
ID=62284351
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721251786.XU Active CN207457431U (en) | 2017-09-27 | 2017-09-27 | Double-station semiconductor die testing machine device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207457431U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107561430A (en) * | 2017-09-27 | 2018-01-09 | 上海旻艾信息科技有限公司 | A kind of double semiconductor die testing machine device |
| CN109489708A (en) * | 2018-09-13 | 2019-03-19 | 深圳市卓精微智能机器人设备有限公司 | A kind of bluetooth Auto-Test System of integral type |
-
2017
- 2017-09-27 CN CN201721251786.XU patent/CN207457431U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107561430A (en) * | 2017-09-27 | 2018-01-09 | 上海旻艾信息科技有限公司 | A kind of double semiconductor die testing machine device |
| CN109489708A (en) * | 2018-09-13 | 2019-03-19 | 深圳市卓精微智能机器人设备有限公司 | A kind of bluetooth Auto-Test System of integral type |
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